JP2007055199A - Method and apparatus for manufacturing composite optical element - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method and an apparatus for manufacturing a composite optical element capable of suppressing an optical accuracy from lowering and fluctuating caused by the misalignment of the centers of an optical substrate and a formed plane. <P>SOLUTION: The method for manufacturing the composite optical element comprises a process for adjusting an axis according to an axis position of a formed plane 111a using an optical axis detecting means 112 capable of detecting an axis of a measuring plane form from a detecting distance along the optical axis corresponding to the measuring plane form of a measuring object, and with an auxiliary measuring plane 115a capable of being positioned with regard to the formed plane and of detecting the axis with the optical axis detecting means. In the process for adjusting an axis, the axis adjustment is performed on the basis of the result of detecting the axis of the auxiliary measuring plane, which is conducted in such a state that the optical axis detecting means is disposed at a position capable of detecting an optical plane La. The detection of the axis of the auxiliary measuring plane is conducted in such a state that the formed plane is nearer to a forming position k than when detecting the axis of the formed plane. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to a method and apparatus for manufacturing a composite optical element, and more particularly to a process for manufacturing a composite optical element in which an optical layer is formed on an optical substrate.

  In general, in order to obtain desired optical characteristics, a composite optical element may be formed by laminating an optical layer on an optical substrate such as a lens. For example, a composite optical element in which a resin layer made of a transparent resin is laminated on the surface of a glass lens formed by polishing or the like is known. When manufacturing such a composite optical element, an uncured resin material is placed between the optical substrate and the mold, and the resin material is molded on the molding surface of the mold by light irradiation or the like. The resin layer is formed by curing the resin material (for example, see Patent Document 1 below). In this case, before the molding, the axis adjustment of the mold (center misalignment) with respect to the optical substrate is performed so that the axial center of the optical surface of the optical substrate and the axis of the molding optical surface of the resin layer have a predetermined positional relationship. Adjustment).

  Conventionally, the axis adjustment of the mold is performed by using an eccentric microscope capable of detecting the axis of the measurement surface shape based on the light reflected by the measurement surface shape of the measurement object, and the axis of the optical surface of the optical substrate. And detecting the axis of the molding surface of the mold, and aligning both axes with a position adjusting means such as an XY stage.

On the other hand, a mold centering method of an optical element molding apparatus that manufactures a lens by molding a glass material heat-softened by upper and lower molds is known (for example, see Patent Document 2 below). The centering method of this mold is based on the reflected light of the molding surface of the mold held on the movable shaft among the upper and lower molds, and the reflection formed or installed on the adjustment mold other than the molding surface. The misalignment of the upper and lower molds is adjusted using the reflected light from the surface.
JP-A-7-308971 Japanese Patent Laid-Open No. 08-91855

  However, in the conventional method of adjusting the axis of the molding die, if the surface shape of the optical surface of the optical substrate is different from the surface shape of the molding surface of the molding die, the detection distance of the optical surface and the detection distance of the molding surface by the eccentric microscope Therefore, if you try to detect the axis of the optical surface and the molding surface using the same eccentric microscope fixed at a predetermined position, the die is placed at a location away from the molding position. I have to do it. If the axis detection of the molding surface is performed at the detection position separated from the molding position in this way, the molding die is molded from the detection position at the time of molding, even if there is no misalignment of the molding die at the detection position by adjusting the axis. Since it is necessary to move to the position, misalignment occurs during molding due to the guide accuracy of the guide mechanism for moving the mold, and this misalignment causes a decrease in the optical accuracy of the manufactured composite optical element and the optical characteristics. There is a problem that variations occur.

  The misalignment caused by the movement of the molding die can be avoided by performing both the axial center detection of the optical surface of the optical base and the axial center detection of the molding surface of the molding die at the molding position. Since the position of the eccentric microscope needs to be moved between the detection of the optical surface and the detection of the molding surface, the detection accuracy is impaired by the guide accuracy of the guide mechanism for moving the eccentric microscope. Therefore, misalignment occurs during molding as described above.

  On the other hand, in the mold centering method in the apparatus for molding the lens by the upper and lower molds, there is no description about the adjustment of the axis of the movable mold (lower mold) as a reference, and there is no description of the mold. There is no disclosure of a method for adjusting the axis to the optical axis. Therefore, if there is an inherent misalignment between the reference mold and the optical axis, this misalignment is directly reflected in the misalignment between the upper and lower molds.

  In this case, when adjusting the axis between the upper and lower molds, the axis of the movable mold is set to the reference position by, for example, matching the optical axis with the optical axis in advance, and then the adjustment side If the position of the mold is adjusted, the molding can be repeated as it is. However, in the case of forming an optical layer by molding an optical material on an optical substrate, the positioning part of the optical substrate and the optical Since there is some variation in the positional relationship of the surfaces, the axis of the optical surface is displaced each time the optical base material is supplied. Therefore, it is necessary to always adjust the axis of the optical surface before molding. Therefore, the axial center of the molding surface must be detected first, and the axial center of the supplied optical substrate must be detected and adjusted based on this axial center position. In order to eliminate this, it is necessary to fix the position of the eccentric microscope between the detection of the axis of the molding surface and the detection of the axis of the optical surface, and sequentially detect the axis of the optical surface at the same position. .

  Therefore, the present invention solves the above-mentioned problems, and the problem is that a method for producing a composite optical element capable of suppressing a decrease in optical accuracy and variations caused by misalignment between an optical substrate and a molding surface, and It is to provide a manufacturing apparatus.

  The method for manufacturing a composite optical element of the present invention is a method for manufacturing a composite optical element in which an optical layer having a molded optical surface formed by a molding surface is laminated on an optical substrate having an optical surface. Axis adjustment for adjusting the axis according to the axis position of the molding surface using an optical axis detection means capable of detecting the axis of the measurement surface shape at a detection distance in the optical axis direction corresponding to the target measurement surface shape And an auxiliary measurement surface that is positioned with respect to the molding surface and capable of detecting an axis by the optical axis detection means. In the axis adjustment step, the optical axis detection means The axis adjustment is performed based on the result of the axis detection of the auxiliary measurement surface performed in a state where the axis is located at a position where the axis can be detected, and the axis detection of the auxiliary measurement surface is performed on the molding surface. The molding surface is higher than the molding position when detecting the axis. Wherein the carried out that in close proximity to.

  According to this invention, when performing the axis adjustment, by detecting the axis of the auxiliary measurement surface positioned with respect to the molding surface, instead of detecting the axis of the molding surface by the optical axis detection means, Even if the detection distance between the molding surface and the optical surface by the optical axis detection means is greatly different, the position of the molding surface when detecting the axis of the auxiliary measurement surface can be brought close to the molding position. Therefore, since the movement distance of the molding surface required between the axis adjustment and molding can be reduced or eliminated, misalignment between the optical surface and the molding surface due to movement accuracy can be suppressed. .

  In this invention, it is preferable that the axial center detection of the said auxiliary | assistant measurement surface is performed in the state in which the said shaping | molding surface was arrange | positioned substantially in a shaping | molding position. According to this, since it is not necessary to move the molding surface between the axis adjustment and molding, it is possible to prevent the occurrence of misalignment due to the movement accuracy.

  Another method of manufacturing a composite optical element of the present invention is to manufacture a composite optical element in which an optical layer having a molded optical surface formed by a molding surface is laminated on an optical substrate having an optical surface. In the method, the axis adjustment according to the axis position of the molding surface using the optical axis detection means capable of detecting the axis of the measurement surface shape at the detection distance in the optical axis direction according to the measurement surface shape of the measurement object And an auxiliary measuring surface that is positioned with respect to the molding surface and capable of detecting the axis by the optical axis detecting means. The surface shape of the auxiliary measuring surface and the optical axis direction are provided. The position is a value obtained by adding a distance in the optical axis direction between the molding surface and the auxiliary measurement surface to the detection distance when detecting the axis of the auxiliary measurement surface, and when detecting the axis of the optical surface. The optical surface and the molding during molding at the detection distance of The absolute value of the difference (D115 + DA−DL−DB) with respect to the value obtained by adding the intervals in the optical axis direction detects the detection distance when detecting the axis of the molding surface and the axis of the optical surface. Is set to be smaller than the absolute value of the difference (D111-DL-DB) between the optical distance at the time of molding and the value obtained by adding the distance in the optical axis direction of the molding surface to the detected distance at In the adjustment step, the axis adjustment is performed based on a result of axial center detection on the auxiliary measurement surface by the optical axis detection means.

  According to this invention, when performing the axis adjustment, by detecting the axis of the auxiliary measurement surface positioned with respect to the molding surface, instead of detecting the axis of the molding surface by the optical axis detection means, Even if the detection distance to the optical surface and the molding surface by the optical axis detection means is greatly different, the molding surface is required between the axis adjustment and molding by configuring the auxiliary measurement surface as described above. Since the movement distance of the optical surface or the optical axis detection means can be reduced or eliminated, it is possible to suppress misalignment between the optical surface and the molding surface due to the movement accuracy of each part.

  In particular, a value (D115 + DA) obtained by adding the distance in the optical axis direction between the molding surface and the auxiliary measurement surface to the detection distance when detecting the axis of the auxiliary measurement surface, and the axis of the optical surface are detected. The surface shape of the auxiliary measurement surface and the direction of the optical axis so that the value (DL + DB) obtained by adding the distance in the optical axis direction of the optical surface and the molding surface at the time of molding substantially coincides with the detection distance at the time of molding Therefore, it is not necessary to move any of the molding surface, the optical surface, and the optical axis detecting means between the adjustment of the molding surface axis and the molding time. Generation of deviation can be prevented.

  Here, it is preferable that the axis measurement of the auxiliary measurement surface is performed in a state in which an auxiliary member having the auxiliary measurement surface is positioned and fixed with respect to a molding die having the molding surface. According to this, since the molding die and the auxiliary member are configured as separate members, the positioning and fixing can be easily performed with an appropriate structure according to the apparatus structure. The auxiliary measurement surface is preferably positioned coaxially with the molding surface. According to this, it is possible to perform the axis adjustment by using the result of the detection of the axis of the auxiliary measurement surface as it is as the axis position of the molding surface without any processing. Furthermore, it is preferable that the auxiliary member is configured to be detachable from the mold. By configuring the auxiliary member so that it can be attached to and removed from the mold, the auxiliary member can be attached to the mold during axis adjustment and the auxiliary member can be removed from the mold during molding. Therefore, it is possible to easily set a predetermined auxiliary measurement surface.

  In the axis adjustment step, it is preferable that the positional relationship between the axis of the auxiliary measurement surface and the optical axis of the optical axis detection means is adjusted. In the axis adjustment process, it is only necessary to adjust the axis according to the axis position of the molding surface in any way based on the detection of the axis of the auxiliary measurement surface. For example, the axis of the auxiliary measurement surface is set to a predetermined position. And adjusting the position of another member according to the axial center position of the auxiliary measurement surface. In particular, by adjusting the positional relationship between the axis of the auxiliary measurement surface and the optical axis of the optical axis detection means (for example, by aligning the axis of the auxiliary measurement surface or the molding surface with the optical axis), The optical surface and the molding surface can be aligned only by aligning the optical axis of the optical axis detection means and the axis of the optical surface.

  Furthermore, it is preferable that the auxiliary measurement surface is positioned on the axis of the molding surface. By positioning the auxiliary measurement surface on the axis of the molding surface, it is possible to detect the axis of the auxiliary measurement surface using the optical axis detection means as it is. In this case, it is more preferable that the axis of the auxiliary measurement surface is configured to coincide with the axis of the molding surface. According to this, it becomes possible to use the axis detection data of the auxiliary measurement surface as it is as the axis detection data of the molding surface.

  Next, the composite optical element manufacturing apparatus of the present invention is a composite optical element manufacturing apparatus in which an optical layer having a molded optical surface formed by a molding surface is laminated on an optical substrate having an optical surface. A support base that supports the optical base; a molding die that includes the molding surface; and a guide structure that guides at least one of the support base and the molding die in the direction of the optical axis in a manner in which the support base and the molding die can be separated from each other , An optical axis detection means capable of detecting the axis of the measurement surface shape at a detection distance in the optical axis direction according to the measurement surface shape of the measurement object, and the axis adjustment between the support base and the mold can be performed And an auxiliary measurement surface positioned with respect to the molding surface and capable of detecting the axis by the optical axis detection unit.

  In the present invention, a value obtained by adding a distance in the optical axis direction between the molding surface and the auxiliary measurement surface to the detection distance when detecting the axis of the auxiliary measurement surface, and the axis of the optical surface are detected. The absolute value of the difference (D115 + DA-DL-DB) between the optical surface at the time of molding and the value obtained by adding the distance in the optical axis direction of the molding surface to the detection distance at the time of detection detects the axis of the molding surface The difference between the detected distance at the time and the value obtained by adding the distance between the optical surface and the molding surface in the optical axis direction at the time of molding to the detection distance when detecting the axis of the optical surface (D111-DL- The surface shape and position of the auxiliary measurement surface are preferably set so as to be smaller than the absolute value of DB).

  Moreover, it is preferable that the said auxiliary | assistant means is comprised with the auxiliary member comprised so that attachment or detachment with respect to the said shaping | molding die was carried out, and also the axial center of the said auxiliary | assistant measurement surface and the said molding surface may correspond. preferable.

  According to the present invention, it is possible to reduce the misalignment caused by the movement accuracy by performing the axis adjustment based on the axial center detection of the auxiliary measurement surface positioned with respect to the molding surface, and thereby the composite optical element. The optical accuracy can be improved, and variations in optical characteristics can be reduced.

  Next, embodiments of a method and apparatus for manufacturing a composite optical element according to the present invention will be described in detail with reference to the accompanying drawings.

[Composite optical element manufacturing equipment]
First, with reference to FIG.1 and FIG.2, schematic structure of the manufacturing apparatus of the composite optical element of this embodiment is demonstrated. FIG. 1 is a schematic configuration diagram showing the overall configuration of the manufacturing apparatus 100, and FIG. 2 is an enlarged partial cross-sectional view showing the vicinity of a forming die and a support base of the manufacturing apparatus 100.

  The manufacturing apparatus 100 includes a support base 102, a mold fixing base 103, and a detection base 104 attached to a common frame 101. The support base 102 supports and fixes a lens base L as an optical base. The molding die 111 is fixed to the die fixing base 103, and the eccentric microscope 112, which is an optical axis detecting means, is fixed to the detection base 104. Here, the support table 102, the mold 111, and the eccentric microscope 112 are arranged along the optical axis 112X of the eccentric microscope 112 extending in the vertical direction in FIG.

  The support base 102 is attached to the frame 101 via a position adjustment mechanism 104 such as an XY table that can adjust the position. Accordingly, the support base 102 is configured to be positionally adjustable in a plane direction (horizontal direction) orthogonal to the optical axis 112X. The support base 102 includes a through hole 102a penetrating along the optical axis 112X, and is configured so that the lens base L can be installed in an attitude in which the optical surface La faces the opening range of the through hole 102a.

  The forming die 111 is fixed to the die fixing base 103 and includes a forming surface 111a facing in the direction of the optical axis 112X. The mold fixing base 103 is configured to be slidable with respect to the frame 101 by a guide mechanism (in the illustrated example, a pair of parallel guide rails and a guided portion guided by the guide rail) 105, and an optical axis 112X by a drive mechanism such as a ball screw. It is configured to be movable along. The mold fixing base 103 incorporates a tilt adjusting mechanism (not shown) of the mold 111.

  The eccentric microscope 112 irradiates illumination light emitted from the light source unit 112A toward the support base 102 and the mold 111 along the optical axis 112X, and at a detection distance corresponding to the measurement surface shape of an arbitrary measurement target. The detection light reflected and returned from the measurement surface is detected by the detection unit 112B, and the axial center position of the measurement surface can be obtained. The detection unit 112B of the eccentric microscope 112 is connected to a monitor 112C, and the axis P of the measurement surface is displayed on the display surface of the monitor 112C. The origin O in the display surface corresponds to the position of the optical axis 112X.

  The detection table 104 is configured to be slidable with respect to the frame 101 by a guide mechanism (a pair of parallel guide rails and a portion guided by the guide mechanism) 106, and along the optical axis 112X by a drive mechanism (not shown) or manually. It is configured to be movable. Further, the detection table 104 is provided with a tilt adjustment mechanism (not shown) of the eccentric microscope 112.

  The dispenser 113 supplies an optical material (transparent resin material) that is a material of an optical layer (resin layer) to be laminated on the lens base L, and is configured to be movable in the horizontal direction in the figure with respect to the frame 101. A certain amount of uncured optical material can be dropped from the nozzle 113 a onto the molding surface 111 a of the molding die 111 by moving from the retracted position to the molding die 111 side.

  The light irradiation unit 114 irradiates light (ultraviolet rays) to the uncured optical material laminated on the lens substrate L. The light irradiation unit 114 is configured to be movable in the horizontal direction in the figure with respect to the frame 101, and can move toward the lens base L from the irradiation port 114 a by moving from the retracted position to the support base 102 side. It is configured as follows.

  The mirror ring 107 increases the light condensing property when the light irradiation unit irradiates light such as ultraviolet rays, and the diffusion plate 108 is for ensuring the illuminance uniformity of the light. . The diffusing plate 108 is configured to be movable in a direction perpendicular to the paper surface of the drawing with respect to the frame 101, and retracts to a position that does not intersect the optical axis 112X except during light irradiation.

  In the apparatus 100 of the present embodiment, as shown in FIG. 2, a detection auxiliary body 115 is detachably attached to the mold 111. The detection assisting body 115 is configured to be positioned and fixed with high accuracy with respect to the mold 111. The detection auxiliary body 115 includes an auxiliary measurement surface 115a disposed on the optical axis 112X. Thereby, when the detection auxiliary body 115 is attached to the molding die 111, the auxiliary measurement surface 115a is positioned with respect to the molding surface 111a. Specifically, the auxiliary measurement surface 115a is arranged on the support base of the molding surface 111a or the eccentric microscope 112 side. The auxiliary measurement surface 115a is preferably configured to be coaxial with the molding surface 111a (that is, the axis of the auxiliary measurement surface 115a coincides with the axis of the molding surface 111a).

  Although the present invention is not particularly limited, in the following description, when the detection assisting body 115 is attached to the molding die 111, the axial center position of the auxiliary measuring surface 115a is the axial center position of the molding surface 111a. Assume that they are configured to match. Of course, in the present invention, the axis position of the auxiliary measurement surface 115a and the axis position of the molding surface 111a may be different. However, in this case, it is necessary to measure the deviation azimuth and deviation amount of both axes in advance, and to perform the adjustment work in consideration of the deviation azimuth and deviation amount in the axis adjustment process described later.

  In the case of the illustrated example, the detection auxiliary body 115 includes a fixing member (fixing ring) 115A that is positioned and fixed to the mold 111, and an auxiliary member 115B that is positioned and fixed to the fixing member 115A. The auxiliary measurement surface 115a is formed on 115B. If it does in this way, while it becomes possible to use fixing member 115A regularly, it becomes possible to replace and use auxiliary member 115B which formed different auxiliary measuring surface 115a as needed.

  Moreover, the raw material which comprises the auxiliary member 115B is not limited at all, For example, it may be comprised with metals, such as a brass and steel materials, and may be comprised with nonmetals, such as glass and a resin material. The auxiliary measurement surface 115a may be a surface (concave or convex) whose axis can be detected by an optical axis detection unit such as the eccentric microscope 112. In the illustrated example, some reflected light is generated on the auxiliary measurement surface 115a. It is sufficient that the reflected light can be detected by the eccentric microscope 112. Here, it is desirable that the auxiliary measurement surface 115a is a mirror surface in order to increase the detection accuracy of the axis. The auxiliary measurement surface 115a is preferably a spherical surface, but may be an aspherical surface.

  Next, a method for detecting the axial center of the measurement surface to be measured by the eccentric microscope 112 will be briefly described. As described above, the optical axis detection means of the present invention performs axial center detection of the measurement surface at a detection distance in the optical axis direction corresponding to the shape of the measurement surface. In the present embodiment, the above-described eccentricity is performed. The microscope 112 is illustrated. As shown in FIG. 5A, the eccentric microscope 112 irradiates illumination light in the optical axis direction at a predetermined focal length f, and from the measurement surface 10a of the measurement object 10 at a position corresponding to the focal length f. The reflected light can be detected.

  In general, when detecting the axial center of the convex measurement surface 20a of the measurement target 20 as shown in FIG. 5B, the detection distance D of the eccentric microscope 112 is the focal length of the illumination light. f−R obtained by subtracting the radius of curvature R of the measurement surface 20a from f, and when the measurement surface 20a is disposed at this detection distance D = f−R, the axis of the measurement surface 20a can be obtained. ing. When detecting the axis of the concave spherical optical surface 30a of the measurement target 30 as shown in FIG. 5C, the detection distance D of the eccentric microscope 112 is measured at the focal length f of the illumination light. The sum of the curvature radii R of the surface 30a is f + R. When the measurement surface 30a is arranged at the detection distance D = f + R, the axis of the measurement surface 30a can be obtained. That is, if the sign of the radius of curvature R is positive when the center of curvature of the measurement surface is on the microscope side and negative when the center of curvature is on the opposite side, the detection distance is always expressed as D = f + R.

  In the above description, the case where the measurement surface is a spherical surface has been described. However, even if the measurement surface is an aspherical surface (for example, a paraboloid or a higher-order curved surface), basically a predetermined detection according to the shape of the measurement surface is performed. At the distance, the axis of the measurement surface is detected.

  Next, a method for manufacturing a composite optical element using the manufacturing apparatus 100 described above will be described. In the manufacturing apparatus 100, first, an axis adjustment process, which will be described in detail later, is performed, and then, the dispenser 113 is moved, and a predetermined amount of optical material (uncured resin material) is transferred from the nozzle 113a to the molding surface 111a of the molding die 111. Drip on top. Thereafter, the dispenser 113 is retracted, the molding die 111 is raised, brought close to the lens base L set on the support base 102, the optical material is sandwiched between the lens base L and the molding die 111, and molded into a predetermined shape. To do.

  Thereafter, the diffusing plate 108 is drawn out and disposed on the optical axis 112X, and the light irradiation unit 114 is moved to irradiate light from the irradiation port 114a. This light is applied to the optical material molded between the lens substrate L and the mold 111, and the optical material is photocured to form the optical layer M shown in FIG. 4C. The The optical layer M has a molding optical surface Ma reflecting the molding surface 111a. Thereafter, when the mold 111 is moved downward and released, a composite optical element in which the optical layer M is laminated on the lens substrate L is left on the support base 102.

  In the manufacturing method of the present embodiment, prior to the molding step of forming the optical layer M on the lens substrate L as described above, the axis of the optical surface La of the lens substrate L shown in FIG. The relationship between the axis of the optical surface La of the lens base L and the axis of the molding surface 111a of the mold 111 is adjusted so that the axis of the molding optical surface Ma of the optical layer M has a predetermined relationship. The axis adjustment process is performed.

  Usually, in the above-mentioned axis adjustment step, the optical surface La of the compound optical element is aligned in the molding step by matching the axis of the optical surface La of the lens substrate L with the axis of the molding surface 111a of the mold 111. The axis of the optical layer M coincides with the axis of the molding optical surface Ma of the optical layer M. The following description will be made based on this assumption. However, the present invention is not limited to this, and the distance between the two axes is arbitrary. A wide range of cases where adjustment is made so that

  In the conventional axis adjustment step, the eccentric microscope 112 performs the detection of the axis of the molding surface 111a of the mold 111 and the detection of the axis of the optical surface La of the lens base L, respectively. For example, the position adjusting mechanism 104 shown in FIG. 1 is adjusted so that the positions of the two axes coincide. In this case, the specific axis adjustment procedure is arbitrary, and the axis positions detected by the eccentric microscope 112 are mutually matched so that the axis of the optical surface La and the axis of the molding surface 111a are directly matched. The position may be adjusted so that the optical axis of the eccentric microscope 112 matches the optical axis of one of the axes, and the other optical axis is then adjusted to match that of the eccentric microscope 112. You may adjust so that it may correspond with an optical axis.

  As a more specific example, first, the optical axis 112X (indicated by the origin O on the screen of the monitor 112C) of the eccentric microscope 112 and the axis of the molding surface 111a of the molding die 111 coincide with each other. The planar position of the eccentric microscope 112 is adjusted by a position adjusting mechanism (not shown), and then the axial center detection of the optical surface La of the lens base L supplied to the support base 102 by the eccentric microscope 112 adjusted in position is performed. The position adjustment mechanism 104 is adjusted so that the axis of the optical surface La coincides with the optical axis (origin O) of the eccentric microscope 112.

  However, in the conventional method, as shown in FIG. 4, the detection distance DL when detecting the axis with respect to the optical surface La by the eccentric microscope 112 is different from the detection distance D111 when detecting the axis with respect to the molding surface 111a. At the time of detecting the axial center of the molding surface 111a by the eccentric microscope 112, the molding surface 111a is arranged at a position separated from the molding position k by a distance S in the main axis direction. Therefore, even when the axis of the optical surface La and the axis of the molding surface 111a are adjusted to coincide with each other during the axis adjustment, the guide mechanism guides while moving the molding die 111 by the distance S in order to perform molding. Since misalignment occurs in accordance with accuracy, misalignment corresponding to the misalignment occurs between the shaft cores during molding.

  The above-described misalignment occurs even when the axial center of the molding surface 111a is detected by the eccentric microscope 112 by placing the molding surface 111a at the molding position k. That is, since the difference between the detection distance DL and D111 does not change at all, in order to detect the axial center of the molding surface 111a at the molding position k, when detecting the axial center of the optical surface La and the molding surface 111a. This is because the position of the eccentric microscope 112 must be changed only by the distance S when the axis is detected. That is, in this case, since the eccentric microscope 112 needs to be moved by the distance S, the eccentric microscope is displaced according to the guide accuracy of the guide mechanism of the eccentric microscope. A misalignment equivalent to the case of moving the mold 111 may occur.

  In the present embodiment, in the shaft adjusting step, the detection auxiliary body 115 is attached to the forming die 111, and the shaft center is detected with respect to the auxiliary measuring surface 115a positioned with respect to the forming surface 111a. The surface shape of the auxiliary measurement surface 115a and the distance between the molding surface 111a and the optical axis 112X in the direction of the optical axis 112X correspond to the position corresponding to the detection distance DL when the eccentric microscope 112 detects the axis of the optical surface La as shown in FIG. The molding surface 111a is set at the molding position k when the axis is detected on the auxiliary measurement surface 115a.

  That is, the surface shape of the auxiliary measurement surface 115a is obtained by adding the distance DA in the optical axis direction between the auxiliary measurement surface 115a and the molding surface 111a to the detection distance D115 when the axis of the auxiliary measurement surface 115a is detected. It coincides with the value obtained by adding the distance DB in the optical axis direction between the optical surface La (molding position j) and the molding surface 111a (molding position k) at the time of molding to the detection distance DL at the time of detecting the axis (D115 + DA = DL + DB). Is formed.

  As described above, the axis measurement of the auxiliary measurement surface 115a is performed in a state where the molding surface 111a is at the molding position k, and when the axis of the optical surface La is detected and when the axis of the auxiliary measurement surface 115a is detected. Thus, the eccentric microscope 112 is in the same position, so that the misalignment caused by the movement accuracy is not caused. Therefore, the axis of the optical surface La and the axis of the shaping optical surface Ma can be matched with high accuracy without being affected by the movement accuracy.

  In the case of the present embodiment as well, not only the axis of the optical surface La and the axis of the auxiliary measurement surface 115a are directly matched, but, for example, the light of the eccentric microscope 112 is aligned with the axis of the auxiliary measurement surface 115a. The positions of the support base 102 may be adjusted so that the axes coincide with each other and then the axis of the optical surface La coincides with the optical axis of the eccentric microscope 112.

  For example, as a specific example, the following axis adjustment work is performed. First, the horizontal posture of the support base 102, the tilt correction of the eccentric microscope 112, the tilt correction of the molding die 111, and the like are performed. Thereafter, the lens base L is installed on the support base 102, and this lens base L The vertical position of the eccentric microscope 112 is adjusted so that the axial center of the optical surface La can be detected. That is, the eccentric microscope 112 is installed above the optical surface La by the detection distance DL.

  Next, the lens base L is detached from the support base 102, the detection auxiliary body 115 is attached to the mold 111, the mold 111 is moved, and the auxiliary measurement surface 115a is located at a position corresponding to the detection distance D115 of the eccentric microscope 112. Detecting the axis center. At this time, if the surface shape of the auxiliary measurement surface 115a and the position in the optical axis direction (interval with the molding surface 111a) are set as described above, the molding surface 111a is arranged at the molding position k as shown in FIG. Is done. Then, the axis position of the auxiliary measurement surface 115a is detected by the eccentric microscope 112 and the axis position is recorded, or the axis of the auxiliary measurement surface 115a is used by using a position adjustment mechanism (not shown) of the eccentric microscope 112. A core (when the axis of the auxiliary measurement surface 115a is set to coincide with the axis of the molding surface 111a) or the axis of the molding surface 111a (the axis of the auxiliary measurement surface 115a and the molding surface 111a (When the axis is set differently) is made to coincide with the optical axis 112X.

  Next, after removing the detection auxiliary body 115 from the mold 111 and returning the mold 111 downward, the lens base L is again placed on the support base 102, the axis of the optical surface La is detected, and the position is adjusted. Using the mechanism 104, the axis of the optical surface La is adjusted to coincide with the recorded axis position or the optical axis 112X. Thereafter, as described above, the optical material is supplied, the mold 111 is moved, the optical material is molded, the optical material is cured, and the mold is sequentially released to manufacture the composite optical element.

  Thereafter, a new lens substrate L is supplied in the same manner as described above, and after the axial center detection of the optical surface La and the axis adjustment of the lens substrate L are performed in the same manner as described above, the molding is performed again. Thereafter, the composite optical element can be repeatedly manufactured by repeating such a procedure.

  In the above embodiment, the surface shape of the auxiliary measurement surface 115a and the position in the optical axis direction are set so that the molding surface 111a is at the molding position k when the axis of the auxiliary measurement surface 115a is detected. The invention is not limited to such an embodiment. For example, if the interval between the position of the molding surface 111a and the molding position k at the time of detecting the axis is reduced as compared with the case where the detection auxiliary body 115 shown in FIG. 4 is not used, the axis of the molding surface 111a. Since the amount of movement between the center detection time and the molding time is reduced, the center deviation due to the movement accuracy is also reduced.

  That is, in order to reduce the misalignment, when the position of the eccentric microscope 112 is fixed and detection is performed, the molding surface 111a and the molding position k when the eccentricity microscope 112 detects the axial center with respect to the auxiliary measurement surface 115a. The surface shape of the auxiliary measurement surface 115a is such that the distance on the optical axis is smaller than the distance on the optical axis between the molding surface 111a and the molding position k when the eccentric microscope 112 detects the axis with respect to the molding surface 111a. And the position should just be set.

  In this case, for example, if the molding surface 111a has a concave curved surface shape as in the illustrated example, the auxiliary measurement surface 115a arranged on the eccentric microscope 112 side has a concave curved surface shape with a smaller radius of curvature than the molding surface 111a, or It is configured in a convex curved surface shape as in the illustrated example.

  Further, instead of setting the position of the molding surface 111a at the time of detection of the axis of the auxiliary measurement surface 115a to the molding position k, the position of the eccentric microscope 112 is set at the time of detecting the axis of the optical surface La and the axis of the auxiliary measurement surface 115a. In the case of changing with time, if the difference in the position of the eccentric microscope 112 at the time of detecting both axes is reduced compared to the case where the detection auxiliary body 115 is not used, the amount of movement of the eccentric microscope 112 is small. Therefore, misalignment due to movement accuracy is also reduced.

  If the above relationship is generalized regardless of whether or not the position of the eccentric microscope 112 is fixed, abs [D115 + DA-DL-DB] is abs when abs [˜] indicates an absolute value of. It is only necessary to set the surface shape of the auxiliary measurement surface 115a and the position in the optical axis direction so as to be smaller than [D111-DL-DB] = S.

  In this way, when the position of the eccentric microscope 112 is fixed at the time of detecting the axis with respect to the optical surface La and the forming surface 111a as described above, the position of the forming die 111 at the time of detecting the axis and at the time of forming The misalignment caused by the movement accuracy caused by the difference from the position of the molding die 111 can be reduced, and the molding surface 111a is set to the molding position k when detecting the axial center of the optical surface La and the molding surface 111a. When performing the axial center detection by moving the position of the eccentric microscope 112 instead of arranging it, the position of the eccentric microscope at the time of the axial center detection with respect to the optical surface La of the lens base L and the molding surface 111a of the mold 111 are determined. Therefore, it is possible to reduce the detection error of the axis due to the movement accuracy caused based on the difference from the position of the eccentric microscope when the axis is detected.

  Note that the present invention is not limited to the illustrated examples described above, and various modifications can be made without departing from the scope of the present invention.

The schematic block diagram which shows the whole structure of the manufacturing apparatus of the composite optical element of embodiment. The expanded partial block diagram which expands and shows the principal part of the manufacturing apparatus of embodiment. Explanatory drawing (a) and (b) which show the positional relationship of the shaping | molding die at the time of the axial center detection and shaping | molding of embodiment. Explanatory drawing (a) and (b) which show the positional relationship of the shaping | molding die at the time of the conventional axial center detection and shaping | molding, and sectional drawing (c) of the composite optical element manufactured. Explanatory drawing (a)-(c) which each shows typically the relationship between the measuring object at the time of the axial center detection by an eccentric microscope, and detection distance.

Explanation of symbols

DESCRIPTION OF SYMBOLS 100 ... Manufacturing apparatus, 101 ... Frame, 102 ... Support stand, 103 ... Mold fixing stand, 104 ... Position adjustment mechanism, 105, 106 ... Guide mechanism, 111 ... Mold, 111a ... Molding surface, 112 ... Eccentric microscope, 115 ... Detection auxiliary body, 115a ... auxiliary measurement surface, 115A ... fixing member, 115B ... auxiliary member, L ... lens substrate, La ... optical surface, M ... optical layer, Ma ... molding optical surface, DL ... axis of optical surface La Detection distance when detecting the core, D111: Detection distance when detecting the axis of the molding surface 111a, D115: Detection distance when detecting the axis of the auxiliary measurement surface, DA: Distance between the auxiliary measurement surface and the molding surface in the optical axis direction, DB: Distance between the optical surface and the molding surface in the optical axis direction during molding

Claims (7)

In the method of manufacturing a composite optical element in which an optical layer having a molded optical surface formed by a molding surface is laminated on an optical substrate having an optical surface,
An axis that adjusts the axis according to the position of the axis of the molding surface by using an optical axis detector that can detect the axis of the shape of the measurement surface at a detection distance in the direction of the optical axis corresponding to the shape of the measurement surface to be measured. An adjustment process is provided,
An auxiliary measuring surface that is positioned with respect to the molding surface and capable of detecting the axis by the optical axis detecting means is provided,
In the axis adjustment step, the axis adjustment is performed based on the result of the axis detection of the auxiliary measurement surface performed in a state where the optical axis detection unit is disposed at a position where the axis of the optical surface can be detected. I,
The method of manufacturing a composite optical element, wherein the axis of the auxiliary measurement surface is detected at a position closer to the molding position than when the axis of the molding surface is detected.   The method of manufacturing a composite optical element according to claim 1, wherein the axis measurement of the auxiliary measurement surface is performed in a state where the molding surface is substantially disposed at a molding position. In a method for manufacturing a composite optical element in which an optical layer having a molded optical surface formed by a molding surface is laminated on an optical substrate having an optical surface,
An axis that adjusts the axis according to the position of the axis of the molding surface by using an optical axis detector that can detect the axis of the shape of the measurement surface at a detection distance in the direction of the optical axis corresponding to the shape of the measurement surface to be measured. An adjustment process is provided,
An auxiliary measuring surface that is positioned with respect to the molding surface and capable of detecting the axis by the optical axis detecting means is provided,
The surface shape of the auxiliary measurement surface and the position in the optical axis direction are values obtained by adding the distance in the optical axis direction between the molding surface and the auxiliary measurement surface to the detection distance when detecting the axis of the auxiliary measurement surface. And the absolute value of the difference (D115 + DA-DL-DB) between the detection distance when detecting the axis of the optical surface and the value obtained by adding the optical axis direction of the molding surface in the optical axis direction during molding However, the detection distance when detecting the axis of the molding surface and the detection distance when detecting the axis of the optical surface are the distance between the optical surface and the molding surface in the optical axis direction during molding. It is set to be smaller than the absolute value of the difference (D111−DL−DB) from the added value,
In the axis adjustment step, the axis adjustment is performed based on a result of axial center detection on the auxiliary measurement surface by the optical axis detection means.   The axis detection of the auxiliary measurement surface is performed in a state where an auxiliary member provided with the auxiliary measurement surface is positioned and fixed with respect to a molding die provided with the molding surface. The manufacturing method of the composite optical element as described in any one. In an apparatus for manufacturing a composite optical element, in which an optical layer having a molded optical surface formed by a molding surface is laminated on an optical substrate having an optical surface,
A support for supporting the optical substrate;
A mold having the molding surface;
A guide structure that guides at least one of the support base and the mold in the direction of the optical axis in a manner capable of contacting and separating from each other;
An optical axis detection means capable of detecting the axis of the measurement surface shape at a detection distance in the optical axis direction according to the measurement surface shape of the measurement object;
Position adjusting means for enabling axis adjustment between the support base and the mold;
An auxiliary measuring surface that is positioned with respect to the molding surface and capable of detecting an axis by the optical axis detecting means
An apparatus for manufacturing a composite optical element, comprising:   The value obtained by adding the distance in the optical axis direction between the molding surface and the auxiliary measurement surface to the detection distance when detecting the axis of the auxiliary measurement surface, and the detection when detecting the axis of the optical surface The detection when the absolute value of the difference (D115 + DA−DL−DB) between the optical surface at the time of molding and the value obtained by adding the distance in the optical axis direction of the molding surface to the distance is detected as the axis of the molding surface Absolute (D111-DL-DB) difference between a distance and a value obtained by adding a distance in the optical axis direction between the optical surface and the molding surface at the time of molding to the detection distance when detecting the axis of the optical surface 6. The composite optical element manufacturing apparatus according to claim 5, wherein the surface shape of the auxiliary measurement surface and the position in the optical axis direction are set so as to be smaller than the value. The said auxiliary | assistant measurement surface is provided in the auxiliary member comprised so that attachment or detachment with respect to the said shaping | molding die was carried out, The manufacturing apparatus of the composite optical element of Claim 5 or 6 characterized by the above-mentioned.

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