JP2006509193A5 - - Google Patents

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Publication number
JP2006509193A5
JP2006509193A5 JP2004556551A JP2004556551A JP2006509193A5 JP 2006509193 A5 JP2006509193 A5 JP 2006509193A5 JP 2004556551 A JP2004556551 A JP 2004556551A JP 2004556551 A JP2004556551 A JP 2004556551A JP 2006509193 A5 JP2006509193 A5 JP 2006509193A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004556551A
Other versions
JP4542907B2 (ja
JP2006509193A (ja
Filing date
Publication date
Priority claimed from GBGB0228368.7A external-priority patent/GB0228368D0/en
Application filed filed Critical
Publication of JP2006509193A publication Critical patent/JP2006509193A/ja
Publication of JP2006509193A5 publication Critical patent/JP2006509193A5/ja
Application granted granted Critical
Publication of JP4542907B2 publication Critical patent/JP4542907B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2004556551A 2002-12-05 2003-12-05 高速走査用プローブ Expired - Fee Related JP4542907B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0228368.7A GB0228368D0 (en) 2002-12-05 2002-12-05 Probe for high speed scanning
PCT/GB2003/005317 WO2004051181A1 (en) 2002-12-05 2003-12-05 Probe for high speed scanning

Publications (3)

Publication Number Publication Date
JP2006509193A JP2006509193A (ja) 2006-03-16
JP2006509193A5 true JP2006509193A5 (ja) 2007-02-01
JP4542907B2 JP4542907B2 (ja) 2010-09-15

Family

ID=9949111

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004556551A Expired - Fee Related JP4542907B2 (ja) 2002-12-05 2003-12-05 高速走査用プローブ

Country Status (7)

Country Link
US (1) US7124514B2 (ja)
EP (1) EP1570231B1 (ja)
JP (1) JP4542907B2 (ja)
CN (1) CN100350213C (ja)
AU (1) AU2003288432A1 (ja)
GB (1) GB0228368D0 (ja)
WO (1) WO2004051181A1 (ja)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004068068A1 (de) * 2003-01-31 2004-08-12 Carl Zeiss Industrielle Messtechnik Gmbh Tastkopf für ein koordinatenmessgerät
JP4436665B2 (ja) * 2003-12-24 2010-03-24 パナソニック株式会社 測定用プローブ及び形状測定方法
DE102004011730A1 (de) * 2004-03-05 2005-09-22 Carl Zeiss Industrielle Messtechnik Gmbh Tastkopf für ein Koordinatenmessgerät
EP1771701B1 (de) 2004-07-23 2013-03-06 Carl Zeiss Industrielle Messtechnik GmbH Sensormodul für einen tastkopf eines taktilen koordinatenmessgerätes
US7114406B2 (en) * 2004-09-16 2006-10-03 The Boeing Company End effector inspection apparatus and method
JP4323412B2 (ja) * 2004-11-02 2009-09-02 株式会社ミツトヨ 表面性状測定用探針およびこれを用いた顕微鏡
EP1672310B1 (de) * 2004-12-15 2007-02-21 Hexagon Metrology GmbH Messender Tastkopf mit Vibrationsdämpfung für ein Koordinatenmessgerät
GB0506158D0 (en) * 2005-03-24 2005-05-04 Renishaw Plc Measurement probe
GB0508388D0 (en) * 2005-04-26 2005-06-01 Renishaw Plc Surface sensing device with optical sensor
DE102008037926B3 (de) * 2008-08-14 2010-02-04 SIOS Meßtechnik GmbH Vorrichtung zur taktilen Messung von dreidimensionalen Kräften
DE102008045841A1 (de) * 2008-09-05 2010-03-11 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Verfahren zum Betreiben einer Messstelle
DE102010023354B4 (de) * 2010-06-10 2023-05-25 Jenoptik Industrial Metrology Germany Gmbh Tastarm für ein Oberflächenmeßgerät
GB201309506D0 (en) * 2013-05-28 2013-07-10 Renishaw Plc Methods of controlling a coordinate positioning machine
US9528824B2 (en) * 2015-03-31 2016-12-27 Mitutoyo Corporation Tactile probing system
US9851818B2 (en) 2015-10-19 2017-12-26 Microsoft Technology Licensing, Llc Handheld input apparatus
US9886092B2 (en) * 2015-10-19 2018-02-06 Microsoft Technology Licensing, Llc Haptics for a handheld input apparatus
JP6212148B2 (ja) * 2016-02-26 2017-10-11 株式会社ミツトヨ 測定プローブ
CN108713128A (zh) * 2016-03-16 2018-10-26 海克斯康测量技术有限公司 用于坐标测量机的探针夹
JP6769764B2 (ja) * 2016-07-19 2020-10-14 株式会社ミツトヨ 測定プローブ及び測定装置
US9835433B1 (en) 2017-05-09 2017-12-05 Tesa Sa Touch trigger probe
CN108153234B (zh) * 2018-01-30 2023-08-04 中国工程物理研究院机械制造工艺研究所 机床直线运动运行态的全自由度精度检测装置
DE102019122655A1 (de) * 2019-08-22 2021-02-25 M & H Inprocess Messtechnik Gmbh Messsystem
US11379058B1 (en) * 2021-04-15 2022-07-05 Microsoft Technology Licensing, Llc Winged bracket for stylus strain gauge

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2242355C2 (de) 1972-08-29 1974-10-17 Fa. Carl Zeiss, 7920 Heidenheim Elektronischer Mehrkoordinatentaster
SU1095065A2 (ru) * 1979-11-05 1984-05-30 Вильнюсский Филиал Экспериментального Научно-Исследовательского Института Металлорежущих Станков Измерительна головка
DE3234471C1 (de) * 1982-09-17 1983-08-25 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Mehrkoordinaten-Tastkopf
JPS60181603A (ja) * 1984-02-29 1985-09-17 Masanori Kunieda 磁力式形状測定方法
GB8728500D0 (en) * 1987-12-05 1988-01-13 Renishaw Plc Position sensing probe
GB8803847D0 (en) * 1988-02-18 1988-03-16 Renishaw Plc Mounting for surface-sensing device
US5189806A (en) * 1988-12-19 1993-03-02 Renishaw Plc Method of and apparatus for scanning the surface of a workpiece
GB8908854D0 (en) 1989-04-19 1989-06-07 Renishaw Plc Method of and apparatus for scanning the surface of a workpiece
US5390424A (en) 1990-01-25 1995-02-21 Renishaw Metrology Limited Analogue probe
GB9004117D0 (en) * 1990-02-23 1990-04-18 Renishaw Plc Touch probe
US5339535A (en) * 1990-02-23 1994-08-23 Renishaw Metrology Limited Touch probe
GB9111382D0 (en) * 1991-05-25 1991-07-17 Renishaw Metrology Ltd Improvements in measuring probes
JP2587565B2 (ja) * 1992-05-28 1997-03-05 株式会社ミツトヨ 倣いプローブ
JP2617651B2 (ja) * 1992-05-29 1997-06-04 株式会社ミツトヨ タッチ信号プローブ
DE69323289T3 (de) * 1992-12-24 2003-04-24 Renishaw Plc, Wotton-Under-Edge Tastsonde und Signalverarbeitungsschaltung dafür
GB9423176D0 (en) * 1994-11-17 1995-01-04 Renishaw Plc Touch probe
JPH08219753A (ja) * 1995-02-14 1996-08-30 Nikon Corp 変位測定プローブ
NL1005718C2 (nl) 1997-04-03 1998-10-07 Ir Reginald Galestien Methode voor het nauwkeurig meten van schroefdraad en aanverwante geometrieën.
GB9907644D0 (en) 1999-04-06 1999-05-26 Renishaw Plc Surface sensing device with optical sensor

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