JP2009063381A5 - - Google Patents

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Publication number
JP2009063381A5
JP2009063381A5 JP2007230659A JP2007230659A JP2009063381A5 JP 2009063381 A5 JP2009063381 A5 JP 2009063381A5 JP 2007230659 A JP2007230659 A JP 2007230659A JP 2007230659 A JP2007230659 A JP 2007230659A JP 2009063381 A5 JP2009063381 A5 JP 2009063381A5
Authority
JP
Japan
Prior art keywords
probe
electrode
joint
slit
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2007230659A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009063381A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2007230659A priority Critical patent/JP2009063381A/ja
Priority claimed from JP2007230659A external-priority patent/JP2009063381A/ja
Publication of JP2009063381A publication Critical patent/JP2009063381A/ja
Publication of JP2009063381A5 publication Critical patent/JP2009063381A5/ja
Pending legal-status Critical Current

Links

JP2007230659A 2007-09-05 2007-09-05 プローブ Pending JP2009063381A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007230659A JP2009063381A (ja) 2007-09-05 2007-09-05 プローブ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007230659A JP2009063381A (ja) 2007-09-05 2007-09-05 プローブ

Publications (2)

Publication Number Publication Date
JP2009063381A JP2009063381A (ja) 2009-03-26
JP2009063381A5 true JP2009063381A5 (cg-RX-API-DMAC10.html) 2011-04-21

Family

ID=40558084

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007230659A Pending JP2009063381A (ja) 2007-09-05 2007-09-05 プローブ

Country Status (1)

Country Link
JP (1) JP2009063381A (cg-RX-API-DMAC10.html)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6980410B2 (ja) 2017-05-23 2021-12-15 株式会社日本マイクロニクス プローブ
TWI851214B (zh) * 2023-05-18 2024-08-01 中華精測科技股份有限公司 懸臂式探針卡裝置及容焊料式探針
TWI851213B (zh) * 2023-05-18 2024-08-01 中華精測科技股份有限公司 懸臂式探針卡裝置及微機電探針
JP7861227B2 (ja) * 2023-08-02 2026-05-18 三菱電機株式会社 パワー半導体測定装置およびプローブ治具

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0439504Y2 (cg-RX-API-DMAC10.html) * 1989-07-19 1992-09-16
JP2002283049A (ja) * 2001-03-23 2002-10-02 Ando Electric Co Ltd コンタクトピンのはんだ付け方法およびコンタクトピン
JP2005197282A (ja) * 2003-12-26 2005-07-21 Kyocera Corp プリント基板及びプリント基板製造方法
JP2005251856A (ja) * 2004-03-02 2005-09-15 Denso Corp 半導体装置
KR100974563B1 (ko) * 2006-01-25 2010-08-06 가부시키가이샤 니혼 마이크로닉스 통전시험용 프로브, 프로브 조립체 및 그 제조방법

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