JP2007232472A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2007232472A5 JP2007232472A5 JP2006052447A JP2006052447A JP2007232472A5 JP 2007232472 A5 JP2007232472 A5 JP 2007232472A5 JP 2006052447 A JP2006052447 A JP 2006052447A JP 2006052447 A JP2006052447 A JP 2006052447A JP 2007232472 A5 JP2007232472 A5 JP 2007232472A5
- Authority
- JP
- Japan
- Prior art keywords
- powder
- light
- measuring
- basis weight
- planar substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000843 powder Substances 0.000 claims 24
- 239000000758 substrate Substances 0.000 claims 10
- 230000001678 irradiating Effects 0.000 claims 4
- 238000005259 measurement Methods 0.000 claims 4
- 238000005507 spraying Methods 0.000 claims 3
- 238000000691 measurement method Methods 0.000 claims 2
- 238000004804 winding Methods 0.000 claims 2
- 239000000463 material Substances 0.000 claims 1
- 230000003287 optical Effects 0.000 claims 1
- 239000007921 spray Substances 0.000 claims 1
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006052447A JP4876631B2 (en) | 2006-02-28 | 2006-02-28 | Powder basis weight measuring method and measuring apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006052447A JP4876631B2 (en) | 2006-02-28 | 2006-02-28 | Powder basis weight measuring method and measuring apparatus |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2007232472A JP2007232472A (en) | 2007-09-13 |
JP2007232472A5 true JP2007232472A5 (en) | 2009-04-09 |
JP4876631B2 JP4876631B2 (en) | 2012-02-15 |
Family
ID=38553205
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006052447A Expired - Fee Related JP4876631B2 (en) | 2006-02-28 | 2006-02-28 | Powder basis weight measuring method and measuring apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4876631B2 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5424659B2 (en) * | 2009-01-23 | 2014-02-26 | 株式会社サキコーポレーション | Inspection device for inspection object |
JP5424660B2 (en) * | 2009-01-23 | 2014-02-26 | 株式会社サキコーポレーション | Inspection device for inspection object |
EP3301433B1 (en) * | 2012-03-09 | 2021-07-14 | Siemens Healthcare Diagnostics Inc. | Calibration method for reagent card analyzers |
JP6408354B2 (en) * | 2014-11-19 | 2018-10-17 | 東レエンジニアリング株式会社 | Inspection device and production management method |
CN113237786A (en) * | 2021-05-17 | 2021-08-10 | 青岛中邦科技发展有限公司 | Method and device for measuring one-time powder applying rate of enamel powder |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5396872A (en) * | 1977-02-04 | 1978-08-24 | Hitachi Ltd | Coating weight measuring method of powder |
US5053822A (en) * | 1990-12-24 | 1991-10-01 | Xerox Corporation | Densitometer for measuring marking particle density on a photoreceptor having a compensation ratio which adjusts for changing environmental conditions and variability between machines |
JP2005227107A (en) * | 2004-02-12 | 2005-08-25 | Ricoh Co Ltd | Method and device for inspecting amount of pollutant |
-
2006
- 2006-02-28 JP JP2006052447A patent/JP4876631B2/en not_active Expired - Fee Related
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP2007232472A5 (en) | ||
US9242411B2 (en) | Method and apparatus for monitoring electro-magnetic radiation power in solid freeform fabrication systems | |
CA2821778C (en) | System for and method of measuring flow of a powder | |
JP2005302036A5 (en) | ||
CN107175937B (en) | Automatically controlling liquid spray pattern | |
US10254234B2 (en) | Arrangement and method for product control | |
JP2018503842A5 (en) | ||
EP2228685A3 (en) | Level sensor arrangement for lithographic apparatus and device manufacturing method | |
TW200951430A (en) | Method of determining defects in a substrate and apparatus for exposing a substrate in a lithographic process | |
EP2280335A3 (en) | Optical position detection apparatus and display apparatus having position detection function | |
HK1077113A1 (en) | Authenticity verification methods, products and apparatuses | |
TW200643472A (en) | Apparatus and methods for scatterometry of optical devices | |
WO2009049834A3 (en) | Optical sensor device | |
EP2492647A3 (en) | Scale, optical encoder and optical device | |
US20180364104A1 (en) | Determining temperature of print zone in additive manufacturing system | |
JP5054266B2 (en) | Spray data acquisition system | |
JP2020029099A (en) | Apparatus for additively manufacturing three-dimensional object | |
TW200736593A (en) | Apparatus for measuring reflectance, method for measuring reflectance and method for manufacturing display panel | |
WO2009057434A1 (en) | Mounting angle measuring device and mounting angle measuring method | |
JP4876631B2 (en) | Powder basis weight measuring method and measuring apparatus | |
JP2005534915A (en) | Method and apparatus for in-line measurement of surface coating characteristics of metal products | |
US20170212056A1 (en) | Arrangement for determining properties and/or parameters of a sample and/or of at least one film formed on the surface of a sample | |
CN206084732U (en) | Grinder of naked wafer | |
JP5009382B2 (en) | Apparatus and method for determining surface properties | |
TW200601267A (en) | Surface measurement device, surface measurement method, surface measurement computer program, and computer-readable storage medium containing surface measurement computer program |