JP2008500520A5 - - Google Patents

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Publication number
JP2008500520A5
JP2008500520A5 JP2007513713A JP2007513713A JP2008500520A5 JP 2008500520 A5 JP2008500520 A5 JP 2008500520A5 JP 2007513713 A JP2007513713 A JP 2007513713A JP 2007513713 A JP2007513713 A JP 2007513713A JP 2008500520 A5 JP2008500520 A5 JP 2008500520A5
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JP
Japan
Prior art keywords
clock signal
unit
time
sampling clock
control clock
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2007513713A
Other languages
English (en)
Japanese (ja)
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JP2008500520A (ja
JP4956424B2 (ja
Filing date
Publication date
Priority claimed from DE102005011285A external-priority patent/DE102005011285A1/de
Application filed filed Critical
Publication of JP2008500520A publication Critical patent/JP2008500520A/ja
Publication of JP2008500520A5 publication Critical patent/JP2008500520A5/ja
Application granted granted Critical
Publication of JP4956424B2 publication Critical patent/JP4956424B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2007513713A 2004-05-27 2005-04-15 座標測定を行うための装置および方法 Expired - Fee Related JP4956424B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
DE102004026022 2004-05-27
DE102004026022.2 2004-05-27
DE102005011285.4 2005-03-11
DE102005011285A DE102005011285A1 (de) 2004-05-27 2005-03-11 Vorrichtung und Verfahren zur Koordinatenmessung
PCT/EP2005/003966 WO2005119173A1 (de) 2004-05-27 2005-04-15 Vorrichtung und verfahren zur koordinatenmessung

Publications (3)

Publication Number Publication Date
JP2008500520A JP2008500520A (ja) 2008-01-10
JP2008500520A5 true JP2008500520A5 (enExample) 2011-09-29
JP4956424B2 JP4956424B2 (ja) 2012-06-20

Family

ID=34965083

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007513713A Expired - Fee Related JP4956424B2 (ja) 2004-05-27 2005-04-15 座標測定を行うための装置および方法

Country Status (6)

Country Link
US (1) US7367133B2 (enExample)
EP (1) EP1754019B1 (enExample)
JP (1) JP4956424B2 (enExample)
AT (1) ATE427476T1 (enExample)
DE (2) DE102005011285A1 (enExample)
WO (1) WO2005119173A1 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0518078D0 (en) * 2005-09-06 2005-10-12 Renishaw Plc Signal transmission system
DE102006054978A1 (de) * 2006-11-22 2008-05-29 Dr. Johannes Heidenhain Gmbh Tastsystem
GB0703423D0 (en) * 2007-02-22 2007-04-04 Renishaw Plc Calibration method and apparatus
GB0900878D0 (en) * 2009-01-20 2009-03-04 Renishaw Plc Method for optimising a measurement cycle
JP5276488B2 (ja) * 2009-03-20 2013-08-28 株式会社森精機製作所 工作機械における工作物測定装置およびその方法
JP5424676B2 (ja) * 2009-03-13 2014-02-26 キヤノン株式会社 画像処理装置
US20100269232A1 (en) * 2009-04-17 2010-10-21 Richard Kenton Workman Scanning Probe Microscope that Outputs Metadata with Image
CN102814707B (zh) * 2012-08-14 2015-02-18 西安理工大学 一种触发式传感器触发行程的测定装置及方法
DE102013219277A1 (de) * 2013-09-25 2015-03-26 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Verfahren zur Überprüfung eines Arbeitstaktsignals
US10215547B2 (en) * 2016-06-24 2019-02-26 Mitutoyo Corporation Method for operating a coordinate measuring machine
GB201700879D0 (en) 2017-01-18 2017-03-01 Renishaw Plc Machine tool apparatus
DE102018204696B4 (de) 2018-03-27 2025-12-24 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und Anordnung zum Erfassen eines Objekts mittels eines bewegbaren Sensors
DE102019122650A1 (de) * 2019-08-22 2021-02-25 M & H Inprocess Messtechnik Gmbh Messsystem
DE102019122655A1 (de) * 2019-08-22 2021-02-25 M & H Inprocess Messtechnik Gmbh Messsystem

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5782707A (en) * 1980-11-10 1982-05-24 Toyoda Mach Works Ltd Method and device for measuring curved surface shape
JPS58127110A (ja) * 1981-10-07 1983-07-28 Toshiba Mach Co Ltd 計測方法および計測装置
US4484118A (en) * 1981-08-29 1984-11-20 Toshiba Kikai Kabushiki Kaisha Method and apparatus for measuring a workpiece
JPH057526Y2 (enExample) * 1987-08-05 1993-02-25
US5189806A (en) * 1988-12-19 1993-03-02 Renishaw Plc Method of and apparatus for scanning the surface of a workpiece
GB8908854D0 (en) * 1989-04-19 1989-06-07 Renishaw Plc Method of and apparatus for scanning the surface of a workpiece
DE4245012B4 (de) * 1992-04-14 2004-09-23 Carl Zeiss Verfahren zur Messung von Formelementen auf einem Koordinatenmeßgerät
IT1279590B1 (it) * 1995-05-11 1997-12-16 Marposs Spa Sistema e metodo di trasmissione di segnali via etere fra una testa di controllo e un ricevitore remoto
DE19525592A1 (de) * 1995-07-13 1997-01-16 Zeiss Carl Fa Verfahren zur Koordinatenmessung an Werkstücken
JPH10132549A (ja) * 1996-10-25 1998-05-22 Ricoh Co Ltd 形状測定装置
DE69814198T2 (de) * 1997-02-10 2004-04-08 Mitutoyo Corp., Kawasaki Messverfahren und Messinstrument mit Triggersonde
DE19929557B4 (de) * 1999-06-18 2006-01-19 Dr. Johannes Heidenhain Gmbh Verfahren und Schaltkreis zur Einstellung einer Schaltschwelle eines Tastschalters
US6704684B2 (en) * 1999-10-22 2004-03-09 Carl-Zeiss-Stiftung Method for determining measuring points on a workpiece and a measuring system therefor
DE10050795C2 (de) * 1999-12-23 2002-11-07 Klingelnberg Gmbh Verfahren und Vorrichtung zum Scannen auf einem Koordinatenmessgerät
DE10020842A1 (de) * 2000-04-28 2001-10-31 Zeiss Carl Koordinatenmeßgerät oder Werkzeugmaschine
DE60228772D1 (de) * 2001-02-02 2008-10-16 Renishaw Plc Durch Biegung des Messfühlers konfigurierbare Messsonde für eine Werkzeugmaschine
GB0308149D0 (en) * 2003-04-09 2003-05-14 Renishaw Plc Probe for sensing the position of an object
DE102004035926A1 (de) * 2004-07-23 2006-03-16 Dr. Johannes Heidenhain Gmbh Tastkopf

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