JP2008525771A - スニッファセンサを備えた漏れ検知装置 - Google Patents
スニッファセンサを備えた漏れ検知装置 Download PDFInfo
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- JP2008525771A JP2008525771A JP2007547431A JP2007547431A JP2008525771A JP 2008525771 A JP2008525771 A JP 2008525771A JP 2007547431 A JP2007547431 A JP 2007547431A JP 2007547431 A JP2007547431 A JP 2007547431A JP 2008525771 A JP2008525771 A JP 2008525771A
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- sniffer
- detector
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- distance
- leak detection
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- 238000001514 detection method Methods 0.000 title claims description 19
- 238000012360 testing method Methods 0.000 claims abstract description 24
- 238000005259 measurement Methods 0.000 claims abstract description 14
- 230000001133 acceleration Effects 0.000 claims abstract description 11
- 230000003287 optical effect Effects 0.000 claims description 5
- 230000001960 triggered effect Effects 0.000 abstract description 2
- 239000000976 ink Substances 0.000 description 24
- 239000007789 gas Substances 0.000 description 19
- 238000011161 development Methods 0.000 description 3
- 239000002826 coolant Substances 0.000 description 2
- 230000001939 inductive effect Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000005253 cladding Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000003550 marker Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
- G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
- G01M3/202—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material using mass spectrometer detection systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
- G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
- G01M3/202—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material using mass spectrometer detection systems
- G01M3/205—Accessories or associated equipment; Pump constructions
Abstract
Description
スニッファ・チップ12が披検体41に接近すると、決められた距離aに達するまたは距離領域に入ったとき測定がトリガされる。そこで測定は自動的にスタートするかまたは操作員が測定を接触スイッチ32を押圧することによって開始する。これに基づいてパルスがインキ弁27に加えられるので、披検体41にインキスポットが飛沫する。択一選択的にインキスポットの射撃が高速に相次いで行われ、これにより複数のインキスポットが生成される。披検体に生成されるインキマーキングは、テスト動作が実施された箇所を指示している。更にこのマーキングは、スニッファセンサが安定保持されたかどうかを指示する。
Claims (7)
- スニッファセンサ(10)がスニッファ・チップ(12)を備えた手持ち装置(11)を有しているというスニッファセンサを備えた漏れ検知装置において、
スニッファ・チップ(12)の、披検体(41)からの予め定めた距離を求めるための距離検知器(40)がスニッファセンサ(10)に設けられており、該距離検知器により、正しい距離(a)が存在している場合にだけテスト動作の開始が許容される
ことを特徴とする漏れ検知装置。 - 手持ち装置(11)の安定した保持を検出するための加速度検知器(33)が設けられており、該検知器により、手持ち装置が安定保持されている場合にだけテスト動作の開始が許容される
請求項1記載の漏れ検知装置。 - スニッファ・チップ(12)に、測定動作の実施の際または実施後に操作されかつ披検体(41)にインキによるマーキングを飛散させるインキ出射口が設けられている
請求項1または2に記載の漏れ検知装置。 - 距離検知器(40)は、光スポットを投影する送光器および反射光を識別する受光器を有している光学式の検知器である
請求項1から3までのいずれか1項記載の漏れ検知装置。 - 送光器および/または受光器は、手持ち装置(11)に配置されている距離識別装置(30)に接続されている導光体(16,17)を有している
請求項4記載の漏れ検知装置。 - 手持ち装置(11)はスニッファ導管(20)を介して本体装置(21)に接続されており、該本体装置は真空ポンプ(22)およびテストガス検知器(TD)を有している
請求項1から5までのいずれか1項記載の漏れ検知装置。 - 手動の接触スイッチ(32)が設けられており、これを操作することにより、テスト条件の充足の通報後にだけテスト動作が実施される
請求項1から6までのいずれか1項記載の漏れ検知装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102004062102.0 | 2004-12-23 | ||
DE102004062102A DE102004062102A1 (de) | 2004-12-23 | 2004-12-23 | Lecksuchgerät mit Schnüffelsonde |
PCT/EP2005/056319 WO2006069877A1 (de) | 2004-12-23 | 2005-11-29 | Lecksuchgerät mit schnüffelsonde |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008525771A true JP2008525771A (ja) | 2008-07-17 |
JP4691109B2 JP4691109B2 (ja) | 2011-06-01 |
Family
ID=35601915
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007547431A Active JP4691109B2 (ja) | 2004-12-23 | 2005-11-29 | スニッファセンサを備えた漏れ検知装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7571634B2 (ja) |
EP (1) | EP1828738B1 (ja) |
JP (1) | JP4691109B2 (ja) |
CN (1) | CN100588932C (ja) |
DE (2) | DE102004062102A1 (ja) |
WO (1) | WO2006069877A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2019529937A (ja) * | 2016-10-06 | 2019-10-17 | インフィコン ゲゼルシャフト ミット ベシュレンクテル ハフツングInficon GmbH | 距離に応じてキャリアガス流量が制御される嗅気式漏洩検出器 |
JP7006827B1 (ja) * | 2021-08-12 | 2022-01-24 | I-Pex株式会社 | 物質検出システム |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005009713A1 (de) * | 2005-03-03 | 2006-09-07 | Inficon Gmbh | Lecksuchgerät mit Schnüffelsonde |
DE102005043494A1 (de) | 2005-09-13 | 2007-03-15 | Inficon Gmbh | Lecksuchgerät mit Schnüffelsonde |
US8074490B2 (en) * | 2006-08-03 | 2011-12-13 | Ut-Battelle Llc | Clandestine grave detector |
DE102007035932A1 (de) * | 2007-07-31 | 2009-02-05 | Inficon Gmbh | Lecksuchgerät |
WO2009051530A1 (en) * | 2007-10-15 | 2009-04-23 | Adixen Sensistor Ab | Leak detection system comprising a tracer gas mediating unit. |
DE102007058438A1 (de) * | 2007-12-05 | 2009-06-10 | Bayerische Motoren Werke Aktiengesellschaft | Klimaanlage und Verfahren zur Dichtheitsprüfung einer Klimaanlage |
DE102008008262A1 (de) * | 2008-02-08 | 2009-08-13 | Inficon Gmbh | Schnüffellecksucher nach dem Referenzmessprinzip |
GB0804467D0 (en) | 2008-03-11 | 2008-04-16 | Renishaw Plc | Touch trigger measurement probe |
US8726719B2 (en) | 2010-07-31 | 2014-05-20 | Ut-Battelle, Llc | Light-weight analyzer for odor recognition |
CN105987796A (zh) * | 2015-02-12 | 2016-10-05 | 广州市和晋自动化控制技术有限公司 | 一种气体浓度探测方法及装置 |
DE102016217891A1 (de) * | 2016-09-19 | 2018-03-22 | Inficon Gmbh | Füllsondenaufsatz mit langgestrecktem gasleitendem Element |
FR3069639B1 (fr) * | 2017-07-26 | 2019-08-30 | Pfeiffer Vacuum | Sonde de reniflage, detecteur de fuites et procede de detection de fuites |
CN108332914A (zh) * | 2018-05-11 | 2018-07-27 | 南京简诺特智能科技有限公司 | 一种产品水密性检测装置 |
CN112393856B (zh) * | 2020-12-03 | 2022-05-10 | 长虹美菱股份有限公司 | 一种冰箱制冷剂泄漏检测装置及其使用方法 |
WO2023077048A1 (en) * | 2021-11-01 | 2023-05-04 | Ultra Clean Holdings, Inc. | Leak detection apparatus employing helium and a helium detector |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH11153507A (ja) * | 1997-11-20 | 1999-06-08 | Shimadzu Corp | リークデテクタ |
WO2003008923A2 (de) * | 2001-07-13 | 2003-01-30 | Inficon Gmbh | Schnüffellecksucher und verfahren zu seinem betrieb |
JP2005181013A (ja) * | 2003-12-17 | 2005-07-07 | Matsushita Electric Ind Co Ltd | 燃料電池用高分子膜のピンホール検査装置及びピンホール検査方法 |
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IL126172A (en) * | 1998-09-10 | 2002-05-23 | Phone Or Ltd | Sensor and method for measuring distances to, and/or physical properties of, a medium |
JP2001050852A (ja) * | 1999-08-04 | 2001-02-23 | Nkk Corp | スニッファープローブ及びそれを用いたガス漏れ試験方法 |
SE518522C2 (sv) * | 2001-03-21 | 2002-10-22 | Sensistor Ab | Metod och anordning vid täthetsprovning och läcksökning |
-
2004
- 2004-12-23 DE DE102004062102A patent/DE102004062102A1/de not_active Withdrawn
-
2005
- 2005-11-29 DE DE502005006236T patent/DE502005006236D1/de active Active
- 2005-11-29 WO PCT/EP2005/056319 patent/WO2006069877A1/de active Application Filing
- 2005-11-29 CN CN200580043681A patent/CN100588932C/zh active Active
- 2005-11-29 JP JP2007547431A patent/JP4691109B2/ja active Active
- 2005-11-29 EP EP05811012A patent/EP1828738B1/de active Active
- 2005-11-29 US US11/794,082 patent/US7571634B2/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11153507A (ja) * | 1997-11-20 | 1999-06-08 | Shimadzu Corp | リークデテクタ |
WO2003008923A2 (de) * | 2001-07-13 | 2003-01-30 | Inficon Gmbh | Schnüffellecksucher und verfahren zu seinem betrieb |
JP2005181013A (ja) * | 2003-12-17 | 2005-07-07 | Matsushita Electric Ind Co Ltd | 燃料電池用高分子膜のピンホール検査装置及びピンホール検査方法 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2019529937A (ja) * | 2016-10-06 | 2019-10-17 | インフィコン ゲゼルシャフト ミット ベシュレンクテル ハフツングInficon GmbH | 距離に応じてキャリアガス流量が制御される嗅気式漏洩検出器 |
JP7006827B1 (ja) * | 2021-08-12 | 2022-01-24 | I-Pex株式会社 | 物質検出システム |
WO2023017764A1 (ja) * | 2021-08-12 | 2023-02-16 | I-Pex株式会社 | 物質検出システム |
Also Published As
Publication number | Publication date |
---|---|
EP1828738A1 (de) | 2007-09-05 |
US7571634B2 (en) | 2009-08-11 |
DE502005006236D1 (de) | 2009-01-22 |
WO2006069877A1 (de) | 2006-07-06 |
CN101084424A (zh) | 2007-12-05 |
US20080000288A1 (en) | 2008-01-03 |
DE102004062102A1 (de) | 2006-07-13 |
CN100588932C (zh) | 2010-02-10 |
JP4691109B2 (ja) | 2011-06-01 |
EP1828738B1 (de) | 2008-12-10 |
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