JP2006284417A - Nondestructive inspection device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To improve workability of a worker by improving portability of a unit held by a hand, and to enable another worker to confirm an inspection result from a place separated from a working field. <P>SOLUTION: This nondestructive inspection device 1 includes an extension (inspection signal collection unit) 2 arranged near a specimen S, and a master machine (signal processing unit) 3 for transferring data with the extension 2. In the device 1, the extension 2 includes a sensor part 7 for detecting a defect of the specimen S and generating an inspection signal, a sensor part driving means for receiving the inspection signal, an inspection signal transmission means for transmitting the received inspection signal to the master machine 3, a display data reception means for receiving display data transmitted from the master machine 3 and converted based on the inspection signal, and a display part 13 for displaying the display data, and the master machine 3 includes an inspection signal reception means for receiving the transmitted inspection signal, a signal processing means for converting the received inspection signal into the display data, and a display data transmission means for transmitting the converted display data to the extension 2. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to a nondestructive inspection apparatus such as an ultrasonic flaw detector and an eddy current flaw detector for inspecting a surface or internal defect of a subject.

  Conventionally, as a method for inspecting an object, a nondestructive inspection method using a nondestructive inspection device such as an ultrasonic flaw detector or an eddy current flaw detector is known. Various nondestructive inspection apparatuses are provided. A general nondestructive inspection apparatus 70 includes an inspection apparatus main body 72 having a display 71 and a surface of a subject S as shown in FIG. And a probe (sensor unit) 73 for detecting internal defects (such as scratches). The inspection apparatus main body 72 and the probe 73 are connected by a cable 74. The driving of the probe 73, the processing of signals obtained from the probe 73, the display of inspection results, and the like are performed by only one apparatus, that is, the inspection apparatus main body 72. Similarly, the inspection result is stored in a recording memory in the inspection apparatus main body 72. Thus, the general nondestructive inspection apparatus 70 can perform nondestructive inspection only with the inspection apparatus main body 72 and the probe 73.

  As shown in FIG. 9, a nondestructive inspection device 75 is also known in which an inspection apparatus main body 72 and a personal computer 76 are connected via a LAN, and various settings of the inspection apparatus main body 72 can be performed from the personal computer 76 side. In this non-destructive inspection device 75, the inspection device main body 72 operates according to the setting by the personal computer 76, performs high-speed signal processing such as filter processing, rejection processing, and amplification processing, and then transmits inspection data to the personal computer 76. To do. The personal computer 76 converts the received inspection data into display data and then displays it on a monitor on the personal computer 76 and stores the inspection result in the personal computer 76.

  In addition, the inspection data transmitted from the nondestructive inspection apparatus is received by the nondestructive inspection data extraction apparatus in which extraction parameters are set in advance, and an extraction process for extracting feature parts from the inspection data according to the extraction parameters is performed. A system for transmitting extracted data to an analysis center via a network is also known (see, for example, Patent Document 1). The extracted data transmitted to the analysis center is stored in a terminal in the analysis center.

As described above, some conventional nondestructive inspection apparatuses operate in combination with one apparatus or a plurality of apparatuses, but in any case, the sensor unit ( In the present situation, the part that performs the high-speed signal processing after the detection by the probe) is performed by a single device.
JP 2004-163288 A

However, the following problems remain in the conventional nondestructive inspection.
In other words, conventional non-destructive inspection devices are larger in size as devices that perform high-speed signal processing. Therefore, in an inspection site where there is no scaffold or is complicated by piping, the device is placed near the subject. It can be difficult. In such a case, the apparatus must be placed at a position slightly away from the subject, but it is difficult to confirm the examination result or it is difficult to operate the apparatus while examining.

Further, even a small device having good portability may be inspected by holding it with one hand for a long time, so it is necessary to make it as small and light as possible. Also in this point, it was difficult to cope with the conventional one.
Further, a small device with good portability is required to be battery-driven, but the battery capacity may be limited in order to make the device small and light. As a result, it was impossible to drive the sensor by applying a high voltage, and the detection capability was low, or the continuous use time was shortened. Alternatively, since only a relatively simple signal processing function can be installed, the detection accuracy is low and noise is high.

  The present invention has been made in view of the above-described problems of the prior art, and an object of the present invention is to improve portability of a device (unit) that can be connected to a sensor and provided with a display, and held by hand. Thus, it is an object of the present invention to provide a nondestructive inspection apparatus that improves the workability of workers and enables other workers to check the inspection results even from a location away from the work site.

In order to achieve the above object, the present invention provides the following means.
The invention according to claim 1 is a nondestructive inspection apparatus for inspecting at least one defect on the surface or inside of a subject, an inspection signal collection unit disposed in the vicinity of the subject, and the inspection signal collection unit A signal processing unit that transfers data to and from the sensor, the inspection signal collecting unit detects the defect of the subject and generates an inspection signal corresponding to the defect, and drives the sensor unit Sensor unit driving means for receiving the inspection signal, inspection signal transmitting means for transmitting the received inspection signal to the signal processing unit, and transmitted from the signal processing unit and converted based on the inspection signal A display data receiving means for receiving the display data; and a display section for displaying the received display data, wherein the signal processing unit is the inspection signal transmitting means. Inspection signal receiving means for receiving the inspection signal transmitted from the signal, signal processing means for performing a predetermined process on the received inspection signal and converting it into the display data, and the converted display data to the inspection signal collecting unit. Provided is a nondestructive inspection device comprising display data transmission means for transmitting.

In the nondestructive inspection apparatus according to the present invention, after the sensor unit is driven by the sensor unit driving means, the sensor unit is moved along the subject to detect at least one defect on the surface or inside of the subject. . During this time, the sensor unit generates an inspection signal according to the detected defect and outputs it to the sensor unit driving means. In response to the sensor unit driving means receiving the inspection signal, the inspection signal transmitting means transmits the inspection signal to the signal processing unit.
The inspection signal receiving means of the signal processing unit receives the transmitted inspection signal and sends it to the signal processing means. The signal processing means converts the inspection signal into display data corresponding to the inspection signal after performing predetermined processing such as amplification processing and filter processing, for example. Then, the display data transmission means transmits the converted display data to the inspection signal collection unit.
The display data receiving means of the inspection signal collecting unit receives the sent display data. Then, the display unit displays this display data display.

Thus, the examiner can perform a non-destructive examination of the subject while confirming the display unit of the examination signal collection unit arranged in the vicinity of the subject. In particular, unlike conventional ones, signal processing means for performing advanced signal processing is provided on the signal processing unit side, so that the inspection signal collecting unit can be miniaturized as much as possible. Thereby, portability improves and the workability | operativity of a nondestructive inspection can be improved.
In addition, since the signal processing means that requires relatively large power is provided in the signal processing unit, the inspection signal collecting unit does not require large power. Therefore, even if the inspection signal collection unit is driven by a battery, the continuous use time can be extended and a large battery installation space is not required, so that the size and weight can be reduced.
On the other hand, since the signal processing unit that does not need to be placed in the vicinity of the subject and has low power constraints includes the signal processing means, it can perform high-accuracy signal processing and make the examination signal collection unit portable. Without loss, noise can be reduced and resolution can be improved.

  According to a second aspect of the present invention, in the nondestructive inspection apparatus according to the first aspect, the signal processing unit receives a gate function for adjusting a threshold value in advance and the threshold value adjusted by the gate function as the inspection signal reception. Triggering means for reflecting the inspection signal received by the means, and trigger transmission means for comparing the inspection signal with the threshold and transmitting the comparison result to the inspection signal collecting unit, the inspection signal collecting unit Provides a nondestructive inspection apparatus comprising trigger receiving means for receiving the comparison result.

  In the nondestructive inspection apparatus according to the present invention, after adjusting the threshold value to a desired value by the gate function, the threshold value can be applied by the trigger means (reflected in the inspection signal). And a trigger transmission means compares a test signal with a threshold value, and transmits the comparison result, ie, the detection result by a trigger, to a test signal collection unit. Then, the trigger reception means of the inspection signal collection unit receives this detection result. Thereby, the inspector can monitor the inspection signal by the trigger, and can perform nondestructive inspection of a wide range of subjects with higher accuracy.

  According to a third aspect of the present invention, in the nondestructive inspection apparatus according to the first aspect, the inspection signal collecting unit transmits an input means to which a set value is input and the input set value to the signal processing unit. There is provided a non-destructive inspection apparatus including a set value transmitting unit configured to receive the set value by the signal processing unit.

In the nondestructive inspection apparatus according to the present invention, the inspector can input various set values according to the purpose by the input means. The test signal collection unit operates based on this set value. The set value is sent to the signal processing unit by the set value transmitting means. The sent set value is received by the set value receiving means. Thereby, the signal processing unit operates based on the set value in the same manner as the inspection signal collecting unit.
In this way, the inspector can control the inspection signal collecting unit, and can simultaneously control the signal processing unit via the inspection signal collecting unit. Therefore, both units can be controlled from the site where nondestructive inspection is performed, and workability can be further improved.

  According to a fourth aspect of the present invention, there is provided the nondestructive inspection apparatus according to the first aspect, wherein the signal processing unit includes a second display unit that displays the display data.

  In the nondestructive inspection apparatus according to the present invention, since the second display unit is provided, the inspection status can be seen also on the signal processing unit side. Therefore, the nondestructive inspection result can be confirmed not only by the inspector who is actually inspecting, but also by other persons away from the site. Therefore, oversight of defects (scratches, etc.) of the subject can be further prevented, and inspection accuracy can be improved.

  According to a fifth aspect of the present invention, in the nondestructive inspection apparatus according to the first or fourth aspect, the signal processing unit includes an input means for inputting a set value, and the input of the set value to the inspection signal collecting unit. A non-destructive inspection apparatus including a set value transmitting means for transmitting the set value, wherein the inspection signal collecting unit includes a set value receiving means for receiving the set value.

In the nondestructive inspection apparatus according to the present invention, various setting values can be input according to the purpose by an input means provided in a signal processing unit located away from the place being inspected. The signal processing unit operates based on this set value. The set value is sent to the inspection signal collecting unit by the set value transmitting means. The sent set value is received by the set value receiving means. Thereby, the inspection signal collecting unit operates based on the set value in the same manner as the signal processing unit.
Thus, the inspector can simultaneously control the signal processing unit and the inspection signal collection unit from either unit side. Accordingly, both units can be controlled from a site where non-destructive inspection is performed or from a slightly separated location and can be operated by a plurality of inspectors, so that further improvement in workability can be achieved.

  The invention according to claim 6 is the nondestructive inspection apparatus according to claim 1 or 4, wherein the signal processing unit detects the defect of the subject and generates a second inspection signal corresponding to the defect. A second sensor unit, a second sensor unit driving means for driving the second sensor unit and receiving the second inspection signal, and either the second inspection signal or the inspection signal Switching means for switching the signal to be input to the signal processing means, input means for inputting a set value, and set value transmitting means for transmitting the input set value to the inspection signal collecting unit, Provided is a nondestructive inspection apparatus in which an inspection signal collecting unit includes a set value receiving means for receiving the set value.

Since the nondestructive inspection apparatus according to the present invention includes the second sensor unit, it is possible to detect a defect in the subject also on the signal processing unit side. The second inspection signal detected by the second sensor unit and generated according to the defect is received by the second sensor unit driving means. The second inspection signal received by the second sensor unit driving means is converted into display data by the signal processing means and sent to the inspection signal collecting unit. Then, the inspection result can be confirmed by the inspection signal collecting unit.
Moreover, since the switching means is provided, the inspection result on the inspection signal collecting unit side or the inspection result on the signal processing unit side can be easily selected (switched) and displayed on the display unit. In this way, it is possible to easily check the inspection result at a place away from the place being inspected by the inspection signal collecting unit. Therefore, the work efficiency of nondestructive inspection is improved and more diverse inspections can be performed.

In addition, various setting values can be input according to the purpose by the input means. The signal processing unit operates based on this set value. The set value is sent to the inspection signal collecting unit by the set value transmitting means. The sent set value is received by the set value receiving means. Thereby, the inspection signal collecting unit operates based on the set value in the same manner as the signal processing unit.
In this way, the inspection signal collection unit and the signal processing unit can be controlled simultaneously.

  According to a seventh aspect of the present invention, in the nondestructive inspection apparatus according to the sixth aspect, the sensor unit driving means is set to stop when the second sensor unit driving unit is operating, and the first A non-destructive inspection apparatus is provided in which two sensor unit driving means are set to stop when the sensor unit driving unit is operating.

  In the nondestructive inspection apparatus according to the present invention, the sensor unit driving unit and the second sensor unit driving unit are stopped when the other sensor unit is operating, so that excessive power consumption can be suppressed as much as possible. it can. In addition, since the nondestructive inspection can be performed only by either the inspection signal collection unit or the signal processing unit, the inspection results can be clearly distinguished, and the inspection results are clear and easy to use.

  The invention according to claim 8 provides the nondestructive inspection apparatus according to claim 1, wherein the data transfer between the inspection signal collection unit and the signal processing unit is performed by wireless communication. To do.

  In the nondestructive inspection apparatus according to the present invention, since data transfer between both units can be performed wirelessly, it is not necessary to connect both units with a cable or the like. Therefore, even if the inspection site where the nondestructive inspection is performed is a small place with few scaffolds, the inspection site is not complicated and the safety of the inspection work is further improved.

  The invention according to claim 9 provides the nondestructive inspection apparatus according to claim 1, wherein the data transfer between the inspection signal collection unit and the signal processing unit is performed by wired communication. To do.

  In the nondestructive inspection apparatus according to the present invention, since the data transfer between both units is wired communication, even if there is an obstacle between the inspection signal collecting unit and the signal processing unit, the data transfer between both units is performed. It can be done reliably.

  The invention according to claim 10 provides the nondestructive inspection apparatus according to claim 1, wherein the inspection signal is an analog signal.

  In the nondestructive inspection apparatus according to the present invention, since the inspection signal is an analog signal, the configuration can be simplified and the manufacturing cost can be reduced.

  The invention according to claim 11 provides the nondestructive inspection apparatus according to claim 1, wherein the inspection signal is a digital signal.

  In the nondestructive inspection apparatus according to the present invention, since the inspection signal is a digital signal, the inspection signal can be transferred with less noise and the inspection accuracy can be improved.

  The invention according to claim 12 provides the nondestructive inspection apparatus according to claim 1, wherein the display data is an analog signal.

  In the nondestructive inspection apparatus according to the present invention, since the display data is an analog signal, the configuration can be simplified and the manufacturing cost can be reduced.

  The invention according to claim 13 provides the nondestructive inspection apparatus according to claim 1, wherein the display data is a digital signal.

  In the nondestructive inspection apparatus according to the present invention, since the display data is a digital signal, the inspection result can be displayed as a clearer image.

  According to a fourteenth aspect of the present invention, in the nondestructive inspection apparatus according to the first aspect, the inspection signal collecting unit is battery-driven, and the signal processing unit includes charging means for charging the inspection signal collecting unit. Provided is a nondestructive inspection apparatus.

  In the nondestructive inspection apparatus according to the present invention, since the signal processing unit includes the charging means, the inspection signal collection unit can be charged in a timely manner. Therefore, it is easy to use and excellent in convenience.

According to the nondestructive inspection apparatus according to the present invention, since the signal processing means for performing advanced signal processing is provided on the signal processing unit side, the inspection signal collecting unit can be miniaturized as much as possible, and portability is improved. The workability of nondestructive inspection can be improved. In addition, since the signal processing means that requires relatively large power is provided in the signal processing unit, even if the inspection signal collecting unit is battery-driven, the continuous use time can be extended and a large battery installation space is provided. Can be reduced in size and weight.
In addition, since the signal processing unit with low power constraint includes the signal processing means, it is possible to perform high-accuracy signal processing and reduce noise without reducing the portability of the inspection signal collection unit. Improvement can be achieved.

Hereinafter, a first embodiment of a nondestructive inspection apparatus according to the present invention will be described with reference to FIGS.
The ultrasonic flaw detector (nondestructive inspection apparatus) 1 according to the present embodiment inspects at least one defect (scratch) on the surface or inside of the subject S as shown in FIGS. 1 and 2. The slave unit (examination signal collection unit) 2 disposed in the vicinity of the subject S and the master unit (signal processing unit) 3 for transferring data between the slave unit 2 are composed of two units. Yes. The master unit 3 and the slave unit 2 are connected by a cable 4, and data transfer is performed by wired communication.

As shown in FIGS. 1 and 3, the slave unit 2 includes a main body part 5 formed in a box shape and a probe (sensor part) 7 connected to the main body part 5 via a cable 6. Have. The probe 7 transmits an ultrasonic wave locally to the subject S and receives the reflected wave, detects a defect of the subject S, and generates an inspection signal corresponding to the defect.
In addition, the probe unit 7 that drives the probe 7 and receives the generated inspection signal is sent to the main body unit 5, and the received inspection signal is transmitted to the base unit 3. An inspection signal transmission unit (inspection signal transmission unit) 11, a display data reception unit (display data reception unit) 12 that receives display data transmitted from the parent device 3 and converted based on the inspection signal, and displays the received display data Display section 13, input device (input means) 14 that can input various setting values, setting value transmission / reception section (setting value transmission means) 15 that transmits the input setting values to base unit 3, and each of these components A battery (not shown) for supplying power to the product is incorporated.

Moreover, among each component, the display part 13 and the input device 14 are provided in the front surface of the main-body part 5, as shown in FIG. The input device 14 is, for example, a direct key, a menu operation key, a power key, or an operation switch such as a dial.
Among these, the direct key is uniquely assigned so that a certain function can be directly operated. Examples of the function include saving inspection data, enlarging the inspection waveform screen, and pausing the inspection waveform. is there. The power key is for turning on or off the power of the slave unit 2. The dial is uniquely assigned a function such as a change of a setting value for a menu selected item or a direct key.
A touch panel (not shown) provided on the display unit 13 may be used instead of the direct key or the menu operation key.

Further, as shown in FIG. 3, in addition to the components described above, the bus 16 is electrically connected to the CPU 17, ROM 18, RAM 19, 20, display control unit 21, and LED 22.
The CPU 17 incorporates a program for controlling various functions, and comprehensively controls each component via the bus 16. The ROM 18 stores various control programs such as processing circuits and menu displays, and the CPU 17 operates according to the control programs.
In the RAM 19, various setting data set by the input device 14, that is, setting values are stored in a setting data area, and the slave unit 2 operates according to the stored setting values. The RAM 19 can simultaneously record not only the setting value on the slave unit 2 side but also the setting value on the master unit 3 side. The set value on the base unit 3 side includes a value received via the set value transmission / reception unit 15. This will be described in detail later.

  Further, in the case of storing the inspection result obtained by the nondestructive inspection, the inspection data is stored in the RAM 20 in response to the execution of the storage function by the input device 14. In addition, each inspection data stored in the RAM 20 includes information on set values. When a stored inspection data file is selected from the menu, not only the previous inspection waveform is displayed, but also the main data is displayed. The setting data stored in the file is read and entered into the setting data area of the RAM 20. By carrying out like this, the subunit | mobile_unit 2 can be operated in the last setting state.

The set value transmission / reception unit 15 transmits the set value set by the input device 14 to the parent device 3 side. The contents related to this setting value may be the value of the setting itself handled on the parent device 3 side, and the input device 14 is treated like a remote control for controlling the parent device 3 side, and each of the values from the child device 2 side. The command may simply indicate that the input device 14 has been pressed. For data transfer, serial communication, LAN, or the like is used.
As a result, when the slave unit 2 and the master unit 3 are activated, the slave unit 2 operates with the set value stored in the RAM 19, and the set value is transmitted to the master unit 3 via the set value transmission / reception unit 15. The master unit 3 can be similarly operated with this set value. That is, the slave unit 2 and the master unit 3 can be operated in a state immediately before the end of the previous power supply.
Note that the RAM 19 may share the same memory as the other RAM 20, may be provided as a separate memory, or an HD or the like may be used to increase the capacity. Further, a memory that can be easily attached and detached, such as a CF memory card or an SD memory card, may be used.

The set value transmission / reception unit 15 also functions as a set value receiving means for receiving the set value transmitted from the parent device 3. The received set value is stored in the RAM 19 as described above. Thereby, the set value changed on the parent device 3 side can be managed on the child device 2 side.
Further, the set value transmission / reception unit 15 also functions as a trigger receiving means for receiving a detection result based on a trigger sent from the parent device 3. This trigger will be described in detail later.

The probe transmission / reception control unit 10 includes a probe transmission / reception circuit 25 and an A / D conversion circuit 26, operates according to the set value set by the input device 14, and is generated by the probe 7. Received inspection signal. Then, this inspection signal is sent to the parent device 3 via the inspection signal transmitter 11.
Note that a LAN or the like is used for communication at this time. When transmitting the inspection signal, either a digital signal or an analog signal may be transmitted. However, when transmitting the analog signal, the A / D conversion circuit 26 is not necessary.

The display data transmitted from the parent device 3 is processed into a video signal such as an inspection waveform or a cross-sectional display, and the child device 2 receives this display data at the display data receiving unit 12.
As display data at this time, either a digital signal or an analog signal may be used. When an analog signal is used, the display data receiving unit 12 only functions as a connector, and the A / D conversion process may be performed by the display control unit 21. When a digital signal is used, transmission is performed using a LAN or the like using a data format such as Mortion-JPEG, MPEG2, or MPEG4.
The received display data is converted into a format that can be displayed on the display unit 13 by the display control unit 21, and is displayed on the display unit 13 after being combined with a screen display created by a program operating on the CPU 17. Is done.

  The LED 22 is lit to indicate a warning or caution, and informs the inspector accordingly. The LED 22 is lit not only to warn or caution, but also to notify the inspector that the trigger has been applied when the set value transmission / reception unit 15 receives the detection result by the trigger.

  As shown in FIGS. 1, 2 and 4, the master unit 3 is formed in a box shape and receives a test signal sent from the slave unit 2 (test signal receiving means). 30. A signal processing means 31 that performs a predetermined process on the received inspection signal and converts it into display data; a display data transmission unit (display data transmission means) 32 that transmits the converted display data to the handset 2; Setting value transmission / reception unit (setting value receiving means) 33 for receiving the set value, input device (input means) 34 for inputting the setting value on the base unit 3 side, display unit for displaying display data (second display) Part) 35, charging means 36 for charging the slave unit 2, and a power source 37 for supplying power to these components. The signal processing means 31 includes a signal processing unit 38 and a display data creation unit 39.

The power source 37 is, for example, a large capacity battery 40 or an AC plug 41 connected to an AC power source as shown in FIGS. Further, an opening 42 that can accommodate the main body 5 of the child device 2 is formed on the upper surface of the parent device 3. The bottom of the opening 42 is electrically connected to the power source 37 and the child device. A charger (not shown) for charging the second battery is provided. That is, the opening 42 and the charger constitute the charging means 36.
Moreover, the display part 35 and the input device 34 are provided in the front surface similarly to the subunit | mobile_unit 2, as shown in FIG.

The input device 34 is, for example, a direct key, a menu operation key, a power key, or an operation switch such as a dial, similar to the input device 14 on the handset 2 side. The screen settings and the like are changed.
As shown in FIG. 4, in addition to the above-described components, the bus 45 is electrically connected with a CPU 46, a ROM 47, RAMs 48 and 49, a display control unit 50, and an LED 51.
The CPU 46 incorporates programs for controlling various functions, and comprehensively controls each component via the bus 45. The ROM 47 stores various control programs such as processing circuits and menu displays, and the CPU 46 operates according to the control programs. In the RAM 48, various setting data set by the input device 34, that is, setting values are stored in a setting data area, and the master unit 3 operates according to the stored setting values.

  Further, in the case of saving the inspection result obtained by performing the nondestructive inspection on the handset 2 side, the inspection data is stored in the RAM 49 in response to the execution of the storage function by the input device 34. Note that the RAM 48 may share the same memory as the other RAM 49, or may be provided as a separate memory, or an HD or the like may be used to increase the capacity. Further, a memory that can be easily attached and detached, such as a CF memory card or an SD memory card, may be used.

The set value transmission / reception unit 33 receives the set value transmitted from the slave unit 2. The base unit 3 operates according to the received set value. When transmitting only a command indicating that the input device 14 has been operated from the slave unit 2, the setting value transmission / reception unit 33 converts the command to a setting value corresponding to the command.
In addition, the setting value transmission / reception unit 33 also functions as a setting value transmission unit that transmits the setting value input by the input device 34 to the child device 2. Thereby, the set value changed on the parent device 3 side can be managed on the child device 2 side.

The inspection signal receiving unit 30 receives the inspection signal transmitted from the slave unit 2 and then sends it to the signal processing unit 38. The signal processing unit 38 performs signal processing such as amplification processing, filtering processing, and rejection processing on the transmitted inspection signal in accordance with the set value set on the handset 2 side, and then displays it on the display data creation unit 39. send. Note that a part of these signal processes may be performed by the probe transmission / reception control unit 10 on the handset 2 side. When the received inspection signal is an analog signal, the inspection signal receiving unit 30 or the signal processing unit 38 may perform A / D conversion.
The display data creation unit 39 processes the inspection signal after the signal processing into an inspection waveform or a cross-sectional display to generate display data (video signal) and the generated display data to the display control unit 50 and the display data transmission unit 32. Send to. The display control unit 50 synthesizes the transmitted display data with the screen display of the program that runs on the CPU 46 and displays it on the display unit 35.
On the other hand, the display data transmission unit 32 transmits the sent display data to the handset 2 side. In this case, when an analog signal is used, the display data transmission unit 32 or the display data creation unit 39 may perform D / A conversion.

Furthermore, the base unit 3 includes a gate function that adjusts the threshold value in advance, and trigger means (not shown) that reflects the threshold value adjusted by the gate function in the inspection signal. The set value transmission / reception unit 33 functions as a trigger transmission unit that compares the inspection signal and the threshold value and transmits the comparison result, that is, the detection result by the trigger, to the slave unit 2.
Further, the LED 51 is turned on when a warning or caution is given, or when a trigger is applied, like the LED 22 on the handset 2 side.

A case where a defect (flaw) of the subject S is inspected by the ultrasonic flaw detector 1 configured as described above will be described below.
First, the examiner places the child device 2 in the vicinity of the subject S and turns on the child device 2 and the parent device 3 with the input devices 14 and 34. When the power is turned on, the slave unit 2 starts to operate with the set value stored in the RAM 19. Further, the set value transmission / reception unit 15 transmits the set value to the base unit 3 side. When the set value transmission / reception unit 33 on the base unit 3 side receives this set value, the base unit 3 similarly starts to operate according to the set value. Thereby, the main | base station 3 and the subunit | mobile_unit 2 can be operated in the state immediately before the end of the last power supply. Further, by inputting a new set value with the input device 14 on the handset 2 side, the base unit 3 and the handset 2 can be operated according to the set value.

  As described above, after the master unit 3 and the slave unit 2 rise to a predetermined state, the examiner gradually shifts the surface of the subject S while applying the probe 7 to the surface of the subject S, Send ultrasonic waves at the location. The probe 7 receives a reflected wave from the subject S at each position and generates an inspection signal corresponding to the reflected wave. At this time, when a defect (scratch) exists on at least one of the surface and the inside of the subject S, the reflected wave changes according to the defect. That is, the inspection signal is a signal corresponding to the defect. The inspection signal is received by the probe transmission / reception control unit 10 and then transmitted from the inspection signal transmission unit 11 to the parent device 3 as an analog signal or a digital signal.

The transmitted inspection signal is received by the inspection signal receiving unit 30 of the parent device 3 and then sent to the signal processing unit 38. The inspection signal is sent to the display data creation unit 39 after predetermined signal processing by the signal processing unit 38. The display data creation unit 39 processes the signal-processed inspection signal into an inspection waveform, a cross-sectional display, etc., generates display data (video signal), and sends it to the display control unit 50 and the display data transmission unit 32.
The display data transmission unit 32 transmits the transmitted display data to the child device 2. The transmitted display data is received by the display data receiving unit 12 of the handset 2 and then sent to the display control unit 21. The display control unit 21 converts the display data into an optimal format that can be displayed on the display unit 13 and combines the display data with the screen display of the program that operates on the CPU 17, and then causes the display unit 13 to display it. The nondestructive inspection data is stored in the RAM 20.

Thereby, the examiner can perform a non-destructive inspection of the subject S while confirming with the display unit 13 of the slave unit 2 arranged in the vicinity of the subject S. In particular, unlike the conventional one, since the signal processing means 31 that performs advanced signal processing is provided on the parent device 3 side, the child device 2 can be miniaturized as much as possible. Thereby, since the portability of the subunit | mobile_unit 2 improves, it can test | inspect, for example, holding the subunit | mobile_unit 2, and can improve the workability | operativity of a nondestructive inspection.
Further, since the signal processing means 31 that requires relatively large power is provided on the parent device 3 side, the child device 2 does not require large power. Therefore, the continuous use time of the battery-powered slave unit 2 can be extended, and a large battery installation space is unnecessary, so that further reduction in size and weight can be achieved.
On the other hand, since the parent device 3 that does not need to be arranged in the vicinity of the subject S and has a low power restriction includes the signal processing means 31, high-accuracy signal processing can be performed, and the portability of the child device 2 can be improved. The noise can be reduced and the resolution can be improved without impairing the image quality.

Further, the display control unit 50 on the base unit 3 side converts the display data sent to an optimal format that can be displayed on the display unit 35 and displays the program that is operated on the CPU 46 on the screen. After the composition, it is displayed on the display unit 35.
Thereby, not only the inspector who is actually inspecting but also other persons away from the site can check the nondestructive inspection result. Therefore, oversight of defects (scratches) in the subject S can be further prevented, and inspection accuracy can be improved.

Further, during the non-destructive inspection, the inspector can freely change the set value of the slave unit 2 via the input device 14 to control the slave unit 2, and the set value is the parent value. It can also be sent to the machine 3 side to control the parent machine 3 at the same time. Thus, it is possible to control both the slave unit 2 and the master unit 3 from the site where the non-destructive inspection is performed, and further workability can be improved.
Further, the setting value of the parent device 3 can be freely changed via the input device 34 to control the parent device 3, and the setting value is also sent to the child device 2 to control the child device 2. Can be done simultaneously. In this way, other persons away from the site can control both the child device 2 and the parent device 3, and further improve workability.

In performing the nondestructive inspection, the threshold value can be adjusted to a desired value by the gate function, and then the threshold value can be reflected in the inspection signal to trigger. The parent device 3 compares the inspection signal with the threshold value, and transmits the comparison result, that is, the detection result by the trigger, to the child device 2 via the set value transmission / reception unit 33. The subunit | mobile_unit 2 receives this detection result in the setting value transmission / reception part 15, notifies an inspector by lighting of LED22 that it was triggered, and displays it on the display part 13. FIG. As a result, the examiner can monitor the inspection signal by the trigger, and can perform nondestructive inspection of the subject S with higher accuracy and a wider range.
Similarly, the LED 51 on the base unit 3 side notifies the surroundings by lighting the LED 51 and displays it on the display unit 35.
In addition, the LEDs 22 and 51 of the master unit 3 and the slave unit 2 are lit not only when a trigger is applied but also when a malfunction occurs during a nondestructive inspection, and warnings and cautions are given to the surroundings. As a result, the certainty of nondestructive inspection work is improved.

  Further, since the master unit 3 and the slave unit 2 are connected by the cable 4 and data transfer between the units 2 and 3 is performed by wired communication, there is an obstacle between the slave unit 2 and the master unit 3. Even so, the data transfer between the units 2 and 3 can be ensured without being affected by the obstacle. Therefore, the certainty of work improves.

In addition, since the inspection signal can be transmitted and received as an analog signal or a digital signal, the degree of freedom in design is improved. In particular, when used as an analog signal, the A / D conversion circuit 26 of the slave unit 2 and the like are unnecessary, so that the configuration can be simplified and the manufacturing cost can be reduced. When a digital signal is used, the inspection signal can be transferred with less noise and the inspection accuracy can be improved.
Similarly, since display data can be transmitted and received as an analog signal or a digital signal, the degree of freedom in design is improved. In particular, when used as an analog signal, the display data receiving unit 12 of the slave unit 2 can be a simple connector, and the configuration can be simplified and the manufacturing cost can be reduced. When a digital signal is used, the inspection result can be displayed on the display unit 13 of the slave unit 2 as a clearer image.

  After the above-described nondestructive inspection is completed, as shown in FIG. 2, the slave unit 2 is charged via the charger by accommodating the main body 5 of the slave unit 2 in the opening 42 of the master unit 3. Can do. In this way, since the handset 2 can be charged as needed, it is easy to use and excellent in convenience. Moreover, since the subunit | mobile_unit 2 can be accommodated in the main | base station 3, the storage space when not performing a nondestructive inspection can be made into the smallest possible space. Also from this, the convenience can be improved.

Next, a second embodiment of the nondestructive inspection apparatus according to the present invention will be described with reference to FIGS. In the second embodiment, the same components as those in the first embodiment are denoted by the same reference numerals, and the description thereof is omitted.
The difference between the second embodiment and the first embodiment is that in the ultrasonic flaw detector 1 of the first embodiment, data transfer between the parent device 3 and the child device 2 is performed by wired communication, and the probe is used. However, the ultrasonic flaw detector (nondestructive inspection device) 60 according to the second embodiment is configured to transfer data (inspection signal, between the parent device 3 and the child device 2). (Various data such as display data, setting values, and detection results) is performed by wireless communication, and probes are provided in both the parent device 3 and the child device 2.

That is, as shown in FIGS. 5 and 6, the base unit 3 of the present embodiment is connected via a cable 61, transmits ultrasonic waves to the local area of the subject S, receives the reflected waves, and receives the reflected waves. A second probe (second sensor unit) 62 that detects a defect (flaw) in the sample S and generates a second inspection signal corresponding to the defect, and drives the second probe 62. The second probe transmission / reception control unit (second sensor unit driving means) 63 that receives the second inspection signal generated together with the inspection received by the second inspection signal or the inspection signal receiving unit 30 A switch (switching means) 64 that switches one of the signals to be input to the signal processing means 31 is provided.
In addition, a switch 65 is provided between the display data creation unit 39 and the display data transmission unit 32 so as to control whether or not display data is output to the display data transmission unit 32.

  Further, as shown in FIG. 5, the base unit 3 includes transmission / reception antennas 66 connected to the set value transmission / reception unit 33, the inspection signal reception unit 30, and the display data transmission unit 32. Similarly, the slave unit 2 includes a transmission / reception antenna 67 connected to the set value transmission / reception unit 15, the inspection signal transmission unit 11, and the display data reception unit 12.

A case will be described in which a nondestructive inspection of the subject S is performed by the ultrasonic flaw detector 60 configured as described above.
First, the case where the probe 7 on the handset 2 side is used will be described.
In this case, the switch 64 on the base unit 3 side is switched in advance so that the inspection signal receiving unit 30 and the signal processing unit 38 are connected by a direct key or menu operation of the input device 34. Then, the slave unit 2 wirelessly transmits the inspection signal obtained by the probe 7 to the master unit 3 via the transmission / reception antenna 67. The inspection signal transmitted wirelessly is received by the inspection signal receiving unit 30 via the transmission / reception antenna 66 of the base unit 3 and then sent to the signal processing unit 38. Similarly, the set value and the comparison result wirelessly transmitted from the handset 2 side are similarly received by the set value transmitting / receiving unit 33 via the transmitting / receiving antenna 66 of the base unit 3.

  Then, the inspection signal processed by the signal processing unit 38 is displayed on the display unit 35 on the parent device 3 side via the display data creation unit 39 and the display control unit 50. At this time, the switch 65 is turned on to connect the display data creation unit 39 and the display data transmission unit 32 so that the display data is wirelessly transmitted to the handset 2 side, and the test result is displayed on the display unit 13 on the handset 2 side. Can be displayed.

As described above, according to the ultrasonic flaw detector 60 of the present embodiment, each data can be wirelessly communicated, so there is no need to connect the parent device 3 and the child device 2 with the cable 4 or the like. Therefore, even if the inspection site where the nondestructive inspection is performed is a small place with few scaffolds, the inspection site is not complicated and the safety of the inspection work can be further improved.
As this data transfer, for example, a wireless LAN is used. In particular, either analog signals or digital signals may be used for display data transfer. In the case of using a digital signal, it is preferable to use a format such as MPEG2 and transmit, for example, by a wireless LAN.

Next, a case where the second probe 62 on the base unit 3 side is used will be described.
In this case, the switch 64 is switched in advance by the direct key or menu operation of the input device 34 so that the second probe transmission / reception control unit 63 and the signal processing unit 38 are connected. Then, the second probe 62 is driven to receive the second inspection signal. The received second inspection signal is sent to the signal processing unit 38 and then displayed on the display unit 35 on the parent device 3 side via the display data creation unit 39 and the display control unit 50. At this time, the switch 65 is turned on to connect the display data creation unit 39 and the display data transmission unit 32 so that the display data is wirelessly transmitted to the handset 2 side, and the test result is displayed on the display unit 13 on the handset 2 side. Can be displayed.
In particular, since the switch 65 is provided between the display data creation unit 39 and the display data transmission unit 32, the inspection result is displayed only on the display unit 35 on the base unit 3 side by turning off the switch 65. can do. That is, it is possible to perform nondestructive inspection with the parent device 3 alone. Then, by stopping the display data transmission unit 32 at this time, it is possible to suppress excessive power consumption and to suppress battery consumption.

Even when the second probe 62 on the parent device 3 side is used, the setting of the parent device 3 may be changed from the input device 14 on the child device 2 side. In this case, it is only necessary to wirelessly transmit to the parent device 3 side via the set value transmission / reception unit 15 on the child device 2 side. In this case, the set value is basically stored on the parent device 3 side, but may be recorded and held on the child device 2 side.
Further, when the second probe 62 of the parent device 3 is used, the child device 2 can be used as a remote controller and an external monitor of the parent device 3. Therefore, if the probe can be connected and inspected not only in the slave unit 2 but also in the master unit 3, the usage method is expanded and the work efficiency is improved.

In addition, the probe transmission / reception control unit 10 on the handset 2 side is set to stop when the second probe transmission / reception control unit 63 on the base unit 3 side is operating. You may set so that the 2nd probe transmission / reception control part 63 by the side of the apparatus 3 may be stopped when the probe transmission / reception control part 10 by the side of the subunit | mobile_unit 2 is act | operating.
By doing so, for example, when using the second probe 62 on the parent device 3 side, the probe transmission / reception control unit 10 on the child device 2 side can be stopped. This can reduce battery consumption. Further, when the probe 7 on the handset 2 side is used, the second probe transmission / reception control unit 63 on the handset 3 side can be stopped. Consumption can be suppressed.

  As described above, according to the ultrasonic flaw detector 60 of this embodiment, the probe 7 or the second probe 62 connected to the slave unit 2 and the master unit 3 can be easily connected by the switch 64. Since it can be switched and used, it is possible to perform a nondestructive inspection while comparing the inspection result at a location slightly different from the location being inspected by the slave unit 2. Therefore, the work efficiency of nondestructive inspection is improved and more diverse inspections can be performed.

  The technical scope of the present invention is not limited to the above embodiment, and various modifications can be made without departing from the spirit of the present invention.

  For example, in the first embodiment, as the charging unit 36, the base unit 3 is formed with the opening 42 and the charger is provided at the bottom of the opening 42. However, the present invention is not limited to this configuration. 7, the child device 2 may be charged using the charger 69 connected to the parent device 3 via the cable 68 as a charging means. By doing so, it is not necessary to form the opening 42 in the base unit 3, so that the base unit 3 can be made more compact.

Further, in each of the above embodiments, the set value transmitting / receiving unit 33 and the inspection signal receiving unit 30 on the base unit 3 side are separately provided, but they may be configured integrally. Similarly, the set value transmission / reception unit 15 and the inspection signal transmission unit 11 on the handset 2 side may be integrally configured.
Furthermore, in each said embodiment, although the ultrasonic flaw detector was taken as an example as a nondestructive inspection apparatus, it is not restricted to this, For example, you may employ | adopt an eddy current flaw detector.

It is a lineblock diagram of a 1st embodiment of a nondestructive inspection device concerning the present invention. It is a figure which shows the state which accommodates the subunit | mobile_unit shown in FIG. 1 in a main | base station, and is charging the subunit | mobile_unit. It is an internal block diagram of the subunit | mobile_unit shown in FIG. It is an internal block diagram of the main | base station shown in FIG. It is a block diagram of 2nd Embodiment of the nondestructive inspection apparatus which concerns on this invention. It is an internal block diagram of the main | base station shown in FIG. It is a figure which shows the other structure of the charging means of the main | base station shown in FIG. It is a block diagram which shows an example of the conventional nondestructive inspection apparatus. It is a block diagram which shows another example of the conventional nondestructive inspection apparatus.

Explanation of symbols

S Subject 1, 60 Ultrasonic flaw detector (Non-destructive inspection device)
2 Slave unit (inspection signal collection unit)
3 Master unit (signal processing unit)
7 Probe (sensor part)
10. Probe transmission / reception control unit (sensor unit drive means)
11 Inspection signal transmission unit (inspection signal transmission means)
12 Display data receiving unit (display data receiving means)
13 Display 14, 34 Input device (input means)
15 Setting value transmission / reception unit (setting value receiving means, setting value transmitting means, trigger receiving means)
30 Inspection signal receiver (Inspection signal receiving means)
31 Signal processing means 32 Display data transmission section (display data transmission means)
33 Setting value transmitting / receiving unit (setting value receiving means, setting value transmitting means, trigger transmitting means)
35 Display section (second display section)
36 Charging means 62 Second probe (second sensor unit)
63 2nd probe transmission / reception control part (2nd sensor part drive means)
64 switches (switching means)

Claims (14)

A nondestructive inspection apparatus for inspecting at least one defect on the surface or inside of an object,
An examination signal collection unit disposed in the vicinity of the subject, and a signal processing unit for transferring data between the examination signal collection unit,
The inspection signal collecting unit detects the defect of the subject and generates an inspection signal corresponding to the defect; a sensor unit driving unit that drives the sensor unit and receives the inspection signal; Inspection signal transmitting means for transmitting the inspection signal to the signal processing unit, display data receiving means for receiving display data transmitted from the signal processing unit and converted based on the inspection signal, and received display data And a display unit for displaying
The signal processing unit is converted into inspection signal receiving means for receiving the inspection signal transmitted from the inspection signal transmitting means, and signal processing means for performing predetermined processing on the received inspection signal and converting it into the display data. And a display data transmitting means for transmitting the display data to the inspection signal collecting unit. In the nondestructive inspection device according to claim 1,
The signal processing unit includes a gate function that preliminarily adjusts a threshold value, a trigger unit that reflects the threshold value adjusted by the gate function in the inspection signal received by the inspection signal receiving unit, the inspection signal, and the A trigger transmission means for comparing a threshold value and transmitting a comparison result to the test signal collection unit;
The non-destructive inspection apparatus, wherein the inspection signal collection unit includes trigger receiving means for receiving the comparison result. In the nondestructive inspection device according to claim 1,
The inspection signal collection unit includes input means for inputting a set value, and set value transmission means for transmitting the input set value to the signal processing unit,
The nondestructive inspection apparatus, wherein the signal processing unit includes setting value receiving means for receiving the setting value. In the nondestructive inspection device according to claim 1,
The non-destructive inspection apparatus, wherein the signal processing unit includes a second display unit that displays the display data. In the nondestructive inspection device according to claim 1 or 4,
The signal processing unit includes input means for inputting a set value, and set value transmitting means for transmitting the input set value to the inspection signal collection unit,
The non-destructive inspection apparatus, wherein the inspection signal collecting unit includes a set value receiving means for receiving the set value. In the nondestructive inspection device according to claim 1 or 4,
The signal processing unit detects the defect of the subject and generates a second inspection signal corresponding to the defect, drives the second sensor unit, and performs the second inspection. A second sensor unit driving unit that receives a signal, a switching unit that switches either the second inspection signal or the inspection signal and inputs the signal to the signal processing unit, and a set value are input. Input means, and setting value transmission means for transmitting the inputted setting value to the inspection signal collection unit,
The non-destructive inspection apparatus, wherein the inspection signal collecting unit includes a set value receiving means for receiving the set value. The nondestructive inspection apparatus according to claim 6,
The sensor unit driving unit is set to stop when the second sensor unit driving unit is operating,
The non-destructive inspection apparatus, wherein the second sensor unit driving unit is set to stop when the sensor unit driving unit is operating. In the nondestructive inspection device according to claim 1,
The nondestructive inspection apparatus, wherein the data transfer between the inspection signal collection unit and the signal processing unit is performed by wireless communication. In the nondestructive inspection device according to claim 1,
The nondestructive inspection apparatus, wherein the data transfer between the inspection signal collection unit and the signal processing unit is performed by wired communication. In the nondestructive inspection device according to claim 1,
The nondestructive inspection apparatus, wherein the inspection signal is an analog signal. In the nondestructive inspection device according to claim 1,
The nondestructive inspection apparatus, wherein the inspection signal is a digital signal. In the nondestructive inspection device according to claim 1,
The nondestructive inspection device, wherein the display data is an analog signal. In the nondestructive inspection device according to claim 1,
The nondestructive inspection device, wherein the display data is a digital signal. In the nondestructive inspection device according to claim 1,
The inspection signal collection unit is battery driven,
The non-destructive inspection apparatus, wherein the signal processing unit includes a charging means for charging the inspection signal collection unit.

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