JP2007218867A - Linewidth-measuring device having macro-viewing functionality - Google Patents

Linewidth-measuring device having macro-viewing functionality Download PDF

Info

Publication number
JP2007218867A
JP2007218867A JP2006042882A JP2006042882A JP2007218867A JP 2007218867 A JP2007218867 A JP 2007218867A JP 2006042882 A JP2006042882 A JP 2006042882A JP 2006042882 A JP2006042882 A JP 2006042882A JP 2007218867 A JP2007218867 A JP 2007218867A
Authority
JP
Japan
Prior art keywords
macro
measuring device
rod lens
needed
viewing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2006042882A
Other languages
Japanese (ja)
Other versions
JP4911675B2 (en
Inventor
Takahiro Shimizu
高博 清水
Shogo Kosuge
正吾 小菅
Satoshi Hirokawa
智 廣川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Kokusai Electric Inc
Original Assignee
Hitachi Kokusai Electric Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Kokusai Electric Inc filed Critical Hitachi Kokusai Electric Inc
Priority to JP2006042882A priority Critical patent/JP4911675B2/en
Publication of JP2007218867A publication Critical patent/JP2007218867A/en
Application granted granted Critical
Publication of JP4911675B2 publication Critical patent/JP4911675B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a size measuring device which avoids (1) a large space is needed for a macro illumination section in a conventional macro viewing mechanism by an enlargement of a substrate, (2) a structure is complicated, in order to make a sample table itself which carries a large-sized glass substrate incline, (3) a space for making the sample table incline is also needed, (4) a design man-days and production time or the adjustment time are increased, large cost is needed, which system also becomes large, and which can realize macro-viewing functionality and which is small, low cost and can be used readily. <P>SOLUTION: The linewidth-measuring device comprises a migration potential macro truck which carries a measuring object. Moreover, a rod lens which diffuses light which exists from an optical source, and the light which passed along this rod lens is reflected, and in order that the measuring object is irradiated for macro viewing, its position and its angle are made adjustable. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、大型ガラス基板のパターン線幅や間隔を TV カメラ等の二次元センサを用いて非接触で寸法測定する装置におけるマクロ観察機能の方式改良に関するものである。   The present invention relates to a method for improving a macro observation function in an apparatus for measuring the pattern line width and interval of a large glass substrate in a non-contact manner using a two-dimensional sensor such as a TV camera.

図1を参照して従来技術の説明を行う。図1は、従来のマクロ観察機能を備えた基本的な寸法測定装置の構成を説明するための図である。
寸法測定装置の基本的な構成としては、被測定対象物を搭載するためのステージ部 1 と、ステージ部 1 を覆う安全カバー 2 と、被測定対象物を拡大するための光学顕微鏡 3 と、拡大された被測定対象物の空間像を撮像する TV カメラ 4 と、TV カメラ 4 が撮像した空間像から画像処理寸法測定演算やステージ制御等を行う測定制御処理部 5 とから構成される。
被測定対象物は、例えば、液晶基板や PDP( Plasma Display Panel )基板で代表される FPD( Flat Panel Display )等の大型ガラス基板である。
The prior art will be described with reference to FIG. FIG. 1 is a diagram for explaining the configuration of a basic dimension measuring apparatus having a conventional macro observation function.
The basic configuration of the dimension measuring device consists of a stage part 1 for mounting the object to be measured, a safety cover 2 for covering the stage part 1, an optical microscope 3 for enlarging the object to be measured, and an enlargement. The TV camera 4 that captures the aerial image of the measured object and the measurement control processing unit 5 that performs image processing dimension measurement calculation, stage control, and the like from the aerial image captured by the TV camera 4.
The object to be measured is, for example, a large glass substrate such as an FPD (Flat Panel Display) represented by a liquid crystal substrate or a PDP (Plasma Display Panel) substrate.

上記の寸法測定装置において、マクロ観察を行うためには、ステージ部 1 の試料台 18 上に固定された被検査対象基板に光を照射するためのマクロ照明部 6 と被検査対象物を傾斜させる機構が必要になる。図1の例では、寸法測定装置の天井部分に取付けられているのがマクロ照明部 6 である。
従来のマクロ照明部 6 は、光源ランプ 7 、反射ミラー 8 、及び、均一照明を得るためのフレネルレンズ 9 などを使用していた。このため、装置の天井部分にかなり大きなスペースを必要としていた。
In the above dimension measuring apparatus, in order to perform macro observation, the macro illumination unit 6 for irradiating light to the substrate to be inspected fixed on the sample stage 18 of the stage unit 1 and the object to be inspected are inclined. A mechanism is required. In the example of FIG. 1, the macro illumination unit 6 is attached to the ceiling portion of the dimension measuring device.
The conventional macro illumination unit 6 uses a light source lamp 7, a reflection mirror 8, a Fresnel lens 9 for obtaining uniform illumination, and the like. For this reason, a considerably large space is required in the ceiling portion of the apparatus.

次に図1の試料台 18 部分に構築されているのが、被検査対象物を傾斜させるための機構である。従来は、被検査対象物を傾斜させるために、大型ガラス基板等の被検査対象物を搭載するステージ部 1 の試料台 18 自体を傾斜させていた(傾斜させた試料台 18′参照)。このため、試料台 18 の構造が複雑になる上に試料台 18 を傾斜させるための制御系なども必要となる。
マクロ検査のための装置としては、例えば、特許文献1に記載がある。
Next, a mechanism for tilting the object to be inspected is constructed on the sample stage 18 in FIG. Conventionally, in order to incline the object to be inspected, the sample stage 18 itself of the stage unit 1 on which the object to be inspected such as a large glass substrate is mounted is inclined (see the inclined sample stage 18 '). For this reason, the structure of the sample stage 18 becomes complicated, and a control system for tilting the sample stage 18 is also required.
An apparatus for macro inspection is described in Patent Document 1, for example.

特開2003−315273号公報JP 2003-315273 A

従来のマクロ観察機構では、マクロ照明部に大きなスペースを必要とすることと、大型ガラス基板を搭載する試料台自体を傾斜させるために構造が複雑で、試料台を傾斜させるための空間も必要になり、設計工数や製作時間、または調整時間が多くなり、高額な費用が必要になる上、装置も大きくなってしまう問題がある。
本発明の目的は、上記問題を解決し、小さく、安価で、簡易的に使用できるマクロ観察機能を実現できる寸法測定装置を提供することにある。
The conventional macro observation mechanism requires a large space for the macro illumination part, and the structure is complicated to tilt the sample stage itself on which a large glass substrate is mounted, and a space for tilting the sample stage is also required. Therefore, there are problems that the number of man-hours for design, production time, and adjustment time increase, which requires a high cost and increases the size of the apparatus.
An object of the present invention is to provide a dimension measuring apparatus that solves the above-described problems and that can realize a macro observation function that is small, inexpensive, and easy to use.

上記目的を達成するため、本発明のマクロ観察機能を備えた線幅測定装置は、マクロ照明部にライトガイド光源装置を使用し、ライトガイド取付部(出射口)に均一照明を得られるロッドレンズを取付けたものである。   In order to achieve the above object, a line width measuring apparatus having a macro observation function according to the present invention uses a light guide light source device for a macro illumination unit, and a rod lens capable of obtaining uniform illumination at a light guide mounting unit (emission port). Is attached.

即ち、本発明のマクロ観察機能を備えた線幅測定装置は、被測定対象物を搭載する移動可能なマクロ台車を備えたことを特徴とする。
また、本発明のマクロ観察機能を備えた線幅測定装置は、光源から出射する光を拡散するロッドレンズと、該ロッドレンズを通った光を反射し、マクロ観察のために被測定対象物に照射するために自在に位置と角度を調整可能であることを特徴とする。
That is, the line width measuring apparatus having the macro observation function of the present invention is characterized by including a movable macro carriage on which a measurement object is mounted.
The line width measuring apparatus having the macro observation function of the present invention also reflects a rod lens that diffuses the light emitted from the light source and the light that has passed through the rod lens to the object to be measured for macro observation. The position and angle can be freely adjusted for irradiation.

本発明によれば、大型のフレネルレンズを不要とすることができた。また、ステージ部とは全く別置きで、大型ガラス基板を搭載し傾斜させるためにマクロ台車を使用することで、小型で、ステージの試料台を傾斜させることなく、簡易的なマクロ観察を実現する装置を提供することができた。
更に、ロッドレンズ付きライトガイド光源装置と別置きマクロ台車を採用することにより、装置自体の構造もシンプルになり、装置外形寸法が小さくできる上に費用が軽減できた。
According to the present invention, a large Fresnel lens can be dispensed with. In addition, by using a macro carriage to mount and tilt a large glass substrate that is completely separate from the stage section, it is small and realizes simple macro observation without tilting the stage sample stage. The equipment could be provided.
Further, by adopting a separately installed macro carriage with a light guide light source device with a rod lens, the structure of the device itself is simplified, the external dimensions of the device can be reduced, and the cost can be reduced.

本発明の一実施例を図2〜図4を参照して説明する。図2は、本発明に適用する光源装置を示す図、図3は、本発明の一実施例の大型ガラス基板を搭載するマクロ台車を示す図、図4は、本発明の一実施例の寸法測定装置全体の構成を説明するための図である。   An embodiment of the present invention will be described with reference to FIGS. 2 is a diagram showing a light source device applied to the present invention, FIG. 3 is a diagram showing a macro carriage mounted with a large glass substrate according to one embodiment of the present invention, and FIG. 4 is a dimension of one embodiment of the present invention. It is a figure for demonstrating the structure of the whole measuring apparatus.

図4に示すように、装置の安全カバー 2′の上部にマクロ照明部 16 を設ける。マクロ照明部16 には、ライトガイド光源装置(図2参照)10 を使用し、ライトガイド取付部(出射口)19 に均一照明を得られるロッドレンズ11 を取付ける。   As shown in FIG. 4, a macro illumination unit 16 is provided on the upper part of the safety cover 2 'of the apparatus. A light guide light source device (see FIG. 2) 10 is used for the macro illumination unit 16, and a rod lens 11 capable of obtaining uniform illumination is attached to the light guide mounting unit (exit port) 19.

更に、反射ミラー 20 を設け、ロッドレンズ出射口を反射ミラー方向に向けて設置する。反射ミラー 20 は、ステージ搬入口 21 付近に光が照射できるように位置や角度が調整できる機構とする。
また、ライトガイド光源装置 10 の出射口 19 にはリモート制御可能なフィルタ切替機構を設け、フィルタを切替えることで色々な波長の光を照射することができる。
Further, a reflection mirror 20 is provided, and the rod lens emission port is set toward the reflection mirror. The reflection mirror 20 is a mechanism whose position and angle can be adjusted so that light can be irradiated near the stage entrance 21.
In addition, the exit port 19 of the light guide light source device 10 is provided with a remotely controllable filter switching mechanism, and light of various wavelengths can be irradiated by switching the filter.

大型ガラス基板を搭載するマクロ台車の一実施例を図3に示す。図3(a) はマクロ台車 12 を側面から見た図、図3(b) はマクロ台車 12 を正面から見た図、図3(c) はマクロ台車 12 のベースプレート(試料台)13 付近の図、図3(d) はマクロ台車 12 のベースプレート 13 と基板固定用ガイド 14 を説明する図である。その他、31 は水平線方向(床面)、32 は垂直線方向( PASS LINE )、33 はマクロ台車 12 を移動させるためのキャスター、34 はベースプレート 13 の傾斜角度を固定するロックレバー、35 は制限タイロッド、36 は角度変更用取手、37 は調整角度範囲、38 はガススプリングを示す。   FIG. 3 shows an example of a macro carriage equipped with a large glass substrate. 3 (a) is a view of the macro carriage 12 from the side, FIG. 3 (b) is a view of the macro carriage 12 from the front, and FIG. 3 (c) is a view of the vicinity of the base plate (sample stand) 13 of the macro carriage 12. FIG. 3 and FIG. 3 (d) are views for explaining the base plate 13 and the substrate fixing guide 14 of the macro carriage 12. In addition, 31 is in the horizontal direction (floor surface), 32 is in the vertical direction (PASS LINE), 33 is a caster for moving the macro carriage 12, 34 is a lock lever for fixing the inclination angle of the base plate 13, and 35 is a limit tie rod 36 is an angle changing handle, 37 is an adjustment angle range, and 38 is a gas spring.

図3において、マクロ台車 12 は、大型ガラス基板(図示しない)を搭載し、クランプ固定できる。また、大型ガラス基板を搭載したベースプレート 13 を傾斜させることが可能であり、基板固定用ガイド 14 はフレキシブルに基板サイズに合せてベースプレート 13 を可動するので、あらゆるサイズの基板を搭載することができる。   In FIG. 3, the macro carriage 12 can be clamped and mounted with a large glass substrate (not shown). In addition, the base plate 13 on which a large glass substrate is mounted can be tilted, and the substrate fixing guide 14 can move the base plate 13 according to the substrate size flexibly, so that substrates of any size can be mounted.

図4において、装置ステージのガントリー 15 を一番奥へ移動させておき、大型ガラス基板を搭載したマクロ台車 12 を移動してワーク搬入口 21 に挿入し、マクロ照明 6′を点灯する。
照明の明るさ調整やフィルタ変更などは全て測定制御処理部 5′の測定制御アプリケーションソフトにより図示しない表示画面を見ながら、図示しない操作器を用いてオペレータによる操作が可能である。
In FIG. 4, the gantry 15 of the apparatus stage is moved to the innermost position, the macro carriage 12 loaded with a large glass substrate is moved and inserted into the work entrance 21, and the macro illumination 6 'is turned on.
The illumination brightness adjustment and filter change can all be performed by an operator using an operation device (not shown) while viewing a display screen (not shown) using the measurement control application software of the measurement control processing unit 5 '.

ワーク搬入口 21 には、エリアセンサ 17 を設け、マクロ台車 12 挿入中にはステージが動かないようインターロックをかけて安全を確保している。
このような構成によって、装置内に挿入したマクロ台車 12 のベースプレート 13 を観察し易い角度に傾斜させ、照明の明るさやフィルタなどを調整しながらマクロ観察を行うことができる。
An area sensor 17 is provided at the work carry-in port 21 and an interlock is provided to ensure safety so that the stage does not move while the macro carriage 12 is inserted.
With such a configuration, it is possible to perform macro observation while tilting the base plate 13 of the macro carriage 12 inserted into the apparatus at an angle that allows easy observation, and adjusting the brightness of the illumination, the filter, and the like.

上記のように、ロッドレンズ付きライトガイド光源装置と別置きマクロ台車を採用することにより、装置自体の構造もシンプルになり、装置外形寸法が小さくできる上に設計、製作、及び調整の費用を軽減できる。   As described above, the light guide light source device with the rod lens and the separately mounted macro carriage simplify the structure of the device itself, reduce the external dimensions of the device, and reduce the cost of design, production, and adjustment. it can.

なお、本発明の装置で、線幅測定を行う場合には、図4におけるステージ部 1′の試料台上に被測定対象物であるガラス基板を搭載して測定を行う。   When the line width measurement is performed with the apparatus of the present invention, the measurement is performed by mounting the glass substrate as the object to be measured on the sample stage of the stage portion 1 ′ in FIG.

従来のマクロ観察機能を備えた寸法測定装置の構成を説明するための図。The figure for demonstrating the structure of the dimension measuring apparatus provided with the conventional macro observation function. 本発明に適用する光源装置を示す図。The figure which shows the light source device applied to this invention. 本発明の一実施例のマクロ台車を示す図。The figure which shows the macro trolley | bogie of one Example of this invention. 本発明の一実施例の寸法測定装置全体の構成を説明するための図。The figure for demonstrating the structure of the whole dimension measuring apparatus of one Example of this invention.

符号の説明Explanation of symbols

1,1′:ステージ部、 2,2′:安全カバー、 3:光学顕微鏡、 4:TV カメラ、 5,5′:測定制御処理部、 6,6′:マクロ照明部、 7:光源ランプ、 8:反射ミラー、 9:フレネルレンズ、 10:ライトガイド光源装置、 11:ロッドレンズ、 12:マクロ台車、 13:ベースプレート、 14:基板固定用ガイド、 15:ガントリー、 16:マクロ照明部、 17:エリアセンサ、 18,18′:試料台、 19:ライトガイド取付部、 20:反射ミラー、 21:ステージ搬入口、 31:水平線方向、 32:PASS LINE、 33:キャスター、 34:ロックレバー、 35:制限タイロッド、 36:角度変更用取手、 37:調整角度範囲、 38:ガススプリング。   1, 1 ': Stage part, 2, 2': Safety cover, 3: Optical microscope, 4: TV camera, 5, 5 ': Measurement control processing part, 6, 6': Macro illumination part, 7: Light source lamp, 8: Reflection mirror, 9: Fresnel lens, 10: Light guide light source device, 11: Rod lens, 12: Macro carriage, 13: Base plate, 14: Guide for fixing board, 15: Gantry, 16: Macro illumination unit, 17: Area sensor, 18, 18 ': Sample stage, 19: Light guide mounting part, 20: Reflection mirror, 21: Stage inlet, 31: Horizontal direction, 32: PASS LINE, 33: Caster, 34: Lock lever, 35: Limit tie rod, 36: Handle for changing angle, 37: Adjustable angle range, 38: Gas spring.

Claims (2)

マクロ観察機能を備えた線幅測定装置において、被測定対象物を搭載する移動可能なマクロ台車を備えたことを特徴とするマクロ観察機能を備えた線幅測定装置。 A line width measuring apparatus having a macro observation function, wherein the line width measuring apparatus has a macro observation function. The line width measuring apparatus has a macro observation function. 請求項1記載のマクロ観察機能を備えた線幅測定装置において、光源から出射する光を拡散するロッドレンズと、該ロッドレンズを通った光を反射し、マクロ観察のために被測定対象物に照射するために自在に位置と角度を調整可能であることを特徴とするマクロ観察機能を備えた線幅測定装置。 2. A line width measuring apparatus having a macro observation function according to claim 1, wherein a rod lens for diffusing light emitted from a light source and light passing through the rod lens are reflected to an object to be measured for macro observation. A line width measuring device having a macro observation function, wherein the position and angle can be freely adjusted for irradiation.
JP2006042882A 2006-02-20 2006-02-20 Line width measuring device with macro observation function Active JP4911675B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006042882A JP4911675B2 (en) 2006-02-20 2006-02-20 Line width measuring device with macro observation function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006042882A JP4911675B2 (en) 2006-02-20 2006-02-20 Line width measuring device with macro observation function

Publications (2)

Publication Number Publication Date
JP2007218867A true JP2007218867A (en) 2007-08-30
JP4911675B2 JP4911675B2 (en) 2012-04-04

Family

ID=38496312

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006042882A Active JP4911675B2 (en) 2006-02-20 2006-02-20 Line width measuring device with macro observation function

Country Status (1)

Country Link
JP (1) JP4911675B2 (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62173731A (en) * 1986-01-28 1987-07-30 Toshiba Corp Inspection device for surface of article to be inspected
JPH0783624A (en) * 1993-09-10 1995-03-28 Idemitsu Material Kk Measurement method and device for strain of molding stamper
JPH0783845A (en) * 1993-09-17 1995-03-31 New Kurieishiyon:Kk Inspection device
JP2003315273A (en) * 2002-04-26 2003-11-06 Hitachi Kokusai Electric Inc Apparatus for visually inspecting plate-shaped object

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62173731A (en) * 1986-01-28 1987-07-30 Toshiba Corp Inspection device for surface of article to be inspected
JPH0783624A (en) * 1993-09-10 1995-03-28 Idemitsu Material Kk Measurement method and device for strain of molding stamper
JPH0783845A (en) * 1993-09-17 1995-03-31 New Kurieishiyon:Kk Inspection device
JP2003315273A (en) * 2002-04-26 2003-11-06 Hitachi Kokusai Electric Inc Apparatus for visually inspecting plate-shaped object

Also Published As

Publication number Publication date
JP4911675B2 (en) 2012-04-04

Similar Documents

Publication Publication Date Title
US20180143309A1 (en) Methods and Systems for LIDAR Optics Alignment
TWI518404B (en) Liquid crystal panel inspection apparatus
TW200909798A (en) Appearance inspecting device for substrate
TWI333544B (en) Substrate inspection apparatus
JP6068453B2 (en) Apparatus and method for repairing defects in electronic energy control or display devices
JP2002082067A (en) Substrate inspecting device
WO2014201719A1 (en) Detecting apparatus and detecting method
JP2015007575A (en) Liquid-crystal display panel inspection method, and liquid-crystal display panel inspection device
JP2008076218A (en) Visual inspection apparatus
JP2007248292A (en) Visual inspection device
JP2003270155A (en) Substrate holding device and inspection device
JP2010281626A (en) Device for inspecting optical characteristic
KR101758647B1 (en) Inspection apparatus of non-planar display panel
JP4911675B2 (en) Line width measuring device with macro observation function
JP6829828B2 (en) Lens appearance inspection device
JP6935262B2 (en) Visual inspection equipment
JP4755673B2 (en) Board inspection equipment
JP2007041601A (en) Cross-slide stage, and microscope system having cross-slide stage
JP2007271350A (en) Reference planar setting method for planar representation type display, and visibility angle measuring method
JP2007333449A (en) Inspection system
JP5938981B2 (en) Projection system
JP2007033240A (en) Flaw detecting method of sheet and flaw detector
JP2008064667A (en) Macro inspection device
JP2005241370A (en) Visual examination method
JP4389754B2 (en) Board inspection equipment

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20080925

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20110201

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20110208

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110407

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20120112

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20120113

R150 Certificate of patent or registration of utility model

Ref document number: 4911675

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20150127

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250