JP2008221352A - Polishing method and polishing device - Google Patents

Polishing method and polishing device Download PDF

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JP2008221352A
JP2008221352A JP2007059410A JP2007059410A JP2008221352A JP 2008221352 A JP2008221352 A JP 2008221352A JP 2007059410 A JP2007059410 A JP 2007059410A JP 2007059410 A JP2007059410 A JP 2007059410A JP 2008221352 A JP2008221352 A JP 2008221352A
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polishing
polished
plate
ultraviolet light
surface plate
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Junji Watanabe
純二 渡邉
Chuji Kirino
宙治 桐野
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Kumamoto Technology and Industry Foundation
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Kumamoto Technology and Industry Foundation
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<P>PROBLEM TO BE SOLVED: To provide a polishing method and a polishing device capable of extremely smoothly polishing without leaving a sub surface damage on surfaces to be polished to form the surfaces to be polished free from chipping, and accurately polishing even a curved surface. <P>SOLUTION: An object to be polished (diamond cutting tool 20) is held by a cutting tool holding mechanism having adjustable angle and swing. The flank 20a and the face 20b of the diamond cutting tool 20 are polished by a plate-like polishing surface plate 10 having a deformable polishing surface. The polishing surface plate 10 is formed of a circular quartz plate having a thickness of 1 mm or shorter and a diameter of 20-40 mm. The surfaces to be polished (the flank 20a and the face 20b) are radiated with an ultraviolet L from an ultraviolet light source lamp 11. The rotational speed, position, and swing angle of the polishing surface plate 10 are adjusted by an automatic spindle swing mechanism. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、ダイヤモンド単結晶、ダイヤモンド切削加工品などの高硬度の研磨対象の研磨に好適な研磨方法および研磨装置に関する。   The present invention relates to a polishing method and a polishing apparatus suitable for polishing a high-hardness polishing object such as a diamond single crystal and a diamond machined product.

従来、ダイヤモンドバイトなどを研磨するには、図5に示したように、回転する鋳鉄定盤100上にダイヤモンド粒子(砥粒)101を散布してダイヤモンドバイト102の被研磨面(逃げ面102a,掬い面102b)を押し付けて研磨する機械的作用による方法(スカイフ研磨)が採用されている。
特開2006−224252号公報
Conventionally, in order to polish a diamond cutting tool or the like, as shown in FIG. 5, diamond particles (abrasive grains) 101 are dispersed on a rotating cast iron surface plate 100, and the polished surface (flank 102 a, A method (skyf polishing) using a mechanical action in which the scooping surface 102b) is pressed and polished is employed.
JP 2006-224252 A

しかしながら、このような機械的作用による研磨方法では、微細なスクラッチが発生し、加工面下には残留歪が残留するため、単結晶ダイヤモンドバイトのエッジには数十nmオーダのチッピングが発生する。また、見かけ上チッピングが小さくても、残留歪の影響により、このバイトにより超精密切削を行っている最中に、ミクロなチッピングや損耗が発生しやすく、高精度な切削面を再現性よく得ることが困難であると共に、バイトを長寿命に使用することができないという問題があった。また、従来の機械的なスカイフ研磨では、ダイヤモンド単結晶の(111)面は研磨できないことが知られている。そのため、磨耗しにくい(111)面をバイトの磨耗しやすい面に構成する特別なバイトを作ることができないという問題があった。   However, in the polishing method using such a mechanical action, fine scratches are generated, and residual strain remains under the processed surface, so that chipping on the order of several tens of nanometers occurs at the edge of the single crystal diamond tool. Even if the chipping is apparently small, microchipping and wear are likely to occur during ultra-precision cutting with this tool due to the effect of residual strain, and a highly accurate cutting surface can be obtained with good reproducibility. There is a problem that the tool cannot be used for a long life. In addition, it is known that the (111) plane of a diamond single crystal cannot be polished by conventional mechanical Skyf polishing. For this reason, there is a problem that a special cutting tool in which the (111) surface which is hard to wear is formed into a surface which is easy to wear can not be made.

また、従来の研磨方法では、鋳鉄定盤によってダイヤモンドバイトの逃げ面を研磨するときには、逃げ面に半円曲面があるため、バイトを回転定盤面に垂直に保持し、掬い面に垂直な軸の周りに±60度程度ゆっくりと傾けながら研磨している。   In the conventional polishing method, when the flank face of a diamond tool is polished by a cast iron surface plate, the flank surface has a semicircular curved surface. Polishing while slowly tilting around ± 60 degrees.

しかしながら、このような研磨方法では、バイトの保持姿勢の安定化が困難であり、定盤面の回転によってミクロンオーダの上下フレが発生し,バイトの先端形状に誤差が生じてしまう。このように従来の研磨方法では、先端曲率半径の小さなバイトを高精度形状に再現良く研磨することは極めて難しく、また極めて高価なものになるという問題があった。   However, with such a polishing method, it is difficult to stabilize the holding posture of the cutting tool, and the rotation of the surface plate surface causes micron-order vertical deflection, resulting in an error in the tip shape of the cutting tool. As described above, the conventional polishing method has a problem that it is extremely difficult and extremely expensive to polish a cutting tool having a small radius of curvature at the tip to a highly accurate shape with good reproducibility.

このようなことから、微細なスクラッチの発生を防ぎ、残留歪のないチッピングフリーとなる高精度研磨加工を実現する技術が望まれていた。なお、特許文献1には、本発明と同様に紫外光を照射して研磨を行う技術が開示されているが、この技術では光触媒作用を有する研磨剤を被研磨面に供給するものであり、かつ研磨定盤が厚肉であるため、バイトの先端部のような曲面を有する部分の加工は困難であった。   For this reason, there has been a demand for a technique that prevents the generation of fine scratches and realizes high-precision polishing that is free of chipping and has no residual strain. In addition, Patent Document 1 discloses a technique for performing polishing by irradiating ultraviolet light in the same manner as in the present invention. In this technique, a polishing agent having a photocatalytic action is supplied to a surface to be polished. In addition, since the polishing surface plate is thick, it is difficult to process a portion having a curved surface such as a tip portion of a cutting tool.

本発明はかかる問題点に鑑みてなされたもので、その目的は、被研磨面にサブサーフェスダメージを残すことなく、極めて平滑に研磨し、被研磨面でのチッピングの発生を抑制することができると共に、曲面形状に対しても高精度の研磨が可能な研磨方法および研磨装置を提供することにある。   The present invention has been made in view of such problems, and the object thereof is to perform extremely smooth polishing without leaving subsurface damage on the surface to be polished, and to suppress the occurrence of chipping on the surface to be polished. At the same time, it is an object to provide a polishing method and a polishing apparatus capable of highly accurate polishing even for a curved surface shape.

本発明の研磨方法は、研磨対象との接触圧により研磨面が撓み可能な板状の研磨定盤を、研磨対象の被研磨面に接触させると共に面内において回転させ、かつ、研磨対象の被研磨面に紫外光を照射しつつ、研磨定盤を研磨対象の被研磨面の形状に沿って移動させることにより研磨対象の研磨を行うものである。   In the polishing method of the present invention, a plate-shaped polishing surface plate whose polishing surface can be bent by contact pressure with the object to be polished is brought into contact with the surface to be polished and rotated within the surface, and the object to be polished is The polishing target is polished by moving the polishing surface plate along the shape of the surface to be polished while irradiating the polishing surface with ultraviolet light.

研磨定盤は、研磨対象よりも軟質の材料により構成されていることが望ましく、例えば研磨対象がダイヤモンドからなる工具である場合には、研磨定盤は厚み1mm以下、直径20mm〜40mmの円形状の石英板とする。また、紫外光は170nm以上400nm以下の波長であるが、研磨対象のバンドギャップエネルギー以上のエネルギーを持つ波長、または研磨対象の光吸収帯と同じ波長域を持つ波長を有するものが好ましく、例えば研磨対象がダイヤモンド工具である場合には、そのバンドギャップエネルギー(5.4eV)に相当する波長220nm付近の紫外光とする。   The polishing surface plate is preferably made of a softer material than the object to be polished. For example, when the object to be polished is a tool made of diamond, the polishing surface plate has a circular shape with a thickness of 1 mm or less and a diameter of 20 mm to 40 mm. Of quartz plate. The ultraviolet light has a wavelength of 170 nm or more and 400 nm or less, but preferably has a wavelength having energy equal to or higher than the band gap energy of the object to be polished or a wavelength having the same wavelength region as the light absorption band of the object to be polished. When the object is a diamond tool, it is an ultraviolet light having a wavelength of around 220 nm corresponding to the band gap energy (5.4 eV).

また、本発明の研磨方法では、研磨対象の所望の形状と研磨中の現形状との差をモニタリングし、差の大きな部位では研磨定盤による研磨度合いを差の小さな部位よりも大きくすることが望ましい。具体的には、差の大きな部位では研磨定盤の停滞時間を長くするか、あるいは研磨定盤の回転速度を速くすればよい。   Further, in the polishing method of the present invention, the difference between the desired shape to be polished and the current shape being polished can be monitored, and the degree of polishing by the polishing surface plate can be made larger at the part where the difference is large than at the part where the difference is small. desirable. Specifically, the stagnation time of the polishing platen may be lengthened or the rotation speed of the polishing platen may be increased at a portion where the difference is large.

本発明の研磨装置は、研磨対象を保持する保持機構と、研磨対象との接触圧により研磨面が撓み可能な板状の研磨定盤と、研磨定盤を研磨面内において回転可能に支持する回転軸を有すると共に、研磨定盤を研磨対象の被研磨面に応じて相対的に変位可能な研磨定盤駆動手段と、研磨対象の被研磨面に紫外光を照射する紫外光照射手段とを備えたものである。   The polishing apparatus of the present invention supports a holding mechanism for holding a polishing target, a plate-shaped polishing surface plate whose polishing surface can be bent by a contact pressure with the polishing target, and a polishing surface plate that is rotatably supported within the polishing surface. A polishing surface plate driving means having a rotating shaft and capable of relatively displacing the polishing surface plate in accordance with the surface to be polished, and an ultraviolet light irradiation means for irradiating the surface to be polished with ultraviolet light. It is provided.

本発明の研磨方法および研磨装置では、研磨対象の被研磨面に紫外光が照射されると共に、研磨定盤が回転しながら研磨対象の被研磨面に接触し、その被研磨面の形状に沿って移動して研磨を行う。このとき紫外光の照射により被研磨面が活性化して酸化膜が形成され、この酸化膜が研磨定盤との相互摩擦により除去されることにより研磨が進行する。特に、被研磨面が曲面形状の場合には、それに倣って研磨定盤がたわみつつ、所定の幅の面接触状態で研磨が行われる。   In the polishing method and the polishing apparatus of the present invention, the surface to be polished is irradiated with ultraviolet light, and the polishing surface plate rotates and contacts the surface to be polished to follow the shape of the surface to be polished. Move and polish. At this time, the surface to be polished is activated by irradiation with ultraviolet light to form an oxide film, and this oxide film is removed by mutual friction with the polishing surface plate, whereby polishing proceeds. In particular, when the surface to be polished is a curved surface, polishing is performed in a surface contact state with a predetermined width while the polishing surface plate bends accordingly.

本発明の研磨装置では、研磨定盤駆動手段を、研磨定盤を旋回させる機能、および研磨定盤の回転速度を研磨部位に応じて変更可能な機能を有するものとし、また、保持機構が研磨対象の姿勢角度を調整可能な機能を有するものとすることが望ましい。   In the polishing apparatus of the present invention, the polishing platen driving means has a function of turning the polishing platen and a function of changing the rotation speed of the polishing platen according to the polishing part, and the holding mechanism is polished. It is desirable to have a function capable of adjusting the posture angle of the target.

本発明の研磨方法または研磨装置によれば、研磨定盤を、研磨対象との接触圧により研磨面が撓み可能な板状のものとし、この研摩定盤を研磨対象の被研磨面に接触させると共に面内において回転させ、かつ研磨対象の被研磨面に紫外光を照射しつつ研磨を行うようにしたので、サブサーフェスダメージを残すことなく極めて平滑に研磨し、被研磨面でのチッピングの発生を抑制することができると共に、例えばダイヤモンドバイトの逃げ面のような曲面形状に対しても高精度の研磨が可能になる。   According to the polishing method or the polishing apparatus of the present invention, the polishing surface plate is formed into a plate shape whose polishing surface can be bent by the contact pressure with the object to be polished, and the polishing surface plate is brought into contact with the surface to be polished. At the same time, the surface to be polished is rotated and the surface to be polished is irradiated with ultraviolet light so that it is polished smoothly without leaving any subsurface damage, and chipping occurs on the surface to be polished. In addition, it is possible to perform high-precision polishing even for a curved surface shape such as a flank of a diamond tool.

以下、本発明の実施の形態について図面を参照して説明する。   Embodiments of the present invention will be described below with reference to the drawings.

図1は本発明の第1の実施の形態に係る研磨方法に用いる研磨装置1の要部構成を表したものである。この研磨装置1は、研磨定盤10および紫外光源ランプ11を備えており、研磨対象、例えばダイヤモンドバイト20の被研磨面(逃げ面20aおよび掬い面20b)に対して研磨を行うものである。   FIG. 1 shows a main configuration of a polishing apparatus 1 used in the polishing method according to the first embodiment of the present invention. The polishing apparatus 1 includes a polishing surface plate 10 and an ultraviolet light source lamp 11, and performs polishing on a surface to be polished, for example, a surface to be polished (flank 20a and scooping surface 20b) of a diamond cutting tool 20.

研磨定盤10は、ダイヤモンドバイト20よりも軟質であって、その接触圧により研磨面が変形可能、特に、ダイヤモンドバイト20の曲面部分(逃げ面20a)の研磨に際しては、その曲面部分に所定の幅で面接触しうる程度の柔軟性を有するものであり、具体的には例えば石英板(SiO2 )により構成される。この石英板は、例えば0.01MPa/mm〜1MPa/mm程度の撓み剛性を有するものであり、例えば直径20〜40mmの大きさの円盤状で、好ましくは1mm以下、より好ましくは0.5mm以下の厚みを有する。 The polishing surface plate 10 is softer than the diamond bit 20 and its polishing surface can be deformed by its contact pressure. In particular, when the curved surface portion (flank 20a) of the diamond bit 20 is polished, the curved surface portion has a predetermined surface. It is flexible enough to make surface contact with the width, and is specifically composed of, for example, a quartz plate (SiO 2 ). This quartz plate has a flexural rigidity of, for example, about 0.01 MPa / mm to 1 MPa / mm, and is, for example, a disk shape having a diameter of 20 to 40 mm, preferably 1 mm or less, more preferably 0.5 mm or less. Having a thickness of

このような厚みおよび大きさを有することにより、本実施の形態では、研磨定盤10が柔軟性を示し、特にダイヤモンドバイト20の曲面(逃げ面20a)においては適度な接触圧をもって高精度に研磨することが可能になる。また、この研磨定盤10は、石英板により構成されているため、紫外光Lに対する透明性を有し、裏面からの紫外線を透過できるようになっている。この研磨定盤10は、その中心位置に取り付けられたスピンドル12によって面内で回転可能となっている。スピンドル12としては、例えば軽負荷用の最大50,000rpmの性能を有するものを用いることができる。また、このスピンドル12は図2に示したようにスピンドル自動旋回機構13に取り付けられており、研磨定盤10を旋回させることができると共に、その旋回角度に応じて回転速度も調整可能となっている。   By having such thickness and size, in this embodiment, the polishing surface plate 10 exhibits flexibility, and particularly, the curved surface (flank 20a) of the diamond tool 20 is polished with an appropriate contact pressure with high accuracy. It becomes possible to do. Moreover, since this polishing surface plate 10 is comprised by the quartz plate, it has transparency with respect to the ultraviolet light L, and can permeate | transmit the ultraviolet-ray from a back surface. The polishing surface plate 10 can be rotated in the plane by a spindle 12 attached to the center position thereof. As the spindle 12, for example, a spindle having a maximum performance of 50,000 rpm for a light load can be used. Further, the spindle 12 is attached to a spindle automatic turning mechanism 13 as shown in FIG. 2, so that the polishing surface plate 10 can be turned and the rotation speed can be adjusted according to the turning angle. Yes.

紫外光源ランプ11は、研磨定盤10およびダイヤモンドバイト20の近傍位置に配置されており、ダイヤモンドバイト20の被研磨面(逃げ面20aおよび掬い面20b)に対して紫外光Lを照射するものである。紫外光Lは、例えば波長170nm以上400nm以下であり、好ましくは、ダンヤモンドのバンドギャップエネルギー(5.4eV)に相当する波長220nm付近のものである。なお、紫外光Lがダイヤモンドバイト20の被研磨面の全面に対して照射されるように、紫外光源ランプ11の位置および出射する紫外光Lの角度および光束を調節することが望ましい。   The ultraviolet light source lamp 11 is disposed in the vicinity of the polishing surface plate 10 and the diamond cutting tool 20, and irradiates the polished surface (flank 20 a and scooping surface 20 b) of the diamond cutting tool 20 with ultraviolet light L. is there. The ultraviolet light L has, for example, a wavelength of 170 nm or more and 400 nm or less, and preferably has a wavelength of around 220 nm corresponding to the band gap energy (5.4 eV) of dyanmond. It is desirable to adjust the position of the ultraviolet light source lamp 11, the angle of the emitted ultraviolet light L, and the luminous flux so that the ultraviolet light L is irradiated to the entire surface of the diamond bit 20 to be polished.

なお、紫外光源ランプ11の配置は研磨定盤10の裏面側としてもよく、また、紫外光Lの照射はランプに限らずレーザによってもよい。レーザとした場合には、研磨定盤10の裏面側からダイヤモンドバイト20の被研磨面に対して直接に紫外光を照射することができる。   The arrangement of the ultraviolet light source lamp 11 may be on the back surface side of the polishing surface plate 10, and the irradiation of the ultraviolet light L is not limited to the lamp and may be a laser. When a laser is used, ultraviolet light can be directly applied to the surface to be polished of the diamond tool 20 from the back surface side of the polishing surface plate 10.

ダイヤモンドバイト20は図2に示したように、バイト保持機構21により保持されており、被研摩面の角度および煽りの調整が可能となっている。バイト保持機構21としては例えばダイヤモンド宝石のブリリアンカット用の機構を用いることができる。   As shown in FIG. 2, the diamond cutting tool 20 is held by a cutting tool holding mechanism 21, and the angle and the angle of the surface to be polished can be adjusted. As the bite holding mechanism 21, for example, a mechanism for brilliant cutting of diamond jewels can be used.

本実施の形態に係る研磨装置1では、研磨定盤10の研摩面をダイヤモンドバイト20の被研磨面(逃げ面20a,掬い面20b)に所定の圧力で押し付けた状態で、紫外光源ランプ11より紫外光Lを照射しつつ研摩を行う。ここで、ダイヤモンドバイト20の被研摩面の位置,角度はバイト保持機構21によって、一方、研磨定盤10の回転速度、位置,旋回角度はスピンドル自動旋回機構13によってそれぞれ相対的に調整され、これにより逃げ面20aおよび掬い面20bが精度よく研磨される。   In the polishing apparatus 1 according to the present embodiment, the ultraviolet light source lamp 11 has the polishing surface of the polishing surface plate 10 pressed against the surface to be polished (flank 20a, scooping surface 20b) of the diamond tool 20 with a predetermined pressure. Polishing is performed while irradiating with ultraviolet light L. Here, the position and angle of the polished surface of the diamond tool 20 are adjusted by the tool holding mechanism 21, while the rotation speed, position and turning angle of the polishing surface plate 10 are relatively adjusted by the spindle automatic turning mechanism 13, respectively. Thus, the flank 20a and the scooping surface 20b are polished with high accuracy.

本実施の形態では、ダイヤモンドバイト20はバイト保持機構21によって正確な位置と姿勢にしっかりと固定されているため、研磨定盤10に撓みを与えた状態で、スピンドル11をダイヤモンドバイト20の先端の曲面に沿って運動させることによって、曲面を精度よく研磨することができる。   In the present embodiment, the diamond cutting tool 20 is firmly fixed to the correct position and posture by the cutting tool holding mechanism 21, so that the spindle 11 is attached to the tip of the diamond cutting tool 20 in a state where the polishing surface plate 10 is bent. By moving along the curved surface, the curved surface can be polished with high accuracy.

本実施の形態では、また、ダイヤモンドバイト20に対してそのバンドギャップエネルギーに相当する波長の紫外光が照射されることにより、被研磨面ではダイヤモンドが励起され、化学的に活性化される。すなわち、被研磨面では電子−正孔対によって水酸基ラジカルや酸素ラジカルが生成されて、酸化膜が形成される。この酸化膜が、研磨定盤10により摩擦エネルギーが与えられることによって、一酸化炭素(CO)あるいは二酸化炭素(CO2 )として除去されて研磨が進行する。このような研磨によってダイヤモンドバイト20の被研磨面の表面粗さはRaで0.3nm以下となり、完全にスクラッチがなく、残留歪みもなくなる。 In the present embodiment, the diamond bit 20 is irradiated with ultraviolet light having a wavelength corresponding to the band gap energy, so that diamond is excited and chemically activated on the surface to be polished. That is, on the surface to be polished, hydroxyl radicals and oxygen radicals are generated by electron-hole pairs to form an oxide film. This oxide film is removed as carbon monoxide (CO) or carbon dioxide (CO 2 ) by applying friction energy to the polishing surface plate 10, and polishing proceeds. By such polishing, the surface roughness of the polished surface of the diamond bit 20 becomes 0.3 nm or less in Ra, and there is no scratch and no residual distortion.

ここで、ダイヤモンドバイト20の曲面(逃げ面20a)を研摩する位置では、その曲面と研磨定盤10との接触部は僅かな幅を有する面接触となり、これにより研磨精度が維持される。よって、本実施の形態では、ダイヤモンドバイト20の目標とする曲面形状に対する、研磨中の現形状との差を検知し、差の大きな部位では研磨定盤10を長時間停滞させ、差の小さな部位に対してより多く研磨を進行させることにより、次第に所望の形状に近づくような研磨を行うことが望ましい。なお、差の大きな部位では研磨定盤10の回転速度を相対的に大きくして研摩を進行させるようにしてもよい。また、平坦な掬い面20bを研磨する場合には、研磨定盤10を掬い面20bに対して平行に設定して研磨すればよい。   Here, at the position where the curved surface (flank 20a) of the diamond tool 20 is polished, the contact portion between the curved surface and the polishing surface plate 10 is a surface contact having a slight width, thereby maintaining the polishing accuracy. Therefore, in the present embodiment, the difference between the target curved surface shape of the diamond tool 20 and the current shape during polishing is detected, and the polishing surface plate 10 is stagnated for a long time at a portion where the difference is large, and the portion where the difference is small In contrast, it is desirable to perform polishing so as to gradually approach a desired shape by advancing the polishing more. It should be noted that the polishing may be advanced by relatively increasing the rotational speed of the polishing surface plate 10 at a portion where the difference is large. Further, when polishing the flat scooping surface 20b, the polishing surface plate 10 may be set parallel to the scooping surface 20b.

このように本実施の形態に係る研磨装置1では、研磨対象(ダイヤモンドバイト20)を機械的な作用のみでなく、紫外線の照射によって化学的に反応を起こさせると共に、その反応生成物をダイヤモンドよりも軟質の石英からなる研磨定盤10の摩擦作用によって除去するようにしたので、被研磨面にスクラッチや残留歪みが生ずることはなく、ダイヤモンドバイト20のエッジ部分にチッピングや残留歪みがなく、使用寿命を長くすることができる。   As described above, in the polishing apparatus 1 according to the present embodiment, the object to be polished (diamond bit 20) is not only mechanically reacted but also chemically reacted by irradiation with ultraviolet rays, and the reaction product is produced from diamond. Since the polishing surface plate 10 made of soft quartz is removed by the frictional action, the surface to be polished is free from scratches and residual strain, and the edge portion of the diamond bit 20 is free from chipping and residual strain. The lifetime can be extended.

更に、紫外光を照射しながら研磨するようにしたので、従来では機械的な研磨が不可能とされていた単結晶(111)面も他の結晶面と同様に研磨することが可能になり、掬い面20bなど切削時に磨耗変形しやすい面にダイヤモンド(111)面を設定した新しいタイプのバイトも製作が可能であり、超精密、超寿命バイトの研磨が可能となる。   Furthermore, since polishing was performed while irradiating with ultraviolet light, it became possible to polish the single crystal (111) plane, which was conventionally impossible to mechanically polish, in the same manner as other crystal planes. A new type of cutting tool having a diamond (111) surface set on a surface that is easily worn and deformed during cutting, such as the scooping surface 20b, can be manufactured, and ultra-precise and ultra-long-life cutting tools can be polished.

また、研磨定盤10はダイヤモンドよりも軟質の石英で構成すると共に、その石英板の厚みを薄くするようにしたので、定盤全体が可撓性を有するものであり、ダイヤモンドバイト20をバイト保持機構21により正確な位置と姿勢にしっかりと固定し、研磨定盤10をダイヤモンドバイト20の被研磨面に接触させ、撓みを与えた状態で、その回転軸(スピンドル11)をダイヤモンドバイト20の先端の曲面に沿って運動させることによって、曲面を所定幅の面接触状態で精度よく研磨することができる。   Further, since the polishing surface plate 10 is made of quartz softer than diamond and the thickness of the quartz plate is made thin, the entire surface plate is flexible, and the diamond bit 20 is held by the bite. The mechanism 21 is firmly fixed in an accurate position and posture, the polishing surface plate 10 is brought into contact with the surface to be polished of the diamond tool 20, and the rotating shaft (spindle 11) is set to the tip of the diamond tool 20 in a state of bending. By moving along the curved surface, the curved surface can be accurately polished in a surface contact state with a predetermined width.

また、本実施の形態では、研磨定盤10を小径の薄い石英板により構成したので、研磨中の形状も顕微鏡的に観察しながら研磨することができる。また、紫外光に対して透明な石英板であるため、研磨定盤10を裏面から照射させることも可能でなり、よってダイヤモンドバイト20の被研磨面に対して紫外光を効果的に照射しながら研磨することができる。   Further, in the present embodiment, the polishing surface plate 10 is made of a thin quartz plate having a small diameter, so that the shape being polished can be polished while being observed microscopically. In addition, since the quartz plate is transparent to ultraviolet light, it is possible to irradiate the polishing surface plate 10 from the back surface, so that the surface to be polished of the diamond tool 20 is effectively irradiated with ultraviolet light. Can be polished.

次に、図4を参照して本発明の第2の実施の形態について説明する。本実施の形態に係る研磨装置2は、上述の石英薄板からなる研磨定盤10を例えばアルミニウム製の保持円盤31により保持する構造としたものである。保持円盤31は、その表面側に中央凸部31Aおよびリング状の周縁凸部31Bを有し、これら中央凸部31Aおよび周縁凸部31Bによって石英薄板からなる研磨定盤10を保持するようになっている。保持は例えば接着剤により行われる。スピンドル12はこの保持円盤31の裏面中央部に取り付けられている。研磨時に生ずる研磨定盤10のたわみは、中央凸部31Aおよび周縁凸部31Bと研磨定盤10とにより囲まれたキャビティ部32によって吸収されるようになっている。保持円盤31にはキャビティ部32に対向してリング状の紫外光透過孔33が設けられ、紫外光源ランプ12からの紫外光はこの紫外光透過孔33を通して、石英薄板の裏面側からダイヤモンドバイト20の先端に照射されるようになっている。   Next, a second embodiment of the present invention will be described with reference to FIG. The polishing apparatus 2 according to the present embodiment has a structure in which the polishing surface plate 10 made of the above-described quartz thin plate is held by a holding disk 31 made of, for example, aluminum. The holding disk 31 has a central convex portion 31A and a ring-shaped peripheral convex portion 31B on the surface side, and holds the polishing surface plate 10 made of a quartz thin plate by the central convex portion 31A and the peripheral convex portion 31B. ing. The holding is performed by an adhesive, for example. The spindle 12 is attached to the center of the back surface of the holding disk 31. Deflection of the polishing surface plate 10 that occurs during polishing is absorbed by the cavity portion 32 surrounded by the central convex portion 31 </ b> A and the peripheral convex portion 31 </ b> B and the polishing surface plate 10. The holding disk 31 is provided with a ring-shaped ultraviolet light transmission hole 33 facing the cavity portion 32, and the ultraviolet light from the ultraviolet light source lamp 12 passes through the ultraviolet light transmission hole 33 from the back side of the quartz thin plate, and the diamond bit 20. The tip is irradiated.

本実施の形態では、石英薄板からなる研磨定盤10を保持円盤31によって撓み可能に保持するようにしているので、石英薄板に割れが生ずる虞がなくなる。その他の作用効果は上記実施の形態と同様であるので、その説明は省略する。   In the present embodiment, since the polishing surface plate 10 made of a quartz thin plate is held by the holding disk 31 so as to be able to bend, there is no possibility that the quartz thin plate is cracked. Other functions and effects are the same as those of the above-described embodiment, and thus description thereof is omitted.

なお、上記実施の形態では、研磨対象をダイヤモンドバイト20としたが、本発明はこれに限定されるものではなく、ダイヤモンド単結晶としてもよく、他の材料、例えば炭化珪素(SiC)やガリウムヒ素(GaAs)などの研磨に対しも用いることがでできる。また、研磨定盤10とし、石英板を用いたが、研磨対象に対して軟質で全体として可撓性を有するものであれば、他の材質のものであってもよい。   In the embodiment described above, the diamond bit 20 is used as an object to be polished. However, the present invention is not limited to this, and may be a diamond single crystal, such as silicon carbide (SiC) or gallium arsenide. It can also be used for polishing (GaAs) or the like. Further, although a quartz plate is used as the polishing surface plate 10, other materials may be used as long as they are soft to the object to be polished and have flexibility as a whole.

本発明の第1実施の形態に係る研磨装置の概略構成を表す斜視図である。1 is a perspective view illustrating a schematic configuration of a polishing apparatus according to a first embodiment of the present invention. 図1の研磨装置の平面図である。FIG. 2 is a plan view of the polishing apparatus in FIG. 1. 図1の研磨装置の側面図である。FIG. 2 is a side view of the polishing apparatus of FIG. 1. 本発明の第2実施の形態に係る研磨装置を表す側断面図である。It is a sectional side view showing the polish device concerning a 2nd embodiment of the present invention. 従来の研磨方法を説明するための斜視図である。It is a perspective view for demonstrating the conventional grinding | polishing method.

符号の説明Explanation of symbols

1…研磨装置、10…研磨定盤、11…紫外光源ランプ、12…スピンドル、13…スピンドル自動旋回機構、21…バイト保持機構、20…ダイヤモンドバイト、20a…逃げ面、20b…掬い面、31…保持円盤   DESCRIPTION OF SYMBOLS 1 ... Polishing apparatus, 10 ... Polishing surface plate, 11 ... Ultraviolet light source lamp, 12 ... Spindle, 13 ... Spindle automatic turning mechanism, 21 ... Bite holding mechanism, 20 ... Diamond bite, 20a ... Flank, 20b ... Scuffing surface, 31 ... holding disc

Claims (10)

研磨対象との接触圧により研磨面が撓み可能な板状の研磨定盤を、前記研磨対象の被研磨面に接触させると共に面内において回転させ、かつ、
前記研磨対象の被研磨面に紫外光を照射しつつ、前記研磨定盤を前記研磨対象の被研磨面の形状に沿って移動させることにより前記研磨対象の研磨を行う
ことを特徴とする研磨方法。
A plate-like polishing surface plate whose polishing surface can be bent by contact pressure with the object to be polished is brought into contact with the surface to be polished of the object to be polished and rotated within the surface; and
A polishing method comprising polishing the polishing target by moving the polishing platen along the shape of the polishing target surface while irradiating the polishing target surface with ultraviolet light. .
前記研磨定盤は、前記研磨対象よりも軟質の材料により構成されている
ことを特徴とする請求項1記載の研磨方法。
The polishing method according to claim 1, wherein the polishing platen is made of a softer material than the object to be polished.
前記研磨定盤は、曲面部分を有する研磨対象の研磨に際し、前記研磨対象の曲面部分に所定の幅で面接触しうる柔軟性を有する
ことを特徴とする請求項1または2に記載の研磨方法。
3. The polishing method according to claim 1, wherein the polishing surface plate has a flexibility that allows surface contact with a predetermined width of the curved surface portion of the polishing target when the polishing target having a curved surface portion is polished. .
前記研磨対象はダイヤモンドからなる工具である
ことを特徴とする請求項1ないし3のいずれか1項に記載の研磨方法。
The polishing method according to claim 1, wherein the object to be polished is a tool made of diamond.
前記紫外光は、前記研磨対象のバンドギャップエネルギー以上のエネルギーを持つ波長、または前記研磨対象の光吸収帯と同じ波長域を持つ波長を有する
ことを特徴とする請求項1ないし4のいずれか1項に記載の研磨方法。
The ultraviolet light has a wavelength having an energy equal to or higher than a band gap energy of the object to be polished, or a wavelength having the same wavelength region as the light absorption band of the object to be polished. The polishing method according to item.
前記研磨対象の所望の形状と研磨中の現形状との差をモニタリングし、差の大きな部位では前記研磨定盤による研磨度合いを差の小さな部位よりも大きくする
ことを特徴とする請求項1ないし5のいずれか1項に記載の研磨方法。
The difference between the desired shape of the object to be polished and the current shape during polishing is monitored, and at a portion where the difference is large, the degree of polishing by the polishing platen is made larger than a portion where the difference is small. 6. The polishing method according to any one of 5 above.
研磨対象を保持する保持機構と、
前記研磨対象との接触圧により研磨面が撓み可能な板状の研磨定盤と、
前記研磨定盤を研磨面内において回転可能に支持する回転軸を有すると共に、前記研磨定盤を前記研磨対象の被研磨面に応じて相対的に変位可能な研磨定盤駆動手段と、
前記研磨対象の被研磨面に紫外光を照射する紫外光照射手段と
を備えたことを特徴とする研磨装置。
A holding mechanism for holding an object to be polished;
A plate-like polishing surface plate whose polishing surface can be bent by contact pressure with the object to be polished;
A polishing surface plate driving means having a rotating shaft that rotatably supports the polishing surface plate in a polishing surface, and capable of relatively displacing the polishing surface plate according to the surface to be polished;
A polishing apparatus comprising: ultraviolet light irradiation means for irradiating the surface to be polished with ultraviolet light.
前記研磨定盤駆動手段は、前記研磨定盤の旋回機能を有すると共に、前記研磨定盤の回転速度を研磨部位に応じて変更可能な機能を有する
ことを特徴とする請求項7記載の研磨装置。
The polishing apparatus according to claim 7, wherein the polishing platen driving unit has a function of turning the polishing platen and changing a rotation speed of the polishing platen according to a polishing portion. .
前記保持機構は前記研磨対象の姿勢角度を調整可能な機能を有する
ことを特徴とする請求項7または8に記載の研磨装置。
The polishing apparatus according to claim 7 or 8, wherein the holding mechanism has a function of adjusting a posture angle of the object to be polished.
前記研磨定盤は、曲面部分を有する研磨対象の研磨に際し、前記研磨対象の曲面部分に所定の幅で面接触しうる柔軟性を有する
ことを特徴とする請求項7ないし9のいずれか1項に記載の研磨装置。
The polishing table according to any one of claims 7 to 9, wherein the polishing platen has a flexibility that allows surface contact with a predetermined width of the curved surface portion of the polishing target when the polishing target having a curved surface portion is polished. The polishing apparatus according to 1.
JP2007059410A 2007-03-09 2007-03-09 Polishing method and polishing device Pending JP2008221352A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011166058A (en) * 2010-02-15 2011-08-25 Fujitsu Ltd Grinding method, manufacturing method of electronic device, and grinding device
CN108857841A (en) * 2018-07-25 2018-11-23 浙江工业大学 A kind of the photochemistry processing platform and its processing method of adjustable light source

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011166058A (en) * 2010-02-15 2011-08-25 Fujitsu Ltd Grinding method, manufacturing method of electronic device, and grinding device
CN108857841A (en) * 2018-07-25 2018-11-23 浙江工业大学 A kind of the photochemistry processing platform and its processing method of adjustable light source
CN108857841B (en) * 2018-07-25 2023-09-29 浙江工业大学 Photochemical processing platform capable of adjusting light source and processing method thereof

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