JP2006520923A5 - - Google Patents

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JP2006520923A5
JP2006520923A5 JP2006504729A JP2006504729A JP2006520923A5 JP 2006520923 A5 JP2006520923 A5 JP 2006520923A5 JP 2006504729 A JP2006504729 A JP 2006504729A JP 2006504729 A JP2006504729 A JP 2006504729A JP 2006520923 A5 JP2006520923 A5 JP 2006520923A5
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Japan
Prior art keywords
photoresist layer
concavo
convex
photoresist
substrate
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JP2006504729A
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Japanese (ja)
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JP4495722B2 (en
JP2006520923A (en
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Priority claimed from DE10318105A external-priority patent/DE10318105B4/en
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Priority claimed from PCT/EP2004/002822 external-priority patent/WO2004083911A1/en
Publication of JP2006520923A publication Critical patent/JP2006520923A/en
Publication of JP2006520923A5 publication Critical patent/JP2006520923A5/ja
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Publication of JP4495722B2 publication Critical patent/JP4495722B2/en
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Claims (15)

第1の凹凸構造(5)に、回折構造(12)として働く少なくとも一つの第2の凹凸構造を重ね合わせることによって、サブストレート(1)上のホトレジスト層(2)に、光を回折させるミクロ構造(13)を作成する方法であって、
a)前記サブストレート(1)に対向して配置された凹凸母型(4)の形状を前記ホトレジスト層(2)の露出した表面に成形することにより形成された第1の凹凸構造(5)を備えたホトレジスト層(2)を平坦なサブストレート(1)上に作成し、
b)前記凹凸母型(4)を取り除き、
c)コーヒレントな光を分岐ビーム(9)と参照ビーム(10)とに分解し、該分岐ビーム(9)および参照ビーム(10)を、所定の交角をもって干渉させることによって、成形された前記第1の凹凸構造(5)上に干渉縞を作成し、
d)前記サブストレート(1)を該サブストレート(1)の平面に対する法線(15)の周りで回転させることにより、前記第1の凹凸構造(5)についての方位に対する、暗い光の縞によって分離された明るい光の縞を備えた干渉縞の方向を決定し、
e)前記ホトレジスト層(2)内の前記第1の凹凸構造(5)を、前記干渉縞を用いて所定時間露光し、
f)前記ホトレジストを所定時間現像し、前記露光によって変質されたホトレジスト材料を部分的に除去して、前記第1の凹凸構造(5)内に前記回折構造(12)の溝(13)を生成させ、
g)前記ホトレジストを乾燥させる、
諸工程を含んでなることを特徴とするミクロ構造の作成方法。
A microscopic structure that diffracts light into the photoresist layer (2) on the substrate (1) by superimposing at least one second uneven structure serving as a diffraction structure (12) on the first uneven structure (5). A method of creating a structure (13) comprising:
a) A first concavo-convex structure (5) formed by molding the shape of the concavo-convex matrix (4) disposed facing the substrate (1) on the exposed surface of the photoresist layer (2). On a flat substrate (1) with a photoresist layer (2) comprising
b) removing the concave / convex matrix (4),
c) The coherent light is decomposed into a branched beam (9) and a reference beam (10), and the branched beam (9) and the reference beam (10) are caused to interfere with each other at a predetermined intersection angle. Create interference fringes on the concavo-convex structure (5) of 1,
d) by rotating the substrate (1) around a normal (15) to the plane of the substrate (1), thereby causing dark light fringes relative to the orientation with respect to the first relief structure (5); Determine the direction of the interference fringes with the bright light stripes separated,
e) exposing the first relief structure (5) in the photoresist layer (2) for a predetermined time using the interference fringes;
f) The photoresist is developed for a predetermined time, and the photoresist material altered by the exposure is partially removed to form a groove (13) of the diffraction structure (12) in the first concavo-convex structure (5). Let
g) drying the photoresist;
A method for producing a microstructure, comprising various steps.
前記f)工程における前記ホトレジストの現像時間は、前記回折構造の溝(13)が最大で500nmの深さに達するような時間であることを特徴とする請求項1記載の方法。   2. A method according to claim 1, characterized in that the development time of the photoresist in step f) is such that the grooves (13) of the diffractive structure reach a maximum depth of 500 nm. 前記f)工程における前記ホトレジストの現像時間は、前記回折構造の溝(13)が最大で250nmの深さに達するような時間であることを特徴とする請求項1記載の方法。2. A method according to claim 1, characterized in that the development time of the photoresist in step f) is such that the grooves (13) of the diffractive structure reach a maximum depth of 250 nm. 前記a)工程において、最初に前記ホトレジスト層(2)を前記サブストレート(1)上に成形し、前記ホトレジスト層(2)を熱の作用により硬化させ、次に型押しスタンプ(3)上に設けられた凹凸母型(4)を前記ホトレジスト層(2)の表面に降下させて、前記第1の凹凸構造(5)の形状を前記凹凸母型(4)の陰画として形成することを特徴とする請求項1から3のいずれか1項記載の方法。 In the step a), the photoresist layer (2) is first formed on the substrate (1), the photoresist layer (2) is cured by the action of heat, and then on the stamp (3). The provided concavo-convex matrix (4) is lowered to the surface of the photoresist layer (2), and the shape of the first concavo-convex structure (5) is formed as a negative of the concavo-convex matrix (4). The method according to any one of claims 1 to 3 . 前記a)工程において、前記ホトレジスト層(2)を注型により形成し、その場合に、液状ホトレジストを前記サブストレート(1)と前記凹凸母型(4)との間に注入し、前記ホトレジストを加熱して硬化させ、離型後、前記ホトレジスト層(2)の露出した表面が、前記凹凸母型(4)の陰画としての前記第1の凹凸構造(5)を備えるようにすることを特徴とする請求項1から3のいずれか1項記載の方法。 In the step a), the photoresist layer (2) is formed by casting. In that case, a liquid photoresist is injected between the substrate (1) and the concave-convex matrix (4), and the photoresist is formed. After being cured by heating and releasing, the exposed surface of the photoresist layer (2) is provided with the first concavo-convex structure (5) as a negative image of the concavo-convex matrix (4). The method according to any one of claims 1 to 3 . 前記a)工程において、周期的格子を前記第1の凹凸構造(5)として前記ホトレジスト層(2)に形成することを特徴とする請求項1からのいずれか1項記載の方法。 Wherein a) in step A method according to any one of claims 1 5, characterized in that formed on the photoresist layer as a periodic grating wherein the first relief structure (5) (2). 前記a)工程において、交差的格子を前記第1の凹凸構造(5)として前記ホトレジスト層(2)に形成することを特徴とする請求項1からのいずれか1項記載の方法。 Wherein a) in step, any one process of claim 1 5, characterized in that formed on the photoresist layer cross grating as the first relief structure (5) (2). 前記a)工程において、1本/mmから1000本/mmまでの間の範囲の空間周波数を有する周期的格子を前記第1の凹凸構造(5)として前記ホトレジスト層(2)に形成することを特徴とする請求項1からのいずれか1項記載の方法。 In the step a), a periodic grating having a spatial frequency in the range of 1 line / mm to 1000 lines / mm is formed on the photoresist layer (2) as the first uneven structure (5). 8. A method according to any one of claims 1 to 7 , characterized in that 前記第1の凹凸構造(5)の空間周波数の少なくとも5倍に相当する空間周波数を有する回折構造(12)が形成されるように、前記c)工程において、前記分岐ビーム(9)と前記参照ビーム(10)との間の交角を設定することを特徴とする請求項または記載の方法。 In step c), the branch beam (9) and the reference are formed so that a diffractive structure (12) having a spatial frequency corresponding to at least five times the spatial frequency of the first concavo-convex structure (5) is formed. The method according to claim 6 or 7 , characterized in that an angle of intersection with the beam (10) is set. 前記a)工程において、光を散乱させるマット構造の一つを前記第1の凹凸構造(5)として前記ホトレジスト層(2)に形成することを特徴とする請求項1からのいずれか1項記載の方法。 In the step a), any one of the preceding claims, characterized in that formed on the photoresist layer as a single mat structure for scattering light the first relief structure (5) (2) 5 The method described. 前記a)工程において、少なくとも一つの回転放物面(16)および/または円錐尖端(17)を有する構造を備えた凹凸母型(4)を、前記第1の凹凸構造(5)の形状の形成に用いることを特徴とする請求項1からのいずれか1項記載の方法。 In the step a), an uneven matrix (4) having a structure having at least one rotational paraboloid (16) and / or conical tip (17) is formed into the shape of the first uneven structure (5). any one process of claim 1 5, characterized by using in formation. 前記第1の凹凸構造(5)を、0.1μmと100μmの間の範囲の深さ(T)で形成することを特徴とする請求項1から11のいずれか1項記載の方法。 It said first concave-convex structure (5), 0.1 [mu] m and 100μm method of any one of claims 1 to 11, characterized in that formed in the range of depth (T) between. 前記g)工程の実行に先立って、前記c)工程から前記f)工程までの写真造形作業を反復することにより少なくとも一つのさらなる回折構造(12)を形成し、その場合に、前記d)工程において、前記法線(15)の周りで前記サブストレート(1)を回転させることにより、新たな干渉縞に対する前記回折構造(12)の溝(13)を備えた前記第1の凹凸構造(5)の方向を決定することを特徴とする請求項1から12のいずれか1項記載の方法。 Prior to the execution of the step g), at least one additional diffractive structure (12) is formed by repeating the photographic molding operation from the step c) to the step f), in which case the step d) The first concavo-convex structure (5) provided with grooves (13) of the diffractive structure (12) for new interference fringes by rotating the substrate (1) around the normal (15). 13. The method according to any one of claims 1 to 12 , characterized in that the direction is determined. 前記c)工程における写真造形作業の反復において、前記分岐ビーム(9)および参照ビーム(10)との間の交角を変更することを特徴とする請求項13記載の方法。 14. Method according to claim 13 , characterized in that in the repetition of the photographic shaping operation in step c), the angle of intersection between the branch beam (9) and the reference beam (10) is changed. 最大500nmの格子周期を備えた回折構造(12)が前記c)工程において形成されるように、前記分岐ビーム(9)と前記参照ビーム(10)との間の交角を設定することを特徴とする請求項1から14のいずれか1項記載の方法。 The intersection angle between the branched beam (9) and the reference beam (10) is set so that a diffractive structure (12) having a grating period of maximum 500 nm is formed in the step c). 15. A method according to any one of claims 1 to 14 .
JP2006504729A 2003-04-22 2004-03-18 Microstructure creation method Expired - Fee Related JP4495722B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10318105A DE10318105B4 (en) 2003-03-21 2003-04-22 Process for the production of microstructures
PCT/EP2004/002822 WO2004083911A1 (en) 2003-03-21 2004-03-18 Microstructure and method for producing microstructures

Publications (3)

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JP2006520923A JP2006520923A (en) 2006-09-14
JP2006520923A5 true JP2006520923A5 (en) 2007-07-19
JP4495722B2 JP4495722B2 (en) 2010-07-07

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JP5104220B2 (en) 2007-11-02 2012-12-19 住友電気工業株式会社 Diffractive optical element and manufacturing method thereof
JP5391670B2 (en) * 2007-12-27 2014-01-15 セイコーエプソン株式会社 Manufacturing method of fine structure
JP2009244529A (en) * 2008-03-31 2009-10-22 Konica Minolta Opto Inc Light shielding part and lens barrel
JP2009294383A (en) * 2008-06-04 2009-12-17 Toppan Printing Co Ltd Display and information printed matter

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JPS57139872A (en) * 1981-02-03 1982-08-30 Landis & Gyr Ag Method of and apparatus for preventing faking of document
JPS63181142A (en) * 1987-01-21 1988-07-26 Toppan Printing Co Ltd Production of optical recording medium
JP2812758B2 (en) * 1988-04-12 1998-10-22 大日本印刷株式会社 Optical recording medium and method for manufacturing the same
GB9524862D0 (en) * 1995-12-06 1996-02-07 The Technology Partnership Plc Colour diffractive structure
DE19708776C1 (en) * 1997-03-04 1998-06-18 Fraunhofer Ges Forschung Anti-reflection coating for glass or plastics panels used in windows, display screens etc.
JP4334656B2 (en) * 1999-03-15 2009-09-30 大日本印刷株式会社 Color-changing vapor deposition medium and manufacturing method thereof
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