JP2009004713A5 - - Google Patents
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- Publication number
- JP2009004713A5 JP2009004713A5 JP2007166863A JP2007166863A JP2009004713A5 JP 2009004713 A5 JP2009004713 A5 JP 2009004713A5 JP 2007166863 A JP2007166863 A JP 2007166863A JP 2007166863 A JP2007166863 A JP 2007166863A JP 2009004713 A5 JP2009004713 A5 JP 2009004713A5
- Authority
- JP
- Japan
- Prior art keywords
- processing gas
- gas supply
- supply mechanism
- processing
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000011144 upstream manufacturing Methods 0.000 claims 16
- 238000009792 diffusion process Methods 0.000 claims 15
- 239000000758 substrate Substances 0.000 claims 10
- 239000000463 material Substances 0.000 claims 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 2
- 230000006835 compression Effects 0.000 claims 2
- 238000007906 compression Methods 0.000 claims 2
- 230000007423 decrease Effects 0.000 claims 2
- 239000002184 metal Substances 0.000 claims 2
- 238000000034 method Methods 0.000 claims 2
- 229910052710 silicon Inorganic materials 0.000 claims 2
- 239000010703 silicon Substances 0.000 claims 2
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007166863A JP4900956B2 (ja) | 2007-06-25 | 2007-06-25 | ガス供給機構及び基板処理装置 |
| US12/127,311 US8221581B2 (en) | 2007-06-25 | 2008-05-27 | Gas supply mechanism and substrate processing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007166863A JP4900956B2 (ja) | 2007-06-25 | 2007-06-25 | ガス供給機構及び基板処理装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009004713A JP2009004713A (ja) | 2009-01-08 |
| JP2009004713A5 true JP2009004713A5 (enExample) | 2010-06-24 |
| JP4900956B2 JP4900956B2 (ja) | 2012-03-21 |
Family
ID=40135247
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007166863A Expired - Fee Related JP4900956B2 (ja) | 2007-06-25 | 2007-06-25 | ガス供給機構及び基板処理装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8221581B2 (enExample) |
| JP (1) | JP4900956B2 (enExample) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4900956B2 (ja) * | 2007-06-25 | 2012-03-21 | 東京エレクトロン株式会社 | ガス供給機構及び基板処理装置 |
| JP5328786B2 (ja) * | 2008-06-06 | 2013-10-30 | 株式会社アルバック | 薄膜太陽電池製造装置 |
| JP5697389B2 (ja) * | 2010-09-27 | 2015-04-08 | 東京エレクトロン株式会社 | プラズマエッチング用の電極板及びプラズマエッチング処理装置 |
| US8900403B2 (en) | 2011-05-10 | 2014-12-02 | Lam Research Corporation | Semiconductor processing system having multiple decoupled plasma sources |
| US9111728B2 (en) | 2011-04-11 | 2015-08-18 | Lam Research Corporation | E-beam enhanced decoupled source for semiconductor processing |
| US8900402B2 (en) * | 2011-05-10 | 2014-12-02 | Lam Research Corporation | Semiconductor processing system having multiple decoupled plasma sources |
| US8980046B2 (en) | 2011-04-11 | 2015-03-17 | Lam Research Corporation | Semiconductor processing system with source for decoupled ion and radical control |
| CN103748665B (zh) * | 2011-05-10 | 2016-11-02 | 朗姆研究公司 | 具有多个解耦等离子体源的半导体处理系统 |
| US10557190B2 (en) | 2013-01-24 | 2020-02-11 | Tokyo Electron Limited | Substrate processing apparatus and susceptor |
| JP6100564B2 (ja) * | 2013-01-24 | 2017-03-22 | 東京エレクトロン株式会社 | 基板処理装置及び載置台 |
| JP5963893B2 (ja) * | 2015-01-09 | 2016-08-03 | 株式会社日立国際電気 | 基板処理装置、ガス分散ユニット、半導体装置の製造方法およびプログラム |
| JP6240712B1 (ja) * | 2016-05-31 | 2017-11-29 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| US10217626B1 (en) * | 2017-12-15 | 2019-02-26 | Mattson Technology, Inc. | Surface treatment of substrates using passivation layers |
| JP7117734B2 (ja) | 2018-12-06 | 2022-08-15 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
| US12486574B2 (en) | 2019-08-23 | 2025-12-02 | Lam Research Corporation | Thermally controlled chandelier showerhead |
| CN119980191A (zh) | 2019-08-28 | 2025-05-13 | 朗姆研究公司 | 金属沉积 |
| JP7296829B2 (ja) * | 2019-09-05 | 2023-06-23 | 東京エレクトロン株式会社 | プラズマ処理装置、処理方法、上部電極構造 |
| KR102607844B1 (ko) * | 2020-07-10 | 2023-11-30 | 세메스 주식회사 | 기판 처리 장치 및 기판 지지 유닛 |
| TWI802384B (zh) * | 2022-04-22 | 2023-05-11 | 華景電通股份有限公司 | 氣簾裝置及透氣組件 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3535309B2 (ja) * | 1996-04-10 | 2004-06-07 | 東京エレクトロン株式会社 | 減圧処理装置 |
| JP2002252219A (ja) * | 2001-02-26 | 2002-09-06 | Tokyo Electron Ltd | 成膜装置及び成膜方法 |
| US6998014B2 (en) * | 2002-01-26 | 2006-02-14 | Applied Materials, Inc. | Apparatus and method for plasma assisted deposition |
| JP3982678B2 (ja) | 2002-02-27 | 2007-09-26 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP2003332314A (ja) * | 2002-05-14 | 2003-11-21 | Tokyo Electron Ltd | プラズマ処理装置用電極及びプラズマ処理装置 |
| US20040261712A1 (en) * | 2003-04-25 | 2004-12-30 | Daisuke Hayashi | Plasma processing apparatus |
| US20050103265A1 (en) * | 2003-11-19 | 2005-05-19 | Applied Materials, Inc., A Delaware Corporation | Gas distribution showerhead featuring exhaust apertures |
| US7712434B2 (en) * | 2004-04-30 | 2010-05-11 | Lam Research Corporation | Apparatus including showerhead electrode and heater for plasma processing |
| US8317968B2 (en) * | 2004-04-30 | 2012-11-27 | Lam Research Corporation | Apparatus including gas distribution member supplying process gas and radio frequency (RF) power for plasma processing |
| JP2007165512A (ja) * | 2005-12-13 | 2007-06-28 | Hitachi High-Technologies Corp | プラズマ処理装置 |
| JP4900956B2 (ja) * | 2007-06-25 | 2012-03-21 | 東京エレクトロン株式会社 | ガス供給機構及び基板処理装置 |
-
2007
- 2007-06-25 JP JP2007166863A patent/JP4900956B2/ja not_active Expired - Fee Related
-
2008
- 2008-05-27 US US12/127,311 patent/US8221581B2/en active Active
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