JP2008193566A - Inspection device for image pickup device and inspection method for image pickup device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an inspection device for an image pickup device easily inspecting a quality of the tip of each leg part of a shield case provided in an image pickup device. <P>SOLUTION: The inspection device for an image pickup device inspects an image pickup device that is provided with an image pickup lens, a package sensor, which includes an image pickup element and in which a plurality of solder balls to be soldered with a prescribed printed circuit board are arranged in a lattice shape, and a shield case formed of a metal plate so as to cover the package sensor. The inspection device is provided with an inspection jig having a smooth placing face, onto which the image pickup device is placed in contact with the solder balls, at least, an inspection camera for imaging each leg part that is provided under the shield case and used for solder-bonding with the printed circuit board, and a display device that displays each leg part imaged by the inspection camera and in which two parallel discrimination lines for discriminating whether or not each leg part is within a prescribed range are prepared. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to an imaging apparatus inspection apparatus and an imaging apparatus inspection method for inspecting an imaging apparatus in which a BGA type package sensor including an imaging element is covered with a shield case.

  In recent years, as the demand for downsizing, weight reduction, high functionality, and high speed of mobile terminals such as mobile phones and PDAs (Personal Digital Assistants) has increased, the same demands have been placed on imaging devices mounted on these mobile terminals. Has been made.

  In these imaging apparatuses, imaging elements such as a CCD (Charge Coupled Device) type image sensor and a CMOS (Complementary Metal-Oxide Semiconductor) type image sensor are used.

  However, in order to make the image sensor more compact and highly integrated, a high-density mounting technique is required, and the conventional QFP (Quad Flat Pack Package) is limited to increase the number of pins due to the line arrangement. At the same time, the area occupied by the substrate several times to several tens of times the internal chip area is required, which makes it difficult to cope with it.

  In view of this, use of a BGA (Ball Grid Array) type package sensor including an image pickup device is under study. The BGA type package sensor is an IC package in which solder balls are arranged in a grid, and can be formed smaller than a conventional QFP.

  In addition, several patent document gazettes are disclosed regarding BGA.

  For example, a BGA type semiconductor package in which solder balls are prevented from being crushed is disclosed (see Patent Document 1).

Further, a semiconductor device having a BGA structure and aiming to maintain high reliability is disclosed (see Patent Document 2).
Japanese Patent Laid-Open No. 11-26507 JP 2000-21903 A

  An example of an imaging apparatus using a BGA type package sensor will be described in detail with reference to FIG. FIG. 1 is a cross-sectional view of an imaging device and a printed wiring board.

  The imaging device 1 includes an imaging lens 11, a fixed aperture 12, an infrared cut filter 13, a package sensor 14, a lens barrel 15, and a shield case 16.

  The imaging lens 11, the fixed aperture 12, the infrared cut filter 13, and the package sensor 14 are fixed to the lens barrel 15 with an adhesive G.

  In addition, as the adhesive G, an ultraviolet thermosetting combined type or a heat curing type is used, and the assembled imaging device is heated in a high-temperature thermostatic bath to cure the adhesive G.

  The package sensor 14 is formed in a package containing an image pickup device (not shown). The imaging element may be a CCD (Charge Coupled Device) type image sensor or a CMOS (Complementary Metal-Oxide Semiconductor) type image sensor.

  The package sensor 14 is a BGA type, and an image sensor is mounted on the upper surface of an internal printed wiring board and connected to a conductive pattern provided on the printed wiring board by wire bonding, and solder balls 14a are formed in a grid shape on the lower surface ( The conductive pattern and the solder ball 14a are electrically connected through a through hole provided in the printed wiring board.

  Moreover, in a mobile phone equipped with such an imaging device, imaging is performed with the imaging device and communication is performed with a communication function. At this time, the electromagnetic wave generated from the image sensor should not adversely affect communication, and the electromagnetic wave emitted for communication must not adversely affect the captured image. In addition, static electricity may be generated when a person's finger comes into contact with the mobile phone. If this static electricity is transmitted to the imaging device, the imaging device may be damaged.

  Therefore, the shield case 16 formed of a metal plate is joined to the lens barrel 15 with an adhesive (not shown) to cover and integrate the package sensor 14.

  The imaging device 1 assembled in the above configuration is attached to the printed wiring board 2 in a separate process. The printed wiring board 2 is for connecting a power source and control circuit (not shown) and the image sensor in the package sensor 14, and a plurality of pre-soldered conductive patterns 2 a are arranged.

  Then, the solder balls 14a of the package sensor 14 and the conductive patterns 2a of the printed wiring board 2 are brought into contact with each other, and reflow is performed to melt the preliminary solder of the solder balls 14a and the conductive patterns 2a and solder them together.

  At the same time, the tin-plated legs 16a of the shield case 16 are soldered to the ground conductive pattern 2b of the printed wiring board 2 and grounded. The conductive pattern 2b is also pre-soldered.

  Here, as shown in the enlarged view of the solder ball in FIG. 2, the height of the solder ball 14a is not constant, but is formed at different heights, and the height is increased by the highest solder ball 14a1 and the lowest solder ball 14a2. There is a maximum difference R.

  As described above, at the same time as the solder bonding of the solder balls 14a of the package sensor 14 and the conductive pattern 2a of the printed wiring board 2, the tin-plated legs 16a of the shield case 16 are electrically conductive for grounding the printed wiring board 2. The pattern 2b is also soldered.

  Before heating at the time of soldering, the highest solder ball 14a1 and the solder ball having a height close thereto abut against the conductive pattern 2a, but the lowest solder ball 14a2 and the solder ball having a height close thereto are conductive. It does not contact the sex pattern 2a. However, when the pre-solder of each solder ball 14a and conductive pattern 2a is melted by reflow, even the lowest solder ball 14a2 comes into contact with the conductive pattern 2a, and all the solder balls 14a are soldered to the conductive pattern 2a. Join.

  On the other hand, when soldering the leg portion 16a of the shield case 16, only the preliminary solder of the conductive pattern 2b is melted, and the leg portion 16a formed of a metal plate is not melted.

  For this reason, if the tip of the leg portion 16a is close to the printed wiring board 2, the tip of the leg portion 16a hits the conductive pattern 2b when the solder ball 14a is melted, and hinders solder joining of the solder ball 14a. . On the other hand, if the tip of the leg portion 16a is separated from the printed wiring board 2, the leg portion 16a is not reliably soldered to the conductive pattern 2b.

  Therefore, it is necessary to set the tip position of the leg portion 16a to a predetermined dimension L with respect to the solder ball 14a.

  However, as described above, the height of the solder ball 14 a varies, and the package sensor 14, the lens barrel 15, and the shield case 16 have dimensional variations due to processing. Further, the shield case 16 covers the lens barrel 15. Sometimes a certain amount of float occurs.

  Therefore, it is necessary to inspect whether or not the tip position of the leg portion 16a of the shield case 16 is within a predetermined allowable range before the imaging apparatus 1 is sent to the process of soldering the printed wiring board 2 which is a separate process. There is. Further, since the tolerance of the height of the solder balls 14a and the allowable amount of the tip positions of the leg portions 16a of the shield case 16 are very small in units of 10 μm, it is difficult to visually inspect them.

  The present invention has been made in view of such problems, and proposes an imaging apparatus inspection apparatus and an imaging apparatus inspection method capable of easily inspecting the quality of the tip position of a leg portion of a shield case provided in the imaging apparatus. The purpose is to do.

The object is achieved by the invention described below.
1. An imaging lens;
A package sensor including a plurality of solder balls arranged in a lattice shape to enclose an image sensor and solder to a predetermined printed wiring board;
A shield case formed of a metal plate and covering the package sensor;
In an imaging apparatus inspection apparatus for inspecting an imaging apparatus comprising:
An inspection jig having a smooth placement surface for placing the imaging device in contact with the solder ball;
At least an inspection camera that images a leg for soldering to the printed wiring board provided in the shield case;
A display device that displays the leg imaged by the inspection camera and that is provided with two parallel determination lines in advance for determining whether the leg is within a predetermined range;
An inspection apparatus for an imaging apparatus, comprising:
2. 1. A reflection mirror that is inclined at an angle of approximately 45 degrees with respect to the mounting surface and reflects the leg, and the leg reflected by the reflection mirror is imaged by the inspection camera. The inspection apparatus for an imaging device described.
3. The inspection apparatus for an imaging apparatus according to 1 or 2, wherein the leg portion is disposed on both a predetermined side surface of the shield case and a side surface facing the predetermined side surface.
4). 4. The imaging apparatus inspection apparatus according to 3, wherein a plurality of the leg portions are arranged on both side surfaces of the shield case.
5. 5. The inspection apparatus for an image pickup apparatus according to 3 or 4, further comprising two inspection cameras for imaging the leg portions provided on both side surfaces of the shield case.
6). The imaging apparatus inspection apparatus according to any one of claims 3 to 5, further comprising two reflecting mirrors that respectively reflect the leg portions provided on both side surfaces of the shield case.
7). The inspection apparatus for an imaging device according to any one of 1 to 6, wherein a reference line indicating the placement surface is provided in advance on the display device.
8). An imaging lens;
A package sensor that includes an image pickup element and includes a plurality of solder balls arranged in a grid pattern for soldering to a predetermined printed wiring board;
A shield case formed of a metal plate and covering the package sensor;
In an inspection method for an imaging apparatus comprising:
Placing the imaging device by bringing the solder balls into contact with a smooth placement surface provided on an inspection jig;
Imaging at least a leg portion for soldering with the printed wiring board provided in the shield case with an inspection camera;
Displaying two parallel determination lines provided in advance for determining whether or not the leg is within a predetermined range and the leg imaged by the inspection camera on a display device;
An inspection method for an imaging apparatus, comprising:

  According to the inspection apparatus for an image pickup apparatus and the inspection method for the image pickup apparatus of the present invention, it is possible to easily check the quality of the tip position of the leg portion for solder bonding to the printed wiring board in the shield case.

  An imaging apparatus inspection apparatus and an imaging apparatus inspection method for inspecting the tip position of a leg portion of a shield case provided in the imaging apparatus will be described in detail with reference to the drawings.

  First, an example of an inspection apparatus for an imaging apparatus will be described with reference to FIGS. FIG. 3 is a perspective view of the inspection apparatus for an imaging apparatus, and FIG. 4 is an enlarged view of the display apparatus.

  In FIG. 3, reference numeral 1 denotes an image pickup apparatus configured as shown in FIGS. 1 and 2, 31 denotes an inspection jig for mounting the image pickup apparatus 1, and 32 denotes an inspection camera for imaging the leg portion 16 a of the shield case 16.

  The imaging device inspection apparatus includes an inspection jig 31, an inspection camera 32, and a display device 33 described later.

  The inspection jig 31 has a mounting surface 31a that is formed on a smooth surface and on which the imaging device 1 is mounted. The image pickup apparatus 1 is placed with the mounting surface 31 a contacting the solder balls 14 a of the package sensor 14 in the image pickup apparatus 1. As shown in FIG. 2, since the height of the solder ball 14a varies, the top three solder balls 14a from the highest solder ball 14a1 come into contact with the mounting surface 31a and other solder balls 14a often floats from the mounting surface 31a. In this state, the leg portion 16a of the shield case 16 is located outside the end portion 31b of the placement surface 31a and is not in contact with the placement surface 31a.

  In the imaging apparatus 1, two leg portions 16a are provided on a predetermined side surface, and two leg portions 16a are also provided on a side surface facing the predetermined side surface.

  The number of legs of the leg portion 16a is an example, and the number of legs may be any number.

  In the imaging apparatus 1, the leg portions 16 a are provided on the two opposing side surfaces of the shield case 16, so that two inspection cameras 32 for imaging the leg portions 16 a are provided on both sides of the inspection jig 31. It is arranged.

  A display device 33 for displaying an image captured by the inspection camera 32 is shown in FIG.

  On the display screen of the display device 33, the placement surface 31a of the inspection jig 31 and the leg portion 16a of the shield case 16 are enlarged and displayed.

  A reference line 33a indicating the placement surface 31a is provided on the display screen in advance, and the position of the inspection camera 32 or the inspection jig 31 is set so that the placement surface 31a imaged before the inspection matches the reference line 33a. Adjust the posture.

  The display screen is provided in advance with two determination lines 33b and 33c for determining whether or not the tip of the leg portion 16a is within a predetermined range in parallel with the reference line 33a. If all the leg portions 16a are located between the two discriminating lines 33b and 33c, the imaging device 1 is regarded as a good product, and at least one leg portion 16a has two discriminating lines 33b and 33c. If the image pickup apparatus 1 is located outside any of the above, the imaging apparatus 1 is regarded as a defective product.

  In this way, the inspector visually recognizes the image of the leg portion 16a enlarged on the display screen of the display device 33, and determines whether or not the image is located between the two discrimination lines 33b and 33c. Since it is only necessary to discriminate between 1 and pass, it is not necessary to take time to become proficient in inspection work, and anyone can immediately perform inspection work.

  The focus of the inspection camera 32 only needs to match the end 31b and the leg 16a of the mounting surface 31a, and does not need to match the solder ball 14a.

  In the imaging apparatus inspection apparatus shown in FIG. 3, since the inspection camera 32, the inspection jig 31, and the inspection camera 32 are arranged in the horizontal direction in this order, a large space is required in the horizontal direction. is there. However, if such a large space cannot be obtained, the configuration shown in FIG.

  In FIG. 5, 41 is an inspection jig, and the imaging apparatus 1 is mounted on a mounting surface 41a formed on a smooth surface as described above. In the inspection jig 41, two reflecting mirrors 44 are disposed at an inclination of approximately 45 degrees with respect to the mounting surface 41a, and two inspection cameras 42 are disposed above. As a result, the two inspection cameras 42 capture the images of the leg portions 16 a of the shield case 16 reflected by the respective reflecting mirrors 44 and display them on the display device 33 described above. Therefore, in this inspection apparatus for an image pickup apparatus, a space for the inspection camera 42 is required in the vertical direction, but a small space is sufficient in the horizontal direction.

  In some cases, the leg portion 16a of the shield case 16 may be provided only on one side surface. In such a case, as a matter of course, only one inspection camera 32, 42 and one reflecting mirror 44 are provided. Good.

It is sectional drawing of an imaging device, and the figure of a printed wiring board. It is an enlarged view of a solder ball. It is a perspective view of the inspection apparatus for imaging devices. It is an enlarged view of a display apparatus. It is a perspective view of the inspection apparatus for imaging devices of other forms.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Imaging device 11 Imaging lens 14 Package sensor 14a Solder ball 16 Shield case 16a Leg part 2 Printed wiring board 2a, 2b Conductive pattern 31, 41 Inspection jig 31a, 41a Mounting surface 32, 42 Inspection camera 33 Display device 33a Reference line 33b, 33c Discrimination line 44 Reflector

Claims (8)

An imaging lens;
A package sensor including a plurality of solder balls arranged in a lattice shape to enclose an image sensor and solder to a predetermined printed wiring board;
A shield case formed of a metal plate and covering the package sensor;
In an imaging apparatus inspection apparatus for inspecting an imaging apparatus comprising:
An inspection jig having a smooth placement surface for placing the imaging device in contact with the solder ball;
At least an inspection camera that images a leg for soldering to the printed wiring board provided in the shield case;
A display device that displays the leg imaged by the inspection camera and that is provided with two parallel determination lines in advance for determining whether the leg is within a predetermined range;
An inspection apparatus for an imaging apparatus, comprising: A reflection mirror that is inclined at an angle of approximately 45 degrees with respect to the mounting surface and reflects the leg portion, and the leg portion reflected by the reflection mirror is imaged by the inspection camera. 2. The inspection apparatus for an imaging apparatus according to 1. The imaging device inspection apparatus according to claim 1, wherein the leg portion is disposed on both a predetermined side surface of the shield case and a side surface facing the predetermined side surface. The imaging device inspection apparatus according to claim 3, wherein a plurality of the leg portions are disposed on both side surfaces of the shield case. The imaging apparatus inspection apparatus according to claim 3, further comprising two inspection cameras that respectively image the leg portions provided on both side surfaces of the shield case. The imaging apparatus inspection apparatus according to claim 3, further comprising two reflecting mirrors that respectively reflect the leg portions provided on both side surfaces of the shield case. The inspection apparatus for an imaging apparatus according to claim 1, wherein a reference line indicating the placement surface is provided in advance on the display apparatus. An imaging lens;
A package sensor that includes an image pickup element and includes a plurality of solder balls arranged in a grid pattern for soldering to a predetermined printed wiring board;
A shield case formed of a metal plate and covering the package sensor;
In an inspection method for an imaging apparatus comprising:
Placing the imaging device by bringing the solder balls into contact with a smooth placement surface provided on an inspection jig;
Imaging at least a leg portion for soldering with the printed wiring board provided in the shield case with an inspection camera;
Displaying two parallel determination lines provided in advance for determining whether or not the leg is within a predetermined range and the leg imaged by the inspection camera on a display device;
An inspection method for an imaging apparatus, comprising:

Images