JP2006108429A - Wafer-processing method and device thereof - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To effectively divide a wafer into individual devices, without lowering the quality of the device in dicing of the wafer. <P>SOLUTION: In the rear surface W2 of a wafer W, a portion other than the rear side of a street S formed in the front surface W1 is coated with a resist film R, and a portion which is not covered with the resist film R is etched to divide to individual devices D from a rear surface to a front surface by fluorine system stable gas which is subjected to plasma processing. Since cutting is not carried out, cracks are not generated, and the quality is improved and, the method is effective for the streets to be separated at a sitting. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a device whose back surface is coated with a resist film and a wafer processing method suitable for manufacturing the device.

  A wafer in which a plurality of devices are partitioned by streets and formed on the front side is formed into a predetermined thickness by grinding the back side, and then divided into individual devices by cutting along the streets and dicing, It is used for various electronic devices (see, for example, Patent Document 1).

JP 2004-228133 A

  However, since the cutting blade that rotates at a high speed cuts into the wafer street during dicing, the device is chipped due to the crushing force of the cutting blade, and the bending strength of the device constituting the wafer is reduced, resulting in a reduction in quality. There's a problem.

  Further, at the time of dicing, it is necessary to precisely align the cutting blade with each street and then cut each street one by one, which is inefficient. In particular, when the device size is small and the number of streets to be cut is large, it takes a considerable time to cut all the streets, and there is a problem that the productivity is remarkably lowered.

  Therefore, the problem to be solved by the present invention is to enable efficient division into individual devices without diminishing device quality when dicing a wafer.

  The present invention relates to a wafer processing method that divides a wafer having a plurality of devices formed on the surface and divided into streets into individual devices, and corresponds to the street formed on the front surface of the wafer among the back surfaces of the wafer. A resist film coating step for coating a resist film on a portion other than the backside, and supplying a fluorinated stable gas into a plasma on the backside portion corresponding to the street where the resist film is not coated on the backside. It is characterized in that it is composed of a dividing step of etching to the surface to divide into individual devices, and a commercializing step of commercializing the device without removing the resist film on the back surface of the device. . Examples of the commercialization process include a pick-up operation, a die attach film attaching operation, a bonding operation, and a mounting operation on a wiring board. The resist film coating process includes a method of removing the resist film on the back side corresponding to the street after covering the entire back surface with the resist film, and a method of covering the resist film by avoiding the back side corresponding to the street from the beginning. There is.

Before the resist film coating process, it is desirable to perform a grinding process in which a protective member is attached to the front surface of the wafer and the back surface of the wafer is ground to form the wafer to a predetermined thickness. In this case, it is desirable that a stress relief process for removing grinding distortion remaining on the back surface of the wafer is performed after the grinding process and before the resist film coating process. Examples of the fluorine-based stable gas used in the dividing step include SF ₆ , CF ₄ , C ₂ F ₆ , C ₂ F ₄ , and CHF ₃ .

  The present invention also provides a device having a back surface coated with a resist film. The wafer processing method is suitable for manufacturing the device, but is not necessarily limited thereto.

  In the wafer processing method according to the present invention, since the wafer can be divided into individual devices by plasma etching without cutting with a cutting blade, the device is not chipped, and the device has a bending strength. It does not decrease and quality does not decrease. Moreover, since all the streets can be simultaneously separated by plasma etching in the dividing step, it is extremely efficient and productivity can be improved. Furthermore, after the division process is performed, the productization process is performed without removing the resist film on the back surface of the device, so that the work of removing the resist film is unnecessary and the resist film is covered. By performing mounting etc. as it is, the bending strength of the device is improved, the quality is improved, the device is not damaged in the production process, and the quality of the electronic device on which the device is mounted is also improved. improves. In addition, anisotropic etching is possible in plasma etching, and the side surface of the device formed by division can be formed almost vertically, so that it can be formed into a shape that can be transferred directly to the production process.

  Further, if a wafer is formed to a predetermined thickness by performing a grinding process before the resist film coating process, the device can be formed to a desired thickness. Furthermore, if the stress relief process is performed between the grinding process and the resist film coating process to remove grinding distortion on the back surface of the wafer, the bending strength is improved and the quality is further improved.

  In the device according to the present invention, since the back surface is coated with a resist film, the resist film serves as a reinforcing material, and even a thinly formed device has a high bending strength. Therefore, it is possible to prevent the device from being damaged in the subsequent processes such as pick-up work, die attach film attaching work, bonding work, mounting work on the wiring board, etc., and the quality of various electronic devices on which the device is mounted. Can be improved.

  A plurality of devices D are formed on the surface W1 of the wafer W shown in FIG. First, as shown in FIG. 1, a protection member P for protecting the device D is attached to the surface W1 of the wafer W. As the protective member P, in addition to a hard plate such as glass, polyethylene terephthalate, and ceramics, an adhesive tape or the like can also be used.

  Next, as shown in FIG. 2, the back surface W2 of the wafer W having the protective member P adhered to the front surface W1 is directed upward, and the back surface W2 is ground to a predetermined thickness (grinding step). . For the grinding step, for example, a grinding apparatus 1 as shown in FIG. 3 can be used. The grinding apparatus 1 includes a chuck table 10 that holds a wafer, a grinding unit 11 that grinds the wafer held on the chuck table 10, and a grinding feed unit 12 that causes the grinding unit 11 to approach or separate from the chuck table 10. It has.

  The grinding means 11 includes a spindle 110 having a vertical axis, a drive source 111 that rotationally drives the spindle 110, a grinding wheel 113 that is fixed at a lower end of the spindle 110 via a wheel mount 112, and a grinding wheel 113. The grinding wheel 114 is fixed to the lower surface, and the grinding wheel 114 is rotated as the spindle 110 is rotated by being driven by the drive source 111.

  The grinding feed means 12 includes a pair of guide rails 121 arranged in a direction perpendicular to the wall 120, a ball screw 122 arranged in parallel to the guide rail 121, and a pulse motor 123 connected to one end of the ball screw 122, , Slidably engaged with the guide rail 121 and an inner nut screwed into the ball screw 122, and a support portion 124. The ball screw 122 is driven by the pulse motor 123 to rotate. The support part 124 is guided by the guide rail 121 and moves up and down, and the grinding means 11 supported by the support part 124 is also moved up and down.

  In the chuck table 10, the protection member P is held, and the back surface W2 of the wafer W is exposed. Then, the chuck table 10 moves in the horizontal direction, so that the wafer W is positioned directly below the grinding means 11. When the wafer W is positioned directly below the grinding means 11, the wafer W is rotated by the rotation of the chuck table 10, and the grinding means 11 is lowered while the grinding wheel 114 is rotated, and comes into contact with the back surface W <b> 2 of the wafer W for grinding. And is ground to a predetermined thickness (grinding step).

  When the grinding process is performed, a damage layer made of grinding distortion or the like is formed on the back surface W2 of the wafer W, causing stress on the wafer W, which causes a reduction in bending strength. Therefore, in order to remove the damaged layer, a stress relief process is performed after the grinding process. For example, as shown in FIG. 4, the stress relief process is performed by attaching a polishing pad 115 in place of the grinding wheel 114 in the grinding apparatus 1 shown in FIG. 3 and polishing the back surface by the same operation as in the case of grinding. Is called. Also, the damaged layer can be removed by dry etching, wet etching, or the like. In FIG. 4, parts other than the polishing wheel 115 are denoted by the same reference numerals as those of the grinding apparatus 1 of FIG. 3.

  After the stress of the wafer W is removed by the stress relief process, as shown in FIG. The resist film R is coated on the portion (resist film coating step). There are various methods for realizing the resist film coating process. Some examples are shown below.

(1) First, as shown in FIG. 6A, a resist film R is coated on the entire back surface W2 using a spin coater or the like. Then, the street S is recognized from the back surface W2 by an infrared camera or the like, and the resist film R is interposed through the photomask 2 having the mask pattern 2a formed in the same shape as the street S as shown in FIG. Is irradiated with light such as ultraviolet rays, and the back side portion of the back surface W2 corresponding to the street S of the front surface W1 is exposed. When the exposed portion is developed, as shown in FIG. 6C, the resist film on the back side corresponding to the street S on the surface W1 is removed, and the street corresponding portion W2S is exposed. Here, in order to prevent the resist film coated on the back side of the device D from being exposed, it is desirable that the width of the mask pattern 2 a be narrower than the width of the street S. Even if a photomask is not used, if the street S on the front surface W1 side is detected by the infrared camera from the back surface W2 side of the wafer W and light is irradiated only on the detected street S portion, FIG. Similarly, the resist film on the back side corresponding to the street S is removed, and the street corresponding portion W2S is exposed.

(2) As shown in FIG. 7A, a resist film R is coated on the entire back surface W2 using a spin coater or the like. Then, the street S is recognized from the back surface W2 with an infrared camera or the like, and as shown in FIG. 7B, using the pressing member 3 formed in the same shape as the street S, as shown in FIG. The pressing member 3 is pressed against the resist film R. Then, as shown in FIG. 7D, the pressed portion, that is, the resist film on the back side corresponding to the street S on the surface W1 is removed, and the street corresponding portion W2S is exposed. Here, in order to prevent the resist film coated on the back side of the device D from being removed, it is desirable that the width of the tip of the pressing member 3 is narrower than the width of the street S.

(3) As shown in FIG. 8A, a resist film R is coated on the entire back surface W2 using a spin coater or the like. Then, the street S is recognized from the back surface W2 by an infrared camera or the like, and as shown in FIG. 8B, the cutting blade 4 having a thickness corresponding to the width of the street S is lowered while rotating at a high speed. As shown in C), the cutting blade 4 is individually brought into contact with the back side portion of the surface W1 corresponding to the street S, and the resist film R is cut by the thickness. When this operation is performed on the back side corresponding to all the streets S, as shown in FIG. 8D, the resist film on the back side corresponding to the streets S on the surface W1 is removed, and the street corresponding portion W2S is exposed. . Here, in order to prevent the resist film coated on the back side of the device D from being removed, the width of the cutting blade 4 is formed to be narrower than the width of the street S. Further, laser light may be used instead of the cutting blade.

  Although not shown, the resist film is coated on the portion other than the back side corresponding to the street S by ejecting the resist material constituting the resist film, avoiding the back side of the street S, like an ink jet. Can do. In this case, the street S on the surface W1 is detected by an infrared camera, and a resist film is ejected to a portion other than the detected street. Further, as in the printing technique, a resist material repelling material may be applied to the back side portion corresponding to the street S of the back surface W2 of the wafer W, and the resist material may be coated thereon.

  After the resist film R is coated on the back surface W2 of the wafer W other than the street corresponding portion W2S and only the street corresponding portion W2S is exposed by various methods as described above, the street corresponding portion W2S is Etching is performed to divide each device D (dividing step). For example, a plasma etching apparatus 5 shown in FIG. 9 can be used in the dividing step.

The plasma etching apparatus 5 includes a gas supply unit 51 and an etching processing unit 52. The gas supply unit 51 stores a fluorine-based stable gas that is a stable gas containing fluorine, such as SF ₆ , CF ₄ , C ₂ F ₆ , C ₂ F ₄ , and CHF ₃ . On the other hand, in the etching processing section 52, the workpiece W after grinding is accommodated, and the fluorine-based stable gas supplied from the gas supply section 51 is turned into plasma to etch the wafer W.

  The etching processing section 52 has a configuration in which an etching gas supply means 54 is accommodated from the upper side of the chamber 53 where plasma etching is performed, and a chuck table 55 that holds a plate-like object to be etched is accommodated from the lower side. Yes.

  The etching gas supply means 54 has a function of supplying an etching gas to the exposed surface of the wafer W held on the chuck table 55, and the shaft portion 54 a is inserted into the chamber 53 via the bearing 56 so as to be movable up and down. In addition, a gas flow hole 57 that communicates with the gas supply part 51 and communicates with the ejection part 57a formed of a porous member is formed inside. The etching gas supply means 54 is configured to move up and down as the ball screw 59 is rotated by being driven by a motor 58 and the elevating unit 60 having a nut screwed to the ball screw 59 is moved up and down.

  On the other hand, the chuck table 55 has a shaft portion 55a rotatably inserted through a bearing 61, and a suction passage 63 communicating with a suction source 62 and a cooling passage 65 communicating with a cooling portion 64 are formed therein. The suction path 63 communicates with the suction part 63a on the upper surface.

  An opening 66 serving as a carry-in / out port for a plate-like object to be etched is formed on the side of the chamber 53, and a shutter 67 that opens and closes the opening 66 by raising and lowering is disposed outside the opening 66. The shutter 67 is moved up and down by a piston 69 that is driven by a cylinder 68 to move up and down.

  An exhaust port 71 communicating with the gas discharge unit 70 is formed in the lower portion of the chamber 53, and used gas can be discharged from the exhaust port 71. Further, a high frequency power source 72 is connected to the etching gas supply means 54 and the chuck table 55, and a high frequency voltage can be supplied to turn the etching gas into plasma.

  Next, an operation when the street corresponding portion W2S is etched using the plasma etching apparatus 5 shown in FIG. 9 will be described. As shown in FIG. 5, the wafer W on which the resist film R is formed on the back surface W2 other than the street corresponding portion W2S has the opening portion 66 in a state where the shutter 67 is lowered and the opening portion 66 is opened. 66 enters the inside of the chamber 53 and is held by the suction portion 63a in a state where the back surface W2 coated with the resist film R is exposed upward. Then, the shutter 67 is returned to the original position, the opening 63 is closed, and the inside is evacuated under reduced pressure.

  Next, the etching gas supply means 54 is lowered, and in this state, a fluorine-based stable gas is supplied as an etching gas from the gas supply section 51 to the gas flow hole 57, and the etching gas is supplied from the ejection section 57 a on the lower surface of the etching gas supply means 54 , And a high frequency voltage is applied between the etching gas supply means 54 and the chuck table 55 from the high frequency power source 72 to turn the etching gas into plasma. Then, due to the plasma etching effect, only the portion of the back surface of the wafer W that is not covered with the resist film R, that is, the street corresponding portion W2S is etched. Then, when etching is performed by the thickness from the back surface W2 to the front surface W1 of the wafer W, as shown in FIG. 10, all the streets S are vertically and horizontally separated and divided into individual devices D. The

  Thus, since all streets can be separated by plasma etching, cutting with a cutting blade becomes unnecessary. Therefore, no chipping occurs in the device, the bending strength of the device does not decrease, and the quality does not decrease. Moreover, since all the streets can be simultaneously separated by plasma etching in the dividing step, it is extremely efficient and productivity can be improved.

  The wafer W divided by the plasma etching in this manner is carried out of the chamber 53 after the opening 66 is opened by the lowering of the shutter 67.

  As shown in FIG. 11, the resist film R remains on the back surface of each device D. Then, the commercialization process is performed in a state where the resist film R coated on the back surface of the device D is left without being removed. For example, as a product manufacturing process, a pick-up operation for separating and picking up individual devices D from a protective member P, a die attach film attaching operation, a bonding operation for bonding individual devices D to a lead frame, etc., mounting on a wiring board There is mounting work to do.

  The resist film R serves as a reinforcing material for the thinned device D. Therefore, when the individual device D is picked up, a die attach film is attached to the back side, the device D is bonded, or mounted on the wiring board, the device D may be reinforced and damaged. Disappear. In addition, the bending strength of the device D is improved, the quality is improved, and the quality of the electronic device on which the device D is mounted is also improved.

  Furthermore, after the dividing process is performed, the productizing process is performed in a state where the resist film R is left without being removed, so that the work of removing the resist film R is not necessary. In addition, anisotropic etching is possible in plasma etching, and the side surface of the device D formed by division can be formed almost vertically, so that it can be formed into a shape that can be transferred directly to the production process.

It is a perspective view which shows an example of a wafer and a protection member. It is a perspective view which shows the wafer by which the protection member was stuck on the surface. It is a perspective view which shows an example of a grinding device. It is explanatory drawing which shows an example of a stress relief process. It is a perspective view which shows the wafer after completion | finish of a resist film coating process. It is schematic sectional drawing which shows the 1st example of a resist film coating process, (A) shows the wafer by which the resist film was coat | covered on the back surface whole surface, (B) exposes a resist film and a street corresponding | compatible part is shown. FIG. 2C shows a state where the street corresponding portion is exposed. It is schematic sectional drawing which shows the 2nd example of a resist film coating process, (A) shows the wafer by which the resist film was coat | covered on the back surface whole surface, (B) shows the wafer and a press member, (C ) Shows a state in which the pressing member is pressed against the resist film to expose the street corresponding portion, and (D) shows a state in which the street corresponding portion is exposed. It is schematic sectional drawing which shows the 3rd example of a resist film coating process, (A) shows the wafer by which the resist film was coat | covered on the whole back surface, (B) shows the wafer and the cutting blade, (C ) Shows how the street corresponding part is exposed using the cutting blade, and (D) shows a state where the street corresponding part is exposed. It is sectional drawing which shows an example of a plasma etching apparatus. It is sectional drawing which shows the wafer after completion | finish of a division | segmentation process. It is a perspective view which shows the device after a division | segmentation.

Explanation of symbols

W: Wafer W1: Front surface D: Device S: Street W2: Back surface W2S: Street corresponding part P: Hard plate R: Resist film 1: Grinding device 10: Chuck table 11: Grinding means 110: Spindle 111: Driving source 112: Wheel Mount 113: Grinding wheel 114: Grinding wheel 115: Polishing pad 12: Grinding feed means 120: Wall part 121: Guide rail 122: Ball screw 123: Pulse motor 124: Support part 2: Photomask 2a: Mask pattern 3: Pressing member 4 : Cutting blade 50: Plasma etching apparatus 51: Gas supply unit 52: Etching processing unit 53... Chamber 54: Etching gas supply means 55: Chuck table 56: Bearing 57: Gas flow hole 57 a: Ejection unit 58: Motor 59: Ball screw 60: Lifting part 61: Bearing 62: Suction source 63: Suction path 64: Cooling part 65: Cooling path 66: Opening part 67: Shutter 68: Cylinder 69: Piston 70: Gas discharge part 71: Exhaust port 72: High frequency power supply

Claims (5)

A wafer processing method for dividing a wafer having a plurality of devices formed on a surface and divided into streets into individual devices,
A resist film coating step of coating a resist film on a portion other than the back side corresponding to the street formed on the front surface of the wafer among the back surface of the wafer,
A dividing step in which a fluorine-based stable gas is supplied to a portion of the back surface corresponding to a street not covered with the resist film in a plasma state, and is etched from the back surface to the surface to be divided into individual devices; ,
A wafer processing method comprising: a productization step for producing a product in a state where the resist film on the back surface of the device is left without being removed. 2. The grinding process for attaching a protective member to the front surface of the wafer and grinding the back surface of the wafer to form the wafer to a predetermined thickness is performed before the resist film coating process. Wafer processing method. The wafer processing method according to claim 2, wherein a stress relief process for removing grinding distortion remaining on the back surface of the wafer is performed after the grinding process and before the resist film coating process. 4. The wafer processing method according to claim 1, wherein the fluorine-based stable gas is any one of SF ₆ , CF ₄ , C ₂ F ₆ , C ₂ F ₄ , and CHF ₃ .   A device with a resist film on the back.

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