JP2008111741A - Magnetic field distribution measuring apparatus, system, method, and program - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a magnetic field distribution measuring apparatus, a magnetic field distribution measuring system, a magnetic field distribution measuring method and a magnetic field distribution measuring program for quickly and easily measuring a magnetic field strength distribution based on circuit pattern design information. <P>SOLUTION: The magnetic field distribution measuring system 10 of the invention has the magnetic field distribution measuring apparatus 20, a CAD apparatus 30 and a magnetic field probe 40. The magnetic field distribution measuring apparatus 20 has a CPU 21, a RAM 22, a ROM 23, a magnetic field distribution information storing section 24, an input apparatus 25 and a display 26, controls the magnetic field probe 40 based on CAD information (the circuit pattern design information), and measures a magnetic field distribution generated on a circuit board. The CPU 21 implements a process for measuring the magnetic field distribution generated on the circuit board in accordance with the magnetic field distribution measuring program. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to a magnetic field distribution measuring apparatus, a magnetic field distribution measuring system, a magnetic field distribution measuring method, and a magnetic field distribution measuring program for measuring a magnetic field strength distribution around a printed circuit board based on circuit pattern design information.

  With the increasing functionality and speed of signals of various electric and electronic devices, recently, so-called electromagnetic interference (EMI: Electromagnetic Interference, EMI) that electromagnetic waves generated according to the operation of electric and electronic circuits interfere with the operation of other electric and electronic circuits. (Hereinafter referred to as EMI). As factors that determine the intensity of the electromagnetic wave radiated from the electric / electronic device, there are three factors: the intensity of the noise source, the noise propagation path, and the antenna pattern. Among these elements, in particular, measures against noise sources on the circuit board of electric and electronic equipment are important because they lead to a fundamental solution.

  Conventionally, as a technique for investigating this type of noise source, there is a near electromagnetic field measurement system disclosed in Japanese Patent Application Laid-Open No. 2004-198232.

This near electromagnetic field measurement system is a system for measuring a near electromagnetic field distribution generated by a circuit board. In this system, a measurement position information of a device for measuring a near electromagnetic field such as a magnetic field probe and a circuit such as CAD (Computer Aided Design) information. Match the circuit pattern design information of the board, display the measurement result of the near electromagnetic field distribution generated by the circuit board on the circuit pattern design information, and easily identify the noise source on the circuit board It has become.
JP 2004-198232 A

  When measuring a magnetic field distribution on a circuit board using a magnetic field probe, it is necessary to pay attention to the direction of the probe. This is because the amount of magnetic flux penetrating the magnetic field probe changes depending on the direction of the magnetic field probe.

  In the conventional technique for investigating the noise source, the direction of the magnetic field probe cannot be associated with the circuit pattern design information in measuring the distribution of the near electromagnetic field generated by the circuit board. For this reason, in the conventional technique for investigating the noise source, it is necessary to manually point the magnetic field probe in the direction in which the maximum magnetic field strength can be obtained at each measurement position. Therefore, in order to obtain the maximum value of the magnetic field strength, it is necessary to measure by changing the direction of the magnetic field probe omnidirectionally at each measurement position, and the conventional technique for investigating the noise source greatly increases the measurement time. There is a problem.

  The present invention has been made in consideration of the above-described circumstances. A magnetic field distribution measuring device, a magnetic field distribution measuring system, a magnetic field distribution measuring method, and a magnetic field distribution measuring method capable of performing magnetic field strength distribution measurement quickly and easily based on circuit pattern design information. An object is to provide a magnetic field distribution measurement program.

  In order to solve the above-described problems, a magnetic field distribution measuring apparatus according to the present invention extracts design information analyzing means for extracting circuit element and circuit pattern arrangement information on a circuit board based on circuit pattern design information, and the arrangement information. Magnetic field probe control means for controlling the direction of the magnetic field probe in accordance with the magnetic field probe and measuring the magnetic field intensity, wherein the magnetic field probe has a direction in which the magnetic flux penetrating the probe loop is maximized. Is.

  In order to solve the above-described problem, the magnetic field distribution measurement system according to the present invention includes a circuit pattern information storage unit that holds circuit pattern design information, a design information acquisition unit that acquires the circuit pattern design information, Based on circuit pattern design information, design information analysis means for extracting circuit element and circuit pattern arrangement information on a circuit board, a magnetic field probe for measuring magnetic field strength, and controlling the direction of the magnetic field probe according to the arrangement information Magnetic field probe control means, and the direction of the magnetic field probe is such that the magnetic flux penetrating the probe loop is maximized.

  Further, in order to solve the above-described problem, the magnetic field distribution measurement method according to the present invention extracts circuit element and circuit pattern arrangement information on a circuit board based on circuit pattern design information, and according to the arrangement information. The method has a step of controlling the direction of the magnetic field probe and measuring the magnetic field strength, and the direction of the magnetic field probe is a direction in which the magnetic flux passing through the probe loop is maximized.

  According to the magnetic field distribution measuring apparatus, the magnetic field distribution measuring system, the magnetic field distribution measuring method, and the magnetic field distribution measuring program according to the present invention, the magnetic field strength distribution measurement can be performed quickly and easily based on the circuit pattern design information.

  Embodiments of a magnetic field distribution measuring device, a magnetic field distribution measuring system, a magnetic field distribution measuring method, and a magnetic field distribution measuring program according to the present invention will be described with reference to the accompanying drawings.

  FIG. 1 is a schematic overall configuration diagram showing a first embodiment of a magnetic field distribution measurement system according to the present invention.

  The magnetic field distribution measurement system 10 includes a magnetic field distribution measurement device 20, a CAD device 30, and a magnetic field probe 40.

  The magnetic field distribution measuring device 20 includes a CPU 21, a RAM 22, a ROM 23, a magnetic field distribution information storage unit 24, an input device 25, and a display device 26. The magnetic field distribution measuring device 20 controls the magnetic field probe 40 based on CAD information (circuit pattern design information) and measures the magnetic field distribution generated by the circuit board.

  The CPU 21 controls the processing operation of the magnetic field distribution measuring device 20 according to a program stored in the ROM 23. The CPU 21 loads the magnetic field distribution measurement program stored in the ROM 23 and data necessary for executing the program into the RAM 22 and executes a process of measuring the magnetic field distribution generated by the circuit board according to the magnetic field distribution measurement program. .

  The RAM 22 provides a work area for temporarily storing programs executed by the CPU 21 and data.

  The ROM 23 stores a startup program for the magnetic field distribution measurement device 20, a magnetic field distribution measurement program, and various data necessary for executing these programs.

  The ROM 23 has a configuration including a recording medium readable by the CPU 21 such as a magnetic or optical recording medium or a semiconductor memory, and a part or all of the programs and data in the ROM 23 are transmitted via an electronic network. It may be configured to be downloaded.

  The CAD device 30 is a device for designing a circuit pattern of a circuit board, and includes a CAD information storage unit 31 that stores circuit pattern information of a printed board.

  FIG. 2 is an explanatory diagram showing the optimum orientation of the magnetic field probe 40 when measuring the peripheral magnetic field of the wiring on the printed circuit board.

  The magnetic field probe 40 is a general magnetic field probe having a shape with a probe loop. The magnetic field probe 40 detects a time change of magnetic flux passing through the probe loop as an induced voltage. For this reason, for example, when measuring a peripheral magnetic field generated when an alternating current is passed through a wiring on a printed circuit board, the magnetic field intensity detected by the magnetic field probe 40 varies greatly depending on the direction of the magnetic field probe 40 (probe loop). . For example, in order to accurately measure the maximum magnetic field strength generated by wiring, it is necessary to note that the magnetic field strength measurement target wiring and the surface formed by the probe loop need to be parallel as shown in FIG. There is.

  One of the main points of the present invention is to automatically control the magnetic field probe 40 based on the CAD information so as to be in the optimum orientation.

  FIG. 3 is a schematic block diagram showing a configuration example of a function realization unit by the CPU 21 shown in FIG.

  The CPU 21 uses at least a CAD information acquisition unit 21a as a design information acquisition unit, a display control unit 21b, a region of interest setting unit 21c, a CAD information analysis unit 21d as a design information analysis unit, and a magnetic field probe control unit 21e according to a magnetic field distribution measurement program. It functions as an unmeasured object determination unit 21f, a maximum magnetic field strength calculation unit 21g, and an unmeasured region determination unit 21h. Each of the units 21a to 21h uses a required work area of the RAM 22 as a temporary storage location for data.

  Next, each part 21a-21h of CPU21 is demonstrated.

  The CAD information acquisition unit 21 a has a function of acquiring printed circuit board design information from the CAD information storage unit 31 of the CAD device 30.

  The display control unit 21b has a function of displaying the circuit elements and circuit patterns of the printed circuit board on the display device 26 based on the design information of the printed circuit board. In addition, the display control unit 21b reads information on the maximum magnetic field strength and measurement position coordinates in the attention area described below from the magnetic field distribution information storage unit 24, and causes the display device 26 to display information on the maximum magnetic field strength.

  The attention area setting unit 21c receives the attention area size in the scanning area instructed by the user through an input unit such as a keyboard or a mouse, and based on the information of the scanning area, the positions of a plurality of attention areas in the scanning area ( (Coordinates) is set. The magnetic field distribution measurement system 10 according to the present invention performs magnetic field distribution measurement for each region of interest.

  Based on the design information of the printed circuit board, the CAD information analysis unit 21d includes the arrangement information (including at least the coordinates and the type of the object) of the measurement object (wiring or the like) in the region of interest to which the magnetic field probe 40 currently belongs. Has a function to extract.

  The magnetic field probe control unit 21e has a function of moving the magnetic field probe 40 to a required position. The magnetic field probe control unit 21e has a function of determining the direction of the magnetic field probe 40 based on the design information of the printed circuit board. Further, the magnetic field probe control unit 21e has a function of measuring the magnetic field strength at the measurement position by performing signal processing on the voltage induced at both ends of the probe loop of the magnetic field probe 40 with a spectrum analyzer.

  The unmeasured object determination unit 21f has a function of determining whether or not there is an unmeasured measurement object in the attention area.

  The maximum magnetic field strength calculating unit 21g has a function of obtaining the maximum magnetic field strength in the target region based on the magnetic field strength measurement result at one or a plurality of locations in the target region stored in the required work area of the RAM 22. The maximum magnetic field strength calculation unit 21g has a function of associating the maximum magnetic field strength in the region of interest with the measurement position coordinates and storing them in the magnetic field distribution information storage unit 24.

  The unmeasured area determination unit 21h has a function of determining whether or not there is an unmeasured attention area in the scanning area.

  Next, the operation of the magnetic field distribution measurement system 10 will be described.

  FIG. 4 shows a magnetic field distribution measurement system 10 shown in FIG. 1 that can quickly and easily generate a magnetic field based on printed circuit board design (CAD shape) information (circuit pattern design information) stored in the CAD information storage unit 31 of the CAD apparatus 30. It is a flowchart which shows the procedure at the time of performing intensity distribution measurement. In FIG. 3, a symbol with a number added to S indicates each step of the flowchart.

  First, in step S <b> 1, the CAD information acquisition unit 21 a acquires printed circuit board design information such as circuit elements (elements) and circuit patterns (printed circuit board wiring) from the CAD information storage unit 31 of the CAD device 30.

  Next, in step S2, the display control unit 21b displays the circuit elements and circuit patterns of the printed circuit board on the display device 26 based on the design information of the printed circuit board.

  Next, in step S3, the user notifies the magnetic field distribution measurement system 10 of the current position of the magnetic field probe 40 as an initial setting position. For example, the magnetic field probe 40 is actually moved to a position away from the printed board by an appropriate distance in the direction perpendicular to the board surface, and the position (coordinates) of the magnetic field probe 40 at this time is set as an initial setting position.

  The adjustment of the initial setting position is performed in order to associate the position (coordinates) of the magnetic field probe 40 with the position (coordinates) on the printed board in a one-to-one relationship. If the mutual positional relationship corresponds to one-to-one in advance, this adjustment is not necessary.

  Next, in step S4, the user sets a scanning area on the printed circuit board via input means such as a keyboard and a mouse. The magnetic field distribution measurement system 10 performs magnetic field distribution measurement within the scanning region. The scanning area information set by the user may be stored in a required work area of the RAM 22.

  Next, in step S5, the attention area setting unit 21c receives the attention area size in the scanning area instructed by the user via an input unit such as a keyboard or a mouse, and based on the information of the scanning area, Set the position (coordinates) of multiple regions of interest. The magnetic field distribution measurement system 10 performs magnetic field distribution measurement for each region of interest. Note that this attention area may be set in advance.

  Next, in step S6, the CAD information analysis unit 21d, based on the design information of the printed circuit board, arranges information (at least coordinates and objects) of the measurement object (wiring, etc.) in the attention area to which the magnetic field probe 40 currently belongs. (Including the type of object).

  Next, in step S <b> 7, the magnetic field probe control unit 21 e moves the magnetic field probe 40 to a position (hereinafter referred to as a measurement position) that is away from the printed circuit board on the measurement target by a predetermined position. This measurement position is preferably directly above (directly above) the object relative to the substrate surface in order to measure the maximum value of the magnetic field generated by the object. Further, the measurement position is more preferably a position that is directly above the vicinity of the center of the measurement object in the region of interest. For example, when the measurement object is a wiring and the wiring crosses the region of interest, the measurement position may be directly above the midpoint of the line segment cut at the end of the region of interest. At this position, the magnetic field intensity is measured.

  Next, in step S8, the magnetic field probe control unit 21e determines the orientation of the magnetic field probe 40 based on the design information of the printed circuit board. For example, when the measurement object is a wiring, the orientation of the magnetic field probe 40 is determined so that the wiring and the magnetic field probe 40 have the positional relationship shown in FIG.

  Next, in step S9, the magnetic field probe control unit 21e measures the magnetic field strength at the measurement position by performing signal processing on the voltage induced at both ends of the probe loop of the magnetic field probe 40 using a spectrum analyzer. This magnetic field strength is stored in a required work area of the RAM 22 in association with the measurement position coordinates.

  Next, in step S10, the unmeasured object determination unit 21f determines whether or not there is an unmeasured measurement object in the region of interest. If there is, return to step S7. If not, the process proceeds to step S11.

  Next, in step S11, the maximum magnetic field strength calculation unit 21g has one (one measurement object) or plural (multiple measurement objects) magnetic fields in this attention area stored in the required work area of the RAM 22. Based on the strength measurement result, the maximum magnetic field strength in this region of interest is obtained. Further, the maximum magnetic field strength calculation unit 21g associates the maximum magnetic field strength in the region of interest with the measurement position coordinates and stores them in the magnetic field distribution information storage unit 24. Then, the maximum magnetic field strength calculating unit 21g notifies the display control device 21b and the unmeasured region determining unit 21h that the measurement in the region of interest has been completed.

  Next, in step S <b> 12, the display control unit 21 b reads out information on the maximum magnetic field strength and measurement position coordinates in the region of interest from the magnetic field distribution information storage unit 24 and causes the display device 26 to display information on the maximum magnetic field strength. The information on the maximum magnetic field strength may be displayed so as to be superimposed on the wiring of the printed circuit board, or may be displayed on a separate screen (a different display device 26, another window on the same display device 26, etc.). You may make it display.

  Next, in step S13, the unmeasured region determination unit 21h determines whether or not there is an unmeasured region of interest in the scanning region. If there is an unmeasured region of interest, the process returns to step S6. On the other hand, if not, the series of magnetic field strength distribution measurement procedures is completed.

  With the above procedure, the magnetic field strength distribution measurement can be performed quickly and easily based on the printed circuit board design (CAD shape) information (circuit pattern design information) stored in the CAD information storage unit 31 of the CAD device 30.

  The magnetic field distribution measurement system 10 shown in FIG. 1 automatically sets the direction of the magnetic field probe 40 based on printed circuit board design (CAD shape) information (circuit pattern design information) stored in the CAD information storage unit 31 of the CAD device 30. To decide. For this reason, the trouble of searching for the maximum direction by performing the measurement while changing the direction of the magnetic field probe 40 at the measurement position can be omitted. Therefore, according to the magnetic field distribution measurement system 10 according to the present embodiment, the distribution measurement of the magnetic field strength generated by the printed circuit board can be performed quickly and efficiently.

  In addition, the magnetic field distribution measurement system 10 according to the present embodiment sets a scanning region, further sets a region of interest, determines a measurement position immediately above a measurement object belonging to the region of interest, and then selects a magnetic field probe. 40 orientations are automatically determined. Therefore, the magnetic field distribution measurement system 10 can accurately and easily measure the magnetic field strength distribution generated by the printed circuit board.

  Next, a second embodiment of the magnetic field distribution measurement system according to the present invention will be described.

  FIG. 5 is a schematic block diagram showing a configuration example of a function realization unit by the CPU 21 in the second embodiment of the magnetic field distribution measurement system according to the present invention.

  The magnetic field distribution measurement system 10A shown in the second embodiment is different from the first embodiment in that the scanning target of the magnetic field probe 40 is a single wiring. In the magnetic field distribution measurement system 10A according to the present embodiment, the configuration of the function realization unit by the CPU 21 is the magnetic field distribution measurement system 10 shown in FIG. Since other configurations and operations are not substantially different from the magnetic field distribution measurement system 10 shown in FIG. 1, the same components are denoted by the same reference numerals and description thereof is omitted.

  It is also important to perform measurement over a wide area of the printed circuit board at a stage where the problem location where the magnetic field on the printed circuit board is strongly generated is not known. However, it may be important to select one wiring to be measured and measure the magnetic field strength distribution from the start point to the end point for this wiring. As such a case, for example, when a problem part is roughly identified, a wiring that crosses the problem part is measured, or a specific wiring that performs high-speed communication is measured. In any case, the possibility of clarifying the phenomenon increases by designating only a specific wiring as a measurement target.

  In this case, based on the printed circuit board design information, the direction of the magnetic field probe 40 is automatically set to the optimum direction along the wiring for the measurement target wiring selected by the user, and the magnetic field strength is measured at an appropriate distance. That's fine.

  As shown in FIG. 5, the CPU 21 executes at least a CAD information acquisition unit 21a, a display control unit 21b, a CAD information analysis unit 21d, a magnetic field probe control unit 21e, a maximum magnetic field strength calculation unit 21g, and an end point determination unit according to a magnetic field distribution measurement program. 21i and the unmeasured wiring determination unit 21j.

  The end point determination unit 21i has a function of determining whether the measurement position is the end point of the measurement target wiring. In this determination, when the distance between the measurement position and the end point is shorter than a preset measurement interval (distance), it is considered that the end point is assumed.

  The unmeasured wiring determination unit 21j has a function of determining whether or not there is an unmeasured selected wiring.

  Next, the operation of the magnetic field distribution measurement system 10A will be described.

  FIG. 6 shows that the magnetic field distribution measurement system 10A according to the second embodiment is fast and easy based on printed circuit board design (CAD shape) information (circuit pattern design information) stored in the CAD information storage unit 31 of the CAD device 30. FIG. 6 is a flowchart showing a procedure for measuring the magnetic field strength distribution, and reference numerals with numerals in S in the figure indicate steps of the flowchart. Moreover, the same code | symbol is attached | subjected to the step equivalent to FIG. 3, and the overlapping description is abbreviate | omitted.

  This procedure starts after a measurement interval (distance) is set in advance. This setting is performed, for example, by storing what is set by the user via the input means in a required work area of the RAM.

  In step S <b> 21, the user designates a measurement target wiring on the printed board via an input unit such as a keyboard or a mouse. This wiring designation may be a plurality of designations. The magnetic field distribution measurement system 10A performs magnetic field distribution measurement on the measurement target wiring. Information on the measurement target wiring set by the user may be stored in a required work area of the RAM 22.

  Next, in step S22, the CAD information analysis unit 21d extracts the arrangement information (including at least the coordinates and the type of the object) of the measurement target wiring based on the design information of the printed circuit board.

  Next, in step S23, the magnetic field probe control unit 21e moves the magnetic field probe 40 to the measurement position immediately above the measurement target wiring. This measurement position is one of the end points of the measurement target wiring. From this end point to the other end point (hereinafter referred to as end point), the magnetic field strength is measured at a preset measurement interval (distance).

  In step S24, the maximum magnetic field strength calculation unit 21g associates the magnetic field strength measurement result at the measurement position stored in the required work area of the RAM 22 with the measurement position coordinates, and causes the magnetic field distribution information storage unit 24 to store them. . Then, the maximum magnetic field strength calculating unit 21g notifies the display control device 21b and the unmeasured region determining unit 21h that the measurement in the region of interest has been completed.

  Next, in step S25, the display control unit 21b reads the magnetic field strength measurement result and the measurement position coordinate information at the measurement position from the magnetic field distribution information storage unit 24, and the magnetic field strength information at the measurement position is read on the display device 26. Is displayed. The information on the maximum magnetic field strength may be displayed so as to be superimposed on the wiring of the printed circuit board, or may be displayed on a separate screen (a different display device 26, another window on the same display device 26, etc.). You may make it display.

  Next, in step S26, the end point determination unit 21i determines whether the measurement position is the end point of the measurement target wiring. If it is not the end point, the process proceeds to step S27. On the other hand, if it is the end point, the process proceeds to step S28.

  Next, in step S27, the magnetic field probe control unit 21e moves the magnetic field probe 40 from the measurement position toward the end point along the wiring by a preset measurement interval (distance), and returns to step S8.

  On the other hand, in step S28, the unmeasured wiring determination unit 21j determines whether there is an unmeasured selected wiring. If there is an unmeasured wiring, the process returns to step S22. On the other hand, if not, the series of magnetic field strength distribution measurement procedures is terminated.

  The magnetic field distribution measurement system 10A according to the present embodiment has the same operational effects as the magnetic field distribution measurement system shown in the first embodiment. In addition, the magnetic field distribution measurement system 10A according to the present embodiment selects one measurement target wiring and measures the magnetic field strength distribution from the start point to the end point for this wiring. Therefore, according to the magnetic field distribution measurement system 10A according to the present embodiment, more information necessary for clarifying the cause of the magnetic field distribution on the printed circuit board can be acquired, and the noise source can be easily identified. Its industrial value is very high.

1 is a schematic overall configuration diagram showing a first embodiment of a magnetic field distribution measurement system 10 according to the present invention. Explanatory drawing which shows the optimal direction of the magnetic field probe 40 in the case of measuring the peripheral magnetic field of the wiring on a printed circuit board. FIG. 2 is a schematic block diagram showing a configuration example of a function realization unit by a CPU 21 shown in FIG. 1. With the magnetic field distribution measurement system 10 shown in FIG. 1, magnetic field strength distribution measurement can be performed quickly and easily based on printed circuit board design (CAD shape) information (circuit pattern design information) stored in the CAD information storage unit 31 of the CAD device 30. The flowchart which shows the procedure at the time of performing. The schematic block diagram which shows the structural example of the function implementation part by CPU21 in 2nd Embodiment of the magnetic field distribution measurement system which concerns on this invention. The magnetic field distribution measurement system 10A according to the second embodiment enables high-speed and easy magnetic field strength distribution based on printed circuit board design (CAD shape) information (circuit pattern design information) stored in the CAD information storage unit 31 of the CAD device 30. The flowchart which shows the procedure at the time of measuring.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 Magnetic field distribution measuring system 20 Magnetic field distribution measuring apparatus 21 CPU
21a CAD information acquisition unit 21b Display control unit 21c Attention area setting unit 21d CAD information analysis unit 21e Magnetic field probe control unit 21f Unmeasured object determination unit 21g Maximum magnetic field strength calculation unit 21h Unmeasured region determination unit 21i End point determination unit 21j Unmeasured Wiring determination unit 22 RAM
23 ROM
24 Magnetic field distribution information storage unit 25 Input device 26 Display device 30 CAD device 31 CAD information storage unit 40 Magnetic field probe

Claims (10)

A design information analyzing means for extracting circuit element and circuit pattern arrangement information on the circuit board based on the circuit pattern design information;
Magnetic field probe control means for controlling the direction of the magnetic field probe according to the arrangement information and measuring the magnetic field strength;
With
The magnetic field distribution measuring apparatus according to claim 1, wherein the magnetic field probe has a direction in which a magnetic flux penetrating the probe loop is maximized. Attention area setting means for setting an attention area obtained by dividing the area to be measured by the magnetic field probe control means into a plurality of areas;
A maximum magnetic field strength calculating means for calculating a maximum magnetic field strength within the region of interest;
The magnetic field probe according to claim 1, wherein the magnetic field probe control means is configured to control the movement and direction of the magnetic field probe according to the arrangement information of the circuit element and the circuit pattern in the region of interest, and to measure the magnetic field strength. Distribution measuring device. A magnetic field distribution information storage unit that stores the maximum magnetic field strength and the measurement position at which the maximum magnetic field strength is measured in association with each of the plurality of regions of interest divided,
3. A display control means for reading out the maximum magnetic field strength and information on a measurement position where the maximum magnetic field strength is measured from the magnetic field distribution information storage unit, and displaying information on the maximum magnetic field strength distribution on a display device. Magnetic field distribution measuring device. The magnetic field distribution measuring apparatus according to claim 1, wherein the magnetic field probe control unit is configured to control the movement and direction of the magnetic field probe along a specific wiring and measure the magnetic field strength. Circuit pattern information storage means for holding circuit pattern design information;
Design information acquisition means for acquiring the circuit pattern design information;
Based on the circuit pattern design information, design information analyzing means for extracting circuit element and circuit pattern arrangement information on the circuit board;
A magnetic field probe for measuring magnetic field strength;
Magnetic field probe control means for controlling the orientation of the magnetic field probe according to the arrangement information;
With
The magnetic field distribution measuring system according to claim 1, wherein the magnetic field probe is oriented so that the magnetic flux penetrating the probe loop is maximized. Based on the circuit pattern design information, extract circuit element and circuit pattern layout information on the circuit board,
Control the direction of the magnetic field probe according to the arrangement information,
Measure magnetic field strength,
Has steps,
The magnetic field distribution measuring method according to claim 1, wherein the magnetic field probe is oriented so that the magnetic flux penetrating the probe loop is maximized. Setting a region of interest by dividing the region to be measured for the magnetic field strength into a plurality of regions;
Calculating a maximum magnetic field strength within the region of interest;
Further comprising
The magnetic field distribution measurement method according to claim 6, wherein the step of controlling the direction of the magnetic field probe is a step of controlling the movement and direction of the magnetic field probe according to arrangement information of the circuit elements and circuit patterns in the region of interest. For each of the regions of interest divided into a plurality, the step of storing the maximum magnetic field strength in association with the measurement position at which the maximum magnetic field strength was measured;
8. The magnetic field distribution according to claim 7, further comprising the step of reading out information on the maximum magnetic field strength and a measurement position where the maximum magnetic field strength is measured from the magnetic field distribution information storage unit and displaying information on the maximum magnetic field strength distribution on a display device. Measuring method. The magnetic field distribution measuring method according to claim 6, wherein the step of controlling the direction of the magnetic field probe is a step of controlling the movement and direction of the magnetic field probe along a specific wiring. Computer
6. A magnetic field distribution measurement program that functions as circuit pattern information storage means, design information acquisition means, design information analysis means, and magnetic field probe control means according to claim 5.

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