JP2006343249A5 - - Google Patents

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Publication number
JP2006343249A5
JP2006343249A5 JP2005170265A JP2005170265A JP2006343249A5 JP 2006343249 A5 JP2006343249 A5 JP 2006343249A5 JP 2005170265 A JP2005170265 A JP 2005170265A JP 2005170265 A JP2005170265 A JP 2005170265A JP 2006343249 A5 JP2006343249 A5 JP 2006343249A5
Authority
JP
Japan
Prior art keywords
probe
shape
measuring
moving body
gantry
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2005170265A
Other languages
English (en)
Japanese (ja)
Other versions
JP4500736B2 (ja
JP2006343249A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2005170265A priority Critical patent/JP4500736B2/ja
Priority claimed from JP2005170265A external-priority patent/JP4500736B2/ja
Publication of JP2006343249A publication Critical patent/JP2006343249A/ja
Publication of JP2006343249A5 publication Critical patent/JP2006343249A5/ja
Application granted granted Critical
Publication of JP4500736B2 publication Critical patent/JP4500736B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2005170265A 2005-06-10 2005-06-10 形状測定装置 Expired - Fee Related JP4500736B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2005170265A JP4500736B2 (ja) 2005-06-10 2005-06-10 形状測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005170265A JP4500736B2 (ja) 2005-06-10 2005-06-10 形状測定装置

Publications (3)

Publication Number Publication Date
JP2006343249A JP2006343249A (ja) 2006-12-21
JP2006343249A5 true JP2006343249A5 (cg-RX-API-DMAC10.html) 2008-07-24
JP4500736B2 JP4500736B2 (ja) 2010-07-14

Family

ID=37640311

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005170265A Expired - Fee Related JP4500736B2 (ja) 2005-06-10 2005-06-10 形状測定装置

Country Status (1)

Country Link
JP (1) JP4500736B2 (cg-RX-API-DMAC10.html)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5025444B2 (ja) * 2007-12-12 2012-09-12 キヤノン株式会社 三次元形状測定装置
JP5179852B2 (ja) * 2007-12-19 2013-04-10 Ｎｔｎ株式会社 軸受の回転精度の測定装置
JP5438988B2 (ja) * 2009-02-17 2014-03-12 株式会社ミツトヨ 測定システムおよび干渉計
JP2012237686A (ja) * 2011-05-12 2012-12-06 Canon Inc 測定装置
JP2014077692A (ja) * 2012-10-10 2014-05-01 Kosaka Laboratory Ltd 触針式測定装置及び触針式測定装置による高さ測定方法
JP6655888B2 (ja) * 2014-08-20 2020-03-04 キヤノン株式会社 計測装置、計測方法、および物品の製造方法
JP6049786B2 (ja) 2015-03-05 2016-12-21 株式会社ミツトヨ 測定プローブ
JP6039718B2 (ja) 2015-03-05 2016-12-07 株式会社ミツトヨ 測定プローブ
JP6049785B2 (ja) * 2015-03-05 2016-12-21 株式会社ミツトヨ 測定プローブ
CN110388875B (zh) * 2019-08-29 2021-04-06 合肥工业大学 能提高测量范围的微纳米三维接触式测量探头及控制方法
JP7340761B2 (ja) * 2019-10-28 2023-09-08 パナソニックＩｐマネジメント株式会社 測定用プローブ
CN112066900B (zh) * 2020-09-16 2022-04-29 江西财经大学 一种距离测量装置
CN121594763A (zh) * 2025-11-28 2026-03-03 中国计量科学研究院 一种立式激光干涉比较测长方法及装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001317933A (ja) * 2000-05-02 2001-11-16 Ricoh Co Ltd 形状測定装置

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