JP2006528808A - 生産工程の出力を監視し視覚化するシステムおよび方法 - Google Patents
生産工程の出力を監視し視覚化するシステムおよび方法 Download PDFInfo
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- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0006—Industrial image inspection using a design-rule based approach
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- G—PHYSICS
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- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
- G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
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- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
- G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
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- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Abstract
Description
Claims (20)
- 生産工程の出力を視覚化する方法であって、
前記生産工程によって生産された二つ以上の材料または製品を検査するステップと、
各被検査製品の一つ以上のパラメータの一つ以上の値を直接的に測定または推定するステップと、
前記測定値または推定値の少なくとも一つを対応する記憶値と比較して差分値を判定するステップと、
コンピューティング装置を用いて前記被検査製品それぞれを表す画像を生成するステップと、を含み、
前記記憶値と比較された前記測定値または推定値の少なくとも一つと関連付けられる前記製品の区域または区分に対応する前記画像の区域または区分は、対応する値または差分値を示すよう視覚的に符号化される、方法。 - 前記測定値または推定値は、前記パラメータの目標値を表す記憶値と比較される、請求項1記載の方法。
- 前記生成された画像それぞれをシリアルにビューアに表示するステップを更に含む、請求項2記載の方法。
- 前記区域または区分を視覚的に符号化することは、前記区域または区分に色を適用することを含み、前記色は、前記値または差分値と関連付けられる、請求項2記載の方法。
- 前記区域または区分を視覚的に符号化することは、前記区域または区分にテクスチャを適用することを含み、前記テクスチャは、前記値または差分値と関連付けられる、請求項2記載の方法。
- 一組の色のそれぞれは、可能な値または差分値の値域と関連付けられる、請求項4記載の方法。
- 一組の色のそれぞれは、特定の値と関連付けられ、前記差分値は、前記色の一つと関連付けられる値の一つに対応するよう量子化される、請求項4記載の方法。
- 前記被検査材料または被検査製品それぞれの対応する点と関連付けられる対応する値および/または差分値に対して統計分析を実行して統計分析に基づくデータセットを導出するステップを更に具備する、請求項2記載の方法。
- 前記統計分析に基づくデータセットを視覚化するステップを更に具備する、請求項8記載の方法。
- 前記実行される統計分析の種類は、平均化、値域決定、および標準偏差の計算よりなる群から選択される、請求項8記載の方法。
- 出力材料または出力製品が一つ以上の検査ユニットによって検査される生産工程の出力を視覚化するシステムであって、
前記一つ以上の検査ユニットから、被検査材料または被検査製品の少なくとも一つのパラメータの測定値または推定値と関連付けられるデータを受信する通信モジュールと、
前記測定値または推定値の少なくとも一つを対応する記憶値と比較して差分値を判定する比較器モジュールと、
前記検査製品それぞれを表す画像を生成する視覚化モジュールと、を備え、
前記記憶値と比較された前記測定値または推定値の少なくとも一つと関連付けられる前記製品または材料の区域または区分に対応する前記画像の区域または区分は、視覚的に符号化され、対応する値または差分値を示す、システム。 - 前記測定値または推定値は、前記パラメータの目標値を表す記憶値と比較される、請求項11記載のシステム。
- 前記視覚化モジュールは、前記生成された画像それぞれをシリアルにビューアに表示する、請求項12記載のシステム。
- 前記視覚化モジュールは、前記区域または区分に色を適用することで前記区域または区分を視覚的に符号化し、前記色は、前記値または前記差分値と関連付けられる、請求項12記載の方法。
- 前記視覚化モジュールは、前記区域または区分にテクスチャを適用することで前記区域または区分を視覚的に符号化し、前記テクスチャは、前記値または前記差分値と関連付けられる、請求項12記載のシステム。
- 一組の色のそれぞれは、可能な値または差分値の値域と関連付けられる、請求項14記載のシステム。
- 一組の色のそれぞれは、特定の値と関連付けられ、前記差分値は、前記色の一つと関連付けられる値の一つに対応するよう量子化される、請求項14記載のシステム。
- 前記検査材料または検査製品それぞれの対応する点と関連付けられる対応する値および/または差分値に対して統計分析を実行して統計分析に基づくデータセットを導出する統計計算モジュールを更に備える、請求項12記載のシステム。
- 前記視覚化モジュールは、前記統計分析に基づくデータセットを視覚化するよう構成される、請求項18記載のシステム。
- 前記実行される統計分析の種類は、平均化、値域決定、および標準検査の計算よりなる群から選択される、請求項18記載のシステム。
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US49132903P | 2003-07-24 | 2003-07-24 | |
PCT/IL2004/000676 WO2005010627A2 (en) | 2003-07-24 | 2004-07-25 | A system and method for monitoring and visualizing the output of a production process |
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JP2006528808A true JP2006528808A (ja) | 2006-12-21 |
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US (2) | US7672500B2 (ja) |
EP (1) | EP1649333B2 (ja) |
JP (1) | JP2006528808A (ja) |
AT (1) | ATE423341T1 (ja) |
CA (1) | CA2525594C (ja) |
DE (1) | DE602004019537D1 (ja) |
WO (1) | WO2005010627A2 (ja) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101297294A (zh) * | 2004-05-21 | 2008-10-29 | 派拉斯科技术公司 | 图形重新检验用户设置界面 |
ITBO20050073A1 (it) * | 2005-02-16 | 2005-05-18 | Gd Spa | Metodo ed unita' per il controllo qualitativo della produzione in una linea per il confezionamento di articoli da fumo |
US7634152B2 (en) * | 2005-03-07 | 2009-12-15 | Hewlett-Packard Development Company, L.P. | System and method for correcting image vignetting |
CN1956650A (zh) * | 2005-10-28 | 2007-05-02 | 鸿富锦精密工业(深圳)有限公司 | 贴片机供料器校正系统及方法 |
US7565216B2 (en) | 2006-09-11 | 2009-07-21 | Innovmetric Logiciels Inc. | Clearance measurement of manufactured parts |
US9378274B2 (en) * | 2013-06-10 | 2016-06-28 | Cisco Technology, Inc. | Object filtering in a computing network |
US10197394B2 (en) | 2013-11-06 | 2019-02-05 | Hexagon Metrology (Israel) Ltd. | Method and system for analyzing spatial measuring data |
EP2913148B8 (en) * | 2014-02-28 | 2020-03-25 | Hexagon Metrology (Israel) Ltd. | Method and system for analyzing process monitoring data |
FR3018618B1 (fr) * | 2014-03-11 | 2017-09-22 | Univ Nantes | Procede et systeme de controle d'un poncage orbital |
US10836110B2 (en) * | 2014-10-31 | 2020-11-17 | Desprez, Llc | Method and system for ordering expedited production or supply of designed products |
US10073439B1 (en) * | 2014-10-31 | 2018-09-11 | Desprez, Llc | Methods, systems, and software for processing expedited production or supply of designed products |
EP3045992B1 (en) | 2015-01-14 | 2020-10-14 | Hexagon Technology Center GmbH | Compensating for errors occurring in a production process |
US9817402B1 (en) * | 2016-07-12 | 2017-11-14 | The Boeing Company | Application of factory automation for an airline assembly and build process |
EP3339801B1 (en) | 2016-12-20 | 2021-11-24 | Hexagon Technology Center GmbH | Self-monitoring manufacturing system, production monitoring unit and use of production monitoring unit |
EP3364374A1 (en) | 2017-02-20 | 2018-08-22 | My Virtual Reality Software AS | Method for visualizing three-dimensional data |
IL257256A (en) | 2018-01-30 | 2018-03-29 | HYATT Yonatan | System and method for establishing production line tests |
IL259143B1 (en) * | 2018-05-03 | 2024-03-01 | Inspekto A M V Ltd | System and method for visual production line inspection of various production items |
IL259285B2 (en) | 2018-05-10 | 2023-07-01 | Inspekto A M V Ltd | A system and method for detecting defects on objects in an image |
DE102018208782A1 (de) * | 2018-06-05 | 2019-12-05 | Volkswagen Aktiengesellschaft | Verfahren zur Qualitätssicherung bei der Produktion eines Produktes sowie Recheneinrichtung und Computerprogramm |
WO2020110119A1 (en) | 2018-11-29 | 2020-06-04 | Inspekto A.M.V Ltd | Multi-camera visual inspection appliance and method of use |
IL267563A (en) * | 2019-06-20 | 2019-11-28 | HYATT Yonatan | Establishing a process for visual inspection |
JP7181849B2 (ja) * | 2019-10-31 | 2022-12-01 | 横河電機株式会社 | 装置、方法およびプログラム |
WO2021161321A1 (en) | 2020-02-13 | 2021-08-19 | Inspekto A.M.V Ltd | User interface device for autonomous machine vision inspection |
CN111832433B (zh) * | 2020-06-24 | 2023-12-29 | 奇点微(上海)光电科技有限公司 | 一种由图像提取物体特性的装置及其工作方法 |
CN111861149B (zh) * | 2020-06-29 | 2023-04-07 | 北京航空航天大学 | 一种基于三维模型的检测过程驱动方法和系统 |
EP4137780A1 (en) | 2021-08-16 | 2023-02-22 | Hexagon Technology Center GmbH | Autonomous measuring robot system |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63196400U (ja) * | 1987-06-08 | 1988-12-16 | ||
JPH0630900A (ja) * | 1992-07-13 | 1994-02-08 | Kimiya Shimizu | 角膜の光学特性の表示方法 |
JPH0644353A (ja) * | 1992-07-22 | 1994-02-18 | Toshiba Corp | 画像表示装置 |
JP2002289662A (ja) * | 2001-03-27 | 2002-10-04 | Hitachi Ltd | 不良原因探索プログラム及び不良原因探索システム |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2523004B2 (ja) * | 1988-11-25 | 1996-08-07 | オ−クマ株式会社 | 数値制御研削盤における加工状態のグラフィック表示方法 |
US5216602A (en) * | 1989-11-06 | 1993-06-01 | The Board Of Trustees Of The University Of Illinois | Color imaging system |
US5335293A (en) * | 1992-06-16 | 1994-08-02 | Key Technology, Inc. | Product inspection method and apparatus |
US5844801A (en) * | 1994-12-08 | 1998-12-01 | Honda Giken Kogyo Kabushiki Kaisha | Method of inspecting and manufacturing vehicle body |
GB2310557B (en) * | 1996-02-21 | 2000-05-10 | Rank Taylor Hobson Ltd | Image processing apparatus |
JP3242008B2 (ja) * | 1996-10-02 | 2001-12-25 | 株式会社ディエス技研 | 製版プロセスにおける画像検査方法および画像検査装置 |
US6259960B1 (en) * | 1996-11-01 | 2001-07-10 | Joel Ltd. | Part-inspecting system |
AU8916498A (en) * | 1997-08-27 | 1999-03-16 | Datacube, Inc. | Web inspection system for analysis of moving webs |
US6415197B1 (en) * | 1997-10-08 | 2002-07-02 | The Goodyear Tire & Rubber Company | Method of displaying characteristic parameters in a tire manufacturing cell |
US6199198B1 (en) * | 1997-12-10 | 2001-03-06 | International Business Machines Corp. | Computer system, method, and article of manufacture for visualizing differences between design artifacts and object-oriented code |
US6571000B1 (en) * | 1999-11-29 | 2003-05-27 | Xerox Corporation | Image processing algorithm for characterization of uniformity of printed images |
US6477432B1 (en) * | 2000-01-11 | 2002-11-05 | Taiwan Semiconductor Manufacturing Company | Statistical in-process quality control sampling based on product stability through a systematic operation system and method |
US6462736B1 (en) * | 2000-01-25 | 2002-10-08 | I2 Technologies Us, Inc. | System and method providing a three-Dimensional display of values relative to comparison values |
US6975754B2 (en) * | 2000-10-26 | 2005-12-13 | Hitachi, Ltd. | Circuit pattern inspection method and apparatus |
JP3859480B2 (ja) † | 2001-10-17 | 2006-12-20 | 株式会社ルネサステクノロジ | 検査方法 |
US7352892B2 (en) * | 2003-03-20 | 2008-04-01 | Micron Technology, Inc. | System and method for shape reconstruction from optical images |
US6807860B1 (en) * | 2003-06-18 | 2004-10-26 | General Electric Company | Multiple alloy rotor transition zone measurement system and method |
US20050286753A1 (en) * | 2004-06-25 | 2005-12-29 | Triant Technologies Inc. | Automated inspection systems and methods |
-
2004
- 2004-07-25 DE DE602004019537T patent/DE602004019537D1/de active Active
- 2004-07-25 WO PCT/IL2004/000676 patent/WO2005010627A2/en active Application Filing
- 2004-07-25 JP JP2006520985A patent/JP2006528808A/ja active Pending
- 2004-07-25 EP EP04745016.8A patent/EP1649333B2/en not_active Not-in-force
- 2004-07-25 US US10/556,409 patent/US7672500B2/en not_active Expired - Fee Related
- 2004-07-25 AT AT04745016T patent/ATE423341T1/de not_active IP Right Cessation
- 2004-07-25 CA CA2525594A patent/CA2525594C/en not_active Expired - Fee Related
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- 2010-02-26 US US12/659,143 patent/US20100215246A1/en not_active Abandoned
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63196400U (ja) * | 1987-06-08 | 1988-12-16 | ||
JPH0630900A (ja) * | 1992-07-13 | 1994-02-08 | Kimiya Shimizu | 角膜の光学特性の表示方法 |
JPH0644353A (ja) * | 1992-07-22 | 1994-02-18 | Toshiba Corp | 画像表示装置 |
JP2002289662A (ja) * | 2001-03-27 | 2002-10-04 | Hitachi Ltd | 不良原因探索プログラム及び不良原因探索システム |
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WO2005010627A2 (en) | 2005-02-03 |
ATE423341T1 (de) | 2009-03-15 |
CA2525594C (en) | 2011-01-04 |
EP1649333A2 (en) | 2006-04-26 |
EP1649333B2 (en) | 2016-06-15 |
CA2525594A1 (en) | 2005-02-03 |
DE602004019537D1 (de) | 2009-04-02 |
US7672500B2 (en) | 2010-03-02 |
WO2005010627A3 (en) | 2005-03-31 |
US20070031024A1 (en) | 2007-02-08 |
US20100215246A1 (en) | 2010-08-26 |
EP1649333B1 (en) | 2009-02-18 |
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