JP2009053214A - Inspection apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a foreign matter inspection system of high detecting accuracy. <P>SOLUTION: The foreign matter inspection system irradiates merchandise M conveyed by a conveyor, with X-rays from an X-ray irradiation means, allows the X-rays transmitted through the merchandise M, to be incident to an X-ray detector, and detects foreign matter D stuck to or intermixed in the merchandise to determine passing or failing. The X-ray irradiation means 21, 31 and X-ray detectors 22, 32 are provided in two sets, and these two sets of X-ray irradiation means 21, 31 and X-ray detectors 22, 32 are provided on a plane which intersects the conveying direction Y of the conveyor. The two sets of X-ray irradiation means 21, 31 and X-ray detectors 22, 32 are disposed so that optical axis S1, S1 of two sets of optical systems 20, 30 intersect each other when viewed from the upper reaches in the conveying direction Y. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

The present invention relates to an inspection apparatus using X-rays.

In recent years, there has been an increasing demand for safety for various products, and in particular, for products such as food, it is necessary to prevent foreign matters from being mixed. On the other hand, it is difficult for a general metal detector to detect a foreign object made of a non-metal such as a fine needle, bone fragment or plastic.
Therefore, for example, an inspection apparatus using X-rays as disclosed in Japanese Patent Application Laid-Open No. 9-113631 or Japanese Patent Application Laid-Open No. 9-127017 has been put into practical use.
JP-A-62-226045 (FIG. 1) JP-A-63-67552 (FIG. 2) Japanese Patent Laid-Open No. 9-113631 (FIG. 1) JP-A-63-140949 (FIG. 1)

An example of such an inspection apparatus is shown in FIG. As shown in FIG. 7, the inspection apparatus irradiates a product M conveyed by a conveyor (not shown) with X-rays L from an X-ray radiating means 101, and detects X-rays transmitted through the product M with an X-ray detector (line sensor). ), And the foreign matter is detected by continuously processing the output from the X-ray detector 102 with a computer.

By the way, the output from the X-ray detector 102 processed by the computer is recognized as an image showing the distribution of the amount of light transmitted through the product M by brightness. In the image, when there is a part whose brightness is significantly different from the surrounding part, it is considered that the X-ray is shielded by the foreign substance, and therefore it can be determined that the foreign substance exists in the part.
However, as shown in FIG. 7, when the needle-shaped foreign matter D is stuck in the product M and the longitudinal axis of the foreign matter D is close to the right angle with respect to the irradiation direction of the X-ray L, the foreign matter D Since the amount of X-ray absorption by the product M is relatively small, the amount of X-ray absorption by the product M itself becomes a large noise (background), making it difficult to recognize the foreign matter D. For this reason, detection leakage may occur.

Accordingly, an object of the present invention is to provide an inspection apparatus in which even a minute needle-like foreign matter or the like is less likely to be detected.

In order to achieve the above object, the inspection apparatus of the present invention is an inspection apparatus that determines the presence or absence of deposits on a product from a transmission X-ray image when the product is irradiated with X-rays, and should be inspected. X-ray irradiating means for irradiating a product with X-rays from a plurality of directions, a plurality of X-ray detectors for individually entering X-rays transmitted through the product from each direction, and each X-ray detector The output is individually imaged to determine the presence / absence of an adhering substance, and when it is determined that there is an adhering substance in at least one image, there is provided means for generating an output indicating that the article to be inspected has an adhering substance. A device for inspecting product deposits characterized by the above.

According to the present invention, the optical axes of the two sets of optical systems are arranged so as to intersect each other when viewed from the upstream in the transport direction. On the other hand, since the X-ray absorption amount of the foreign matter is increased, the foreign matter can be recognized. Accordingly, it is difficult for detection leakage to occur.
Moreover, if the detection cross section by X-ray of each optical system is provided on a plane orthogonal to the conveying direction of the conveyor, the change in the background due to the part of the product is reduced, so foreign matter can be easily identified. Accordingly, the detection accuracy of the inspection apparatus is improved, and detection leakage is less likely to occur.
In such a system, if it is determined that a foreign object is attached to the product based on the output from any one of the two sets of X-ray detectors, the product is rejected. .

  In the present invention, in addition to the two sets of optical systems, another optical system may be provided to detect foreign matter.

Configuration and Principle of the Invention Next, the principle of the present invention will be described with reference to FIGS.
As shown in FIG. 1, two sets of X-ray irradiation means 21 and 31 and X-ray detectors 22 and 32 are provided. The sets of the X-ray irradiation means 21 and 31 and the X-ray detectors 22 and 32 are arranged so as to cross each other when viewed from the upstream in the transport direction Y, and the first optical system 20 and the second optical system, respectively. A system 30 is configured. Both optical systems 20 and 30 are disposed at positions separated from each other in the transport direction when viewed from the side of the conveyor, and are provided on a plane intersecting the transport direction Y. First, after the first foreign matter is detected by the first optical system 20, the product M is conveyed to the position of the second optical system 30 and the second foreign matter is detected.

Principle 1:
Here, as shown in FIG. 1, for example, a needle-like foreign matter D is stuck in the product M, and the longitudinal axis of the foreign matter D is perpendicular to the X-ray L irradiation direction of the first optical system 20. When the first foreign object detection is near, the absorption amount of the foreign substance D is small, so that the X-ray L absorption by the product M itself becomes a large background and the foreign object D may not be recognized. . However, in this case, since the irradiation direction of the X-ray L of the second optical system 30 is along the longitudinal direction of the foreign matter D, the amount of X-ray L absorbed by the foreign matter D is large in the second foreign matter detection. Therefore, the foreign matter D can be recognized.

Principle 2:
By the way, as shown in FIG. 2A, it is conceivable to provide two sets of optical systems 20a and 30a on a plane which is obliquely forward and backward with respect to the transport direction Y. However, since the X-ray L is irradiated obliquely with respect to the product M in this way, the X-ray L passes along the large cross sections P1 and P2 as indicated by the broken lines. Therefore, the amount of X-ray L absorbed by the product M itself increases. Therefore, the difference between the absorption amount of the X-ray L at the end portion Me of the product M and the absorption amount of the other portion indicated by the broken line increases. As a result, the so-called background changes greatly depending on the detection location, making it difficult to determine foreign matter.
Therefore, in the present invention, as shown in FIG. 2 (b), the planes P3 and P4 through which the X-rays L entering the X-ray detectors 22 and 32 from the X-ray irradiation means 21 and 31 pass are parallel to each other. And it is preferable to set so as to be substantially orthogonal to the transport direction Y. By setting in this way, the X-ray L passes through the cross sections (detection cross sections) P3 and P4 orthogonal to the conveyance direction of the product M, so the amount of X-ray L absorbed by the product M becomes small. That is, since the background change is small, the foreign matter can be easily identified.

Hereinafter, an embodiment of the present invention will be described with reference to the drawings.
3 and 4 show a first embodiment of the present invention.

As shown in FIG. 3A, the inspection apparatus 1 provided on the product conveyance line has an X-ray shield box 1S provided with an entrance 1a and an exit 1b for the product M on both sides. First to third conveyors 51 to 53 are arranged in series in the X-ray shield box 1S. The first conveyor 51 has a starting end located at the inlet 1a, and the product M carried in from the inlet 1a reaches the third conveyor 53 via the second conveyor 52, and is carried out from the outlet 1b by the third conveyor 53. The

  In the X-ray shield box 1S, two sets of first and second optical systems 20 and 30 are provided at positions separated from each other in the transport direction when viewed from the side surfaces of the conveyors 51 to 53. The first optical system 20 includes a first X-ray irradiation unit 21 and a first X-ray detector 22, while the second optical system 30 includes a second X-ray irradiation unit 31 and a second X-ray detector 32. ing. The X-ray irradiation means 21 and 22 generate X-rays and irradiate the X-rays toward the X-ray detectors 22 and 32. The X-ray detectors 22 and 32 are composed of line sensors in which a large number of pixels are arranged at predetermined intervals in the width direction of the conveyor.

Dimensions that do not hinder delivery of the product M between the terminal end of the first conveyor 51 and the start end of the second conveyor 52 and between the terminal end of the second conveyor 52 and the start end of the third conveyor 53. The first and second gaps 50a and 50b are respectively provided. The optical axes S1 and S2 of both optical systems 20 and 30 are set at positions passing through the gaps 50a and 50b of the front and rear conveyors.
As shown in FIG. 3B, the optical axes S1 and S2 of the two sets of optical systems 20 and 30 are arranged so as to be bilaterally symmetrical and substantially orthogonal to each other when viewed from the upstream in the transport direction Y. Yes. Further, as shown in FIG. 3A, the two sets of optical systems 20 and 30 have parallel planes through which X-rays incident on the X-ray detectors 22 and 32 from the X-ray irradiation means 21 and 31 pass. And is set to be substantially orthogonal to the transport direction Y.
A sorting device 9 for line-out of defective products is provided downstream of the inspection device 1.

Next, the control configuration of the inspection apparatus will be described.
As shown in FIG. 4, the inspection device 1 is connected to the sorting device 9. The inspection apparatus 1 has a microcomputer 10. The microcomputer 10 is connected to the first and second optical systems 20 and 30, the display 4, the first to third conveyors 51 to 53, and the passage detector 8. Each device shown in FIG. 4 is connected through an interface (not shown).

The microcomputer 10 includes a CPU 11, a ROM 12 and a RAM 13. The CPU 11 includes an X-ray image processing unit 11a.
The X-ray image processing unit 11a continuously processes the output from the first X-ray detector 22 in the order of reception, thereby creating an image having a light / dark distribution corresponding to the amount of transmitted X-rays. The CPU 11 displays the image on the display 4. On the other hand, the CPU 11 performs the first foreign object detection as to whether or not there is a foreign object attached to the product M by determining whether or not there is a part whose brightness is significantly different from the peripheral part in the image. The pass / fail of the product M is determined.
The X-ray image processing unit 11a and the CPU 11 perform the same process on the output from the second X-ray detector 32, display the created image on the display 4, and perform second foreign object detection.
When the CPU 11 determines that a foreign object is attached to the product M in at least one of the first and second foreign object detection results, the CPU 11 rejects the product and sends a distribution signal. 9 to send.

Next, the operation of the inspection apparatus will be described.
The product M on the transport line is carried into the X-ray shield box 1S from the entrance 1a of the inspection apparatus 1 by the first conveyor 51 shown in FIG. The commodity M on the first conveyor 51 passes over the first gap 50a and transfers to the second conveyor 52. At the same time, the X-ray image processing unit 11 a creates an image based on the transmission X-ray detection signal from the first X-ray detector 22, and the CPU 11 displays the image on the display 4. At the same time, the CPU 11 performs first foreign object detection based on the image. In the first foreign object detection, when it is determined that the product M is rejected because the foreign matter is attached to the product M, a distribution signal is transmitted to the distribution device 9.

After the first foreign matter is detected, the product M on the second conveyor 52 passes over the second gap 50b and transfers to the third conveyor 53. At the same time, the X-ray image processing unit 11 a creates an image based on the transmission X-ray detection signal from the second X-ray detector 32, and the CPU 11 displays the image on the display 4. At the same time, the CPU 11 performs second foreign object detection. In the second foreign object detection, when it is determined that the product M is unacceptable, a distribution signal is transmitted to the distribution device 9.
Thereafter, the product M is conveyed out of the X-ray shield box 1S from the outlet 1b and sent to the downstream sorting device 9.

  In this configuration, in the foreign matter detection system, as described in the above-described Principle 1, even if the foreign matter is a needle-like foreign matter, at least one of the two optical systems 20 and 30 has X-rays of the foreign matter D. Since the amount of L absorbed increases, the foreign matter D can be recognized. In addition, as described in the above-described Principle 2, since the background change is small, foreign matter can be easily identified. Therefore, even a minute needle-like foreign material or the like is unlikely to leak.

In addition, since both optical systems 20 and 30 in the present invention are provided on a plane that intersects the transport direction Y, two sets of optical systems 20a and 30a are provided obliquely as shown in FIG. Rather, the overall length of the inspection apparatus can be shortened. Therefore, the inspection device can be made compact.

  In the first embodiment, the optical axes of both the optical systems 20 and 30 are set in the first and second gaps 50a and 50b in FIG. 3A. However, the gaps 50a and 50b are not provided, and the conveyor You may make it detect the X-ray which permeate | transmitted itself.

Further, as shown in FIG. 5A, the two optical systems 20 and 30 are brought close to each other so as not to interfere with each other, and the optical axes S1 and S2 of the two optical systems 20 and 30 are set to positions that pass through the same gap 50a. It may be provided.
Three or more optical systems may be provided. For example, as shown in FIG. 5B, a third optical system 30 </ b> A having an optical axis that is set obliquely downward and the like with respect to the transport direction Y may be provided.

FIG. 6 shows a second embodiment.
As shown in FIG. 6, the inspection apparatus of the second embodiment is for the products M1 and M2 conveyed on the two conveyors 51A (52A, 53A) and 51B (52B and 53B) arranged in parallel to each other. Foreign matter detection is performed.
The X-ray irradiation ranges of the first and second optical systems 20 and 30 are provided at positions where both the two products M1 and M2 to be conveyed can be irradiated. The detection range of the X-ray detectors 22 and 32 is divided into two by addresses, 22A, 22B and 32A, 32B, and two conveyors 51A (52A, 53A), 51B (52B) with one X-ray detector. , 53B) can detect foreign matter on the products M1 and M2 on the same time.
Other configurations are the same as those in the first embodiment, and the same parts or corresponding parts are denoted by the same reference numerals, and detailed description and illustration thereof are omitted.

It is a front view which shows the detection principle of the inspection apparatus of this invention. (A) is an inspection device not included in the present invention, (b) is a perspective view showing the detection principle of the inspection device according to the present invention. It is the schematic side view and schematic front view which show the test | inspection apparatus concerning 1st Embodiment of this invention. It is a schematic block diagram which shows the inspection apparatus . It is a schematic side view which shows other embodiment. It is a schematic front view which shows the inspection apparatus concerning 2nd Embodiment of this invention. It is a schematic perspective view which shows the conventional inspection apparatus .

Explanation of symbols

20: 1st optical system 21: 1st X-ray irradiation means 22: 1st X-ray detector 30: 2nd optical system 31: 2nd X-ray irradiation means 32: 2nd X-ray detector 51,51A, 51B: 1st conveyor 52 , 52A, 52B: second conveyor 53, 53A, 53B: third conveyor D: foreign matter M, M1, M2: product S1: optical axis S2: optical axis Y: transport direction

Claims (8)

Irradiating products conveyed by a conveyor with X-rays from the X-ray irradiation means, causing X-rays transmitted through the products to enter an X-ray detector, and detecting foreign matter adhering to or mixed in the products In the foreign matter inspection system that performs pass / fail judgment at
While providing two sets of the X-ray irradiation means and X-ray detector,
These two sets of X-ray irradiation means and X-ray detector are provided on a plane that intersects the conveying direction of the conveyor,
The foreign substance inspection system, wherein the two sets of X-ray irradiation means and the X-ray detector are arranged so that the optical axes of the two sets of optical systems cross each other when viewed from the upstream in the transport direction. In claim 1,
The foreign matter inspection system, wherein the two sets of X-ray irradiation means and the X-ray detector are arranged so that the optical axes of the two sets of optical systems are substantially orthogonal to each other when viewed from the upstream in the transport direction. In claim 1 or 2,
The foreign matter inspection system in which the optical axes of the two sets of optical systems are set at positions separated from each other in the transport direction when viewed from the side of the conveyor. In claim 1, 2 or 3,
A foreign matter inspection system in which the optical axes of the two sets of optical systems are set at positions that pass through a gap between the front and rear conveyors. In any one of Claims 1 thru | or 4,
A foreign matter inspection system in which the optical axes of the two sets of optical systems are set to be bilaterally symmetric when viewed from the upstream in the transport direction. In any one of Claims 1 thru | or 5,
The two sets of optical systems are foreign matter inspection systems in which planes through which X-rays incident on the X-ray detector from the X-ray irradiating means pass are parallel to each other and substantially orthogonal to the transport direction. In any one of Claims 1 thru | or 6,
A foreign matter inspection system in which the X-ray detector is composed of a line sensor. In any one of Claims 1 thru | or 6,
A foreign matter inspection system that rejects a product when it is determined that foreign matter is attached to or mixed in the product based on an output from any one of the X-ray detectors. .

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