JP2006086258A - Nonsuction head pickup for electronic device waiting test - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a nonsuction head pickup for electronic device waiting test. <P>SOLUTION: The nonsuction head pickup formed by an airtight cover having a plurality of openings sucks an electronic device waiting test having a plurality of terminals (pads) on the surface wherein each opening is used for containing each terminal and the electronic device waiting test is sucked by suction force generated through pressure reduction. Test is carried out while keeping some distance between each terminal of the electronic device waiting test and a corresponding test terminal (pogo pin) by means of a resilient device, and bringing each terminal into contact with the corresponding test terminal through compression of the resilient device. Terminal of the electronic device waiting test is separated from the test terminal by releasing compression of the resilient device after completing the test, and the electronic device waiting test is moved to a tray area where vacuum is broken and released. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a pick-up device for a test standby electronic device, and more particularly to an apparatus for picking up a test standby electronic device by a non-adsorption head type pickup device formed by an airtight cover.

  The electronic device needs to be subjected to a normal test after completion of manufacture, thereby determining whether or not a predetermined function can be achieved. During testing, the entire batch of electronic devices is typically left in a tester tray, and one or more electronic devices are placed on a shuttle means by a handler on the tester. Then, the test standby electronic device is transported to the test area by the shuttle device, the electronic device is further picked up by the pickup device in the test area, further transported to the socket, the test is performed, and after the test is completed, the electronic device is shuttled. Is returned to the tray area, and the electronic device is placed in a pass tray or a reject tray depending on the test result.

  Traditionally, the pick-up device is a soft suction head that picks up the upper surface (ie, a flat surface) of the test standby electronic device that has been packaged using the vacuum suction method, and then transports the picked-up electronic device to the testing machine. The electronic device is tested by bringing a lower surface having a plurality of terminals (pads) in the electronic device into contact with test terminals (pogo pins) in the socket by pressure operation.

  In addition, in response to the diversification demand of products, many electronic devices need to attach terminals or other special accessories such as a charge coupled device (CCD) 180 to the upper and lower surfaces of the package. In 180, a single photosensitive layer 184 is disposed on one surface to receive light, and a terminal 182 is disposed on the other surface to contact the outside. However, at the time of testing, the required test light is emitted from the testing machine, and therefore the photosensitive layer must be provided on the lower surface and the terminal 182 must be provided on the upper surface. At this time, when the size of the test standby electronic device is small or the terminals on the surface to be adsorbed are too dense, for example, the device is a ball grid array (BGA) package, and the distance between the solder bumps is 0. When it is smaller than 7 mm, as shown in FIG. 1, the terminals of the surface to be adsorbed are distributed in various places on the surface to be adsorbed, and the adsorbing surface is used for the adsorption of the adsorption head and has no terminals capable of generating airtightness. Can not provide a large surface area part. On the other hand, if the size of the test standby electronic device is too small, the suction head must be reduced accordingly, and the receiving force is more likely to become non-average, and the problem of distortion becomes more severe.

  Therefore, at the time of picking up an electronic device with accessories attached on both sides, it is possible to prevent collision between the terminal on the surface of the electronic device and the test terminal, and it can be applied to a relatively small BGA package electronic device. The challenge is not to be restricted.

  The present invention provides a kind of non-adsorptive head-type pickup device for test standby electronic devices, which solves the problem that the pickup device in the prior art cannot absorb the test standby electronic device whose surface terminals are overcrowded. When the standby electronic device is adsorbed and distorted and slides into the floating site, the upper surface terminal collides with the test terminal due to the distortion, thereby causing damage to the terminal or the test terminal, or the test standby electronic device. It is assumed that the apparatus can solve the problem of falling off.

  An object of the present invention is to provide a kind of non-adsorptive head type pick-up device for a test standby electronic device, which adopts an airtight cover instead of a conventional adsorption head, and is provided with terminals on the surface to be adsorbed by each opening of the airtight cover And sucking in through each opening, adsorbing the test standby electronic device, and holding the test standby electronic device, the terminal and the test terminal are held at a certain distance, thereby preventing a collision problem.

The invention of claim 1 is a non-adsorption head type pickup device for a test standby electronic device comprising an intake device, a base, an airtight cover, and an elastic device,
The intake device generates suction force by intake air,
The base includes an airtight space and a plurality of test terminals, and an opening at one end of the airtight space is connected to the intake device;
The hermetic cover is formed of an elastic material, one end of which is connected to the hermetic space and maintains airtight contact with the hermetic space, and a plurality of openings are provided at the other end, and the plurality of openings are a plurality of test terminals. And the plurality of openings correspond to a plurality of terminals on the surface to be adsorbed of the test standby electronic device,
The elastic device has an elastic modulus, one end of which is connected to the other end of the base, and the other end of the elastic device is connected to the hermetic cover;
The plurality of openings generate suction force by suction of the intake device to adsorb the test standby electronic device, and when the test standby electronic device is adsorbed, the plurality of terminals and the plurality of test terminals are not in contact with each other The airtight cover is controlled between the first position and the second position of the airtight space by the elastic device, and the elastic device controls the airtight cover to the first position when receiving no suction force. The non-adsorptive head type pickup device for the test standby electronic device.
According to a second aspect of the present invention, in the non-adsorption head type pickup device for the test standby electronic device according to the first aspect, when the elastic device receives a pressure larger than its elastic coefficient, the hermetic cover is controlled to the second position, and a plurality of The non-adsorptive head type pick-up device for test standby electronic device, wherein the elastic device separates the plurality of terminals and the plurality of test terminals after the terminal is brought into contact with the plurality of test terminals and the pressure disappears It is said.
The invention according to claim 3 is the non-adsorption head type pickup device for the test standby electronic device according to claim 1, wherein the elastic device is any one of an annular ring, a spring set, and a sponge. This is a non-adsorption head type pickup device.
According to a fourth aspect of the present invention, in the non-adsorption head type pickup device for the test standby electronic device according to the first aspect, the airtight cover includes a protective skirt for fixing the test standby electronic device. It is a non-adsorptive head type pickup device for electronic devices.
The invention according to claim 5 is the non-adsorption head type pickup device for the test standby electronic device according to claim 1, wherein the test standby electronic device is a charge coupled device (CCD), and the charge coupled device is a ball grid array (BGA). The non-adsorptive head type pickup device for the test standby electronic device is characterized in that it is packaged in a system and the ball pitch of the ball grid array is smaller than 0.7 mm.

  Accordingly, in the present invention, the test standby electronic device having a plurality of terminals (pads) on the surface is adsorbed by the non-adsorption head type pick-up device formed by the airtight cover having a plurality of openings, and each opening has each terminal. The test standby electronic device is adsorbed by the suction force that is used for housing and generated by suction. Further, the elastic device is used to hold a distance at a test terminal (pogo pin) corresponding to each terminal of the test stand-by electronic device, and the test terminal corresponding to each terminal is brought into contact by the compression of the elastic device to perform the test. When the compression of the elastic device is released after the test is completed, the terminal of the test standby electronic device and the test terminal are separated, and the test standby electronic device is moved to the tray area, and the vacuum is broken and released.

  The invention is illustrated below with specific examples. However, in addition to the detailed description, the present invention can be implemented in a wider range of other embodiments, and the scope of the present invention is not limited to the description of the embodiments, but conforms to the description of the claims. Shall.

  Further, in order to provide a clear description and facilitate understanding of the present invention, each part in the figure is not drawn by its relative dimensions, and the ratio of certain dimensions to other related dimensions is exaggerated. Unrelated details are not fully described and the illustration is simplified.

  According to the prior art, the test stand-by electronic device is a test stand-by electronic device with a traditional pick-up head type pick-up device, either when the surface with its terminals is subjected to suction or when the size of the electronic device is too small It was not compatible with the adsorption. The present invention provides a kind of non-adsorption head type pickup device for a test standby electronic device. The present invention adsorbs a test standby electronic device having a plurality of pads (pads) on its surface by a non-adsorptive head pickup device formed by an elastic hermetic cover, and after the test standby electronic device is adsorbed, a protective skirt for the hermetic cover And the test standby electronic device terminal and the test terminal are kept at a certain distance.

  Subsequently, after the test standby electronic device is moved to the test machine, the test is performed by bringing the terminal of the test standby electronic device into contact with the test terminal by the lower pressure provided by the test machine. At this time, in order to reduce the contact stress between the terminal of the test standby electronic device and the test terminal, the present invention further reduces the contact stress by using an elastic device (a set of springs or a set of elastic sponge) as a shock absorber. After the completion of the test of the test standby electronic device, when the lower pressure of the testing machine disappears, the terminals of the test standby electronic device and the test terminals are returned to their original positions by the elastic device. In addition, the hermetic cover has a plurality of openings, which correspond to the plurality of terminals of the test standby electronic device, accommodate the terminals of the test standby electronic device when the test standby electronic device is attracted, and the elastic device is compressed. The test standby electronic device terminal and the test terminal are accommodated and contacted internally when the test is performed.

  Furthermore, the airtight cover is limited to the airtight space of the base, and the airtight cover and the base are kept in airtight contact. In addition, an air intake device (for example, a pump) performs intake to the airtight space to form a vacuum. A suction force is generated at each opening to attract the test standby electronic device. After the test standby electronic device is adsorbed, each opening forms an airtight state, and the airtight space also forms an airtight state, thereby generating a suction force for adsorbing the test standby electronic device. In this way, the disadvantage that the test standby electronic device falls off due to the collision between the terminal of the test standby electronic device and the test terminal in the prior art is prevented, and each opening of the airtight cover disperses the adsorption force with respect to the electronic device. It is assumed that the device is not restricted by the position of the terminal on the surface to be adsorbed.

  According to a specific embodiment of the present invention, the pick-up device 100 of the test standby electronic device includes a base 24, an airtight cover 22 having elasticity, an air intake device 26, and an airtight cover 22 and a base 24, as shown in FIG. The elastic device 30 is located between the two. The hermetic cover 22 is located in the hermetic space 242 of the base 24 and includes a plurality of openings 222 corresponding to the plurality of terminals 282 of the test standby electronic device 28, and the opening 222 is configured to test when the test standby electronic device 28 is sucked. The terminal 282 of the standby electronic device 28 can be accommodated. In addition, the airtight cover 22 further includes a protective skirt 226, and the air intake device 26 performs air intake to form a negative pressure in the airtight space 242 and the opening 222, and the terminal of the test standby electronic device 28 is provided by the generated suction force. This protective skirt 226 secures the test standby electronic device 28 when adsorbing the surface, and prevents the test standby electronic device 28 from dropping off due to a collision caused by distortion during the adsorption process of the test standby electronic device 28.

  In addition, a plurality of test terminals 246 and an airtight space 242 are arranged on the base 24. The first opening 244 of the airtight space 242 is used for connection with the intake device 26, and the second opening is in contact with the connection end 224 of the airtight cover 22, so that the airtight cover 22 and the airtight space 242 are in airtight contact. In addition, the connection end 224 of the hermetic cover 22 can move in the hermetic space 242, but the movement is limited to the range of x, that is, the hermetic cover 22 is slightly defined as the connection end 224 (that is, the first position). And the second position 248 is active. When the intake device 26 inhales, the gas enters only through the airtight space 242 and the opening 222 of the airtight cover 22 and generates a suction force at the suction end 228 of the airtight cover 22. appear. Subsequently, after the test standby electronic device 28 is attracted to each opening 222, the test standby electronic device 28 closes the opening 222, so that the airtight space 242 forms an airtight space between the first opening 244 and the suction end 228. As a result, the test standby electronic device 28 is firmly adsorbed.

  The hermetic cover 22 is formed of an elastic material, for example, a sponge. Therefore, when the test standby electronic device 28 is attracted to the suction end 228, the stress received by the test standby electronic device 28 can be reduced due to the elastic characteristics of the test standby electronic device 28. . In addition, the airtight cover 22 absorbs stress generated when the test standby electronic device 28 is adsorbed as a shock absorber, reduces the stress received by the test standby electronic device 28, and adsorbs the test standby electronic device 28 by the protective skirt 226. The horizontal state is maintained in the process, thereby preventing the test standby electronic device 28 from falling off during the adsorption process. In addition, the distance between the terminal 282 of the test standby electronic device 28 and the test terminal 246 is controlled by the elastic characteristic of the hermetic cover 22, so that the terminal 282 of the test standby electronic device 28 is directly connected to the test standby electronic device at the time of adsorption. Collisions are prevented, as shown in FIG.

  Subsequently, when the test standby electronic device 28 is moved to the socket position (not shown) of the tester, the test standby electronic device 28 is joined to the socket by the operation of the lower pressure provided by the tester, and at the same time, this lower pressure. Is larger than the elastic modulus of the sponge of the airtight cover 22 and the elastic device 30, it is further compressed, the terminal 282 and the test terminal 246 are brought into contact with each other, and a test is performed, as shown in FIG. Similarly, the elastic device 30 has a function of absorbing stress, whereby the elastic device 30 is used as a shock absorber and absorbs the pressure generated by the lower pressure of the test machine, thereby bringing the terminal 282 and the test terminal 246 into contact with a gentle force. This prevents the test standby electronic device 28 or the test terminal 246 from being damaged due to the lower pressure.

  In addition, after the test of the test standby electronic device 28 is completed, the testing machine terminates the lower pressure force and provides a pulling force to cause the test standby electronic device 28 to be detached from the socket. At this time, the elastic device 30 also separates the terminal 282 and the test terminal 246, lowers the hermetic cover 22 to the connection end 224 (that is, the first position), and reliably returns the hermetic cover 22 to the fixed position. Subsequently, the intake device 26 supplies air (i.e., vacuum break), and the test standby electronic device 28 is dropped into the tray. After the vacuum is broken, the suction device 26 causes the gas to flow into the airtight space 242 to make the air pressure in the airtight space 242 equal to the external air pressure, and lowers the adsorption device 22 to the first position.

  In addition, the above-described elastic device 30 is configured by one or a plurality of elastic parts, for example, an annular ring, a sponge, or a spring, and the present invention does not limit the type and quantity of the elastic device.

  The non-adsorptive head type pick-up device for test standby electronic device of the present invention performs adsorption to the test standby electronic device in which terminals or other special accessories such as a charge coupled device (CCD) are attached to the upper surface and the lower surface. Can be used for testing. In particular, when the test standby electronic device 28 is small in size or the terminals on the surface to be adsorbed are excessively dense, for example, when the device is a BGA package and the pitch between the solder bumps is smaller than 0.7 mm, the test of the present invention is performed. A test can be performed by using a non-adsorption head type pickup device for a standby electronic device.

  The above is the description of the embodiments of the present invention, and is not intended to limit the scope of the claims of the present invention. By the above description, those having ordinary knowledge in the technical field to which the present invention belongs will clarify the present invention. Can understand and execute. Any modification or alteration in detail based on the present invention which can be made within the spirit of the present invention shall fall within the scope of the claims of the present invention.

It is a display figure of a known test standby electronic device. It is an apparatus display figure of the Example of this invention. It is an apparatus display figure of the Example of this invention. It is an apparatus display figure of the Example of this invention.

Explanation of symbols

100 pickup device 180 charge coupled device 182 terminal 184 photosensitive layer 22 airtight cover 222 opening 224 connection end 226 protective skirt 228 suction end 24 base 242 airtight space 244 first opening 246 test terminal 248 second position 26 air intake device 28 electronic device 282 terminal 30 Elastic device

Claims (5)

It is a non-adsorptive head type pick-up device for test standby electronic devices comprising an intake device, a base, an airtight cover, and an elastic device
The intake device generates suction force by intake air,
The base includes an airtight space and a plurality of test terminals, and an opening at one end of the airtight space is connected to the intake device;
The hermetic cover is formed of an elastic material, one end of which is connected to the hermetic space and maintains airtight contact with the hermetic space, and a plurality of openings are provided at the other end, and the plurality of openings are a plurality of test terminals. And the plurality of openings correspond to a plurality of terminals on the surface to be adsorbed of the test standby electronic device,
The elastic device has an elastic modulus, one end of which is connected to the other end of the base, the other end of the elastic device is connected to the hermetic cover,
The plurality of openings generate suction force by suction of the intake device to adsorb the test standby electronic device, and when the test standby electronic device is adsorbed, the plurality of terminals and the plurality of test terminals are not in contact with each other The airtight cover is controlled between the first position and the second position of the airtight space by the elastic device, and the elastic device controls the airtight cover to the first position when receiving no suction force. Non-adsorptive head type pickup device for test standby electronic device.   2. The non-adsorption head type pickup device for a test standby electronic device according to claim 1, wherein when the elastic device receives a pressure larger than its elastic modulus, the hermetic cover is controlled to the second position, and the plurality of terminals are a plurality of test terminals. A non-adsorptive head type pick-up device for a test standby electronic device, wherein the elastic device separates a plurality of terminals and a plurality of test terminals after the pressure is lost.   2. The non-adsorptive head type pickup device for test standby electronic device according to claim 1, wherein the elastic device is any one of an annular ring, a spring set and a sponge. .   2. The non-adsorption head type pickup device for test standby electronic devices according to claim 1, wherein the airtight cover includes a protective skirt for fixing the test standby electronic device. Pickup device. 2. The non-adsorption head type pickup device for a test standby electronic device according to claim 1, wherein the test standby electronic device is a charge coupled device (CCD), the charge coupled device is packaged in a ball grid array (BGA) system, and A non-adsorptive head type pickup device for a test standby electronic device, wherein the ball pitch of the ball grid array is smaller than 0.7 mm.

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