JP2007507602A - 電子ビームエンハンスト大面積堆積システム - Google Patents
電子ビームエンハンスト大面積堆積システム Download PDFInfo
- Publication number
- JP2007507602A JP2007507602A JP2006523827A JP2006523827A JP2007507602A JP 2007507602 A JP2007507602 A JP 2007507602A JP 2006523827 A JP2006523827 A JP 2006523827A JP 2006523827 A JP2006523827 A JP 2006523827A JP 2007507602 A JP2007507602 A JP 2007507602A
- Authority
- JP
- Japan
- Prior art keywords
- plasma
- large area
- electron beam
- source
- deposition system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3471—Introduction of auxiliary energy into the plasma
- C23C14/3478—Introduction of auxiliary energy into the plasma using electrons, e.g. triode sputtering
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/644,567 US20050040037A1 (en) | 2003-08-20 | 2003-08-20 | Electron beam enhanced large area deposition system |
| PCT/US2004/015273 WO2005020277A2 (en) | 2003-08-20 | 2004-05-13 | Electron beam enhanced large area deposition system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2007507602A true JP2007507602A (ja) | 2007-03-29 |
| JP2007507602A5 JP2007507602A5 (enExample) | 2007-07-26 |
Family
ID=34194125
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006523827A Pending JP2007507602A (ja) | 2003-08-20 | 2004-05-13 | 電子ビームエンハンスト大面積堆積システム |
Country Status (3)
| Country | Link |
|---|---|
| US (2) | US20050040037A1 (enExample) |
| JP (1) | JP2007507602A (enExample) |
| WO (1) | WO2005020277A2 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104498898B (zh) * | 2008-08-04 | 2017-10-24 | 北美Agc平板玻璃公司 | 通过等离子体增强的化学气相沉积形成涂层的方法 |
| JP6508746B2 (ja) | 2014-12-05 | 2019-05-08 | エージーシー フラット グラス ノース アメリカ,インコーポレイテッドAgc Flat Glass North America,Inc. | マクロ粒子低減コーティングを利用したプラズマ源ならびにマクロ粒子低減コーティングを用いたプラズマ源を薄膜コーティングおよび表面改質に使用する方法 |
| ES2883288T3 (es) | 2014-12-05 | 2021-12-07 | Agc Glass Europe Sa | Fuente de plasma de cátodo hueco |
| US9799491B2 (en) * | 2015-10-29 | 2017-10-24 | Applied Materials, Inc. | Low electron temperature etch chamber with independent control over plasma density, radical composition and ion energy for atomic precision etching |
| US9721764B2 (en) | 2015-11-16 | 2017-08-01 | Agc Flat Glass North America, Inc. | Method of producing plasma by multiple-phase alternating or pulsed electrical current |
| US9721765B2 (en) | 2015-11-16 | 2017-08-01 | Agc Flat Glass North America, Inc. | Plasma device driven by multiple-phase alternating or pulsed electrical current |
| US10242846B2 (en) | 2015-12-18 | 2019-03-26 | Agc Flat Glass North America, Inc. | Hollow cathode ion source |
| US10573499B2 (en) | 2015-12-18 | 2020-02-25 | Agc Flat Glass North America, Inc. | Method of extracting and accelerating ions |
| US11257685B2 (en) * | 2018-09-05 | 2022-02-22 | Tokyo Electron Limited | Apparatus and process for electron beam mediated plasma etch and deposition processes |
| CN112680700B (zh) * | 2020-12-04 | 2022-07-26 | 安徽工业大学 | 一种电子束辅助碳基超润滑固体薄膜制备装置及方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3393142A (en) * | 1964-08-20 | 1968-07-16 | Cons Vacuum Corp | Cathode sputtering apparatus with plasma confining means |
| US3436332A (en) * | 1965-07-15 | 1969-04-01 | Nippon Electric Co | Stabilized low pressure triode sputtering apparatus |
| JPH09111443A (ja) * | 1995-10-12 | 1997-04-28 | Mitsubishi Heavy Ind Ltd | 薄膜コーティング方法及び装置 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4336277A (en) * | 1980-09-29 | 1982-06-22 | The Regents Of The University Of California | Transparent electrical conducting films by activated reactive evaporation |
| JPH01268859A (ja) * | 1988-04-20 | 1989-10-26 | Casio Comput Co Ltd | 透明導電膜の形成方法および形成装置 |
| US5182496A (en) * | 1992-04-07 | 1993-01-26 | The United States Of America As Represented By The Secretary Of The Navy | Method and apparatus for forming an agile plasma mirror effective as a microwave reflector |
| US6416635B1 (en) * | 1995-07-24 | 2002-07-09 | Tokyo Electron Limited | Method and apparatus for sputter coating with variable target to substrate spacing |
| CU22559A1 (es) * | 1996-01-17 | 1999-05-03 | Ct Ingenieria Genetica Biotech | Sistema de expresión de antígenos heterologos en e. coli como proteínas de fusión |
| US5874807A (en) * | 1997-08-27 | 1999-02-23 | The United States Of America As Represented By The Secretary Of The Navy | Large area plasma processing system (LAPPS) |
-
2003
- 2003-08-20 US US10/644,567 patent/US20050040037A1/en not_active Abandoned
-
2004
- 2004-05-13 WO PCT/US2004/015273 patent/WO2005020277A2/en not_active Ceased
- 2004-05-13 JP JP2006523827A patent/JP2007507602A/ja active Pending
-
2009
- 2009-08-27 US US12/548,510 patent/US20090314633A1/en not_active Abandoned
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3393142A (en) * | 1964-08-20 | 1968-07-16 | Cons Vacuum Corp | Cathode sputtering apparatus with plasma confining means |
| US3436332A (en) * | 1965-07-15 | 1969-04-01 | Nippon Electric Co | Stabilized low pressure triode sputtering apparatus |
| JPH09111443A (ja) * | 1995-10-12 | 1997-04-28 | Mitsubishi Heavy Ind Ltd | 薄膜コーティング方法及び装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2005020277A3 (en) | 2005-05-12 |
| WO2005020277A2 (en) | 2005-03-03 |
| US20090314633A1 (en) | 2009-12-24 |
| US20050040037A1 (en) | 2005-02-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070509 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070509 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20100818 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20110209 |