JP2009009811A5 - - Google Patents

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Publication number
JP2009009811A5
JP2009009811A5 JP2007169784A JP2007169784A JP2009009811A5 JP 2009009811 A5 JP2009009811 A5 JP 2009009811A5 JP 2007169784 A JP2007169784 A JP 2007169784A JP 2007169784 A JP2007169784 A JP 2007169784A JP 2009009811 A5 JP2009009811 A5 JP 2009009811A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2007169784A
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JP4918662B2 (ja
JP2009009811A (ja
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Publication date
Application filed filed Critical
Priority claimed from JP2007169784A external-priority patent/JP4918662B2/ja
Priority to JP2007169784A priority Critical patent/JP4918662B2/ja
Priority to KR20097025939A priority patent/KR101491996B1/ko
Priority to EP20080777751 priority patent/EP2163890B1/en
Priority to US12/666,656 priority patent/US8168441B2/en
Priority to CN2008800220362A priority patent/CN101688847B/zh
Priority to PCT/JP2008/061936 priority patent/WO2009001963A1/ja
Publication of JP2009009811A publication Critical patent/JP2009009811A/ja
Publication of JP2009009811A5 publication Critical patent/JP2009009811A5/ja
Priority to US13/429,570 priority patent/US8278117B2/en
Publication of JP4918662B2 publication Critical patent/JP4918662B2/ja
Application granted granted Critical
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2007169784A 2007-06-27 2007-06-27 Ｍａｌｄｉ質量分析用の試料ホルダおよび質量分析方法 Expired - Fee Related JP4918662B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2007169784A JP4918662B2 (ja) 2007-06-27 2007-06-27 Ｍａｌｄｉ質量分析用の試料ホルダおよび質量分析方法
CN2008800220362A CN101688847B (zh) 2007-06-27 2008-06-25 Maldi质谱分析用的试样架及质谱分析方法
EP20080777751 EP2163890B1 (en) 2007-06-27 2008-06-25 Sample holder for maldi mass spectrometric analysis, and mass spectrometric analysis method
US12/666,656 US8168441B2 (en) 2007-06-27 2008-06-25 Sample holder for MALDI mass spectrometric analysis, and mass spectrometric analysis method
KR20097025939A KR101491996B1 (ko) 2007-06-27 2008-06-25 Ｍａｌｄｉ 질량 분석용의 시료 홀더 및 질량 분석 방법
PCT/JP2008/061936 WO2009001963A1 (ja) 2007-06-27 2008-06-25 Ｍａｌｄｉ質量分析用の試料ホルダおよび質量分析方法
US13/429,570 US8278117B2 (en) 2007-06-27 2012-03-26 Sample holder for maldi mass spectrometric analysis, and mass spectrometric analysis method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007169784A JP4918662B2 (ja) 2007-06-27 2007-06-27 Ｍａｌｄｉ質量分析用の試料ホルダおよび質量分析方法

Publications (3)

Publication Number Publication Date
JP2009009811A JP2009009811A (ja) 2009-01-15
JP2009009811A5 true JP2009009811A5 (ja) 2010-08-12
JP4918662B2 JP4918662B2 (ja) 2012-04-18

Family

ID=40185769

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007169784A Expired - Fee Related JP4918662B2 (ja) 2007-06-27 2007-06-27 Ｍａｌｄｉ質量分析用の試料ホルダおよび質量分析方法

Country Status (6)

Country Link
US (2) US8168441B2 (ja)
EP (1) EP2163890B1 (ja)
JP (1) JP4918662B2 (ja)
KR (1) KR101491996B1 (ja)
CN (1) CN101688847B (ja)
WO (1) WO2009001963A1 (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2416345A1 (en) * 2010-08-06 2012-02-08 Philips Intellectual Property & Standards GmbH Particle-based matrix carriers for mass spectrometry
JP5972187B2 (ja) * 2013-02-04 2016-08-17 富士フイルム株式会社 導電膜形成用組成物、導電膜の製造方法
JP6593689B2 (ja) * 2015-08-27 2019-10-23 高知県公立大学法人 Ｍａｌｄｉ質量分析用マトリックス及びその製法並びにそれを用いた質量分析法
US20190137932A1 (en) * 2016-05-25 2019-05-09 The Regents Of The University Of California Wide-field imaging of birefringent crystals and other materials using lens-free polarized microscope
KR101834720B1 (ko) 2016-11-03 2018-03-06 (주)바이오니아 매트릭스 도움 레이저 탈착／이온화 질량분석 방법
CN108022822B (zh) * 2017-12-06 2019-08-06 江苏天瑞仪器股份有限公司福建分公司 基质辅助激光解析飞行时间质谱仪样品靶的进出装置
US11532472B2 (en) * 2020-07-30 2022-12-20 Ricoh Company, Ltd. Mass spectrometry
CN114112818B (zh) * 2021-11-29 2023-05-16 暨南大学 一种气溶胶颗粒电离方法、电离系统及质谱分析装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6243562A (ja) 1985-08-21 1987-02-25 Shimadzu Corp レ−ザイオン化質量分析計用試料作成方法および試料ホルダ
JPH02145422A (ja) * 1988-11-24 1990-06-04 Dowa Mining Co Ltd 微細酸化銅粉末の製造方法
JPH06243562A (ja) 1993-02-16 1994-09-02 Funai Electric Co Ltd ディスクチャッキング機構
DE10144250A1 (de) 2001-08-31 2003-04-03 Fraunhofer Ges Forschung Verbesserte massenspektrometrische Analyse unter Verwendung von Nanopartikeln
JP4576606B2 (ja) 2005-01-21 2010-11-10 独立行政法人産業技術総合研究所 質量分析用イオン化基板及び質量分析装置
JP5266477B2 (ja) * 2005-12-26 2013-08-21 Ｄｏｗａエレクトロニクス株式会社 酸化銅の製造方法

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