JP2008518406A5 - - Google Patents
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- Publication number
- JP2008518406A5 JP2008518406A5 JP2007538179A JP2007538179A JP2008518406A5 JP 2008518406 A5 JP2008518406 A5 JP 2008518406A5 JP 2007538179 A JP2007538179 A JP 2007538179A JP 2007538179 A JP2007538179 A JP 2007538179A JP 2008518406 A5 JP2008518406 A5 JP 2008518406A5
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- arc suppression
- connection
- power
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000001629 suppression Effects 0.000 claims 4
- 238000001514 detection method Methods 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
- 230000001052 transient effect Effects 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US62191704P | 2004-10-25 | 2004-10-25 | |
| PCT/US2005/038493 WO2006047564A2 (en) | 2004-10-25 | 2005-10-25 | Method and apparatus for arc suppression in scanned ion beam processing equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008518406A JP2008518406A (ja) | 2008-05-29 |
| JP2008518406A5 true JP2008518406A5 (enExample) | 2012-02-16 |
Family
ID=36228406
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007538179A Pending JP2008518406A (ja) | 2004-10-25 | 2005-10-25 | イオンビーム処理装置のスキャン中にアークを抑制する方法および機構 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7345856B2 (enExample) |
| JP (1) | JP2008518406A (enExample) |
| WO (1) | WO2006047564A2 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7405394B2 (en) * | 2004-08-24 | 2008-07-29 | Hitachi, Ltd. | Gas cluster-ion irradiation apparatus |
| JP4597886B2 (ja) * | 2005-02-24 | 2010-12-15 | イーエヌ テクノロジー インコーポレイテッド | プラズマ電源装置用アークエネルギー制御回路 |
| WO2007106395A2 (en) * | 2006-03-14 | 2007-09-20 | Axcelis Technologies, Inc. | Arc quenching circuit to mitigate ion beam disruption |
| US7507977B2 (en) | 2006-03-14 | 2009-03-24 | Axcelis Technologies, Inc. | System and method of ion beam control in response to a beam glitch |
| US7834327B2 (en) * | 2008-09-23 | 2010-11-16 | Tel Epion Inc. | Self-biasing active load circuit and related power supply for use in a charged particle beam processing system |
| US8619395B2 (en) | 2010-03-12 | 2013-12-31 | Arc Suppression Technologies, Llc | Two terminal arc suppressor |
| US8604449B2 (en) * | 2010-07-01 | 2013-12-10 | Varian Semiconductor Equipment Associates, Inc. | Glitch control during implantation |
| US8766209B2 (en) | 2011-07-21 | 2014-07-01 | Varian Semiconductor Equipment Associates, Inc. | Current limiter for high voltage power supply used with ion implantation system |
| DE102015119455B3 (de) | 2015-11-11 | 2016-11-24 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung zum Unterdrücken von Arcs in einem Elektronenstrahlerzeuger |
| US11019711B2 (en) | 2018-01-27 | 2021-05-25 | Static Clean International, Inc. | Static-neutralization system and high-voltage power supply for use in conjunction therewith |
| CN112152452B (zh) | 2019-06-26 | 2022-02-08 | 台达电子工业股份有限公司 | 电源供应电路与操作方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4152744A (en) * | 1977-06-17 | 1979-05-01 | Gould Inc. | Solid state tripping circuit |
| JPS6366900A (ja) * | 1986-09-08 | 1988-03-25 | 石川島播磨重工業株式会社 | プラズマ放電用電源装置 |
| DE3630775A1 (de) | 1986-09-10 | 1988-03-24 | Frank Behlke | Mosfet-hochspannungsschalter mit extrem kurzer schaltzeit |
| US5162965A (en) * | 1991-06-28 | 1992-11-10 | The United States Of America As Represented By The Secretary Of The Air Force | Anti crow bar current interrupter for microwave tube transmitters |
| JPH0864166A (ja) * | 1994-08-19 | 1996-03-08 | Tel Varian Ltd | イオン注入装置 |
| US6900592B2 (en) * | 1997-03-18 | 2005-05-31 | The Trustees Of The Stevens Institute Of Technology | Method and apparatus for stabilizing of the glow plasma discharges |
| GB9714576D0 (en) * | 1997-07-10 | 1997-09-17 | Applied Materials Inc | Method and apparatus for neutralising space charge in an ion beam |
| US6559454B1 (en) * | 1999-06-23 | 2003-05-06 | Applied Materials, Inc. | Ion beam generation apparatus |
| JP2001102196A (ja) * | 1999-09-29 | 2001-04-13 | Hitachi Kokusai Electric Inc | プラズマ処理装置 |
| US6577479B1 (en) * | 2000-08-28 | 2003-06-10 | The Regents Of The University Of California | Arc suppression circuit |
| JP2002302767A (ja) * | 2001-04-06 | 2002-10-18 | Toshiba Corp | スパッタリング装置とその方法 |
-
2005
- 2005-10-25 US US11/259,549 patent/US7345856B2/en not_active Expired - Lifetime
- 2005-10-25 JP JP2007538179A patent/JP2008518406A/ja active Pending
- 2005-10-25 WO PCT/US2005/038493 patent/WO2006047564A2/en not_active Ceased
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