JP2006092813A - Surface treating device and surface treatment method - Google Patents

Surface treating device and surface treatment method Download PDF

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JP2006092813A
JP2006092813A JP2004274268A JP2004274268A JP2006092813A JP 2006092813 A JP2006092813 A JP 2006092813A JP 2004274268 A JP2004274268 A JP 2004274268A JP 2004274268 A JP2004274268 A JP 2004274268A JP 2006092813 A JP2006092813 A JP 2006092813A
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processing
treatment
workpiece
surface treatment
gas
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JP4603326B2 (en
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Kenzo Sano
佐野  健三
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Sekisui Chemical Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a surface treating device and a surface treatment method, capable of applying uniform surface treatment in a short time, while preventing a treatment head from touching an object to be treated, even if the object to be treated is warped and curved. <P>SOLUTION: The plasma treatment device M, performing surface treatment, by making gas discharged from a nozzle head 1 as a treatment head contact a surface of a work W as an object to be treated, has rollers 29, 29 as flattening means which turn the work W into a flattened state, and turns the treatment gas supplied from a treatment gas source 2 into a plasma, by making the treatment gas pass between electrodes 23, 24 on which a pulse-formed voltage is impressed by a power source 4, and the rollers are made to contact the flattened surface of the work. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、プラズマ処理装置や熱CVD装置等により被処理物の表面を処理する装置と方法に係り、特に、プリント配線基板等の多層基板のように反りの発生しやすい被処理物を均一に処理できる表面処理装置と、表面処理方法に関する。   The present invention relates to an apparatus and a method for processing the surface of an object to be processed by a plasma processing apparatus, a thermal CVD apparatus, or the like, and in particular, an object to be processed that is likely to be warped like a multilayer substrate such as a printed wiring board is made uniform. The present invention relates to a surface treatment apparatus capable of treatment and a surface treatment method.

従来、この種の表面処理装置としては、所定のガスを被処理材の表面に向けて送出するためのガス流路と、ガス流路内でガスに大気圧又はその近傍の圧力下で気体放電を発生させ、それによりガスの励起活性種を生成するための一対の電源電極及び接地電極とからなり、励起活性種を含むガスを被処理材表面に噴出させるようにした表面処理装置であって、ガス流路が、2枚の誘電体からなる板を所定の間隔をもって対向させ、かつその間隙に供給されるガスを誘電体板の一方の側辺から被処理材表面に噴出させるように形成され、各電極が、誘電体板を挟んでその外側に対向配置されることを特徴としている(例えば、特許文献1参照)。
特開平9−92493号公報(段落[0009]参照)
Conventionally, this type of surface treatment apparatus includes a gas flow path for sending a predetermined gas toward the surface of a material to be treated, and a gas discharge under atmospheric pressure or a pressure in the vicinity of the gas in the gas flow path. Is a surface treatment apparatus that includes a pair of power supply electrodes and a ground electrode for generating excited active species of gas, thereby ejecting a gas containing excited active species onto the surface of the material to be processed. The gas flow path is formed so that two dielectric plates face each other at a predetermined interval, and the gas supplied to the gap is ejected from one side of the dielectric plate to the surface of the workpiece. Each electrode is disposed opposite to the outer side of the dielectric plate (see, for example, Patent Document 1).
JP-A-9-92493 (see paragraph [0009])

ところで、前記構造の表面処理装置で、例えばプリント配線基板の表面を洗浄処理するとき、多層のプリント配線基板の場合、積層一体化する際に加熱するため反りが発生することがあり、処理ヘッドと配線基板との距離が変わるため均一に処理できない。特に、プリント配線基板のサイズが300×500mm程度の大きいサイズのときには、平板に対する反りによる突出量が大きくなってしまう。一般的にサイズの大きい被処理物を処理するとき、被処理物を移動して処理を行うが、反りによる突出量が大きい被処理物を処理する際に、被処理物と処理ヘッドとの間のワーキングディスタンスを小さく設定すると、被処理物が処理ヘッドと接触する虞があった。また、被処理物が反っているためガス流が乱されてしまい、処理が均一に行われない虞があった。特に、被処理物毎に反り量がばらついている場合、均一な処理は調整が難しく困難である。接触を防止する目的で前記のワーキングディスタンスを大きく設定すると、処理反応が緩慢となり処理時間が余分にかかる問題があった。   By the way, in the surface treatment apparatus having the above structure, for example, when cleaning the surface of a printed wiring board, in the case of a multilayer printed wiring board, warping may occur due to heating when stacking and integrating, Since the distance to the wiring board changes, uniform processing cannot be performed. In particular, when the size of the printed wiring board is a large size of about 300 × 500 mm, the protrusion amount due to warpage with respect to the flat plate becomes large. In general, when processing an object to be processed having a large size, the object to be processed is moved and processed. However, when processing an object to be processed that has a large protrusion due to warpage, If the working distance is set to be small, there is a possibility that the object to be processed comes into contact with the processing head. Further, since the object to be processed is warped, the gas flow is disturbed, and there is a possibility that the processing is not performed uniformly. In particular, when the amount of warp varies for each workpiece, uniform processing is difficult and difficult to adjust. If the working distance is set to be large for the purpose of preventing contact, the processing reaction becomes slow and there is a problem that extra processing time is required.

本発明は、このような問題に鑑みてなされたものであって、その目的とするところは、被処理物が反って湾曲している場合で、ワーキングディスタンスを小さく設定しても、被処理物と処理ヘッドとが接触することがなく処理することができ、表面処理が均一に、しかも短時間で行える表面処理装置と、表面処理方法を提供することにある。   The present invention has been made in view of such a problem, and the object thereof is a case where the object to be processed is curved in a curved manner, and the object to be processed is set even if the working distance is set small. It is an object of the present invention to provide a surface processing apparatus and a surface processing method that can perform processing without contact with the processing head, perform surface processing uniformly and in a short time.

前記目的を達成すべく、本発明に係る表面処理装置は、処理ヘッドから吹き出した処理ガスを被処理物の表面に接触させて表面処理する装置であって、この表面処理装置は被処理物を平坦な状態にする平坦化手段を備えることを特徴としている。表面処理としては、プラズマ処理による表面改質処理、エッチング処理、クリーニング処理等の他に、熱CVD処理、オゾンアッシング処理、HFベーパエッチング処理等、種々の表面処理を行うことができる。   In order to achieve the above-mentioned object, a surface treatment apparatus according to the present invention is an apparatus for performing a surface treatment by bringing a treatment gas blown from a treatment head into contact with the surface of the object to be treated. A flattening means for flattening is provided. As the surface treatment, various surface treatments such as thermal CVD treatment, ozone ashing treatment, and HF vapor etching treatment can be performed in addition to surface modification treatment by plasma treatment, etching treatment, cleaning treatment, and the like.

前記のごとく構成された本発明の表面処理装置は、処理ヘッドから吹き出した処理ガスを平坦な状態にされた被処理物の表面に吹き出させるため、処理ガスが被処理物の表面に均一に接触し表面処理を均一に行うことができ、表面処理の処理品質を高めることができ
る。また、処理ヘッドを被処理物に近づけてワーキングディスタンスを小さく設定できるため、処理反応を速めて処理時間を短縮できる。ここで、被処理物を平坦な状態にするには、被処理物を平坦な基準面に押圧状態にするなどすればよい。
The surface treatment apparatus of the present invention configured as described above blows out the processing gas blown from the processing head onto the surface of the workpiece to be flattened, so that the processing gas uniformly contacts the surface of the workpiece. Thus, the surface treatment can be performed uniformly, and the quality of the surface treatment can be improved. Further, since the working distance can be set small by bringing the processing head closer to the object to be processed, the processing reaction can be accelerated and the processing time can be shortened. Here, in order to make the object to be processed flat, the object to be processed may be pressed against a flat reference surface.

本発明に係る表面処理装置の他の態様としては、この表面処理装置は前記処理ヘッドと被処理物との少なくとも一方を移動させて表面処理することを特徴としている。この構成によれば、表面面積の大きい被処理物が平坦な状態に維持されているため、処理ヘッドと被処理物との少なくとも一方を移動させても、被処理物と処理ヘッドとが接触しないし、ガス流が乱れないので、ワーキングディスタンスを小さくすることができ、表面処理の均一化と迅速化を達成できる。   As another aspect of the surface treatment apparatus according to the present invention, the surface treatment apparatus is characterized in that the surface treatment is performed by moving at least one of the treatment head and the workpiece. According to this configuration, since the workpiece having a large surface area is maintained in a flat state, the workpiece and the processing head do not come into contact with each other even when at least one of the processing head and the workpiece is moved. In addition, since the gas flow is not disturbed, the working distance can be reduced, and the surface treatment can be made uniform and quick.

また、本発明に係る表面処理装置の好ましい具体的な態様としては、前記平坦化手段は、処理ヘッド側に回転可能に支持され、被処理物の表面を押圧するローラであることを特徴としている。ローラは球状、円筒状あるいは太鼓状等が好ましく、回転軸と摺動方向とが直交するように設置され、表面に軟質ゴム等の接触層が形成されることが好ましい。この構成によれば、被処理物の表面をローラで押え付けて平坦な状態で処理するため、表面処理の均一化と、迅速な表面処理を可能とする。被処理物と処理ヘッドとの少なくとも一方を移動させる際でも、均一で迅速な表面処理を行える。   Further, as a preferred specific aspect of the surface treatment apparatus according to the present invention, the flattening means is a roller that is rotatably supported on the treatment head side and presses the surface of the object to be treated. . The roller is preferably spherical, cylindrical, or drum-shaped, and is preferably installed such that the rotation axis and the sliding direction are orthogonal to each other, and a contact layer such as soft rubber is formed on the surface. According to this configuration, since the surface of the object to be processed is pressed with the roller and processed in a flat state, the surface treatment can be made uniform and the surface treatment can be performed quickly. Even when at least one of the workpiece and the processing head is moved, uniform and quick surface treatment can be performed.

さらに、本発明に係る表面処理装置の好ましい具体的な他の態様としては、前記平坦化手段は、支持台を介して被処理物を平坦な状態に保持することを特徴としている。特に、被処理物が四辺形の基板である場合、四辺形が嵌没するような容器状の支持台や、四辺形の2辺が係合する段差部を有する支持台を使用し、基板の上面を爪やフック、ばね等で押圧するものが好ましい。この構成によれば、被処理物の上面を押え付けて平坦にしてから、その状態のまま表面処理を行うため、均一な表面処理が可能となる。   Furthermore, as another preferable specific aspect of the surface treatment apparatus according to the present invention, the flattening means holds the object to be processed in a flat state via a support base. In particular, when the object to be processed is a quadrilateral substrate, a container-like support base into which the quadrilateral is fitted or a support base having a stepped portion with which two sides of the quadrilateral are engaged is used. What presses an upper surface with a nail | claw, a hook, a spring, etc. is preferable. According to this configuration, since the upper surface of the object to be processed is pressed and flattened and then the surface treatment is performed in that state, a uniform surface treatment can be performed.

本発明に係る表面処理方法は、処理ヘッドから処理ガスを吹き出し、被処理物の表面に接触させて表面処理する方法であって、前記被処理物を平坦な状態にしたあと、前記処理ガスを接触させることを特徴としている。このように構成された表面処理方法は、被処理物を平坦な状態に修正して処理ガスを接触させて表面処理するため、均一な表面処理が可能となる。また、被処理物が平坦な状態に修正されるため、ワーキングディスタンスを小さくすることができ、短い処理時間で少ない処理ガスにより効率良く表面処理を行うことができる。   A surface treatment method according to the present invention is a method of performing a surface treatment by blowing a treatment gas from a treatment head and bringing it into contact with the surface of the object to be treated. It is characterized by contact. Since the surface treatment method configured in this way corrects the object to be processed and brings the treatment gas into contact with the surface treatment, uniform surface treatment is possible. In addition, since the object to be processed is corrected to a flat state, the working distance can be reduced, and the surface treatment can be efficiently performed with a small amount of processing gas in a short processing time.

本発明の表面処理装置および表面処理方法によれば、反り等により被処理物が湾曲している場合でも表面処理を均一に行うことができ、処理品質を高めることができる。また、被処理物と処理ヘッドとの間隔であるワーキングディスタンスを小さくすることができ、処理時間を短縮することができる。処理ヘッドと被処理物とを相対的に移動して処理する場合、ワーキングディスタンスを小さく設定しても両者が接触することを防止でき、処理の均一化を達成でき、処理時間を短縮することができる。   According to the surface treatment apparatus and the surface treatment method of the present invention, even when the workpiece is curved due to warp or the like, the surface treatment can be performed uniformly, and the treatment quality can be improved. In addition, the working distance that is the distance between the object to be processed and the processing head can be reduced, and the processing time can be shortened. When processing by moving the processing head and the object to be processed relative to each other, even if the working distance is set to a small value, they can be prevented from coming into contact, the processing can be made uniform, and the processing time can be shortened. it can.

以下、本発明に係る表面処理装置の一実施形態を図面に基づき詳細に説明する。図1は、本実施形態に係る表面処理装置としてプラズマ処理装置の要部構成を示す断面図、図2は、図1のプラズマ処理装置の要部底面図である。   Hereinafter, an embodiment of a surface treatment apparatus according to the present invention will be described in detail with reference to the drawings. FIG. 1 is a cross-sectional view showing a configuration of a main part of a plasma processing apparatus as a surface processing apparatus according to the present embodiment, and FIG. 2 is a bottom view of the main part of the plasma processing apparatus of FIG.

図1,2において、本実施形態に係る表面処理装置はプラズマ処理装置Mであり、被処理物であるワークWに放電プラズマを吹き付けるノズルヘッド1を備え、ノズルヘッドは処理ガス源2から処理ガスが導入される処理ガス導入部10と、放電処理部20とを備え
ている。また、プラズマ処理装置MはワークWを移動させる搬送手段3と、放電処理部20の対向する電極に電圧を印加する電源4とを備えており、放電処理部20の上部に処理ガス導入部10が位置し、放電処理部20の下方に搬送手段3の搬送台3aが位置し、放電処理部20の下面と搬送手段3との間を被処理物であるワークWが搬送される構成となっている。そして、電源4は、後述する放電処理部20の内部の電極にパルス状の電圧を印加するものである。以下、各構成部分について、詳細に説明する。
1 and 2, the surface treatment apparatus according to the present embodiment is a plasma treatment apparatus M, which includes a nozzle head 1 that blows discharge plasma onto a workpiece W that is an object to be treated. Is provided with a processing gas introduction section 10 and a discharge processing section 20. In addition, the plasma processing apparatus M includes a transport unit 3 that moves the workpiece W, and a power source 4 that applies a voltage to the opposing electrode of the discharge processing unit 20. A processing gas introduction unit 10 is provided above the discharge processing unit 20. Is located, and the carrier 3a of the conveying means 3 is positioned below the discharge processing unit 20, and the workpiece W, which is the object to be processed, is conveyed between the lower surface of the discharge processing unit 20 and the conveying means 3. ing. The power source 4 applies a pulsed voltage to the electrodes inside the discharge processing unit 20 described later. Hereinafter, each component will be described in detail.

処理ガス導入部10はプラズマ処理を行う際に放電処理部20の放電空間に処理ガスを送り込む部分であり、容器状をしており、内部に処理ガス源2から配管2aを介して処理ガスが導入される2本のパイプ11を備えている。この2本のパイプは紙面と直交する方向に延在しており、ワークWの搬送方向WAと直交する方向のワークWの全幅より大きい幅を有している。2本のパイプ11は上下の板状の支持部材12,13により所定の間隔で支持されてユニット化され、支持部材の上下にはチャンバー14,15が形成されている。   The processing gas introduction unit 10 is a part that sends processing gas into the discharge space of the discharge processing unit 20 when performing plasma processing. The processing gas introduction unit 10 has a container shape, and the processing gas is supplied from the processing gas source 2 to the inside through the pipe 2a. Two pipes 11 to be introduced are provided. These two pipes extend in a direction orthogonal to the paper surface, and have a width larger than the entire width of the workpiece W in a direction orthogonal to the conveyance direction WA of the workpiece W. The two pipes 11 are supported at predetermined intervals by upper and lower plate-like support members 12 and 13 to form a unit, and chambers 14 and 15 are formed above and below the support members.

上方の支持部材12には、短い間隔で多数の貫通孔16が上下方向に貫通しており、この貫通孔はパイプ11を貫通しており、パイプの内部と上方のチャンバー14とが連通している。処理ガス導入部10の底面には、外部に開口するスリット17が形成され、このスリットは上方に向けて広がるように形成され、下方のチャンバー15と連通している。したがって、処理ガス源2から導入された処理ガスは2本のパイプ11内に入り、貫通孔16を通して上方のチャンバー14に入り、上下のチャンバーをつなぐ隙間18を通して下方のチャンバー15に入り、下方のスリット17から外部に吹き出されるように構成されている。この構成により、処理ガスの吹き出しはスリット17の長手方向の全ての位置で均一となるように設定されている。スリット17もワークWの全幅より大きい幅を有している。   The upper support member 12 has a large number of through-holes 16 penetrating in the vertical direction at short intervals. The through-holes penetrate the pipe 11 so that the inside of the pipe communicates with the upper chamber 14. Yes. A slit 17 that opens to the outside is formed on the bottom surface of the processing gas introduction part 10, and this slit is formed so as to expand upward and communicates with the lower chamber 15. Accordingly, the processing gas introduced from the processing gas source 2 enters the two pipes 11, enters the upper chamber 14 through the through hole 16, enters the lower chamber 15 through the gap 18 connecting the upper and lower chambers, and moves downward. It is configured to be blown out from the slit 17. With this configuration, the blowing of the processing gas is set to be uniform at all positions in the longitudinal direction of the slit 17. The slit 17 also has a width larger than the entire width of the workpiece W.

放電処理部20は、ケース状の本体部21の内部にセラミックスやポリテトラフルオロエチレン等の絶縁性樹脂等の絶縁材からなるホルダ22を介して電極23,24が対向して内蔵されている。電極23,24はワークWの搬送方向WAに直角に交差する方向に沿って、所定の幅を有する中心間隙25を介して平行に配列されている。中心間隙25の幅は、1〜3mm程度が好ましい。電極23,24に電圧が印加されているとき、中心間隙25が放電空間となる。   The discharge processing unit 20 has electrodes 23 and 24 built in a case-like main body 21 with a holder 22 made of an insulating material such as ceramic or polytetrafluoroethylene interposed therebetween. The electrodes 23 and 24 are arranged in parallel through a central gap 25 having a predetermined width along a direction perpendicular to the conveyance direction WA of the workpiece W. The width of the center gap 25 is preferably about 1 to 3 mm. When a voltage is applied to the electrodes 23 and 24, the central gap 25 becomes a discharge space.

電極23,24は、銅、アルミニウム等の金属単体、ステンレス、黄銅等の合金、金属間化合物等から構成される。各電極の少なくとも電極対向面は、アーク放電を防止するためにアルミナ等の固体誘電体26のコーティング層で被覆されており、コーティング層の厚さは0.01〜4mm程度が好ましい。固体誘電体として、アルミナの他に、セラミックスや樹脂等の板状物、シート状物、フィルム状のものを用いて電極の外周面を被覆してもよい。電極23,24の長さは、被処理物の処理幅に合わせて、それより長く設定される。電極23,24は、少なくとも中心間隙25のコーナー部分がアーク放電を防止するために、図1に示されるようにアール加工がされている。   The electrodes 23 and 24 are made of a single metal such as copper or aluminum, an alloy such as stainless steel or brass, an intermetallic compound, or the like. At least the electrode facing surface of each electrode is covered with a coating layer of solid dielectric 26 such as alumina in order to prevent arc discharge, and the thickness of the coating layer is preferably about 0.01 to 4 mm. As the solid dielectric, in addition to alumina, a plate-like material such as ceramics or resin, a sheet-like material, or a film-like material may be used to cover the outer peripheral surface of the electrode. The lengths of the electrodes 23 and 24 are set longer than the processing width of the workpiece. The electrodes 23 and 24 are rounded as shown in FIG. 1 in order to prevent arc discharge at least at the corner portion of the center gap 25.

ケース状の本体部21の上面には、横方向にスリット27が形成され、このスリットは処理ガス導入部10の下面のスリット17と一致している。したがって、処理ガス導入部10のスリット17から出た処理ガスは、本体部21のスリット27から本体部21の内部に進入し、電極23,24の電極面間の中心間隙25を通して下方に移動し、本体部21底面の仕切り板28の吹き出し口28aから吹き出される構成となっている。   A slit 27 is formed in the lateral direction on the upper surface of the case-shaped main body portion 21, and this slit coincides with the slit 17 on the lower surface of the processing gas introduction portion 10. Accordingly, the processing gas that has exited from the slit 17 of the processing gas introduction unit 10 enters the inside of the main body 21 through the slit 27 of the main body 21 and moves downward through the central gap 25 between the electrode surfaces of the electrodes 23 and 24. The air outlet 28a of the partition plate 28 on the bottom surface of the main body 21 is blown out.

ノズルヘッド側の仕切り板28には、ワークWを押圧するローラ29,29…が回転可能に支持されている。ローラ29,29は所定長さのものが、所定の間隔でもって配置さ
れており、下方の突出部分がワークWと接触しワークの移動に伴って回転する構成である。このローラ29,29…はワークWを平坦な状態にする平坦化手段を構成する。ローラはゴム等の軟質材で形成すると、ワークWに擦り傷等が付きにくく好ましい。また、ローラはベアリング等で回転しやすく支持すると好適である。さらに、ローラはワークを押え付けるばね等の押圧手段を備えるように構成してもよい。処理領域がワークの中央部で、処理領域にローラが触れないことが好ましい場合は、処理領域外の端部等をローラで押えるように構成すると好適である。
Rollers 29, 29... That press the workpiece W are rotatably supported on the partition plate 28 on the nozzle head side. The rollers 29 and 29 having a predetermined length are arranged at a predetermined interval, and the lower protruding portion is in contact with the workpiece W and rotates as the workpiece moves. These rollers 29, 29... Constitute a flattening means for making the workpiece W flat. If the roller is formed of a soft material such as rubber, it is preferable that the work W is not easily scratched. The roller is preferably supported by a bearing or the like so as to be easily rotated. Further, the roller may be configured to include pressing means such as a spring for pressing the work. When it is preferable that the processing area is the central part of the workpiece and the roller does not touch the processing area, it is preferable that the end portion or the like outside the processing area is pressed by the roller.

本体部21の側面には電極23,24を水平方向に進退させる押しボルト30と引きボルト31が装着され、押しボルト30を右回転させることでホルダ22を押して電極を進出させ中心間隙25を狭めることができ、押しボルト30を緩めて引きボルト31を右回転させることにより電極を後退させ中心間隙25を広げることができると共に、中心間隙25を一直線状にすることができる。中心間隙25の幅は一定であることが好ましく、一定にすることで電極23,24間の放電状態を安定させることができ、均一なプラズマ処理が可能となる。押しボルト30と引きボルト31は、前記のように中心間隙25を調整する機能と共に、各電極が電圧印加時にクーロン力を受けたり熱膨張したりして撓むのを防止する機能を有する。   A push bolt 30 and a pull bolt 31 for moving the electrodes 23 and 24 in the horizontal direction are mounted on the side surface of the main body 21. By rotating the push bolt 30 clockwise, the holder 22 is pushed to advance the electrode and narrow the center gap 25. In addition, by loosening the push bolt 30 and rotating the pull bolt 31 clockwise, the electrode can be retracted and the center gap 25 can be widened, and the center gap 25 can be made straight. It is preferable that the width of the center gap 25 is constant. By making the width constant, the discharge state between the electrodes 23 and 24 can be stabilized, and uniform plasma processing can be performed. The push bolt 30 and the pull bolt 31 have a function of adjusting the center gap 25 as described above and a function of preventing each electrode from being bent due to Coulomb force or thermal expansion when a voltage is applied.

搬送手段3は、例えば搬送台3aを直動機構等で移動させる構成であり、被処理物であるプリント配線基板等のワークWを搬送して放電処理部20の下方に搬送するものであり、一定の搬送速度でワークWを搬送することによりワークWのプラズマ処理を均一に行うことができる。搬送手段3はワークWを搬送する構成であるが、ワークWを固定しておき放電プラズマを吹き付けるノズルヘッド1を搬送するように構成することもできる。搬送手段はベルトコンベア、ローラコンベアや、上下のローラでワークを挟んで搬送するもの等の他の搬送手段で構成してもよい。   The conveyance means 3 is a structure which moves the conveyance stand 3a with a linear motion mechanism etc., for example, conveys the workpiece | work W, such as a printed wiring board which is a to-be-processed object, and conveys it below the discharge process part 20, By conveying the workpiece W at a constant conveyance speed, the plasma processing of the workpiece W can be performed uniformly. Although the transport means 3 is configured to transport the workpiece W, it may be configured to transport the nozzle head 1 that fixes the workpiece W and blows discharge plasma. The conveying means may be constituted by other conveying means such as a belt conveyer, a roller conveyer, or a conveyer that conveys a work with upper and lower rollers.

電源4は放電処理部20内の電極23,24に極性の異なるパルス状の電圧を印加するものであり、一方の電極23にパルス状電圧を印加し、対向する他方の電極24を接地4aして電極間の中心間隙25に放電を立たせるものである。パルス状の電圧は立上り時間及び立下り時間が10μs以下で、電界強度が10〜1000kV/cm、周波数は0.5kHz以上であることが好ましい。   The power supply 4 applies pulsed voltages having different polarities to the electrodes 23 and 24 in the discharge processing unit 20, applies a pulsed voltage to one electrode 23, and grounds the other electrode 24 opposite to the ground 4a. Thus, a discharge is generated in the central gap 25 between the electrodes. The pulse voltage preferably has a rise time and a fall time of 10 μs or less, an electric field strength of 10 to 1000 kV / cm, and a frequency of 0.5 kHz or more.

電界強度が10kV/cm未満であると処理に時間がかかりすぎ、1000kV/cmを超えるとアーク放電が発生しやすくなる。0.5kHz未満であると、プラズマ密度が低く、処理に時間がかかりすぎる。上限は特に限定されないが、常用されている13.56MHz、試験的に使用されている500MHzといった高周波帯でも可能である。負荷との整合のとり易さや取り扱い性を考慮すると、500kHz以下が好ましい。このようなパルス状電圧を電源4から電極23,24に印加することにより、処理速度を大きく向上させることができる。   When the electric field strength is less than 10 kV / cm, it takes too much time for processing, and when it exceeds 1000 kV / cm, arc discharge tends to occur. If it is less than 0.5 kHz, the plasma density is low and the processing takes too much time. The upper limit is not particularly limited, but the upper limit is also possible in a high frequency band such as 13.56 MHz that is commonly used and 500 MHz that is used experimentally. In consideration of ease of matching with the load and handleability, 500 kHz or less is preferable. By applying such a pulse voltage to the electrodes 23 and 24 from the power source 4, the processing speed can be greatly improved.

パルス状電圧における1つのパルスの継続時間は、200μs以下であることが好ましい。200μsを超えるとアーク放電に移行しやすくなる。ここで、1つのパルス継続時間とは、ON、OFFの繰り返しからなるパルス状電圧における、1つのパルスの連続するON時間をいう。パルス状電圧におけるパルスのオフ時間は、0.5〜1000μsが好ましく、0.5〜500μsがより好ましい。1000μsを超えるとアーク放電に移行しやすくなる。   The duration of one pulse in the pulse voltage is preferably 200 μs or less. If it exceeds 200 μs, it tends to shift to arc discharge. Here, one pulse duration means a continuous ON time of one pulse in a pulsed voltage composed of repetition of ON and OFF. The pulse off time in the pulse voltage is preferably 0.5 to 1000 μs, and more preferably 0.5 to 500 μs. When it exceeds 1000 μs, it becomes easy to shift to arc discharge.

なお、電極23,24に印加される電圧はパルス状電圧に限らず、連続波の電圧でもよい。パルス状の電圧波形は、インパルス型の他に、方形波型、変調型、あるいは前記の波形を組み合わせた波形等の適宜の波形を用いることができる。また、電圧波形は、電圧印
加が正負の繰り返しであるものの他に、正又は負のいずれかの極性側に電圧を印加する、いわゆる片波状の波形を用いてもよい。また、バイポーラ型の波形を用いてもよい。もちろん、一般的なサイン波である交流波形を用いてもよい。
The voltage applied to the electrodes 23 and 24 is not limited to the pulse voltage, and may be a continuous wave voltage. As the pulse voltage waveform, an appropriate waveform such as a square wave type, a modulation type, or a combination of the above waveforms can be used in addition to the impulse type. Further, the voltage waveform may be a so-called one-wave waveform in which a voltage is applied to either the positive or negative polarity side, in addition to the voltage application repeating positive and negative. A bipolar waveform may also be used. Of course, an AC waveform that is a general sine wave may be used.

このプラズマ処理装置Mは、大気圧近傍の圧力下で処理が行われることが好ましい。大気圧近傍の圧力とは、100〜800Torr(約1.333×104〜10.664×
104Pa)の圧力であり、実際には圧力調整が容易で、かつ放電プラズマ処理に使用さ
れる装置が簡便となる、700〜780Torr(約9.331×104〜10.397
×104Pa)の圧力が好ましい。また、プラズマ処理される被処理材の表面に、放電プ
ラズマを接触させて活性化する際には、被処理材は加熱されていても、冷却されていてもよく、室温に保たれていてもよい。
In the plasma processing apparatus M, it is preferable that the processing is performed under a pressure near atmospheric pressure. The pressure near atmospheric pressure is 100 to 800 Torr (about 1.333 × 10 4 to 10.664 ×
The pressure is 10 4 Pa). In practice, it is easy to adjust the pressure, and the apparatus used for the discharge plasma treatment is simple. 700 to 780 Torr (about 9.331 × 10 4 to 10.9797)
A pressure of × 10 4 Pa) is preferred. In addition, when the discharge plasma is brought into contact with the surface of the material to be treated by plasma treatment and activated, the material to be treated may be heated, cooled, or kept at room temperature. Good.

前記のように構成されたプラズマ処理装置Mの動作について説明する。ノズルヘッド1の処理ガス導入部10で処理ガス源2から供給された処理ガスは、パイプ11から貫通孔16を通して上方のチャンバー14に進入し、隙間18を通って下方のチャンバー15に進入し、ワークWの幅方向に均一化されて下方のチャンバー15からスリット17で構成されるガス導入路を通して放電処理部20の本体部21内にスリット27を通して進入する。   The operation of the plasma processing apparatus M configured as described above will be described. The processing gas supplied from the processing gas source 2 in the processing gas introduction part 10 of the nozzle head 1 enters the upper chamber 14 from the pipe 11 through the through hole 16, enters the lower chamber 15 through the gap 18, The workpiece W is made uniform in the width direction of the workpiece W and enters the main body portion 21 of the discharge processing portion 20 through the slit 27 from the lower chamber 15 through the gas introduction path formed by the slit 17.

放電処理部20内では、処理ガスは電極23,24間の中心間隙25に均一に導入される。電源4から電極23,24にパルス状電圧が印加されると、中心間隙25は放電空間となってグロー放電が発生し、処理ガスがプラズマ化され活性化されて、吹き出し口28aからワークWに吹き付けられワーク表面に接触して洗浄等の表面処理を行うことができる。   In the discharge processing unit 20, the processing gas is uniformly introduced into the central gap 25 between the electrodes 23 and 24. When a pulse voltage is applied from the power source 4 to the electrodes 23 and 24, the central gap 25 becomes a discharge space, glow discharge is generated, the processing gas is turned into plasma and activated, and the workpiece W is blown from the outlet 28a. The surface treatment such as cleaning can be performed by being sprayed and contacting the workpiece surface.

プラズマ化された処理ガスは、中心間隙25を通して幅広のワークWの全幅に亘って吹き出され、グロー放電状態が安定しているため、ワークWの表面は均一に洗浄処理される。ワークWは搬送手段3により所定の速度で搬送され、プラズマ化された処理ガスの吹き付けエリアがワークWの移動に伴って徐々に移動して、ワークWの広いエリアを均一にプラズマ処理することができる。なお、表面処理として洗浄処理について説明したが、親水性処理や撥水性処理等の表面改質処理も、同様に均一に行うことができる。   The plasma-ized processing gas is blown out over the entire width of the wide workpiece W through the central gap 25 and the glow discharge state is stable, so that the surface of the workpiece W is uniformly cleaned. The workpiece W is conveyed by the conveying means 3 at a predetermined speed, and the sprayed area of the plasma-ized processing gas gradually moves as the workpiece W moves, so that a wide area of the workpiece W can be uniformly plasma-processed. it can. Although the cleaning process has been described as the surface treatment, a surface modification process such as a hydrophilic process or a water repellent process can also be performed uniformly.

ワークWはノズルヘッド1に対して搬送手段3により搬送されることで、ワークWの広い処理領域を均一に表面処理することができる。そして、ワークWは処理中に移動される際、ワークが反りによって湾曲している場合でも、搬送方向の前後に設置されたローラ29,29により搬送台3aの方向に押圧され、ひいては搬送台3aの上面である基準面に押圧されるため、反りが修正されてワークWは平坦な状態となり、表面処理を均一に行うことができる。また、ワークWが平坦な状態に保持されるのでワークとノズルヘッドとの間隔であるワーキングディスタンスを小さくでき、処理反応を速くできるため処理時間を短縮できる。ワークWは搬送台3aに直接載置されているが、水平な基準面を備える支持台に載置してもよい。   The work W is transported to the nozzle head 1 by the transport means 3 so that a wide processing area of the work W can be uniformly surface-treated. When the workpiece W is moved during processing, even if the workpiece is curved due to warping, the workpiece W is pressed in the direction of the conveyance table 3a by the rollers 29 and 29 installed before and after the conveyance direction, and as a result, the conveyance table 3a. Therefore, the warpage is corrected and the workpiece W becomes flat, and the surface treatment can be performed uniformly. Further, since the workpiece W is held in a flat state, the working distance that is the interval between the workpiece and the nozzle head can be reduced, and the processing time can be shortened, so that the processing time can be shortened. The workpiece W is directly placed on the transport table 3a, but may be placed on a support table having a horizontal reference surface.

本発明で用いる処理ガスとしては、電界を印加することによってプラズマを発生するガスであれば、特に限定されず、処理目的により種々のガスを使用できる。本発明のプラズマ処理装置Mによれば、プラズマ発生空間中に存在する気体の種類を問わずグロー放電プラズマを発生させることが可能であり、開放系あるいは気体の自由な流失を防ぐ程度の低気密系での処理が可能となる。前記のパルス電界を用いた大気圧放電プラズマ処理装置によると、ガス種にまったく依存せず、電極間において大気圧下で放電を起こすことが可能であり、電極構造や放電手順を単純化でき、高速処理を実現できる。   The processing gas used in the present invention is not particularly limited as long as it is a gas that generates plasma by applying an electric field, and various gases can be used depending on the processing purpose. According to the plasma processing apparatus M of the present invention, glow discharge plasma can be generated regardless of the kind of gas existing in the plasma generation space, and the airtightness is low enough to prevent free flow of the open system or gas. System processing is possible. According to the atmospheric pressure discharge plasma processing apparatus using the pulse electric field, it is possible to cause discharge at atmospheric pressure between the electrodes without depending on the gas type at all, and the electrode structure and the discharge procedure can be simplified. High-speed processing can be realized.

処理ガスとして、CF、C、CClF、SF等のフッ素含有化合物ガスを用いることによって、撥水性表面を得ることができる。処理ガスとして、O、O、水、空気等の酸素元素含有化合物、N、NH等の窒素元素含有化合物、SO、SO等の硫黄元素含有化合物を用いることによって、基材表面にカルボニル基、水酸基、アミノ基等の親水性官能基を形成させて表面エネルギーを高くし、親水性表面を得ることができる。また、アクリル酸、メタクリル酸等の親水基を有する重合性モノマーを用いて親水性重合膜を被膜することもできる。 A water-repellent surface can be obtained by using a fluorine-containing compound gas such as CF 4 , C 2 F 6 , CClF 3 , or SF 6 as the processing gas. By using oxygen element-containing compounds such as O 2 , O 3 , water and air, nitrogen element-containing compounds such as N 2 and NH 3 , and sulfur element-containing compounds such as SO 2 and SO 3 as processing gases, A hydrophilic surface such as a carbonyl group, a hydroxyl group, and an amino group can be formed on the surface to increase the surface energy and obtain a hydrophilic surface. Alternatively, the hydrophilic polymer film can be coated with a polymerizable monomer having a hydrophilic group such as acrylic acid or methacrylic acid.

さらに、Si、Ti、Sn等の金属の金属−水素化合物、金属−ハロゲン化合物、金属アルコラート等の処理ガスを用いることによって、SiO、TiO、SnO等の金属酸化物薄膜を形成でき、基材表面に電気的、光学的機能を与えることができる。ハロゲン系ガスを用いてエッチング処理やダイシング処理を行ったり、酸素系ガスを用いてレジスト処理や有機物汚染の除去を行ったり、アルゴン、窒素等の不活性ガスを用いて表面クリーニングや表面改質を行うこともできる。経済性及び安全性の観点から、処理ガス単独雰囲気よりも、以下に挙げる希釈ガスによって希釈された雰囲気中で処理を行うことが望ましい。希釈ガスとしては、ヘリウム、ネオン、アルゴン、キセノン等の希ガス、窒素ガス等が挙げられる。これらは単独でも2種以上を混合して用いてもよい。 Furthermore, metal oxide thin films such as SiO 2 , TiO 2 and SnO 2 can be formed by using a processing gas such as metal metal-hydrogen compounds, metal-halogen compounds, metal alcoholates such as Si, Ti, and Sn, Electrical and optical functions can be imparted to the substrate surface. Etching and dicing using halogen-based gas, resist processing and organic contamination removal using oxygen-based gas, and surface cleaning and surface modification using inert gas such as argon and nitrogen It can also be done. From the viewpoint of economy and safety, it is desirable to perform the treatment in an atmosphere diluted with a diluent gas listed below, rather than the atmosphere alone. Examples of the diluent gas include rare gases such as helium, neon, argon, and xenon, nitrogen gas, and the like. These may be used alone or in admixture of two or more.

本発明の他の実施形態を図面に基づき詳細に説明する。図3は本発明に係る表面処理装置の他の実施形態として、平坦化手段である第1の支持台の斜視図と、その変形例の斜視図、図4は第2の支持台の斜視図、図5は第3の支持台の斜視図である。なお、これらの実施形態は前記した実施形態に対し、被処理物であるワークWは支持台を介して平坦な状態に保持され、搬送手段で搬送されて表面処理が行われることを特徴とする。そして、他の実質的に同等の構成については同じ符号を付して詳細な説明は省略する。   Another embodiment of the present invention will be described in detail with reference to the drawings. FIG. 3 is a perspective view of a first support base, which is a flattening means, and a perspective view of a modification thereof as another embodiment of the surface treatment apparatus according to the present invention, and FIG. 4 is a perspective view of the second support base. FIG. 5 is a perspective view of the third support base. In addition, these embodiments are characterized in that the workpiece W, which is an object to be processed, is held in a flat state via a support, and is transported by a transport means to be subjected to surface treatment. . Other substantially equivalent configurations are denoted by the same reference numerals, and detailed description thereof is omitted.

図3において、この実施形態のワークWは平面形状が長方形をしており、ワークを平坦な状態に保持する支持台35はベースとなる平板36と、複数のクリップ37とから構成される。平板36は剛性を有するセラミックス等から形成され、ワークと略同一の長方形状をしており、上面が平坦な基準面となっている。クリップ37はステンレス鋼やばね材から形成され、板材の上下端部を折り曲げて平板36とワークW、具体的には端部とを挟むことによりワークを押圧し、平板36の上面(基準面)に密着させ、ワークWの反りをとって平坦化するものである。   In FIG. 3, the workpiece W of this embodiment has a rectangular planar shape, and a support base 35 that holds the workpiece in a flat state is composed of a flat plate 36 serving as a base and a plurality of clips 37. The flat plate 36 is formed of a ceramic or the like having rigidity, has a rectangular shape that is substantially the same as the workpiece, and has a flat reference surface on the upper surface. The clip 37 is formed of stainless steel or a spring material. The upper and lower end portions of the plate material are bent to sandwich the flat plate 36 and the work W, specifically, the end portion to press the work, and the upper surface (reference surface) of the flat plate 36. The workpiece W is warped and flattened.

このようにして平坦化手段である支持台35によりワークを平坦な状態で保持し、平板36を搬送台3aに載置、搬送または固定することで、ノズルヘッド1から吹き出される処理ガスはワークの表面に均一に接触し、均一な表面処理を行うことができる。そして、ワーキングディスタンスを小さく設定できるため、処理時間を短縮することができる。なお、平板36のクリップが挟まれる部分を予め段差にしておくと、搬送台3aへの固定が容易となる。また、クリップは絶縁被膜が形成されていてもよく、上下端部にはクッション材を貼着してもよい。クリップの位置はワークに傷を付けたり、処理の邪魔にならない位置を適宜選択すればよい。ワークやノズルヘッドを搬送するときは、ワークの搬送方向に平行な対向する2辺に設けるのが好ましい(図3b参照)。   In this way, by holding the work in a flat state by the support table 35 that is a flattening means, and placing, transporting, or fixing the flat plate 36 on the transport table 3a, the processing gas blown from the nozzle head 1 is transferred to the work table. It is possible to perform uniform surface treatment by uniformly contacting the surface. Since the working distance can be set small, the processing time can be shortened. In addition, if the part where the clip of the flat plate 36 is pinched is made a step in advance, the fixing to the transport table 3a becomes easy. In addition, the clip may be formed with an insulating coating, and a cushion material may be attached to the upper and lower ends. The position of the clip may be selected as appropriate so that the work is not damaged or does not interfere with the processing. When the work or nozzle head is transported, it is preferably provided on two opposing sides parallel to the work transport direction (see FIG. 3b).

図4に示す支持台40は、長方形のワークWが陥没する凹部41を形成してある容器状をしており、外周の縁部には回転可能に複数の押え爪42が支持されている。押え爪は4辺の縁部に、その長さに必要な数だけ支持されており、押え爪42が縁部と平行な状態では凹部41上に突出せず、押え爪42を例えば90度回転させたときに凹部41上に突出してワークWを凹部41の底面である水平な基準面に押圧するように構成されている。凹部41の深さは保持されるワークWの厚さと略同じに形成されている。   A support base 40 shown in FIG. 4 has a container shape in which a concave portion 41 into which a rectangular work W is depressed is formed, and a plurality of presser claws 42 are rotatably supported on an outer peripheral edge portion. The presser claws are supported on the edges of the four sides as many as the length of the presser claws. When the presser claws 42 are parallel to the edges, the presser claws 42 do not protrude onto the recesses 41, and the presser claws 42 are rotated, for example, 90 degrees When it is made to protrude, it protrudes on the recessed part 41, and it is comprised so that the workpiece | work W may be pressed on the horizontal reference plane which is the bottom face of the recessed part 41. FIG. The depth of the recess 41 is formed to be substantially the same as the thickness of the work W to be held.

支持台40も搬送手段3で搬送される搬送台3a上に、図示していないクランプ手段等で固定される。支持台40の凹部41にワークWを嵌合させ、押え爪42を回転させてワークW上に位置させると、反りによりワークWが湾曲していても、その外周部が押え爪42により下方に押圧されるため、ワークは平坦な状態となる。ワークを平坦な状態にしてノズルヘッド1から処理ガスを吹き出させて処理することにより、表面処理は均一に行われ、ワーキングディスタンスが小さくても搬送の途中でワークWと処理ヘッドとの接触が防止される。   The support base 40 is also fixed on the transport base 3a transported by the transport means 3 by a clamping means (not shown). When the workpiece W is fitted in the recess 41 of the support base 40 and the presser claw 42 is rotated and positioned on the workpiece W, even if the workpiece W is curved due to warping, the outer peripheral portion thereof is lowered downward by the presser claw 42. Since it is pressed, the workpiece is in a flat state. By processing by blowing the processing gas from the nozzle head 1 with the workpiece in a flat state, the surface treatment is performed uniformly, and even if the working distance is small, the contact between the workpiece W and the processing head is prevented during the conveyance. Is done.

図5に示す支持台45は、長方形状のワークWの長手方向の2辺を係合させて支持するものであり、支持台45にはワークWの幅より僅かに大きい凹溝46が形成されている。この凹溝の深さは、保持されるワークの厚さより大きく設定され、凹溝の対向する垂直面には対向する2対の突起47が形成されている。これらの突起は、凹溝46の底面と対向する下面との距離がワークの厚さと同等になるように設定され、前後側が上昇する傾斜面となっている。なお、突起の数は2対に限らず、さらに多くしてもよい。突起が2対の場合は、凹溝46の入口部と出口部に設置することが好ましい。また、突起の下面にばね材を装着してワークを押し付けるように構成してもよい。   The support base 45 shown in FIG. 5 supports and supports two sides in the longitudinal direction of the rectangular workpiece W, and the support base 45 has a concave groove 46 slightly larger than the width of the work W. ing. The depth of the concave groove is set to be larger than the thickness of the work to be held, and two pairs of protrusions 47 facing each other are formed on the opposing vertical surfaces of the concave groove. These protrusions are set so that the distance between the bottom surface of the concave groove 46 and the lower surface facing the groove 46 is equal to the thickness of the workpiece, and are inclined surfaces in which the front and rear sides rise. The number of protrusions is not limited to two pairs, and may be increased. When there are two pairs of protrusions, it is preferable that the protrusions are installed at the entrance and exit of the groove 46. Moreover, you may comprise so that a workpiece | work may be pressed by attaching a spring material to the lower surface of a protrusion.

このように構成された支持台45では、ワークWを平坦化して保持させるときには凹溝46の開口部の方向から、突起47の下面と凹溝底面との間にワークWを挿入して凹溝46方向に押し込むことでワークWは2対の突起47により押圧状態となり、支持台45具体的には凹溝底面である水平な基準面に密着して平坦な状態で保持固定される。ワークWは2対あるいはそれ以上の突起47により長手方向の外周部を押え付けられるため、ワークが反って湾曲状態でも支持台45に平坦な状態で保持される。この支持台45に保持されたワークWをプラズマ処理装置Mで表面処理すると、各種の表面処理が均一に行われ、ワーキングディスタンスを小さくできるため処理時間を短縮できる。また、少ない処理ガスで表面処理が可能となる。   In the support base 45 configured as described above, when the workpiece W is flattened and held, the workpiece W is inserted between the bottom surface of the protrusion 47 and the bottom surface of the concave groove from the direction of the opening of the concave groove 46 to form the concave groove. By pushing in the 46 direction, the workpiece W is pressed by the two pairs of protrusions 47, and is held and fixed in a flat state in close contact with the horizontal reference surface which is the bottom surface of the support groove 45, specifically the concave groove. Since the workpiece W is pressed against the outer peripheral portion in the longitudinal direction by two or more pairs of protrusions 47, the workpiece W is held flat on the support base 45 even when the workpiece is curved. When the workpiece W held on the support 45 is surface-treated with the plasma processing apparatus M, various surface treatments are uniformly performed, and the working distance can be reduced, so that the processing time can be shortened. Further, the surface treatment can be performed with a small amount of processing gas.

以上、本発明の一実施形態について詳述したが、本発明は、前記の実施形態に限定されるものではなく、特許請求の範囲に記載された本発明の精神を逸脱しない範囲で、種々の設計変更を行うことができるものである。例えば、プラズマ処理として、被処理物の表面を洗浄する例を示したが、成膜、エッチング、表面改質やアッシング等の各種処理にも適用できることは勿論である。また、対向する電極間での放電は、グロー放電に限らず、コロナ放電、アーク放電等の放電でもよく、大気圧近傍での処理に限らず減圧下での表面処理にも適用できる。   Although one embodiment of the present invention has been described in detail above, the present invention is not limited to the above-described embodiment, and various modifications can be made without departing from the spirit of the present invention described in the claims. Design changes can be made. For example, an example of cleaning the surface of an object to be processed has been shown as plasma processing, but it is needless to say that the present invention can be applied to various processes such as film formation, etching, surface modification, and ashing. The discharge between the electrodes facing each other is not limited to glow discharge, but may be discharge such as corona discharge or arc discharge, and is applicable not only to treatment in the vicinity of atmospheric pressure but also to surface treatment under reduced pressure.

被処理物を押圧するローラは処理ガスの吹き出し口の搬送方向前後側に各1列に設ける例を示したが、さらに多数列設けるように構成してもよい。放電処理部に処理ガスを導入する処理ガス導入部を備える構成を示したが、放電処理部に直接処理ガス源から導入するように構成してもよく、途中に処理ガスの圧力変化を防止する圧力調整弁を備えるように構成してもよい。処理ガスは吹き出し口を通して被処理物に吹き付ける構成としたが、中心間隙から直接吹き付ける構成でもよい。   Although the roller which presses a to-be-processed object showed the example provided in each 1 row in the conveyance direction front and back side of the blowing port of a process gas, you may comprise so that many rows may be provided. Although a configuration including a processing gas introduction unit that introduces a processing gas into the discharge processing unit has been shown, it may be configured to be introduced directly from the processing gas source into the discharge processing unit, and a change in the pressure of the processing gas is prevented in the middle. You may comprise so that a pressure control valve may be provided. The processing gas is blown to the object to be processed through the blowout port, but may be blown directly from the center gap.

本発明の活用例として、処理ヘッドから吹き出す処理ガスとしてHFベーパ等を使用してエッチング処理を行うことができる。また、プラズマ処理装置に限られるものでなく、熱CVDヘッドを取り付けることによって薄膜形成の用途にも適用できる。さらに、本発明では親水処理や撥水処理等の表面処理を行うこともできる。   As an application example of the present invention, an etching process can be performed using HF vapor or the like as a processing gas blown from the processing head. Moreover, it is not restricted to a plasma processing apparatus, It can apply also to the use of thin film formation by attaching a thermal CVD head. Further, in the present invention, surface treatment such as hydrophilic treatment or water repellent treatment can be performed.

本発明に係る表面処理装置の一実施形態としてプラズマ処理装置の要部構成を示す断面図。Sectional drawing which shows the principal part structure of a plasma processing apparatus as one Embodiment of the surface treatment apparatus which concerns on this invention. 図1の要部を示す底面図。The bottom view which shows the principal part of FIG. (a)は本発明に係る表面処理装置の他の実施形態で用いる平坦化手段として第1の支持台の斜視図、(b)はその変形例を示す斜視図。(A) is a perspective view of a 1st support stand as a planarization means used with other embodiment of the surface treatment apparatus which concerns on this invention, (b) is a perspective view which shows the modification. 第2の支持台の斜視図。The perspective view of the 2nd support stand. 第3の支持台の斜視図。The perspective view of a 3rd support stand.

符号の説明Explanation of symbols

1:ノズルヘッド(処理ヘッド)、2:処理ガス源、3:搬送手段、3a:搬送台、4:電源、23,24:電極、29:ローラ(平坦化手段)、10:処理ガス導入部、20:放電処理部、35,40,45:支持台(平坦化手段)、36:平板、37:クリップ、41:凹部、42:押え爪、46:凹溝、47:突起、M:プラズマ処理装置(表面処理装置)、W:ワーク(被処理物)   1: nozzle head (processing head), 2: processing gas source, 3: transport means, 3a: transport table, 4: power supply, 23, 24: electrode, 29: roller (flattening means), 10: processing gas introduction section , 20: Discharge treatment part, 35, 40, 45: Support base (flattening means), 36: Flat plate, 37: Clip, 41: Recess, 42: Pressing claw, 46: Concave groove, 47: Protrusion, M: Plasma Processing equipment (surface treatment equipment), W: Workpiece (object to be treated)

Claims (5)

処理ヘッドから吹き出した処理ガスを被処理物の表面に接触させて表面処理する装置であって、
該表面処理装置は、被処理物を平坦な状態にする平坦化手段を備えることを特徴とする表面処理装置。
An apparatus for performing a surface treatment by bringing a treatment gas blown from a treatment head into contact with the surface of an object to be treated,
The surface treatment apparatus includes a flattening means for flattening an object to be processed.
前記表面処理装置は、前記処理ヘッドと被処理物との少なくとも一方を移動させて表面処理することを特徴とする請求項1に記載の表面処理装置。   The surface treatment apparatus according to claim 1, wherein the surface treatment apparatus performs surface treatment by moving at least one of the treatment head and an object to be treated. 前記平坦化手段は、前記処理ヘッド側に回転可能に支持され、前記被処理物の表面を押圧するローラであることを特徴とする請求項1または2に記載の表面処理装置。   The surface processing apparatus according to claim 1, wherein the flattening unit is a roller that is rotatably supported on the processing head side and presses the surface of the object to be processed. 前記平坦化手段は、支持台を介して前記被処理物を平坦な状態に保持することを特徴とする請求項1または2に記載の表面処理装置。   The surface treatment apparatus according to claim 1, wherein the flattening unit holds the workpiece in a flat state via a support base. 処理ヘッドから処理ガスを吹き出し、被処理物の表面に接触させて表面処理する方法であって、
前記被処理物を平坦な状態にしたあと、前記処理ガスを接触させることを特徴とする表面処理方法。
A method of performing a surface treatment by blowing a processing gas from a processing head and bringing it into contact with the surface of an object to be processed,
A surface treatment method comprising bringing the treatment gas into contact after the object to be treated is in a flat state.
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JP2007323836A (en) * 2006-05-30 2007-12-13 Sekisui Chem Co Ltd Plasma processing device
JP2007323820A (en) * 2006-05-30 2007-12-13 Sekisui Chem Co Ltd Plasma processing device
JP2019530948A (en) * 2016-09-30 2019-10-24 シノギー・ゲーエムベーハーCINOGY GmbH Electrode structure for forming a dielectric barrier plasma discharge

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JPH08222548A (en) * 1995-02-16 1996-08-30 Hitachi Ltd Plasma processor and plasma processing of substrate
JP2002134594A (en) * 2000-10-24 2002-05-10 Nippon Telegr & Teleph Corp <Ntt> Substrate holder and thin film forming device
JP2003297912A (en) * 2002-03-28 2003-10-17 Hitachi Kokusai Electric Inc Substrate treatment device
JP2004134437A (en) * 2002-10-08 2004-04-30 Renesas Technology Corp Method and apparatus for manufacturing semiconductor device

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JPH08222548A (en) * 1995-02-16 1996-08-30 Hitachi Ltd Plasma processor and plasma processing of substrate
JP2002134594A (en) * 2000-10-24 2002-05-10 Nippon Telegr & Teleph Corp <Ntt> Substrate holder and thin film forming device
JP2003297912A (en) * 2002-03-28 2003-10-17 Hitachi Kokusai Electric Inc Substrate treatment device
JP2004134437A (en) * 2002-10-08 2004-04-30 Renesas Technology Corp Method and apparatus for manufacturing semiconductor device

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Publication number Priority date Publication date Assignee Title
JP2007323836A (en) * 2006-05-30 2007-12-13 Sekisui Chem Co Ltd Plasma processing device
JP2007323820A (en) * 2006-05-30 2007-12-13 Sekisui Chem Co Ltd Plasma processing device
JP2019530948A (en) * 2016-09-30 2019-10-24 シノギー・ゲーエムベーハーCINOGY GmbH Electrode structure for forming a dielectric barrier plasma discharge
JP7074351B2 (en) 2016-09-30 2022-05-24 シノギー・ゲーエムベーハー Dielectric barrier Electrode structure for forming plasma discharge

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