JP2007305036A - Verification program, apparatus and method - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a verification program, apparatus and method capable of surely verifying design of wiring for electrically connecting a test head body to a plurality of connection terminals to which the plurality of external terminals of an electronic component to be tested are connected. <P>SOLUTION: The verification program causes a computer to realize the function of obtaining verification information about a group of connections, related to information about the plurality of connecting terminals and wherein the connections to which the plurality of connecting terminals should be electrically connected are classified on a predetermined basis; the function of obtaining design information about a group of connections to which the connections for the plurality of connecting terminals to be electrically connected belong, this information being related to the information about the plurality of connecting terminals; and the function of collating the verification information obtained with the design information. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to a program, a verification device, and a verification method for verifying a design of a wiring that electrically connects a test head main body and a plurality of connection terminals to which a plurality of external terminals of an electronic component are connected in an electronic component test apparatus.

  2. Description of the Related Art Conventionally, as an electronic component testing apparatus, for example, an apparatus including a test head body and a plurality of connection terminals to which a plurality of external terminals of an electronic device under test such as an IC device are connected is used. The wiring that electrically connects the test head body and the plurality of connection terminals is determined based on the specifications of the electronic component test apparatus and the specifications that differ depending on the type of electronic component under test. When testing an electronic device under test using an apparatus, it is necessary to design the wiring according to the type of the electronic device test apparatus and electronic device under test used for the test.

  If there is an error in the wiring design, it may not be possible to perform the desired test on the electronic device under test. Therefore, it is necessary to verify the design of the wiring that electrically connects the test head body and multiple connection terminals. is there. That is, it is necessary to verify the wiring design based on the specifications of the electronic component test apparatus and the electronic component under test. Conventionally, as a method of verifying a wiring design, a method of visually verifying a design circuit diagram of a printed wiring board (performance board) has been adopted.

  However, with the conventional visual verification method, the judgment of the validity of the connection destination depends on the knowledge level of the operator who verifies the wiring design of the performance board, the information and storage of the operator, and the verification of the design result Was not enough.

  In addition, it is difficult to determine an appropriate connection destination after understanding the specifications of the electronic component test apparatus and the electronic device under test, which may result in a wiring design confirmation error or a confirmation failure. In such a case, there has been a problem that a desired test using an electronic component testing apparatus cannot be performed on the electronic component under test.

  In view of such circumstances, the present invention provides a verification program capable of reliably verifying the design of a wiring that connects a test head body and a plurality of connection terminals to which a plurality of external terminals of an electronic device under test are connected. An object is to provide a verification apparatus and a verification method.

  In order to solve the above problems, the present invention provides an electronic component comprising a test head main body and a plurality of connection terminals electrically connected to the test head main body and connected to a plurality of external terminals of the electronic device under test. A verification program for causing a computer to realize a function of verifying a design of a wiring for electrically connecting the test head main body and the plurality of connection terminals in a test apparatus, the program being associated with information on the plurality of connection terminals A plurality of connection terminals to which the connection destinations to be electrically connected are obtained according to a predetermined reference and a function for obtaining verification information related to a connection destination group, and the wiring design Acquire design information related to a connection destination group to which a connection destination to which each of the plurality of connection terminals is electrically connected, associated with information related to a connection terminal. Features and and a function of collating the design information and the acquired verification information to provide a verification program, characterized in that to realize said computer (claim 1).

  According to the above invention (invention 1), the design of the wiring can be verified by a computer. Therefore, there is no risk of confirmation errors or omissions as in the case of conventional visual verification. It is possible to verify the design of the wiring that electrically connects the connection terminals. In general, the wiring design for electrically connecting the test head main body and a plurality of connection terminals can be obtained based on the specifications of the electronic device under test, all of which are the result of the wiring design. However, according to the above-described invention (claim 1), the verification information to be compared with the design information is ambiguous information that is related to the connection destination group to which the connection destination belongs. Creation errors can be prevented, and wiring design can be verified more reliably.

  Here, in the present invention, the “connection destination group in which the connection destinations are classified according to a predetermined standard” is, for example, a connection classified according to whether the connection destination is a high-speed signal pin, a power supply pin, a ground, or the like. It means attributes such as the previous pins and parts.

  In the above invention (invention 1), the function of acquiring the verification information is such that the one connection terminal associated with information on one connection terminal of the plurality of connection terminals is electrically connected. The verification information regarding the connection destination group to which the power connection destination belongs is sequentially acquired, and the function of acquiring the design information is based on the design of the wiring, and the one connection terminal associated with the information regarding the one connection terminal. It is preferable to obtain design information related to a group of connection destinations to which a connection destination to which is electrically connected belongs.

  According to the above invention (invention 2), the connection destinations of the plurality of connection terminals in the wiring design can be sequentially verified one by one, so that the wiring for electrically connecting the test head main body and the plurality of connection terminals can be verified. The design can be verified reliably.

  In the above inventions (inventions 1 and 2), the electronic component testing apparatus includes a performance board to which a socket or a probe card to which the electronic device under test is connected is electrically connected, and acquires the design information. The function is based on the information on the design circuit of the performance board, and the connection destination to which the connection terminal of the socket or the probe card is electrically connected is related to the information about the connection terminal of the socket or the probe card. You may make it acquire the design information regarding the connection destination group to which it belongs (Claim 3).

  According to the above invention (invention 3), the design of the wiring of the performance board that electrically connects the test head body and the plurality of terminals of the socket or the probe card can be reliably verified.

  In the above inventions (inventions 1 and 2), the electronic component testing apparatus is electrically connected to the test head body, and a plurality of external terminals of the electronic device under test are electrically connected. A probe card having a contact of the contact card, and the function of acquiring the design information is based on information related to a design circuit of the probe card, and the contact associated with the information related to the contact is electrically connected. Design information related to the connection destination group to which the connection destination belongs may be acquired (claim 4).

  According to the above invention (invention 4), it is possible to reliably verify the design of the wiring of the probe card that electrically connects the test head main body and the plurality of contacts.

  In the said invention (invention 1-4), it is preferable to make the said computer further implement | achieve the function to display the said collated result (invention 5). According to this invention (Claim 5), since the collation result is displayed, it is possible to visually determine whether the wiring design is correct or not, and when there is an error in the wiring design, the wiring design can be easily performed again. It can be carried out.

  Here, in the present invention, in addition to the collation result, when the wiring design is normal, the information regarding the connection destination to which each of the plurality of connection terminals is electrically connected, and when there is an error in the wiring design Information regarding a connection destination group to which a connection destination to which each of the connection terminals should be electrically connected may be displayed.

  Further, the present invention provides the test in an electronic component test apparatus comprising a test head main body and a plurality of connection terminals electrically connected to the test head main body and connected to a plurality of external terminals of the electronic component to be tested. An apparatus for verifying a wiring design for electrically connecting a head main body and the plurality of connection terminals, wherein each of the plurality of connection terminals is classified according to a predetermined standard. Based on the design of the wiring, the storage unit that stores the verification information related to the connection destination group in association with the information related to the plurality of connection terminals, the verification information acquisition unit that acquires the verification information stored in the storage unit, Design information for acquiring design information related to a group of connection destinations to which a connection destination to which each of the plurality of connection terminals is electrically connected is associated with information about the plurality of connection terminals. A verification apparatus comprising: an acquisition unit; and a verification unit that collates verification information acquired by the verification information acquisition unit and design information acquired by the design information acquisition unit (Claim 6). ).

  According to the above invention (invention 6), the design of the wiring for electrically connecting the test head main body and the plurality of connection terminals is surely verified without causing a check omission as in the conventional visual verification. be able to. In general, the wiring design for electrically connecting the test head main body and a plurality of connection terminals can be obtained based on the specifications of the electronic device under test, all of which are the result of the wiring design. However, according to the above invention (Claim 6), the verification information to be compared with the design information is ambiguous information that is information on the connection destination group to which the connection destination belongs. Creation errors can be prevented, and wiring design can be verified more reliably.

  In the above invention (invention 6), the verification information acquisition unit is connected to a connection destination stored in the storage unit to which one of the plurality of connection terminals is to be electrically connected. The verification information on the destination group is sequentially acquired, and the design information acquisition unit acquires design information on the connection destination group to which the connection destination to which the one connection terminal is electrically connected belongs based on the design of the wiring. (Claim 7).

  According to the above invention (invention 7), the connection destinations of the plurality of connection terminals in the wiring design can be sequentially verified one by one, so that the test head main body and the plurality of connection terminals are reliably electrically connected. The wiring design can be verified.

  In the above inventions (inventions 6 and 7), the electronic component test apparatus includes a performance board to which a socket or a probe card to which the electronic device under test is connected is electrically connected, and the design information acquisition unit is The connection to which the connection destination to which the connection terminal of the socket or the probe card is electrically connected is associated with the information about the connection terminal of the socket or the probe card based on the information about the design circuit of the performance board You may make it acquire the design information regarding a front group (Claim 8).

  According to the above invention (invention 8), the design of the performance board wiring for electrically connecting the test head body and the plurality of connection terminals of the socket or the probe card can be reliably verified.

  In the above inventions (inventions 6 and 7), the electronic component testing apparatus is electrically connected to the test head body, and a plurality of external terminals of the electronic device under test are electrically connected. And the design information acquisition unit is connected to the information related to the contact based on the information related to the design circuit of the probe card and to which the contact is electrically connected. You may make it acquire the design information regarding the connection destination group to which the tip belongs (claim 9).

  According to the above invention (invention 9), it is possible to reliably verify the design of the probe card wiring that electrically connects the test head body and the plurality of contacts.

  In the said invention (inventions 6-9), it is preferable to further provide the display part which displays the collation result by the said collation part (invention 10). According to this invention (Claim 10), since the collation result is displayed on the display unit, it is possible to visually determine whether the wiring design is correct or not. If there is an error in the wiring design, the wiring design is redone. Can be easily performed.

  Furthermore, the present invention provides the test in an electronic component test apparatus comprising: a test head main body; and a plurality of connection terminals electrically connected to the test head main body and connected to a plurality of external terminals of the electronic device under test. A method for verifying a design of a wiring for electrically connecting a head body and the plurality of connection terminals, wherein each of the plurality of connection terminals associated with information on the plurality of connection terminals is electrically connected. Obtaining verification information regarding a connection destination group in which connection destinations to be classified are classified according to a predetermined criterion, and based on the design of the wiring, the plurality of connection terminals associated with the information regarding the plurality of connection terminals. A step of acquiring design information related to a connection destination group to which a connection destination to which each is electrically connected belongs, and a step of collating the acquired verification information and design information. To provide a verification method characterized by having a flop (claim 11).

  According to the above invention (invention 11), the design of the wiring for electrically connecting the test head main body and the plurality of connection terminals is surely verified without the possibility of a check omission as in the conventional visual verification. be able to. In general, the wiring design for electrically connecting the test head main body and a plurality of connection terminals can be obtained based on the specifications of the electronic device under test, all of which are the result of the wiring design. However, according to the above invention (claim 11), the verification information to be compared with the design information is ambiguous information that is information on the connection destination group to which the connection destination belongs. Creation errors can be prevented, and wiring design can be verified more reliably.

  In the above invention (invention 11), in the step of obtaining the verification information, the one connection terminal associated with information on one connection terminal of the plurality of connection terminals is electrically connected. In the step of sequentially obtaining verification information related to the connection destination group to which the connection destination should belong and acquiring the design information, the one connection terminal associated with the information related to the one connection terminal based on the design of the wiring It is preferable to obtain design information relating to a group of connection destinations to which connection destinations to which are electrically connected belong.

  According to the above invention (invention 12), the connection destinations of the plurality of connection terminals in the wiring design can be sequentially verified one by one, so that the test head body and the plurality of connection terminals can be more reliably electrically connected. The wiring design to be verified can be verified.

  In the above inventions (inventions 11 and 12), the electronic component test apparatus includes a performance board to which a socket or a probe card to which the electronic device under test is connected is electrically connected, and acquires the design information. In the step, the connection destination to which the connection terminal of the socket or the probe card is electrically connected based on the information about the design circuit of the performance board is related to the information about the connection terminal of the socket or the probe card. You may make it acquire the design information regarding the connection destination group to which it belongs (claim 13).

  According to the above invention (invention 13), the design of the performance board wiring for electrically connecting the test head main body and the plurality of connection terminals of the socket or the probe card can be reliably verified.

  In the above inventions (inventions 11 and 12), the electronic component test apparatus is electrically connected to the test head body, and a plurality of external terminals of the electronic device under test are electrically connected. And the design information acquisition unit is connected to the information related to the contact based on the information related to the design circuit of the probe card and to which the contact is electrically connected. You may make it acquire the design information regarding the connection destination group to which the tip belongs (claim 14).

  According to the above invention (invention 14), the design of the wiring of the probe card that electrically connects the test head body and the plurality of contacts can be reliably verified.

  In the said invention (invention 11-14), it is preferable to further have the step which displays the said collation result (invention 15). According to this invention (Claim 15), since the collation result is displayed, it is possible to visually confirm the correctness of the wiring design, and when there is an error in the wiring design, the wiring design can be easily re-executed. It can be carried out.

  According to the present invention, it is possible to reliably verify the design of the wiring that electrically connects the test head body and the plurality of connection terminals to which the plurality of external terminals of the electronic device under test are connected. Since the verification information for collating with the design information is ambiguous information, it is possible to prevent the generation of verification information and to verify the wiring design more reliably.

  Hereinafter, a wiring design verification apparatus according to an embodiment of the present invention will be described in detail with reference to the drawings. FIG. 1 is a block diagram showing an internal configuration of the wiring design verification apparatus according to the present embodiment, FIG. 2 is a schematic diagram showing a wiring design circuit diagram, and FIGS. 3A and 3B show netlist information and FIG. 4 is a flowchart illustrating the operation of the wiring design verification apparatus according to the present embodiment.

  The wiring design verification apparatus 1 according to the present embodiment includes a test head main body and a plurality of pins of the socket in an electronic component testing apparatus including a test head main body and a socket in which an electronic component (for example, an IC device) is mounted. And specifically, a printed wiring board (hereinafter referred to as “performance board”) for connecting a test head body and a plurality of pins of a socket to which an IC device or the like is mounted. This is a device for verifying the wiring design. In this embodiment, a verification apparatus for verifying the wiring design of a performance board on which a socket on which an electronic component such as an IC device is mounted is described as an example, but the present invention is not limited to this. For example, a verification device for verifying a wiring design of a probe card or the like that electrically connects a plurality of probe pins and a test head main body may be used.

  As shown in FIG. 1, the wiring design verification device 1 according to the present embodiment includes an information processing unit 2 that executes information calculation processing, information processed by the information processing unit 2, and the wiring design verification device 1. The storage part 3 which memorize | stores the program for implement | achieving each of these functions, the input part 4 which inputs various information, and the display part 5 which displays the process result by the information processing part 2 are provided.

  The information processing unit 2 reads information stored in the storage unit 3 in accordance with the instructions of the program stored in the storage unit 3, performs various processes based on the information, and receives information or various types of information input from the input unit 4. Information obtained by the process is stored in the storage unit 3, or information stored in the storage unit 3 or information obtained by various processes is output to the display unit 5.

  Specifically, the information processing unit 2 generates design information indicating the attribute of the connection destination to which the pin of the IC device is connected in the design circuit diagram of the performance board, based on the net list information stored in the storage unit 3. Processing to acquire, verification processing of the design information and verification information (restriction condition information depending on the type of IC device, etc.) regarding the attribute of the connection destination pin or component to which the IC device pin should be connected, verification A process for storing the information related to the verification result obtained in the storage unit 3 and a process for outputting the information related to the verification result to the display unit 5 are performed.

  The netlist information is information regarding connection destination pins and components to which each of a plurality of pins of the IC device is connected in the design circuit diagram of the performance board. This netlist information is created based on the design circuit diagram of the performance board as shown in FIG.

  As shown in FIG. 3A, information on a plurality of pins (information on pin numbers) of an IC device is associated with information on a connection destination pin or component to which the plurality of pins are connected. It has been. For example, as shown in FIG. 3A, in the netlist information, the IC device pin (DUT1-1) is connected to the high-speed signal pin IO1 of the tester, and the IC device pin (DUT1-5) is connected to the tester. The IC device pin (DUT1-8) is information indicating that it is connected to the ground (GND) of the tester. The netlist information may be created by a designer or the like based on the design circuit diagram, or automatically created by software or the like (for example, CAD) that creates the design circuit diagram. It may be.

  Further, the constraint condition information is verification information regarding attributes of a connection destination pin or a component to be connected to each of the plurality of pins of the IC device, and is ambiguous about each connection destination of the plurality of pins of the IC device. Information (that is, information that does not specify a specific connection destination). This constraint condition information includes information dependent on the type of IC device and information dependent on the model of the electronic component testing apparatus, and is created for each type of IC device and for each model of the electronic component testing apparatus. It is. The information depending on the model of the electronic component test apparatus in the constraint condition information is created in advance for each model of the electronic component test apparatus. If the model is the same, the created information is used. Thus, the man-hour for creating the information can be reduced.

  As shown in FIG. 3B, each piece of information (pin number information) related to a plurality of pins of the IC device, and verification information related to attributes of the connection destination pins and components to which the plurality of pins should be connected, Is associated. For example, as shown in FIG. 3B, the constraint condition information indicates that the high-speed signal IO should be connected to the pin (DUT1-1) of the IC device and the pin (DUT1-5) of the IC device. Is information indicating that the high-speed signal IO should be connected and that the ground GND should be connected to the pins (DUT1-8) of the IC device.

  The storage unit 3 is a netlist information storage unit 31 that stores netlist information created from the design circuit diagram of the performance board, and a constraint condition that stores constraint condition information that depends on the type of IC device or the type of electronic component test apparatus An information storage unit 32, a verification result information storage unit 33 that stores verification result information verified by the information processing unit 2, and a program (for example, a wiring design verification program) that instructs processing of the information processing unit 2 are stored. The program storage unit 34 is provided.

  The storage unit 3 is connected to the information processing unit 2, and various information stored in the storage unit 3 is read from the storage unit 3 to the information processing unit 2 in accordance with instructions from the information processing unit 2. 2 is processed.

  The input unit 4 is an interface through which constraint condition information, net list information, and the like can be input. The constraint condition information, net list information, and the like input by the operator or the like from the input unit 4 are acquired by the information processing unit 2, The information processing unit 2 stores the acquired netlist information in the netlist information storage unit 31 of the storage unit 3 and stores the constraint condition information in the constraint information condition storage unit 32 of the storage unit 3.

  The display unit 5 includes an image processing unit 51 and a general-purpose display 52, and various types of information output from the information processing unit 2 are processed by the image processing unit 51 and processed by the image processing unit 51. The displayed image is displayed on the display 52.

Next, the operation of the wiring design verification apparatus 1 will be described with reference to FIG.
In the wiring design verification apparatus 1, when the operator inputs netlist information and constraint condition information from the input unit 4, the information processing unit 2 stores the netlist information in the netlist information storage unit 31 and stores the constraint condition information. It is stored in the constraint condition information storage unit 32 (step 101).

  When the wiring design verification process by the wiring design verification device 1 is started by an instruction from an operator or the like, the information processing unit 2 reads the constraint condition information stored in the constraint condition information storage unit 32 (step 102). Based on the constraint information, the information processing unit 2 acquires information on the pin number of the IC device described in the row with the row number n = 1 (n is an integer equal to or greater than 1) in the constraint table. Then, verification information related to the attribute of the connection destination pin or component to be connected to the pin, which is associated with the acquired information regarding the pin number, is acquired (step 103).

  Next, the information processing unit 2 reads the net list information stored in the net list information storage unit 31 (step 104), and is described in the row of the line number n = 1 based on the net list information. The design information about the attributes of the connection destination pins and components to which the pins of the IC device are connected is acquired (step 105).

  Then, the information processing unit 2 obtains the verification information regarding the attribute of the connection destination pin or component to be connected to the IC device pin acquired based on the constraint condition information, and the IC device pin acquired based on the netlist information. The design information related to the attributes of the connection destination pins and parts to be connected is checked (step 106).

  If the verification information and the design information match with each other as a result of verification (step 107, Yes), the information processing unit 2 verifies that the performance board wiring design is normal. Information on the result (verification result information) and information on the connection destination pin or component to which the pin of the IC device is connected (net list information) are written in the verification result information storage unit 33 as log information (step 108). ).

  On the other hand, if the verification information and the design information do not match as a result of the verification (step 107, No), the information processing unit 2 matches the verification result information that the wiring design of the performance board is incorrect. Then, information (error message information) regarding the contents of the wiring design of the performance board is written in the verification result information storage unit 33 as log information (step 109).

  The information processing unit 2 determines whether the pin of the IC device for which the verification processing from step 102 to step 109 has been completed is the pin whose row number is the last (n = 7), and the IC for which the verification processing has been completed. If the device pin determines that the row number is not the last pin (step 110, No), the verification process from step 102 to step 109 is repeated for the pin of row number n + 1.

  Thus, the wiring design verification apparatus 1 according to the present embodiment can sequentially verify the wiring design for all pins of the IC device for each IC device.

  When the information processing unit 2 determines that the pin of the IC device for which the verification process has been completed is the last pin of the row number (step 110, Yes), the log information stored in the verification result information storage unit 33 is displayed. The log information is transmitted to the image processing unit 51 (step 111), and the image processing unit 51 displays the log information on the display 52 (step 112).

  As described above, the wiring design verification device 1 according to the present embodiment can display the verification result of the performance board wiring design, and the designers can visually confirm the correctness of the performance board wiring design. Can do. As a result, when there is an error in the wiring design, the wiring design can be easily performed again, and a desired test can be performed on the IC device by the electronic component test apparatus using the performance board for which the wiring design has been performed again. it can.

  In this embodiment, the pin attribute of the connection destination to which the pin (DUT1-1) of the IC device of row number 1 is connected is IO, and the pin attribute of the connection destination to which the pin (DUT1-1) is connected. Is IO (see FIGS. 3A and 3B), the information processing unit 2 determines that the verification information and the design information match (step 107, Yes), and the performance board wiring design is normal. The verification result information storage unit 33 as log information includes collation result information indicating that the IC device pin (DUT1-1) is connected to the IO1 pin belonging to the specified attribute (IO). (Step 108).

  Next, the information processing section 2 starts verification processing for the pin (DUT 1-5) of the IC device of row number 2. Since the pin attribute of the connection destination to be connected to the pin (DUT1-5) of the IC device of row number 2 is IO, the pin attribute of the connection destination to which the pin (DUT1-5) is connected is PS. (See FIGS. 3A and 3B), the information processing unit 2 determines that the verification information and the design information do not match (step 107, No), and verifies that the performance board wiring design is incorrect. The result information and error message information indicating that the pin (DUT 1-5) of the IC device is not connected to the designated attribute (IO) are written in the verification result information storage unit 33 as log information (step 109). Such processing is repeated up to the pin (DUT 1-16) of the IC device of row number 7, and then log information is displayed on the display 51.

  According to the wiring design verification apparatus 1 according to the present embodiment, the wiring design of the performance board can be reliably verified. In general, the wiring design of the performance board can obtain a plurality of wiring designs based on the specifications of the IC device, etc., and these are all acceptable, but the wiring design verification device 1 according to the present embodiment uses the IC Since the wiring design can be verified based on ambiguous information such as information on the connection destination pin to which the device pin should be connected and the attribute of the component, it is possible to prevent an error in creating verification information. Thereby, a desired test using an electronic component test apparatus can be performed on an IC device or the like.

  The embodiment described above is described for facilitating understanding of the present invention, and is not described for limiting the present invention. Therefore, each element disclosed in the above embodiment is intended to include all design changes and equivalents belonging to the technical scope of the present invention.

  For example, in the above embodiment, the verification information is all information related to the attribute of the connection destination to which each of the plurality of pins of the IC device is to be connected. It may be information specifying a specific connection destination (for example, information on specific pins, parts, etc.). Specifically, information indicating that “the connection destination to which the pin (DUT 1-8) of the IC device is connected is AGND” may be included as the verification information.

  In the above embodiment, log information such as verification result information is displayed on the display 52, but the present invention is not limited to this. For example, log information data is transmitted to a printer or the like. The log information may be printed on a paper medium or the like by the printer, or the log information is displayed on the display 52 and the log information data is transmitted to the printer or the like. For example, log information may be printed.

  Furthermore, in the above-described embodiment, the constraint condition information input by the operator in advance is stored in the constraint condition information storage unit 32, and verification processing is sequentially performed using verification information acquired based on the constraint condition information. For example, the information processing unit 2 requests input of verification information of one pin of the socket, and the information processing unit 2 inputs the verification information of one pin of the socket in response to the request, You may make it collate the input verification information and design information. Thus, the wiring design may be verified for each arbitrary pin of the socket.

  The performance board design verification apparatus of the present invention is useful for verifying the wiring design of a performance board that electrically connects an electronic component and a test head body.

It is a block diagram which shows the wiring design verification apparatus which concerns on one Embodiment of this invention. It is the schematic which shows the circuit diagram of the performance board verified in the wiring design verification apparatus which concerns on one Embodiment of this invention. A is a diagram showing a net list information table, and B is a diagram showing a constraint condition information table. It is a flowchart which shows operation | movement of the wiring design verification apparatus which concerns on one Embodiment of this invention.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 ... Wiring design verification apparatus 2 ... Information processing part 3 ... Storage part 31 ... Net list information storage part 32 ... Restriction condition information storage part 5 ... Display part 51 ... Image processing part 52 ... Display

Claims (15)

In an electronic component testing apparatus comprising: a test head main body; and a plurality of connection terminals electrically connected to the test head main body and connected to a plurality of external terminals of the electronic device under test. A verification program for causing a computer to realize a function of verifying a design of a wiring for electrically connecting a connection terminal,
A function of acquiring verification information related to a group of connection destinations, which is associated with information related to the plurality of connection terminals, and each of the connection terminals to be electrically connected is classified according to a predetermined standard;
A function of acquiring design information related to a connection destination group to which a connection destination to which each of the plurality of connection terminals is electrically connected is associated with information related to the plurality of connection terminals based on the design of the wiring;
A verification program for causing the computer to realize a function of collating the acquired verification information and design information. The function of obtaining the verification information is related to information related to one connection terminal of the plurality of connection terminals, and verification related to a connection destination group to which a connection destination to which the one connection terminal is to be electrically connected belongs. Obtain information sequentially,
The function of acquiring the design information is a design related to a connection destination group to which a connection destination to which the one connection terminal is electrically connected is associated with the information related to the one connection terminal based on the design of the wiring. Information is acquired, The verification program of Claim 1 characterized by the above-mentioned. The electronic component test apparatus includes a performance board to which a socket or a probe card to which the electronic device under test is connected is electrically connected,
The function of acquiring the design information is based on information related to the design circuit of the performance board, and the connection terminal of the socket or the probe card associated with the information related to the connection terminal of the socket or the probe card is electrically The verification program according to claim 1 or 2, wherein design information about a connection destination group to which a connection destination to be connected belongs is acquired. The electronic component testing apparatus includes a probe card having a plurality of contacts that are electrically connected to the test head body and to which a plurality of external terminals of the electronic device under test are electrically connected.
The function of acquiring the design information is based on information related to a design circuit of the probe card, and is related to information related to the contact, and a design related to a connection destination group to which a connection destination to which the contact is electrically connected belongs. Information is acquired, The verification program of Claim 1 or 2 characterized by the above-mentioned.   The verification program according to claim 1, further causing the computer to realize a function of displaying the collated result. In an electronic component testing apparatus comprising: a test head main body; and a plurality of connection terminals electrically connected to the test head main body and connected to a plurality of external terminals of the electronic device under test. A device for verifying the design of wiring for electrically connecting a connection terminal,
A storage unit for storing verification information related to a connection destination group in which connection destinations to which each of the plurality of connection terminals is to be electrically connected is classified according to a predetermined standard, in association with information related to the plurality of connection terminals;
A verification information acquisition unit for acquiring verification information stored in the storage unit;
Based on the design of the wiring, design information acquisition for acquiring design information related to a connection destination group to which a connection destination to which each of the plurality of connection terminals is electrically connected is associated with information related to the plurality of connection terminals. And
A verification apparatus comprising: a verification unit that collates verification information acquired by the verification information acquisition unit and design information acquired by the design information acquisition unit. The verification information acquisition unit sequentially acquires verification information related to a connection destination group to which a connection destination to which one connection terminal of the plurality of connection terminals is to be electrically connected, stored in the storage unit,
The said design information acquisition part acquires the design information regarding the connection destination group to which the connection destination to which the said one connection terminal is electrically connected belongs based on the design of the said wiring. Verification equipment. The electronic component test apparatus includes a performance board to which a socket or a probe card to which the electronic device under test is connected is electrically connected,
The design information acquisition unit is configured to electrically connect a connection terminal of the socket or the probe card, which is associated with information about the connection terminal of the socket or the probe card, based on information about a design circuit of the performance board. The verification apparatus according to claim 6, wherein design information relating to a connection destination group to which the connection destination belongs is acquired. The electronic component testing apparatus includes a probe card having a plurality of contacts that are electrically connected to the test head body and to which a plurality of external terminals of the electronic device under test are electrically connected.
The design information acquisition unit associates design information related to a connection destination group to which a connection destination to which the contact is electrically connected, associated with information related to the contact based on information related to a design circuit of the probe card. The verification apparatus according to claim 6, wherein the verification apparatus acquires the verification apparatus.   The verification apparatus according to claim 6, further comprising a display unit that displays a collation result by the collation unit. In an electronic component testing apparatus comprising: a test head main body; and a plurality of connection terminals electrically connected to the test head main body and connected to a plurality of external terminals of the electronic device under test. A method for verifying the design of a wiring for electrically connecting a connection terminal,
Obtaining verification information related to a group of connection destinations, which are associated with information related to the plurality of connection terminals, each of the connection terminals to be electrically connected is classified according to a predetermined standard;
Obtaining design information related to a connection destination group to which a connection destination to which each of the plurality of connection terminals is electrically connected is associated with information related to the plurality of connection terminals based on the design of the wiring;
A verification method comprising the step of collating the acquired verification information with design information. In the step of obtaining the verification information, the verification related to the connection destination group to which the connection destination to which the one connection terminal is to be electrically connected is associated with the information related to one connection terminal among the plurality of connection terminals. Obtain information sequentially,
In the step of obtaining the design information, the design related to the connection destination group to which the connection destination to which the one connection terminal is electrically connected is associated with the information related to the one connection terminal based on the design of the wiring. Information is acquired, The verification method of Claim 10 characterized by the above-mentioned. The electronic component test apparatus includes a performance board to which a socket or a probe card to which the electronic device under test is connected is electrically connected,
The step of acquiring the design information is based on information related to the design circuit of the performance board, and the connection terminal of the socket or the probe card associated with the information related to the connection terminal of the socket or the probe card is electrically The verification method according to claim 11 or 12, wherein design information about a connection destination group to which a connection destination to be connected belongs is acquired. The electronic component testing apparatus includes a probe card having a plurality of contacts that are electrically connected to the test head body and to which a plurality of external terminals of the electronic device under test are electrically connected.
The design information acquisition unit associates design information related to a connection destination group to which a connection destination to which the contact is electrically connected, associated with information related to the contact based on information related to a design circuit of the probe card. The verification method according to claim 11, wherein the verification method is acquired. The verification method according to claim 11, further comprising a step of displaying the collated result.

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