JP2009019942A5 - - Google Patents

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Publication number
JP2009019942A5
JP2009019942A5 JP2007181720A JP2007181720A JP2009019942A5 JP 2009019942 A5 JP2009019942 A5 JP 2009019942A5 JP 2007181720 A JP2007181720 A JP 2007181720A JP 2007181720 A JP2007181720 A JP 2007181720A JP 2009019942 A5 JP2009019942 A5 JP 2009019942A5
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JP
Japan
Prior art keywords
sheet light
test object
shape
multiple reflection
unit
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Application number
JP2007181720A
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English (en)
Japanese (ja)
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JP5170622B2 (ja
JP2009019942A (ja
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Priority to JP2007181720A priority Critical patent/JP5170622B2/ja
Priority claimed from JP2007181720A external-priority patent/JP5170622B2/ja
Publication of JP2009019942A publication Critical patent/JP2009019942A/ja
Publication of JP2009019942A5 publication Critical patent/JP2009019942A5/ja
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Publication of JP5170622B2 publication Critical patent/JP5170622B2/ja
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JP2007181720A 2007-07-11 2007-07-11 形状測定方法、プログラム、および形状測定装置 Active JP5170622B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007181720A JP5170622B2 (ja) 2007-07-11 2007-07-11 形状測定方法、プログラム、および形状測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007181720A JP5170622B2 (ja) 2007-07-11 2007-07-11 形状測定方法、プログラム、および形状測定装置

Publications (3)

Publication Number Publication Date
JP2009019942A JP2009019942A (ja) 2009-01-29
JP2009019942A5 true JP2009019942A5 (https=) 2010-11-18
JP5170622B2 JP5170622B2 (ja) 2013-03-27

Family

ID=40359718

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007181720A Active JP5170622B2 (ja) 2007-07-11 2007-07-11 形状測定方法、プログラム、および形状測定装置

Country Status (1)

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JP (1) JP5170622B2 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8938099B2 (en) * 2010-12-15 2015-01-20 Canon Kabushiki Kaisha Image processing apparatus, method of controlling the same, distance measurement apparatus, and storage medium
US9857166B2 (en) 2012-09-19 2018-01-02 Canon Kabushiki Kaisha Information processing apparatus and method for measuring a target object
JP6351201B2 (ja) * 2012-12-06 2018-07-04 キヤノン株式会社 距離計測装置および方法
JP2014115109A (ja) 2012-12-06 2014-06-26 Canon Inc 距離計測装置及び方法
FR3056778B1 (fr) * 2016-09-29 2018-10-26 Airbus Operations Procede et dispositif de generation d'une trajectoire de vol optimale destinee a etre suivie par un aeronef.
DE102018004592A1 (de) * 2017-06-20 2018-12-20 Mitutoyo Corporation Messapparat für dreidimensionale Geometrie und Messverfahren für dreidimensionale Geometrie
JP7219034B2 (ja) * 2018-09-14 2023-02-07 株式会社ミツトヨ 三次元形状測定装置及び三次元形状測定方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6410109A (en) * 1987-07-03 1989-01-13 Toshiba Corp Position detecting device
JPH03257307A (ja) * 1990-03-08 1991-11-15 Mitsubishi Heavy Ind Ltd 三次元形状認識方法及び装置
JPH04238205A (ja) * 1991-01-21 1992-08-26 Toshiba Corp 溶接位置検出装置
JP3800842B2 (ja) * 1998-12-28 2006-07-26 スズキ株式会社 三次元形状を計測する方法および装置並びに三次元形状計測用プログラムを記憶した記憶媒体
JP2004219154A (ja) * 2003-01-10 2004-08-05 Hitachi Ltd 物体の表面形状計測方法及び自動溶接装置

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