JP2008026260A - Chip parts jig for four-terminal measurement - Google Patents

Chip parts jig for four-terminal measurement Download PDF

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JP2008026260A
JP2008026260A JP2006202032A JP2006202032A JP2008026260A JP 2008026260 A JP2008026260 A JP 2008026260A JP 2006202032 A JP2006202032 A JP 2006202032A JP 2006202032 A JP2006202032 A JP 2006202032A JP 2008026260 A JP2008026260 A JP 2008026260A
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contact
terminal block
side terminal
chip component
electrode
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Kazuhiko Tomiyama
和彦 富山
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Hioki EE Corp
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Hioki EE Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide chip parts jig for four-terminal measurement which reliably can measure bottom electrode type microchip parts by accurizing through four-terminal measurement method, while flexibly responding to even any chip part with differently sized area. <P>SOLUTION: This chip parts jig at least comprises one side terminal block 12 equipped with two contact terminals to separately be in contact with one electrode side in a pair of electrodes provided on bottom side of the chip, another side terminal block 32 equipped with two contact terminals to separately be in contact with another electrode side, and base 52 freely supporting mutual contact/release and positional fixation of these one side terminal block 12 and another side terminal block 32 so as to fit them in plane size of the chip. The above base 52 keeps a thrusting member 69 arranged which allows one electrode to contact with each contact terminal of the one side terminal block 12 and the other electrode with each contact terminal of the other side terminal block 32 to fix the chip. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、下面に電極を備える微小なチップ部品の電気的な特性を四端子測定法により測定することができるほか、サイズを異にするチップ部品にも柔軟に対応させつつ、電気的な接触も確実に確保させた状態のもとで位置固定することができる四端子測定用チップ部品治具に関する技術である。   In addition to being able to measure the electrical characteristics of a minute chip component having electrodes on the bottom surface by a four-terminal measurement method, the present invention can flexibly accommodate chip components of different sizes while making electrical contact. This is a technique related to a chip component jig for four-terminal measurement that can be fixed in a fixed position.

図7は、下記特許文献1に開示されているチップ部品測定用治具の全体斜視図であり、チップ部品測定用治具1の全体は、測定されるべきチップ部品が水平な下面側に備える一対の電極と個別に接触する各接触端子5,5を表出させてなる定置台部3を固定した筐体などからなる基台2と、該基台2上に配設されて接触端子5,5に電極を各別に接触させた状態のもとで定置台部3との間でチップ部品を位置固定する保持機構6とで構成されている。
特開2004−138546号公報
FIG. 7 is an overall perspective view of the chip component measurement jig disclosed in Patent Document 1 below, and the entire chip component measurement jig 1 includes a chip component to be measured on a horizontal lower surface side. A base 2 composed of a housing or the like to which a stationary base portion 3 formed by exposing the contact terminals 5 and 5 that individually contact a pair of electrodes is fixed, and the contact terminals 5 disposed on the base 2. , 5 and a holding mechanism 6 for fixing the position of the chip component with the stationary base 3 under the state where the electrodes are in contact with each other.
JP 2004-138546 A

この場合、定置台部3は、基台2側にねじ止めして固定配置される絶縁性の台本体部4と、該台本体部4の略中央部にチップ部品の大きさとの関係で定まる縦横幅が付与された凹部4aと、該凹部4a上の適宜位置に平面視が略三角形状を呈し、かつ、それぞれの頂角部側を対向させて隣接配置された導電性の一対の接触端子5,5とを備えて形成されている。   In this case, the stationary base 3 is determined by the relationship between the insulating base body 4 fixedly screwed to the base 2 side and the size of the chip component at the substantially central portion of the base body 4. A concave portion 4a having vertical and horizontal widths, and a pair of conductive contact terminals that are arranged in an approximate position at an appropriate position on the concave portion 4a and are arranged adjacent to each other with their apex portions facing each other. 5 and 5.

一方、保持機構6は、基台1上に位置固定を自在に配設される支台部7と、該支台部7上にその雄ねじ側を突出させて直立配置されるボルト軸部8と、該ボルト軸部8にその長さ方向を直交させ、かつ、上昇方向への付勢力を伴って遊挿される昇降腕部9と、付勢力に抗した昇降腕部9の押し下げを自在にボルト軸部8に螺着されるナット部8aと、昇降腕部9を回動停止させるストッパー9aとで形成されている。   On the other hand, the holding mechanism 6 includes an abutment portion 7 that can be freely fixed in position on the base 1, and a bolt shaft portion 8 that is arranged upright with the male screw side protruding on the abutment portion 7. The bolt shaft portion 8 has its longitudinal direction perpendicular to the bolt shaft portion 8 and is freely inserted with an urging force in the upward direction, and a bolt that can freely push down the lifting arm portion 9 against the urging force. It is formed by a nut portion 8a screwed to the shaft portion 8 and a stopper 9a for stopping the lifting arm portion 9 from rotating.

このため、測定時には、昇降腕部9の先端側に垂設された圧接部の押圧力によりその位置が固定された状態のもとで定置台部3上にチップ部品を定置することができることになる。   For this reason, at the time of measurement, it is possible to place the chip component on the stationary base 3 under a state where the position is fixed by the pressing force of the pressure contact portion suspended from the distal end side of the lifting arm portion 9. Become.

しかし、図7に示すチップ部品測定用治具1による場合には、下面に電極を備えるチップ部品を二端子測定法により測定することはできるものの、より測定精度が高い四端子測定法による測定には対応させることができない不都合があった。   However, in the case of using the chip component measuring jig 1 shown in FIG. 7, a chip component having electrodes on the lower surface can be measured by the two-terminal measurement method, but the measurement by the four-terminal measurement method with higher measurement accuracy is possible. There was an inconvenience that could not be dealt with.

また、図7に示すチップ部品測定用治具1による場合には、面サイズを同じくする同一のチップ部品に限定され、面サイズを異にするチップ部品には柔軟に適用させることができないという不具合もあった。   Further, in the case of using the chip part measuring jig 1 shown in FIG. 7, it is limited to the same chip part having the same surface size, and cannot be flexibly applied to chip parts having different surface sizes. There was also.

本発明は、従来例にみられた上記課題に鑑み、下面電極タイプの微小なチップ部品の電気的な特性を四端子測定法により精度を高めて確実に測定することができるほか、サイズを異にするチップ部品であっても柔軟に対応させることもできる四端子測定用チップ部品治具を提供することを目的とする。   In view of the above-mentioned problems seen in the conventional example, the present invention can measure the electrical characteristics of a small chip component of the bottom electrode type with a high accuracy by a four-terminal measurement method, and can also vary the size. It is an object of the present invention to provide a chip component jig for four-terminal measurement that can be flexibly adapted even to a chip component to be made.

本発明は、上記目的を達成すべくなされたものであり、測定対象試料としてのチップ部品が下面側に相互に向き合った位置関係のもとで備える一対の電極における一方の前記電極側に各別に接触させる2本の接触端子を具備させた一側端子台と、他方の前記電極側に各別に接触させる2本の接触端子を具備させた他側端子台と、これら一側端子台と他側端子台とを前記チップ部品の下面サイズに対応させるべく相互の接離とその位置固定とを自在に支持する基台とを少なくとも備え、該基台には、前記一側端子台の各接触端子にチップ部品の一方の前記電極を、前記他側端子台の各接触端子にチップ部品の他方の前記電極をそれぞれ接触させて前記チップ部品を定置する押当て部材を配設したことを最も主要な特徴とする。   The present invention has been made to achieve the above-mentioned object, and each of the electrode parts in a pair of electrodes provided under a positional relationship in which chip parts as measurement target samples face each other on the lower surface side is separately provided. One side terminal block provided with two contact terminals to be contacted, the other side terminal block provided with two contact terminals respectively brought into contact with the other electrode side, and the one side terminal block and the other side And at least a base for freely supporting and fixing the position of the terminal block so as to correspond to the size of the lower surface of the chip component, and the base includes each contact terminal of the one-side terminal block. The most important thing is that one of the electrodes of the chip component is disposed, and the pressing member for placing the chip component is arranged by bringing the other electrode of the chip component into contact with each contact terminal of the other terminal block. Features.

この場合、それぞれの前記接触端子における少なくとも各接触端部側は、前記押当て部材を介して前記チップ部品が押し付けられた際に撓む可撓性が付与されて前記一側端子台と前記他側端子台とに各別に配設させておくのが好ましい。   In this case, at least each contact end portion side of each contact terminal is provided with flexibility to bend when the chip component is pressed through the pressing member, so that the one-side terminal block and the other are provided. It is preferable to arrange each separately on the side terminal block.

請求項1に係る発明によれば、2本の接触端子を具備させた一側端子台と、2本の接触端子を具備させた他側端子台とを、チップ部品のサイズに対応させるべく相互の接離とその位置固定とを自在に基台側に支持させてあるので、下面電極タイプの微小なチップ部品の電気的な特性をそのサイズの大小によく対応させながら四端子測定法により精度を高めて確実に測定することができる。   According to the first aspect of the present invention, the one side terminal block provided with two contact terminals and the other side terminal block provided with two contact terminals are mutually connected to correspond to the size of the chip component. Since the contact and separation of the electrode and its position fixing are supported on the base side freely, the accuracy of the four-terminal measurement method is achieved while making the electrical characteristics of the small chip parts of the bottom electrode type well correspond to the size of the chip. Can be measured reliably.

また、請求項2に係る発明によれば、計4本の接触端子における各接触端部側には、押し当て部材を介してチップ部品が押し付けられた際に下方に撓む可撓性が付与されているので、各接触端のすべての位置を同一平面上に強制的に位置させることで、より確実な接触関係を確保して精度の高い四端子測定を行うことができる。   According to the invention of claim 2, the flexibility of bending downward when the chip component is pressed through the pressing member is imparted to each contact end side of the total of four contact terminals. Therefore, by forcibly positioning all the positions of each contact end on the same plane, a more reliable contact relationship can be ensured and highly accurate four-terminal measurement can be performed.

図1は、本発明の一例を押当て部材の一部を省略して示す全体斜視図であり、図2は、図1におけるA−A線矢視方向での断面構造をチップ部品を定置した状態のもとで拡大して示す説明図である。また、図3は、本発明を構成している一側端子台の外観形状を示す斜視図であり、図4は、図3におけるB−B線矢視方向での断面図である。なお、図1における楕円形状の囲繞領域は、四端子測定法による測定領域を示す。   FIG. 1 is an overall perspective view showing an example of the present invention with a part of a pressing member omitted, and FIG. 2 is a cross-sectional view taken along line AA in FIG. It is explanatory drawing expanded and shown under a state. FIG. 3 is a perspective view showing the external shape of the one-side terminal block constituting the present invention, and FIG. 4 is a cross-sectional view in the direction of arrows BB in FIG. In addition, the oval-shaped surrounding area | region in FIG. 1 shows the measurement area | region by a 4-terminal measuring method.

これらの図によれば、四端子測定用チップ部品治具11の全体は、測定対象試料としてのチップ部品71がその下面側に例えば図6に明示されているように相互に向き合った位置関係のもとで備える一対の電極72,73における一方の電極72側に各別に接触させる2本の接触端子20,23を具備させた一側端子台12と、他方の電極73側に各別に接触させる2本の接触端子40,43を具備させた他側端子台32と、これら一側端子台12と他側端子台32とをチップ部品71の下面サイズの大小に対応させるべく相互の接離とその位置固定とを自在に支持する基台52とを少なくとも備えて構成されている。なお、図中の符号19は、アルミ板を備える下カバーを示し、例えば一側端子台12や台本体部13を左右方向に開いた際などに内部に意図しないごみが入り込むのを防止することができるようになっている。   According to these drawings, the whole of the four-terminal measuring chip component jig 11 has a positional relationship in which the chip component 71 as a measurement target sample faces each other as clearly shown in FIG. One side terminal block 12 provided with two contact terminals 20 and 23 to be brought into contact with one electrode 72 side of the pair of electrodes 72 and 73 originally provided, and the other electrode 73 side is brought into contact with each other. The other side terminal block 32 provided with the two contact terminals 40 and 43, and the one side terminal block 12 and the other side terminal block 32 are connected to and separated from each other so as to correspond to the size of the lower surface size of the chip component 71. At least a base 52 that freely supports the fixing of the position is provided. In addition, the code | symbol 19 in a figure shows the lower cover provided with an aluminum plate, for example, when opening the one side terminal block 12 or the base main-body part 13 in the left-right direction etc., preventing that an unintended garbage enters inside. Can be done.

このうち、一側端子台12を構成している略直方体形状を呈する台本体部13は、図3および図4からも明らかなように、その前端部側に位置する下側部を略L字状に削除して前面側と下底面側とを開口させた隔室部14が形成されており、該隔室部14を介して2本の接触端子20,23を配設することができるようになっている。   Among these, the base body 13 having a substantially rectangular parallelepiped shape constituting the one-side terminal base 12 has a substantially L-shaped lower side located on the front end side, as is apparent from FIGS. 3 and 4. A compartment portion 14 is formed in which the front side and the lower bottom side are opened by removing the shape, and the two contact terminals 20 and 23 can be disposed through the compartment portion 14. It has become.

また、板状を呈する2本の接触端子20,23は、それぞれの開放端側をチップ部品71の一方の電極72への接触端21,24とする直立片部20a,23aと、これら直立片部20a,23aの終端側から水平方向に延設された水平片部20b,23bと、これら水平片部20b,23bの終端側から垂設された垂下片部20c,23cとで形成されている。   Further, the two contact terminals 20 and 23 each having a plate shape include upright pieces 20a and 23a each having an open end side as a contact end 21 and 24 to one electrode 72 of the chip component 71, and these upright pieces. The horizontal piece portions 20b and 23b extending in the horizontal direction from the end sides of the portions 20a and 23a and the hanging piece portions 20c and 23c extending from the end sides of the horizontal piece portions 20b and 23b are formed. .

この場合、2本の接触端子20,23は、接触端子20の水平片部20b側を上方に、接触端子23の水平片部23b側を下方にそれぞれ配置するとともに、これら水平片部20b,23b相互間にスペーサ材26を介在させた上で一体的に連結して組み合わされており、これにより接触端子23の接触端24側が前列に、接触端子20の接触端21側が後列に配置されることになる。   In this case, the two contact terminals 20 and 23 are arranged such that the horizontal piece portion 20b side of the contact terminal 20 is arranged upward and the horizontal piece portion 23b side of the contact terminal 23 is arranged downward, and the horizontal piece portions 20b and 23b are arranged. The spacer members 26 are interposed and connected together so that the contact end 24 side of the contact terminal 23 is arranged in the front row, and the contact end 21 side of the contact terminal 20 is arranged in the back row. become.

これを図示例に基づきより詳しく説明すれば、接触端子20,23における水平片部20b,23bとスペーサ材26とには、その組み合わせ時に相互が対面合致する部位にボルト材29を挿通させるための通孔22,25,27が穿設されている。   This will be described in more detail with reference to the illustrated example. For the horizontal pieces 20b and 23b and the spacer material 26 in the contact terminals 20 and 23, the bolt material 29 is inserted into a portion where the two face to face each other at the time of combination. Through holes 22, 25, and 27 are formed.

また、台本体部13にあって隔室部14の天井としての役割を担っている表出面14a側の所定位置には、スペーサ材26を介して一体的に組み合わされている接触端子20,23をボルト材29を介して位置固定するための雌ねじ部15が形成されており、該雌ねじ部15にボルト材29を螺着させることで接触端子20,23側を台本体部13側に取り付けることができるようになっている。   In addition, contact terminals 20 and 23 that are integrally combined via a spacer material 26 at a predetermined position on the side of the exposed surface 14 a that serves as the ceiling of the compartment 14 in the base body 13. Is formed with a female screw portion 15 for fixing the position of the screw through the bolt material 29, and the bolt material 29 is screwed to the female screw portion 15 to attach the contact terminals 20, 23 side to the base body portion 13 side. Can be done.

この場合、台本体部13の前端上角側の中央部に位置する領域には、チップ部品71が一方の電極72側を介して載置される定置部16が形成されており、該定置部16を介して接触端子20の接触端21と接触端子23の接触端24とを一方の電極72に同時接触させるために表出配置することができることになる。   In this case, a stationary part 16 on which the chip component 71 is placed via the one electrode 72 side is formed in a region located in the central part on the upper corner side of the front end of the base body part 13. 16, the contact end 21 of the contact terminal 20 and the contact end 24 of the contact terminal 23 can be exposed and arranged at the same time with one electrode 72.

しかも、台本体部13は、接触端子20の直立片部20aと水平片部20bとの境界部位である内側角部と対面する角部に切除部17が形成されており、該切除部17により直立片部20aと水平片部20bとの境界部位である内側角部がやや円曲している場合にも追随させることができるようになっている。また、スペーサ材26は、接触端子20にあって直立片部20a側に位置する直立片部20aとの対面部位の肉厚を薄くして空隙28が確保できるように形成されている。このため、接触端子20には、その接触端21が上方から外力により押し込まれた際に撓ませるための可撓性を付与することができることになる。   Moreover, the base body 13 has a cutout 17 formed at a corner facing the inner corner that is the boundary between the upright piece 20a and the horizontal piece 20b of the contact terminal 20, and the cutout 17 It is also possible to follow even when the inner corner which is the boundary portion between the upright piece 20a and the horizontal piece 20b is slightly curved. The spacer member 26 is formed so that the gap 28 can be secured by reducing the thickness of the portion facing the upright piece 20a located on the upright piece 20a side of the contact terminal 20. For this reason, the contact terminal 20 can be provided with flexibility for bending when the contact end 21 is pushed in from above by an external force.

他の1本である接触端子23の直立片部23aと水平片部23bとは、スペーサ材26を介して下方への撓みが自在となって配置されている。この場合、スペーサ材26は、接触端子23の直立片部23aと水平片部23bとの境界部位である内側角部と対面する角部に切除部26aが形成されており、該切除部26aにより直立片部23aと水平片部23bとの境界部位である内側角部がやや円曲している場合にも追随させることができるようになっている。また、接触端子23の直立片部23aと水平片部23bとは、スペーサ材26に対し非固定状態となって単に接触させてあるだけなので、接触端子23の接触端24が上方から外力により押し込まれた際に下方に撓ませることができることになる。   The other upright piece portion 23 a and the horizontal piece portion 23 b of the contact terminal 23 are arranged so as to be freely bent downward via the spacer material 26. In this case, the spacer member 26 has a cut portion 26a formed at a corner portion facing an inner corner portion that is a boundary portion between the upright piece portion 23a and the horizontal piece portion 23b of the contact terminal 23, and the cut portion 26a It is also possible to follow even when the inner corner portion, which is the boundary portion between the upright piece portion 23a and the horizontal piece portion 23b, is slightly curved. Further, since the upright piece portion 23a and the horizontal piece portion 23b of the contact terminal 23 are simply brought into contact with the spacer member 26 in an unfixed state, the contact end 24 of the contact terminal 23 is pushed in from above by an external force. When it is bent, it can be bent downward.

また、台本体部13は、隔室部14近傍に位置する部位の上下方向に貫通させた雌ねじ孔18を有しており、該雌ねじ孔18に抓みねじ58が一側支持片部55上面から長孔57を通して螺着される。このとき、一側端子台12は、一側支持片部55の内壁面方向へと吊り上げられる固定される。その結果、台本体部13は、その全体が一側支持片部55を介して基台52側に固定できることになる。   In addition, the base body 13 has a female screw hole 18 that penetrates in a vertical direction at a portion located in the vicinity of the compartment 14, and a pinching screw 58 is inserted into the female screw hole 18 on the upper surface of the one side support piece 55. And screwed through the long hole 57. At this time, the one-side terminal block 12 is fixed so as to be lifted toward the inner wall surface of the one-side support piece 55. As a result, the entire base body 13 can be fixed to the base 52 via the one-side support piece 55.

他側端子台32は、一側端子台12と同じ構造を備えて形成されており、基台52側に一側端子台12と向き合わせた配置関係のもとで一側端子台12と同様に位置固定されることなる。なお、他側端子台32の構造については、図中に一側端子台12と対応させた符号を付してその詳細説明を省略する。   The other-side terminal block 32 is formed to have the same structure as the one-side terminal block 12, and is similar to the one-side terminal block 12 in the arrangement relationship facing the one-side terminal block 12 on the base 52 side. The position is fixed to. In addition, about the structure of the other side terminal block 32, the code | symbol corresponding to the one side terminal block 12 is attached | subjected in the figure, and the detailed description is abbreviate | omitted.

一側端子台12と他側端子台32とを相互の接離とその位置固定とを自在に支持する基台52は、接触端子20,23,40,43と各別に結線された計4個の接続端子54を備えてなる基台本体部53と、該基台本体部53上に位置固定されて一側端子台12と他側端子台32とをそれぞれの定置部16,36を表出させた状態のもとで接離自在に各別に支持する一側支持片部55と他側支持片部65とを少なくとも備えて構成されている。   A total of four bases 52 connected to the contact terminals 20, 23, 40, and 43, respectively, for freely supporting the one-side terminal block 12 and the other-side terminal block 32 to contact and separate each other and to fix their positions. The base body 53 having the connection terminals 54 and the base body 53 are fixed on the base body 53 so that the one-side terminal block 12 and the other-side terminal block 32 are exposed to the stationary portions 16 and 36, respectively. It is configured to include at least one side support piece portion 55 and another side support piece portion 65 that are separately supported so as to be able to come into contact with and separate from each other under the state of being brought into contact with each other.

この場合、一側支持片部55と他側支持片部65とは、一側端子台12と他側端子台32とを相互に接離させる際のガイド部材として機能させるために基台本体部53上に位置固定されている。   In this case, the one-side support piece portion 55 and the other-side support piece portion 65 serve as a base body portion for functioning as a guide member when the one-side terminal block 12 and the other-side terminal block 32 are brought into contact with or separated from each other. The position is fixed on 53.

これを一側支持片部55と一側端子台12との配置関係について詳しく説明すれば、一側支持片部55の底面側には、基台本体部53との間で一側端子台12側を定置部16を表出させた状態のもとで位置規制しながら進退自在(図示例においては左右方向)に収容する空間部56が形成されているほか、その上面には、一側端子台12の進退方向を長さ方向とする長孔57が形成されている。   This will be described in detail with respect to the positional relationship between the one-side support piece 55 and the one-side terminal block 12. A space portion 56 is formed that can be moved forward and backward (left and right in the illustrated example) while the position is restricted with the stationary portion 16 being exposed. A long hole 57 is formed in which the advancing / retreating direction of the table 12 is the length direction.

そして、該長孔57は、一側端子台12が図2に示す位置関係にあるときに抓みねじ68をその前端57a側に当接させ、図6に示す位置関係にあるときに抓みねじ68をその後端57b側に当接させる長さを付与して形成されている。   Then, the long hole 57 makes the pinching screw 68 abut on the front end 57a side when the one-side terminal block 12 is in the positional relationship shown in FIG. The screw 68 is formed to have a length that abuts the rear end 57b.

他側支持片部65は、一側支持片部55と同じ構造を備えて形成されており、基台52上に一側支持片部55と向き合わせた配置関係のもとで一側支持片部55と同様に位置固定されることなる。なお、他側支持片部65の構造については、図中に一側支持片部55と対応させた符号を付してその詳細説明を省略する。   The other side support piece portion 65 is formed to have the same structure as the one side support piece portion 55, and is arranged on the base 52 with the one side support piece portion 55 facing the one side support piece portion 55. The position is fixed similarly to the portion 55. In addition, about the structure of the other side support piece part 65, the code | symbol corresponding to the one side support piece part 55 is attached | subjected in a figure, and the detailed description is abbreviate | omitted.

しかも、基台52を構成している基台本体部53には、一側端子台12の各接触端子20,23にチップ部品71の一方の電極72を、他側端子台32の各接触端子40,43にチップ部品71の他方の電極73をそれぞれ接触させてチップ部品71を定置部16,36上に定置する押当て部材69が配設されている。   In addition, in the base body 53 constituting the base 52, one electrode 72 of the chip component 71 is connected to each contact terminal 20, 23 of the one-side terminal block 12, and each contact terminal of the other-side terminal block 32. A pressing member 69 for placing the chip part 71 on the placement parts 16 and 36 by placing the other electrode 73 of the chip part 71 in contact with the parts 40 and 43 is provided.

該押当て部材69は、サイズを異にするチップ部品71を定置部16,36上に位置固定することができる構造を備えているものであればよく、例えば図5に示されているように、基台本体部53上にその昇降を自在に螺着された螺杆材69aと、該螺杆材69aに取り付けられてチップ部品71側と当接する押さえ板69bとで構成するなど、適宜の構造のものを採用することができる。   The pressing member 69 only needs to have a structure capable of fixing the position of the chip component 71 having a different size on the stationary portions 16 and 36. For example, as shown in FIG. An appropriate structure such as a screw member 69a screwed up and down on the base body 53 and a pressing plate 69b attached to the screw member 69a and abutting on the chip component 71 side is used. Things can be adopted.

次に、上記構成からなる本発明の作用・効果を説明すれば、まず、今回分の測定対象試料となるチップ部品71が選択される。該チップ部品71は、例えば図6からも明らかなように、水平な下面側に相互に向き合った位置関係で配設されている一対の電極72,73を備えている。   Next, the operation and effect of the present invention having the above-described configuration will be described. First, the chip component 71 serving as the measurement target sample for this time is selected. The chip component 71 includes a pair of electrodes 72 and 73 disposed in a positional relationship facing each other on the horizontal lower surface side, as is apparent from FIG. 6, for example.

選択されたチップ部品71が最も微少な面サイズを備えているものである場合には、一側端子台12を基台52側に位置固定している抓みねじ58と、他側端子台32を基台52側に位置固定している抓みねじ68とを緩め、一側端子台12は一側支持片部55の空間部56内を進出させ、他側端子台32は他側支持片部65の空間部66内を進出させる。これにより、抓みねじ58は、長孔57の前端57aに、抓みねじ68は長孔67の前端67aにそれぞれ当接する結果、一側端子台12と他側端子台32との移動も停止され、この停止位置にて抓みねじ58と抓みねじ68とを緊締することで位置固定され、図1に示すように相互を接近させることができる。   When the selected chip component 71 has the smallest surface size, the screw screw 58 that fixes the position of the one-side terminal block 12 to the base 52 side, and the other-side terminal block 32. The one side terminal block 12 is advanced into the space 56 of the one side support piece 55, and the other side terminal block 32 is the other side support piece. The inside of the space part 66 of the part 65 is advanced. As a result, the scissors screw 58 contacts the front end 57a of the long hole 57, and the scissors screw 68 contacts the front end 67a of the long hole 67. As a result, the movement of the one side terminal block 12 and the other side terminal block 32 also stops. At this stop position, the pinching screw 58 and the pinching screw 68 are tightened to fix the position, and can be brought close to each other as shown in FIG.

図1の状態のもとでは、一側端子台12と他側端子台32とを接近させることで、図中に楕円形状の囲繞領域として示される測定部が確保され、図2に示すように選択されたチップ部品71が定置される。   Under the state of FIG. 1, by bringing the one-side terminal block 12 and the other-side terminal block 32 close to each other, a measurement unit shown as an elliptical enclosed region in the drawing is secured, as shown in FIG. The selected chip component 71 is placed.

この場合、チップ部品71は、一方の電極72に一側端子台12が備える2本の接触端子20,23を、他方の電極73に他側端子台32が備える2本の接触端子40,43をそれぞれ接触させる位置関係のもとで定置させることができる。   In this case, the chip component 71 includes the two contact terminals 20 and 23 included in the one-side terminal block 12 on one electrode 72 and the two contact terminals 40 and 43 included in the other-side terminal block 32 on the other electrode 73. Can be placed under the positional relationship of contacting each other.

また、基台52には、押し当て部材69が配設されおり、該押し当て部材69を構成している押さえ板69bをチップ部品71の上面に押し当てることにより電気的な接触関係を確実なものとすることができる。   Further, a pressing member 69 is disposed on the base 52, and the pressing contact plate 69 b constituting the pressing member 69 is pressed against the upper surface of the chip component 71, thereby ensuring an electrical contact relationship. Can be.

しかも、仮に接触端子20,23,40,43の接触端21,24,41,44の位置が同一平面上に位置していない場合には、押さえ板69bでチップ部品71の上面をより強く押し下げて既に接触状態にあるいずれかの直立片部20a,23a,40a,43aのみを下方へと撓ませることで、接触端21,24,41,44のすべての位置を同一平面上に位置させることができるので、より確実な接触関係を確保して精度の高い四端子測定を行うことができることになる。   Moreover, if the positions of the contact ends 21, 24, 41, 44 of the contact terminals 20, 23, 40, 43 are not on the same plane, the upper surface of the chip component 71 is pushed down more strongly by the pressing plate 69b. All the positions of the contact ends 21, 24, 41, 44 are located on the same plane by deflecting only one of the upright pieces 20 a, 23 a, 40 a, 43 a already in contact. Therefore, a more reliable four-terminal measurement can be performed while ensuring a more reliable contact relationship.

かくして、今回分の測定対象試料であるチップ部品71に対する四端子測定を終えた後は、逆の手順を踏むことで該チップ部品71を回収することができる。   Thus, after completing the four-terminal measurement for the chip component 71 that is the sample to be measured this time, the chip component 71 can be recovered by following the reverse procedure.

一方、選択されたチップ部品71が最も大きな面サイズを備えているものである場合には、一側端子台12を基台52側に位置固定している抓みねじ58と、他側端子台32を基台52側に位置固定している抓みねじ68とを緩め、一側端子台12は一側支持片部55の空間部56内を後退させ、他側端子台32は他側支持片部65の空間部66内を後退させる。   On the other hand, when the selected chip component 71 has the largest surface size, the screw screw 58 that fixes the position of the one-side terminal block 12 to the base 52 side, and the other-side terminal block Loosen the pinching screw 68 that fixes the position 32 to the base 52 side, the one-side terminal block 12 retreats in the space 56 of the one-side support piece 55, and the other-side terminal block 32 supports the other side. The space 66 of the piece 65 is retreated.

これにより、抓みねじ58は、長孔57の後端57bに、抓みねじ68は長孔67の後端67bにそれぞれ当接する結果、一側端子台12と他側端子台32との移動も停止され、この停止位置にて抓みねじ58と抓みねじ68とを緊締することで位置固定され、図6に示すように相互を離間させることができる。   As a result, the scissors screw 58 abuts on the rear end 57b of the long hole 57 and the scissors screw 68 abuts on the rear end 67b of the long hole 67. As a result, the one side terminal block 12 and the other side terminal block 32 move. In this stop position, the pinching screw 58 and the pinching screw 68 are tightened to fix the position, and can be separated from each other as shown in FIG.

図6の状態のもとでは、一側端子台12と他側端子台32とを引き離すことで、大きな面領域となって確保される測定部へとチップ部品71を定置させることができる。   Under the state of FIG. 6, by separating the one-side terminal block 12 and the other-side terminal block 32, it is possible to place the chip component 71 on the measurement unit secured as a large surface area.

この場合、チップ部品71は、図2の場合と同様に一方の電極72に一側端子台12が備える2本の接触端子20,23を、他方の電極73に他側端子台32が備える2本の接触端子40,43をそれぞれ接触させる位置関係のもとで定置させることができる。   In this case, as in the case of FIG. 2, the chip component 71 includes the two contact terminals 20 and 23 included in the one-side terminal block 12 on one electrode 72 and the other terminal block 32 included in the other electrode 73 2. The contact terminals 40 and 43 of the book can be placed under the positional relationship of contacting each other.

また、この場合においても押さえ板69bをチップ部品71の上面に押し当てることにより、電気的な接触関係を確実なものとすることができるので、既に接触状態にあるいずれかの直立片部20a,23a,40a,43aのみを下方へと撓ませることで、接触端21,24,41,44のすべての位置を同一平面上に位置させて確実な接触関係を確保して精度の高い四端子測定を行うことができることになる。   Also in this case, since the electrical contact relationship can be ensured by pressing the pressing plate 69b against the upper surface of the chip component 71, any of the upright pieces 20a, By bending only 23a, 40a, and 43a downward, all positions of the contact ends 21, 24, 41, and 44 are located on the same plane, ensuring a reliable contact relationship, and highly accurate four-terminal measurement. Will be able to do.

かくして、今回分の測定対象試料である最もサイズの大きなチップ部品71に対する四端子測定を終えた後は、逆の手順を踏むことで該チップ部品71を回収することができる。   Thus, after finishing the four-terminal measurement for the chip component 71 having the largest size, which is the sample to be measured this time, the chip component 71 can be recovered by following the reverse procedure.

なお、以上は、図2に示す最小サイズのチップ部品71と、図6に示す最大サイズのチップ部品71とを例にその作用・効果を説明したものであり、当然のことながら両者のサイズ内に含まれるサイズを異にするチップ部品のための四端子測定用チップ部品治具11として適用することができる。   Note that the above has described the operation and effect of the chip component 71 having the minimum size shown in FIG. 2 and the chip component 71 having the maximum size shown in FIG. 6 as an example. Can be applied as a four-terminal measuring chip component jig 11 for chip components having different sizes.

本発明の一例を押当て部材の一部を省略して示す全体斜視図。The whole perspective view which abbreviate | omits a part of pressing member and shows an example of this invention. 図1におけるA−A線矢視方向での断面構造をチップ部品を定置した状態のもとで拡大して示す一部省略説明。FIG. 2 is a partially omitted illustration showing an enlarged cross-sectional structure in the direction of arrows AA in FIG. 本発明を構成している一側端子台の外観形状を示す斜視図。The perspective view which shows the external appearance shape of the one side terminal block which comprises this invention. 図3におけるB−B線矢視方向での断面図。Sectional drawing in the BB arrow direction in FIG. 面サイズの大きなチップ部品に本発明を適用した際の状態を示す全体斜視図。The whole perspective view which shows the state at the time of applying this invention to the chip component with a large surface size. 図5におけるC−C線矢視方向での断面構造を拡大して示す一部省略説明。FIG. 5 is a partially omitted illustration showing an enlarged cross-sectional structure in the direction of arrows CC in FIG. 5. 特許文献1に示されているチップ部品測定用治具の全体斜視図Whole perspective view of chip component measuring jig shown in Patent Document 1

符号の説明Explanation of symbols

11 四端子測定用チップ部品治具
12 一側端子台
32 他側端子台
13,33 台本体部
14,34 隔室部
15,35 雌ねじ部
16,36 定置部
17,37 切除部
18,38 雌ねじ孔
20,23,40,43 接触端子
20a,23a,40a,43a 直立片部
20b,23b,40b,43b 水平片部
20c,23c,40c,43c 垂下片部
21,24,41,44 接触端
22,25,42,45 通孔
26,46 スペーサ
26a,46a 切除部
27,47 通孔
28,48 空隙
29,49 ボルト材
52 基台
53 基台本体部
54 接続端子
55 一側支持片部
65 他側支持片部
56,66 空間部
57,67 長孔
57a,67a 前端
57b,67b 前端
58,68 抓みねじ
69 押し当て部材
69a 螺杆材
69b 押さえ板
71 チップ部品
72,73 電極
11 Four-terminal measurement chip component jig 12 One-side terminal block 32 Other-side terminal block 13, 33 Base body section 14, 34 Compartment section 15, 35 Female thread section 16, 36 Fixed section 17, 37 Cut section 18, 38 Female thread Hole 20, 23, 40, 43 Contact terminal 20a, 23a, 40a, 43a Standing piece 20b, 23b, 40b, 43b Horizontal piece 20c, 23c, 40c, 43c Hanging piece 21, 24, 41, 44 Contact end 22 , 25, 42, 45 Through hole 26, 46 Spacer 26a, 46a Cutout part 27, 47 Through hole 28, 48 Air gap 29, 49 Bolt material 52 Base 53 Base body part 54 Connection terminal 55 One side support piece part 65 Others Side support piece portion 56, 66 Space portion 57, 67 Long hole 57a, 67a Front end 57b, 67b Front end 58, 68 Tightening screw 69 Pressing member 69a Screw member 69 b Holding plate 71 Chip parts 72, 73 Electrode

Claims (2)

測定対象試料としてのチップ部品が下面側に相互に向き合った位置関係のもとで備える一対の電極における一方の前記電極側に各別に接触させる2本の接触端子を具備させた一側端子台と、他方の前記電極側に各別に接触させる2本の接触端子を具備させた他側端子台と、これら一側端子台と他側端子台とを前記チップ部品の下面サイズに対応させるべく相互の接離とその位置固定とを自在に支持する基台とを少なくとも備え、
該基台には、前記一側端子台の各接触端子にチップ部品の一方の前記電極を、前記他側端子台の各接触端子にチップ部品の他方の前記電極をそれぞれ接触させて前記チップ部品を定置する押当て部材を配設したことを特徴とする四端子測定用チップ部品治具。
A one-side terminal block provided with two contact terminals that are individually brought into contact with one of the electrode sides of a pair of electrodes provided under a positional relationship in which a chip component as a measurement target sample faces the lower surface side; The other side terminal block provided with two contact terminals to be brought into contact with the other electrode side separately, and the one side terminal block and the other side terminal block are adapted to correspond to the lower surface size of the chip component. At least a base that freely supports contact and separation and its position fixing,
In the base, one of the electrodes of the chip component is brought into contact with each contact terminal of the one-side terminal block, and the other electrode of the chip component is brought into contact with each contact terminal of the other-side terminal block. A four-terminal measuring chip component jig, characterized in that a pressing member is provided for fixing the terminal.
それぞれの前記接触端子における少なくとも各接触端部側は、前記押当て部材を介して前記チップ部品が押し付けられた際に撓む可撓性が付与されて前記一側端子台と前記他側端子台とに各別に配設された請求項1に記載の四端子測定用チップ部品治具。
At least each contact end side of each contact terminal is provided with flexibility to bend when the chip component is pressed through the pressing member, and the one-side terminal block and the other-side terminal block. The four-terminal measuring chip component jig according to claim 1, which is separately provided.
JP2006202032A 2006-07-25 2006-07-25 Chip parts jig for four-terminal measurement Pending JP2008026260A (en)

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Country Link
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104267219A (en) * 2014-10-13 2015-01-07 华东光电集成器件研究所 Chip capacitor voltage withstanding performance test fixture
CN104625946A (en) * 2015-01-07 2015-05-20 工业和信息化部电子第五研究所 Chip separation and sample preparation fixing device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63172969A (en) * 1987-01-12 1988-07-16 Matsushita Electric Ind Co Ltd Resistance value measuring method for chip resistor
JPH04215070A (en) * 1990-12-11 1992-08-05 Nitto Kogyo Co Ltd Measuring terminal for chip electronic component
JP2004138546A (en) * 2002-10-18 2004-05-13 Hioki Ee Corp Chip component measuring tool

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63172969A (en) * 1987-01-12 1988-07-16 Matsushita Electric Ind Co Ltd Resistance value measuring method for chip resistor
JPH04215070A (en) * 1990-12-11 1992-08-05 Nitto Kogyo Co Ltd Measuring terminal for chip electronic component
JP2004138546A (en) * 2002-10-18 2004-05-13 Hioki Ee Corp Chip component measuring tool

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104267219A (en) * 2014-10-13 2015-01-07 华东光电集成器件研究所 Chip capacitor voltage withstanding performance test fixture
CN104625946A (en) * 2015-01-07 2015-05-20 工业和信息化部电子第五研究所 Chip separation and sample preparation fixing device

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