JP2008172197A - Combined member of aluminum-ceramics - Google Patents

Combined member of aluminum-ceramics Download PDF

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JP2008172197A
JP2008172197A JP2007273950A JP2007273950A JP2008172197A JP 2008172197 A JP2008172197 A JP 2008172197A JP 2007273950 A JP2007273950 A JP 2007273950A JP 2007273950 A JP2007273950 A JP 2007273950A JP 2008172197 A JP2008172197 A JP 2008172197A
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aluminum
ceramic
plate
bonding
thickness
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JP5467407B2 (en
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Hideyo Osanai
英世 小山内
Mutsumi Namioka
睦 浪岡
Ken Iyoda
憲 伊與田
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Dowa Holdings Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • H01L23/373Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
    • H01L23/3735Laminates or multilayers, e.g. direct bond copper ceramic substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/46Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
    • H01L23/467Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing gases, e.g. air
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/46Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
    • H01L23/473Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing liquids
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

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  • Chemical & Material Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Materials Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Cooling Or The Like Of Electrical Apparatus (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To directly bond an aluminum member to a ceramic substrate without using any brazing filler metal so as to reduce the stress concentrated on the boundary surface by utilizing plastic deformation of the bonded metal, unlike a conventional manner in which radiating fins are directly bonded to a ceramic substrate by a brazing method to form a combined member of aluminum-ceramics and which is disadvantageous in that separation occurs at the boundary surface because of the difference in thermal expansion coefficient, resulting in weak bonding strength. <P>SOLUTION: In a combined member of aluminum-ceramics, a conductive member holding electronic components thereon is formed on one surface of a ceramic substrate, and a radiating fin assembly or a water-cooling jacket made of aluminum or an aluminum alloy is directly bonded to the other surface by a molten metal bonding method without using any intermediate material such as a brazing filler metal. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明はアルミニウム−セラミックス接合体、特に、電子部品に使用される放熱機能を有するアルミニウム−セラミックス接合体に関するものである。更にはパワーモジュール用電子部材に関するものである。   The present invention relates to an aluminum-ceramic bonded body, and more particularly to an aluminum-ceramic bonded body having a heat dissipation function used for electronic parts. Furthermore, it is related with the electronic member for power modules.

従来、セラミックス絶縁基板と呼ばれるセラミックスの一方の面に回路金属、他方の面に放熱用の金属を接合させ、上記回路金属上に電流・電圧制御用の半導体チップを半田付けし、これらを単数あるいは複数枚、金属ベース板(ヒートシンク)あるいは複合材上に半田付けし、さらにこのベース板裏面に放熱グリースを介して放熱フィンを取り付けたものは知られている。   Conventionally, a circuit metal is bonded to one surface of a ceramic called a ceramic insulating substrate, a metal for heat dissipation is bonded to the other surface, and a semiconductor chip for current / voltage control is soldered on the circuit metal. It is known that a plurality of sheets, a metal base plate (heat sink) or a composite material are soldered and a heat radiation fin is attached to the back surface of the base plate via heat radiation grease.

然しながら、この構造の場合、以下の問題点がある。   However, this structure has the following problems.

(1)半田接合を多用しており、鉛フリー化するために新規半田や実装方法の開発が必要である。   (1) Since solder joining is frequently used, it is necessary to develop a new solder and a mounting method in order to eliminate lead.

(2)半田接合を多用しており、鉛半田による熱伝導の損失がある。   (2) A lot of solder joints are used, and there is a loss of heat conduction due to lead solder.

(3)半田接合を多用しており、半田ボイドによる製造上の歩留まりリスクの問題がある。   (3) Since solder joining is frequently used, there is a problem of yield risk in manufacturing due to solder voids.

(4)放熱グリースの熱伝導性が極端に低い。   (4) The thermal conductivity of the heat dissipating grease is extremely low.

上述の(1)から(3)の問題点はベース一体型基板すなわち、上記セラミックス絶縁基板を直接ベース板に接合することで解決できる。しかし、(4)については市販の放熱グリースの熱伝導率は高くても数W/m・Kしかなく、他に熱伝導率の高い部材を使用してもベース板と放熱フィンの間の熱抵抗が大きく、性能アップのネックとなっていた。   The above problems (1) to (3) can be solved by directly bonding the base integrated substrate, that is, the ceramic insulating substrate to the base plate. However, with regard to (4), the thermal conductivity of commercially available heat radiation grease is only a few W / m · K even if it is high. The resistance was large, and it was a bottleneck for improving performance.

そこで、特許文献1に示すようにろう接法を使いセラミックスに直接フィンを取り付けるという先行技術が知られている。
特開平4−363052号公報
Therefore, as shown in Patent Document 1, a prior art is known in which fins are directly attached to ceramics using a brazing method.
Japanese Patent Laid-Open No. 4-36352

然しながら上記先行技術のように線膨張係数の小さく、薄いセラミックスに対し、線膨張係数の大きく、体積の大きいアルミニウムのフィンを直接取り付けると、常温では問題ないが、パワーモジュールを実際に運転した場合のようにスイッチングにより加熱・冷却を何度も受けた場合、両者の線膨張係数による差から生じる応力によりセラミックスとアルミニウムの接合界面で剥離が起きたり、セラミックスが破損してしまう。   However, when aluminum fins with a large linear expansion coefficient and a large volume are directly attached to thin ceramics with a low linear expansion coefficient as in the above prior art, there is no problem at room temperature, but when the power module is actually operated Thus, when heating and cooling are repeated many times by switching, peeling occurs at the bonding interface between the ceramic and the aluminum or the ceramic is damaged due to the stress resulting from the difference between the linear expansion coefficients of the two.

本発明は上記の欠点を除くようにしたものである。   The present invention eliminates the above-mentioned drawbacks.

本発明はセラミックス基板の一方の面に電子部品搭載用導体が形成され、他方の面にアルミニウムまたはアルミニウム合金からなる放熱フィンが直接接合されているアルミニウム−セラミックス接合体である。直接接合とはろう材等中間材を使用せずにセラミックス基板と金属を接合する方法を示す。   The present invention is an aluminum-ceramic bonding body in which an electronic component mounting conductor is formed on one surface of a ceramic substrate, and a heat radiating fin made of aluminum or an aluminum alloy is directly bonded to the other surface. Direct bonding refers to a method of bonding a ceramic substrate and a metal without using an intermediate material such as a brazing material.

上記放熱フィンは、上記セラミックス基板より大きい形状であることを特徴とする。   The heat radiating fin has a shape larger than that of the ceramic substrate.

また、本発明のアルミニウム−セラミックス接合体は、セラミックス基板の一方の面に電子部品搭載用導体が形成され、他方の面にアルミニウムまたはアルミニウム合金からなる水冷ジャケットが直接接合により形成されていることを特徴とする。   In the aluminum-ceramic bonded body of the present invention, the electronic component mounting conductor is formed on one surface of the ceramic substrate, and the water cooling jacket made of aluminum or aluminum alloy is formed on the other surface by direct bonding. Features.

上記放熱フィンまたは水冷ジャケットは銅を含むことを特徴とする。   The heat radiation fin or the water cooling jacket includes copper.

上記直接接合は、溶湯接合法であることを特徴とする。   The direct joining is a molten metal joining method.

上記セラミックス基板の主成分は、アルミナ、窒化アルミ、窒化硅素の一つであることを特徴とする。   The main component of the ceramic substrate is one of alumina, aluminum nitride, and silicon nitride.

上記セラミックス基板は、複数であることを特徴とする。   The ceramic substrate includes a plurality of ceramic substrates.

本発明は、上記アルミニウム−セラミックス接合体をパワーモジュール用電子部品に使用することを特徴とする。   The present invention is characterized in that the above-mentioned aluminum-ceramic bonding body is used for an electronic component for a power module.

上記のように本発明においては、セラミックス基板とアルミニウムの接合力がろう接法よりも強く、接合欠陥が起きにくい。さらにろう接法ではアルミニウムフィンを原料から一度鋳造、加工して作ったものを真空中でろう材を介してセラミックスに接合して作成するのに対し、本発明では接合する際の鋳造でフィン形状を作れることから、セラミックスとアルミニウムの接合と同時にフィン形状にすることが可能で、放熱性、コスト面や生産面で多大なメリットがあり、パワーモジュール等の大電力電子部品に実装に好適な信頼性の秀れたアルミニウム−セラミックス接合体を容易に得ることができる大きな利益がある。   As described above, in the present invention, the bonding force between the ceramic substrate and aluminum is stronger than the brazing method, and bonding defects are less likely to occur. In addition, in the brazing method, aluminum fins are once cast and processed from raw materials and bonded to ceramics via brazing material in a vacuum. It is possible to make a fin shape at the same time as joining ceramics and aluminum, which has great advantages in terms of heat dissipation, cost and production, and is suitable for mounting on high power electronic components such as power modules. There is a great advantage that an aluminum-ceramic bonded body having excellent properties can be easily obtained.

以下図面によって本発明の実施例を説明する。   Embodiments of the present invention will be described below with reference to the drawings.

図1に示すようにセラミックス板1として、厚さ0.25mm、40mm×40mmサイズのアルミナ基板を2枚用意した。これをカーボン製の鋳型(図示せず)に10mmの間隔を置いてセットし、炉内に入れた。炉内は窒素雰囲気で酸素濃度100ppm以下にした。この状態でさらに750℃まで加熱し、純度4Nの溶融状態のアルミニウムをカーボン製シリンダで圧力をかけることで酸化被膜を取り除き、前記鋳型に流し込んだ。前記鋳型は夫々のセラミックスの一面(回路側)に39mm×39mm、0.4mm厚の板2状になるようにアルミニウムが流れ込み、他面(ベース側)には夫々のセラミックスを繋げた形で110mm×60mm、厚み5mmの板3状になるようにアルミニウムが流れ込み、さらにこの5mmの板3にはセラミックス板1と接触する面と反対側の面に高さ25mm、幅5mmのストレートフィン4がベース長手方向と平行に5mm間隔で形成されるように流れ込む形状にした。この鋳型を冷却し、アルミニウムを凝固、セラミックス板と接合させた後、室温まで冷却し、接合体を鋳型より取り出した。この後、0.4mm厚のアルミニウム板2の表面に所定形状のエッチングレジストを印刷して、塩化第二鉄溶液にてエッチング処理し回路パターンを形成した。次いで、レジストを剥離した後、無電解Ni−Pメッキをアルミニウム上に3μmつけ、セラミックス基板が二枚ベース板に直接接合されたフィン付きベース一体型基板とした。   As shown in FIG. 1, two alumina substrates having a thickness of 0.25 mm and a size of 40 mm × 40 mm were prepared as the ceramic plate 1. This was set in a carbon mold (not shown) at an interval of 10 mm and placed in a furnace. The inside of the furnace was set to an oxygen concentration of 100 ppm or less in a nitrogen atmosphere. In this state, it was further heated to 750 ° C., and aluminum oxide in a molten state having a purity of 4N was applied with a carbon cylinder to remove the oxide film and poured into the mold. In the mold, aluminum flows into one side (circuit side) of each ceramic so as to form a plate 2 having a thickness of 39 mm x 39 mm and 0.4 mm, and the other side (base side) 110 mm x Aluminum flows into a plate 3 having a thickness of 60 mm and a thickness of 5 mm. Further, the straight plate 4 having a height of 25 mm and a width of 5 mm is provided on the surface opposite to the surface in contact with the ceramic plate 1. It was shaped to flow so as to be formed at intervals of 5 mm parallel to the direction. The mold was cooled, the aluminum was solidified and bonded to the ceramic plate, and then cooled to room temperature, and the bonded body was taken out from the mold. Thereafter, an etching resist having a predetermined shape was printed on the surface of the aluminum plate 2 having a thickness of 0.4 mm, and an etching process was performed with a ferric chloride solution to form a circuit pattern. Next, after removing the resist, 3 μm of electroless Ni-P plating was applied on the aluminum, and a base integrated substrate with fins in which the ceramic substrate was directly bonded to the two base plates was obtained.

評価は以下のように行った。まず、めっき後のセラミックスとアルミニウムの接合界面(アルミニウム回路とセラミックス、アルミニウムベースとセラミックスの両者)を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。このサンプルに−40℃30分保持、25℃10分、125℃30分保持、25℃10分を1サイクルとするヒートサイクルを3000回与えた。その後、再度セラミックスとアルミニウムの接合界面を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。   Evaluation was performed as follows. First, when the bonded interface between the ceramic and the aluminum after plating (both aluminum circuit and ceramic, both aluminum base and ceramic) was examined with an ultrasonic flaw detector, no bonding defect was found. In addition, no crack was observed in ceramics. The sample was subjected to 3000 heat cycles of -40 ° C. for 30 minutes, 25 ° C. for 10 minutes, 125 ° C. for 30 minutes, and 25 ° C. for 10 minutes. Thereafter, the bonding interface between the ceramic and aluminum was examined again with an ultrasonic flaw detector, and no bonding defect was found. In addition, no crack was observed in ceramics.

セラミックス板の厚さが0.635mmで材質が窒化アルミである他は実施例1と同様のものを用いたところ実施例1と同一の効果が得られた。   The same effect as in Example 1 was obtained when the same material as in Example 1 was used except that the thickness of the ceramic plate was 0.635 mm and the material was aluminum nitride.

セラミックス板の厚さが0.32mmで材質が窒化硅素である他は実施例1と同様のものを用いたところ実施例1と同一の効果が得られた。   The same effect as in Example 1 was obtained when the same material as in Example 1 was used except that the thickness of the ceramic plate was 0.32 mm and the material was silicon nitride.

セラミックス板1として、厚さ0.25mm、40mm×40mmサイズのアルミナ基板を2枚用意した。これをカーボン製の鋳型(図示せず)に10mmの間隔を置いてセットし、炉内に入れた。炉内は窒素雰囲気で酸素濃度100ppm以下にした。この状態でさらに750℃まで加熱し、溶融状態のアルミニウムをカーボン製シリンダで圧力をかけることで酸化被膜を取り除き、前記鋳型の回路側に流し込んだ。前記鋳型は夫々のセラミックスの一面に39mm×39mm、0.4mm厚の板2状になるように純度4Nのアルミニウムが流れ込み、他面には夫々のセラミックスを繋げた形で110mm×60mm、厚み5mmの板3状になるように純度99.7%(JIS1070番)のアルミニウムが流れ込み、さらにこの5mmの板にはセラミックスと接触する面と反対側の面に高さ25mm、幅5mmのストレートフィン4がベース長手方向と平行に5mm間隔で形成されるように流れ込む形状にした。この鋳型を冷却し、アルミニウムを凝固、セラミックスと接合させた後、室温まで冷却し、接合体を鋳型より取り出した。この後、0.4mm厚のアルミニウム板2の表面に所定形状のエッチングレジストを印刷して、塩化第二鉄溶液にてエッチング処理し回路パターンを形成した。次いで、レジストを剥離した後、無電解Ni−Pメッキをアルミニウム上に3μmつけ、セラミックス基板が二枚ベース板に直接接合されたフィン付きベース一体型基板とした。   As the ceramic plate 1, two alumina substrates having a thickness of 0.25 mm and a size of 40 mm × 40 mm were prepared. This was set in a carbon mold (not shown) at an interval of 10 mm and placed in a furnace. The inside of the furnace was set to an oxygen concentration of 100 ppm or less in a nitrogen atmosphere. In this state, it was further heated to 750 ° C., and the molten aluminum was removed by applying pressure with a carbon cylinder, and poured into the circuit side of the mold. In the mold, aluminum of 4N purity flows into one plate of 39mm x 39mm and 0.4mm thickness on one side of each ceramic, and 110mm x 60mm and 5mm in thickness with each ceramic connected to the other side. Aluminum with a purity of 99.7% (JIS No. 1070) flows into the plate 3, and this 5mm plate has a straight fin 4 with a height of 25mm and a width of 5mm on the surface opposite to the surface in contact with the ceramic. It was shaped to flow so as to be formed at intervals of 5 mm parallel to the direction. The mold was cooled, the aluminum was solidified and bonded to the ceramic, and then cooled to room temperature, and the bonded body was taken out from the mold. Thereafter, an etching resist having a predetermined shape was printed on the surface of the aluminum plate 2 having a thickness of 0.4 mm, and an etching process was performed with a ferric chloride solution to form a circuit pattern. Next, after removing the resist, 3 μm of electroless Ni-P plating was applied on the aluminum, and a base integrated substrate with fins in which the ceramic substrate was directly bonded to the two base plates was obtained.

評価は以下のように行った。まず、めっき後のセラミックスとアルミニウムの接合界面(アルミニウム回路とセラミックス、アルミニウムベースとセラミックスの両者)を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。このサンプルに−40℃30分保持、25℃10分、125℃30分保持、25℃10分を1サイクルとするヒートサイクルを3000回与えた。その後、再度セラミックスとアルミニウムの接合界面を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。   Evaluation was performed as follows. First, when the bonded interface between the ceramic and the aluminum after plating (both aluminum circuit and ceramic, both aluminum base and ceramic) was examined with an ultrasonic flaw detector, no bonding defect was found. In addition, no crack was observed in ceramics. The sample was subjected to 3000 heat cycles of -40 ° C. for 30 minutes, 25 ° C. for 10 minutes, 125 ° C. for 30 minutes, and 25 ° C. for 10 minutes. Thereafter, the bonding interface between the ceramic and aluminum was examined again with an ultrasonic flaw detector, and no bonding defect was found. In addition, no crack was observed in ceramics.

セラミックス板の厚さが0.635mmで材質が窒化アルミである他は実施例4と同様のものを用いたところ実施例4と同一の効果が得られた。   The same effect as in Example 4 was obtained when the same material as in Example 4 was used except that the thickness of the ceramic plate was 0.635 mm and the material was aluminum nitride.

セラミックス板の厚さが0.32mmで材質が窒化硅素である他は実施例4と同様のものを用いたところ実施例4と同一の効果が得られた。   Using the same material as in Example 4 except that the thickness of the ceramic plate was 0.32 mm and the material was silicon nitride, the same effect as in Example 4 was obtained.

セラミックス板1として、厚さ0.25mm、40mm×40mmサイズのアルミナ基板を2枚用意した。これをカーボン製の鋳型(図示せず)に10mmの間隔を置いてセットし、炉内に入れた。炉内は窒素雰囲気で酸素濃度100ppm以下にした。この状態でさらに750℃まで加熱し、純度99.7%(JIS1070番)の溶融状態のアルミニウムをカーボン製シリンダで圧力をかけることで酸化被膜を取り除き、前記鋳型に流し込んだ。前記鋳型は夫々のセラミックスの一面に39mm×39mm、0.4mm厚の板2状になるようにアルミニウムが流れ込み、他面には夫々のセラミックスを繋げた形で110mm×60mm、厚み5mmの板3状になるようにアルミニウムが流れ込み、さらにこの5mmの板にはセラミックスと接触する面と反対側の面に高さ25mm、幅5mmのストレートフィン4がベース長手方向と平行に5mm間隔で形成されるように流れ込む形状にした。この鋳型を冷却し、アルミニウムを凝固、セラミックスと接合させた後、室温まで冷却し、接合体を鋳型より取り出した。この後、0.4mm厚のアルミニウム板2の表面に所定形状のエッチングレジストを印刷して、塩化第二鉄溶液にてエッチング処理し回路パターンを形成した。次いで、レジストを剥離した後、無電解Ni−Pメッキをアルミニウム上に3μmつけ、セラミックス基板が二枚ベース板に直接接合されたフィン付きベース一体型基板とした。   As the ceramic plate 1, two alumina substrates having a thickness of 0.25 mm and a size of 40 mm × 40 mm were prepared. This was set in a carbon mold (not shown) at an interval of 10 mm and placed in a furnace. The inside of the furnace was set to an oxygen concentration of 100 ppm or less in a nitrogen atmosphere. In this state, the mixture was further heated to 750 ° C., and aluminum oxide in a molten state having a purity of 99.7% (JIS No. 1070) was applied with a carbon cylinder to remove the oxide film and poured into the mold. In the mold, aluminum flows into one side of each ceramic to form a plate of 39mm x 39mm and 0.4mm thickness, and the other side is a plate of 110mm x 60mm and thickness 5mm with each ceramic connected. In addition, aluminum flows into this 5 mm plate, and straight fins 4 having a height of 25 mm and a width of 5 mm are formed on the surface opposite to the surface in contact with the ceramic at intervals of 5 mm parallel to the longitudinal direction of the base. Shaped to flow into. The mold was cooled, the aluminum was solidified and bonded to the ceramic, and then cooled to room temperature, and the bonded body was taken out from the mold. Thereafter, an etching resist having a predetermined shape was printed on the surface of the aluminum plate 2 having a thickness of 0.4 mm, and an etching process was performed with a ferric chloride solution to form a circuit pattern. Next, after removing the resist, 3 μm of electroless Ni-P plating was applied on the aluminum, and a base integrated substrate with fins in which the ceramic substrate was directly bonded to the two base plates was obtained.

評価は以下のように行った。まず、めっき後のセラミックスとアルミニウムの接合界面(アルミニウム回路とセラミックス、アルミニウムベースとセラミックスの両者)を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。このサンプルに−40℃30分保持、25℃10分、125℃30分保持、25℃10分を1サイクルとするヒートサイクルを3000回与えた。その後、再度セラミックスとアルミニウムの接合界面を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。   Evaluation was performed as follows. First, when the bonded interface between the ceramic and the aluminum after plating (both aluminum circuit and ceramic, both aluminum base and ceramic) was examined with an ultrasonic flaw detector, no bonding defect was found. In addition, no crack was observed in ceramics. The sample was subjected to 3000 heat cycles of -40 ° C. for 30 minutes, 25 ° C. for 10 minutes, 125 ° C. for 30 minutes, and 25 ° C. for 10 minutes. Thereafter, the bonding interface between the ceramic and aluminum was examined again with an ultrasonic flaw detector, and no bonding defect was found. In addition, no crack was observed in ceramics.

セラミックス板の厚さが0.635mmで材質が窒化アルミである他は実施例7と同様のものを用いたところ実施例7と同一の効果が得られた。   The same effect as in Example 7 was obtained when the same material as in Example 7 was used except that the thickness of the ceramic plate was 0.635 mm and the material was aluminum nitride.

セラミックス板の厚さが0.32mmで材質が窒化硅素である他は実施例7と同様のものを用いたところ実施例7と同一の効果が得られた。   Using the same material as in Example 7 except that the thickness of the ceramic plate was 0.32 mm and the material was silicon nitride, the same effect as in Example 7 was obtained.

セラミックス板1として、厚さ0.25mm、40mm×40mmサイズのアルミナ基板を2枚用意した。これをカーボン製の鋳型(図示せず)に10mmの間隔を置いてセットし、炉内に入れた。炉内は窒素雰囲気で酸素濃度100ppm以下にした。この状態でさらに750℃まで加熱し、アルミニウム99.5wt%、銅0.5wt%の溶融状態のものをカーボン製シリンダで圧力をかけることで酸化被膜を取り除き、前記鋳型に流し込んだ。アルミニウム合金として銅を含有するものとしたのはフィンの耐食性を考慮したためである。前記鋳型は夫々のセラミックスの一面に39mm×39mm、0.4mm厚の板2状になるようにアルミニウムが流れ込み、他面には夫々のセラミックスを繋げた形で110mm×60mm、厚み5mmの板3状になるようにアルミニウムが流れ込み、さらにこの5mmの板にはセラミックスと接触する面と反対側の面に高さ25mm、幅5mmのストレートフィン4がベース長手方向と平行に5mm間隔で形成されるように流れ込む形状にした。この鋳型を冷却し、アルミニウムを凝固、セラミックスと接合させた後、室温まで冷却し、接合体を鋳型より取り出した。この後、0.4mm厚のアルミニウム板2の表面に所定形状のエッチングレジストを印刷して、塩化第二鉄溶液にてエッチング処理し回路パターンを形成した。次いで、レジストを剥離した後、無電解Ni−Pメッキをアルミニウム上に3μmつけ、セラミックス基板が二枚ベース板に直接接合されたフィン付きベース一体型基板とした。   As the ceramic plate 1, two alumina substrates having a thickness of 0.25 mm and a size of 40 mm × 40 mm were prepared. This was set in a carbon mold (not shown) at an interval of 10 mm and placed in a furnace. The inside of the furnace was set to an oxygen concentration of 100 ppm or less in a nitrogen atmosphere. In this state, the mixture was further heated to 750 ° C., and a molten state of 99.5 wt% aluminum and 0.5 wt% copper was removed by applying pressure with a carbon cylinder and poured into the mold. The reason why copper is contained as the aluminum alloy is that the corrosion resistance of the fins is taken into consideration. In the mold, aluminum flows into one side of each ceramic to form a plate of 39mm x 39mm and 0.4mm thickness, and the other side is a plate of 110mm x 60mm and thickness 5mm with each ceramic connected. In addition, aluminum flows into this 5 mm plate, and straight fins 4 having a height of 25 mm and a width of 5 mm are formed on the surface opposite to the surface in contact with the ceramic at intervals of 5 mm parallel to the longitudinal direction of the base. Shaped to flow into. The mold was cooled, the aluminum was solidified and bonded to the ceramic, and then cooled to room temperature, and the bonded body was taken out from the mold. Thereafter, an etching resist having a predetermined shape was printed on the surface of the aluminum plate 2 having a thickness of 0.4 mm, and an etching process was performed with a ferric chloride solution to form a circuit pattern. Next, after removing the resist, 3 μm of electroless Ni-P plating was applied on the aluminum, and a base integrated substrate with fins in which the ceramic substrate was directly bonded to the two base plates was obtained.

評価は以下のように行った。まず、めっき後のセラミックスとアルミニウムの接合界面(アルミニウム回路とセラミックス、アルミニウムベースとセラミックスの両者)を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。このサンプルに−40℃30分保持、25℃10分、125℃30分保持、25℃10分を1サイクルとするヒートサイクルを3000回与えた。その後、再度セラミックスとアルミニウムの接合界面を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。   Evaluation was performed as follows. First, when the bonded interface between the ceramic and the aluminum after plating (both aluminum circuit and ceramic, both aluminum base and ceramic) was examined with an ultrasonic flaw detector, no bonding defect was found. In addition, no crack was observed in ceramics. The sample was subjected to 3000 heat cycles of -40 ° C. for 30 minutes, 25 ° C. for 10 minutes, 125 ° C. for 30 minutes, and 25 ° C. for 10 minutes. Thereafter, the bonding interface between the ceramic and aluminum was examined again with an ultrasonic flaw detector, and no bonding defect was found. In addition, no crack was observed in ceramics.

セラミックス板の厚さが0.635mmで材質が窒化アルミである他は実施例10と同様のものを用いたところ実施例10と同一の効果が得られた。   The same effect as in Example 10 was obtained when the same material as in Example 10 was used except that the thickness of the ceramic plate was 0.635 mm and the material was aluminum nitride.

セラミックス板の厚さが0.32mmで材質が窒化硅素である他は実施例10と同様のものを用いたところ実施例10と同一の効果が得られた。   When the same material as in Example 10 was used except that the thickness of the ceramic plate was 0.32 mm and the material was silicon nitride, the same effect as in Example 10 was obtained.

図2に示すように、セラミックス板1として、厚さ0.25mm、40mm×40mmサイズのアルミナ基板を2枚用意した。これをカーボン製の鋳型(図示せず)に10mmの間隔を置いてセットし、炉内に入れた。炉内は窒素雰囲気で酸素濃度100ppm以下にした。この状態でさらに750℃まで加熱し、アルミニウム99.5wt%、銅0.5wt%の溶融状態のものをカーボン製シリンダで圧力をかけることで酸化被膜を取り除き、前記鋳型に流し込んだ。アルミニウム合金として銅を含有するものとしたのは耐食性を考慮したためである。前記鋳型は夫々のセラミックスの一面に39mm×39mm、0.4mm厚の板2状になるようにアルミニウムが流れ込み、他面には夫々のセラミックスを繋げた形で110mm×60mm、厚み50mmの板3状になるようにアルミニウムが流れ込み、さらにこの50mmの板3内には蛇行状の水路5が形成されるように流れ込む形状にした。この鋳型を冷却し、アルミニウムを凝固、セラミックスと接合させた後、室温まで冷却し、接合体を鋳型より取り出した。この後、0.4mm厚のアルミニウム板2の表面に所定形状のエッチングレジストを印刷して、塩化第二鉄溶液にてエッチング処理し回路パターンを形成した。次いで、レジストを剥離した後、無電解Ni−Pメッキをアルミニウム上に3μmつけた。上記板3の底面はゴム製シール11を介してアルミニウム板6によって塞ぎ、さらに上記板3の側面の水路5の位置にゴム管7を配管するため穴を明け開口8とした。その穴に溝を切りジョイントを介しゴム管7を取り付け、セラミックス基板が二枚ベース板に直接接合された水冷ジャケット一体型基板とした。ゴム製シール11及びアルミニウム板3は本実施例においては接着剤で接着し水路5を塞いだが、ネジ止めやスポット溶接等の方法でも良い。   As shown in FIG. 2, two alumina substrates having a thickness of 0.25 mm and a size of 40 mm × 40 mm were prepared as the ceramic plate 1. This was set in a carbon mold (not shown) at an interval of 10 mm and placed in a furnace. The inside of the furnace was set to an oxygen concentration of 100 ppm or less in a nitrogen atmosphere. In this state, the mixture was further heated to 750 ° C., and a molten state of 99.5 wt% aluminum and 0.5 wt% copper was removed by applying pressure with a carbon cylinder and poured into the mold. The reason why the aluminum alloy contains copper is that corrosion resistance is taken into consideration. In the mold, aluminum flows into one side of each ceramic to form a plate of 39mm x 39mm and 0.4mm thickness, and the other side is a plate of 110mm x 60mm and thickness 50mm with each ceramic connected. Then, aluminum flowed in such a way that the meandering water channel 5 was formed in the 50 mm plate 3. The mold was cooled, the aluminum was solidified and bonded to the ceramic, and then cooled to room temperature, and the bonded body was taken out from the mold. Thereafter, an etching resist having a predetermined shape was printed on the surface of the aluminum plate 2 having a thickness of 0.4 mm, and an etching process was performed with a ferric chloride solution to form a circuit pattern. Next, after removing the resist, 3 μm of electroless Ni—P plating was applied on the aluminum. The bottom surface of the plate 3 was closed with an aluminum plate 6 through a rubber seal 11, and a hole was made as an opening 8 for piping a rubber tube 7 in the position of the water channel 5 on the side surface of the plate 3. A groove was cut in the hole and a rubber tube 7 was attached via a joint to form a water cooling jacket integrated substrate in which the ceramic substrate was directly bonded to the two base plates. In this embodiment, the rubber seal 11 and the aluminum plate 3 are bonded with an adhesive to close the water channel 5, but may be screwed or spot welded.

評価は以下のように行った。まず、めっき後のセラミックスとアルミニウムの接合界面(アルミニウム回路とセラミックス、アルミニウムベースとセラミックスの両者)を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。このサンプルに−40℃30分保持、25℃10分、125℃30分保持、25℃10分を1サイクルとするヒートサイクルを3000回与えた。その後、再度セラミックスとアルミニウムの接合界面を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。   Evaluation was performed as follows. First, when the bonded interface between the ceramic and the aluminum after plating (both aluminum circuit and ceramic, both aluminum base and ceramic) was examined with an ultrasonic flaw detector, no bonding defect was found. In addition, no crack was observed in ceramics. The sample was subjected to 3000 heat cycles of -40 ° C. for 30 minutes, 25 ° C. for 10 minutes, 125 ° C. for 30 minutes, and 25 ° C. for 10 minutes. Thereafter, the bonding interface between the ceramic and aluminum was examined again with an ultrasonic flaw detector, and no bonding defect was found. In addition, no crack was observed in ceramics.

セラミックス板の厚さが0.635mmで材質が窒化アルミである他は実施例13と同様のものを用いたところ実施例13と同一の効果が得られた。   The same effect as in Example 13 was obtained when the same material as in Example 13 was used except that the thickness of the ceramic plate was 0.635 mm and the material was aluminum nitride.

セラミックス板の厚さが0.32mmで材質が窒化硅素である他は実施例13と同様のものを用いたところ実施例13と同一の効果が得られた。   The same effect as in Example 13 was obtained when the same material as in Example 13 was used except that the thickness of the ceramic plate was 0.32 mm and the material was silicon nitride.

図3に示すようにセラミックス板1として、厚さ0.25mm、40mm×40mmサイズのアルミナ基板を2枚用意した。これをカーボン製の鋳型(図示せず)に10mmの間隔を置いてセットし、炉内に入れた。炉内は窒素雰囲気で酸素濃度100ppm以下にした。この状態でさらに750℃まで加熱し、アルミニウム99.5wt%、銅0.5wt%の溶融状態のものをカーボン製シリンダで圧力をかけることで酸化被膜を取り除き、前記鋳型に流し込んだ。前記鋳型は夫々のセラミックスの一面に39mm×39mm、0.4mm厚の板2状になるようにアルミニウムが流れ込み、他面には夫々のセラミックスを繋げた形で110mm×60mm、厚み5mmの板3状になるようにアルミニウムが流れ込み、さらにこの5mmの板3には基板接触側の縁面に幅3mmの壁9が垂直に30mm立つように、なおかつセラミックスと接触する面と反対側の面に高さ25mm、幅5mmのストレートフィン4がベース長手方向と平行に5mm間隔で形成されるように流れ込む形状にした。この鋳型を冷却し、アルミニウムを凝固、セラミックスと接合させた後、室温まで冷却し、接合体を鋳型より取り出した。この後、0.4mm厚のアルミニウム板表面に所定形状のエッチングレジストを印刷して、塩化第二鉄溶液にてエッチング処理し回路パターンを形成した。次いで、レジストを剥離した後、無電解Ni−Pメッキをアルミニウム上に3μmつけ、セラミックス基板が二枚ベース板に直接接合されたフィン付き壁付きベース一体型基板とした。   As shown in FIG. 3, two alumina substrates having a thickness of 0.25 mm and a size of 40 mm × 40 mm were prepared as the ceramic plate 1. This was set in a carbon mold (not shown) at an interval of 10 mm and placed in a furnace. The inside of the furnace was set to an oxygen concentration of 100 ppm or less in a nitrogen atmosphere. In this state, the mixture was further heated to 750 ° C., and a molten state of 99.5 wt% aluminum and 0.5 wt% copper was removed by applying pressure with a carbon cylinder and poured into the mold. In the mold, aluminum flows into one side of each ceramic to form a plate of 39mm x 39mm and 0.4mm thickness, and the other side is a plate of 110mm x 60mm and thickness 5mm with each ceramic connected. Furthermore, the aluminum flows into the plate so that the wall 9 with a width of 3 mm stands 30 mm vertically on the edge surface on the substrate contact side, and the height on the surface opposite to the surface in contact with the ceramic. The straight fins 4 having a width of 25 mm and a width of 5 mm were formed so as to flow in parallel with the longitudinal direction of the base at intervals of 5 mm. The mold was cooled, the aluminum was solidified and bonded to the ceramic, and then cooled to room temperature, and the bonded body was taken out from the mold. Thereafter, an etching resist having a predetermined shape was printed on the surface of an aluminum plate having a thickness of 0.4 mm, and a circuit pattern was formed by etching with a ferric chloride solution. Next, after removing the resist, 3 μm of electroless Ni-P plating was applied on the aluminum, and a base-integrated substrate with fins with a ceramic substrate directly bonded to the base plate was obtained.

評価は以下のように行った。まず、めっき後のセラミックスとアルミニウムの接合界面(アルミニウム回路とセラミックス、アルミニウムベースとセラミックスの両者)を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。このサンプルに−40℃30分保持、25℃10分、125℃30分保持、25℃10分を1サイクルとするヒートサイクルを3000回与えた。その後、再度セラミックスとアルミニウムの接合界面を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。   Evaluation was performed as follows. First, when the bonded interface between the ceramic and the aluminum after plating (both aluminum circuit and ceramic, both aluminum base and ceramic) was examined with an ultrasonic flaw detector, no bonding defect was found. In addition, no crack was observed in ceramics. The sample was subjected to 3000 heat cycles of -40 ° C. for 30 minutes, 25 ° C. for 10 minutes, 125 ° C. for 30 minutes, and 25 ° C. for 10 minutes. Thereafter, the bonding interface between the ceramic and aluminum was examined again with an ultrasonic flaw detector, and no bonding defect was found. In addition, no crack was observed in ceramics.

セラミックス板の厚さが0.635mmで材質が窒化アルミである他は実施例16と同様のものを用いたところ実施例16と同一の効果が得られた。   The same effect as in Example 16 was obtained when the same material as in Example 16 was used except that the thickness of the ceramic plate was 0.635 mm and the material was aluminum nitride.

セラミックス板の厚さが0.32mmで材質が窒化硅素である他は実施例16と同様のものを用いたところ実施例16と同一の効果が得られた。   The same effect as in Example 16 was obtained when the same material as in Example 16 was used except that the thickness of the ceramic plate was 0.32 mm and the material was silicon nitride.

図4に示すように、セラミックス板1として、厚さ0.25mm、40mm×40mmサイズのアルミナ基板を2枚用意した。これをカーボン製の鋳型(図示せず)に10mmの間隔を置いてセットし、炉内に入れた。炉内は窒素雰囲気で酸素濃度100ppm以下にした。この状態でさらに750℃まで加熱し、アルミニウム99.5wt%、銅0.5wt%の溶融状態のものをカーボン製シリンダで圧力をかけることで酸化被膜を取り除き、前記鋳型に流し込んだ。前記鋳型は夫々のセラミックスの一面に39mm×39mm、0.4mm厚の板2状になるようにアルミニウムが流れ込み、他面には夫々のセラミックスを繋げた形で110mm×60mm、厚み5mmの板3状になるようにアルミニウムが流れ込み、さらにこの5mmの板3には基板接触側の面に10mm×20mm、高さ3mmの端子台10を板2の脇2ヶ所に、流れ込む形状にした。端子台には10mm×20mm×0.635mmのアルミナが接合され、その上には9mm×19mm×0.4mmのアルミニウムが接合される。また、チップと端子を結線するためのアルミニウムワイヤーが超音波ボンディングにより打てるようになっている。前述のアルミナはセラミックス板1と同じように2枚鋳型にセットするが、端子台高さの分セラミックス板1と高さが違う。そして板2と同時にアルミニウムが流れ込み前述の厚みのアルミニウムが形成される。なおかつセラミックスと接触する面と反対側の面に高さ25mm、幅5mmのストレートフィン4がベース長手方向と平行に5mm間隔で形成されるように流れ込む形状にした。この鋳型を冷却し、アルミニウムを凝固、セラミックスと接合させた後、室温まで冷却し、接合体を鋳型より取り出した。この後、0.4mm厚のアルミニウム板表面に所定形状のエッチングレジストを印刷して、塩化第二鉄溶液にてエッチング処理し回路パターンを形成した。次いで、レジストを剥離した後、無電解Ni−Pメッキをアルミニウム上に3μmつけ、セラミックス基板が二枚ベース板に直接接合されたフィン付き端子台付きベース一体型基板とした。   As shown in FIG. 4, two alumina substrates having a thickness of 0.25 mm and a size of 40 mm × 40 mm were prepared as the ceramic plate 1. This was set in a carbon mold (not shown) at an interval of 10 mm and placed in a furnace. The inside of the furnace was set to an oxygen concentration of 100 ppm or less in a nitrogen atmosphere. In this state, the mixture was further heated to 750 ° C., and a molten state of 99.5 wt% aluminum and 0.5 wt% copper was removed by applying pressure with a carbon cylinder and poured into the mold. In the mold, aluminum flows into one side of each ceramic to form a plate of 39mm x 39mm and 0.4mm thickness, and the other side is a plate of 110mm x 60mm and thickness 5mm with each ceramic connected. Then, aluminum flowed in such a manner that the terminal block 10 having a size of 10 mm × 20 mm and a height of 3 mm was poured into the 5 mm plate 3 on two sides of the plate 2. The terminal block is bonded with 10 mm × 20 mm × 0.635 mm alumina, and 9 mm × 19 mm × 0.4 mm aluminum is bonded thereon. Further, an aluminum wire for connecting the chip and the terminal can be hit by ultrasonic bonding. The above-mentioned alumina is set in two molds in the same manner as the ceramic plate 1, but the height is different from the ceramic plate 1 by the height of the terminal block. Then, aluminum flows simultaneously with the plate 2 to form aluminum having the above thickness. In addition, the straight fins 4 having a height of 25 mm and a width of 5 mm were formed on the surface opposite to the surface in contact with the ceramic so as to flow in parallel with the longitudinal direction of the base at intervals of 5 mm. The mold was cooled, the aluminum was solidified and bonded to the ceramic, and then cooled to room temperature, and the bonded body was taken out from the mold. Thereafter, an etching resist having a predetermined shape was printed on the surface of an aluminum plate having a thickness of 0.4 mm, and a circuit pattern was formed by etching with a ferric chloride solution. Next, after removing the resist, 3 μm of electroless Ni—P plating was applied on the aluminum, and a base integrated substrate with finned terminal blocks in which two ceramic substrates were directly bonded to the base plate was obtained.

評価は以下のように行った。まず、めっき後のセラミックスとアルミニウムの接合界面(アルミニウム回路とセラミックス、アルミニウムベースとセラミックスの両者)を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。このサンプルに−40℃30分保持、25℃10分、125℃30分保持、25℃10分を1サイクルとするヒートサイクルを3000回与えた。その後、再度セラミックスとアルミニウムの接合界面を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。   Evaluation was performed as follows. First, when the bonded interface between the ceramic and the aluminum after plating (both aluminum circuit and ceramic, both aluminum base and ceramic) was examined with an ultrasonic flaw detector, no bonding defect was found. In addition, no crack was observed in ceramics. The sample was subjected to 3000 heat cycles of -40 ° C. for 30 minutes, 25 ° C. for 10 minutes, 125 ° C. for 30 minutes, and 25 ° C. for 10 minutes. Thereafter, the bonding interface between the ceramic and aluminum was examined again with an ultrasonic flaw detector, and no bonding defect was found. In addition, no crack was observed in ceramics.

セラミックス板の厚さが0.635mmで材質が窒化アルミである他は実施例19と同様のものを用いたところ実施例19と同一の効果が得られた。   The same effect as in Example 19 was obtained when the same material as in Example 19 was used except that the thickness of the ceramic plate was 0.635 mm and the material was aluminum nitride.

セラミックス板の厚さが0.32mmで材質が窒化硅素である他は実施例19と同様のものを用いたところ実施例19と同一の効果が得られた。   The same effect as in Example 19 was obtained when the same material as in Example 19 was used except that the thickness of the ceramic plate was 0.32 mm and the material was silicon nitride.

(比較例1)   (Comparative Example 1)

純度99.7%(JIS1070番)、110mm×60mm、厚み30mmのアルミニウム金属板を用意し、フライス盤による切削加工で一方の面に高さ25mm、幅5mmのストレートフィンを長手方向と平行に5mm間隔で形成し、フィン付きベース板を作成した。セラミックス板として、厚さ0.25mm、40mm×40mmサイズのアルミナ基板を2枚用意した。次に純度4Nの39mm×39mm、0.4mm厚のアルミニウム金属板を2枚、前記フィン付きベース板を1枚用意した。ろう材合金箔として、アルミニウム95wt%、銅4wt%、マグネシウム1wt%の組成で厚み20μmのものを作製した。前記夫々のセラミックス板の片面に0.4mm厚みのアルミニウム金属板を、他面に厚み5mmのアルミニウム金属板を前記20μmろう材合金箔を介して重ねた(5mm厚のアルミニウム金属板上に前記セラミックスが10mmの間隔置く形で)。これを20kgf/cm2で加圧しながら、10-4Torrの真空中、630℃でアルミニウム板とセラミックスを接合させた。接合後、0.4mm厚のアルミニウム板表面に所定形状のエッチングレジストを印刷して、塩化第二鉄溶液にてエッチング処理し回路パターンを形成した。次いで、レジストを剥離した後、無電解Ni−Pメッキをアルミニウム上に3μmつけ、セラミックス基板が二枚ベース板に直接接合されたベース一体型基板とした。 Aluminum metal plate with 99.7% purity (JIS1070), 110mm x 60mm, 30mm thickness is prepared, and straight fins with a height of 25mm and a width of 5mm are formed on one side at 5mm intervals parallel to the longitudinal direction by cutting with a milling machine Then, a base plate with fins was created. Two ceramic substrates having a thickness of 0.25 mm and a size of 40 mm × 40 mm were prepared. Next, two aluminum metal plates with a purity of 4N of 39 mm × 39 mm and 0.4 mm thickness and one base plate with fins were prepared. A brazing alloy foil having a composition of 95 wt% aluminum, 4 wt% copper, and 1 wt% magnesium and a thickness of 20 μm was produced. An aluminum metal plate having a thickness of 0.4 mm is laminated on one side of each ceramic plate, and an aluminum metal plate having a thickness of 5 mm is laminated on the other side via the 20 μm brazing alloy foil (the ceramics are placed on the aluminum metal plate having a thickness of 5 mm). In the form of 10mm spacing). While pressing this at 20 kgf / cm 2, the aluminum plate and the ceramic were joined at 630 ° C. in a vacuum of 10 −4 Torr. After bonding, an etching resist having a predetermined shape was printed on the surface of an aluminum plate having a thickness of 0.4 mm and a circuit pattern was formed by etching with a ferric chloride solution. Next, after removing the resist, electroless Ni-P plating was applied to 3 μm on aluminum, and a base integrated substrate in which the ceramic substrate was directly bonded to the two base plates was obtained.

評価は以下のように行った。まず、めっき後のセラミックスとアルミニウムの接合界面(アルミニウム回路とセラミックス、アルミニウムベースとセラミックスの両者)を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。このサンプルに−40℃30分保持、25℃10分、125℃30分保持、25℃10分を1サイクルとするヒートサイクルを3000回与えた。その後、再度セラミックスとアルミニウムの接合界面を超音波探傷装置により調べたところ、セラミックスとフィン付きアルミニウム金属板の接合界面に基板の縁面より10mm程度の剥離が認められた。セラミックスについてはクラックは認められなかった。   Evaluation was performed as follows. First, when the bonded interface between the ceramic and the aluminum after plating (both aluminum circuit and ceramic, both aluminum base and ceramic) was examined with an ultrasonic flaw detector, no bonding defect was found. In addition, no crack was observed in ceramics. The sample was subjected to 3000 heat cycles of -40 ° C. for 30 minutes, 25 ° C. for 10 minutes, 125 ° C. for 30 minutes, and 25 ° C. for 10 minutes. Thereafter, when the interface between the ceramic and the aluminum was examined again with an ultrasonic flaw detector, peeling of about 10 mm from the edge of the substrate was observed at the interface between the ceramic and the aluminum metal plate with fins. No cracks were observed for ceramics.

(比較例2)   (Comparative Example 2)

セラミックス板の厚さが0.635mmで材質が窒化アルミである他は比較例1と同様のものを用いたところ比較例1と同一の効果が得られた。   The same effect as in Comparative Example 1 was obtained when the same material as in Comparative Example 1 was used except that the thickness of the ceramic plate was 0.635 mm and the material was aluminum nitride.

(比較例3)   (Comparative Example 3)

セラミックス板の厚さが0.32mmで材質が窒化硅素である他は比較例1と同様のものを用いたところ比較例1と同一の効果が得られた。   When the same material as in Comparative Example 1 was used except that the thickness of the ceramic plate was 0.32 mm and the material was silicon nitride, the same effect as in Comparative Example 1 was obtained.

(比較例4)   (Comparative Example 4)

純度4N、110mm×60mm、厚み30mmのアルミニウム金属板を用意し、フライス盤による切削加工で一方の面に高さ25mm、幅5mmのストレートフィンを長手方向と平行に5mm間隔で形成し、フィン付きベース板を作成した。セラミックス板として、厚さ0.25mm、40mm×40mmサイズのアルミナ基板を2枚用意した。次に純度4Nの39mm×39mm、0.4mm厚のアルミニウム金属板を2枚、前記フィン付きベース板を1枚用意した。ろう材合金箔として、アルミニウム95wt%、銅4wt%、マグネシウム1wt%の組成で厚み20μmのものを作製した。前記夫々のセラミックス板の片面に0.4mm厚みのアルミニウム金属板を、他面に厚み5mmのアルミニウム金属板を前記20μmろう材合金箔を介して重ねた(5mm厚のアルミニウム金属板上に前記セラミックスが10mmの間隔置く形で)。これを20kgf/cm2で加圧しながら、10-4Torrの真空中、630℃でアルミニウム板とセラミックスを接合させた。接合後、0.4mm厚のアルミニウム板表面に所定形状のエッチングレジストを印刷して、塩化第二鉄溶液にてエッチング処理し回路パターンを形成した。次いで、レジストを剥離した後、無電解Ni−Pメッキをアルミニウム上に3μmつけ、セラミックス基板が二枚ベース板に直接接合されたベース一体型基板とした。 Aluminum metal plate of purity 4N, 110mm × 60mm, thickness 30mm is prepared, and straight fins with a height of 25mm and a width of 5mm are formed on one side by a milling machine at intervals of 5mm parallel to the longitudinal direction, with fins A board was created. Two ceramic substrates having a thickness of 0.25 mm and a size of 40 mm × 40 mm were prepared. Next, two aluminum metal plates with a purity of 4N of 39 mm × 39 mm and 0.4 mm thickness and one base plate with fins were prepared. A brazing alloy foil having a composition of 95 wt% aluminum, 4 wt% copper, and 1 wt% magnesium and a thickness of 20 μm was produced. An aluminum metal plate having a thickness of 0.4 mm is laminated on one side of each ceramic plate, and an aluminum metal plate having a thickness of 5 mm is laminated on the other side via the 20 μm brazing alloy foil (the ceramics are placed on the aluminum metal plate having a thickness of 5 mm). In the form of 10mm spacing). While pressing this at 20 kgf / cm 2, the aluminum plate and the ceramic were joined at 630 ° C. in a vacuum of 10 −4 Torr. After bonding, an etching resist having a predetermined shape was printed on the surface of an aluminum plate having a thickness of 0.4 mm and a circuit pattern was formed by etching with a ferric chloride solution. Next, after removing the resist, electroless Ni-P plating was applied to 3 μm on aluminum, and a base integrated substrate in which the ceramic substrate was directly bonded to the two base plates was obtained.

評価は以下のように行った。まず、めっき後のセラミックスとアルミニウムの接合界面(アルミニウム回路とセラミックス、アルミニウムベースとセラミックスの両者)を超音波探傷装置により調べたところ、接合欠陥は認められなかった。また、セラミックスについてもクラックは認められなかった。このサンプルに−40℃30分保持、25℃10分、125℃30分保持、25℃10分を1サイクルとするヒートサイクルを3000回与えた。その後、再度セラミックスとアルミニウムの接合界面を超音波探傷装置により調べたところ、セラミックスとフィン付きアルミニウム金属板の接合界面に基板の縁面より10mm程度の剥離が認められた。セラミックスについてはクラックは認められなかった。   Evaluation was performed as follows. First, when the bonded interface between the ceramic and the aluminum after plating (both aluminum circuit and ceramic, both aluminum base and ceramic) was examined with an ultrasonic flaw detector, no bonding defect was found. In addition, no crack was observed in ceramics. The sample was subjected to 3000 heat cycles of -40 ° C. for 30 minutes, 25 ° C. for 10 minutes, 125 ° C. for 30 minutes, and 25 ° C. for 10 minutes. Thereafter, when the interface between the ceramic and the aluminum was examined again with an ultrasonic flaw detector, peeling of about 10 mm from the edge of the substrate was observed at the interface between the ceramic and the aluminum metal plate with fins. No cracks were observed for ceramics.

(比較例5)   (Comparative Example 5)

セラミックス板の厚さが0.635mmで材質が窒化アルミである他は比較例4と同様のものを用いたところ比較例4と同一の効果が得られた。   The same effect as in Comparative Example 4 was obtained when the same material as in Comparative Example 4 was used except that the thickness of the ceramic plate was 0.635 mm and the material was aluminum nitride.

(比較例6)   (Comparative Example 6)

セラミックス板の厚さが0.32mmで材質が窒化硅素である他は比較例4と同様のものを用いたところ比較例4と同一の効果が得られた。   When the same material as in Comparative Example 4 was used except that the thickness of the ceramic plate was 0.32 mm and the material was silicon nitride, the same effect as in Comparative Example 4 was obtained.

なお、上記各例を表1に示す。   The above examples are shown in Table 1.

Figure 2008172197
Figure 2008172197

従来のようにセラミックス回路基板を金属ベース板あるいは複合材上に半田付けするのに比べ、本発明は鉛半田を使用しないことから環境に配慮したPbフリー化を達成し、また、半田による熱伝導の損失すなわち放熱性の劣化がなく、アセンブリ工程上も半田ボイドによる製造上の歩留まりリスクがなくなる。また金属ベース板あるいは複合材を半田付けするアセンブリ行程も廃止することができる。さらに、放熱フィンとの密着に使用する放熱グリースが不要であるため、熱伝導の劣化を防止できる。   Compared to soldering a ceramic circuit board on a metal base plate or a composite material as in the past, the present invention achieves environmentally friendly Pb-free because it does not use lead solder, and heat conduction by solder Loss, that is, heat dissipation is not deteriorated, and there is no risk of manufacturing yield due to solder voids in the assembly process. Also, the assembly process of soldering the metal base plate or the composite material can be eliminated. Furthermore, since no heat dissipating grease is used for close contact with the heat dissipating fins, deterioration of heat conduction can be prevented.

別の従来技術として、窒化アルミニウム等のセラミックス基板に、Al系ろう材を介して回路形成用アルミニウム板と放熱フィンを接合することで、半田に起因する課題は避けることができる。しかしながら、パワーモジュールを実際に運転した場合や、自動車や電車などの車両にパワーモジュールが使用される場合、スイッチングや外的環境変化により加熱・冷却を繰り返し受けることになるが、実際車両などに使用される場合、その加熱・冷却サイクル即ちヒートサイクルが非常に厳しく、セラミックスとアルミニウムの接合界面で剥離が起きたり、セラミックスが破損する場合がある。原因として、セラミックスと接合される金属であるアルミニウムの熱膨張係数差から発生する熱応力のためであることが知られているが、ろう材の影響も大きい。ろう材は通常数〜数100μmの厚さであり、放熱フィンや放熱板のように数mm〜数10mmといった厚さと比べ影響が少ないように思われるが、ろう材層が固くもろく、また変形の0.2耐力が大きいため発生する熱応力が大きいため、接合界面であるろう材層、またはセラミックスそのものが破壊するといった現象がおこる。   As another prior art, a problem caused by solder can be avoided by joining a circuit forming aluminum plate and a heat radiation fin to a ceramic substrate such as aluminum nitride via an Al-based brazing material. However, when the power module is actually driven, or when the power module is used in a vehicle such as an automobile or a train, it is repeatedly heated and cooled due to switching and external environmental changes. In this case, the heating / cooling cycle, that is, the heat cycle is very severe, and peeling may occur at the bonding interface between the ceramic and the aluminum, or the ceramic may be damaged. The cause is known to be due to the thermal stress generated from the difference in thermal expansion coefficient of aluminum, which is a metal to be joined to ceramics, but the influence of the brazing material is also great. The brazing material is usually several to several hundreds of μm thick and seems to have less influence than the thickness of several mm to several tens of mm, like a heat radiating fin or heat radiating plate, but the brazing material layer is hard and brittle. 0.2 Since the heat stress generated due to the high proof stress is large, the brazing filler metal layer, which is the bonding interface, or the ceramic itself is destroyed.

本発明は、ろう材を使用せず、セラミックスとアルミニウムを直接接合し、接合金属の塑性変形を利用し、接合界面に集中する応力を小さくすることを実現した。これにより、ヒートサイクル性がろう材を使用するものに比べ飛躍的にしており、室温→−40℃×30分→室温×10分→+125℃×30分→室温×10分を1サイクルとする条件で3000サイクル後において、接合界面に変化なし、即ち接合界面やセラミックスの破壊がなく、車両用としても使用可能な非常い高い信頼性を持つ、フィン付きアルミニウム−セラミックス接合体を得ることができる。   The present invention has realized that ceramics and aluminum are directly joined without using brazing material, and the stress concentrated on the joining interface is reduced by utilizing plastic deformation of the joining metal. As a result, heat cycle performance is dramatically higher than that using brazing filler metal, and room temperature → −40 ° C × 30 minutes → room temperature × 10 minutes → + 125 ° C × 30 minutes → room temperature × 10 minutes is one cycle. After 3000 cycles, there is no change in the bonding interface, that is, there is no destruction of the bonding interface or ceramics, and a highly reliable finned aluminum-ceramic bonding body that can be used for vehicles can be obtained. .

セラミックスとアルミニウムを直接接合する方法は、溶湯接合法、アルミニウム部材をセラミックス板上に配置し窒素中等不活性ガス中で加熱接合する直接接合法、さらにはAl−Siの共晶接合法等がある。溶湯接合法はアルミニウムの溶湯をセラミックス基板が所定の位置に保持された鋳型に流し込み、セラミックス上をその溶湯を移動させ凝固させ接合する。この方法は、鋳型形状により、さまざまなフィン形状に対応することが簡単にできるという特徴がある。その他の方法は、予め機械加工や鋳造等で所定のフィン形状に加工したアルミニウム部材を、窒素中、真空中で接合することが特徴である。フィンの形状は回路板側に搭載する素子の発熱量に左右されるが、通常、図1に示すような高さ数cm、幅数mm、間隔数mm程度のもので対応できることが多く、上記鋳型、機械加工も比較的簡単にできる。   Methods for directly bonding ceramics and aluminum include a molten metal bonding method, a direct bonding method in which an aluminum member is placed on a ceramic plate and heat bonded in an inert gas such as nitrogen, and an Al-Si eutectic bonding method. . In the molten metal joining method, a molten aluminum is poured into a mold having a ceramic substrate held at a predetermined position, and the molten metal is moved and solidified on the ceramic to be joined. This method is characterized in that it can easily cope with various fin shapes depending on the mold shape. Another method is characterized in that an aluminum member that has been processed into a predetermined fin shape by machining or casting in advance is bonded in nitrogen or in vacuum. The shape of the fin depends on the amount of heat generated by the elements mounted on the circuit board side, but usually it can be handled with a height of several centimeters, a width of several millimeters and a spacing of several millimeters as shown in FIG. Molds and machining can be done relatively easily.

セラミックス基板より大きい形状とすることで、セラミックスよりはみ出した部分を利用し、パワーモジュール作製工程におけるプラスチックパッケージ等の接着部とすることができ、また、冷却時フィン側に圧縮応力がかかる構造となり、耐ヒートサイクル性にも寄与していると思われる。また、モジュールのアセンブリ工程として、加工の基準面として利用でき、半田付け、ワイヤボンディング、パッケジング等のアセンブリ工程に有用である。   By making the shape larger than the ceramic substrate, it can be used as an adhesive part such as a plastic package in the power module manufacturing process using the part that protrudes from the ceramic, and it also has a structure in which compressive stress is applied to the fin side during cooling, It seems to contribute to heat cycle resistance. Further, it can be used as a reference surface for processing as a module assembly process, and is useful for assembly processes such as soldering, wire bonding, and packaging.

また、放熱フィンがセラミックス基板を囲む壁を有することで、その壁を利用し、パワーモジュール作製において、プラスチックパッケージの代わりに絶縁ゲルの容器とすることができ、直接モジュールの構成物として利用できる。   In addition, since the heat radiating fin has a wall surrounding the ceramic substrate, it can be used as a container of an insulating gel instead of a plastic package in manufacturing a power module, and can be directly used as a component of the module.

放熱フィンが端子台を有することで、従来行われている半田付けや接着により金属−セラミックス接合基板をパワーモジュール上に構成する工程を削除することができる。また、上記放熱フィンを銅を含むアルミニウムとすることにより、更に耐食性を向上させることができる。   Since the heat dissipating fin has the terminal block, it is possible to eliminate the step of forming the metal / ceramic bonding substrate on the power module by soldering or bonding which has been conventionally performed. Moreover, corrosion resistance can be further improved by making the said radiation fin into aluminum containing copper.

さらに本発明の構成は、セラミックス基板の一方の面に電子部品搭載用導体を形成し、他方の面にアルミニウムまたはアルミニウム合金からなる水冷ジャケットが直接接合により形成されているアルミニウム−セラミックス接合体である。水冷方式とすることで、更に安定した冷却能力を得ることができ、また水冷ジャケットが銅を含むアルミニウム合金であることが、耐食性の面から好ましい。直接接合方法としては、溶湯接合法であることが、様々な形状に対応可能であること、接合の信頼性が高いことから好ましい。   Furthermore, the structure of the present invention is an aluminum-ceramic bonding body in which an electronic component mounting conductor is formed on one surface of a ceramic substrate, and a water cooling jacket made of aluminum or an aluminum alloy is formed on the other surface by direct bonding. . By adopting the water cooling method, more stable cooling ability can be obtained, and the water cooling jacket is preferably an aluminum alloy containing copper from the viewpoint of corrosion resistance. As the direct bonding method, the molten metal bonding method is preferable because it can cope with various shapes and the bonding reliability is high.

また、セラミックス基板として、熱伝導の面からは窒化アルミニウム、強度の面から窒化珪素、コストの面からアルミナを、目的に応じ使用することが好ましく、また回路設計上複数の基板を搭載することも可能である。   In addition, it is preferable to use aluminum nitride from the viewpoint of heat conduction, silicon nitride from the viewpoint of strength, and alumina from the viewpoint of cost, as the ceramic substrate, depending on the purpose. Is possible.

以上、本発明のアルミニウム−セラミックス接合体を用いることで、放熱性及び耐ヒートサイクル性に優れ、アセンブリコストを抑えたパワーモジュールを提供することができる。   As described above, by using the aluminum-ceramic bonding article of the present invention, it is possible to provide a power module that is excellent in heat dissipation and heat cycle resistance and that suppresses assembly cost.

本発明のアルミニウム−セラミックス接合体の第1の実施例を示す斜視図である。It is a perspective view which shows the 1st Example of the aluminum ceramics joined body of this invention. 本発明のアルミニウム−セラミックス接合体の第2の実施例を示す斜視図である。It is a perspective view which shows the 2nd Example of the aluminum ceramics joined body of this invention. 本発明のアルミニウム−セラミックス接合体の第3の実施例を示す斜視図である。It is a perspective view which shows the 3rd Example of the aluminum-ceramics joined body of this invention. 本発明のアルミニウム−セラミックス接合体の第4の実施例を示す斜視図である。It is a perspective view which shows the 4th Example of the aluminum ceramics joined body of this invention.

符号の説明Explanation of symbols

1 セラミックス板
2 アルミニウム板
3 板
4 ストレートフィン
5 水路
6 アルミニウム板
7 ゴム管
8 開口
9 壁
10 端子台
DESCRIPTION OF SYMBOLS 1 Ceramics board 2 Aluminum board 3 Board 4 Straight fin 5 Water channel 6 Aluminum board 7 Rubber tube 8 Opening 9 Wall 10 Terminal block

Claims (9)

セラミックス基板の一方の面に電子部品搭載用導体が形成され、他方の面にアルミニウムまたはアルミニウム合金からなる放熱フィンが直接接合により形成されていることを特徴とするアルミニウム−セラミックス接合体。   An aluminum / ceramic bonding article, wherein an electronic component mounting conductor is formed on one surface of a ceramic substrate, and a heat radiation fin made of aluminum or an aluminum alloy is formed on the other surface by direct bonding. 上記放熱フィンが上記セラミックス基板より大きい形状であることを特徴とする請求項1記載のアルミニウム−セラミックス接合体。   2. The aluminum / ceramic bonding article according to claim 1, wherein the radiating fin has a shape larger than that of the ceramic substrate. 上記放熱フィンが銅を含むことを特徴とする請求項1または2記載のアルミニウム−セラミックス接合体。   3. The aluminum / ceramic bonding article according to claim 1, wherein the heat radiation fin contains copper. セラミックス基板の一方の面に電子部品搭載用導体が形成され、他方の面にアルミニウムまたはアルミニウム合金からなる水冷ジャケットが直接接合により形成されていることを特徴とするアルミニウム−セラミックス接合体。   An aluminum-ceramic bonding article, wherein an electronic component mounting conductor is formed on one surface of a ceramic substrate, and a water cooling jacket made of aluminum or an aluminum alloy is formed on the other surface by direct bonding. 上記水冷ジャケットが銅を含むことを特徴とする請求項4記載のアルミニウム−セラミックス接合体。   5. The aluminum / ceramic bonding article according to claim 4, wherein the water cooling jacket contains copper. 上記直接接合が溶湯接合法であることを特徴とする請求項1、2、3、4または5記載のアルミニウム−セラミックス接合体。   6. The aluminum / ceramic bonding article according to claim 1, wherein the direct bonding is a molten metal bonding method. 上記セラミックス基板の主成分がアルミナ、窒化アルミ、窒化硅素の一つであることを特徴とする請求項1、2、3、4、5または6記載のアルミニウム−セラミックス接合体。   7. The aluminum / ceramic bonding article according to claim 1, wherein the main component of the ceramic substrate is one of alumina, aluminum nitride, and silicon nitride. 上記セラミックス基板が複数であることを特徴とする請求項1、2、3、4、5、6または7記載のアルミニウム−セラミックス接合体。   8. The aluminum / ceramic bonding article according to claim 1, wherein a plurality of the ceramic substrates are provided. 請求項1〜8の何れか一項に記載のアルミニウム−セラミックス接合体を使用したパワーモジュール。   A power module using the aluminum-ceramic bonded body according to any one of claims 1 to 8.
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