JP2008198897A - Washing apparatus - Google Patents

Washing apparatus Download PDF

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Publication number
JP2008198897A
JP2008198897A JP2007034433A JP2007034433A JP2008198897A JP 2008198897 A JP2008198897 A JP 2008198897A JP 2007034433 A JP2007034433 A JP 2007034433A JP 2007034433 A JP2007034433 A JP 2007034433A JP 2008198897 A JP2008198897 A JP 2008198897A
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Prior art keywords
cleaning
substrate
cleaning liquid
recovered
water
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JP2007034433A
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Japanese (ja)
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Futoshi Shimai
太 島井
Shigeru Kawada
茂 河田
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Tokyo Ohka Kogyo Co Ltd
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Tokyo Ohka Kogyo Co Ltd
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Priority to JP2007034433A priority Critical patent/JP2008198897A/en
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a cleaning apparatus capable of automatically dividing cleaning water into a less dirty cleaning liquid and a much dirty cleaning liquid and recovering respective cleaning liquids. <P>SOLUTION: The lower part of a carrier 1 on a substrate W is divided into a center recovery portion 6 and side recovery portions 7 by partition plates 5 arranged along a carrying direction. Since the much quantity of a cleaning liquid which is not involved in cleaning is directly recovered to the center recovery portion 6 and a less dirty cleaning solution can be recovered, and on the contrary, a cleaning liquid involved in cleaning is recovered in the side recover portions 7. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、ガラス基板や半導体ウェーハなどの基板の洗浄装置に関する。   The present invention relates to an apparatus for cleaning a substrate such as a glass substrate or a semiconductor wafer.

液晶表示装置に組み込まれるガラス基板にはTFTアレイなどが形成されている。このTFTアレイはガラス基板に半導体集積回路の形成プロセスと同一の方法にて形成される。そして半導体集積回路の形成プロセスにはレジスト膜の形成があり、このレジスト膜はスピンコータなどを用いてガラス基板表面にレジスト液を塗布した後にベークすることで形成される。そして、レジスト液を塗布する前にガラス基板の表面からゴミ、異物を除去しておかなければならない。   A TFT array or the like is formed on a glass substrate incorporated in the liquid crystal display device. This TFT array is formed on the glass substrate by the same method as the process for forming the semiconductor integrated circuit. A process for forming a semiconductor integrated circuit includes formation of a resist film. This resist film is formed by applying a resist solution on the surface of a glass substrate using a spin coater or the like and then baking it. And, before applying the resist solution, dust and foreign matter must be removed from the surface of the glass substrate.

洗浄装置としては、特許文献1または特許文献2に開示されるように、多数の搬送ローラにて搬送路を構成し、この搬送路の上方に洗浄水を基板表面に向けて噴出する複数のノズルを搬送方向と直交する方向に配置している。   As disclosed in Patent Document 1 or Patent Document 2, the cleaning apparatus includes a plurality of transport rollers that form a transport path, and a plurality of nozzles that eject cleaning water toward the substrate surface above the transport path. Are arranged in a direction perpendicular to the conveying direction.

そして従来にあっては効果的に洗浄を行うため、搬送路の下方に超音波発振装置を配置したり、イオン水を基板表面に向けて高圧でジェット噴射している。   Conventionally, in order to perform cleaning effectively, an ultrasonic oscillation device is disposed below the transport path, or ion water is jetted at a high pressure toward the substrate surface.

特開2005−013960号公報JP 2005-013960 A 特開平11−333387号公報JP-A-11-333387

上述した先行文献は洗浄効果の向上についての考慮はしているが、洗浄に使用した水には現像液などが混ざるため、そのまま廃棄し水のリサイクルについては考慮していない。   Although the above-mentioned prior art documents consider improvement of the cleaning effect, the developer used is mixed with the water used for cleaning, and therefore, it is discarded as it is and does not consider recycling of water.

しかしながら、水は極めて貴重な資源であり、特に水資源の乏しい地域や国において液晶表示装置を製造する工場を建設する場合には、解決しなければならない根本的な課題となる。   However, water is an extremely valuable resource, and is a fundamental problem that must be solved when a factory for manufacturing a liquid crystal display device is constructed, particularly in regions and countries where water resources are scarce.

上記の課題を解決するため本発明は、基板を搬送しつつ基板表面に洗浄水を供給する洗浄装置において、前記基板の搬送路の下方は搬送方向に沿った仕切り板で中央回収部と側方回収部とに分離された構成とした。   In order to solve the above problems, the present invention provides a cleaning apparatus for supplying cleaning water to a substrate surface while transporting a substrate, wherein a lower part of the transport path of the substrate is a partition plate along the transport direction, and a central recovery portion and a side. It was set as the structure isolate | separated into the collection | recovery part.

前記中央回収部で回収される洗浄水は側方回収部で回収される洗浄水よりも汚れが少なく、リサイクルすることが可能である。中央回収部で回収される洗浄水の汚れが少ないのは、連続して搬送される基板と基板の間では、洗浄水が洗浄に関与せずにそのまま落下すること、更に基板の表面に供給された洗浄水の一部は基板の前端及び後端から落下するが、多くは基板の側端から落下するからと考えられる。   The washing water collected by the central collection unit is less contaminated than the washing water collected by the side collection unit and can be recycled. The reason why the cleaning water collected by the central recovery unit is less contaminated is that the cleaning water falls without being involved in cleaning between the substrates that are transported continuously, and is supplied to the surface of the substrate. A part of the washed water falls from the front end and the rear end of the substrate.

また、次の槽に移る手前のノズルの軸線を基板の進行方向とは逆に傾斜せしめ、基板上に供給された洗浄液が基板の進行方向前方に落ちるのを防止するようにしてもよい。このようにすることで、次の槽に汚れた洗浄液が持ち込まれることがなくなる。また中央回収部で回収される洗浄液の汚れが少なくなる。   Further, the axis of the nozzle before moving to the next tank may be inclined in the direction opposite to the traveling direction of the substrate to prevent the cleaning liquid supplied on the substrate from falling forward in the traveling direction of the substrate. By doing so, the dirty cleaning liquid is not brought into the next tank. In addition, the contamination of the cleaning liquid collected by the central collection unit is reduced.

本発明に係る洗浄装置によれば、ガラス基板などの被洗浄物に供給された洗浄水を自動的に汚れた部分と殆んど汚れていない部分に分けることができ、その結果汚れていない洗浄水を再度洗浄水として利用するなどリサイクルが可能になり、省資源に有効である。   According to the cleaning apparatus of the present invention, the cleaning water supplied to an object to be cleaned such as a glass substrate can be automatically divided into a dirty part and a part that is hardly dirty, and as a result, cleaning that is not dirty. Recycling is possible, such as using water as cleaning water again, which is effective in saving resources.

以下に本発明の最適な実施例を添付図面に基づいて説明する。図1は本発明に係る洗浄装置の平面図、図2は図1のA−A方向から見た断面図、図3は図1のB−B方向から見た断面図である。   DESCRIPTION OF EXEMPLARY EMBODIMENTS Hereinafter, preferred embodiments of the invention will be described with reference to the accompanying drawings. 1 is a plan view of a cleaning apparatus according to the present invention, FIG. 2 is a cross-sectional view seen from the direction AA in FIG. 1, and FIG. 3 is a cross-sectional view seen from the direction BB in FIG.

洗浄装置はトンネル状をなす搬送路1を備えている。この搬送路1はモータによって駆動される複数の搬送ローラ2…から構成され、搬送ローラ2…上を複数のガラス基板Wが一定の間隔で搬送されつつ、搬送路に沿って設けた第1洗浄エリアR1及び第2洗浄エリアR2で順に洗浄される。   The cleaning device includes a transport path 1 having a tunnel shape. The transport path 1 is composed of a plurality of transport rollers 2 driven by a motor, and a first cleaning provided along the transport path while transporting a plurality of glass substrates W at regular intervals on the transport rollers 2. Cleaning is performed in order in the area R1 and the second cleaning area R2.

第1洗浄エリアR1では後述するように第2洗浄エリアR2で回収した汚れの少ない洗浄液を用いて洗浄し、第2洗浄エリアR2では新液を用いて洗浄する。   As will be described later, the first cleaning area R1 is cleaned using a cleaning liquid with less dirt collected in the second cleaning area R2, and the second cleaning area R2 is cleaned using a new liquid.

各洗浄エリアR1、R2の上方には洗浄装置3が配置されている。洗浄装置3は搬送方向と直交する方向に複数の洗浄液噴出ノズル4…を配置している。また、搬送路1の下方は各洗浄エリアR1、R2毎に搬送方向に沿った仕切り板5,5で中央回収部6と側方回収部7,7とに分離されている。   A cleaning device 3 is disposed above each cleaning area R1, R2. The cleaning device 3 has a plurality of cleaning liquid jet nozzles 4 arranged in a direction orthogonal to the transport direction. Further, the lower part of the conveyance path 1 is separated into a central collection unit 6 and side collection units 7 and 7 by partition plates 5 and 5 along the conveyance direction for each cleaning area R1 and R2.

尚、中央回収部6及び側方回収部7の底面は傾斜面とされ、最も低くなった箇所に回収穴6a,7aが形成されている。前記中央回収部6では洗浄に関与しなかった洗浄液がそのまま回収される量が多いため、汚れの少ない洗浄液が回収され、逆に側方回収部7では洗浄に関与して汚れた洗浄液が回収される。   The bottom surfaces of the central recovery unit 6 and the side recovery unit 7 are inclined surfaces, and recovery holes 6a and 7a are formed at the lowest point. Since the central recovery unit 6 collects a large amount of cleaning liquid that is not involved in cleaning, the cleaning liquid with less dirt is recovered. Conversely, the side recovery unit 7 recovers the dirty cleaning liquid related to cleaning. The

そして、本実施例にあっては、第2洗浄エリアR2の中央回収部6で回収した洗浄液を配管8を介して第1洗浄エリアR1のノズル4に供給するようにしている。   In this embodiment, the cleaning liquid recovered by the central recovery unit 6 in the second cleaning area R2 is supplied to the nozzle 4 in the first cleaning area R1 via the pipe 8.

即ち、図においてガラス基板Wは右から左に向かって搬送される。ガラス基板Wは先ず第1洗浄エリアR1において洗浄される。このときの洗浄液は前記したように若干汚れた第2洗浄エリアR2の中央回収部6で回収した洗浄液を用いる。そして、ある程度洗浄されたガラス基板Wは第2洗浄エリアR2に搬送され、ここで新液を使って洗浄される。   That is, in the drawing, the glass substrate W is transported from the right to the left. The glass substrate W is first cleaned in the first cleaning area R1. As the cleaning liquid at this time, the cleaning liquid recovered by the central recovery unit 6 of the second cleaning area R2 slightly dirty as described above is used. Then, the glass substrate W that has been cleaned to some extent is transported to the second cleaning area R2, where it is cleaned using a new solution.

実施例では第1洗浄エリアR1においても仕切り板5によって中央回収部6と側方回収部7に分けており、中央回収部6で回収した洗浄液を更に上流側の洗浄で使用してもよい。また、第1洗浄エリアR1及び第2洗浄エリアR2のいずれにおいても側方回収部7で回収した洗浄液は汚れているので廃棄する。尚、洗浄槽が多数ある場合には、側方回収部7で回収した洗浄液は更に汚れが少なくなっていくので、最初の洗浄液がある程度汚れていてもよい槽の洗浄には使用可能である。   In the embodiment, the first recovery area R1 is also divided into the central recovery unit 6 and the side recovery unit 7 by the partition plate 5, and the cleaning liquid recovered by the central recovery unit 6 may be used for further upstream cleaning. Further, in both the first cleaning area R1 and the second cleaning area R2, the cleaning liquid recovered by the side recovery unit 7 is dirty and discarded. If there are a large number of cleaning tanks, the cleaning liquid recovered by the side recovery unit 7 is further less contaminated, and therefore can be used for cleaning a tank where the initial cleaning liquid may be dirty to some extent.

図4は別実施例を示す図2と同様の図であり、この実施例にあっては洗浄装置3を構成する複数の洗浄液噴出ノズル4…のうち、次の槽に移る手前のノズル4aの軸線を基板の進行方向とは逆に傾斜せしめ、基板上に供給された洗浄液が基板の進行方向前方に落ちるのを防止するようにしてもよい。
このようにすることで、更に次の槽に汚れた洗浄液が混入することを防ぐことができる。
FIG. 4 is a view similar to FIG. 2 showing another embodiment. In this embodiment, of the plurality of cleaning liquid ejection nozzles 4 constituting the cleaning apparatus 3, the nozzle 4a before moving to the next tank is shown. The axis may be inclined in the direction opposite to the traveling direction of the substrate to prevent the cleaning liquid supplied on the substrate from falling forward in the traveling direction of the substrate.
By doing in this way, it can prevent that the dirty washing | cleaning liquid mixes into the next tank further.

尚、実施例では第2洗浄エリアR2で回収した洗浄液を第1洗浄エリアR1で再利用する態様を示したが、これに限定されるものではなく、洗浄エリアは1つとし、中央回収部で回収した比較的汚れの少ない洗浄水を別の箇所で使用するようにしてもよい。   In the embodiment, the cleaning liquid recovered in the second cleaning area R2 is reused in the first cleaning area R1. However, the present invention is not limited to this, and there is one cleaning area. The recovered cleaning water with relatively little dirt may be used at another location.

本発明に係る洗浄装置の平面図Plan view of a cleaning apparatus according to the present invention 図1のA−A方向から見た断面図Sectional view seen from the AA direction in FIG. 図1のB−B方向から見た断面図Sectional view seen from the BB direction in FIG. 別実施例を示す図2と同様の図Figure similar to FIG. 2 showing another embodiment

符号の説明Explanation of symbols

1…搬送路、2…搬送ローラ、3…洗浄装置、4,4a…洗浄液噴出ノズル、5…仕切り板、6…中央回収部、7…側方回収部、8…配管、R1…第1洗浄エリア、R2…第2洗浄エリア、W…ガラス基板。   DESCRIPTION OF SYMBOLS 1 ... Conveyance path, 2 ... Conveyance roller, 3 ... Cleaning apparatus, 4 and 4a ... Cleaning liquid jet nozzle, 5 ... Partition plate, 6 ... Central collection part, 7 ... Side collection part, 8 ... Piping, R1 ... 1st washing | cleaning Area, R2 ... second cleaning area, W ... glass substrate.

Claims (2)

基板を搬送しつつ基板表面に洗浄水を供給する洗浄装置において、前記基板の搬送路の下方は搬送方向に沿った仕切り板で中央回収部と側方回収部とに分離されていることを特徴とする洗浄装置。 In the cleaning apparatus for supplying cleaning water to the substrate surface while transporting the substrate, the lower part of the transport path of the substrate is separated into a central recovery part and a side recovery part by a partition plate along the transport direction. A cleaning device. 請求項1に記載の洗浄装置において、前記洗浄水の供給は基板の搬送方向に沿って複数のノズルが配置され、このうち次の槽に移る手前のノズルの軸線を基板の進行方向とは逆に傾斜せしめ、基板上に供給された洗浄液が基板の進行方向前方に落ちるのを防止することを特徴とする洗浄装置。





2. The cleaning apparatus according to claim 1, wherein a plurality of nozzles are arranged along the substrate transport direction for supplying the cleaning water, and the axis of the nozzle before moving to the next tank is opposite to the substrate traveling direction. The cleaning apparatus is characterized in that the cleaning liquid supplied on the substrate is prevented from falling forward in the direction of travel of the substrate.





JP2007034433A 2007-02-15 2007-02-15 Washing apparatus Pending JP2008198897A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110120502A1 (en) * 2009-11-24 2011-05-26 Applied Materials, Inc. Substrate Washing Apparatus and Methods of Use
JP2013115420A (en) * 2011-11-29 2013-06-10 Samsung Electro-Mechanics Co Ltd Substrate processing apparatus
KR20150137219A (en) * 2014-05-28 2015-12-09 세메스 주식회사 Apparatus and method for processing substrate
CN108526097A (en) * 2018-04-28 2018-09-14 武汉华星光电技术有限公司 Substrate cleaning apparatus

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110120502A1 (en) * 2009-11-24 2011-05-26 Applied Materials, Inc. Substrate Washing Apparatus and Methods of Use
JP2013115420A (en) * 2011-11-29 2013-06-10 Samsung Electro-Mechanics Co Ltd Substrate processing apparatus
KR20150137219A (en) * 2014-05-28 2015-12-09 세메스 주식회사 Apparatus and method for processing substrate
KR102250366B1 (en) * 2014-05-28 2021-05-12 세메스 주식회사 Apparatus and method for processing substrate
CN108526097A (en) * 2018-04-28 2018-09-14 武汉华星光电技术有限公司 Substrate cleaning apparatus

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