JP2009065181A5 - - Google Patents
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- JP2009065181A5 JP2009065181A5 JP2008260231A JP2008260231A JP2009065181A5 JP 2009065181 A5 JP2009065181 A5 JP 2009065181A5 JP 2008260231 A JP2008260231 A JP 2008260231A JP 2008260231 A JP2008260231 A JP 2008260231A JP 2009065181 A5 JP2009065181 A5 JP 2009065181A5
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Description
本発明の磁気抵抗効果素子の製造方法は、第一強磁性層と、前記第一強磁性層の上に位置するMgO層と、前記MgO層の上に位置する第二強磁性層と、を有する多層積層膜からなる磁気抵抗効果素子の製造方法であって、酸化性ガスに対するゲッタ効果がMgOより大きい物質を含有するターゲットをスパッタリングして、該物質を成膜室の構成部材に被着する第一工程と、前記第一工程後に、前記成膜室において、基板とMgOターゲットの間に設けられたシャッタを閉状態にしながら、前記MgOターゲットに高周波電力を印加してスパッタリングするプリスパッタ工程と、前記プリスパッタ工程後、前記成膜室において、前記シャッタを開状態にして、前記MgOターゲットに高周波電力を印加してスパッタリング法により基板に前記MgO層を形成する第二工程と、を有することを特徴とする。また、本発明に係る前記成膜室は、10 −7 Pa以下に排気されていることを特徴とする。また、本発明に係る前記第一工程は、前記シャッタを閉状態にしながら、行われることを特徴とする。また、本発明に係る前記第一工程は、ダミー基板を基板保持部に載置しながら、行われることを特徴とする。また、本発明に係る前記第一工程は、前記プリスパッタ工程の直前に行なわれることを特徴とする。 A method for manufacturing a magnetoresistive element of the present invention includes a first ferromagnetic layer, an MgO layer positioned on the first ferromagnetic layer, and a second ferromagnetic layer positioned on the MgO layer. A method of manufacturing a magnetoresistive effect element comprising a multi-layered film comprising sputtering a target containing a substance having a getter effect on an oxidizing gas greater than MgO, and depositing the substance on a constituent member of a film forming chamber A pre-sputtering step of applying a high-frequency power to the MgO target and performing sputtering while the shutter provided between the substrate and the MgO target is closed in the film formation chamber after the first step; After the pre-sputtering step, in the film formation chamber, the shutter is opened, high frequency power is applied to the MgO target, and the substrate is formed by sputtering. And having a second step of forming an MgO layer. The film formation chamber according to the present invention is evacuated to 10 −7 Pa or less. In addition, the first step according to the present invention is performed while the shutter is in a closed state. In addition, the first step according to the present invention is performed while placing the dummy substrate on the substrate holding portion. Further, the first step according to the present invention is performed immediately before the pre-sputtering step .
Claims (5)
酸化性ガスに対するゲッタ効果がMgOより大きい物質を含有するターゲットをスパッタリングして、該物質を成膜室の構成部材に被着する第一工程と、
前記第一工程後に、前記成膜室において、基板とMgOターゲットの間に設けられたシャッタを閉状態にしながら、前記MgOターゲットに高周波電力を印加してスパッタリングするプリスパッタ工程と、
前記プリスパッタ工程後、前記成膜室において、前記シャッタを開状態にして、前記MgOターゲットに高周波電力を印加してスパッタリング法により基板に前記MgO層を形成する第二工程と、を有すること
を特徴とする磁気抵抗効果素子の製造方法。 Production of a magnetoresistive effect element comprising a multilayer laminated film having a first ferromagnetic layer, an MgO layer located on the first ferromagnetic layer, and a second ferromagnetic layer located on the MgO layer A method,
A first step of sputtering a target containing a substance having a getter effect with respect to an oxidizing gas greater than MgO, and depositing the substance on a constituent member of the film forming chamber;
A pre-sputtering step of applying high-frequency power to the MgO target and performing sputtering while the shutter provided between the substrate and the MgO target is closed in the film formation chamber after the first step;
After the pre-sputtering step, the film forming chamber includes a second step of opening the shutter and applying high frequency power to the MgO target to form the MgO layer on the substrate by a sputtering method. A method of manufacturing a magnetoresistive element characterized by the above.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008260231A JP5260225B2 (en) | 2006-03-03 | 2008-10-07 | Method for manufacturing magnetoresistive element |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006058748 | 2006-03-03 | ||
JP2006058748 | 2006-03-03 | ||
JP2008260231A JP5260225B2 (en) | 2006-03-03 | 2008-10-07 | Method for manufacturing magnetoresistive element |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008042175A Division JP4679595B2 (en) | 2006-03-03 | 2008-02-22 | Magnetoresistive element manufacturing method and manufacturing apparatus |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2009065181A JP2009065181A (en) | 2009-03-26 |
JP2009065181A5 true JP2009065181A5 (en) | 2011-03-31 |
JP5260225B2 JP5260225B2 (en) | 2013-08-14 |
Family
ID=39699993
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
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JP2008042175A Active JP4679595B2 (en) | 2006-03-03 | 2008-02-22 | Magnetoresistive element manufacturing method and manufacturing apparatus |
JP2008260231A Active JP5260225B2 (en) | 2006-03-03 | 2008-10-07 | Method for manufacturing magnetoresistive element |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
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JP2008042175A Active JP4679595B2 (en) | 2006-03-03 | 2008-02-22 | Magnetoresistive element manufacturing method and manufacturing apparatus |
Country Status (2)
Country | Link |
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JP (2) | JP4679595B2 (en) |
CN (2) | CN101615653B (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2530182B1 (en) * | 2010-01-26 | 2015-03-25 | Canon Anelva Corporation | Film-forming method, film-forming apparatus, and apparatus for controlling the film-forming apparatus |
JP5998654B2 (en) | 2012-05-31 | 2016-09-28 | 東京エレクトロン株式会社 | Vacuum processing apparatus, vacuum processing method, and storage medium |
JP5745699B2 (en) * | 2012-08-10 | 2015-07-08 | キヤノンアネルバ株式会社 | Tunnel magnetoresistive element manufacturing equipment |
US9461242B2 (en) | 2013-09-13 | 2016-10-04 | Micron Technology, Inc. | Magnetic memory cells, methods of fabrication, semiconductor devices, memory systems, and electronic systems |
US9608197B2 (en) | 2013-09-18 | 2017-03-28 | Micron Technology, Inc. | Memory cells, methods of fabrication, and semiconductor devices |
WO2015064194A1 (en) * | 2013-10-30 | 2015-05-07 | 東京エレクトロン株式会社 | Deposition device and deposition method |
US10454024B2 (en) | 2014-02-28 | 2019-10-22 | Micron Technology, Inc. | Memory cells, methods of fabrication, and memory devices |
US9281466B2 (en) | 2014-04-09 | 2016-03-08 | Micron Technology, Inc. | Memory cells, semiconductor structures, semiconductor devices, and methods of fabrication |
US9349945B2 (en) | 2014-10-16 | 2016-05-24 | Micron Technology, Inc. | Memory cells, semiconductor devices, and methods of fabrication |
US9768377B2 (en) | 2014-12-02 | 2017-09-19 | Micron Technology, Inc. | Magnetic cell structures, and methods of fabrication |
US10439131B2 (en) | 2015-01-15 | 2019-10-08 | Micron Technology, Inc. | Methods of forming semiconductor devices including tunnel barrier materials |
CN110565059B (en) * | 2019-09-10 | 2021-09-17 | 天津大学 | Preparation method and device of titanium oxide-based nano particle composite film with room-temperature tunnel magnetoresistance effect |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0314227A (en) * | 1989-06-13 | 1991-01-22 | Sharp Corp | Manufacture of semiconductor device |
JPH0397855A (en) * | 1989-09-07 | 1991-04-23 | Shimadzu Corp | Sputtering device |
JPH0499271A (en) * | 1990-08-10 | 1992-03-31 | Olympus Optical Co Ltd | Method and device for forming multilayer thin film |
JP3021601B2 (en) * | 1990-10-22 | 2000-03-15 | 神島化学工業株式会社 | MgO target |
JPH07180047A (en) * | 1993-12-24 | 1995-07-18 | Matsushita Electric Ind Co Ltd | Production of ferroelectric substance thin film element and apparatus for producing the same |
JPH0949075A (en) * | 1995-08-10 | 1997-02-18 | Sony Corp | Sputtering device |
JPH11152564A (en) * | 1997-11-17 | 1999-06-08 | Murata Mfg Co Ltd | Presputtering method and device |
JP2003069112A (en) * | 2001-08-28 | 2003-03-07 | Nec Corp | Manufacturing method of ferromagnetic tunnel junction element |
WO2005088745A1 (en) * | 2004-03-12 | 2005-09-22 | Japan Science And Technology Agency | Magnetoresistive element and its manufacturing method |
JP2005298894A (en) * | 2004-04-12 | 2005-10-27 | Fujitsu Ltd | Method for cleaning target, and physical deposition apparatus |
-
2007
- 2007-02-26 CN CN2009101467886A patent/CN101615653B/en active Active
- 2007-02-26 CN CNA2007800072332A patent/CN101395732A/en active Pending
-
2008
- 2008-02-22 JP JP2008042175A patent/JP4679595B2/en active Active
- 2008-10-07 JP JP2008260231A patent/JP5260225B2/en active Active
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