JP2009053197A - Pattern inspection method and apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To detect images without detection image errors due to the effects of ions implanted to wafers, the presence of pattern connections, the shapes of pattern edges, etc. <P>SOLUTION: In a pattern inspection method, an object substrate is imaged to acquire its digital images. The digital images are used to mask patterns matched with a region previously registered on the basis of coordinate data or patterns matched with a pre-registered pattern, detect defects, and display detected defects. In the pattern inspection method, an object substrate is imaged to acquire its digital images. The digital images are used to detect defects. Defects matched with registered characteristics among detected defects are changed over between display and non-display or displayed in such a way as to be distinguishable from others. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to a substrate manufacturing apparatus having a circuit pattern such as a semiconductor device or a liquid crystal, and more particularly to a technique for inspecting a pattern of a substrate being manufactured.

  Conventional optical or electron beam pattern inspection apparatuses are disclosed in Japanese Patent Application Laid-Open No. 5-258703, Japanese Patent Application Laid-Open No. 11-160247, and Japanese Patent Application Laid-Open No. 61-278706. Gazette), patent document 4 (JP-A-7-5116), patent document 5 (JP-A-2-146682), patent document 6 (JP-A-9-312318), patent document 7 (JP-A-3-31516). 85742) and the like.

  As an example of an electron beam pattern inspection apparatus, the configuration of Patent Document 1 (Japanese Patent Laid-Open No. 5-258703) is shown in FIG. The electron beam 2 from the electron beam source 1 is deflected in the X direction by the deflector 3, irradiated onto the object substrate 5 through the objective lens 4, and simultaneously moving the stage 6 continuously in the Y direction, 5 where secondary electrons and the like 7 from 5 are detected by the detector 8, and the detection signal is A / D converted by the A / D converter 9 to be a digital image, which can be expected to be essentially the same in the image processing circuit 10. Compared with the digital image, a place where there is a difference is detected as a pattern defect 11, and the defect position is determined.

  As an example of the optical inspection apparatus, an apparatus configuration disclosed in Patent Document 2 (Japanese Patent Laid-Open No. 11-160247) is shown in FIG. The object substrate 5 is irradiated with light from the light source 21 via the objective lens 22, and reflected light at that time is detected by the image sensor 23. By repeating detection while moving the stage 6 at a constant speed, an image is detected as a detected image 24 and stored in the memory 25. Compared with the stored image 27 on the memory 25 which can be expected to be the same pattern as the detected image 24, if the same pattern is detected, it is detected as a normal part, and if the pattern is different, it is detected as a pattern defect 11 and the defect position is determined. It is. As an example, FIG. 3 shows a layout when the object substrate 5 is a wafer 31.

Dies 32 are formed on the wafer 31 to be finally separated and become individual products of the same type. The stage 6 is moved along the scanning line 33 and an image of the stripe region 34 is detected. If the detection position A is currently 35, the image of the detection position B36 on the memory 25 is taken out as a stored image 27 and compared. This compares with the pattern which can be expected to be the same pattern. Here, the memory 25 has a capacity capable of holding an image that can be expected to have the same pattern, and configures an actual circuit by reusing it in a ring shape.
In the following two examples, an object for which a defect is determined in a binary image is determined by checking whether the pattern is defective in synchronization with the detection of the pattern and ignoring a defect in a specific mask area. Yes.

  Patent Document 3 (Japanese Patent Application Laid-Open No. 61-278706) discloses an example of inspection of through holes in a printed board. Prepare a printed board that is perforated only in the area that should be the non-inspection area, detect the image of the printed board prior to inspection, and detect the necessity of masking by making a binary image with and without perforation. The image data is stored in the masking data storage unit. When the location where the difference is generated in the binary image at the time of inspection is the image region stored in the masking data storage unit, the difference is ignored and the inspection is not performed.

Patent Document 4 (Japanese Patent Laid-Open No. 7-5116) discloses an example of printed circuit board inspection. Pattern shape is detected and binarized, normal / abnormal is determined from the detected pattern, it is determined whether the detected pattern is in the regular pattern, and it is determined as abnormal only when the nonconforming pattern is in the regular pattern Is.
In the two examples described below, a dead zone is provided at the boundary for the purpose of allowing an error at the pattern boundary from the pattern information.

  Japanese Patent Application Laid-Open No. 2-146682 discloses an example of detection in which a mask pattern is compared with design information. By calculating a reduced image obtained by reducing the pattern by a certain width from the design information and an enlarged image obtained by enlarging the pattern by a certain width, and extracting the common part, a dead band having a certain width is provided. In other words, the mask area is set and inspected so as to ignore an error of a certain width at the pattern boundary portion from the design information.

  Patent Document 6 (Japanese Patent Laid-Open No. 9-312318) is an example of inspecting a pattern using a scanning electron microscope (hereinafter referred to as SEM). Since the fine shift of the pattern edge is not a defect from the reference image acquired in advance, the vicinity of the pattern edge is set as a region where a fatal defect does not occur, and an image of a region where a fatal defect does not occur is not acquired. When a difference from the reference image is recognized in the area where the image is acquired, it is determined as a defect.

  Patent Document 7 (Japanese Patent Laid-Open No. 3-85742) discloses an example of an apparatus for comparatively inspecting a pattern on a printed circuit board. The defect candidate image obtained by the comparison inspection is stored in the memory, and it is determined whether the defect is a true defect asynchronously with the inspection based on the stored image.

JP-A-5-258703, JP-A-11-160247, JP-A 61-278706, JP-A-7-5116, JP-A-2-146682, JP-A-9-312318, JP-A-3-85742

There is a place on the object having a large error in the detected pattern even in the normal part. For example, a region where ions are implanted to form a transistor. In the transistor portion, the location where ions are implanted and the location where they are not significant are significant, but the presence or absence of ion implantation in other wiring portions does not affect the characteristics. Therefore, ion implantation creates an implantation region with a rough mask. However, when an inspection is performed with an electron beam, the presence or absence of implantation is detected as a large detected image error even in the wiring portion, and it is erroneously determined as a defect.
Further, for example, in a power supply wiring layer in which redundant wiring is provided, even if there is no connection in a part of the wiring, it is normal if there is connection in another place. For this reason, there are cases where a rough pattern is formed and there are many unconnected patterns. A detected image error is detected with or without connection, and it is erroneously determined as a defect.

Further, for example, the amount of signal detected by the pattern edge differs depending on the film thickness and inclination. Although it is normal even if it is slightly different, it becomes a large detection signal amount error and is erroneously detected as a defect. Although these false detections are false detections, they also serve as an index for knowing the product level. First, it is preferable to recognize whether there is any type of false detection, and then to recognize other defects by excluding them.
In the conventional optical or electron beam pattern inspection apparatus disclosed in JP-A-5-258703 and JP-A-11-160247, a non-inspection area cannot be set.

  In the technique disclosed in JP-A-61-278706 and JP-A-7-5116, a non-inspection area is set, but in the example disclosed in JP-A-61-278706, It is necessary to set a non-inspection area in a very large inspection area with a bit pattern. When it is applied to wafer inspection, it is 7 trillion pixels (7 Tbit), which is practically impossible, considering that the inspection area with a diameter of 300 mm is inspected with 0.1 μm pixels. Further, in the invention disclosed in Japanese Patent Application Laid-Open No. 7-5116, except for the regular pattern portion, it is a non-inspection area. However, in the case of a wafer pattern, since it is composed of a very complicated pattern, a simple rule is used. The non-inspection area cannot be set only by using the property.

  The non-inspection areas described in JP-A-2-146682, JP-A-9-312318 and the like are limited to the pattern edges, and therefore, the non-inspection areas cannot be set at necessary places.

  In the method described in Japanese Patent Laid-Open No. 3-85742, the image information of the defect candidate portion is stored, and a detailed inspection is performed based on the stored image information to determine whether or not the defect is a true pattern. It can correspond to the shape. However, it is determined whether or not the defect is a uniform standard, and those that are not defective are considered normal parts. That is, information once lost to the normal part is lost.

  As described above, in conventional inspection, the user cannot set a non-inspection area that is effective for an apparatus that inspects a complicated and large area such as a wafer, and even a normal part has a large error in the detected image. However, it cannot be said that sufficient consideration has been given to the detection of stable fine defects while giving consideration to erroneous detection of defects.

  SUMMARY OF THE INVENTION An object of the present invention is to provide a pattern inspection method and apparatus that solves the above-described problems of the prior art and that enables a user to easily set a non-inspection area, which is effective for an apparatus for inspecting a large area. It is to provide.

  In order to achieve the above object, in the present invention, the pattern inspection apparatus is configured as shown in FIG. 4, for example. Here, a configuration using an electron beam is shown, but it is essentially the same as the optical type. An electron beam source 1 that generates an electron beam 2, a deflector 3 that deflects the electron beam 2, an objective lens 4 that converges the electron beam 2 on the object substrate 5, and the object substrate 5 are held, scanned, or Originally based on the stage 6 for positioning, the detector 8 for detecting secondary electrons 7 from the object substrate 5, the A / D converter 9 for A / D converting the detection signal into a digital image, and the digital image Image processing circuit 10 that detects a place where there is a difference as a defect candidate 40 compared with a digital image at a place where it can be expected to be the same, a defect that stores feature quantities such as coordinates, projection length, and image information of the defect candidate 40 Of the pattern defects 11 stored in the candidate storage unit 41 and the defect candidate storage unit 41, those on the mask region 42 (displayed in FIG. 5) designated in advance as coordinate information are mask defects 43 (displayed in FIG. 5). Mask as flag An operation screen 45 for displaying or editing the pattern defect 11 from the setting unit 44 and the mask setting unit 44, the image display of the position of the specific pattern defect 11, and the mask area 42 is provided.

  Next, the operation of the above configuration will be described. First, the mask region 42 will be described with reference to FIG.

  On the target substrate 5, there is a region having a large error even in a normal portion, such as the ion implantation region 50. Ions are implanted into the implantation portion 52 other than the pattern 51 to be implanted with ions. Even if the shifted driving portion 52 is shifted, it is a normal portion that does not affect the characteristics even if it is shifted, but is detected as the pattern defect 11. Therefore, a region including the ion implantation region 50 is set as the mask region 42, and a defect therein is handled as the mask defect 43. In addition, since the same die is repeated on the wafer 31, the coordinates in determining the area are the coordinates in the die, and even if different dies, if the coordinates in the die are the same, they are regarded as the same. If it is included in the specified area, it is considered to be included in the area. In the case of the wafer 31, the repeatability includes shots other than the die. A shot is a drawing unit of an exposure apparatus that is a manufacturing apparatus. Depending on the target false detection, a shot may be more appropriate than a die. In the following description, only the die will be described. However, it is obvious that it is not described with respect to a configuration in which a shot and a die can be switched even if it is replaced with a shot.

  There are a condition setting for determining the mask area 42 and an inspection for detecting a defect generated outside the mask area 42 among the detected defect candidates 40 as a pattern defect.

  Conditioning clears the mask area 42, deflects the electron beam 2 from the electron beam source 1 in the X direction by the deflector 3, irradiates the target substrate 5 through the objective lens 4, and simultaneously irradiates the stage 6 in the Y direction. , The secondary electrons 7 from the object substrate 5 are detected by the detector 8, and the detection signal is A / D converted by the A / D converter 9 to obtain a digital image. In comparison with a digital image of a place where it can be expected to be the same, a place where there is a difference is defined as a defect candidate 40, and its feature amount such as coordinates, projection length, image information, or image data is stored in the defect candidate storage unit 41. All of them are determined as pattern defects 11 by the mask setting unit 44, and the pattern defects 11 are displayed on the map display unit 55 on the operation screen 45 shown in FIG. Pattern defect 11 on screen 45 (FIG. 6 Then, both the true defect 57 and the defect 58 not to be detected are selected, and the image of the selected pattern defect 11 is displayed on the image display unit 56 on the operation screen 45, and the image displayed on the image display unit 56 is displayed. Based on this, the user classifies the pattern defect 11 into the true defect 57 and the defect 58 that the user does not want to detect, and displays the result as symbol information on the map display unit 55.

  After classification, the true defect 57 shown in FIG. 7, the defect 58 not to be detected, the map display unit 55 in which the current position 59 is enlarged, and the mask area 42 for displaying the image of the current position 59 on the image display unit 56 are designated. Switch to the screen you want to use. The position of the pattern defect 11 is displayed on the map display unit 55. The coordinates of the mask region 42 are set so as not to detect the defect 51 that is not desired to be detected while referring to the displayed classification information of the pattern defect 11 and the display image at the current position. If necessary, the conditions are set again, and the coordinates of the mask area 42 are set more finely.

  In the inspection, the electron beam 2 from the electron beam source 1 is deflected in the X direction by the deflector 3 and irradiated onto the target substrate 5 through the objective lens 4, and at the same time the stage 6 is continuously moved in the Y direction, Secondary electrons 7 from the target substrate 5 are detected by the detector 8, and the detection signal is A / D converted by the A / D converter 9 to be a digital image, which is essentially the same in the image processing circuit 10. Compared with a digital image of a place that can be expected, a place having a difference is set as a defect candidate 40, and its coordinates, projection length, image information and other feature quantities or image data are stored in the defect candidate storage unit 41, and the defect is determined. When the coordinates of the mask area 42 are not specified in the part 43, the pattern defect 11 is confirmed and the pattern defect 11 is displayed on the map display part 55 so as to overlap the display of the target substrate 5. Defects that have not been confirmed are also retained and can be displayed again by switching the display. Thereby, even a normal part having a large error can be inspected without being erroneously detected as a defect.

  The mask setting unit 44 determines a defect that is not to be detected by the configuration and the action. Although an example using coordinates is shown in the mask setting unit 44, the same effect can be expected from the identification using the pattern information and feature amount of the defect portion image. The signal amount of the edge to be solved does not occur at a specific coordinate, and there is a feature in which the pattern is an edge. Therefore, identification using the feature amount is performed.

  Further, although the masking method has been described, a method of inspecting a portion corresponding to the mask region by another inspection method or an inspection by another standard, instead of a mask that does not inspect a simple defect. In this case, the defect determination can be performed again on the defect candidate 40 stored in the defect candidate machine unit 41 under the conditions specified by the user after the inspection.

  As a result, the user can set a non-inspection area that is effective for a device that inspects a complex and large area such as a wafer, and even a normal part has a large error in the detected image and is erroneously detected as a defect. In addition, it is possible to detect minute defects while giving consideration to what is done.

  According to the present invention, a user can set an effective non-inspection area for a device that inspects a complicated and large area such as a wafer, and even a normal part has a large error in a detected image, There is a feature that fine defects can be detected while giving consideration to erroneous detection.

Hereinafter, embodiments of the present invention will be described with reference to specific drawings.
(First embodiment)
A first embodiment of the present invention will be described. FIG. 8 shows the configuration of the first embodiment. Electron beam source 1 for generating electron beam 2, electron beam 2 from electron beam source 1 is accelerated by an electrode and taken out, and an electron gun 102 and virtual light source 101 that make virtual light source 101 at a fixed place by an electrostatic or magnetic field superimposing lens A blanking plate 104 for controlling ON / OFF of the electron beam 2 and the electron beam 2 in the XY directions are installed in the vicinity of the position converged by the condenser lens 103 and the electron gun 102 for converging the electron beam 2 to a certain place. An electron optical system 106 composed of a deflector 105 for deflecting and an objective lens 4 for converging the electron beam 2 on the target substrate 5, a sample chamber 107 for holding the wafer 31 as the target substrate in a vacuum, and the wafer 31 are mounted. A stage 6 to which a retarding voltage 108 that enables detection of an image at an arbitrary position is applied, a detector 8 that detects secondary electrons 7 from the object substrate 5, and the detector 8. An A / D converter 9 that obtains a digital image by A / D converting the output detection signal, a memory 109 that stores the digital image, and a stored image stored in the memory 109 and a digital image that has undergone A / D conversion In comparison, the image processing circuit 10 that detects a place where there is a difference as the defect candidate 40, the defect candidate storage unit 41 that stores the feature amount such as coordinates, projection length, and image information of the defect candidate 40, control of the entire apparatus and the defect The feature amount of the pattern defect 11 stored in the candidate storage unit 41 is received, the mask area 42 is included as area information, and the mask defect 42 (displayed in FIG. 5) is present on the mask area 42 (displayed in FIG. 5). An overall control unit 110 for setting a flag (control lines from the overall control unit 110 are omitted in the drawing), display of a pattern defect 11, an image display of a position of a specific pattern defect 11, and a mask area 42 The operation screen 45 for displaying or editing, the keyboard 120 for instructing the operation, the mouse 121, the knob 122 (all not shown), the height of the wafer 31 are measured, and the current value of the objective lens 4 is added with the offset 112. The Z sensor 113 that keeps the focal position of the detected digital image constant by controlling the load, the loader 116 (not shown) that moves the wafer 31 in the cassette 114 in and out of the sample chamber 107, and the outer shape of the wafer 31 An orientation flat detector 117 (not shown) for positioning the wafer 31 with respect to a reference, an optical microscope 118 for observing a pattern on the wafer 31, and a standard sample piece 119 provided on the stage 6.

  The operation of the first embodiment will be described. The operation includes a condition determination for determining the mask region 42 and an inspection for detecting a defect generated in a detected defect candidate 40 other than the mask region 42 as a pattern defect.

  In the condition setting, the start screen shown in FIG. 9 is displayed on the operation screen 45, the user selects the shelf number where the target wafer 31 exists with the shelf number selection component 130, and the target wafer 31 with the recipe selection component 131. When the recipe creation start button 132 is pressed, the condition setting is started. For condition determination, contrast setting for setting the conditions of the electron optical system, pattern layout setting for the wafer 31, alignment for positioning the pattern of the wafer 31, and signal amount confirmation at a place where the signal amount of the wafer 31 is accurately expressed. There are calibration, inspection condition setting, mask area setting, and setting condition confirmation in trial inspection. Here, three points of related contrast setting, mask area setting, and trial inspection will be described.

The overall control unit 110 instructs each unit to operate according to the following procedure.
First, an instruction is given to a loader 116 (not shown). The loader 116 takes out the wafer 31 from the cassette 114, positions the wafer with an orientation flat detector 117 (not shown) on the basis of the outer shape, and places the wafer 31 on the stage 6. And the inside of the sample chamber 107 is evacuated. Along with the mounting, conditions for the electron optical system 106 and the retarding voltage 108 are set, and a voltage is applied to the blanking plate 104 to turn off the electron beam 2. The stage is moved to the standard sample piece 119, the output of the Z sensor 113 is made effective, the focal position of the electron beam 2 by the electron optical system 106 is kept constant at the detected value of the Z sensor 113 + the offset 112, and the deflector 105 is The raster scanning is performed, the voltage of the blanking plate 104 is turned off in synchronization with the scan, and the electron beam 2 is irradiated to the wafer 31 only when necessary, and the reflected electrons or secondary electrons generated from the wafer 31 at that time are detected by the detector 8. The A / D converter 9 generates a digital image. A plurality of digital images are detected by changing the offset 112, and the optimum offset 111 that gives the highest sum of the differential values of the images in the overall control unit 110 for each detection is set as the current offset value.

  After setting the offset value, the output of the Z sensor 113 is invalidated, and the screen is changed to the contrast adjustment screen shown in FIG. The contrast adjustment screen moves the map display and the entire wafer or die, etc., and the button that controls the map display method and the mouse (not shown in the figure). A map display unit 55 having a mouse operation instruction button 140 for instructing, an image display part, an image magnification, an optical microscope image on the optical microscope 118, or an SEM image on the electron optical system 106, and an image for designating an image type The image display unit 56 includes a switching button 141, a recipe creation item selection button 142, a recipe creation end button 133, and a recipe save button 134. On the contrast adjustment screen, the mouse operation instruction button 140 is set to the movement mode, and the mouse 121 is clicked to move on the map, and an image of the place is displayed on the image display unit. An electron optical system adjustment item is assigned to the knob 122 and each part of the electron optical system 106 is adjusted to obtain an appropriate contrast.

  The recipe creation end button 133, the recipe save button 134, and the recipe creation item selection button 142 are buttons common to all screens for instructing recipe creation end, recipe condition saving, setting of another condition and screen transition, respectively. is there. By switching the recipe creation item selection button 142 to the trial inspection, a transition is made to the trial inspection start screen shown in FIG.

  The trial inspection start screen includes a map display unit 55, a recipe creation end button 133, a recipe storage button 134, a recipe creation item selection button 142, an inspection start button 143, and an inspection end button 144. The mouse operation selection button 140 is in a selection mode. When the user clicks a die on the map display unit, the selection / non-selection of the die to be inspected is switched as a trial, and the die to be inspected is selected. After selecting the die to be inspected, the start of trial inspection is instructed by the inspection start button 143. When the trial inspection is started, the stage 6 is moved and moved to the scanning start position of the area to be inspected of the mounted wafer 31. The offset 112 is set by adding an offset specific to the wafer measured in advance, the Z sensor 113 is enabled, the stage 6 is scanned in the Y direction along the scanning line 33 shown in FIG. 3, and is synchronized with the stage scanning. Then, the deflector 105 is scanned in the X direction, the voltage of the blanking plate 104 is turned off during the effective scanning, and the electron beam 2 is irradiated and scanned on the wafer 31. Reflected electrons or secondary electrons generated from the wafer 31 are detected by the detector 8, and a digital image of the stripe region 34 is obtained by the A / D converter 9 and stored in the memory 109. After the scanning of the stage 6 is completed, the Z sensor 113 is invalidated. By repeating the stage scanning, the entire necessary area is inspected. When the entire surface of the wafer 31 is inspected, the inspection is performed in the order shown in FIG.

  When the detection position A 35 is detected by the image processing circuit 10, a place that is different from the image of the detection position B 36 stored in the memory 109 is extracted as the defect candidate 40, and the list of pattern defects 11 is extracted. Is transmitted to the overall control unit 110. The overall control unit 110 receives the feature amount of the pattern defect 11 from the defect candidate storage unit 41, and sets a flag on the feature amount with the pattern defect 11 on the mask area 42 registered in the recipe as the mask defect 43. After the inspection of the necessary area, the defect confirmation screen shown in FIG. 13 is displayed.

The defect confirmation screen displays the defect feature quantity, the defect display editing component 150 that can edit the classification, and the current position display 59 that indicates the current position and the pattern defect 11 that displays the classification number as a symbol together with the layout information of the wafer 31. The map display unit 55, the image display unit 56 displaying an image at the current position, the display switching button 151 for switching display / non-display of the mask defect 43, and the various buttons described above. When the mouse operation instruction button 140 is set to the selection mode and the pattern defect 11 is clicked, the image is displayed on the image display unit 56 and the feature amount is displayed on the defect display editing component 150. The pattern defect 11 is classified based on the image and the feature amount, and the defect display editing component 150 assigns a classification number to the feature amount of the pattern defect 11. At this time, a specific classification number is assigned to the defect to be masked so that it can be identified on the map. After the classification is completed, the screen is changed to the mask area setting screen shown in FIG. 14 by the recipe creation item selection button. In addition, the test end button returns to the trial test initial screen.

  The mask area setting screen displays a current position display 59 indicating the current position, a map display unit 55 displaying the pattern defect 11 and the mask area 42 with the classification number symbolized together with the layout information of the wafer 31, and an image of the current position. The image display unit 56, the display switching button 151 for switching display / non-display of the mask defect 43, the new region button 160 for instructing the creation of a new mask region, the completion button 161 for instructing the end of the region creation, and already It consists of the various buttons described. The map display unit 55 displays the entire die area, and displays the pattern defects 11 and the current position display 59 of all the dies in coordinates within the die.

  When the mouse operation instruction button 140 is set to the movement mode and the vicinity of the classification number of the defect to be masked is clicked, the mouse moves to that point and the image is displayed on the image display unit 56. If it is determined that the area is to be masked, the new creation button 160 is pressed to enter the area creation mode, and the area is determined by clicking the upper left and lower right of the area on the image display area. The determined area is displayed as a mask area 42 on the map display unit 55. After the area is created, display / non-display of the mask defect 43 is switched by the display switching button 151 to confirm that the defect to be masked is not displayed. When the necessary mask area 42 is set, information on the mask area 42 is stored in the recipe by pressing a recipe storage button 134.

  After the saving is completed, the completion button 161 is used to return to the test inspection defect confirmation screen. Furthermore, the inspection end button 144 on the defect confirmation screen returns to the trial inspection initial screen. It is also possible to set a test inspection die again and perform a test inspection. When the confirmation is completed, the recipe end button 133 is pressed to complete the recipe creation. At the end of production, the wafer 31 is unloaded and returned to the original cassette 114.

  Next, an inspection for detecting a defect occurring outside the mask region 42 as a pattern defect will be described. In the inspection, the start screen shown in FIG. 9 is displayed on the operation screen 45, the user selects the shelf number where the target wafer 31 exists by the shelf number selection component 130, and the recipe selection component 131 sets the target wafer 31. An inspection is started by designating a product type and a process and pressing an inspection start button 330. The inspection is performed after loading, alignment, and calibration of the wafer, and then performing inspection processing. After defect confirmation and defect output, the wafer is unloaded and terminated. Here, inspection processing and defect confirmation related to the present invention will be described.

  The start of inspection is instructed by the inspection start button 330. When the inspection is started, the stage 6 is moved and moved to the scanning start position of the region to be inspected of the mounted wafer 31. The offset 112 is set by adding an offset specific to the wafer measured in advance, the Z sensor 113 is enabled, the stage 6 is scanned in the Y direction along the scanning line 33 shown in FIG. 3, and is synchronized with the stage scanning. Then, the deflector 105 is scanned in the X direction, the voltage of the blanking plate 104 is turned off during the effective scanning, and the electron beam 2 is irradiated and scanned on the wafer 31. Reflected electrons or secondary electrons generated from the wafer 31 are detected by the detector 8, and a digital image of the stripe region 34 is obtained by the A / D converter 9 and stored in the memory 109. After the scanning of the stage 6 is completed, the Z sensor 113 is invalidated. By repeating the stage scanning, the entire necessary area is inspected. When the entire surface of the wafer 31 is inspected, the inspection is performed in the order shown in FIG.

  When the detection position A 35 is detected by the image processing circuit 10, a place having a difference is extracted as a defect candidate 40 by comparing with the image of the detection position B 36 stored in the memory 109, and a list of pattern defects 11 is created. And transmitted to the overall control unit 110. The overall control unit 110 receives the feature amount of the pattern defect 11 from the defect candidate storage unit 41, and sets a flag on the feature amount with the pattern defect 11 on the mask area 42 registered in the recipe as the mask defect 43. After the inspection of the necessary area, the defect confirmation screen shown in FIG. 15 is displayed.

  The defect confirmation screen displays the defect feature quantity, the defect display editing component 150 that can edit the classification, and the current position display 59 that indicates the current position and the pattern defect 11 that displays the classification number as a symbol together with the layout information of the wafer 31. The map display unit 55 includes an image display unit 56 that displays an image at the current position, a display switching button 151 that switches between display and non-display of the mask defect 43, and an inspection end button 144 that instructs the end of the inspection. .

  When the mouse operation instruction button 140 is set to the selection mode and the pattern defect 11 is clicked, the image is displayed on the image display unit 56 and the feature amount is displayed on the defect display editing component 150. The pattern defect 11 is classified based on the image and the feature amount, and the defect display editing component 150 assigns a classification number to the feature amount of the pattern defect 11. By switching with the display switching button 151 for switching display / non-display of the mask defect 43, the pattern defect 11 in the mask region 42 can be hidden. The defect confirmation step is terminated by the inspection end button 144, and the classified pattern defects 11 and their feature quantities are stored in storage means (not shown) in the overall control unit, and via a communication line (not shown). Output to an external storage means (not shown) or other inspection or observation means (none shown) to return to the initial screen.

  According to the present embodiment, there is a feature that the entire surface of the wafer is inspected by using the SEM image without being confused by the pattern defect 11 in the mask region 42 to detect only the true pattern defect 57 and present them to the user. .

  Further, according to the present embodiment, since defects in the mask region 42 can be displayed, for example, in the case of a redundant power supply wiring layer formed roughly as shown in the problem to be solved. Also, there is a feature that the roughness can be determined by switching to the display.

  Further, according to the present embodiment, there is a feature that only a place necessary for setting the mask area 42 can be surely masked so as to mask erroneous detection obtained under actual inspection conditions.

  Further, according to the present embodiment, since the mask area 42 can be added, even if the condition is determined by an object with a small accidental error, a necessary place can be obtained by setting the mask area 42 again. Can be reliably masked.

  The first modification of the present embodiment is implemented by hardware as a part of an image processing function, instead of being configured by a computer system that performs mask area management and overall control. According to this modification, although it is essentially the same, the inspection is generally limited by the limit of the number of defects output from the hardware. There is a feature that the restriction can be removed by masking with image processing hardware.

  Although the second modification of the present embodiment has been described with only one type of mask region, a plurality of types of mask regions can be set. According to this modification, it is possible to separately manage false detections that occur due to multiple types of factors, switch between displaying and not displaying for each factor, and recognizing how each factor is occurring. There is a feature that can eliminate only the minimum necessary false detection.

  In the third modification of the present embodiment, the mask is not set by the user on the mask area setting screen, but is automatically defined as a rectangle having a size about twice the projection length of the pattern defect 58 that is not desired to be detected. The adjacent mask regions are merged to generate a mask region from information on the pattern defects 11 classified without user intervention. According to this modification, it can be generated automatically and can be specified more finely. For example, even in the case of setting several hundred mask regions, there is an easy feature if automatic setting is performed. In addition, as a further modification of this modification, a configuration in which an automatically set area is redefined and edited can be considered.

  In a third modification of the present embodiment, a known rough pattern such as a mask region for power supply wiring and an implantation mask is obtained from design information. According to this modification, the user can save the input effort and can set all the rough patterns with the possibility of erroneous detection without omission.

  In the fourth modification of the present embodiment, the pattern defect 11 is not displayed on the layout information held in the inspection apparatus, but is displayed on a CAD terminal connected via a network. According to this modification, there is a feature that it is possible to easily know which layer is a problem, which is a rough pattern or a fine pattern.

(Second embodiment)
A second embodiment of the present invention will be described. FIG. 16 shows the configuration of the second embodiment. Electron beam source 1 for generating electron beam 2, electron beam 2 from electron beam source 1 is accelerated by an electrode and taken out, and an electron gun 102 and virtual light source 101 that make virtual light source 101 at a fixed place by an electrostatic or magnetic field superimposing lens A blanking plate 104 for controlling ON / OFF of the electron beam 2 and the electron beam 2 in the XY directions are installed in the vicinity of the position converged by the condenser lens 103 and the electron gun 102 for converging the electron beam 2 to a certain place. An electron optical system 106 composed of a deflector 105 for deflecting and an objective lens 4 for converging the electron beam 2 on the target substrate 5, a sample chamber 107 for holding the wafer 31 as the target substrate in a vacuum, and the wafer 31 are mounted. A stage 6 to which a retarding voltage 108 that enables detection of an image at an arbitrary position is applied, a detector 8 that detects secondary electrons 7 from the object substrate 5, and the detector 8. An A / D converter 9 that obtains a digital image by A / D converting the output detection signal, a memory 109 that stores the digital image, and a stored image stored in the memory 109 and a digital image that has undergone A / D conversion In comparison, the image processing circuit 201 for changing the image processing condition 201 for each designated image processing area 200 and detecting a place where there is a difference as the pattern defect 11, coordinates of the pattern defect 11, projection length, image information, etc. An overall control unit 110 that receives the feature amount 203 (control lines from the overall control unit 110 are not shown in the drawing), and displays the pattern defect 11 and the image display of the position of the specific pattern defect 11 and the image processing area 200 or Measure the height of the operation screen 45 for editing, the keyboard 120 for instructing the operation, the mouse 121, the knob 122 (all not shown), and the wafer 31. A Z sensor 113 that keeps the focal position of the detected digital image constant by controlling the current value of the objective lens 4 by adding the offset 112, and a loader 116 that takes the wafer 31 in the cassette 114 into and out of the sample chamber 107 ( (Not shown), an orientation flat detector 117 (not shown) for positioning the wafer 31 with reference to the outer shape of the wafer 31, an optical microscope 118 for observing a pattern on the wafer 31, and the stage 6 It consists of a provided standard sample piece 119.

  The operation of the second embodiment will be described. The operation includes a condition determination for determining the image processing area 200 and the image processing condition 201 of the area, and an inspection for detecting the pattern defect 11.

  In the condition setting, the start screen shown in FIG. 9 is displayed on the operation screen 45, the user selects the shelf number where the target wafer 31 exists with the shelf number selection component 130, and the target wafer 31 with the recipe selection component 131. When the recipe creation start button 132 is pressed, the condition setting is started. For condition determination, contrast setting for setting the conditions of the electron optical system, pattern layout setting for the wafer 31, alignment for positioning the pattern of the wafer 31, and signal amount confirmation at a place where the signal amount of the wafer 31 is accurately expressed. There are settings for calibration and inspection conditions, image processing area 200 for setting the image processing area 200 and the image processing condition 201 for the area, and confirmation of setting conditions for trial inspection. Here, three points of related settings of contrast, image processing area setting, and trial inspection will be described.

  When started, the overall control unit 110 instructs each unit to operate according to the following procedure. An instruction is given to a loader 116 (not shown), and the loader 116 takes out the wafer 31 from the cassette 114, positions the wafer based on the outer shape by an orientation flat detector 117 (not shown), and mounts the wafer 31 on the stage 6. Then, the sample chamber 107 is evacuated. Along with the mounting, conditions for the electron optical system 106 and the retarding voltage 108 are set, and a voltage is applied to the blanking plate 104 to turn off the electron beam 2. The stage is moved to the standard sample piece 119, the Z sensor 113 is enabled and the focus is kept constant at the detected value value of the Z sensor 113 + the offset 112, the deflector 105 is raster scanned, and the blanking plate 104 is synchronized with the scan. The voltage is turned off, and the electron beam 2 is irradiated onto the wafer 31 only when necessary. At that time, reflected electrons or secondary electrons generated from the wafer 31 are detected by the detector 8 and converted into a digital image by the A / D converter 9. A plurality of digital images are detected by changing the offset 112, and for each detection, an optimum offset 111 that maximizes the sum of the differential values of the images in the image is set as the current offset value.

  After the setting, the Z sensor 113 is invalidated, and the screen is changed to the contrast adjustment screen shown in FIG. The contrast adjustment screen instructs the operation to move the map display and select the item when it is selected with the mouse and the button (not shown in the figure) that controls the map display method and the map display method. Map display unit 55 having a mouse operation instruction button 140 for performing image switching, and an image switching button for designating a portion for displaying an image, a magnification of the image, an optical microscope image on the optical microscope 118 or an SEM image on the electron optical system 106, and an image type The image display unit 56 includes a recipe creation item selection button 142, a recipe creation end button 133, and a recipe save button 134. On the contrast adjustment screen, the mouse operation instruction button 140 is set to the movement mode, and the mouse 121 is clicked to move on the map, and an image of the place is displayed on the image display unit. An electron optical system adjustment item is assigned to the knob 122 and each part of the electron optical system 106 is adjusted to obtain an appropriate contrast. The recipe creation end button 133, the recipe save button 134, and the recipe creation item selection button 142 are buttons common to all screens for instructing recipe creation end, recipe condition saving, setting of another condition and screen transition, respectively. is there. By switching the recipe creation item selection button 142 to the trial inspection, a transition is made to the trial inspection start screen shown in FIG.

The trial inspection start screen includes a map display unit 55, a recipe creation end button 133, a recipe storage button 134, a recipe creation item selection button 142, an inspection start button 143, and an inspection end button 144. The mouse operation selection button 140 is in a selection mode. When the user clicks a die on the map display section, the selection / non-selection of the die to be inspected is switched as a trial, and the die to be inspected is selected. After selecting the die to be inspected, the start of trial inspection is instructed by the inspection start button 143. When the trial inspection is started, the stage 6 is moved and moved to the scanning start position of the area to be inspected of the mounted wafer 31.
The offset 112 is set by adding an offset specific to the wafer measured in advance, the Z sensor 113 is enabled, the stage 6 is scanned in the Y direction along the scanning line 33 shown in FIG. 3, and is synchronized with the stage scanning. Then, the deflector 105 is scanned in the X direction, the voltage of the blanking plate 104 is turned off during the effective scanning, and the electron beam 2 is irradiated and scanned on the wafer 31. Reflected electrons or secondary electrons generated from the wafer 31 are detected by the detector 8, and a digital image of the stripe region 34 is obtained by the A / D converter 9 and stored in the memory 109. After the scanning of the stage 6 is completed, the Z sensor 113 is invalidated. By repeating the stage scanning, the entire necessary area is inspected. When the entire surface of the wafer 31 is inspected, the inspection is performed in the order shown in FIG.

  When the detection position A 35 is detected by the image processing circuit 200, a place where there is a difference is extracted as the pattern defect 11 compared with the image of the detection position B 36 stored in the memory 109, and a list of the pattern defects 11 is created. And transmitted to the overall control unit 110. After the inspection of the necessary area, the defect confirmation screen shown in FIG. 13 is displayed.

  The defect confirmation screen displays the defect feature quantity, the defect display editing component 150 that can edit the classification, and the current position display 59 that indicates the current position and the pattern defect 11 that displays the classification number as a symbol together with the layout information of the wafer 31. The map display unit 55, the image display unit 56 displaying an image at the current position, the display switching button 151 for switching display / non-display of the mask defect 43, and the various buttons described above.

  When the mouse operation instruction button 140 is set to the selection mode and the pattern defect 11 is clicked, the image is displayed on the image display unit 56 and the feature amount is displayed on the defect display editing component 150. The pattern defect 11 is classified based on the image and the feature amount, and the defect display editing component 150 assigns a classification number to the feature amount of the pattern defect 11. At this time, a specific classification number is assigned to the defect to be masked so that it can be identified on the map. After the classification is completed, the screen is changed to the image processing area setting screen shown in FIG. 17 using the recipe creation item selection button. In addition, the test end button returns to the trial test initial screen.

  The image processing area setting screen 205 includes a current position display 59 indicating the current position, a pattern defect 11 displaying a classification number as a symbol, and a map display section 55 displaying the image processing area 200 together with layout information of the wafer 31, and the current position. Using the image display unit 56 displaying the image, the image data of the feature amount 203 of the pattern defect 11, the defect redisplay button 207, the new region button 160 for instructing creation of a new mask region, and the end of region creation are instructed The completion button 161 and the various buttons already described. The map display unit 55 displays the entire die area, and displays the pattern defects 11 and the current position display 59 of all the dies in coordinates within the die. The mouse operation instruction button 140 is set to the movement mode, and the image processing condition 201 is clicked in the vicinity of the defect classification number to be changed to move to that point, and the image is displayed on the image display unit 56.

  When it is determined that the image processing condition 201 is an area to be changed, a new creation button 160 is pressed to enter the area creation mode, and the area is determined by clicking the upper left and lower right of the area on the image display area. The image processing condition number 206 is matched with the classification number. The image information in the feature amount 203 of the pattern defect 11 with the classification number matching the image processing condition number 206 is referred to, and the image processing circuit is used or software on the computer in the overall control unit does not detect all as defects. In this way, the image processing condition 201 of the image processing condition number 206 is set. Manually adjust conditions as needed. Also, the special condition valid / invalid button 208 is used to specify whether or not to apply the image processing condition 201 at the time of inspection. The determined area is displayed on the map display unit 55 as the image processing area 200 together with the image processing condition number 206. After the area is created, it is confirmed with the defect redisplay button 207 that the pattern defect 11 belonging to each image processing area 200 is not displayed. When the necessary image processing area 200 is set, the recipe storage button 134 is pressed to save the information on the image processing area 200, the image processing condition number 206 corresponding to the area, and the image processing condition 201 for each image processing number.

  After the saving is completed, the completion button 161 is used to return to the test inspection defect confirmation screen. Furthermore, the inspection end button 144 on the defect confirmation screen returns to the trial inspection initial screen. It is also possible to set a test inspection die again and perform a test inspection. When the confirmation is completed, the recipe end button 133 is pressed to complete the recipe creation. At the end of production, the wafer 31 is unloaded and returned to the original cassette 114.

  Next, the inspection will be described. In the inspection, the start screen shown in FIG. 9 is displayed on the operation screen 45, the user selects the shelf number where the target wafer 31 exists by the shelf number selection component 130, and the recipe selection component 131 sets the target wafer 31. An inspection is started by designating a product type and a process and pressing an inspection start button 330. The inspection is performed after loading, alignment, and calibration of the wafer, and then performing inspection processing. After defect confirmation and defect output, the wafer is unloaded and terminated. Here, inspection processing and defect confirmation related to the present invention will be described.

  The start of inspection is instructed by the inspection start button 330. When the inspection is started, the stage 6 is moved and moved to the scanning start position of the region to be inspected of the mounted wafer 31. The offset 112 is set by adding an offset specific to the wafer measured in advance, the Z sensor 113 is enabled, the stage 6 is scanned in the Y direction along the scanning line 33 shown in FIG. 3, and is synchronized with the stage scanning. Then, the deflector 105 is scanned in the X direction, the voltage of the blanking plate 104 is turned off during the effective scanning, and the electron beam 2 is irradiated and scanned on the wafer 31. Reflected electrons or secondary electrons generated from the wafer 31 are detected by the detector 8, and a digital image of the stripe region 34 is obtained by the A / D converter 9 and stored in the memory 109. After the scanning of the stage 6 is completed, the Z sensor 113 is invalidated. By repeating the stage scanning, the entire necessary area is inspected. When the entire surface of the wafer 31 is inspected, the inspection is performed in the order shown in FIG.

  When the detection position A 35 is detected by the image processing circuit 202, a place having a difference is extracted as a pattern defect 11 by comparing with the image of the detection position B 36 stored in the memory 109, and a list of the pattern defects 11 is created. And transmitted to the overall control unit 110. After the inspection of the necessary area, the defect confirmation screen shown in FIG. 15 is displayed.

  The defect confirmation screen displays the defect feature quantity, the defect display editing component 150 that can edit the classification, and the current position display 59 that indicates the current position and the pattern defect 11 that displays the classification number as a symbol together with the layout information of the wafer 31. The map display unit 55 includes an image display unit 56 that displays an image at the current position, a display switching button 151 that switches between display and non-display of the mask defect 43, and an inspection end button 144 that instructs the end of the inspection. . When the mouse operation instruction button 140 is set to the selection mode and the pattern defect 11 is clicked, the image is displayed on the image display unit 56 and the feature amount is displayed on the defect display editing component 150. The pattern defect 11 is classified based on the image and the feature amount, and the defect display editing component 150 assigns a classification number to the feature amount of the pattern defect 11.

  The display switching button 209 for switching display validity / invalidity of the image processing condition 201 in the image processing area 200 can switch the display when the image processing condition 201 is applied to the pattern defect 11 in the image processing area 200 or not. . However, there is no change in the display state because the area in which whether or not the image processing condition 201 is applied at the time of inspection is enabled by the special condition enable / disable button 208 has already been applied at the time of inspection. The defect confirmation step is terminated by the inspection end button 144, and the classified pattern defects 11 and their feature quantities are stored in storage means (not shown) in the overall control unit, and via a communication line (not shown). Output to an external storage means (not shown) or other inspection or observation means (none shown) to return to the initial screen.

  According to the present embodiment, the SEM image is used to inspect the entire surface of the wafer without being confused by the pattern defects 11 in the image processing area 200, detect only the true pattern defects 57, and present them to the user. is there.

  Further, according to the present embodiment, since defects in the image processing area 200 can be displayed, for example, in the case of a redundant power supply wiring layer formed roughly as shown in the problem to be solved. However, there is a feature that the roughness can be determined by switching to the display.

  Further, according to the present embodiment, there is a feature that it is possible to reliably set a threshold only for a place necessary for setting image processing conditions so as not to erroneously detect erroneous detection obtained under actual inspection conditions.

  In addition, according to the present embodiment, since the image processing area 200 can be added, even if the condition is determined by an object with a small chance of error, it is necessary to additionally set the image processing area 200. The image processing conditions for the place can be set reliably.

  In addition, according to the present embodiment, the pattern defect 11 in the image processing area 200 is not completely erased, but the image processing condition 201 is changed. Image processing conditions can be set to prevent detection.

  In addition, according to the present embodiment, when the special condition valid / invalid button 208 is specified so that the image processing condition 201 is not used at the time of inspection, the image processing area 200 and the image processing condition 201 can be changed. Even if the appropriate image processing conditions change, it is possible to inspect again from the already acquired feature amount 203 only by changing the image processing conditions 201 again.

(Third embodiment)
A third embodiment of the present invention will be described.
FIG. 18 shows the configuration of the third embodiment. Electron beam source 1 for generating electron beam 2, electron beam 2 from electron beam source 1 is accelerated by an electrode and taken out, and an electron gun 102 and virtual light source 101 that make virtual light source 101 at a fixed place by an electrostatic or magnetic field superimposing lens A blanking plate 104 for controlling ON / OFF of the electron beam 2 and the electron beam 2 in the XY directions are installed in the vicinity of the position converged by the condenser lens 103 and the electron gun 102 for converging the electron beam 2 to a certain place. An electron optical system 106 composed of a deflector 105 for deflecting and an objective lens 4 for converging the electron beam 2 on the target substrate 5, a sample chamber 107 for holding the wafer 31 as the target substrate in a vacuum, and the wafer 31 are mounted. A stage 6 to which a retarding voltage 108 that enables detection of an image at an arbitrary position is applied, a detector 8 that detects secondary electrons 7 from the object substrate 5, and the detector 8. An A / D converter 9 that obtains a digital image by A / D converting the output detection signal, a memory 109 that stores the digital image, and a stored image stored in the memory 109 and a digital image that has undergone A / D conversion In comparison, the image processing circuit 10 that detects a place where there is a difference as the defect candidate 40, the defect candidate storage unit 41 that stores the feature amount 203 such as the coordinates, projection length, and image information of the defect candidate 40, and the defect candidate 40 feature amounts 203 are received, a feature amount confirmation unit 251 that determines whether or not a defect candidate 40 matches a designated feature amount 250 specified in advance, and a defect candidate 40 that is determined to match by the feature amount confirmation unit 251 The defect determination is performed with the image processing condition 201 specified for each feature amount, and the pattern image from the detailed image processing unit 252 and the detailed image processing unit 252 for determining the pattern defect 11 is determined. An overall control unit 110 that receives the image defect 11 (control lines from the overall control unit 110 are omitted in the figure), a display of the pattern defect 11, an image display of the position of the specific pattern defect 11, and an image processing area 200. Alternatively, the operation screen 45 for editing and the like, the keyboard 120 for instructing the operation, the mouse 121 and the knob 122 (all not shown), the height of the wafer 31 are measured, and the current value of the objective lens 4 is added with the offset 112. The Z sensor 113 that keeps the focal position of the detected digital image constant by controlling the load, the loader 116 (not shown) that moves the wafer 31 in the cassette 114 in and out of the sample chamber 107, and the outer shape of the wafer 31 An orientation flat detector 117 (not shown) for positioning the wafer 31 with respect to a reference, and a pattern for observing the pattern on the wafer 31 Manabu microscope 118, and consists of a standard sample piece 119 provided on the stage 6.

  The operation of the third embodiment will be described. The operation includes a condition determination for determining the designated feature amount 250 and the image processing condition 201 for the feature amount, and an inspection for detecting the pattern defect 11.

  In the condition setting, the start screen shown in FIG. 9 is displayed on the operation screen 45, the user selects the shelf number where the target wafer 31 exists with the shelf number selection component 130, and the target wafer 31 with the recipe selection component 131. When the recipe creation start button 132 is pressed, the condition setting is started. For condition determination, contrast setting for setting the conditions of the electron optical system, pattern layout setting for the wafer 31, alignment for positioning the pattern of the wafer 31, and signal amount confirmation at a place where the signal amount of the wafer 31 is accurately expressed. There are settings of calibration and inspection conditions, image processing feature amount setting 253 for setting the designated feature amount 250 and its image processing condition 201, and confirmation of setting conditions in the trial inspection. Here, the three points of the related contrast setting, image processing feature amount setting, and trial inspection will be described.

  When started, the overall control unit 110 instructs each unit to operate according to the following procedure. An instruction is given to a loader 116 (not shown), and the loader 116 takes out the wafer 31 from the cassette 114, positions the wafer based on the outer shape by an orientation flat detector 117 (not shown), and mounts the wafer 31 on the stage 6. Then, the sample chamber 107 is evacuated. Along with the mounting, conditions for the electron optical system 106 and the retarding voltage 108 are set, and a voltage is applied to the blanking plate 104 to turn off the electron beam 2. The stage is moved to the standard sample piece 119, the Z sensor 113 is enabled and the focus is kept constant at the detected value value of the Z sensor 113 + the offset 112, the deflector 105 is raster scanned, and the blanking plate 104 is synchronized with the scan. The voltage is turned off, and the electron beam 2 is irradiated onto the wafer 31 only when necessary. At that time, reflected electrons or secondary electrons generated from the wafer 31 are detected by the detector 8 and converted into a digital image by the A / D converter 9.

  A plurality of digital images are detected by changing the offset 112, and the optimum offset 111 that gives the highest sum of the differential values of the images in the overall control unit 110 for each detection is set as the current offset value. After the setting, the Z sensor 113 is invalidated, and the screen is changed to the contrast adjustment screen shown in FIG. The contrast adjustment screen instructs the operation to move the map display and select the item when it is selected with the mouse and the button (not shown in the figure) that controls the map display method and the map display method. Map display unit 55 having a mouse operation instruction button 140 for performing image switching, and an image switching button for designating a portion for displaying an image, a magnification of the image, an optical microscope image on the optical microscope 118 or an SEM image on the electron optical system 106, and an image type The image display unit 56 includes a recipe creation item selection button 142, a recipe creation end button 133, and a recipe save button 134.

  On the contrast adjustment screen, the mouse operation instruction button 140 is set to the movement mode, and the mouse 121 is clicked to move on the map, and an image of the place is displayed on the image display unit. An electron optical system adjustment item is assigned to the knob 122 and each part of the electron optical system 106 is adjusted to obtain an appropriate contrast. The recipe creation end button 133, the recipe save button 134, and the recipe creation item selection button 142 are buttons common to all screens for instructing recipe creation end, recipe condition saving, setting of another condition and screen transition, respectively. is there. By switching the recipe creation item selection button 142 to the trial inspection, a transition is made to the trial inspection start screen shown in FIG.

  The trial inspection start screen includes a map display unit 55, a recipe creation end button 133, a recipe storage button 134, a recipe creation item selection button 142, an inspection start button 143, and an inspection end button 144. The mouse operation selection button 140 is in a selection mode. When the user clicks a die on the map display section, the selection / non-selection of the die to be inspected is switched as a trial, and the die to be inspected is selected. After selecting the die to be inspected, the start of trial inspection is instructed by the inspection start button 143. When the trial inspection is started, the stage 6 is moved and moved to the scanning start position of the area to be inspected of the mounted wafer 31. The offset 112 is set by adding an offset specific to the wafer measured in advance, the Z sensor 113 is enabled, the stage 6 is scanned in the Y direction along the scanning line 33 shown in FIG. 3, and is synchronized with the stage scanning. Then, the deflector 105 is scanned in the X direction, the voltage of the blanking plate 104 is turned off during the effective scanning, and the electron beam 2 is irradiated and scanned on the wafer 31. Reflected electrons or secondary electrons generated from the wafer 31 are detected by the detector 8, and a digital image of the stripe region 34 is obtained by the A / D converter 9 and stored in the memory 109. After the scanning of the stage 6 is completed, the Z sensor 113 is invalidated. By repeating the stage scanning, the entire necessary area is inspected. When the entire surface of the wafer 31 is inspected, the inspection is performed in the order shown in FIG.

  When the detection position A 35 is detected by the image processing circuit 10, a place having a difference is extracted as a defect candidate 40 compared with the image of the detection position B 36 stored in the memory 109, and the feature amount 203 of the defect candidate 40 is detected. Is stored in the defect candidate storage unit 41. At the same time, the designated feature quantity confirmation unit 251 confirms whether the defect candidate 40 has the designated feature quantity 250, and sends the defect candidate 40 having the designated feature quantity to the detailed image processing unit 252. The detailed image processing unit 252 performs image processing with the image processing condition 201 set for each designated feature amount, and determines whether or not the pattern defect 11 is present. In the case of the pattern defect 11, the identification number 253 in the defect candidate storage unit 41 is transmitted to the overall control unit 110. After the inspection of the necessary area, the defect confirmation screen shown in FIG. 19 is displayed.

  The defect confirmation screen displays the defect feature quantity, the defect display editing component 150 that can edit the classification, and the current position display 59 that indicates the current position and the pattern defect 11 that displays the classification number as a symbol together with the layout information of the wafer 31. The map display unit 55 includes an image display unit 56 that displays an image at the current position, a real / memory image switching button 255 that switches between an actual image and a memory image display, and various buttons that have already been described. When the mouse operation instruction button 140 is set to the selection mode and the actual image is selected by the real / memory image switching button 255 by clicking the pattern defect 11, the image is moved to the coordinates of the pattern defect 11 and the image is acquired. When the memory image is selected, the image information of the pattern defect 11 is displayed on the image display unit 56, and the feature amount is displayed on the defect display editing component 150. The pattern defect 11 is classified based on the image and the feature amount, and the defect display editing component 150 assigns a classification number to the feature amount of the pattern defect 11. At this time, the defect 58 that is not desired to be detected is assigned a specific classification number so that it can be identified on the map. After the classification is completed, the screen is switched to the image processing feature amount setting screen shown in FIG. 20 by the recipe creation item selection button. In addition, the test end button returns to the trial test initial screen.

  The image processing feature quantity setting screen 260 includes a classification number designation part 262 for designating a target class number 261 of interest, a defect selection part 263 for sequentially selecting defects having a target class number 261, and feature quantities of selected defects. The feature quantity designation component 264 that designates the designated feature quantity 250 that is the selection criterion, the map display section 55, the image display section 56 that displays the image of the defective portion, and the image selected by the feature quantity designation component 264. The image processing condition setting component 265 for setting the image processing condition number 207 for determining the image processing condition 201 to be applied and the image of the defect candidate unit 41 are determined by the evaluation image processing unit 252 to determine whether or not the pattern defect 11 is present. , A defect redisplay button 207 for displaying the result on the map display unit 55, and a new image processing condition number 207 corresponding to the designated feature amount 250. It is composed of various buttons completion button 161, and already described to indicate the end of the new feature quantity creation button 266, and creates an instruction to create. Information is saved in the recipe by pressing the recipe save button 134.

  After the saving is completed, the completion button 161 is used to return to the test inspection defect confirmation screen. Furthermore, the inspection end button 144 on the defect confirmation screen returns to the trial inspection initial screen. It is also possible to set a test inspection die again and perform a test inspection. When the confirmation is completed, the recipe end button 133 is pressed to complete the recipe creation. At the end of production, the wafer 31 is unloaded and returned to the original cassette 114.

  Next, the inspection will be described. In the inspection, the start screen shown in FIG. 9 is displayed on the operation screen 45, the user selects the shelf number where the target wafer 31 exists by the shelf number selection component 130, and the recipe selection component 131 sets the target wafer 31. An inspection is started by designating a product type and a process and pressing an inspection start button 330. The inspection is performed after loading, alignment, and calibration of the wafer, and then performing inspection processing. After defect confirmation and defect output, the wafer is unloaded and terminated. Here, inspection processing and defect confirmation related to the present invention will be described.

  The start of inspection is instructed by the inspection start button 330. When the inspection is started, the stage 6 is moved and moved to the scanning start position of the region to be inspected of the mounted wafer 31. The offset 112 is set by adding an offset specific to the wafer measured in advance, the Z sensor 113 is enabled, the stage 6 is scanned in the Y direction along the scanning line 33 shown in FIG. 3, and is synchronized with the stage scanning. Then, the deflector 105 is scanned in the X direction, the voltage of the blanking plate 104 is turned off during the effective scanning, and the electron beam 2 is irradiated and scanned on the wafer 31. Reflected electrons or secondary electrons generated from the wafer 31 are detected by the detector 8, and a digital image of the stripe region 34 is obtained by the A / D converter 9 and stored in the memory 109. After the scanning of the stage 6 is completed, the Z sensor 113 is invalidated. By repeating the stage scanning, the entire necessary area is inspected. When the entire surface of the wafer 31 is inspected, the inspection is performed in the order shown in FIG.

  When the detection position A 35 is detected by the image processing circuit 202, a place where there is a difference compared with the image of the detection position B 36 stored in the memory 109 is extracted as the defect candidate 40 and stored in the defect candidate storage unit 41. At the same time, a defect candidate that matches the designated feature value is selected by the feature value confirmation unit 251, and the pattern defect 11 is selected by the detailed image processing unit 252 using the image processing condition 201 determined by the image processing condition number 207 corresponding to the designated feature value. Whether or not, a list of pattern defects 11 is created and transmitted to the overall control unit 110. After the inspection of the necessary area, the defect confirmation screen shown in FIG. 15 is displayed.

  The defect confirmation screen displays the defect feature quantity, the defect display editing component 150 that can edit the classification, and the current position display 59 that indicates the current position and the pattern defect 11 that displays the classification number as a symbol together with the layout information of the wafer 31. A map display unit 55, an image display unit 56 that displays an image at the current position, a display switching button 151 for switching display / non-display of whether or not to display the defect candidate 41 in addition to the pattern defect 11, and an instruction to end the inspection It is comprised from the inspection end button 144 to perform. When the mouse operation instruction button 140 is set to the selection mode and the pattern defect 11 is clicked, the image is displayed on the image display unit 56 and the feature amount is displayed on the defect display editing component 150. The pattern defect 11 is classified based on the image and the feature amount, and the defect display editing component 150 assigns a classification number to the feature amount of the pattern defect 11. The display switching button 209 for switching display validity / invalidity of the image processing condition 201 in the image processing area 200 can switch the display when the image processing condition 201 is applied to the pattern defect 11 in the image processing area 200 or not. . However, there is no change in the display state because the area in which whether or not the image processing condition 201 is applied at the time of inspection is enabled by the special condition enable / disable button 208 has already been applied at the time of inspection. The defect confirmation step is terminated by the inspection end button 144, and the classified pattern defects 11 and their feature quantities are stored in storage means (not shown) in the overall control unit, and via a communication line (not shown). Output to an external storage means (not shown) or other inspection or observation means (none shown) to return to the initial screen.

  According to the present embodiment, there is a feature that the entire wafer surface is inspected using the SEM image to detect only the true pattern defects 57 and present them to the user.

  In addition, according to the present embodiment, for example, even in the case of a redundant power supply wiring layer or pattern edge formed roughly in the problem to be solved, the roughness is determined by switching to the display. There are features that can be done.

  Further, according to the present embodiment, there is a feature that it is possible to reliably set a threshold only for a place necessary for setting image processing conditions so as not to erroneously detect erroneous detection obtained under actual inspection conditions.

  Further, according to the present embodiment, the pattern defect 11 in the image processing region 200 is not completely erased, but the image processing condition 201 is changed, so that it is possible to inspect for obvious defects while preventing necessary erroneous detection. The image processing conditions can be set to

It is a front view which shows schematic structure of the conventional electron beam type pattern inspection apparatus. It is a front view which shows schematic structure of the conventional optical pattern inspection apparatus. It is a top view of the wafer which shows the layout of a wafer. It is a front view of the electron beam type pattern inspection apparatus which shows the structure of the 1st solution means of this invention. It is a top view of the wafer explaining the effect | action of the 1st solving means of this invention. It is a front view of the display screen explaining a defect confirmation screen. It is a front view of the display screen explaining a mask area | region setting screen. It is a front view of the electron beam type pattern inspection apparatus which shows the structure of 1st Embodiment. It is a front view of the display screen which shows the start screen of 1st Embodiment. It is a front view of the display screen which shows the contrast setting screen of the recipe preparation of 1st Embodiment. It is a front view of the display screen which shows the trial test | inspection initial screen of the recipe preparation of 1st Embodiment. It is a top view of the wafer which shows the scanning order of 1st Embodiment. It is a front view of the display screen which shows the defect confirmation screen of the trial inspection of the recipe preparation of 1st Embodiment. It is a front view of the display screen which shows the mask area setting screen of the recipe preparation of 1st Embodiment. It is a front view of the display screen which shows the defect confirmation screen of the test | inspection of 1st Embodiment. It is a front view of the electron beam type pattern inspection apparatus of a 2nd embodiment. It is a front view of the display screen which shows the image processing area | region setting screen of the recipe preparation which shows the structure of 2nd Embodiment. It is a front view of the electron beam type pattern inspection apparatus which shows the structure of 3rd Embodiment. It is a front view of the display screen which shows the defect confirmation screen of the recipe preparation of 3rd Embodiment. It is a front view of the display screen which shows the image processing feature-value setting screen of the recipe preparation of 3rd Embodiment.

Explanation of symbols

1 .... Electron beam source 2 .... Electron beam 3 .... Deflector 4 .... Objective lens 5 .... Substrate substrate 6..Stage 7 .... Secondary electron etc. 8 .... Detector 9 .... A / D conversion Device 10 Image processing circuit 11 Pattern defect candidate 21 Light source 22 Objective lens 23 Image sensor 24 Detection image 25 Memory 27 Memory image 31 Wafer 32 Die 33 Scan line 40 Defect candidate 41 Defect candidate storage unit 42 Mask area 43 Mask defect 44 Mask setting unit 45 Operation screen 55 Map display unit 56 Image display unit 57 .. True defect 101 .. Virtual light source 102 .. Electron gun 106 .. Electron optical system 107 .. Sample chamber 108 .. Retarding voltage 110 .. Overall control unit 113 .. Z sensor 118 .. Optical microscope 119・・ Standard specimen 120 ・ ・ Keyboard 130 ・ ・ Storage number selection part 131 ・ ・ Recipe selection part 132 ・ ・ Recipe creation start part 133 ・ ・ Recipe creation end button 134 ・ ・ Recipe creation button 141 ・ ・ Image switching button 142 ・ ・Recipe creation item selection button 143 .. Inspection start button 144 .. Inspection end button 150 .. Defect display edit part 151 .. Display switching button 160 .. New area creation button 161 .. Complete button 200 .. Image processing area 201.・ Image processing conditions 205 ・ ・ Image processing area setting screen 207 ・ ・ Defect redisplay button 208 ・ ・ Special condition valid / invalid button 250 ・ ・ Specified feature amount 251 ・ ・ Feature amount confirmation unit 252 ・ ・ Detailed image processing unit 255 ・Real / memory image switch button 260 Image processing feature amount setting screen 261 Class number 264 .. Feature amount designation part 265 .. Image processing condition setting part 266 .. New feature creation button 330 .. Inspection start button.

Claims (4)

  An inspection method for imaging a target substrate to obtain a digital image of the target substrate, detecting defects from the obtained digital image, and displaying information on the detected defects on a screen, wherein the detected defects Information related to defects existing in a pre-registered area among the detected defects, or a pattern that matches a pre-registered shape or a pattern that matches a pre-registered feature amount A pattern inspection method characterized in that information is output separately from information on other defects.   The pattern inspection method according to claim 1, wherein position information of the target substrate of the other defect is displayed on a screen together with an image of the other defect.   An imaging unit that captures an image of an object substrate and obtains a digital image of the object substrate, a defect candidate detection unit that detects a defect candidate from a digital image obtained by imaging with the imaging unit, and a detection by the defect candidate detection unit A defect extraction unit that extracts a defect from the defect candidates and displays information on the extracted defect on a screen, wherein the defect extraction unit is detected by the defect candidate detection unit The defect candidate is displayed on the screen except for the defect having the feature that matches the feature registered in advance in the defect extracting unit, or the detected defect candidate matches the feature registered in the defect extracting unit in advance. A pattern inspection apparatus for displaying a defect having a feature so as to be distinguishable from other defects.   The pattern inspection apparatus according to claim 3, wherein the defect extraction unit displays a defect image and position information of the defect on the target substrate on a screen.

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