JP2008017691A - Monitoring device of electric double-layer capacitor system - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a monitoring device for monitoring the state of an electric double-layer capacitor by predicting the life of the capacitor in an electric double-layer capacitor system. <P>SOLUTION: In a central operating unit of an EDLC bank controller 10, the life of the EDLC bank 4 is predicted based on the history of measurement data obtained by a voltage measuring instrument 13, an atmosphere temperature sensor 14a, and a box-surface temperature sensor 15. When the predicted life reaches a predetermined value, operation is applied for switching a charging and discharging object to a backup EDLC bank 12 while alarming to urge the exchange of an EDLC bank 4. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to a monitoring device that monitors the state of a capacitor in a system configured using an electric double layer capacitor.

An electric double layer capacitor (hereinafter referred to as EDLC (Electric Double Layer Capacitor)) has a very large capacitance. Therefore, for example, in power control devices such as converters, inverters, uninterruptible power supply devices, etc., it is used to absorb and smooth fluctuations in power consumption due to loads by charge / discharge operations. For example, Patent Document 1 discloses an uninterruptible power supply using EDLC. In this patent document 1, when the apparatus is operated, the state of EDLC is measured and grasped.
JP 2001-197686 A

However, Patent Document 1 does not disclose a technique for estimating how long the EDLC can be used from the present time (so-called remaining life). Regarding EDLC, there is some misunderstanding that “chemical reaction does not occur in charge / discharge operation and electrical characteristics are not essentially deteriorated”.
However, when EDLC is actually used, its electrical characteristics gradually deteriorate, and after a certain amount of operation time, it becomes practically impossible to use. This is presumed that a chemical reaction that is not assumed for the original charge / discharge operation actually occurs, and as a result, characteristic deterioration such as a decrease in capacitance occurs. Therefore, accurately estimating the remaining life of the EDLC is very important in order to plan the time for maintenance and renewal in a system that requires high reliability.

  The present invention has been made in view of the above circumstances, and an object thereof is to provide a monitoring device that monitors the state of a capacitor by predicting the remaining life of the electric double layer capacitor in an electric double layer capacitor system. There is.

In order to achieve the above object, the electric double layer capacitor system monitoring device according to claim 1 is used in an electric double layer capacitor system that controls power supply to a load by controlling charging and discharging of the electric double layer capacitor. Monitoring the state of the electric double layer capacitor,
Measurement means for obtaining measurement data necessary for predicting the remaining life of the electric double layer capacitor;
A remaining life prediction means for predicting a remaining life of the electric double layer capacitor based on the history of the measurement data;
When the remaining life reaches a predetermined value, replacement treatment means is provided for performing measures necessary for replacing the electric double layer capacitor.
With this configuration, the remaining life predicting means appropriately estimates the remaining life of the electric double layer capacitor, so that the replacement treatment means replaces the electric double layer capacitor when the remaining life reaches a predetermined value. Therefore, it becomes possible to appropriately perform necessary measures.

The remaining life predicting means calculates the time until the capacitance of the capacitor decreases to a predetermined ratio when the electric double layer capacitor is placed in a predetermined temperature environment and a predetermined voltage is applied. As well as measuring a plurality of voltages in advance,
Data indicating the relationship between the temperature obtained based on the measurement result and the lifetime of the capacitor is stored in the storage means,
During operation of the electric double layer capacitor system, when the measuring means measures the ambient temperature and the housing surface temperature of the capacitor every predetermined time, the internal temperature of the capacitor is estimated based on the measurement result,
Based on the measurement result and the data stored in the storage means, the life reduction degree of the capacitor is calculated, and the remaining life of the capacitor is predicted.

In other words, the capacitance of the electric double layer capacitor gradually decreases as it is repeatedly used for a long time by actually repeating the charge / discharge operation. Therefore, when the capacitance of the electric double layer capacitor is reduced from the initial state to a predetermined ratio that is determined to hinder the operation according to the application using the capacitor, the electric double layer capacitor is It can be determined that the lifetime has been reached. It is empirically known that the manner in which the capacitance of the electric double layer capacitor decreases greatly depends on the voltage application state and the internal element temperature.
Therefore, data indicating the relationship between the temperature obtained based on the pre-measured result and the lifetime of the capacitor is stored, and when the electric double layer capacitor is actually operated, the internal temperature of the capacitor is set every predetermined time. By estimating and calculating the life reduction degree of the capacitor based on the estimation result and the stored data, the remaining life of the capacitor, that is, the remaining life can be appropriately predicted.

  According to the monitoring device of the electric double layer capacitor system of the present invention, since necessary measures for exchanging the electric double layer capacitor can be appropriately executed, system maintenance management is systematically performed to reduce the management cost. Is possible. Since the remaining life predicting means can reasonably estimate the remaining life of the electric double layer capacitor, it is possible to appropriately perform maintenance management of the electric double layer capacitor system.

(First embodiment)
The first embodiment of the present invention will be described below with reference to FIGS. FIG. 7 shows a block configuration of the power control apparatus 1 as an electric double layer capacitor system. In FIG. 7, a power source 2 such as a commercial AC power source is connected to an AC input terminal of a converter 3 via an input terminal 1 a of the power control device 1. The converter 3 is formed of a thyristor or the like, and is configured to convert AC power into DC power when AC power is input to the AC input terminal and output the DC power to the DC output terminal. A DC output terminal of the converter 3 is connected to a DC input terminal of the inverter 5 and is connected to a charge / discharge terminal of an EDLC (electric double layer capacitor) bank 4 via a changeover switch (exchange treatment means) 11. . The EDLC bank 4 is configured by accommodating a number of EDLC cells connected in series and parallel in a housing.

  As will be described later, the changeover switch 11 determines that the EDLC bank 4 has reached the end of life (strictly speaking, the remaining life time has fallen below a predetermined time) and the DC output terminal of the converter 3 and the inverter 5 The DC input terminal is arranged for switching so as to be connected to the backup EDLC bank 12 side. The changeover control of the changeover switch 11 is performed by an EDLC bank control device 10 described later.

  The inverter 5 is formed by bridge-connecting switching elements such as IGBTs (Insulated Gate Bipolar Transistors), and when DC power is input to the DC input terminal, the set desired voltage, current, frequency, phase, and It is comprised so that the signal of a harmonic content rate may be output by alternating current. The AC output terminal of the inverter 5 is connected to the load 6 through the output terminal 1 b of the power control device 1.

  The control device 7 is mainly composed of a converter control device 8, an inverter control device 9, and an EDLC bank control device 10. The converter control device 8 controls the drive of the converter 3, the inverter control device 9 controls the drive of the inverter 5, and the EDLC bank control device 10 controls the charge / discharge operation of the EDLC bank 4 while monitoring it. The control device 7 is configured to monitor the control operations of the control devices 8 to 10 to perform power control operations and supply predetermined power to the load 6.

  The voltage measuring device (measuring means) 13 measures the voltage applied to the EDLC bank 4 and outputs the measurement result to the control device 7. The ambient temperature sensor (measuring means) 14 detects the ambient temperature of the environment where the EDLC bank 4 is installed. The housing surface temperature sensor (measuring means) 15 is attached to the housing surface of the EDLC bank 4 and detects the temperature of the housing surface. The detection signals of the temperature sensors 14 and 15 are also output to the control device 7. Although not specifically shown, a temperature sensor is similarly arranged for the backup EDLC bank 12.

  FIG. 8 is a functional block diagram showing the configuration of the EDLC bank control device (monitoring device) 10. The EDLC bank control device 10 includes a central processing unit (CPU, remaining life prediction means, replacement processing means) 16, a program storage RAM 17, a data storage RAM (storage means) 18, a timer / clock 19, a keyboard 20, and a display device (exchange processing). Means) 21 and the like. In the program storage RAM 14, a control program for operating the central processing unit 16 is uploaded and stored. As will be described later, the data storage RAM 18 stores data relating to measurements performed in advance in order to predict the remaining life of the EDLC bank 4. The data storage RAM 18 is also used as a work area for the central processing unit 16.

  The timer / clock 19 has both a function as a system timer that causes the central processing unit 16 to generate a timer interrupt at regular intervals, and a clock function as a real-time clock that measures time. The keyboard 20 is an operation terminal for a user to perform various input operations, and the display device 21 is configured by a liquid crystal display, for example, and outputs data for the central processing unit 16 to display characters and images. The sensor signal input port 22 is a port to which sensor signals output from the voltage measuring device 13 and the temperature sensors 14 and 15 shown in FIG. 7 are input. The central processing unit 16 converts the sensor signals into A / D. It is supposed to be converted and read.

Next, the operation of the present embodiment will be described with reference to FIGS. 1 to 6, 9, and 10. FIG. First, prior to actually operating the system, measurement data relating to EDLC is obtained in advance by the procedure shown in FIG. In order to simulate the internal temperature of the EDLC determined from the self-heating of the EDLC and the ambient temperature during system operation, the EDLC is placed in a thermostat adjusted to various temperatures (for example, three types, low, medium, and high) . Then, various DC voltages (for example, four types of low, slightly low, slightly high, and high) are float applied to the EDLC, and the capacitance of the EDLC is measured at an appropriate time interval (step S1).
From the measurement result, as shown in FIG. 3, a decrease curve indicating a change in the capacitance of the EDLC is obtained (step S2). Note that the horizontal axis of FIG. 3 is the logarithmic memory power application time, and the vertical axis is a relative value indicating the rate of change in capacitance.

  Next, in the obtained decrease curve, the time until the capacitance decreases to a certain rate (when the initial capacitance is 100%, for example, it decreases to 90%) is (L). A relationship with the internal temperature of the EDLC is obtained for each applied voltage (step S3). At this time, the temperature is converted into an absolute temperature (T) (that is, “273” is added to the Celsius temperature) and the reciprocal is multiplied by 1000 to make the horizontal axis, and the time (L) is displayed in natural logarithm. If taken, a straight line is obtained on the graph as shown in FIG.

Here, when regression is performed using the least square method for each measurement point, an equation in accordance with the Arrhenius rule is obtained as shown in equation (1). However, a and b are regression constants.
ln (L) = ba · 1000 / T (1)
The Arrhenius law is known as an equation indicating the relationship between temperature and the rate of chemical reaction depending on the temperature. Then, by plotting the results obtained by changing the temperature for each voltage, the constants a and b obtained from the equation (1) are written and stored in the data storage RAM 18 together with the equation (1) (step S4). .
In addition, the reference temperature (T0) is determined in advance before the system is operated, and given to the equation (1) together with the constants a and b, the lifetime (L0) with respect to the EDLC reference temperature (T0) is obtained (step S5). ). For example, when the reference temperature (T0) is 20 ° C., the lifetime (L0) is several hundred thousand hours. These are also written and stored in the data storage RAM 18.

Next, measurement data relating to the internal temperature of the EDLC is obtained. A sample in which a thermocouple insulated inside the EDLC is embedded as a temperature sensor is created, and the temperature sensor is also arranged on the surface of the EDLC casing. The internal temperature of the EDLC obtained by these sensors and the housing surface temperature (case temperature) as well as the ambient temperature of the measurement environment can be measured, and a pulse voltage is applied to the EDLC until these temperature rises are saturated. Apply repeatedly (cycle power application).
From this measurement result, the difference between the ambient temperature and the case temperature and the difference between the internal temperature and the ambient temperature are acquired. Then, by associating the relationship between these differences, the data is organized so that the difference between the internal temperature and the ambient temperature can be read from the difference between the ambient temperature and the case temperature, and written and stored in the data storage RAM 18 (step S6). ). As a result, for example, as shown in FIG. 6, a data table in which the relationship between the two is a straight line is obtained.

  After the above measurement is performed in advance, the system is operated. FIG. 1 is a flowchart showing the contents of control performed by the control device 7 (mainly the central processing unit 16 of the EDLC bank control device 10) during operation of the power control device 1. The central processing unit 16 performs the processing of steps S13 to S18 according to the gist of the present invention every time a timer interrupt for a measurement cycle (for example, a 10-hour cycle) is generated by the timer / clock 19 (step S11, “YES”). Otherwise, ("NO") system operation processing is performed (step S12). That is, the converter 3 and the inverter 5 are substantially controlled by the converter control device 8 and the inverter control device 9.

  In step S <b> 13, the central processing unit 16 refers to the sensor signals output from the ambient temperature sensor 14 and the housing surface temperature sensor 15, and the ambient temperature of the environment where the EDLC bank 4 is installed and the EDLC bank 4. The case temperature is detected and the difference between the two is obtained. Then, the internal temperature of the EDLC bank 4 is estimated based on the data indicating the temperature difference relationship stored in the data storage RAM 18 (step S14). For example, when the atmospheric temperature is 20 ° C. and the difference from the case temperature is 5 ° C., a difference of 8 ° C. from the internal temperature of the EDLC is obtained from the table shown in FIG. Therefore, the internal temperature is estimated to be 28 ° C. Subsequently, the central processing unit 16 converts the internal temperature estimated in step S14 into an absolute temperature (step S15).

  Next, the central processing unit 16 uses the timer / clock 19 to calculate the elapsed time (operation time) from the start of operation of the system to the point of time for the first time, and the elapsed time from the previous measurement for the second time and thereafter. Obtain (step S16). Then, the equation (1) is transformed into an equation for obtaining the constant b1, and the constant a stored in the data storage RAM 18, the reciprocal of the absolute temperature obtained in step S15, and the elapsed time obtained in step S16 are substituted. A constant b1 value corresponding to the operating temperature at the time is obtained. That is, as shown in FIG. 5, the constant a which is the slope of the straight line does not change even when the temperature changes, but the constant b which is the intercept changes according to the temperature.

Furthermore, if the time (LT1) is obtained by substituting the constant b1 obtained above into the equation (1), the first use time of the EDLC bank 4 converted by the reference temperature (T0) can be obtained. For example, the operating time at the actual internal temperature of 28 ° C. is 10 hours, whereas the operating time (LT 1) converted at the reference temperature (T 0 = 20 ° C.) is 32 hours. Then, by subtracting the use time (LT1) from the life time (L0) stored in the data storage RAM 18, the remaining life time (LR1) at that time is obtained (step S17).
LR1 = L0−LT1 (2)
When the remaining lifetime (LR1) is obtained as described above, the central processing unit 16 stores the remaining lifetime (LR1) in the data storage RAM 18 and displays it on the display device 21. In addition, when the remaining life time obtained thereafter becomes a predetermined time or less, a warning display is displayed on the display device 21 to the effect that the EDLC bank 4 needs to be replaced and the user is notified, and the changeover switch 11 is set. Then, the connection is switched to the backup EDLC bank 12 side (step S18). Then, the process returns to step S11.

  By repeatedly executing the above processing, the remaining life time (LR1) is obtained after the second time. The remaining life time (LR1) obtained at each time point can be displayed on the display device 21 as a graph each time. Further, based on the result, the regression equation of the lifetime can be obtained for the EDLC bank 4 that is actually used, and the remaining lifetime can be estimated again by extrapolation from the obtained regression equation.

  Here, the mechanism of EDLC electrical characteristic deterioration will be considered. There are no significant differences between manufacturers in terms of materials and basic structures applied to EDLCs sold in the market to date. As a general configuration, a solution obtained by dissolving a quaternary ammonium salt in an organic solvent is used as an electrolytic solution, and an electrode made of activated carbon is immersed in the electrolytic solution. However, with regard to the long-term reliability of EDLC, there are significant differences between those that have been fully studied and those that have not.

  The EDLC having a material and structure selected in consideration of reliability naturally has stable characteristics, and the inventors have found that the main causes of characteristic deterioration are only voltage and temperature. It became clear by the test done. One of the tests is that EDLC is charged at a constant voltage for a long time in an atmosphere of high temperature and high humidity of 60 ° C. and 95% RH, and EDLC is similarly applied in an atmosphere of 60 ° C. without humidification. It is the one that has been charged. As a result, there was no significant difference in the degree of characteristic deterioration between the two.

  Furthermore, one applied electric power for a long time with and without mechanical vibration applied to the EDLC, but no significant difference was found in the results. The reason why such a result was obtained is that EDLC manufactured in consideration of reliability is housed in a robust container (housing), so it has high sealing performance and is not deformed. It is thought that it is in a state where it is difficult to receive. Therefore, it is confirmed that the remaining life in operation can be estimated sufficiently based on the life formula obtained in advance if the EDLC has a robust and confidential structure.

  In the present embodiment, when the internal temperature of the EDLC bank 4 is estimated, the reason for not estimating the internal temperature only by the case temperature is that the calorific value (Joule loss) depends on the current value flowing through the EDLC and the current cycle (load factor). This is because accurate estimation cannot be performed. Regarding the mechanism of this temperature rise, the temperature fluctuation of the gas in the atmosphere is relatively small, so if the temperature difference based on the atmosphere temperature is obtained, the internal temperature of the EDLC that changes according to the load factor can be obtained. I think.

  It is also possible to obtain estimation data for the relationship between the energization current and the internal temperature and the relationship between the energization current and the case temperature by measuring the energization current for the EDLC. If it is in the form of a pulse, it is considered that the result varies greatly depending on the number of energization cycles and the presence or absence of a downtime. Therefore, it is necessary to obtain data in advance for all possible cycle patterns, which is not realistic and difficult to apply.

By the way, it is not clarified at this time what kind of chemical change directly controls the characteristic deterioration of EDLC. However, one of the main ones is that, based on the experiments and analysis results described later, the inventors presume that they are moisture and functional groups that cannot be removed in the manufacturing process of EDLC and remain inside the activated carbon electrode. .
Each manufacturer implements various methods for removing moisture from the activated carbon electrode, but at present, no method for completely removing moisture has been established. Activated carbon basically has a property that it is very easy to absorb water, and a slight amount of adsorbed water remains on its surface, and also forms as a functional group such as a carbonium group, a hydronium group, etc. But it remains.

  When an EDLC equipped with an activated carbon electrode in such a state is operated, it is assumed that electrolysis, which is an electrochemical reaction, occurs with respect to the remaining water, and hydrolysis also occurs with respect to the electrolytic solution. As a result of such an unexpected chemical reaction, a deteriorated substance is formed on the surface of the activated carbon electrode. The fact that the lifetime estimation in the present invention is obtained in a straight line based on the relationship shown in the equation (1) indicates that the characteristic deterioration of EDLC is governed by a chemical reaction.

  As described above, according to the present invention, when the EDLC has a robust and highly confidential housing structure, it is possible to predict the remaining life with high accuracy. For example, if the EDLC element is housed in something like a film, the film diffuses humidity inside, so if you run for a long time in a high temperature and high humidity atmosphere or in an environment where vibration continues to be applied, There is a possibility that the remaining life will be shorter than expected.

  In a general electrolytic solution used for EDLC, an organic solvent is polypropylene carbonate (PC), and tetraethylammonium boron fluoride (TEABF4) or the like is dissolved in the solvent as an electrolyte. This electrolytic solution has a property of being easily hydrolyzed by the presence of moisture. Further, since water undergoes an electrolysis reaction even at a voltage of about 1.2 V, which is considerably lower than the operating voltage of EDLC, the hydrolysis reaction of the electrolytic solution is also accelerated. As a result, it is considered that the deteriorated product is deposited inside a hole (micropore) of about several nm formed on the surface of the activated carbon electrode and hinders the operation as an electric double layer.

  9A and 9B are photographs taken by observing the surface of the activated carbon electrode of EDLC (0.1 nm from the true surface) before and after the voltage application test with an atomic force microscope (AFM). From these, it can be clearly seen that the state of the electrode surface changes. FIG. 10 shows the result of X-ray electron spectroscopic analysis (XPS) for detecting a compound present on the surface of the activated carbon electrode (several nm from the true surface). The horizontal axis corresponds to the type of compound detected, and the vertical axis represents the relative value of the detection level. It is clear that more compounds are present in the electrode (+) after operation than in the electrode (+) before operation.

As described above, according to this embodiment, the central processing unit 16 constituting the control device 7 is based on the history of measurement data obtained by the voltage measuring device 13, the ambient temperature sensor 14, and the housing surface temperature sensor 15. The remaining life of the EDLC bank 4 is predicted. When the predicted remaining life reaches a predetermined value, a notification operation for prompting replacement of the EDLC bank 4 is performed and a measure for switching the charge / discharge control target to the backup EDLC bank 12 is performed.
In predicting the remaining life, when a predetermined voltage is applied with the EDLC bank placed in a predetermined temperature environment, the time until the capacitance decreases to a predetermined ratio is set in advance for a plurality of temperatures and a plurality of voltages. The measurement is performed, a regression equation to which the Arrhenius equation is applied is obtained for the measurement result, and a constant representing the equation is stored.

  When the ambient temperature and the housing surface temperature of the EDLC bank 4 are measured every predetermined time during the operation of the system using the EDLC bank 4, the internal temperature of the EDLC bank 4 is estimated from the measurement result, and the estimation result The life reduction degree is calculated based on the stored data and the remaining life is predicted. Accordingly, it is possible to predict the remaining life of the EDLC bank 4 while operating the system, and the notification operation and the replacement procedure can be automatically performed at an appropriate time.

  Further, in order to estimate the internal temperature of the EDLC bank 4, the internal temperature change and the case surface temperature change when the EDLC bank 4 is energized are measured in advance, and the ambient temperature and the case surface temperature are calculated. The difference and the difference between the ambient temperature and the internal temperature are stored in correspondence. Then, when the ambient temperature and the housing surface temperature are measured during system operation, the difference between the ambient temperature and the internal temperature corresponding to the difference between the two is read, and the temperature difference is added to the ambient temperature. 4 internal temperature is estimated. Therefore, it is possible to reasonably estimate the internal temperature of the EDLC bank 4 that changes according to the load factor.

(Second embodiment)
FIG. 11 shows a second embodiment of the present invention. The same parts as those of the first embodiment are denoted by the same reference numerals and the description thereof is omitted. Only different parts will be described below. The configuration of the second embodiment is basically the same as that of the first embodiment, and an example in which the remaining life is predicted corresponding to the case where a pulsed voltage is applied to the EDLC bank 4 is shown. In the second embodiment, in the measurement in the previous stage of FIG. 2 shown in the first embodiment, measurement data is obtained by performing cycle electricity instead of the float electricity application in step S1.

  That is, a pulsed voltage is continuously applied at a constant cycle, and the capacitance of the EDLC bank is measured in the same manner. In this case, the peak value of the pulse voltage is constant, and the current passed through the EDLC bank is changed by changing the rise time of the voltage, and the temperature is changed to three types (low, medium, high) for each current. And measure the data. Then, the number of pulses applied up to the time when the capacitance ratio decreases by 10% is obtained for each temperature.

  In FIG. 11, the number of pulses is logarithmically displayed on the vertical axis, the internal temperature of the EDLC bank (according to the set temperature of the thermostat) is converted to an absolute temperature, and the reciprocal number is plotted on the horizontal axis. As shown in this figure, it can be seen that the cycle charge life characteristics are obtained with a highly correlated straight line. That is, even when the cycle voltage is applied by the pulse voltage, the life characteristics of the EDLC can be determined based on the number of applied pulses and the internal temperature without depending on the peak of the pulse voltage or the rise time of the voltage. it is obvious. Therefore, thereafter, similarly to the first embodiment, the regression constants a and b of the formula (1) are obtained by using the least square method, and the lifetime (L0) corresponding to the reference temperature is obtained and stored in the data storage RAM 18. , Predict remaining life. The internal temperature estimation method is the same as in the first embodiment.

  As described above, according to the second embodiment, in order to cope with the case where a pulsed voltage is applied to the EDLC bank 4, when the EDLC bank 4 is placed in a predetermined temperature environment and a pulsed voltage is applied. Data indicating the relationship between the internal temperature and the life of the EDLC bank 4 obtained by measuring the number of times of voltage application corresponding to the time until the capacitance decreases to a predetermined ratio for a plurality of temperatures in advance. Remember.

  During operation of the system, when the internal temperature of the EDLC bank 4 is estimated and the number of times of application of the pulse voltage is measured, the life reduction degree of the EDLC bank 4 is calculated based on the measurement result and the stored data, Predict remaining life. That is, the inventors of the present invention have revealed that the lifetime characteristics when the EDLC bank 4 is cycled are determined based on the number of applied pulses and the internal temperature of the EDLC bank 4, Based on this principle, the remaining life can be predicted appropriately.

The present invention is not limited to the embodiments described above and shown in the drawings, and the following modifications or expansions are possible.
The lifetime of the EDLC is not necessarily determined when the electrostatic capacity is reduced by 10% from the initial state, and an appropriate reduction rate may be set according to individual circumstances.
In the first embodiment, when the remaining lifetime falls below a predetermined value, only one of the switching to the backup EDLC bank 12 side and the notification for prompting the user to replace the EDLC bank is performed. Anyway. Further, the notification is not limited to using the display device 21, but may be performed by using a sound or a buzzer, a lamp dedicated to notification, or the like.
In step S18, when the remaining life is equal to or shorter than a predetermined time, discharging is performed by connecting a resistor to the EDLC bank 4, and the current capacitance is obtained from the current and voltage change characteristics at that time. It may be confirmed whether the capacity has actually dropped to a level that requires replacement.

As in the first embodiment, it is not always necessary to return to the equation (1), the data obtained in the previous measurement is stored in the data storage RAM 18, and the life characteristics are estimated directly from the tendency indicated by those data. May be. At that time, for example, linear approximation may be partially performed for a predetermined temperature range. Also in this case, as in the first embodiment, after estimating the internal temperature of the EDLC bank 4, the life corresponding to each temperature is read from the data storage RAM 18, and the remaining life at a predetermined reference temperature is calculated. Can be predicted.
Further, when the applied voltage to the EDLC bank 4 fluctuates during operation of the system, it is based on data (regression equation or lifetime data) obtained for the voltage closest to the applied voltage at that time measured during operation. The remaining life can be predicted. Even in that case, the remaining life prediction is the sum of the results of prediction for each voltage.

The flowchart which is 1st Example of this invention, and shows the control content performed by the control apparatus (mainly central processing unit of an EDLC bank control apparatus) during driving | operation of an electric power control apparatus. Prior to operating the system, a flowchart showing the procedure for obtaining the required measurement data for EDLC in advance. The figure which shows the change characteristic of the capacitance of EDLC FIG. 2 is a graph showing the measurement result obtained by the procedure of FIG. 2 with the horizontal axis representing temperature (1000 / T) and the vertical axis representing the natural logarithm. A diagram showing the change in the EDLC lifetime with the internal temperature as a parameter when the float voltage is changed. Diagram showing the relationship between the ambient temperature of the measurement environment, the case temperature of the EDLC bank, and the internal temperature Functional block diagram showing the configuration of the power control device Functional block diagram showing the configuration of the EDLC bank controller It is the photograph which observed and photographed the surface of activated carbon electrode of EDLC with an atomic force microscope, (a) is a state before an electric power test, and (b) is a figure showing the state after an electric power test. The figure which shows the result of having performed the X ray electron spectroscopic analysis in order to detect the compound which exists in the activated carbon electrode surface FIG. 4 is a diagram corresponding to FIG. 4 when the cycle power is applied to the EDLC in the second embodiment of the present invention.

Explanation of symbols

  In the drawings, 1 is a power control device (electric double layer capacitor system), 4 is an EDLC bank (electric double layer capacitor), 10 is an EDLC bank control device (monitoring device), 11 is a changeover switch (exchange treatment means), and 12 is EDLC bank (backup electric double layer capacitor), 13 is a voltage measuring device (measuring means), 14 is an ambient temperature sensor (measuring means), 15 is a temperature sensor for the housing surface (measuring means), 16 is a central processing unit ( CPU, remaining life prediction means, replacement treatment means), 18 denotes a data storage RAM (storage means), and 21 denotes a display device (exchange treatment means).

Claims (6)

A monitoring device that is used in an electric double layer capacitor system that controls power supply to a load by controlling charging and discharging of the electric double layer capacitor, and monitors the state of the electric double layer capacitor,
Measurement means for obtaining measurement data necessary for predicting the remaining life of the electric double layer capacitor;
A remaining life prediction means for predicting a remaining life of the electric double layer capacitor based on the history of the measurement data;
When the remaining life reaches a predetermined value, a replacement treatment means for performing a treatment necessary for replacing the electric double layer capacitor,
The remaining life predicting means, when an electric double layer capacitor is placed in a predetermined temperature environment and a predetermined voltage is applied, the time until the capacitance of the capacitor decreases to a predetermined ratio, Storing in the storage means data indicating the relationship between the temperature obtained based on the results measured in advance for a plurality of voltages and the lifetime of the capacitor;
During operation of the electric double layer capacitor system, when the measurement means measures the ambient temperature and the housing surface temperature of the capacitor every predetermined time, the internal temperature of the capacitor is estimated based on the measurement result,
A monitoring device for an electric double layer capacitor system, wherein a life reduction degree of the capacitor is calculated based on the estimation result and data stored in the storage means, and a remaining life of the capacitor is predicted. When the remaining life predicting means obtains a regression equation to which the Arrhenius equation is applied with respect to the result measured in advance, the constant representing the regression equation is stored in the storage means,
Estimating the lifetime of the capacitor with respect to a predetermined temperature based on the regression equation, also storing the estimation result in the storage means,
By substituting the measurement result obtained by the measurement means during the operation of the electric double layer capacitor system into the regression equation, the life reduction degree of the capacitor is calculated, and the calculation result and the life stored in the storage means The monitoring device for an electric double layer capacitor system according to claim 1, wherein the remaining life of the capacitor is predicted based on the prediction. In order to estimate the internal temperature of the electric double layer capacitor, the remaining life prediction means previously measured the internal temperature change of the capacitor and the temperature change of the surface of the case of the capacitor when the capacitor was energized. Storing the difference between the ambient temperature at the time and the temperature of the housing surface and the difference between the ambient temperature and the internal temperature in the storage means,
During operation of the electric double layer capacitor system, when the ambient temperature and the temperature of the housing surface are measured, the difference between the ambient temperature and the internal temperature corresponding to the difference between the two is read from the storage means,
3. The monitoring device for an electric double layer capacitor system according to claim 1, wherein the internal temperature of the capacitor is estimated by adding the temperature difference to the ambient temperature.   If the applied voltage of the capacitor fluctuates during operation of the electric double layer capacitor system, the remaining life predicting means is data obtained with respect to a voltage closest to the current applied voltage measured during the operation. 4. The monitoring device for an electric double layer capacitor system according to claim 1, wherein the remaining life is predicted based on the characteristics. The remaining life predicting means is arranged in such a manner that the electric double layer capacitor is placed under a predetermined temperature environment in order to cope with a case where a pulsed voltage is applied to the capacitor during operation of the electric double layer capacitor system. When a voltage is applied, the number of times of voltage application corresponding to the time until the capacitance of the capacitor decreases to a predetermined rate, the temperature obtained based on the results of measurement in advance for a plurality of temperatures, the life of the capacitor, Storing the data indicating the relationship in the storage means,
During the operation of the electric double layer capacitor system, when the measurement means estimates the internal temperature of the capacitor and measures the number of times of voltage application corresponding to the operation time of the system, the measurement result is stored in the storage means. 5. The monitoring device for an electric double layer capacitor system according to claim 1, wherein a life reduction degree of the capacitor is calculated based on the data and the remaining life of the capacitor is predicted.   6. The electric double layer capacitor according to claim 1, wherein when the remaining life reaches a predetermined value, the replacement treatment means performs a notification operation for prompting replacement of the electric double layer capacitor. System monitoring device.