JP2007199044A5 - - Google Patents

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Publication number
JP2007199044A5
JP2007199044A5 JP2006044545A JP2006044545A JP2007199044A5 JP 2007199044 A5 JP2007199044 A5 JP 2007199044A5 JP 2006044545 A JP2006044545 A JP 2006044545A JP 2006044545 A JP2006044545 A JP 2006044545A JP 2007199044 A5 JP2007199044 A5 JP 2007199044A5
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JP
Japan
Prior art keywords
terahertz wave
terahertz
measured
specific frequency
contact type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006044545A
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English (en)
Japanese (ja)
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JP2007199044A (ja
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Publication date
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Priority to JP2006044545A priority Critical patent/JP2007199044A/ja
Priority claimed from JP2006044545A external-priority patent/JP2007199044A/ja
Publication of JP2007199044A publication Critical patent/JP2007199044A/ja
Publication of JP2007199044A5 publication Critical patent/JP2007199044A5/ja
Pending legal-status Critical Current

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JP2006044545A 2006-01-24 2006-01-24 テラヘルツ波式計測装置及び方法 Pending JP2007199044A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006044545A JP2007199044A (ja) 2006-01-24 2006-01-24 テラヘルツ波式計測装置及び方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006044545A JP2007199044A (ja) 2006-01-24 2006-01-24 テラヘルツ波式計測装置及び方法

Publications (2)

Publication Number Publication Date
JP2007199044A JP2007199044A (ja) 2007-08-09
JP2007199044A5 true JP2007199044A5 (https=) 2009-04-30

Family

ID=38453776

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006044545A Pending JP2007199044A (ja) 2006-01-24 2006-01-24 テラヘルツ波式計測装置及び方法

Country Status (1)

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JP (1) JP2007199044A (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4949976B2 (ja) * 2007-09-03 2012-06-13 トヨタ自動車株式会社 粒子状物質の捕集分布検出方法及び捕集分布検出装置と排ガス浄化装置
WO2009041393A1 (ja) * 2007-09-26 2009-04-02 Ishida Co., Ltd. 検査装置
JP5407794B2 (ja) * 2009-11-19 2014-02-05 日本電気株式会社 テラヘルツ光を用いた物質成分の解析装置及びテラヘルツ光を用いた物質成分の解析方法
KR101545419B1 (ko) 2011-02-10 2015-08-18 가부시키가이샤 히다치 하이테크놀로지즈 이물 검출 장치 및 이물 검출 방법
CN103335976B (zh) * 2013-06-04 2015-12-23 中国石油大学(北京) 利用太赫兹时域光谱检测硫酸盐、硝酸盐溶液浓度的方法
JP6595982B2 (ja) * 2014-03-28 2019-10-23 国立大学法人秋田大学 繊維鑑別方法
KR101737983B1 (ko) * 2015-09-10 2017-05-22 한국과학기술원 테라헤르츠 펄스 레이저를 이용한 구조물의 수분 측정장비
JP6930711B2 (ja) * 2017-11-20 2021-09-01 フロイント産業株式会社 錠剤測定装置
JP6875639B2 (ja) * 2017-11-30 2021-05-26 日本電信電話株式会社 水分量計測装置及び水分量計測方法
CN116423930A (zh) * 2023-03-08 2023-07-14 电子科技大学 一种基于Ti3C2Tx的多层波浪型太赫兹波超强吸收材料

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4755678A (en) * 1985-05-06 1988-07-05 The University Of Alabama Simultaneous measurement of moisture content and basis weight of paper sheet with a submillimeter laser
JP2005172774A (ja) * 2003-12-05 2005-06-30 Semiconductor Res Found 反射光学特性によって物性を測定する装置および測定方法
JP2005172779A (ja) * 2003-12-10 2005-06-30 Semiconductor Res Found 電磁波を照射してバクテリア、ウィルスおよび毒性物質を測定する方法および装置

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