JP2006153543A - Device for supporting optical path length setting, and concentration measuring system - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To support setting of an expandable/contractible optical path length of a measurement cell. <P>SOLUTION: This optical path length setting support device for supporting the setting of the optical path length L of the measurement cell 10, when measuring a sample gas concentration by using the measurement cell 10, capable of setting the optical path length L expandably and contractibly, is equipped with a specific information storage means 22 for storing specific information for specifying the optical path length L suitable for the concentration range of the sample gas in the measurement cell 10, based on sensor outputs from an infrared sensor 15 detected with a plurality of different optical path lengths L in the measurement cell 10; a sensor output fetching means 21a for fetching each sensor output outputted from the infrared sensor 15, corresponding to the plurality of different optical path lengths L, in correlatively with each optical path length L; an optical path length specification means 21b for specifying the optical path length L suitable for the concentration range based on the taken sensor output and the specific information in the specific information storage means 22; and an optical path length change instruction means 21c for instructing change in the measurement cell 10 to the specified optical path lengths L. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to an optical path length setting support device and a concentration measurement system, and more specifically, a measurement in which an optical path length used for measuring a concentration of a sample gas such as carbon dioxide, carbon monoxide, moisture, and hydrocarbon can be set in a freely stretchable manner. The present invention relates to an optical path length setting support device that supports setting of an optical path length of a cell, and a concentration measurement system including the optical path length setting support device.

  Since many gases have a characteristic absorption wavelength band in the infrared wavelength region, a gas concentration measuring device that detects the ratio of the infrared absorption light intensity of the gas to be measured and accurately measures the concentration has been proposed ( Patent Document 1).

  FIG. 7 is a diagram showing a schematic configuration of a conventional gas concentration measuring apparatus. For example, the infrared absorption wavelength of carbon dioxide is 4.3 μm and 15 μm, and since this ratio is stable, the gas concentration measuring apparatus shown in FIG. 3 μm and 15 μm filters 107 and 108 and photodetectors 109 and 110 are provided in combination. The cell 102 is arranged so that the transparent window 103 on one side faces the light source 101 and the window 104 on the other side faces the filters 107 and 108, respectively, and the gas to be measured is contained inside the cell 102. It has an intake 105 and an intake 106 for the gas.

  First, the light source 101 is turned on in a state where a predetermined gas is filled in the cell 102, the signals from the photodetectors 109 and 110 are measured, and the ratio is set as the ratio of the absorption intensity used as a reference. Next, the gas to be measured is filled in the cell 102, the signals from the photodetectors 109 and 110 are measured, and when the ratio matches a preset reference ratio, the gas concentration measuring device is By measuring the concentration of a gas based on the infrared absorption intensity of the measurement gas, it has been possible to accurately measure the concentration without being influenced by other gases.

  However, since the gas concentration measuring apparatus described above requires two types of expensive optical filters, there is a problem that the apparatus becomes expensive and the cost cannot be reduced. Further, although the characteristics of individual filters change with time, there is a possibility that the characteristics will change in the same manner, and therefore there is a problem that the measurement accuracy is lowered when a deviation occurs in the change.

  In order to improve the measurement accuracy, it is known that the length of the measurement cell (optical path length) is set long when the concentration is low and short when the concentration is high, according to the concentration range of the sample gas. Yes. However, when the length of the measurement cell is changed, there is a problem that many parts of the measurement cell must be prepared with different optical path lengths so as to correspond to various specifications of the concentration range of the sample gas. there were.

In order to solve this problem, a measurement cell has been proposed in which a measurement cell having an optical path length suitable for the concentration range of the sample gas can be manufactured easily and at low cost. In this measurement cell, a light source unit is disposed on the left side of the first cylindrical body, a detection unit is disposed on the right side of the second cylindrical body, and the second cylindrical body is disposed on the inner periphery of the right side portion of the first cylindrical body. The optical path length suitable for the concentration range of the sample gas has been realized only by assembling and adjusting by fitting the outer peripheral portion of the left portion and making it relatively movable in the axial direction (see Patent Document 2).
JP-A-48-42792 Japanese Patent Laid-Open No. 10-62335

  However, the optical path length suitable for the concentration range of the sample gas can be set by the measurement cell. However, when the concentration of the sample gas is unknown, the measurement cell is set to the optical path length suitable for the concentration. If the optical path length suitable for the concentration range of the sample gas is not set, there is a problem that the accuracy of the measured concentration is lowered. For this reason, the above-described gas concentration measuring device that requires two kinds of expensive optical filters must be used, and the cost of the concentration measuring system having the concentration measuring device cannot be reduced.

  Therefore, in view of the above-described problems, an object of the present invention is to provide an optical path length setting support device and a concentration measurement system that support the setting of the optical path length of a stretchable measurement cell.

  The optical path length setting support device according to claim 1, which is made according to the present invention in order to solve the above-mentioned problem, has a light source 13 that emits infrared rays on one side, as shown in the basic configuration diagram of FIG. 1, and the other side. A filter 14 that transmits a wavelength corresponding to an absorption band of the sample gas that absorbs the infrared light and an infrared sensor 15 that detects the intensity of the infrared light that has passed through the filter 14 are sequentially disposed, and the filter 14 or This is an optical path length setting support device that supports the setting of the optical path length of the measurement cell when the concentration of the sample gas is measured using the measurement cell 10 in which the optical path length L to the infrared sensor 15 can be freely set. Based on sensor outputs indicating the intensity of the infrared rays detected by the infrared sensor 15 at a plurality of different optical path lengths L in the measurement cell 10 determined in advance, Specific information storage means 22 for storing specific information for specifying the optical path length L suitable for the concentration range of the sample gas filled in the cell 10, and the infrared sensor 15 outputs corresponding to the plurality of different optical path lengths L. Based on the sensor output capturing means 21a that captures the sensor output associated with the optical path length L, the sensor output captured by the sensor output capturing means 21a, and the specific information stored in the specific information storage means 22 An optical path length specifying means 21b for specifying an optical path length L suitable for the concentration range of the sample gas, and an optical path length changing instruction means 21c for instructing the optical path length L specified by the optical path length specifying means 21b to change the measurement cell 10. And.

  According to the optical path length setting support device of the present invention described in claim 1 above, measurement is performed based on sensor outputs output from the infrared sensor 15 corresponding to a plurality of different optical path lengths L in a predetermined measurement cell 10. For example, specific information such as a calculation formula or a table for specifying the optical path length L suitable for the concentration range of the sample gas filled in the cell is stored in the specific information storage means. And the sensor output which shows the intensity | strength of the infrared rays which the infrared sensor 15 detected corresponding to several different optical path length L is related with the corresponding optical path length L, and is taken in by the sensor output taking-in means 21a. Based on the sensor output and the specific information stored in the specific information storage means 22, the optical path length L suitable for the concentration range of the sample gas is specified by the optical path length specifying means 21b. 10 is instructed by the optical path length change instructing means 21c.

  In order to solve the above-mentioned problem, the invention according to claim 2 is the optical path length setting support apparatus according to claim 1 as shown in the basic configuration diagram of FIG. At least one of the above is set such that the infrared light passing through the measurement cell 10 has an optical path length L that is not absorbed by the sample gas.

  According to the optical path length setting support device of the present invention described in claim 2 above, at least one of the plurality of different optical path lengths L in the measurement cell 10 does not absorb the infrared rays passing through the measurement cell 10 by the sample gas. As described above, the optical path length L from the light source 13 to the filter 14 or the infrared sensor 15 is set to zero, for example, a value close to zero. Also, a plurality of optical path lengths L can be set such that the value is not limited to zero and is close to zero.

  In order to solve the above problems, the concentration measuring system according to claim 3 according to the present invention, as shown in the basic configuration diagram of FIG. 1, transmits a light source 13 that emits infrared rays and a wavelength at which the sample gas absorbs the infrared rays. Filter 14, an infrared sensor 15 that detects the intensity of infrared light transmitted through the filter 14 and outputs a sensor signal indicating the intensity, the light source 13 is disposed at one end, and the other side The filter 14 and the infrared sensor 15 for detecting the intensity of infrared light transmitted through the filter 14 are sequentially arranged at the end, and the optical path length L from the light source 13 to the filter 14 or the infrared sensor 15 can be changed. A concentration measurement system comprising a measurement cell 10 and a concentration measurement device 20 that measures the concentration of the sample gas based on the sensor output output from the infrared sensor 15. And further comprising the optical path length setting support device 2 according to claim 1, wherein the concentration measuring device 20 has an optical path length L that is instructed to be changed by the optical path length change instructing means 21 c of the optical path length setting support device 2. When the changed measurement cell 10 is filled with the sample gas, the sensor output of the infrared sensor 15 that detects the intensity of infrared rays from the light source 13 that has passed through the measurement cell 10 and passed through the filter 14 is output. Based on this, the concentration of the sample gas is measured.

  According to the concentration measurement system of the present invention described in claim 3, when the optical path length L of the measurement cell 10 is set by an instruction from the optical path length setting support device 2, the light source is supplied to the measurement cell 10 filled with the sample gas. Infrared rays from 13 are incident, and infrared rays that pass through the measurement cell 10 and pass through the filter 14 are detected by the infrared sensor 15. Then, the concentration measuring device 20 measures the concentration of the sample gas based on the sensor output of the infrared sensor 15 according to this detection.

  As described above, according to the optical path length setting support device of the present invention described in claim 1, the sample filled in the measurement cell based on the sensor output of the infrared sensor corresponding to a plurality of different optical path lengths in the measurement cell. Specific information for specifying the optical path length suitable for the gas concentration range is stored in advance, and the sensor output actually measured by the infrared sensor corresponding to a plurality of different optical path lengths of the measurement cell filled with the sample gas Since the optical path length suitable for the concentration range of the sample gas is specified based on the sensor output and the specific information, the measurement cell is instructed to set the measurement cell. By setting the optical path length of the measurement cell, the optical path length suitable for the concentration range can be obtained even if the concentration of the sample gas is unknown. Therefore, since the concentration can be measured with a measurement cell having an optical path length suitable for the concentration range of the sample gas, it is possible to contribute to improvement in measurement accuracy.

  According to the invention described in claim 2, in addition to the effect of the invention described in claim 1, one of a plurality of different optical path lengths in the measurement cell is set such that the infrared light is not absorbed by the sample gas. Since the infrared rays detected by the infrared sensor become the reference sensor output related to the deterioration of the light source and the fluctuation of the infrared due to the environment, etc., regardless of the concentration of the sample gas. The optical path length can be specified in consideration of fluctuations and the like, and a decrease in measurement accuracy due to secular change can be reduced. Therefore, since the concentration can be measured with a measurement cell having an optical path length more suitable for the concentration range of the sample gas, it is possible to contribute to improvement of measurement accuracy.

  As described above, according to the concentration measurement system of the present invention described in claim 3, when the optical path length of the measurement cell is set by the instruction of the optical path length setting support device, the infrared ray that has passed through the measurement cell is detected. Since the concentration of the sample gas is measured based on the sensor output of the corresponding infrared sensor, the concentration of the sample gas can be measured with the measurement cell set to the optical path length suitable for the concentration range of the sample gas. Therefore, the concentration of the sample gas can be detected with high accuracy. In addition, by setting one optical path length among a plurality of different optical path lengths as a reference, it is only necessary to use a filter corresponding to an absorption band in which the sample gas absorbs infrared rays. Cost can be reduced.

  Hereinafter, an embodiment of a concentration measurement system including a concentration measurement device incorporating an optical path length setting support device according to the present invention will be described with reference to the drawings of FIGS.

  FIG. 2 is a configuration diagram showing a schematic configuration of the optical path length setting support device and the concentration measurement system according to the present invention. As shown in FIG. 2, the concentration measurement system 1 passes through a measurement cell 10 filled with carbon dioxide gas (sample gas), a light source 13 that emits infrared light incident on the measurement cell 10, and the measurement cell 10. A filter 14 that transmits a wavelength at which the sample gas absorbs infrared rays out of infrared rays emitted from the measurement cell 10, an infrared sensor 15 that detects the intensity of infrared rays that have passed through the filter 14, and a sensor signal output by the infrared sensor 15 And a concentration measuring device 20 that measures the concentration of carbon dioxide gas based on the above. In the best mode, a case where the measurement cell 10 is filled with carbon dioxide gas having an unknown concentration and the concentration is measured by the concentration measuring device 20 will be described.

  The measurement cell 10 includes a first cylindrical body 11 and a second cylindrical body 12, and the outer peripheral portion 11a of the first cylindrical body 11 is fitted to the inner peripheral portion 12a of the second cylindrical body 12, and measurement is performed. The cell 10 is configured to be relatively movable in the axial direction. A space surrounded by the end surface 11b on the one end side of the first cylindrical body 11 and the inner peripheral portion 12a of the second cylindrical body 12 serves as a measurement chamber E filled with the sample gas. The chamber E is configured such that the volume can be changed by moving the first cylindrical body 11 in the axial direction.

  A light source 13 that emits infrared rays is disposed on one end side (left side in FIG. 2) of the first cylindrical body 11, and a filter 14 and an infrared sensor 15 are sequentially disposed on the other end side (right side in FIG. 2) of the second cylindrical body 12. It is arranged. And it becomes the structure which can change the optical path length L which is the distance from the light source 13 to the filter 14 by moving the 1st cylindrical body 11 to the said axial direction.

  In this best mode, as shown in FIG. 2, a point P2 (corresponding to a movement limit position on one end side (left side in FIG. 2) of the second cylindrical body 12 from a point P0 corresponding to the position of the filter 14 is shown. The range of movement up to P2> P0) is possible. FIG. 3 is a diagram for explaining mode 1 of the measurement cell 10. As shown in FIG. 3, the position where the first cylindrical body 11 is moved from the point P2 toward the filter 14 by a predetermined distance [for example (P2-P0) / 2] is a point P1 (P2> P1> P0). It has become.

  FIG. 4 is a diagram for explaining mode 0 of the measurement cell. As shown in FIG. 4, the position where the first cylindrical body 11 is moved from the point P1 toward the filter 14 so that the end surface 11b thereof is in contact with the end surface 12b of the second cylindrical body 12 is a point P0 ′. Yes. Since the point P0 'is as close as possible to the point P0, the optical path length L at that time can be regarded as zero. That is, since the infrared rays that reach the filter 14 from the light source 13 are not affected by absorption by the sample gas, the sensor output at that time can be used as the reference sensor output.

  In the concentration measurement system 1, the case where the end surface 11b of the first cylindrical body 11 is located at the point P2 is defined as mode 2, the case where it is located at the point P1 is defined as mode 1, and the case where it is located at the point P0 ′ is defined as mode 0. ing. In the best mode, a case where three stages of modes are set will be described. However, the present invention is not limited to this, and three or more stages of modes are set. Various embodiments such as an arbitrary distance from P0 ′ can be adopted.

  In addition, on the peripheral wall of the second cylindrical body 12, an inlet 12s into which the sample gas is introduced into the measurement chamber E, and two (a plurality of) outlets 12e1 and 12e2 through which the sample gas filled in the measurement chamber E flows out. Is provided. Although the inlet 12s and the outlets 12e1 and 12e2 are not shown in the drawing, they have a valve or the like and are configured to be able to control inflow and outflow.

  The inflow port 12s is closed by the first cylindrical body 11 in the mode 0, that is, provided at a position where the inflow of the sample gas is prevented. Further, the outlet 12e1 is provided so as to be blocked by the first cylindrical body 11 in the mode 0 and to allow the sample gas to flow out in the modes 1 and 2. The outlet 12e2 is provided so as to be blocked by the first cylindrical body 11 in the modes 0 and 1 and to allow the sample gas to flow out in the mode 2.

  FIG. 5 is an enlarged view of a portion A in FIG. 2, and each of the first cylindrical body 11 and the second cylindrical body 12 has grooves for positioning at the above-described points P0 ′ to P2. 11c and 12c are provided corresponding to the points P0 ′ to P2. Each of the grooves 12c of the second cylindrical body 12 is provided with a spring 12g that biases the bearing 12f in a direction in which the bearing 12f projects from the outer peripheral portion 12a into the second cylindrical body 12.

  When the second cylindrical body 12 is moved, the bearing 12f fits into the grooves 12c of the second cylindrical body 12, and is pushed into the grooves 12c until it is moved to the plurality of grooves 11c of the first cylindrical body 11. It will be in the state. When moved to the positioning position, the bearing 12f enters the groove 11c of the first cylindrical body 11 by the urging force of the spring 12g and is positioned.

  The light source 13 is assumed to change the wavelength of infrared rays (thermal energy) depending on the applied voltage. For example, a black body furnace, a light bulb, or the like is used. When the heat generated by the voltage applied to the light source 13 changes, the peak of the wavelength of far infrared rays (thermal energy) changes, so the temperature of the light source 13 is controlled by the applied voltage.

  Since the absorption wavelength of carbon dioxide gas, which is the sample gas in this best mode, is 4.3 μm, the filter 14 uses an optical filter that transmits the wavelength of 4.3 μm.

  The infrared sensor 15 uses a pyroelectric infrared sensor or the like and is connected to a concentration measuring device 20 described later. The infrared sensor 15 converts infrared heat that has passed through the filter 14 into electrical energy. When the heat changes, the infrared sensor 15 converts the heat into electrical energy and outputs the electrical energy to the concentration measuring device 20 as a sensor output.

  Next, the concentration measuring apparatus 20 includes a microprocessor (MPU) 21 that operates according to a predetermined program. As is well known, the MPU 21 is a central processing unit (CPU) 21a that performs various processes and controls according to a predetermined program, a ROM 21b that is a read-only memory storing a program for the CPU 21a, and various data. And a RAM 21c, which is a readable / writable memory having an area necessary for processing operations of the CPU 21a.

  The MPU 21 is connected to an electrically erasable / rewritable read-only memory 22 capable of retaining stored contents even while the apparatus main body is in an off state. The memory 22 stores various kinds of information (described later) necessary for calculating the density, and stores the calculated density in a time series so that it can be read from the outside.

  The concentration measuring device 20 further includes a control circuit 23, a display unit 24, and an interface unit 25, which are connected to the MPU 21, respectively. The control circuit 23 controls the voltage applied to the light source 13 in accordance with an instruction from the MPU 21. Then, for example, the light source 13 is caused to blink by turning on and off the light source 13 with a predetermined period of 1 Hz or the like.

  The display unit 24 uses an LCD or the like, and displays various information instructed from the MPU 21. And in this best form, the display part 24 displays the change instruction information which instruct | indicates the change to the optimal mode (optical path length) of the measurement cell 10 output from MPU21, and the display part 24 changes a mode etc. to a measurement person etc. Is configured to instruct.

  The interface unit 25 can be connected to the infrared sensor 15 of the measurement cell 10 and includes an amplifier that amplifies the sensor output output from the infrared sensor 15. The sensor output amplified by the interface unit 25 is input to the MPU 21. In addition, the MPU 11 takes in the sensor output from the infrared sensor 15 in synchronization with the predetermined period, performs Fourier transform on the sensor output, and converts it into a voltage of each frequency. Therefore, the influence of noise or the like is suppressed to a minimum by referring to the voltage only at 1 Hz.

Next, in the configuration described above, Beer-Lambert's law (hereinafter referred to as Lambert-Beer's law) can be applied to infrared rays that have passed through the sample gas filled in the measurement chamber E of the measurement cell 10. When the incident light I ₀ λ having the wavelength λ is incident on the measuring cell 1 having the optical path length L, the concentration C, and the extinction coefficient α, and is emitted as the outgoing light Iλ, the following equation is established according to Lambert-Beer's law.
ln (I ₀ λ / Iλ) = αCL (1)
When the expression (1) is expanded, the following expression is established.
Iλ = I ₀ λe ⁻ α ^CL (2)
Thus, it can be seen from equation (2) that Iλ decreases exponentially according to the gas concentration and the optical path length (length).

The following calculation formula is established between the ratio of Iλ / I ₀ λ and the sensor output PV of the infrared sensor 15.
Iλ / I ₀ λ = A * PV (3)
Substituting this equation (3) into equation (1) to obtain the concentration C yields the following equation.
C = ln (A * PV) / αL (4)
Since A, α, and L in Equation (4) are known values, these are summarized into a set, and the sensor output PV corresponding to the concentration C is measured from the experiment, and the coefficient β is obtained from the regression equation. The following equation is obtained.
C = β * PV (5)

  Therefore, the density calculation information indicating the formula (5) is stored in the ROM 21b in advance, and the CPU 21a calculates the density by substituting the sensor output fetched from the infrared sensor 15 into the RAM 21c and the like into the density calculation information. .

  The memory 22 is filled in the measurement cell 10 based on the sensor output indicating the intensity of the infrared rays detected by the infrared sensor 15 at the above-described points P0 ′ to P2 (a plurality of different optical path lengths) in the measurement cell 10. Since the specific information for specifying the points P0 ′ to P2 (optical path length) suitable for the concentration of the sample gas is stored, the memory 22 functions as the specific information storage means in the claims.

  For example, in this best mode, a calculation formula for calculating a concentration based on a ratio (PV2 / PV0) of sensor outputs PV2 and PV0 indicating the intensity of infrared rays detected by the infrared sensor 15 at points P0 ′ and P2, and this A case will be described in which a table in which the points P0 ′ to P2 corresponding to the density are associated is stored as the specific information.

  In the case of the point P0 ′, by substituting “0” for the optical path length L in the equation (2), the ratio of the incident light I0λ to the emitted light Iλ becomes “1”, and the infrared light of the light source 13 is detected regardless of the gas concentration. Since it becomes an output and is related only to the deterioration of the light source 13 and the fluctuation of the infrared rays due to the environment, it can be used as a reference when measuring the carbon dioxide concentration.

Then, the reference sensor output is K, and the equation for calculating the concentration by correcting the variation of the environment and the like based on β * PV / K by modifying equation (5) is as follows: Derived. Note that β * PV / K is an argument X.
F (X) = C ₀ + A * e ^{(X−X0) / t} (6)
However, C ₀ , A, X0, and t are constants.

  If the change of the light source 13 and the change due to the surrounding environment are expressed by δ in the equation (6), it is expressed by β * PV * δ / K * δ, and since it similarly affects the denominator and numerator, δ is canceled out. It is not affected by changes in the light source 13 and fluctuations in the surrounding environment. By using the standard sensor output, a reference filter for obtaining a standard infrared sensor output that is not affected by the sample gas required in the conventional configuration can be excluded from the configuration.

  Therefore, in this best mode, a calculation program corresponding to the equation (6) is stored as specific information, and β * PV2 / PV0 is an argument from the sensor outputs PV2 and PV0 (corresponding to K) captured from the infrared sensor 15. As described above, the calculation program is executed (called). The calculation program stores the density as the calculation result in a predetermined area of the RAM 21c.

  FIG. 6 is a flowchart showing an example of an outline of processing according to the present invention executed by the CPU of the concentration calculation device (optical path length setting support device), and the concentration of carbon dioxide gas (sample gas) with reference to the flowchart shown in FIG. An example of the calculation will be described.

  In step S1, change instruction information for instructing to change the measurement cell 10 to mode 2 is generated and output to the display unit 24, whereby an instruction screen for instructing the display unit 24 to change to mode 2 is displayed. After that, the process proceeds to step S2.

  In step S2 (sensor output capturing means), the light source 2 is controlled by instructing the control circuit 13 to perform voltage control using a predetermined voltage in accordance with the display of the instruction screen for mode 2 on the display unit 24. The sensor output PV2 output by the infrared sensor 15 that emits infrared rays and detects the infrared rays that have passed through the measurement chamber E of the measurement cell 10 is captured, stored in the RAM 21c in association with mode 2 (optical path length), and then to step S3. move on.

  In step S3, change instruction information for instructing the change of the measurement cell 10 to mode 0 is generated and output to the display unit 24, whereby an instruction screen for instructing the display unit 24 to change to mode 0 is displayed. After that, the process proceeds to step S4.

  In step S4 (sensor output capturing means), the control circuit 13 is instructed to perform voltage control with a predetermined voltage in accordance with the display of the instruction screen for mode 0 on the display unit 24, whereby the light source 2 is The sensor output PV0 output by the infrared sensor 15 that has detected the emitted infrared light is captured, stored in the RAM 21c in association with mode 0 (optical path length), and then the process proceeds to step S5.

  In step S5 (optical path length specifying means), the above-mentioned argument β * PV2 / PV0 is calculated based on the sensor outputs PV2 and PV0 of the RAM 21c, and the calculation program for the memory 22 is executed using this value as an argument. The optimum mode is specified based on the calculated density and the table of specific information, and the specified mode is stored in the RAM 21c, and then the process proceeds to step S6.

  In step S6 (optical path length change instructing means), change instruction information for instructing the mode change of the measurement cell 10 to the mode of the RAM 21c is generated and output to the display unit 24, whereby the mode change is performed on the display unit 24. An instruction screen for instructing is displayed, and then the process proceeds to step S7. Note that the method of instructing the change of the optical path length can be in various forms such as instructing by voice, instructing by display and voice. In addition, when the optical path length of the measurement cell 10 is automatically changed by a drive device or the like, the change is instructed to the drive device or the like.

  In step S <b> 7, it is determined whether or not the mode change of the measurement cell 11 is completed based on input data from an input unit, a connection unit, etc. (not shown). If it is determined that the mode change has not been completed (N in S7), the determination process is repeated to wait for the completion of the mode change. On the other hand, if it is determined that the mode change has been completed (Y in S7), the process proceeds to step S8.

  In step S8, when the control circuit 13 is instructed to perform voltage control using a predetermined voltage, the light source 2 emits infrared light, and the infrared sensor 15 that detects the infrared light that has passed through the measurement chamber E of the measurement cell 10 outputs the light. The obtained sensor output PV is taken in and stored in the RAM 21c, and then the process proceeds to step S9.

  In step S9, the sensor output PV of the RAM 21c is substituted into the concentration calculation information stored in the ROM 21b, and the concentration of the sample gas is calculated and stored in the RAM 21c. In step S10, the concentration of the RAM 21c is output to the display unit 24. Concentration information to be generated is generated and output to the display unit 24, whereby the concentration of the sample gas is displayed on the display unit 24, and then the process ends.

  As is clear from the above description, the CPU 11a of the concentration measuring apparatus 10 functions as the sensor output capturing means, the optical path length specifying means, and the optical path length change instructing means described in the claims.

  Next, an example of the operation (action) of the present embodiment of the concentration measurement system 1 using the concentration measurement device (optical path length setting support device) 20 having the above-described configuration will be described below.

  In measuring the concentration of carbon dioxide gas whose concentration is unknown, first, when the concentration measuring device 20 instructs to change the measurement cell 10 to mode 2, the measurer or the like goes to the first cylinder up to the point P2 corresponding to mode 2. By moving the body 11, the optical path length L of the measurement cell 10 is set, and the measurement chamber E of the measurement cell 10 is filled with carbon dioxide gas. Then, the concentration measuring device 20 applies a predetermined voltage to the light source 13, the infrared light emitted from the light source 13 passes through the measurement chamber E of the measurement cell 10, and the infrared light transmitted through the filter 14 is detected by the infrared sensor 15. The sensor output PV2 of the infrared sensor 15 is taken into the concentration measuring device 20 in association with the optical path length L of the measurement cell 10.

  When the concentration measuring device 20 instructs the measurement cell 10 to change to mode 0, the measurer or the like causes the carbon dioxide gas to flow out from the measurement chamber E of the measurement cell 10 to the point 0 ′ corresponding to mode 0. The optical path length L of the measurement cell 10 is set by moving the cylindrical body 11. Then, the concentration measuring device 20 applies a predetermined voltage to the light source 13 so that the infrared rays emitted from the light source 13 pass through the filter 14 and are detected by the infrared sensor 15. The sensor output PV 0 of the infrared sensor 15 is taken into the concentration measuring device 20 in association with the optical path length L of the measurement cell 10.

  When the concentration measuring device 20 specifies the optimum mode of the measurement cell 10 based on the sensor outputs PV2 and PV0 and the specifying information in the memory 22, the display unit 24 instructs the measurer or the like to change to the optimum mode. For example, when the optimum mode is mode 1, the measurer or the like sets the optical path length L of the measurement cell 10 by moving the first cylindrical body 11 to the point P1 corresponding to mode 1, and the measurement of the measurement cell 10 Chamber E is filled with carbon dioxide gas.

  In response to the completion of measurement preparation, the concentration measuring device 20 applies a predetermined voltage to the light source 13 so that the infrared light emitted from the light source 13 passes through the filter 14 and is detected by the infrared sensor 15. The sensor output PV is taken into the concentration measuring device 20. Then, the concentration measuring device 20 calculates the concentration based on the acquired sensor output PV and the concentration calculation information in the ROM 21b, stores the concentration in the RAM 21c, and displays it on the display unit 24.

  As described above, according to the concentration measurement device (optical path length setting support device) 20, the measurement cell 10 is filled based on the sensor outputs of the infrared sensors 15 corresponding to a plurality of different optical path lengths L in the measurement cell 10. Specific information for specifying the optical path length L suitable for the concentration range of the carbon dioxide gas (sample gas) is stored in advance, and corresponds to a plurality of different optical path lengths L of the measurement cell 10 filled with the sample gas. Then, the sensor output when the infrared sensor 15 is actually measured is fetched, the optical path length L suitable for the concentration range of the sample gas is specified based on the sensor output and the specific information, and the setting of the measurement cell 10 is instructed. Thus, the measurer or the like sets the optical path length L of the measurement cell 10 based on the instruction, so that the optical path length suitable for the concentration range is obtained even if the concentration of the sample gas is unknown. It can be. Therefore, since the concentration can be measured by the measurement cell 10 having the optical path length L suitable for the concentration range of the sample gas, it is possible to contribute to the improvement of measurement accuracy.

  In addition, the infrared sensor 15 detects one of a plurality of different optical path lengths L in the measurement cell 10 because the optical path length L is set so that infrared rays are not absorbed by carbon dioxide gas (sample gas). Since the infrared ray to be used is a standard sensor output related to the deterioration of the light source and the fluctuation of the infrared ray due to the environment regardless of the concentration of the sample gas, the optical path length L is specified in consideration of the deterioration of the light source 13 and the fluctuation due to the environment. It is possible to reduce the decrease in measurement accuracy due to secular change. Therefore, since the concentration can be measured by the measurement cell 10 having the optical path length L more suitable for the concentration range of the sample gas, it is possible to contribute to the improvement of measurement accuracy.

  According to the concentration measurement system 1 of the present invention, when the optical path length L of the measurement cell 10 is set according to an instruction from the concentration measurement device (optical path length setting support device) 20, it responds to detection of infrared rays that have passed through the measurement cell 10. Since the concentration of the sample gas is measured based on the sensor output of the infrared sensor 15, the concentration of the sample gas is measured with the measurement cell 10 set to the optical path length L suitable for the concentration range of the sample gas. Therefore, the concentration of the sample gas can be detected with high accuracy. Further, by setting one optical path length L among a plurality of different optical path lengths L as a reference, it is sufficient to use only the filter 14 corresponding to the absorption band in which the sample gas absorbs infrared rays. The cost of the measurement system 1 can be reduced.

  In the above-described best mode, a case has been described in which a mode (optical path length) suitable for the concentration range of the sample gas is specified based on each sensor output and specific information acquired in modes 2 and 0. However, the present invention is not limited to this, and various forms such as specifying from each sensor output detected at points of mode 2, 1, 0 or higher and specific information can be adopted.

  Further, in the above-described best mode, the case where the density conversion data obtained by Fourier transform of the detected signal is used has been described. However, the present invention is not limited to this, and the peak-to-peak (maximum) of the waveform of the detected signal is not limited. It is possible to adopt various forms such as using density conversion data based on (value-minimum value = waveform width).

  Furthermore, in the above-described best mode, the case where the optical path length setting support device of the present invention is incorporated in the concentration measurement device 20 has been described. However, the present invention is not limited to this, and the optical path length setting support device is used alone. It is possible to adopt various forms such as realization as an apparatus.

It is a block diagram which shows the basic composition of the optical path length setting assistance apparatus and density | concentration measurement system of this invention. It is a block diagram which shows schematic structure of the optical path length setting assistance apparatus and density | concentration measurement system of this invention. It is a figure for demonstrating the mode 1 of a measurement cell. It is a figure for demonstrating the mode 0 of a measurement cell. It is the enlarged view to which the part A in FIG. 2 was expanded. It is a flowchart which shows an example of the process injury based on this invention which CPU of a density | concentration calculation apparatus (optical path length setting assistance apparatus) performs. It is a figure which shows schematic structure of the conventional gas concentration measuring apparatus.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Concentration measuring system 2 Optical path length setting assistance apparatus 10 Measurement cell 13 Light source 14 Filter 15 Infrared sensor 20 Concentration measuring apparatus 21a Sensor output taking means (CPU)
21b Optical path length specifying means (CPU)
21c Optical path length change instruction means (CPU)
22 Specific information storage means (memory)

Claims (3)

A light source that emits infrared light is disposed on one side, and a filter that transmits a wavelength corresponding to the absorption band of the sample gas that absorbs infrared light and an infrared sensor that detects the intensity of infrared light transmitted through the filter are disposed on the other side. When measuring the concentration of the sample gas using a measurement cell that is sequentially arranged and the optical path length from the light source to the filter or the infrared sensor can be set to be stretchable, the setting of the optical path length of the measurement cell is supported. An optical path length setting support device,
The optical path length suitable for the concentration range of the sample gas filled in the measurement cell based on a sensor output indicating the intensity of the infrared light detected by the infrared sensor at a plurality of different optical path lengths in the measurement cell determined in advance. Specific information storage means for storing specific information for specifying
Sensor output capturing means for capturing the sensor output output by the infrared sensor in association with the plurality of different optical path lengths in association with the optical path length;
An optical path length specifying means for specifying an optical path length suitable for the concentration range of the sample gas based on the sensor output captured by the sensor output capturing means and the specific information stored in the specific information storage means;
An optical path length change instruction means for instructing the optical path length specified by the optical path length specifying means to change the measurement cell;
An optical path length setting support device comprising:   2. The optical path length according to claim 1, wherein at least one of the plurality of different optical path lengths is set to have an optical path length in which the infrared light passing through the measurement cell is not absorbed by the sample gas. Setting support device. A light source that emits infrared light, a filter that transmits a wavelength at which the sample gas absorbs the infrared light, an infrared sensor that detects the intensity of the infrared light transmitted through the filter and outputs a sensor signal indicating the intensity, and an end on one side The light source is disposed in the part, and the filter and the infrared sensor for detecting the intensity of infrared light transmitted through the filter are sequentially disposed at the other end, and the light source to the filter or the infrared sensor In a concentration measurement system comprising: a measurement cell capable of changing an optical path length; and a concentration measurement device that measures the concentration of the sample gas based on a sensor output output from the infrared sensor.
The optical path length setting support device according to claim 1 or 2, further comprising:
When the sample gas is filled in the measurement cell that has been changed to the optical path length instructed to be changed by the optical path length change instruction unit of the optical path length setting support device, the concentration measuring device passes through the measurement cell and passes through the measurement cell. A concentration measurement system characterized in that the concentration of the sample gas is measured based on the sensor output of the infrared sensor that detects the intensity of infrared light from the light source that has passed through a filter.

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