JP2006113058A5 - - Google Patents
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- JP2006113058A5 JP2006113058A5 JP2005294303A JP2005294303A JP2006113058A5 JP 2006113058 A5 JP2006113058 A5 JP 2006113058A5 JP 2005294303 A JP2005294303 A JP 2005294303A JP 2005294303 A JP2005294303 A JP 2005294303A JP 2006113058 A5 JP2006113058 A5 JP 2006113058A5
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- JP
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Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US61920104P | 2004-10-15 | 2004-10-15 | |
| US60/619,201 | 2004-10-15 | ||
| US11/141,763 US7398443B2 (en) | 2004-10-15 | 2005-05-31 | Automatic fault-testing of logic blocks using internal at-speed logic-BIST |
| US11/141,763 | 2005-05-31 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006113058A JP2006113058A (ja) | 2006-04-27 |
| JP2006113058A5 true JP2006113058A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 2008-11-20 |
| JP5336692B2 JP5336692B2 (ja) | 2013-11-06 |
Family
ID=35708890
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005294303A Expired - Fee Related JP5336692B2 (ja) | 2004-10-15 | 2005-10-07 | 内部アットスピード論理ｂｉｓｔを用いた論理ブロックの自動故障試験 |
Country Status (8)
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101512362A (zh) * | 2006-07-10 | 2009-08-19 | 阿斯特瑞昂公司 | 自动测试设备的数字波形产生及测量 |
| KR20080019078A (ko) * | 2006-08-22 | 2008-03-03 | 삼성전자주식회사 | 순환 중복 검사를 이용한 테스트 방법 및 이를 이용하는디지털 장치 |
| TWI312076B (en) | 2006-10-19 | 2009-07-11 | Via Tech Inc | Apparatus and related method for chip i/o test |
| TWI304889B (en) | 2006-10-26 | 2009-01-01 | Via Tech Inc | Method and related apparatus for testing chip |
| US8675076B2 (en) * | 2009-07-21 | 2014-03-18 | Qualcomm Incorporated | System for embedded video test pattern generation |
| US20110029827A1 (en) * | 2009-07-29 | 2011-02-03 | International Business Machines Corporation | Method, apparatus, and design structure for built-in self-test |
| US9222971B2 (en) * | 2013-10-30 | 2015-12-29 | Freescale Semiconductor, Inc. | Functional path failure monitor |
| US9665934B2 (en) * | 2014-10-28 | 2017-05-30 | Texas Instruments Incorporated | Apparatus for detecting faults in video frames of video sequence |
| KR102549438B1 (ko) * | 2016-09-27 | 2023-06-29 | 삼성전자주식회사 | 순차 회로, 이를 포함하는 스캔 체인 회로 및 집적 회로 |
| US20190197929A1 (en) * | 2017-12-26 | 2019-06-27 | Novatek Microelectronics Corp. | Driving apparatus of display panel and operation method thereof |
| CN111782448A (zh) * | 2020-07-01 | 2020-10-16 | 长沙景嘉微电子股份有限公司 | 芯片自检测方法、装置、芯片、显示系统及存储介质 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4513318A (en) * | 1982-09-30 | 1985-04-23 | Allied Corporation | Programmable video test pattern generator for display systems |
| US5416784A (en) | 1991-10-28 | 1995-05-16 | Sequoia Semiconductor | Built-in self-test flip-flop with asynchronous input |
| JP3192225B2 (ja) * | 1992-07-15 | 2001-07-23 | 松下電工株式会社 | クロック信号・同期リセット信号発生回路 |
| EP0642083A1 (en) * | 1993-09-04 | 1995-03-08 | International Business Machines Corporation | Test circuit and method for interconnect testing of chips |
| KR19990069337A (ko) * | 1998-02-06 | 1999-09-06 | 윤종용 | 복합 반도체 메모리장치의자기 테스트 회로 및 이를 이용한 자기 테스트 방법 |
| JP2001074811A (ja) * | 1999-09-03 | 2001-03-23 | Hitachi Ltd | 半導体集積回路 |
| US6684358B1 (en) * | 1999-11-23 | 2004-01-27 | Janusz Rajski | Decompressor/PRPG for applying pseudo-random and deterministic test patterns |
| JP4883850B2 (ja) * | 2001-06-29 | 2012-02-22 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US20030074619A1 (en) | 2001-10-12 | 2003-04-17 | Dorsey Michael C. | Memory bist employing a memory bist signature |
| US20030074618A1 (en) * | 2001-10-12 | 2003-04-17 | Dorsey Michael C. | Dual mode ASIC BIST controller |
| JP2003302448A (ja) * | 2002-04-09 | 2003-10-24 | Kawasaki Microelectronics Kk | テスト回路 |
| KR100997166B1 (ko) * | 2002-06-20 | 2010-11-29 | 소니 주식회사 | 디코딩 장치 및 디코딩 방법 |
| US8621304B2 (en) * | 2004-10-07 | 2013-12-31 | Hewlett-Packard Development Company, L.P. | Built-in self-test system and method for an integrated circuit |
-
2005
- 2005-05-31 US US11/141,763 patent/US7398443B2/en active Active
- 2005-09-20 TW TW094132463A patent/TWI370907B/zh not_active IP Right Cessation
- 2005-09-21 AT AT05255823T patent/ATE378608T1/de not_active IP Right Cessation
- 2005-09-21 DE DE602005003302T patent/DE602005003302T2/de not_active Expired - Lifetime
- 2005-09-21 EP EP05255823A patent/EP1647828B1/en not_active Expired - Lifetime
- 2005-09-22 SG SG200506109A patent/SG121944A1/en unknown
- 2005-10-07 JP JP2005294303A patent/JP5336692B2/ja not_active Expired - Fee Related
- 2005-10-11 KR KR1020050095184A patent/KR101268611B1/ko not_active Expired - Lifetime