JP2007225457A - Inspection device of test object - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To transfer smoothly a test object into a guide part by preventing effectively clogging of the test object supplied to a disk. <P>SOLUTION: This inspection device of the test object includes the disk 2 provided on the circumference with the guide part 3 for putting in and transferring the test object 1, a rotation mechanism 6 for rotating the disk 2, a supply mechanism 4 for supplying the test object 1 into the guide part 3 of the disk 2, and a guide 5 disposed close to the circumference of the disk 2 and forming a transfer aperture 8 between itself and the circumference of the disk 2. The inspection device supplies the test object 1 into the guide part 3 of the disk 2 from the supply mechanism 4, rotates the disk 2, and inspects the test object 1 at the inspection position. In the inspection device, the guide 5 is disposed so that the transfer aperture 8 between itself and the disk 2 can be expanded, and a shutter 7 for stopping transfer of the test object 1 sequentially with the guide 5 is provided on the discharge side of the supply mechanism 4, and the shutter 7 is controlled so that transfer of the test object 1 is stopped when the guide 5 is expanded by the test object 1 supplied to the transfer aperture 8 and not guided into the guide part 3. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to an apparatus for selecting the quality of a device under test such as a screw, for example, the presence or absence of a screw thread, the state of plating, the length of a screw, and the like.

  For screw inspection equipment, the throughput per hour is as important as the sorting characteristics. This is because screws manufactured on an automatic machine are very large and this type of equipment is relatively expensive. Necessary and unprofitable. The present inventor has succeeded in developing an optical inspection method and significantly speeding up the inspection time.

  As a result, if the screw inspection apparatus can quickly process the feeding and unloading of the screw, the processing capability can be dramatically improved. Furthermore, the present inventor has developed the apparatus shown in FIG. 1 and succeeded in dramatically improving the processing capability. (See Patent Document 1)

This apparatus supplies a screw 91 from the supply guide 94 to the disk 2 with a nozzle 96 between the disk 92 and the guide 95. The disk 92 is provided with a recess 93 on the outer periphery for guiding and transferring the screw 91. The guide 95 is disposed close to a part of the circumference of the disk 92, and a transfer gap 98 is provided between the guide 95 and the disk 92. The transfer gap 98 is a gap that is narrower than the outer diameter of the screw 91. The screw 91 is pushed by the air flow of the nozzle 96 and is fed from the supply guide 94 into the recess 93 of the disk 92. The screw 91 guided to the concave portion 93 is transferred by the rotating disk 92 so that it does not leak from the concave portion 93 by the guide 95, and when moving along the guide 95, the quality of the screw 91 is inspected.
JP 55-113906 A

  The above apparatus can supply the screw smoothly from the supply guide to the concave portion of the disk, thereby increasing the processing capacity. However, this device may stop the rotation of the disk by clogging the transfer gap with screws in a bridge state. In order to solve this problem, the present inventor has a structure in which the transfer gap 88 between the guide 85 and the disk 82 can be elastically expanded as shown in FIG. Then, a device for expanding the transfer gap 88 was made as a prototype. However, in this structure, as shown in the drawing, the plurality of screws 81 are clogged in a bridge state, and the stop of the rotation of the disk 82 cannot be effectively prevented. This is because even if the transfer gap 88 is widened, the screw 81 of the bridge is transferred in the narrow direction of the transfer gap 88 by the rotation of the disk 82.

  The present invention was developed with the aim of eliminating this drawback, and an important object of the present invention is to effectively prevent clogging of the test object supplied to the disk from the supply mechanism, An object of the present invention is to provide an inspection apparatus for a device under test that can smoothly transfer a body to a guide portion of a disk.

In order to achieve the above-mentioned object, an inspection apparatus for a device under test of the present invention has the following configuration.
The inspection device for a device under test includes a disk 2 provided with a guide 3 on the outer periphery at a predetermined interval for inserting and transferring the device under test 1, a rotating mechanism 6 for rotating the disk 2, and a rotating disk. The supply mechanism 4 for supplying the test object 1 to the guide part 3 of 2 and the test object 1 guided to the guide part 3 of the disk 2 by this supply mechanism 4 are positioned on the guide part 3. A guide 5 is provided that is disposed close to the outer periphery and forms a transfer gap 8 narrower than the outer diameter of the DUT 1 between the outer periphery of the disk 2. This inspection apparatus supplies the device under test 1 from the supply mechanism 4 to the guide portion 3 of the disk 2 and rotates the disk 2 to inspect the device under test 1 of the guide portion 3 at the inspection position. Further, the inspection apparatus is provided with a guide 5 so that the transfer gap 8 with the disk 2 can be widened, and a shutter 7 that stops the transfer of the DUT 1 in conjunction with the guide 5 is provided in the supply mechanism 4. Provided on the discharge side. In the inspection apparatus, the test object 1 that is supplied from the supply mechanism 4 to the transfer gap 8 and is not guided by the guide unit 3 expands the guide 5, and the expanded guide 5 stops the transfer of the test object 1. Thus, the shutter 7 is controlled.

  In the inspection apparatus for a device under test of the present invention, the supply mechanism 4 arranges the devices under test 1 in a line and supplies them to the guide portion 3 of the disk 2 and the device under test 1 of the supply guide 12. And a nozzle 14 that moves toward the disk 2 by an air flow.

  In the device under test of the present invention, the guide 5 and the shutter 7 can be connected by the link mechanism 18. The link mechanism 18 is supplied from the supply mechanism 4 to the transfer gap 8 and when the guide 5 is expanded by the test object 1 that is not guided by the guide unit 3, the expanded guide 5 causes the link of the test object 1. The shutter 7 can be controlled to stop the transfer.

  In the device under test of the present invention, the shutter 7 can be disposed between the discharge side of the supply mechanism 4 and the outer periphery of the disk 2. The shutter 7 can reciprocate in the tangential direction of the disk 2 to stop the transfer of the DUT 1 from the supply mechanism 4.

  The test object inspection apparatus of the present invention reliably prevents clogging of the test object supplied from the supply mechanism to the disk, and smoothly transfers the test object from the supply mechanism to the guide part of the disk to efficiently cover the test object. It has the feature that the specimen can be inspected. This feature is that the inspection device for the device under test of the present invention provides a guide so that the transfer gap with the disk can be widened, and supplies a shutter that stops the transfer of the device under test in conjunction with this guide. This is achieved by providing it on the discharge side of the mechanism. In this inspection device for the test object, when the test object supplied to the transfer gap is not guided by the guide portion of the disk, and is sandwiched between the outer periphery of the disk and the guide, the test object expands the guide. The expanded guide controls the shutter so that the next object to be tested is not supplied to the transfer gap. Further, the inspection apparatus smoothly guides and transfers the test object sandwiched between the transfer gaps without being guided by the guide part to the guide part by the elastically expanding guide and the rotating disk. Therefore, the inspection apparatus of the present invention smoothly guides and transfers the test objects jammed in the transfer gap to the guide part while reliably preventing a plurality of test objects from clogging in the transfer gap and forming a bridge. The test object can be inspected efficiently.

  Embodiments of the present invention will be described below with reference to the drawings. However, the examples shown below exemplify a device under test for embodying the technical idea of the present invention, and the present invention does not specify the device under test as follows. .

  Further, in this specification, in order to facilitate understanding of the scope of claims, numbers corresponding to the members shown in the examples are indicated in the “claims” and “means for solving problems” sections. It is added to the members. However, the members shown in the claims are not limited to the members in the embodiments.

  The inspection apparatus for a test object shown in FIGS. 3 to 7 includes a disk 2 provided with a guide portion 3 on the outer periphery at a predetermined interval for inserting and transferring the test object 1, and a rotating mechanism 6 for rotating the disk 2. A transfer gap 8 between the supply mechanism 4 for supplying the DUT 1 to the guiding part 3 of the rotating disk 2 and the outer periphery of the disk 2. A guide 5 that is formed and an inspection mechanism 40 that inspects the DUT 1 transferred by the disk 2 are provided. This inspection apparatus supplies the device under test 1 from the supply mechanism 4 to the guide portion 3 of the disk 2, rotates the disk 2 to move the device under test 1 to the inspection position, and the device under test 1 of the guide portion 3. Is inspected by the inspection mechanism 40.

  As shown in FIG. 7, the DUT 1 is a component having a head 1A having a larger outer shape than the shaft 1B at the tip of the shaft 1B. The inspection apparatus of the present invention is suitable for inspecting a component having a screw thread in a shaft portion, such as a screw, as the device under test 1. However, the inspection apparatus of the present invention does not specify the device under test as a screw. The inspection apparatus can also inspect bolts, screws, nails, pins, and the like as test objects.

  As shown in FIG. 3 and FIG. 7, the disk 2 is provided with a penetrating portion 10 on the inner side, and has a circular inner shape and an outer peripheral shape, and a circular ring shape as a whole. The ring-shaped disk 2 can be held in a predetermined posture by providing the penetrating portion 10 with a holding mechanism that holds the disk 2 in a horizontal posture. However, the disk does not necessarily have to be a ring shape having a penetrating portion, and may be a disc shape having no penetrating portion at the center.

  The disk 2 is provided with guide portions 3 for guiding and transferring the device under test 1 at regular intervals. The guide portion 3 has a shape that can be transferred in a state where the shaft portion 1B of the device under test 1 is inserted and the head portion 1A is hooked on the upper surface. The disk 2 shown in the figure is provided with concave portions that can guide the device under test 1 as guide portions 3 at regular intervals on an arcuate outer peripheral edge portion. The recess shown in the figure has a U-groove shape. However, the guide part which is a concave part can also be made into all the shapes which can guide the axial part of a to-be-tested body, for example, triangle shape. Furthermore, the guide part 3 can also be made into the slit provided in the upper surface of the ring shaped disk 2, as shown in FIG. 8 and FIG. The guide portion 3 that is a slit is provided in a state of penetrating the ring-shaped disk 2 from the inside toward the outside. As described above, the guide portion 3 that is a slit has a feature that the entire silhouette of the device under test 1 can be detected in a state in which the device under test 1 is inserted and transferred.

  The rotation mechanism 6 rotates the disk 2 at a predetermined speed. As shown in the figure, the ring-shaped disk 2 is provided with a rotation mechanism 6 for rotating the disk 2 in the penetrating portion 10. The rotating mechanism 6 shown in the drawing includes a driving roller 11A in the penetrating portion 10 of the disk 2, and the inner periphery of the disk 2 is driven and rotated by the driving roller 11A. As shown in the cross-sectional view of FIG. 7, the drive roller 11 </ b> A elastically sandwiches the disk 2 up and down and rotates the disk 2. In the apparatus of FIG. 3, three sets of rollers 11 are disposed in the penetrating portion 10. The plurality of rollers 11 drives the disk 2 with one of them as a driving roller 11A, and rotates the disk 2 while holding the disk 2 in a predetermined posture with the other roller 11 as a support roller 11B. As shown in FIG. 7, the driving roller 11 </ b> A that drives the disk 2 is connected to the motor 17 and is rotated by the motor 17. The disk 2 is disposed outside the roller 11 so as to be removable. In order to detach the disk 2, the roller 11 is elastically moved toward the inner periphery of the ring-shaped disk 2 by an elastic body (not shown) such as a spring. In this structure, the roller 11 is moved to the center side of the disk 2 to exchange the disk 2.

  However, the rotation mechanism does not necessarily have to be provided with a driving roller in the penetrating portion. All the rollers arranged in the penetrating portion of the disk are used as support rollers, and the disc is held in a predetermined posture while being outside the penetrating portion. The disk can be driven and rotated by the provided driving roller. In addition, a disk without a penetrating portion can be rotated around the rotation axis by providing a rotation axis at the center. This rotating mechanism, for example, fixes the rotating shaft to the disk and drives the rotating shaft with a motor to rotate the disk, or drives the outer periphery of the disk with a drive roller or the like without fixing the rotating shaft to the disk. And can be rotated.

  The supply mechanism 4 includes a supply guide 12 that supplies the device under test 1 to the guide portion 3 of the disk 2. The supply guide 12 in FIGS. 3 to 6 has a structure in which the DUTs 1 are arranged in a line and supplied to the guide portion 3 of the disk 2. The supply guide 12 includes a pair of side walls 13 so that the DUTs 1 can be arranged and transferred in a row, and the interval between these side walls 13 is narrower than the head 1A of the DUT 1 and the shaft portion 1B. It is wider than that and arranged in a straight line. Further, the supply guide 12 has a structure in which the DUT 1 is transferred side by side by vibration. The front end of the supply guide 12 is positioned near the outer peripheral edge of the disk 2 and between the front end of the guide 5 and the disk 2. The linear supply guide 12 is disposed so as to be inclined by, for example, 45 to 80 degrees with respect to the tangential direction of the disk 2 so that the DUT 1 to be sent out can be smoothly fed into the guide portion 3.

  Furthermore, the supply mechanism 4 shown in the figure has a nozzle 14 disposed in the supply portion of the device under test 1, and the device under test 1 is guided by the air flow blown from the nozzle 14. 3 is transferred. The nozzle 14 pushes the device under test 1 to the guide portion 3, and injects air in a direction to transfer the device under test 1 toward the guide portion 3. The air nozzle 14 blows air on the device under test 1 positioned at the forefront of the supply guide 12 to accelerate the air, and moves the device under test 1 at the tip away from the device under test 1 sent next. The test object 1 at the tip is pressed against the outer peripheral edge of the disk 2 with an air flow. When the disk 2 rotates and the guide part 3 comes in front of the supply guide 12, the state-of-the-art device under test 1 is pressed by the air flow and pushed into the guide part 3.

  The nozzle 14 blows air to push the device under test 1 from the supply guide 12 to the guide portion 3 of the disk 2. The nozzle 14 is connected to a compressor that is an air source 16 via an on-off valve 15 that controls the blowing of air. As shown in FIG. 10, the supply mechanism 4 may be provided with two upper and lower nozzles 14. This supply mechanism 4 blows air from the lower nozzle 14 to the shaft portion 1B of the DUT 1, blows air from the upper nozzle 1 to the head 1A of the DUT 1, and the upper and lower nozzles 14 The head 1A and the shaft 1B of the device under test 1 can be pressed. In this structure, the air pressure injected from the nozzles 14 disposed above and below is adjusted according to the shape of the device under test 1, for example, the weight ratio and shape of the shaft portion 1B and the head portion 1A. The test body 1 can be reliably transferred to the guide part 3 of the disk 2.

  The guide 5 is arranged close to the outer periphery of the disk 2 so that the DUT 1 guided to the guide part 3 of the disk 2 by the supply mechanism 4 is positioned on the guide part 3. The guide 5 has an opposing surface facing the outer peripheral edge of the disk 2 in an arc shape along the outer periphery of the disk 2. The guide 5 forms a transfer gap 8 narrower than the outer diameter of the DUT 1 between the outer periphery of the disk 2. In the illustrated guide 5, one end edge 5 </ b> A is disposed close to the discharge side of the supply guide 12. This guide 5 guides the device under test 1 transferred from the supply guide 12 to the guide portion 3 of the disk 2 along the edge 5A.

  Further, the guide 5 has a structure capable of elastically expanding the transfer gap 8 with the disk 2. The illustrated guide 5 is rotated in the same plane as the disk 2 to widen the transfer gap 8. 4 and 6, the guide 5 moves the end portion located on the discharge side of the supply guide 12 in a direction away from the outer periphery of the disk 2, so that a transfer gap 8 with the disk 2 is formed. Expand. The guide 5 is provided with a rotating shaft 20 at the end opposite to the expanding end so that the guide 5 can be rotated in a horizontal plane. Further, the guide 5 of FIG. 4 is connected to the elastic body 21 so that it can be elastically expanded, that is, to be elastically returned to its original position. The elastic body 21 is disposed so as to bias the rotating guide 5 toward the disk 2. The elastic body 21 shown in the drawing is a tension spring, and elastically pulls the connecting piece 22 fixed to the guide 5 to rotate the guide 5 so that the expanded end portion moves toward the outer periphery of the disk 2. Yes. Further, the guide 5 shown in the drawing has a gap adjusting screw 23 that adjusts the transfer gap 8 between the disk 2 and the connecting piece 22 inserted therethrough. The gap adjusting screw 23 passes through the connecting piece 22, and its tip is brought into contact with a stopper piece 24 fixed to the base 19 to restrict the rotation of the guide 5 to adjust the transfer gap 8. ing. In this guide 5, the transfer gap 8 is widened when the protruding amount of the gap adjusting screw 23 is increased, and the transfer gap 8 is narrowed when the protruding amount of the gap adjusting screw 23 is reduced.

  When the DUT 1 supplied from the supply guide 12 becomes a bridge in the transfer gap 8, the guide 5 having the above structure is elastically rotated in the direction of expanding the transfer gap 8. When the guide 5 rotates and the transfer gap 8 is widened, the device under test 1 clogged in the transfer gap 8 moves along the outer peripheral edge of the disk 2 and is guided to the guide portion 3. When the device under test 1 is guided to the guide portion 3, the guide 5 returns to its original position elastically. As described above, the guide 5 that expands elastically guides the device under test 1 jammed in the transfer gap 8 to the guide portion 3 promptly.

  However, when the next DUT 1 is supplied from the supply mechanism 4 while the DUT 1 is clogged in the transfer gap 8, as shown in FIG. May become clogged. In this state, even if the guide 5 is expanded, the device under test 1 is not guided by the guide portion 3, and the two devices under test 1 become bridges and become clogged in the transfer gap 8. In order to prevent this state, the inspection apparatus of the present invention is configured such that when the test object 1 is clogged in the transfer gap 8 and the guide 5 is expanded, the next test object 1 is transferred from the supply mechanism 4 to the disk 2. A shutter 7 for blocking the supply is provided.

  When the device under test 1 that is supplied from the supply mechanism 4 to the transfer gap 8 and is not guided by the guide unit 3 expands the guide 5, the shutter 7 is controlled by the expanded guide 5 to transfer the device under test 1. Stop. The shutter 7 shown in the drawing moves in conjunction with the guide 5 that widens the transfer gap 8 and stops the transfer of the DUT 1 from the supply mechanism 4. The shutter 7 is disposed between the discharge side of the supply guide 12 and the outer periphery of the disk 2. The shutter 7 reciprocates in the tangential direction of the disk 2 to stop the transfer of the DUT 1 from the supply guide 12. The shutter 7 shown in the drawing is connected to a guide base 30 having a slide surface along the tangent line so as to be able to reciprocate so that the shutter 7 can reciprocate in the tangential direction of the disk 2. The shutter 7 has a distal end located on the discharge side of the supply guide 12, and stops the discharge of the DUT 1 by closing the discharge portion of the supply guide 12 while the shutter 7 is pushed out.

  The shutter 7 is reciprocated by a reciprocating mechanism 31. The illustrated reciprocating mechanism 31 includes a drive arm 32 that presses the rear end of the shutter 7 and moves the shutter 7 to the closed position, and an elastic body 33 that returns the shutter 7 to the non-closed position. The drive arm 32 is connected to a fixed base 34 fixed to the base 19 via a rotation shaft 35 so that the drive arm 32 can be rotated in a horizontal plane. The drive arm 32 has a rear end connected to the fixed base 34 via the rotation shaft 35 and a front end located at the rear end of the shutter 7. As will be described in detail later, the drive arm 32 rotates in conjunction with the expanding guide 5 and presses the rear end of the shutter 7 to move the shutter 7 to the closed position. The reciprocating mechanism 31 shown in the figure includes a positioning stopper 36 that restricts the rotation of the drive arm 32, and is driven by abutting the tip of a position adjusting screw 37 connected to the driving arm 32 against the positioning stopper 36. The rotation of the arm 32 is limited. Further, the driving arm 32 shown in the drawing is provided with a pressing screw 38 that abuts on the rear end of the shutter 7 at the tip, and the stop position of the shutter 7 can be adjusted by adjusting the protruding amount of the pressing screw 38. . The elastic body 33 elastically returns the shutter 7 to the non-blocking position. The elastic body 33 shown in the figure is a tension spring and urges the shutter 7 in a direction to move the shutter 7 to the non-closed position. As described above, the reciprocating mechanism 31 including the elastic body 33 has a feature that the shutter 7 can be quickly returned to the non-blocking position by the elastic force of the elastic body 33 when the expanding guide 5 returns to the original position. . However, this elastic body is not necessarily required, and the front end of the drive arm can be directly connected to the rear end of the shutter, and the shutter can be reciprocated by the drive arm.

  Although the above reciprocating mechanism 31 includes the drive arm 32 and the elastic body 33, the present invention does not specify the reciprocating mechanism as the above structure. As the reciprocating mechanism, any other mechanism capable of reciprocating the shutter can be used. For example, a rack provided on the shutter can be driven by a pinion gear rotated by a servo motor to reciprocate the shutter, or a shutter such as an air cylinder can be reciprocated.

  Further, in the inspection apparatus shown in the figure, the guide 5 and the shutter 7 are connected by a link mechanism 18 in order to reciprocate the shutter 7 in conjunction with the guide 5 that widens the transfer gap 8. When the guide 5 is expanded by the test object 1 that is not guided by the guide unit 3, the link mechanism 18 operates the shutter 7 so as to stop the transfer of the test object 1 in conjunction with the expanded guide 5. Move. The link mechanism 18 shown in the figure is connected to the guide 5 and is fixed to the fixed arm 25 that rotates together with the guide 5, and is connected to the drive arm 32 that drives the shutter 7, and the connection arm 39 that rotates together with the drive arm 32. The connecting arm 27 is connected to the fixed arm 25 and the connecting arm 39 at both ends.

  The fixed arm 25 is fixed to the guide 5 via the rotation shaft 20. The rotary shaft 20 is disposed vertically through a support base 26 fixed to the base 19, and fixes the guide 5 at the upper end and the fixed arm 25 at the lower end. When the guide 5 rotates in the direction in which the transfer gap 8 widens, the fixed arm 25 rotates integrally with the guide 5 and moves the connecting rod 27 connected to the tip in the rotation direction of the fixed arm 25. Let The fixed arm 25 connects one end of the connecting rod 27 so as to be rotatable in a horizontal plane.

  The connecting arm 39 is fixed to the drive arm 32 via the rotation shaft 35. The rotary shaft 35 is disposed vertically through a fixed base 34 fixed to the base 19, and fixes a drive arm 32 at the upper end and a connecting arm 39 at the lower end. The connecting arm 39 connects the other end of the connecting rod 27 to the tip so that it can rotate in a horizontal plane.

The link mechanism 18 having the above structure closes the supply guide 12 with the shutter 7 in conjunction with the guide 5 as follows.
(1) When the DUT 1 supplied from the supply mechanism 4 to the disk 2 is clogged with the transfer gap 8 to form a bridge, the guide 5 rotates in the direction indicated by the arrow A in FIGS. 8 is elastically expanded.
(2) The rotating guide 5 rotates the fixed arm 25 integrally connected via the rotating shaft 20 in the direction indicated by the arrow C in FIG.
(3) The rotating fixed arm 25 moves the connecting rod 27 in the direction indicated by the arrow D in the figure.
(4) The connecting rod 27 that moves in the direction indicated by the arrow D in the figure rotates the connecting arm 39 in the direction indicated by the arrow E.
(5) The rotating connecting arm 39 rotates the driving arm 32 integrally connected via the rotating shaft 35 in the direction indicated by the arrow F in the figure.
(6) The rotating drive arm 32 presses the rear end portion of the shutter 7 at the front end portion, and moves the shutter 7 in the direction indicated by the arrow B in the figure.
(7) The shutter 7 moving in the direction of arrow B closes the discharge portion of the supply guide 12 and stops supplying the next device under test 1 to the disk 2.

  As described above, when the DUT 1 is clogged in the transfer gap 8 and the guide 5 is expanded, the shutter 7 closes the supply guide 12 in conjunction with the expanding guide 5, and the next DUT is tested. Stop supplying the body 1. Therefore, it is possible to reliably prevent the plurality of devices under test 1 from clogging the transfer gap 8. The link mechanism 18 is interlocked so that the shutter 7 quickly closes the discharge side of the supply guide 12 when the test object 1 is clogged in the transfer gap 8 and the guide 5 is expanded. That is, in the link mechanism 18, when the guide 5 widens the transfer gap 8 beyond the thickness of the shaft portion 1 </ b> B of the DUT 1, the movement amount of the shutter 7 becomes a movement amount that can close the discharge portion of the supply guide 12. Adjust as follows.

  Further, the inspection apparatus can control the blowing of air from the nozzle in conjunction with the expansion of the guide. For example, this inspection apparatus controls the opening / closing of the on-off valve by detecting that the guide has been expanded with a switch or a sensor. When this inspection device detects that the guide has expanded, it closes the on-off valve to stop the air blowing from the nozzle, and when the guide returns to its original position, it opens the on-off valve to blow out the air from the nozzle. To resume.

Further, the link mechanism 18 opens the supply guide 12 by returning the guide 5 and the shutter 7 to the original positions as follows.
(1) When the DUT 1 jammed in the transfer gap 8 is guided to the guide portion 3 by the rotating disk 2, the guide 5 rotates in the direction opposite to the arrow A in FIGS. The guide 5 is rotated to the original return position by the elastic force of the elastic body 21.
(2) The guide 5 that rotates to the original position rotates the fixed arm 25 that is integrally connected via the rotating shaft 20 in the direction opposite to the arrow C in FIG.
(3) The rotating fixed arm 25 moves the connecting rod 27 in the direction opposite to the arrow D in the figure.
(4) The moving connecting rod 27 rotates the connecting arm 39 in the direction opposite to the arrow E in the figure.
(5) The rotating connecting arm 39 rotates the driving arm 32 integrally connected via the rotating shaft 35 in the direction opposite to the arrow F in the figure.
(6) Since the rotating drive arm 32 does not press the rear end portion of the shutter 7 at the front end portion, the shutter 7 is urged by the elastic body 33 and moves in the direction opposite to the arrow B.
(7) The shutter 7 moving in this direction opens the discharge part of the supply guide 12 so that the DUT 1 can be supplied from the supply guide 12 to the guide part 3 of the disk 2.

  The above inspection apparatus has a structure in which the guide 5 and the shutter 7 are connected by the link mechanism 18 and the shutter 7 reciprocates in conjunction with the expanding guide 5. However, the inspection apparatus of the present invention does not specify a structure in which the shutter closes the discharge side of the supply mechanism when the guide is expanded as the link mechanism. The inspection device can detect that the guide has been expanded with a sensor or a switch, and when it is in this state, it can drive the shutter to move the shutter so as to close the discharge side of the supply mechanism. For example, the inspection apparatus includes a switch that is turned on when the guide is expanded, and when the switch is turned on, the reciprocating mechanism moves the shutter so as to close the discharge portion of the supply mechanism. When elastically returned to the original position, the switch is turned off, and the reciprocating mechanism can move the shutter to the original position so that the supply of the device under test can be resumed. As described above, the above-described mechanism such as a cylinder or a motor can be adopted as a reciprocating mechanism that is interlocked with a switch or a sensor.

  As described above, the inspection apparatus of the present invention guides the clogged DUT 1 to the guide portion 3 with the guide 5 that elastically expands even if the DUT 1 is clogged in the transfer gap 8. In addition, the supplied DUT 1 is reliably guided and transferred to the guide portion 3 of the disk 2 while preventing the DUT 1 from being clogged in the transfer gap 8. The DUT 1 guided and transferred by the guide part 3 of the disk 2 is transferred to the inspection position and inspected by the inspection mechanism 40.

  Furthermore, the inspection apparatus shown in the figure includes a transfer unit 9 that holds and transfers the device under test 1 supplied to the guide unit 3 to the guide unit 3. The transfer unit 9 shown in the figure is arranged along the outer periphery of the disk 2, closes the opening edge of the guide part 3 of the disk 2, and the DUT 1 transferred by the disk 2 drops from the guide part 3. Is prevented. Although the transfer part 9 may contact the outer periphery of the disk 2, Preferably, in order to rotate the disk 2 more smoothly, it is good to make it the non-contact state which approaches but does not contact. The transfer guide 9 is a partial area outside the disk 2, and is disposed only in an area until the DUT 1 supplied by the supply mechanism 4 is inspected by the inspection mechanism 40 and then discharged.

  The inspection mechanism 40 in FIG. 3 includes a light source 41 that emits light toward the device under test 1 and a camera that receives the light emitted from the light source 41 and converts the light into a silhouette video signal indicating the contour of the device under test 1. 42 and an arithmetic tester 43 that calculates the video signal output from the camera 42 and inspects the device under test 1 by image processing. As shown in FIGS. 11 and 12, the inspection mechanism 40 includes a first inspection unit 40 </ b> A that irradiates the object under test 1 from the side to detect the entire silhouette and inspects the object under test 1. And a second inspection unit 40b that detects and inspects the silhouette of the head 1A by irradiating light. The first inspection unit 40A inspects the overall shape, overall length, plating state, and the thread state of the shaft 1B. The second inspection unit 40B determines the shape of the head 1A, the plating state, and the like. inspect. However, the inspection mechanism does not necessarily have to inspect the device under test from both the upper side and the side, and can perform only one of the inspections.

  The light source 41 shown in the figure is a surface light source. The surface light source irradiates the front surface with uniform light from the surface. A light source 41, which is a surface light source, irradiates a plurality of test objects 1 with light simultaneously. Furthermore, the light source 41 of the first inspection unit 40A shown in FIG. 11 includes an upper light source 41A that irradiates light to the head 1A of the device under test 1, and a lower light source 41B that irradiates light to the shaft portion 1B of the device under test 1. With. The upper light source 41A irradiates the device under test 1 with light farther from the device under test 1 than the lower light source 41B. In this manner, the light source is divided into the upper light source 41A and the lower light source 41B, and the upper light source 41A irradiates light to one head 1A to be tested, and the lower light source 41B irradiates light to the shaft portion 1B of the test object 1. The light source 41 can increase the inspection accuracy of the DUT 1. This is because the camera 42 can capture both the head 1 </ b> A and the shaft 1 </ b> B having different outer diameters as images with clear outlines so that the outer peripheral edge of the silhouette cannot be blurred. When imaging the outline of the device under test 1 with a silhouette, if the distance from the light source 41 to the device under test 1 is too close, bleeding occurs at the outer periphery of the silhouette. In order to avoid this problem, if the light source 41 is separated from the device under test 1, the contrast between the silhouette of the device under test 1 and the light source 41 decreases. The structure in which the upper light source 41A irradiates light to the device under test 1 away from the device under test 1 than the lower light source 41B can capture both the head 1A and the shaft 1B as clear images. The head 1 </ b> A having a large outer diameter can bleed when the light source 41 is approached. The contrast of the shaft portion 1B having a small outer diameter decreases when the light source 41 is separated. The blur and contrast change with the distance between the DUT 1 and the light source 41. The head 1A having a large outer diameter is likely to be blurred when the light source 41 is approached. When the light source 41 is separated from the DUT 1 so as to be optimal for the head 1A, the contrast of the shaft portion 1B decreases. The light source 41 divided into the upper light source 41A and the lower light source 41B is separated from the head 1A so that the upper light source 41A cannot be blotted, and the shaft portion 1B of the DUT 1 approaches to increase the contrast. The entire device under test 1 can be imaged by the camera 42 as a clear silhouette. However, the light source of the first inspection unit does not necessarily need to be divided into the upper light source and the lower light source, and can irradiate light on both the head and the shaft as a planar light source on the same plane.

  The surface light source irradiates the DUT 1 with white light, or irradiates the DUT 1 with light such as red, blue, and green. As the light source 41, a light emitting diode, a cold cathode tube, or a light bulb can be used. However, the surface light source irradiates the device under test 1 uniformly on these surfaces. The surface light source may have a structure used for a liquid crystal backlight or the like. Since the surface light source can uniformly irradiate light on the entire DUT 1, the inspection accuracy of the DUT 1 can be increased. However, in the inspection apparatus of the present invention, the light source is not necessarily a surface light source, and a point light source can also be used.

  The light source 41 of the first inspection unit 40A is disposed inside the penetrating part 10 provided in the disk 2. The light source 41 is disposed so as to irradiate light from the inner side of the disk 2 toward the outer periphery and to irradiate light toward the device under test 1 of the guide unit 3. The camera 42 is disposed outside the disk 2, receives light emitted from the light source 41 toward the device under test 1, images the device under test 1 as a silhouette image, and outputs a video signal. .

  The first inspection unit shown in the figure has a light source 41 in the penetrating part 10 of the disk 2 and a camera 42 on the outside of the disk 2, but the first inspection part has a camera inside the penetrating part of the disk. It is also possible to arrange the light source outside the disk. This inspection apparatus is arranged so that the light source emits light from the outside to the inside of the disk and irradiates the test object of the guide part. Light emitted from the light source toward the device under test is received by the camera, and the camera images the device under test as a silhouette image and outputs a video signal. The test object 1 is inspected by performing arithmetic processing on the video signal output from the camera with an arithmetic inspection device.

  The camera 42 receives the contours of the plurality of devices under test 1 as silhouette images, and outputs the image signals of the silhouettes of the plurality of devices under test 1 to the arithmetic tester 43. For example, as shown in FIG. 13, the camera 42 images three test objects at the same time, and outputs the video signals to the arithmetic and inspection unit 43. The arithmetic inspector 43 calculates the input video signal and inspects the three test objects 1 at the same time. In this way, the apparatus that images a plurality of devices under test 1 together and performs arithmetic processing by the operation tester 43 shortens the time for inspecting one device under test 1 and allows a large amount of objects to be tested in a short time. The test body 1 can be inspected. However, the camera can image two or four or more test objects together and output a video signal to the arithmetic tester. Also, the camera can image one test object and output the video signal. Can also be output to the arithmetic tester.

  The camera 42 images the device under test 1 in synchronization with a timing signal output from a position sensor 44 that detects the position of the guide portion 3 of the disk 2. In this structure, since the camera 42 images the device under test 1 in synchronization with the rotational position of the disk 2, the camera 42 can always image the device under test 1 at a fixed position. The position sensor 42 detects a concave portion and a convex portion of the guide portion 3 with light and outputs a timing signal, or detects a convex portion between the guide portions 3 with light and outputs a timing signal. The unit 3 is detected by light and a timing signal is output. The position sensor can also detect a magnetic signal indicating a position provided on the disk and output a timing signal.

  The light source 41 blinks in synchronization with the timing signal output from the position sensor 44 or is continuously lit. The light source 41 blinking in synchronization with the timing signal of the position sensor 44 is turned on when the camera 42 images the device under test 1 and is turned off when the camera 42 does not image the device under test 1. A device that turns on the light source 41 in synchronization with the timing when the camera 42 images the device under test 1 can shorten the lighting time of the light source 41 and can clearly image the moving device under test 1.

  The arithmetic tester 43 calculates the total length of the device under test 1, the length of the shaft 1B, the height of the head 1A, the outer diameter of the head 1A, and the mountain diameter of the shaft 1B from the video signal input from the camera 42. And the valley diameter, the lead angle of the DUT 1, the tip sharpness of the shaft portion 1B, the plating state of the DUT 1, and the like. From the calculated result, if the test object to be inspected is a standard test object, it is determined as a normal test object, and if it is a non-standard test object, it is determined as a non-standard test object.

  The non-standard specimen is separated from the normal specimen by the removing means 45. The removing means 45 removes the standard outer test specimen detected by the arithmetic and inspection device 43 when it reaches the removal position. The removal means 45 is ejected from the removal sensor 46, the removal nozzle 47, and the removal nozzle 47. And an open / close valve 48 as a control member of the removal nozzle 47 for controlling the air flow.

  When transferring the test specimens side by side, it is convenient to remove the non-standard test specimens by transferring them by a predetermined distance rather than immediately removing them at the detection position. In order to realize this, it is detected how many test objects exist at the position to detect pass / fail of the test object and the position to remove the non-standard test object, and pass through the removal position. What is necessary is just to determine whether the to-be-tested object to remove is removed.

  The removal sensor 46 detects that the nonstandard test specimen has come to a fixed position. The removal sensor 46 outputs this to the arithmetic and inspection device 43 when a standard outer specimen to be removed passes in front of the removal nozzle 47. The arithmetic tester 43 controls an on-off valve 48 connected between the removal nozzle 47 and the air source 16. The arithmetic tester 43 opens the on-off valve 48 so as to inject air toward the standard outer test specimen, and removes the standard outer test specimen with an air flow.

  As shown in FIG. 14, the removal sensor 46 includes a light receiving body 50 that receives the light beam emitted from the light source 49, and the DUT 1 comes to a fixed position when the light from the light source 49 is blocked by the head 1A. Detect that. Accordingly, the light source 49 emits a light beam toward the radial direction of the disk 2 and toward the head 1A, and the photoreceptor 50 is positioned between the light source 49 and the light source 49 in front of the light beam emitted from the light source 49. It is disposed at a position sandwiching 1A. The removal sensor 46 having this structure detects that the incident light from the light source 49 has decreased when the head 1A comes between the light source 49 and the light receiver 50, and the device under test 1 is in a fixed position. Detect that you came to.

  The output signal of the photoreceptor 50 is sent to the arithmetic tester 43. When the DUT 1 is a non-standard DUT, the on-off valve 48 is opened and air is injected from the removal nozzle 47. When the DUT is a good DUT, the on-off valve 48 is not opened, that is, the removal nozzle 47 is air. Is sent to the next process by the guide 3 of the disk 2.

  When air is ejected from the removal nozzle 47, the standard outer specimen is immediately blown off from the guide portion 3 of the disk 2 and sent to the removal guide 51 as shown in FIGS. 14 and 15. When air is not blown out from the removal nozzle 47, the normal test object passes through the front of the removal nozzle 47 and then inclines toward the traveling direction and hits the extraction arm 52 disposed in the passage of the test object 1. As a result, the product is fed into the non-defective guide 53.

  By the way, as shown in FIG. 14, generally, the removal sensor 46 and the removal nozzle 47 are arranged somewhat apart from each other. Therefore, the on-off valve 48 for controlling the air injection of the removal nozzle 47 is opened with a delay for the time period during which the device under test 1 moves from the removal sensor 46 to the front of the removal nozzle 47, and opens one device under test 1. After the air is blown out in a pulsed manner for the time to blow off, the valve is closed.

  As described above, the inspection apparatus according to the present invention has a considerably high processing capacity per time while feeding the test object to the continuously rotating disk without stopping the rotation of the disk, and the test object is clogged. It has a number of features, such as the ability to minimize failures such as easy maintenance and handling.

1 is a schematic plan view of an inspection apparatus for a device under test previously developed by the inventor. FIG. It is a perspective view which shows the state which a some to-be-tested object clogs in the guide which expands, and becomes a bridge | bridging. 1 is a schematic plan view of an inspection device inspection device according to an embodiment of the present invention. It is an expansion perspective view which shows the link mechanism of the inspection apparatus shown in FIG. It is an enlarged plan view of the guide and shutter of the inspection apparatus shown in FIG. FIG. 5 is an enlarged plan view showing a state in which the guide and the shutter shown in FIG. FIG. 4 is a cross-sectional view taken along line AA showing a rotation mechanism of the inspection apparatus shown in FIG. 3. It is a schematic plan view of the inspection apparatus concerning the other Example of this invention. It is an enlarged plan view of the inspection apparatus shown in FIG. It is sectional drawing which shows another example of a supply mechanism. FIG. 4 is a vertical sectional view showing a first inspection part of the inspection mechanism shown in FIG. 3. FIG. 4 is a vertical sectional view showing a second inspection part of the inspection mechanism shown in FIG. 3. It is a figure which shows the image of the to-be-tested object which the 1st test | inspection part imaged. It is an enlarged plan view which shows the removal means of the inspection apparatus shown in FIG. It is an expanded sectional view which shows the state in which the removal nozzle shown in FIG.

Explanation of symbols

1 ... DUT 1A ... head
DESCRIPTION OF SYMBOLS 1B ... Shaft part 2 ... Disk 3 ... Guide part 4 ... Supply mechanism 5 ... Guide 5A ... End edge 6 ... Rotating mechanism 7 ... Shutter 8 ... Transfer gap 9 ... Transfer part 10 ... Through part 11 ... Roller 11A ... Drive roller
DESCRIPTION OF SYMBOLS 11B ... Support roller 12 ... Supply guide 13 ... Side wall 14 ... Nozzle 15 ... On-off valve 16 ... Air source 17 ... Motor 18 ... Link mechanism 19 ... Base 20 ... Rotating shaft 21 ... Elastic body 22 ... Connecting piece 23 ... Gap adjustment screw 24 ... Stopper piece 25 ... Fixing arm 26 ... Support base 27 ... Connecting rod 30 ... Guide base 31 ... Reciprocating mechanism 32 ... Drive arm 33 ... Elastic body 34 ... Fixing base 35 ... Rotating shaft 36 ... Positioning stopper 37 ... Position adjustment screw 38 ... Pressing screw 39 ... Connecting arm 40 ... Inspection mechanism 40A ... First inspection part
40B ... 2nd inspection part 41 ... Light source 41A ... Upper light source
41B ... Lower light source 42 ... Camera 43 ... Calculation tester 44 ... Position sensor 45 ... Removing means 46 ... Removal sensor 47 ... Removal nozzle 48 ... Open / close valve 49 ... Light source 50 ... Receptor 51 ... Removal guide 52 ... Removal arm 53 ... Good Guide 81 ... Screw 82 ... Disc 85 ... Guide 88 ... Transfer gap 91 ... Screw 92 ... Disc 93 ... Recess 94 ... Supply guide 95 ... Guide 96 ... Nozzle 98 ... Transfer gap

Claims (4)

A disk (2) provided on the outer periphery with guide portions (3) for transferring the test object (1) at a predetermined interval, and a rotating mechanism (6) for rotating the disk (2) A supply mechanism (4) for supplying the specimen (1) to the guide part (3) of the disk (2), and the target guided to the guide part (3) of the disk (2) by the supply mechanism (4). The test body (1) is placed close to the outer periphery of the disk (2) so that the test body (1) is positioned on the guide (3), and between the outer periphery of the disk (2), the test object (1) A guide (5) forming a transfer gap (8) narrower than the outer diameter,
The test object (1) is supplied from the supply mechanism (4) to the guide part (3) of the disk (2), and the disk (2) is rotated to inspect the test object (1) of the guide part (3). An inspection device for a device under test,
The guide (5) is arranged so that the transfer gap (8) with the disk (2) can be widened, and the shutter that stops the transfer of the DUT (1) in conjunction with this guide (5) (7) is provided on the discharge side of the supply mechanism (4),
The test object (1) supplied from the supply mechanism (4) to the transfer gap (8) and not guided by the guide (3) expands the guide (5), and the expanded guide (5) A device for inspecting a device under test configured to control the shutter (7) so as to stop the transfer of the sample (1).   The supply mechanism (4) arranges the DUTs (1) in a line and supplies them to the guide part (3) of the disk (2), and the DUT (1) And a nozzle (14) for transferring the gas to the disk (2) with an air flow.   The guide (5) and the shutter (7) are connected by a link mechanism (18), and this link mechanism (18) is supplied from the supply mechanism (4) to the transfer gap (8) to the guide section (3). When the guide (5) is expanded by the untested test object (1), the shutter (7) is controlled by the expanded guide (5) to stop the transfer of the test object (1). An inspection apparatus for a device under test described in claim 1. A shutter (7) is disposed between the discharge side of the supply mechanism (4) and the outer periphery of the disk (2), and this shutter (7) reciprocates in the tangential direction of the disk (2) to supply The inspection apparatus for a test object according to claim 1, wherein the transfer of the test object (1) from the mechanism (4) is stopped.

Images