JP2009065181A5 - - Google Patents

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JP2009065181A5
JP2009065181A5 JP2008260231A JP2008260231A JP2009065181A5 JP 2009065181 A5 JP2009065181 A5 JP 2009065181A5 JP 2008260231 A JP2008260231 A JP 2008260231A JP 2008260231 A JP2008260231 A JP 2008260231A JP 2009065181 A5 JP2009065181 A5 JP 2009065181A5
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mgo
sputtering
manufacturing
magnetoresistive
element according
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本発明の磁気抵抗効果素子の製造方法は、第一強磁性層と、前記第一強磁性層の上に位置するMgO層と、前記MgO層の上に位置する第二強磁性層と、を有する多層積層膜からなる磁気抵抗効果素子の製造方法であって、酸化性ガスに対するゲッタ効果がMgOより大きい物質を含有するターゲットをスパッタリングして、該物質を成膜室の構成部材に被着する第一工程と、前記第一工程後に、前記成膜室において、基板とMgOターゲットの間に設けられたシャッタを閉状態にしながら、前記MgOターゲットに高周波電力を印加してスパッタリングするプリスパッタ工程と、前記プリスパッタ工程後、前記成膜室において、前記シャッタを開状態にして、前記MgOターゲットに高周波電力を印加してスパッタリング法により基板に前記MgO層を形成する第二工程と、を有することを特徴とする。また、本発明に係る前記成膜室は、10 −7 Pa以下に排気されていることを特徴とする。また、本発明に係る前記第一工程は、前記シャッタを閉状態にしながら、行われることを特徴とする。また、本発明に係る前記第一工程は、ダミー基板を基板保持部に載置しながら、行われることを特徴とする。また、本発明に係る前記第一工程は、前記プリスパッタ工程の直前に行なわれることを特徴とする。 A method for manufacturing a magnetoresistive element of the present invention includes a first ferromagnetic layer, an MgO layer positioned on the first ferromagnetic layer, and a second ferromagnetic layer positioned on the MgO layer. A method of manufacturing a magnetoresistive effect element comprising a multi-layered film comprising sputtering a target containing a substance having a getter effect on an oxidizing gas greater than MgO, and depositing the substance on a constituent member of a film forming chamber A pre-sputtering step of applying a high-frequency power to the MgO target and performing sputtering while the shutter provided between the substrate and the MgO target is closed in the film formation chamber after the first step; After the pre-sputtering step, in the film formation chamber, the shutter is opened, high frequency power is applied to the MgO target, and the substrate is formed by sputtering. And having a second step of forming an MgO layer. The film formation chamber according to the present invention is evacuated to 10 −7 Pa or less. In addition, the first step according to the present invention is performed while the shutter is in a closed state. In addition, the first step according to the present invention is performed while placing the dummy substrate on the substrate holding portion. Further, the first step according to the present invention is performed immediately before the pre-sputtering step .

Claims (5)

第一強磁性層と、前記第一強磁性層の上に位置するMgO層と、前記MgO層の上に位置する第二強磁性層と、を有する多層積層膜からなる磁気抵抗効果素子の製造方法であって、
酸化性ガスに対するゲッタ効果がMgOより大きい物質を含有するターゲットをスパッタリングして、該物質を成膜室の構成部材に被着する第一工程と、
前記第一工程後に、前記成膜室において、基板とMgOターゲットの間に設けられたシャッタを閉状態にしながら、前記MgOターゲットに高周波電力を印加してスパッタリングするプリスパッタ工程と、
前記プリスパッタ工程後、前記成膜室において、前記シャッタを開状態にして、前記MgOターゲットに高周波電力を印加してスパッタリング法により基板に前記MgO層を形成する第二工程と、を有すること
を特徴とする磁気抵抗効果素子の製造方法。
Production of a magnetoresistive effect element comprising a multilayer laminated film having a first ferromagnetic layer, an MgO layer located on the first ferromagnetic layer, and a second ferromagnetic layer located on the MgO layer A method,
A first step of sputtering a target containing a substance having a getter effect with respect to an oxidizing gas greater than MgO, and depositing the substance on a constituent member of the film forming chamber;
A pre-sputtering step of applying high-frequency power to the MgO target and performing sputtering while the shutter provided between the substrate and the MgO target is closed in the film formation chamber after the first step;
After the pre-sputtering step, the film forming chamber includes a second step of opening the shutter and applying high frequency power to the MgO target to form the MgO layer on the substrate by a sputtering method. A method of manufacturing a magnetoresistive element characterized by the above.
前記成膜室は、10The film forming chamber has 10 −7-7 Pa以下に排気されていることを特徴とする請求項1に記載の磁気抵抗効果素子の製造方法。2. The method of manufacturing a magnetoresistive element according to claim 1, wherein the magnetoresistive element is exhausted to Pa or less. 前記第一工程は、前記シャッタを閉状態にしながら、行われることを特徴とする請求項1に記載の磁気抵抗効果素子の製造方法。The method of manufacturing a magnetoresistive effect element according to claim 1, wherein the first step is performed while the shutter is in a closed state. 前記第一工程は、ダミー基板を基板保持部に載置しながら、行われることを特徴とする請求項1に記載の磁気抵抗効果素子の製造方法。The method of manufacturing a magnetoresistive effect element according to claim 1, wherein the first step is performed while placing the dummy substrate on the substrate holding portion. 前記第一工程は、前記プリスパッタ工程の直前に行なわれることを特徴とする請求項1に記載の磁気抵抗効果素子の製造方法。The method of manufacturing a magnetoresistive effect element according to claim 1, wherein the first step is performed immediately before the pre-sputtering step.
JP2008260231A 2006-03-03 2008-10-07 Method for manufacturing magnetoresistive element Active JP5260225B2 (en)

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JP2006058748 2006-03-03
JP2006058748 2006-03-03
JP2008260231A JP5260225B2 (en) 2006-03-03 2008-10-07 Method for manufacturing magnetoresistive element

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JP2009065181A5 true JP2009065181A5 (en) 2011-03-31
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JP5998654B2 (en) 2012-05-31 2016-09-28 東京エレクトロン株式会社 Vacuum processing apparatus, vacuum processing method, and storage medium
JP5745699B2 (en) * 2012-08-10 2015-07-08 キヤノンアネルバ株式会社 Tunnel magnetoresistive element manufacturing equipment
US9461242B2 (en) 2013-09-13 2016-10-04 Micron Technology, Inc. Magnetic memory cells, methods of fabrication, semiconductor devices, memory systems, and electronic systems
US9608197B2 (en) 2013-09-18 2017-03-28 Micron Technology, Inc. Memory cells, methods of fabrication, and semiconductor devices
WO2015064194A1 (en) * 2013-10-30 2015-05-07 東京エレクトロン株式会社 Deposition device and deposition method
US10454024B2 (en) 2014-02-28 2019-10-22 Micron Technology, Inc. Memory cells, methods of fabrication, and memory devices
US9281466B2 (en) 2014-04-09 2016-03-08 Micron Technology, Inc. Memory cells, semiconductor structures, semiconductor devices, and methods of fabrication
US9349945B2 (en) 2014-10-16 2016-05-24 Micron Technology, Inc. Memory cells, semiconductor devices, and methods of fabrication
US9768377B2 (en) 2014-12-02 2017-09-19 Micron Technology, Inc. Magnetic cell structures, and methods of fabrication
US10439131B2 (en) 2015-01-15 2019-10-08 Micron Technology, Inc. Methods of forming semiconductor devices including tunnel barrier materials
CN110565059B (en) * 2019-09-10 2021-09-17 天津大学 Preparation method and device of titanium oxide-based nano particle composite film with room-temperature tunnel magnetoresistance effect

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