JP5728395B2 - Cylinder inner peripheral surface inspection optical system and cylinder inner peripheral surface inspection device - Google Patents

Cylinder inner peripheral surface inspection optical system and cylinder inner peripheral surface inspection device Download PDF

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JP5728395B2
JP5728395B2 JP2012002565A JP2012002565A JP5728395B2 JP 5728395 B2 JP5728395 B2 JP 5728395B2 JP 2012002565 A JP2012002565 A JP 2012002565A JP 2012002565 A JP2012002565 A JP 2012002565A JP 5728395 B2 JP5728395 B2 JP 5728395B2
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inner peripheral
peripheral surface
light
cylinder
convex lens
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JP2013142596A (en
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千恵 豊田
千恵 豊田
塚田 敏彦
敏彦 塚田
加藤 覚
覚 加藤
松原 弘幸
弘幸 松原
宏明 佐々木
宏明 佐々木
良雄 横山
良雄 横山
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Denso Corp
Toyota Central R&D Labs Inc
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Toyota Central R&D Labs Inc
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本発明は、円筒内周面検査用光学系及び円筒内周面検査装置に関する。   The present invention relates to a cylindrical inner peripheral surface inspection optical system and a cylindrical inner peripheral surface inspection device.

従来より、孔内面の鋳巣、疵、バリ等の結果を検出する円筒孔検査装置が知られている(特許文献1)。この円筒孔検査装置は、円筒の孔内面を照明するための照明手段と、照明手段によりの照明光を伝達する導光手段と、導候手段よりの照明光を孔内に照射する照明照射手段と、画像反射手段を有し、照明照射手段より照射される照明の照射角度と孔内面にて反射されて画像反射手段に入射する画像の入射角度とが略正反射となるよう構成された内視鏡と、内視鏡及び画像伝達手段を介して撮像手段より撮像された孔の内面の画像から欠陥検出手段と備えている。   2. Description of the Related Art Conventionally, a cylindrical hole inspection device that detects results such as a cast hole, a flaw, and a burr on the inner surface of a hole is known (Patent Document 1). This cylindrical hole inspection apparatus includes an illuminating means for illuminating the inner surface of a cylindrical hole, a light guiding means for transmitting illumination light from the illuminating means, and an illumination irradiating means for irradiating illumination light from the weather guiding means into the hole. And the image reflection means, and the illumination angle irradiated from the illumination irradiation means and the incident angle of the image reflected on the inner surface of the hole and incident on the image reflection means are substantially regular reflections. A defect detection unit is provided from an image of the inner surface of the hole imaged by the imaging unit through the endoscope and the endoscope and the image transmission unit.

特開2008−233715号公報JP 2008-233715 A

上記の特許文献1に記載の技術では、照明照射手段より照射される照明の照射角度と孔内面にて反射された画像反射手段に入射する画像の入射角度とが略正反射となるよう構成する必要がある。   In the technique described in Patent Document 1, the illumination angle irradiated from the illumination irradiation unit and the incident angle of the image incident on the image reflection unit reflected by the inner surface of the hole are configured to be substantially regular reflection. There is a need.

しかしながら、上記特許文献1に記載の光学系では、被検査対象の円筒内に、先端に反射光学系を備えた検査プローブを位置決め精度良く挿入することは難しく、芯ずれや傾いて挿入される場合が多い。   However, in the optical system described in Patent Document 1, it is difficult to insert an inspection probe having a reflection optical system at the tip into the cylinder to be inspected with high positioning accuracy, and the case is inserted with a misalignment or an inclination. There are many.

このとき、上記特許文献1に記載の光学系では、プローブが芯ずれや傾いて挿入されることにより、円筒の内壁面での反射方向が正反射の光学系からずれた方向へ反射されるため、画像全体が暗く撮像され、その部分に巣やキズなどの欠陥がある場合にも、それらを検出することが難しくなってしまう、という問題がある。   At this time, in the optical system described in Patent Document 1, when the probe is inserted with a misalignment or inclination, the reflection direction on the inner wall surface of the cylinder is reflected in a direction deviated from the regular reflection optical system. However, even when the entire image is captured darkly and there is a defect such as a nest or a flaw in the portion, it is difficult to detect them.

また、芯ずれや傾きを防ぐためには、高価な位置決め装置を導入し、微妙な調整の元でプローブを挿入させる必要が生じるため、検査スピードを速くすることができない。   Further, in order to prevent misalignment and inclination, it is necessary to introduce an expensive positioning device and insert a probe under fine adjustment, so that the inspection speed cannot be increased.

本発明は、上記事情を鑑みて成されたものであり、本発明の目的は、検査装置の円筒内への光学系位置決めのずれに対してロバストで、円筒の内周面に亘って画像化することができる円筒内周面検査用光学系及び円筒内周面検査装置を提供することにある。   The present invention has been made in view of the above circumstances, and an object of the present invention is to provide robust imaging against the displacement of the optical system positioning in the cylinder of the inspection apparatus and to image the inner peripheral surface of the cylinder. It is an object of the present invention to provide a cylindrical inner peripheral surface inspection optical system and a cylindrical inner peripheral surface inspection device that can be used.

上記目的を達成するために本発明に係る円筒内周面検査用光学系は、円筒内を照明するための光源と、前記光源からの照明光を、前記円筒内であって、かつ、前記円筒と同軸な光となるように導光する導光部と、前記導光部により導光された照明光の開口を制限するための絞り部と、前記導光部により導光され、かつ、前記絞り部により制限された照明光の拡散を防止するように集光する凸レンズ部と、前記凸レンズ部によって集光された照明光を前記円筒の内周面に亘って反射させると共に、前記内周面からの反射光を、前記円筒内を撮像する撮像装置へ反射させる凸面状の反射鏡と、前記反射鏡により反射された照明光を前記内周面に照射すると共に前記内周面からの反射光を集光して受光するための、前記内周面に対向して設けられた対物凸レンズ部と、を含んで構成されている。   In order to achieve the above object, a cylindrical inner surface inspection optical system according to the present invention includes a light source for illuminating a cylinder and illumination light from the light source in the cylinder and the cylinder. A light guide part that guides light so as to be coaxial with the light, a diaphragm part for limiting an opening of illumination light guided by the light guide part, guided by the light guide part, and A convex lens part that condenses light to prevent diffusion of illumination light limited by the diaphragm part, and reflects the illumination light condensed by the convex lens part over the inner peripheral surface of the cylinder, and the inner peripheral surface A convex reflecting mirror that reflects the reflected light from the image to the imaging device that images the inside of the cylinder, and illumination light reflected by the reflecting mirror is applied to the inner peripheral surface and the reflected light from the inner peripheral surface Is provided opposite to the inner peripheral surface for collecting and receiving light. It is configured to include a thing convex portion.

本発明によれば、光源からの照明光が、導光部、絞り部、凸レンズ部、凸面状の反射鏡、及び対物凸レンズ部を介して、円筒の内周面に亘って照射される。そして、内周面からの反射光が、対物凸レンズ部、凸面状の反射鏡、凸レンズ部、及び絞り部を介して、撮像装置へ入射され、撮像装置によって、円筒内が撮像される。   According to the present invention, the illumination light from the light source is irradiated over the inner peripheral surface of the cylinder via the light guide unit, the diaphragm unit, the convex lens unit, the convex reflecting mirror, and the objective convex lens unit. Then, the reflected light from the inner peripheral surface enters the imaging device via the objective convex lens portion, the convex reflecting mirror, the convex lens portion, and the aperture portion, and the inside of the cylinder is imaged by the imaging device.

このように、凸面状の反射鏡によって、照明光を前記円筒の内周面に亘って反射させると共に、対物凸レンズ部によって、内周面からの反射光を集光して受光し、凸面状の反射鏡によって、円筒内を撮像する撮像装置へ反射させることにより、検査装置の円筒内への光学系位置決めのずれに対してロバストで、円筒の内周面に亘って画像化することができる。   In this way, the convex reflecting mirror reflects the illumination light over the inner peripheral surface of the cylinder, and the objective convex lens unit collects and receives the reflected light from the inner peripheral surface. By reflecting the image inside the cylinder with the reflecting mirror to the imaging device, it is possible to form an image over the inner peripheral surface of the cylinder, which is robust against the displacement of the optical system positioning in the cylinder of the inspection device.

上記の絞り部は、開口の大きさを調整可能とすることができる。開口の大きさによって、検査対象の円筒内周面に投射される検査光の角度広がりが制御される。これによって、検査の感度を調整することができる。   The aperture portion can be adjusted in opening size. The angular spread of the inspection light projected on the inner peripheral surface of the inspection target cylinder is controlled by the size of the opening. Thereby, the sensitivity of the inspection can be adjusted.

上記の円筒内周面検査用光学系は、前記光源からの照明光の拡散を防止するよう集光する照明用凸レンズ部を更に含み、前記導光部は、前記照明用凸レンズによって集光された照明光を、前記円筒内であって、かつ、前記円筒と同軸な光となるように導光することができる。   The cylindrical inner surface inspection optical system further includes an illumination convex lens portion that condenses light to prevent diffusion of illumination light from the light source, and the light guide portion is condensed by the illumination convex lens. Illumination light can be guided so as to be light within the cylinder and coaxial with the cylinder.

上記の導光部は、前記対物凸レンズ部、前記反射鏡、前記凸レンズ部、及び前記絞り部を介して入射された、前記内周面からの反射光を透過し、前記撮像装置には、前記導光部を透過した前記内周面からの反射光が入射されるようにすることができる。   The light guide unit transmits reflected light from the inner peripheral surface that is incident through the objective convex lens unit, the reflecting mirror, the convex lens unit, and the diaphragm unit, and the imaging device includes The reflected light from the inner peripheral surface that has passed through the light guide portion can be incident.

本発明に係る円筒内周面検査装置は、上記の円筒内周面検査用光学系と、前記円筒の内周面を検査するための画像として、前記円筒内を表わす画像を撮像する撮像装置とを含んで構成されている。   A cylindrical inner peripheral surface inspection apparatus according to the present invention includes the above-described cylindrical inner peripheral surface inspection optical system, and an imaging device that captures an image representing the inside of the cylinder as an image for inspecting the inner peripheral surface of the cylinder. It is comprised including.

本発明に係る円筒内周面検査用光学系及び円筒内周面検査装置によれば、凸面状の反射鏡によって、照明光を前記円筒の内周面に亘って反射させると共に、対物凸レンズ部によって、内周面からの反射光を集光して受光し、凸面状の反射鏡によって、円筒内を撮像する撮像装置へ反射させることにより、検査装置の円筒内への光学系位置決めのずれに対してロバストで、円筒の内周面に亘って画像化することができる、という効果がある。   According to the cylindrical inner peripheral surface inspection optical system and the cylindrical inner peripheral surface inspection device according to the present invention, the illumination light is reflected across the inner peripheral surface of the cylinder by the convex reflecting mirror, and by the objective convex lens unit. The reflected light from the inner peripheral surface is collected and received, and reflected to the imaging device that images the inside of the cylinder by the convex reflecting mirror, thereby preventing the optical system from being misaligned in the cylinder of the inspection device. Thus, there is an effect that the image can be imaged over the inner peripheral surface of the cylinder.

本発明の実施の形態に係る円筒内周面検査装置の概略構成図である。It is a schematic block diagram of the cylindrical inner peripheral surface inspection apparatus which concerns on embodiment of this invention. 同軸落射照明を説明するための図である。It is a figure for demonstrating coaxial epi-illumination. 撮像画像の一例であり、欠陥とその周りのみを切り出した図である。It is an example of a captured image, and is a diagram in which only a defect and its periphery are cut out. 反射鏡及び対物凸レンズ部における照射光および反射光の光路を示す図である。It is a figure which shows the optical path of the irradiation light and reflected light in a reflective mirror and an objective convex-lens part. (A)軸ずれがない場合における照射光および反射光の光路を示す図、及び(B)軸ずれが生じた場合における照射光および反射光の光路を示す図である。(A) The figure which shows the optical path of irradiation light and reflected light in the case where there is no axial shift, (B) The figure which shows the optical path of irradiation light and reflected light in the case where axial deviation arises. (A)、(B)絞り部の開口の大きさを調整した場合における照射光および反射光の光路を示す図である。(A), (B) It is a figure which shows the optical path of irradiation light and the reflected light at the time of adjusting the magnitude | size of the opening of a stop part. 欠陥モデルを示す図である。It is a figure which shows a defect model. シミュレーションにより得られた撮像画像の一部を示す図である。It is a figure which shows a part of captured image obtained by simulation. 軸ずれがない場合における撮像画像を示す図である。It is a figure which shows the captured image in case there is no axis shift. 軸ずれを許容した場合における撮像画像を示す図である。It is a figure which shows the picked-up image in the case of accept | permitting axial deviation.

以下、図面を参照して本発明の実施の形態の一例を詳細に説明する。   Hereinafter, an example of an embodiment of the present invention will be described in detail with reference to the drawings.

図1は本発明の実施の形態に係る円筒内周面検査装置の概略構成図である。図1に示すように、本実施の形態に係る円筒内周面検査装置10は、円筒孔を有する検査対象物12を保持する保持具14と、円筒孔の内面を照明するための光源16と、光源16からの照明光の拡散を防止するよう集光する照明用凸レンズ18と、照明用凸レンズ18により集光された照明光を、円筒孔に導光し、かつ、検査対象物12の円筒孔と同軸な光となるように反射させるビームスプリッタ20と、ビームスプリッタ20を透過した光を集光するカメラ用凸レンズ22と、カメラ用凸レンズ22を介して、検査対象物12の円筒孔内を撮像する撮像装置24と、ビームスプリッタ20により反射された照明光の開口を制限するための絞り部26と、ビームスプリッタ20により反射され、かつ、絞り部26により制限された照明光を集光して、照明光を検査対象物12の円筒孔の内周面に亘って照射すると共に内周面からの反射光を集光する複合レンズ28と、撮像装置24により撮像された画像に画像処理を施し、欠陥の検出を行うコンピュータ30とを備えている。なお、ビームスプリッタが、導光部の一例であり、光源16、照明用凸レンズ18、ビームスプリッタ20、絞り部26、及び複合レンズ28が、円筒内周面検査用光学系の一例である。   FIG. 1 is a schematic configuration diagram of a cylindrical inner peripheral surface inspection apparatus according to an embodiment of the present invention. As shown in FIG. 1, the cylindrical inner peripheral surface inspection apparatus 10 according to the present embodiment includes a holder 14 that holds an inspection object 12 having a cylindrical hole, and a light source 16 that illuminates the inner surface of the cylindrical hole. The illumination convex lens 18 for condensing the illumination light from the light source 16 and the illumination light collected by the illumination convex lens 18 are guided to the cylindrical hole and the cylinder of the inspection object 12 A beam splitter 20 that reflects light so as to be coaxial with the hole, a camera convex lens 22 that condenses the light transmitted through the beam splitter 20, and the cylindrical hole of the inspection object 12 through the camera convex lens 22. An imaging device 24 for imaging, a diaphragm unit 26 for limiting the opening of the illumination light reflected by the beam splitter 20, and illumination light reflected by the beam splitter 20 and limited by the diaphragm unit 26 Condensing and irradiating illumination light over the inner peripheral surface of the cylindrical hole of the inspection object 12 and condensing the reflected light from the inner peripheral surface, and an image captured by the imaging device 24 And a computer 30 that performs image processing and detects defects. The beam splitter is an example of a light guide unit, and the light source 16, the illumination convex lens 18, the beam splitter 20, the diaphragm unit 26, and the compound lens 28 are examples of a cylindrical inner surface inspection optical system.

検査対象物12は、例えば、内面が金属面となっている、φ14mm、深さ25mmの円筒孔を有している。   The inspection object 12 has, for example, a cylindrical hole of φ14 mm and a depth of 25 mm, whose inner surface is a metal surface.

また、円筒内周面検査装置10では、光源16より照射される照明光が、円筒孔と同軸な照明となるように、円筒孔内に照射される。これによって、光源16より照射される照明光の照射角度と円筒孔の内周面にて反射されて撮像装置24に入射する反射光の入射角度とが略正反射となる。また、円筒内周面検査装置10は、複合レンズ28を円筒孔の深さ方向に挿入するための移動機構(図示省略)に固定されており、移動機構により、複合レンズ28が検査対象物12の円筒孔の位置に移動したときに、円筒孔の深さ方向に挿入される。   Moreover, in the cylindrical inner peripheral surface inspection apparatus 10, the illumination light irradiated from the light source 16 is irradiated into the cylindrical hole so that the illumination is coaxial with the cylindrical hole. As a result, the illumination angle of the illumination light emitted from the light source 16 and the incident angle of the reflected light that is reflected by the inner peripheral surface of the cylindrical hole and enters the imaging device 24 are substantially regular reflections. Further, the cylindrical inner surface inspection device 10 is fixed to a moving mechanism (not shown) for inserting the compound lens 28 in the depth direction of the cylindrical hole, and the compound lens 28 is inspected by the moving mechanism. When it moves to the position of the cylindrical hole, it is inserted in the depth direction of the cylindrical hole.

絞り部26は、照明光の開口の大きさを調整可能に構成されている。例えば、絞り部26は、人手により開口の大きさが調整可能な機構を有している。   The diaphragm 26 is configured to be able to adjust the size of the opening of the illumination light. For example, the diaphragm portion 26 has a mechanism capable of adjusting the size of the opening manually.

複合レンズ28は、ビームスプリッタ20により反射され、かつ、絞り部26により制限された照明光を集光する凸椀状の凸レンズ部28Aと、凸レンズ部28Aによって集光された照明光を円筒孔の内周面に亘って反射させると共に、内周面からの反射光を、撮像装置24へ反射させる凸曲面状の反射鏡28Bと、反射鏡28Bにより反射された照明光を円筒孔の内周面に照射すると共に内周面からの反射光を集光して受光するための、円筒孔の内周面に対向して設けられた対物凸レンズ部28Cとを組み合わせて構成されている。凸曲面状の反射鏡28Bについては、例えば、凸椀状の反射鏡が、複合レンズ28の下面(凸レンズ部28Aと反対側の面)に形成されている。   The compound lens 28 includes a convex lens-shaped convex lens portion 28A that condenses the illumination light reflected by the beam splitter 20 and limited by the diaphragm 26, and the illumination light condensed by the convex lens portion 28A. A convex curved reflecting mirror 28B that reflects the inner peripheral surface and reflects the reflected light from the inner peripheral surface to the imaging device 24, and the illumination light reflected by the reflecting mirror 28B is the inner peripheral surface of the cylindrical hole. And an objective convex lens portion 28C provided opposite to the inner peripheral surface of the cylindrical hole for condensing and receiving the reflected light from the inner peripheral surface. Regarding the convex curved reflector 28B, for example, a convex reflector is formed on the lower surface of the compound lens 28 (the surface opposite to the convex lens portion 28A).

次に、円筒内周面検査装置10の動作について説明する。検査対象物12は、保持具14により保持され、規定位置に位置決めされると、複合レンズ28が検査対象物12の円筒孔内に挿入されるように、移動機構により円筒内周面検査装置10が移動する。   Next, operation | movement of the cylindrical inner peripheral surface inspection apparatus 10 is demonstrated. When the inspection object 12 is held by the holder 14 and positioned at the specified position, the cylindrical inner peripheral surface inspection apparatus 10 is moved by the moving mechanism so that the compound lens 28 is inserted into the cylindrical hole of the inspection object 12. Move.

そして、光源16から照射された照明光は、照明用凸レンズ18、ビームスプリッタ20、絞り部26、凸レンズ部28A、反射鏡28B、及び対物凸レンズ部28Cを介して、検査対象物12の円筒孔の内周面に亘って照射される。そして、光源16からの照明光は、検査対象物12の円筒孔の内周面にて反射され、対物凸レンズ部28Cを介して、反射鏡28Bに入射および反射して、凸レンズ部28A、絞り部26、ビームスプリッタ20、及びカメラ用凸レンズ22を介して撮像装置24に入射され、撮像装置24により、検査対象物の円筒孔内が撮像される。また、凸面上の反射鏡28Bにより、円筒孔の内周面に亘って広視野に撮像される。   The illumination light emitted from the light source 16 passes through the convex lens 18 for illumination, the beam splitter 20, the diaphragm unit 26, the convex lens unit 28A, the reflecting mirror 28B, and the objective convex lens unit 28C. Irradiated over the inner peripheral surface. Then, the illumination light from the light source 16 is reflected on the inner peripheral surface of the cylindrical hole of the inspection object 12, and is incident on and reflected by the reflecting mirror 28B via the objective convex lens portion 28C, thereby forming the convex lens portion 28A and the diaphragm portion. 26, the beam splitter 20, and the camera convex lens 22, and enters the imaging device 24, and the imaging device 24 images the inside of the cylindrical hole of the inspection object. Further, the image is taken in a wide field of view over the inner peripheral surface of the cylindrical hole by the reflecting mirror 28B on the convex surface.

このとき、円筒孔の内面に自然巣や疵、くぼみなどの欠陥部分Aがあると、図2に示すように、欠陥部分Aにより正反射光が散乱するため、反射鏡28Bに入射する光量が減少し、結果として、図3に示すように、撮像装置24により暗部(背景光)となって撮像される。   At this time, if there is a defect portion A such as a natural nest, a flaw or a dent on the inner surface of the cylindrical hole, the specularly reflected light is scattered by the defect portion A as shown in FIG. As a result, as shown in FIG. 3, the image pickup device 24 picks up an image as a dark portion (background light).

コンピュータ30は、撮像装置24によって撮像された画像から、明暗より欠陥候補を切り出し、欠陥であるか否かを判定することにより、欠陥の検出を行う。   The computer 30 detects a defect by cutting out a defect candidate from light and dark from an image captured by the imaging device 24 and determining whether or not it is a defect.

また、対物凸レンズ部28Cによって、検査対象物12の円筒孔の内周面に対する垂直から少し傾いた、内周面の反射光を集光して、反射鏡28Bを介して撮像装置24へ向かうようにする。これによって、検査対象物12の円筒孔の内周面に垂直な光(図5(A)参照)だけでなく、図5(B)に示すように、検査対象物12の円筒孔の内周面に対する垂直方向から少しだけ傾いて入射する光も撮像装置24の撮像面で結像させることができる。従って、円筒内周面検査装置10が、検査対象物12の円筒孔の軸に対して少しだけ傾いている場合であっても、検査対象物12の円筒孔の内周面での反射光が、反射鏡28Bを介して撮像装置24へ向かう。   Further, the reflected light of the inner peripheral surface, which is slightly inclined from the perpendicular to the inner peripheral surface of the cylindrical hole of the inspection object 12, is collected by the objective convex lens portion 28C, and is directed to the imaging device 24 via the reflecting mirror 28B. To. As a result, not only the light perpendicular to the inner peripheral surface of the cylindrical hole of the inspection object 12 (see FIG. 5A) but also the inner periphery of the cylindrical hole of the inspection object 12 as shown in FIG. Light incident with a slight inclination from the direction perpendicular to the surface can also be imaged on the imaging surface of the imaging device 24. Therefore, even if the cylindrical inner peripheral surface inspection device 10 is slightly inclined with respect to the axis of the cylindrical hole of the inspection object 12, the reflected light on the inner peripheral surface of the cylindrical hole of the inspection object 12 is reflected. To the imaging device 24 via the reflecting mirror 28B.

また、図6(A)、(B)に示すように、絞り部26の開口の大きさを変更することにより、開口絞りによる、検査対象物12の円筒孔の内周面の反射光の拡散度合いを制御することができる。ここで、円筒孔の内周面の反射光の拡散度合いは、検出する欠陥(凹み)の度合いに対応するため、絞り部26の開口の大きさを調整することにより、検出感度を制御することができる。   Also, as shown in FIGS. 6A and 6B, by changing the size of the aperture of the aperture 26, the diffused reflected light on the inner peripheral surface of the cylindrical hole of the inspection object 12 by the aperture aperture. The degree can be controlled. Here, since the degree of diffusion of the reflected light on the inner peripheral surface of the cylindrical hole corresponds to the degree of the defect (dent) to be detected, the detection sensitivity is controlled by adjusting the size of the aperture of the diaphragm portion 26. Can do.

次に、本実施の形態に係る円筒内周面検査光学系を模擬した光学シミュレーションと、円筒内周面検査装置を用いて実験サンプルを作成して実験を行った結果について説明する。   Next, a description will be given of an optical simulation that simulates the cylindrical inner peripheral surface inspection optical system according to the present embodiment, and results of experiments performed by creating experimental samples using the cylindrical inner peripheral surface inspection device.

まず、図7に示すような、円筒孔の内周面にφ0.2mm、フチ角度2.5度とする微小欠陥を等間隔に配置したモデルに対して、同軸照射照明により円筒孔の内周面を撮像するシミュレーションを行った。撮像画像を4分割した左下部分を、図8に示す。2つの円周の間が、観察する円周内面部分である。上記図8に示すように、微小欠陥が、撮像画像によって捉えられていることがわかった。   First, as shown in FIG. 7, the inner periphery of the cylindrical hole is illuminated by coaxial illumination for a model in which minute defects having a diameter of 0.2 mm and a border angle of 2.5 degrees are arranged at equal intervals on the inner peripheral surface of the cylindrical hole. A simulation of imaging the surface was performed. FIG. 8 shows a lower left portion obtained by dividing the captured image into four parts. Between the two circumferences is a circumferential inner surface portion to be observed. As shown in FIG. 8 described above, it was found that minute defects were captured by the captured image.

また、図9に示すような、検査対象物の円筒の内周面上に凹が存在する場合に、±0.1mm以内(±0.5度以内)の軸ずれを許容して、撮像画像を取得した。図10に、得られた撮像画像を示す。上記図10に示すように、±0.1mm以内の軸ずれが生じても、円筒の内周面上のゴミ及び穴を正しく検出できることがわかった。   In addition, when there is a recess on the inner peripheral surface of the cylindrical object to be inspected as shown in FIG. 9, an axis deviation within ± 0.1 mm (within ± 0.5 degrees) is allowed, and the captured image Acquired. FIG. 10 shows the obtained captured image. As shown in FIG. 10, it was found that dust and holes on the inner peripheral surface of the cylinder can be correctly detected even if an axial deviation within ± 0.1 mm occurs.

以上説明したように、本発明の実施の形態に係る円筒内周面検査装置によれば、凸曲面状の反射鏡によって、照明光を円筒の内周面に亘って反射させると共に、対物凸レンズ部によって、内周面からの反射光を集光して受光し、凸曲面状の反射鏡によって、円筒内を撮像する撮像装置へ反射させることにより、検査装置の円筒内への光学系位置決めのずれに対してロバストで、円筒の内周面の全周を表わす画像を撮像することができる。   As described above, according to the cylindrical inner peripheral surface inspection apparatus according to the embodiment of the present invention, the convex light reflecting mirror reflects the illumination light over the inner peripheral surface of the cylinder and the objective convex lens portion. The optical system positioning in the cylinder of the inspection device is shifted by condensing and receiving the reflected light from the inner peripheral surface and reflecting it to the imaging device that images the inside of the cylinder by the convex curved reflector. On the other hand, an image representing the entire circumference of the inner circumferential surface of the cylinder can be taken.

凸椀状の反射鏡により円筒の内周面に亘って一度に撮像することにより、1回の撮像で円筒内面を周状にさらに深さ方向にも幅広く画像化することができる。   By capturing an image over the inner peripheral surface of the cylinder at once with the convex-shaped reflecting mirror, the inner surface of the cylinder can be imaged in the circumferential direction and further in the depth direction with a single imaging.

円筒内壁面に対して垂直に照射して反射光を撮像する光学系とすることで、傷、凹みによる内壁面の傾き変化を光強度の変化として感度良く捉えることができる。例えば、円筒内壁面内の傾き2.5度以上、大きさ0.2mm以上となる傷・凹みを高感度に検出することができる。   By adopting an optical system that captures reflected light by irradiating perpendicularly to the cylindrical inner wall surface, it is possible to capture the change in the inclination of the inner wall surface due to scratches and dents as a change in light intensity with high sensitivity. For example, it is possible to detect with high sensitivity scratches or dents having an inclination of 2.5 degrees or more and a size of 0.2 mm or more in the inner wall surface of the cylinder.

また、対物凸レンズ部で光を集光することで、位置ずれによる傾きの影響を低減している。これによって、検査装置の円筒内への光学系位置決めのずれに対してロバストとなり、例えば、挿入時の傾きが0.5度程度発生しても、傷・凹みを画像としてS/N良く撮像することができる。   Moreover, the influence of the inclination by position shift is reduced by condensing light with the objective convex lens part. As a result, the optical system positioning in the cylinder of the inspection apparatus is robust, and, for example, even if an inclination at the time of insertion occurs about 0.5 degrees, a scratch / dent is imaged with good S / N as an image. be able to.

また、絞り部の開口の大きさを調整することにより、傷・凹みの検出感度を調整することができる。   Moreover, the detection sensitivity of a flaw / dent can be adjusted by adjusting the size of the aperture of the diaphragm.

なお、上記の実施の形態では、絞り部が、照明光の開口の大きさを調整可能に構成されている場合を例に説明したが、これに限定されるものではなく、絞り部を取替え可能に構成してもよい。この場合には、開口の大きさが異なる絞り部を用いることにより、照明光の開口の大きさを調整することができる。   In the above embodiment, the case where the diaphragm unit is configured to be able to adjust the size of the opening of the illumination light has been described as an example. However, the present invention is not limited to this, and the diaphragm unit can be replaced. You may comprise. In this case, the aperture size of the illumination light can be adjusted by using the apertures having different aperture sizes.

また、複合レンズを用いた場合を例に説明したが、これに限定されるものではなく、凸椀状の凸レンズ部、凸曲面状の反射鏡、及び対物凸レンズ部をそれぞれ別個に設けてもよい。   Further, the case where a compound lens is used has been described as an example. However, the present invention is not limited to this, and a convex-convex convex lens portion, a convex curved reflector, and an objective convex lens portion may be provided separately. .

また、複合レンズの反射鏡として、凸曲面状の反射鏡を用いる場合を例に説明したが、これに限定されるものではなく、例えば、照明光を円筒の内周面に亘って反射させる凸面状(例えば、円錐状)の反射鏡を用いてもよい。   Moreover, although the case where the convex-curved reflector is used as the reflector of the compound lens has been described as an example, the invention is not limited to this. For example, a convex surface that reflects illumination light over the inner peripheral surface of the cylinder A reflector (for example, a cone) may be used.

また、ビームスプリッタを用いて、光源からの照明光を円筒内に導光する場合を例に説明したが、これに限定されるものではなく、ビームスプリッタ以外の導光手段を用いて、光源からの照明光を円筒内に導光するようにしてもよい。   Further, the case where the illumination light from the light source is guided into the cylinder by using the beam splitter has been described as an example, but the present invention is not limited to this, and the light source from the light source by using a light guiding means other than the beam splitter is used. The illumination light may be guided into the cylinder.

10 円筒内周面検査装置
12 検査対象物
16 光源
18 照明用凸レンズ
20 ビームスプリッタ
22 カメラ用凸レンズ
24 撮像装置
26 絞り部
28 複合レンズ
28A 凸レンズ部
28B 反射鏡
28C 対物凸レンズ部
DESCRIPTION OF SYMBOLS 10 Cylindrical inner surface inspection apparatus 12 Inspection object 16 Light source 18 Illumination convex lens 20 Beam splitter 22 Camera convex lens 24 Imaging apparatus 26 Aperture part 28 Compound lens 28A Convex lens part 28B Reflective mirror 28C Objective convex lens part

Claims (6)

円筒内を照明するための光源と、
前記光源からの照明光を、前記円筒内であって、かつ、前記円筒と同軸な光となるように導光する導光部と、
前記導光部により導光された照明光の開口を制限するための絞り部と、
前記導光部により導光され、かつ、前記絞り部により制限された照明光の拡散を防止するように集光する凸レンズ部と、
前記凸レンズ部によって集光された照明光を前記円筒の内周面に亘って反射させると共に、前記内周面からの反射光を、前記円筒内を撮像する撮像装置へ反射させる凸面状の反射鏡と、
前記反射鏡により反射された照明光を前記内周面に照射すると共に前記内周面からの反射光を集光して受光するための、前記内周面に対向して設けられた対物凸レンズ部であって、かつ、前記内周面に対して、前記反射鏡により反射された照明光を前記内周面に垂直に照射すると共に前記内周面からの正反射光を集光して受光するように設けられた前記対物凸レンズ部と、
を含み、前記撮像装置には、前記対物凸レンズ部が受光した前記内周面からの前記正反射光が入射される円筒内周面検査用光学系。
A light source for illuminating the inside of the cylinder;
A light guide that guides illumination light from the light source so as to be light in the cylinder and coaxial with the cylinder;
A diaphragm for limiting the opening of the illumination light guided by the light guide;
A convex lens part that is guided by the light guide part and condenses to prevent diffusion of illumination light limited by the diaphragm part;
A convex reflector that reflects the illumination light collected by the convex lens portion over the inner peripheral surface of the cylinder and reflects the reflected light from the inner peripheral surface to an imaging device that images the inside of the cylinder. When,
An objective convex lens portion provided opposite to the inner peripheral surface for irradiating the inner peripheral surface with the illumination light reflected by the reflecting mirror and condensing and receiving the reflected light from the inner peripheral surface In addition, the illumination light reflected by the reflecting mirror is applied to the inner peripheral surface perpendicularly to the inner peripheral surface, and the regular reflection light from the inner peripheral surface is collected and received. The objective convex lens part provided as follows:
Only contains, in the imaging device, the cylindrical inner peripheral surface examination optical system for regular reflected light is incident from said inner circumferential surface of the objective lens unit has received.
前記絞り部は、開口の大きさを調整可能とした請求項1記載の円筒内周面検査用光学系。   The cylindrical inner peripheral surface inspection optical system according to claim 1, wherein the aperture portion is adjustable in opening size. 前記光源からの照明光の拡散を防止するよう集光する照明用凸レンズ部を更に含み、
前記導光部は、前記照明用凸レンズによって集光された照明光を、前記円筒内であって、かつ、前記円筒と同軸な光となるように導光する請求項1又は2記載の円筒内周面検査用光学系。
Further comprising a convex lens portion for illumination for condensing to prevent diffusion of illumination light from the light source,
The inside of the cylinder according to claim 1 or 2, wherein the light guide unit guides the illumination light collected by the illumination convex lens so as to be light in the cylinder and coaxial with the cylinder. Optical system for surface inspection.
前記導光部は、前記対物凸レンズ部、前記反射鏡、前記凸レンズ部、及び前記絞り部を介して入射された、前記内周面からの反射光を透過し、
前記撮像装置には、前記導光部を透過した前記内周面からの反射光が入射される請求項1〜請求項3の何れか1項記載の円筒内周面検査用光学系。
The light guide part transmits the reflected light from the inner peripheral surface, which is incident through the objective convex lens part, the reflecting mirror, the convex lens part, and the diaphragm part,
The cylindrical inner peripheral surface inspection optical system according to any one of claims 1 to 3, wherein reflected light from the inner peripheral surface that has passed through the light guide portion is incident on the imaging device.
前記凸レンズ部、前記反射鏡、及び前記対物凸レンズ部は、前記凸レンズ部、前記反射鏡、及び前記対物凸レンズ部を組み合わせて構成された複合レンズ部によって形成され、
前記反射鏡は、前記凸レンズ部が形成されている、前記複合レンズ部の面の反対側の面に形成されている請求項1〜請求項の何れか1項記載の円筒内周面検査用光学系。
The convex lens part, the reflecting mirror, and the objective convex lens part are formed by a compound lens part configured by combining the convex lens part, the reflecting mirror, and the objective convex lens part,
The reflecting mirror, the convex portion is formed, for the cylindrical inner peripheral surface according to any one of the composite lens of the claims 1 are formed on the surface opposite to the surface 4 test Optical system.
請求項1〜請求項の何れか1項記載の円筒内周面検査用光学系と、
前記円筒の内周面を検査するための画像として、前記円筒内を表わす画像を撮像する撮像装置と、
を含む円筒内周面検査装置。
The cylindrical inner peripheral surface inspection optical system according to any one of claims 1 to 5 ,
As an image for inspecting the inner peripheral surface of the cylinder, an imaging device that captures an image representing the inside of the cylinder;
Cylindrical inner surface inspection device.
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