JP2008201644A - MANUFACTURE PROCESS OF BaLiF3 SINGLE CRYSTAL - Google Patents

MANUFACTURE PROCESS OF BaLiF3 SINGLE CRYSTAL Download PDF

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JP2008201644A
JP2008201644A JP2007041772A JP2007041772A JP2008201644A JP 2008201644 A JP2008201644 A JP 2008201644A JP 2007041772 A JP2007041772 A JP 2007041772A JP 2007041772 A JP2007041772 A JP 2007041772A JP 2008201644 A JP2008201644 A JP 2008201644A
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single crystal
balif
ingot
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JP4723525B2 (en
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Toshiaki Mabuchi
俊朗 真淵
Naoto Mochizuki
直人 望月
Teruhiko Nawata
輝彦 縄田
Hiroki Sato
浩樹 佐藤
Tsuguo Fukuda
承生 福田
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Tokuyama Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To stably, simply and inexpensively manufacture an optical member which is composed of BaLiF<SB>3</SB>crystal having the light-transmitting principal axis direction in the <100> direction, useful as the last lens in an immersion exposure apparatus for the manufacture of semiconductors and has a good uniformity in the refractive index. <P>SOLUTION: An ingot is manufactured by growing the crystal in the <111> direction by Czochralski method. The ingot is sliced in the diagonal direction to obtain a plate-like article having two parallel faces composed of ä100} faces. The plate-like article has a more uniform stress distribution (distortion) than the one grown in the <100> direction and sliced horizontally and gives a member with a good refractive index uniformity. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明はBaLiF単結晶体からなる光学部材の製造方法に関する。より詳しくは、液浸式露光装置のラストレンズとして有望な、光を透過させる主軸方向が<100>方向であるBaLiF結晶の光学特性を向上させることのできる製造方法に関する。 The present invention relates to a method for producing an optical member made of a BaLiF 3 single crystal. More specifically, the present invention relates to a manufacturing method that is promising as a last lens of an immersion type exposure apparatus and that can improve the optical characteristics of a BaLiF 3 crystal whose principal axis direction for transmitting light is the <100> direction.

半導体集積回路などの電子材料の製造分野で実施されるリソグラフィーエ程では、露光基板に対する転写パターンの微細化の要求が高まっており、この要求を実現すべく露光装置の解像度の向上が検討されている。   In the lithography process implemented in the field of manufacturing electronic materials such as semiconductor integrated circuits, there is an increasing demand for miniaturization of the transfer pattern on the exposure substrate, and improvement of the resolution of the exposure apparatus is being studied to realize this requirement. Yes.

一般に露光装置では、露光波長が小さくレンズの開口数が大きいほど、解像線幅を小さくして解像度を向上できることが知られている。このため、波長200nm以下の真空紫外領域の光(たとえば、ArFエキシマレーザー;発振波長193nm、F2エキシマレーザー;発振波長157nmなど)を光源として使用する試みと共に、このような短波長の光に対応可能な光学系の設計や、レンズ材料の開発などが進められている。   In general, it is known that in an exposure apparatus, as the exposure wavelength is smaller and the numerical aperture of the lens is larger, the resolution can be improved by reducing the resolution line width. For this reason, light in the vacuum ultraviolet region with a wavelength of 200 nm or less (for example, ArF excimer laser; oscillation wavelength 193 nm, F2 excimer laser; oscillation wavelength 157 nm, etc.) can be used as a light source and can handle such short wavelength light New optical system designs and lens materials are being developed.

また、これらの試みと並行して、露光基板と露光装置のラストレンズとの間に液体を充填することにより、露光基板面における光の波長を実質的に短くして解像度を向上させようとする液浸式露光装置の研究も進められている。   In parallel with these attempts, by filling a liquid between the exposure substrate and the last lens of the exposure apparatus, the wavelength of light on the exposure substrate surface is substantially shortened to improve the resolution. Research on immersion exposure equipment is also underway.

液浸式露光装置は、少なくとも、光源と、照明光学系と、マスク(レチクル)と、投影光学系と、液体の供給回収装置とを備えた装置であり、投影光学系の露光基板側の先端に設けられたレンズ(ラストレンズ)と、レジスト膜を有する露光基板との間に、液体を充填した状態で露光を行なう装置である。   An immersion exposure apparatus is an apparatus that includes at least a light source, an illumination optical system, a mask (reticle), a projection optical system, and a liquid supply / recovery device. Is an apparatus that performs exposure in a state in which a liquid is filled between a lens (last lens) provided on the substrate and an exposure substrate having a resist film.

このような液浸式露光装置のラストレンズには、光源の光の波長における屈折率および透過率が高いこと、真性複屈折や応力複屈折が低いかあるいは存在しないこと、光源の光に対する耐久性があること、使用する液体に対する耐久性があることなどの種々の性能が要求される。   The last lens of such an immersion type exposure apparatus has a high refractive index and transmittance at the light wavelength of the light source, low or no intrinsic birefringence or stress birefringence, and durability against the light of the light source. Various performances are required, such as being durable and resistant to the liquid used.

このような液浸式露光装置のラストレンズとして使用できる上記のような物性を有する材料としては、BaLiF単結晶体が提案されている(特許文献1参照)
また液浸式露光装置のラストレンズ以外の用途としては、露光装置等の真空紫外光用装置の光学部材としてBaLiF単結晶体を用いることが既に提案されている(例えば、特許文献2、3参照)。
As a material having the above physical properties that can be used as the last lens of such an immersion exposure apparatus, a BaLiF 3 single crystal has been proposed (see Patent Document 1).
Further, as applications other than the last lens of the immersion type exposure apparatus, it has already been proposed to use a BaLiF 3 single crystal as an optical member of a vacuum ultraviolet light apparatus such as an exposure apparatus (for example, Patent Documents 2 and 3). reference).

液浸式露光装置のラストレンズとしてBaLiF単結晶体を使用する場合には、BaLiF単結晶体の真性複屈折の特性により露光の解像度が低下することを防ぐために、光学系の設計や、マスク(レチクル)に描かれるパターン形状について工夫がなされる。光学系の設計では、たとえばCaF2単結晶などのBaLiF単結晶体とは異なる真性複屈折を有するレンズ材料と組合わせて投影光学系を構成することで、真性複屈折の影響を相殺して露光精度の改善を図ることが検討されているが、このような露光装置の光学設計をする上で、液浸式露光装置のラストレンズとして使用するBaLiF単結晶体としては、光を透過させる主軸方向に対して4回対称性を有する結晶方位<100>の単結晶体が好ましいと言われている。 When using a BaLiF 3 single crystal as a last lens of an immersion type exposure apparatus, in order to prevent a reduction in exposure resolution due to intrinsic birefringence characteristics of the BaLiF 3 single crystal, design of an optical system, A device is devised for the pattern shape drawn on the mask (reticle). In the design of the optical system, for example, the projection optical system is configured in combination with a lens material having intrinsic birefringence different from that of a BaLiF 3 single crystal such as a CaF 2 single crystal, thereby canceling the influence of intrinsic birefringence. Although improvement of exposure accuracy is being studied, in optical design of such an exposure apparatus, BaLiF 3 single crystal used as a last lens of an immersion type exposure apparatus transmits light. It is said that a single crystal having a crystal orientation <100> having 4-fold symmetry with respect to the principal axis direction is preferred.

BaLiF単結晶体は、上述した特許文献にも開示されているように、チョクラルスキー法やブリッジマン法等の融液成長により製造することが可能である。 The BaLiF 3 single crystal can be produced by melt growth such as the Czochralski method or the Bridgman method as disclosed in the above-mentioned patent documents.

通常、チョクラルスキー法によりレンズ等の光学部材用の単結晶を製造する際には、その方法の簡便さや加工効率の点から、光を透過させる主軸方向と同じ方向に結晶を成長させて単結晶体の塊(以下、「インゴット」という)を得た後に、該インゴットを結晶成長方向に対して垂直な面に沿って輪切りにすることで所望の結晶方向を有する板状体(以下、「ディスク」という)を切り出す工程が採用されている(図1参照)。   Usually, when a single crystal for an optical member such as a lens is manufactured by the Czochralski method, the single crystal is grown in the same direction as the principal axis direction through which light is transmitted from the viewpoint of the simplicity of the method and the processing efficiency. After obtaining a lump of crystal body (hereinafter referred to as “ingot”), the ingot is cut along a plane perpendicular to the crystal growth direction to obtain a plate-like body having a desired crystal direction (hereinafter, “ (Referred to FIG. 1).

チョクラルスキー法では、種結晶の結晶方位を選択することによって、単結晶体のインゴットの結晶成長方向を容易に制御することが可能であり、結晶成長方向が<100>方向であるインゴットは、結晶成長方向に対して<100>方向を向いた種結晶を原料溶融液に接触させた後に、該種結晶を引き上げることで製造することが可能である。   In the Czochralski method, by selecting the crystal orientation of the seed crystal, it is possible to easily control the crystal growth direction of the single crystal ingot, and the ingot whose crystal growth direction is the <100> direction is It is possible to manufacture the seed crystal by pulling up the seed crystal after bringing the seed crystal facing the <100> direction with respect to the crystal growth direction into contact with the raw material melt.

特開2007−005777号公報JP 2007-005777 A 特開2002−228802号公報JP 2002-228802 A 特開2003−119096号公報Japanese Patent Laid-Open No. 2003-119096

しかしながら、上記のようにチョクラルスキー法で<100>方向に成長させたインゴットを、成長方向に対して垂直に輪切りにしてBaLiF単結晶体のディスクを得た場合には、ディスク面内の屈折率均質性(Homogeneityともいう)が悪くなることがしばしばあることが本発明者らの検討によって明らかになった。 However, when an ingot grown in the <100> direction by the Czochralski method as described above is cut perpendicularly to the growth direction to obtain a BaLiF 3 single crystal disc, It has been clarified by the present inventors that refractive index homogeneity (also referred to as homogeneity) often deteriorates.

屈折率均質性は、液浸式露光装置のラストレンズとして使用する際に必要な特性であり、ラストレンズの屈折率均質性が低い場合には露光時の解像度が低下して極めて重大な問題になる。   Refractive index homogeneity is a necessary characteristic when used as the last lens of an immersion type exposure apparatus. If the refractive index homogeneity of the last lens is low, the resolution at the time of exposure is lowered, which is a very serious problem. Become.

本発明者らが更に検討を進めた結果、上記の方法で製造したBaLiF単結晶体のディスクについてクロスニコルという手法で歪の分布状態を観察した際に、不均質な歪の分布が結晶面に沿ったような線状の跡として観察され、更にこのような歪が不均質になった部分がディスク面内の屈折率が乱れた領域と一致していたことから、歪の不均質な分布が屈折率均質性の低下原因の1つであることが明らかになった。このようなクロスニコルで観察された歪の不均質な分布は、BaLiF単結晶体育成中に結晶中に発生した応力が結晶面でスリップすることによって部分的に緩和されて、他の部分と歪の状態が変わるために引き起こされたものと推定される。 As a result of further investigations by the present inventors, when the strain distribution state was observed by a method called crossed Nicols for the BaLiF 3 single crystal disk produced by the above method, the heterogeneous strain distribution was found to be a crystal plane. Since the portion where the distortion was inhomogeneous coincided with the region where the refractive index was disturbed in the disk surface, the distortion was inhomogeneously distributed. Is one of the causes of the decrease in refractive index homogeneity. The inhomogeneous distribution of strain observed in such a crossed Nicol is partially relaxed by the stress generated in the crystal during the growth of the BaLiF 3 single crystal being slipped on the crystal plane, and the other parts. It is presumed that it was caused by the change in the state of distortion.

従って本発明は、BaLiF単結晶体育成中のスリップを抑えることにより、液浸式露光装置のラストレンズの特性として要求される屈折率均質性が高く、かつ、光を透過させる主軸方向が<100>方向であるBaLiF単結晶体からなる光学部材の製造方法を提供することを目的とする。 Therefore, the present invention suppresses slip during BaLiF 3 single crystal growth, thereby providing high refractive index homogeneity required as a characteristic of the last lens of the immersion type exposure apparatus and a principal axis direction through which light is transmitted is < and to provide a method for producing an optical member made of BaLiF 3 single crystal 100> direction.

本発明者らは、上記課題を解決すべく鋭意検討を行い、その結果、チョクラルスキー法でインゴットを<111>方向に成長させることで、育成中に結晶面においてスリップが発生して歪の分布状態が不均質になることを抑えることが可能であり、この<111>方向に成長させたインゴットから、光を透過させる主軸方向が<100>方向になるように光学部材を切り出すことにより、屈折率均質性の高い光学部材を製造できることを見出し、さらに検討を進めた結果、本発明を完成させるに至った。   The present inventors have intensively studied to solve the above-mentioned problems, and as a result, by growing the ingot in the <111> direction by the Czochralski method, slip occurs on the crystal plane during the growth, and strain is reduced. It is possible to suppress the distribution state from becoming inhomogeneous, and by cutting the optical member from the ingot grown in the <111> direction so that the principal axis direction for transmitting light is the <100> direction, As a result of finding that an optical member having high refractive index homogeneity can be produced and further studying it, the present invention has been completed.

即ち、本発明は、BaLiF単結晶体からなり、光を透過させる主軸方向が該単結晶体における<100>方向である光学部材の製造方法であって、BaLiF溶融液に種結晶を接触させた後に引き上げるチョクラルスキー法によってインゴットを<111>方向に成長させて単結晶体を得、その後、該インゴットを加工して{100}面からなる平行2面を有する板状体を得る工程、を含むことを特徴とするBaLiF単結晶体からなる光学部材の製造方法である。 That is, the present invention is a method for manufacturing an optical member that is made of a BaLiF 3 single crystal and has a principal axis direction through which light is transmitted being the <100> direction in the single crystal, and the seed crystal is brought into contact with the BaLiF 3 melt. A step of growing the ingot in the <111> direction by the Czochralski method of pulling up and obtaining a single crystal, and then processing the ingot to obtain a plate-like body having two parallel faces of {100} faces a BaLiF 3 process for producing an optical member made of a single crystal which comprises a.

上記方法で、チョクラルスキー法で、インゴットを<111>方向に成長させた後に、このインゴットから{100}面に平行な面を有する板状体を切り出してBaLiF単結晶体からなる光学部材の製造をした場合には、育成中の結晶面のスリップの発生を抑えることが可能であり、屈折率均質性の高い光学部材を安定的に、また簡便かつ安価に得ることができる。 After the ingot is grown in the <111> direction by the Czochralski method by the above method, a plate-like body having a plane parallel to the {100} plane is cut out from the ingot, and an optical member made of a BaLiF 3 single crystal body Thus, it is possible to suppress the occurrence of slip on the crystal plane during growth, and an optical member having high refractive index homogeneity can be obtained stably, simply and inexpensively.

本発明により製造される、光を透過させる主軸方向が<100>方向であるBaLiF単結晶体からなる光学部材は、屈折率均質性の高く、液浸式露光装置のラストレンズ等の材料として有用である。 An optical member made of a BaLiF 3 single crystal having a <100> direction through which light is transmitted, manufactured according to the present invention, has high refractive index homogeneity and is used as a material for the last lens of an immersion exposure apparatus. Useful.

本発明の対象物である光学部材は、BaLiF単結晶体からなり、その光を透過させる主軸方向がBaLiF単結晶体の<100>方向である。ここで、主軸方向とは、該光学部材を透過する光の基準軸となる方向であり、該光学部材がレンズである場合には、そのレンズ球面の曲率中心が並ぶ軸(光軸ともいう)の方向と一致する(図2参照)。本発明の対象物である光学部材は、その光を透過させる主軸方向が<100>厳密に<100>方向である必要は無く、実質的に該方向であればよい。そのずれの許容範囲は光学部材の用途等により適宜決定される。通常は、BaLiF単結晶体の主軸方向と<100>方向との角度のずれは10°以内であり、好ましくは5°以内、より好ましくは3°以内、特に好ましくは1°以内である。 The optical member which is the object of the present invention is made of a BaLiF 3 single crystal, and the principal axis direction through which the light is transmitted is the <100> direction of the BaLiF 3 single crystal. Here, the principal axis direction is a direction serving as a reference axis for light transmitted through the optical member. When the optical member is a lens, the axis along which the centers of curvature of the lens spherical surfaces are arranged (also referred to as an optical axis). (See FIG. 2). In the optical member that is the object of the present invention, the main axis direction for transmitting the light does not need to be <100> strictly <100> direction, and may be substantially in that direction. The allowable range of the deviation is appropriately determined depending on the use of the optical member. Usually, the deviation of the angle between the main axis direction of the BaLiF 3 single crystal and the <100> direction is within 10 °, preferably within 5 °, more preferably within 3 °, and particularly preferably within 1 °.

本発明の対象物である光学部材は、BaLiF単結晶体からなり、光を透過させる方向が当該単結晶体における<100>方向であれば特に限定されない。屈折率均質性の高い光学部材に対する要求が高い点で、露光装置用レンズ、特に液浸式露光装置用のレンズあるいはレンズブランクであることが好ましい。通常、このようなレンズは、まずチョクラルスキー法にて製造されたインゴットを切断加工して得られるディスク(円板)状のレンズブランクを製造し、ついでこれをレンズ加工して製造される。 The optical member which is the object of the present invention is not particularly limited as long as it is made of a BaLiF 3 single crystal and the direction of transmitting light is the <100> direction in the single crystal. A lens for an exposure apparatus, particularly a lens for an immersion type exposure apparatus or a lens blank is preferable because of high demand for an optical member having high refractive index homogeneity. Usually, such a lens is manufactured by first manufacturing a disk (disk) -shaped lens blank obtained by cutting an ingot manufactured by the Czochralski method, and then processing the lens.

以下、本発明の光学部材の製造方法を詳しく説明する。   Hereafter, the manufacturing method of the optical member of this invention is demonstrated in detail.

まず該光学部材の製造において、チョクラルスキー法によってBaLiF単結晶体のインゴットを<111>方向に成長させる方法を、以下に具体的に述べる。 First, in the production of the optical member, a method of growing an ingot of a BaLiF 3 single crystal in the <111> direction by the Czochralski method will be specifically described below.

原料として用いるBaF及びLiFとしては可能な限り不純物の少ないものを用いることが好ましく、アルカリ土類金属以外の金属不純物濃度が10ppm以下、さらには5ppm以下、特に1ppm以下であることが望ましい。また水分や酸化物(BaO及びLi0等)も可能な限り除去された原料を用いることが好ましい。 As BaF 2 and LiF used as raw materials, those having as little impurities as possible are preferably used, and the concentration of metal impurities other than alkaline earth metals is preferably 10 ppm or less, more preferably 5 ppm or less, and particularly preferably 1 ppm or less. In addition, it is preferable to use a raw material from which moisture and oxides (BaO, Li 2 O, etc.) are removed as much as possible.

このような原料BaF及びLiFを、モル比で35:65〜48:52程度で混合、溶融した溶融液にBaLiF単結晶体からなる種結晶を接触、徐々に引き上げて単結晶体を得る。特許文献1、2等に記載されているように、融液成長法では、LiFが過剰な原料を用いない限り、光学材料として使用可能な大きさを有するBaLiF単結晶体を、再現性を特って得ることは事実上できない。 Such raw materials BaF 2 and LiF are mixed at a molar ratio of about 35:65 to 48:52, and a seed crystal made of BaLiF 3 single crystal is brought into contact with the molten liquid and gradually pulled to obtain a single crystal. . As described in Patent Documents 1 and 2, etc., in the melt growth method, unless a LiF-excess raw material is used, a BaLiF 3 single crystal having a size that can be used as an optical material is reproducible. It is virtually impossible to get specially.

引き上げに際しては、上記モル比で混合した原料BaF及びLiFを高密度黒鉛焼結体などのカーボン製坩堝、白金坩堝等に充填し、チョクラルスキー炉(CZ炉)内で溶融温度以上に昇温する。ここで、坩堝として特開2006−199577などに記載された二重坩堝を用いると、メルトを溶融させた際に、ゴミがメルト表面に浮いた場合に容易にゴミを除くことができ、更に結晶育成中のメルト対流を安定化させて、結晶中に泡などの混入を防ぐことができるため好ましい。 When pulling up, the raw material BaF 2 and LiF mixed in the above molar ratio are filled in a carbon crucible such as a high-density graphite sintered body, a platinum crucible, etc., and the temperature is raised to the melting temperature or higher in a Czochralski furnace (CZ furnace). Warm up. Here, when a double crucible described in JP-A-2006-199577 is used as the crucible, the dust can be easily removed when the melt floats on the melt surface when the melt is melted. It is preferable because melt convection during growth can be stabilized and mixing of bubbles and the like can be prevented in the crystal.

原料の溶融温度は図3に示されるようにBaFとLiFのモル比により異なる。坩堝に充填する原料としては、各々粉末状態のものを用いても、あるいは予め所定比で混合し、さらに加熱して焼結体や溶融固化体とした原料を用いても良い。CZ炉内での溶融に先立ち、600〜650℃程度までは炉内を真空排気(好ましくは10−5〜10−2Pa程度)することも、吸着水分等の揮発性不純物を除去できる点で好ましい。さらには真空排気後、又は真空排気せずにHF、CF等のフッ素系ガスを導入し、その雰囲気下で加熱することも、水分や酸化物を効率的に除去できる点で好ましい。 The melting temperature of the raw material varies depending on the molar ratio of BaF 2 and LiF as shown in FIG. As raw materials to be filled in the crucible, those in powder form may be used, or raw materials mixed in advance at a predetermined ratio and further heated to form a sintered body or a melt-solidified body may be used. Prior to melting in the CZ furnace, evacuation of the furnace to about 600 to 650 ° C. (preferably about 10 −5 to 10 −2 Pa) can also remove volatile impurities such as adsorbed moisture. preferable. Further, it is also preferable to introduce a fluorine-based gas such as HF or CF 4 after evacuation or without evacuation, and to heat in the atmosphere from the viewpoint that moisture and oxide can be efficiently removed.

十分に溶融した原料溶融液にBaLiF単結晶からなる種単結晶体を接触させて徐々に引上げる。結晶成長方向を<111>にするために、種単結晶体としては、引上げる軸方向が<111>方向と一致したものが用いられる。また該軸に垂直に切断した場合の切断面は{111}面となる。なお種結晶の該軸方向からのずれは10°以内であればよく、好ましくは5°以内、より好ましくは3°以内、特に好ましくは1°以内である。通常、このような結晶方向を有する円柱あるいは角柱状の種結晶が使用される。種結晶の先端、即ち原料溶融液と接触する部分の形状は特に限定されず、平面状でも錐状でも如何なる形状でもよい。なお引上げは、常圧、減圧又は加圧下で行うことができる。負結晶などの結晶欠陥の少ないBaLiF単結晶体が得られやすい点で、減圧下で行うことが好ましい。また雰囲気としてはHF、CF等のフッ素系ガスや、Ar、He、Ne、N2などの不活性ガス、あるいは該不活性ガスで希釈したフッ素系ガス等の雰囲気下で行うことができる。酸素の影響を排除しやすい点で、フッ素系ガス又は不活性ガスで希釈したフッ素系ガスの雰囲気下で行うことが好ましい。引上げ速度は通常、0.1〜20mm/hである。 A seed single crystal composed of a BaLiF 3 single crystal is brought into contact with a sufficiently melted raw material melt and gradually pulled up. In order to set the crystal growth direction to <111>, as the seed single crystal, a crystal whose pulled-up axial direction coincides with the <111> direction is used. Further, the cut surface when cut perpendicular to the axis is the {111} plane. The deviation of the seed crystal from the axial direction may be within 10 °, preferably within 5 °, more preferably within 3 °, and particularly preferably within 1 °. Usually, a cylindrical or prismatic seed crystal having such a crystal direction is used. The shape of the tip of the seed crystal, that is, the portion in contact with the raw material melt is not particularly limited, and may be any shape such as a flat shape, a cone shape, or the like. The pulling can be performed under normal pressure, reduced pressure or increased pressure. It is preferable to carry out under reduced pressure because a BaLiF 3 single crystal with few crystal defects such as a negative crystal can be easily obtained. The atmosphere may be a fluorine-based gas such as HF or CF 4 , an inert gas such as Ar, He, Ne, or N 2 , or a fluorine-based gas diluted with the inert gas. From the viewpoint of easily eliminating the influence of oxygen, it is preferable to carry out in an atmosphere of a fluorine gas diluted with a fluorine gas or an inert gas. The pulling speed is usually 0.1 to 20 mm / h.

所望の長さのBaLiF単結晶体を引上げた後、室温程度まで冷却し、CZ炉内から取り出す。冷却に際しては、冷却速度が速いほど分相を起こしにくいが、一方で極端に速いと熱衝撃により、製造した(引上げた)単結晶体にひびが入るなどの問題が生じる場合がある。従って、冷却速度は1〜500℃/hrとすることが好ましく、3〜50℃/hrとすることがより好ましい。 A BaLiF 3 single crystal having a desired length is pulled up, cooled to about room temperature, and taken out from the CZ furnace. During cooling, the higher the cooling rate, the less likely to cause phase separation. On the other hand, when the cooling rate is extremely high, problems such as cracks may occur in the manufactured (pulled up) single crystal due to thermal shock. Therefore, the cooling rate is preferably 1 to 500 ° C./hr, more preferably 3 to 50 ° C./hr.

このようにしてチョクラルスキー法によりBaLiF単結晶体のインゴットが得られる。通常、インゴットは単結晶体として得られるが、育成中の変動などの影響により多結晶化した部分がある場合でも、インゴットから単結晶の部分を切り出すことにより単結晶体を得ることができる。 In this way, an ingot of BaLiF 3 single crystal is obtained by the Czochralski method. Usually, an ingot is obtained as a single crystal, but even when there is a portion that has been polycrystallized due to fluctuations during growth, a single crystal can be obtained by cutting out the portion of the single crystal from the ingot.

本発明の製造方法では、続いて上記方法で<111>方向に成長させたBaLiF単結晶体のインゴットから、{100}面からなる平行2面を有する板状体(ディスク)の切断、研削等の加工を行って得る。通常は、概ね{100}面からなる2面を有するディスクを切り出し、次いで研削・研磨等により{100}面からなる平行2面を有するように加工する(図4参照)。また製造された単結晶体を成長方向に対して水平方向に厚めに切断し(概ね{111}面を有するディスクとなる)、ついで{100}面が出るように斜めに研削加工等して製造してもよい。 In the production method of the present invention, cutting and grinding of a plate-like body (disk) having two parallel planes of {100} planes from an ingot of a BaLiF 3 single crystal grown in the <111> direction by the above-described method. It is obtained by processing such as. Usually, a disc having two faces consisting of {100} faces is cut out and then processed to have two parallel faces consisting of {100} faces by grinding and polishing (see FIG. 4). In addition, the manufactured single crystal body is cut thickly in the horizontal direction with respect to the growth direction (substantially becomes a disk having a {111} plane), and then is obliquely ground to produce the {100} plane. May be.

このように{100}面と平行な面の板状体に加工することにより、最終的に製造する光学部材の光を透過させる主軸方向を、容易に<100>に揃えることが可能になる。{100}面と平行な面で切出す工程は、最終的な光学部材の結晶方向を合せる操作を実施できるようにする工程であるため、切出す面は実質的に{100}面と平行であればよく、切り出した面の垂線とBaLiF単結晶体の<100>方向ベクトルとのなす角度が10°以内、好ましくは5°以内、より好ましくは3°以内、特に好ましくは1°以内である。 By processing into a plate-like body having a plane parallel to the {100} plane in this way, it is possible to easily align the main axis direction through which light of the optical member to be finally manufactured to <100>. Since the step of cutting out in a plane parallel to the {100} plane is a step that enables the operation of aligning the crystal direction of the final optical member, the cut out plane is substantially parallel to the {100} plane. The angle between the perpendicular of the cut surface and the <100> direction vector of the BaLiF 3 single crystal is within 10 °, preferably within 5 °, more preferably within 3 °, and particularly preferably within 1 °. is there.

切出した面の垂線とBaLiF単結晶体の<100>方向ベクトルとのなす角度は、X線を用いた結晶方位測定などの公知の評価方法を用いて特定することができる。更に、最終的な光学部材の形状に加工する段階において、十分な光学的な性能を達成するために、光の透過する主軸方向を更に精密に調整してもよい。 The angle formed between the perpendicular of the cut surface and the <100> direction vector of the BaLiF 3 single crystal can be specified using a known evaluation method such as crystal orientation measurement using X-rays. Further, in order to achieve sufficient optical performance in the stage of processing into the final optical member shape, the direction of the principal axis through which light is transmitted may be adjusted more precisely.

インゴットを切出す際の加工方法は、公知の何れの方法を用いてもよく、外周刃や、無端状のいわゆるバンドソー、ワイヤソー等の切断刃を備えた切断装置を用いて切出すことが一般的であり、特に、切断時の被加工物のロスを考慮するとバンドソー、ワイヤソー等の無端状の切断刃を使用することが好ましい。   Any known method may be used as a processing method when cutting an ingot, and cutting is generally performed using a cutting device equipped with a peripheral blade or a cutting blade such as an endless so-called band saw or wire saw. In particular, it is preferable to use an endless cutting blade such as a band saw or a wire saw in consideration of the loss of the workpiece during cutting.

インゴットが切断加工中に割れやすい場合には、円筒研削機を用いてインゴットの端部から徐々に削り込むことによっても割れの発生を防いで所望の形状に切出すこともできる。   In the case where the ingot is easily broken during the cutting process, it is also possible to prevent the occurrence of cracking by cutting gradually from the end of the ingot using a cylindrical grinder, and to cut out the desired shape.

このようにして得られた板状体(ディスク)はそのままレンズブランクとできるし、必要に応じて外周部を加工して円板状としレンズブランクとしてもよい。さらに当該レンズブランクを公知の方法に従ってレンズ形状に加工すれば、レンズを得ることができる。   The plate-like body (disk) thus obtained can be used as a lens blank as it is, or the outer peripheral portion can be processed into a disk shape as necessary to form a lens blank. Furthermore, if the lens blank is processed into a lens shape according to a known method, a lens can be obtained.

当該レンズを露光装置用のレンズとする場合には、十分な解像度が得られるように、上記レンズ加工の前にアニール処理を行って歪除去を行うことが好ましい。   When the lens is used for an exposure apparatus, it is preferable to remove the distortion by performing an annealing process before the lens processing so that a sufficient resolution can be obtained.

当該アニール処理は、フッ化物単結晶のアニール処理の方法として知られる公知の方法を適用すればよい。具体的には、BaLiFの融点(857℃)よりも5〜50℃程度低い温度まで加熱し、その後、徐々に降温すればよい。降温速度は0.1〜5℃/hr程度、特に0.1〜2℃/hr程度である。またより高い温度領域ではゆっくりと降温し、温度が低下するにつれて徐々に降温速度をはやくしていくことも効果的である。 For the annealing treatment, a known method known as a method for annealing a fluoride single crystal may be applied. Specifically, it may be heated to a temperature lower by about 5 to 50 ° C. than the melting point of BaLiF 3 (857 ° C.), and then gradually lowered. The temperature lowering rate is about 0.1 to 5 ° C./hr, particularly about 0.1 to 2 ° C./hr. It is also effective to slowly lower the temperature in a higher temperature range and gradually increase the temperature lowering rate as the temperature decreases.

アニール処理は、インゴット状態で行っても良いが、最終部品形状に近い大きさまで加工した後に行うことがより効果的である。例えば、外周部等を加工して円板状とする前に行ってもよいし、外周部を加工して円板状とした後にアニール処理を行い、その後さらに表面を研削・研磨してレンズブランクとすることもできる。   The annealing process may be performed in an ingot state, but it is more effective to perform the annealing process after processing to a size close to the final part shape. For example, it may be performed before the outer peripheral portion or the like is processed into a disk shape, or after the outer peripheral portion is processed into a disk shape, annealing is performed, and then the surface is further ground and polished to form a lens blank. It can also be.

またレンズ又はレンズブランク以外の光学部材としては、真空紫外光用の窓材の製造等に本発明の製造方法を適用することも好適である。   Moreover, as an optical member other than a lens or a lens blank, it is also preferable to apply the manufacturing method of the present invention to the manufacture of a window material for vacuum ultraviolet light.

以下、本発明を実施例を挙げてさらに具体的に説明するが、本発明はこれらの実施例に限定されるものではない。   EXAMPLES Hereinafter, although an Example is given and this invention is demonstrated further more concretely, this invention is not limited to these Examples.

実施例1
LiF粉末とBaF2粉末をそれぞれ溶融、固化させることにより得られた塊状のLiF原料およびBaF2原料を、LiF:BaF2が0.57:0.43のモル比であり、かつ、原料の合計量が3kgになるように混合して、特開2006−199577号公報等に開示されている内坩堝と外坩堝からなる二重構造坩堝に収容し、チョクラルスキー結晶育成炉(CZ炉)内に収容した。上記の二重坩堝を構成する外坩堝の内径は120mm、内坩堝の内径は84mmであった。次に、炉内を1×10−3Pa以下の真空度に保ち坩堝を600℃まで24時間かけて加熱昇温させ、純度99.999%のCF4ガスを炉内に導入して炉内の圧力80kPaにした。その後、坩堝を900℃まで2時間かけて加熱昇温させて、上記混合物を融解させた。
Example 1
The bulk LiF raw material and the BaF 2 raw material obtained by melting and solidifying the LiF powder and the BaF 2 powder, respectively, have a molar ratio of LiF: BaF 2 of 0.57: 0.43, and the total of the raw materials The mixture is mixed so that the amount becomes 3 kg, and accommodated in a double structure crucible composed of an inner crucible and an outer crucible disclosed in JP 2006-199577 A, etc., inside a Czochralski crystal growth furnace (CZ furnace) Housed in. The inner diameter of the outer crucible constituting the double crucible was 120 mm, and the inner diameter of the inner crucible was 84 mm. Next, the inside of the furnace was kept at a vacuum degree of 1 × 10 −3 Pa or less and the crucible was heated to 600 ° C. over 24 hours, and a CF 4 gas having a purity of 99.999% was introduced into the furnace. The pressure was 80 kPa. Thereafter, the temperature of the crucible was raised to 900 ° C. over 2 hours to melt the mixture.

次いで、坩堝内の原料融液に、BaLiF単結晶からなり鉛直方向が<111>方向である種結晶を接触させ、この種結晶を15rpmで回転させながら1.0mm/hの速度で引き上げることにより、BaLiF単結晶体からなるインゴットを成長させた。BaLiF単結晶体のインゴットを所定の大きさまで成長させた後、溶融液からインゴットを切り離した。次いで、CZ炉を36時間かけて冷却した後に、インゴットをCZ炉から取り出した。得られたインゴットは全長130mm、直胴部の長さが100mm、直胴部の直径が50mmであった。 Next, the raw material melt in the crucible is brought into contact with a seed crystal made of BaLiF 3 single crystal and the vertical direction is the <111> direction, and the seed crystal is pulled up at a speed of 1.0 mm / h while rotating at 15 rpm. Thus, an ingot made of a BaLiF 3 single crystal was grown. A BaLiF 3 single crystal ingot was grown to a predetermined size, and then the ingot was separated from the melt. Subsequently, after cooling the CZ furnace over 36 hours, the ingot was taken out from the CZ furnace. The obtained ingot had a total length of 130 mm, a length of the straight body portion of 100 mm, and a diameter of the straight body portion of 50 mm.

上記のインゴットについて、直胴部から{100}面と平行な2つの面で切断して板状の部材を得て、さらに得られた板状の部材の側面を円筒研削してディスク状にした後に、更に切断面を研磨して、直径30mm、厚み10mmのBaLiF単結晶体のディスクを得た。 About said ingot, it cut | disconnected from the straight body part by two surfaces parallel to the {100} surface, and obtained the plate-shaped member, and also the side surface of the obtained plate-shaped member was cylindrical-grinded into the disk shape Later, the cut surface was further polished to obtain a disk of BaLiF 3 single crystal having a diameter of 30 mm and a thickness of 10 mm.

得られたBaLiF単結晶体のディスクについて、クロスニコルで歪の状態を観察したところ、ディスク全体に渡って歪の分布が小さく、歪の分布状態が激しく変化するような線状の跡は殆ど確認されなかった(図5)。更に、Zygo MarkIII GPI(6インチ干渉計)にて633nmの波長の光源を用いて屈折率均質性を評価した。ゼルニケ36項除去後の屈折率均質性は、最小自乗平均(RMS)で258ppbであった。ゼルニケ36項除去後の屈折率分布を図6に示した。 When the strain state of the obtained BaLiF 3 single crystal disk was observed with crossed Nicols, the strain distribution was small over the entire disk, and there was almost no linear trace in which the strain distribution state changed drastically. It was not confirmed (FIG. 5). Further, refractive index homogeneity was evaluated using a light source having a wavelength of 633 nm with a Zygo Mark III GPI (6-inch interferometer). The refractive index homogeneity after removing Zernike's 36 terms was 258 ppb in terms of least mean square (RMS). FIG. 6 shows the refractive index distribution after removing 36 items of Zernike.

比較例1
種結晶の鉛直方向である<100>方向であるBaLiF単結晶体を用いた以外は実施例1と同様の方法で、チョクラルスキー法によりBaLiF単結晶体のインゴットを成長させた。得られたインゴットは全長130mm、直胴部の長さが100mm、直胴部の直径が50mmであった。上記のインゴットの直胴部から、インゴットの成長方向に垂直な{100}面と平行な面(結晶引上げ方向に垂直な面)で切断してディスク状にした後に、側面を円筒研削して、更に切断面を研磨することで、直径45mm、厚み10mmのBaLiFのディスクを得た。更に、実施例1と同様の方法で、得られたBaLiFのディスクについて、クロスニコルで歪の状態を観察したところ、歪が不均質に分布した線状の跡が確認された(図5)。更に、実施例1と同様の方法で屈折率均質性を評価した。ゼルニケ36項除去後の屈折率均質性は、RMSで493ppbであった。ゼルニケ36項除去後の屈折率分布を図6に示した。
Comparative Example 1
A BaLiF 3 single crystal ingot was grown by the Czochralski method in the same manner as in Example 1 except that the BaLiF 3 single crystal in the <100> direction, which is the vertical direction of the seed crystal, was used. The obtained ingot had a total length of 130 mm, a length of the straight body portion of 100 mm, and a diameter of the straight body portion of 50 mm. From the straight body portion of the above ingot, cut in a plane parallel to the {100} plane perpendicular to the growth direction of the ingot (plane perpendicular to the crystal pulling direction) to form a disk, and then cylindrically grind the side surface. Further, the cut surface was polished to obtain a BaLiF 3 disk having a diameter of 45 mm and a thickness of 10 mm. Furthermore, when the strain state of the obtained BaLiF 3 disk was observed with crossed Nicols in the same manner as in Example 1, a linear trace in which the strain was unevenly distributed was confirmed (FIG. 5). . Furthermore, the refractive index homogeneity was evaluated in the same manner as in Example 1. The refractive index homogeneity after removing 36 items of Zernike was 493 ppb in RMS. FIG. 6 shows the refractive index distribution after removing 36 items of Zernike.

板状体(ディスク)を得る従来の方法を示す模式図。The schematic diagram which shows the conventional method of obtaining a plate-shaped body (disk). レンズにおける主軸(光軸)方向を示す模式図。The schematic diagram which shows the principal axis (optical axis) direction in a lens. LiFおよびBaF2の相平衡図。Phase equilibrium diagram of LiF and BaF 2. 本発明におけるインゴットの加工例を示す模式図。The schematic diagram which shows the process example of the ingot in this invention. 実施例および比較例で得られた板状体のクロスニコル像。The crossed Nicols image of the plate-shaped body obtained by the Example and the comparative example. 実施例および比較例で得られた板状体の屈折率分布図。The refractive index distribution map of the plate-shaped body obtained by the Example and the comparative example.

Claims (4)

BaLiF単結晶体からなり、光を透過させる主軸方向が該単結晶体における<100>方向である光学部材の製造方法であって、BaLiF溶融液に種結晶を接触させた後に引き上げるチョクラルスキー法によってインゴットを<111>方向に成長させて単結晶体を得、その後、該インゴットを加工して{100}面からなる平行2面を有する板状体を得る工程、を含むことを特徴とするBaLiF単結晶体からなる光学部材の製造方法。 A method for producing an optical member comprising a BaLiF 3 single crystal, wherein the principal axis direction through which light is transmitted is the <100> direction in the single crystal, and is pulled up after bringing the seed crystal into contact with the BaLiF 3 melt A step of growing an ingot in the <111> direction by a ski method to obtain a single crystal, and then processing the ingot to obtain a plate-like body having two parallel surfaces of {100} planes. A method for producing an optical member made of a BaLiF 3 single crystal. BaLiF単結晶体からなり、{100}面からなる平行2面を有する板状の光学部材の製造方法であって、BaLiF溶融液に種結晶を接触させた後に引き上げるチョクラルスキー法によってインゴットを<111>方向に成長させて単結晶体を得、その後、該インゴットを加工して{100}面からなる平行2面を有する板状体を得る工程、を含むことを特徴とする前記製造方法。 A method of manufacturing a plate-like optical member made of a BaLiF 3 single crystal and having two parallel planes of {100} planes, which is ingot by the Czochralski method of pulling up after bringing a seed crystal into contact with a BaLiF 3 melt. In the <111> direction to obtain a single crystal, and then processing the ingot to obtain a plate-like body having two parallel faces consisting of {100} faces. Method. 光学部材がレンズブランクである請求項1又は2記載の製造方法。   The manufacturing method according to claim 1, wherein the optical member is a lens blank. 請求項3記載の方法でレンズブランクを製造し、ついで該レンズブランクを加工してレンズとする、露光装置用レンズの製造方法。   A manufacturing method of a lens for an exposure apparatus, wherein a lens blank is manufactured by the method according to claim 3, and then the lens blank is processed into a lens.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009073682A (en) * 2007-09-19 2009-04-09 Tokuyama Corp MANUFACTURE PROCESS OF BaLiF3 SINGLE CRYSTAL
JP2012012244A (en) * 2010-06-30 2012-01-19 Tokuyama Corp Method for producing metal fluoride single crystal body

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Publication number Priority date Publication date Assignee Title
JP2000128696A (en) * 1998-10-16 2000-05-09 Nikon Corp Fluoride single crystal-made raw material for making optical element and production of the same raw material
JP2006199577A (en) * 2004-12-22 2006-08-03 Tokuyama Corp Pulling apparatus for manufacturing metal fluoride single crystal and method of manufacturing metal fluoride single crystal using the apparatus
JP2007005777A (en) * 2005-05-25 2007-01-11 Tokuyama Corp Last lens of immersion exposure device

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JP2000128696A (en) * 1998-10-16 2000-05-09 Nikon Corp Fluoride single crystal-made raw material for making optical element and production of the same raw material
JP2006199577A (en) * 2004-12-22 2006-08-03 Tokuyama Corp Pulling apparatus for manufacturing metal fluoride single crystal and method of manufacturing metal fluoride single crystal using the apparatus
JP2007005777A (en) * 2005-05-25 2007-01-11 Tokuyama Corp Last lens of immersion exposure device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009073682A (en) * 2007-09-19 2009-04-09 Tokuyama Corp MANUFACTURE PROCESS OF BaLiF3 SINGLE CRYSTAL
JP2012012244A (en) * 2010-06-30 2012-01-19 Tokuyama Corp Method for producing metal fluoride single crystal body

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