JP2006079686A - Method of manufacturing glass master - Google Patents

Method of manufacturing glass master Download PDF

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JP2006079686A
JP2006079686A JP2004260673A JP2004260673A JP2006079686A JP 2006079686 A JP2006079686 A JP 2006079686A JP 2004260673 A JP2004260673 A JP 2004260673A JP 2004260673 A JP2004260673 A JP 2004260673A JP 2006079686 A JP2006079686 A JP 2006079686A
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Prior art keywords
groove
photoresist
glass master
glass
master
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JP2004260673A
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Japanese (ja)
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Toyohito Asanuma
豊人 浅沼
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Victor Company of Japan Ltd
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Victor Company of Japan Ltd
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Priority to JP2004260673A priority Critical patent/JP2006079686A/en
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a glass master in which a rough surface on a side wall of a groove is not generated. <P>SOLUTION: After photoresist 2 is applied on a glass substrate 1 and the photoresist 2 is exposed using a laser beam of wavelength shorter than absorption wavelength of the photoresist 2, development is performed and a photoresist pattern 4 is formed, the glass substrate 1 is etched by using a photoresist pattern 4 as a mask. In forming a groove 5, after the groove 5 is formed, dry etching is performed at applied voltage of 50-500V under 0.5 Pa-5Pa ambient gas using fluorocarbon based gas. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、CDやDVD等の光ディスクの成形に用いられるガラス原盤の製造方法に関する。   The present invention relates to a method of manufacturing a glass master used for forming an optical disc such as a CD or a DVD.

一般にオーディオ、画像用途、コンピュ−タメモリとして高密度データが蓄積できる光ディスクは、ガラス原盤を用いて作製される。
従来のガラス原盤を用いた光ディスクの製造方法は、特許文献1に記載されている。
In general, an optical disc capable of storing high-density data as an audio, image application, or computer memory is manufactured using a glass master.
A method for manufacturing an optical disk using a conventional glass master is described in Patent Document 1.

即ち、ガラス基板上にフォトレジストパターンを形成した後、このフォトレジストパターンをマスクとして、前記ガラス基板をプラズマエッチングすることにより幅が底幅と略同一な矩形状のグルーブを形成し、次に、前記フォトレジストパターンを除去してガラス原盤を作製する。更に、前記ガラス原盤のグルーブ上にNi膜を形成し、Ni電鋳を行い前記ガラス原盤からNi層を剥がしマスターを作製する。このマスターのNi膜表面の酸化皮膜処理を行うことによって、酸化皮膜を形成し、この酸化皮膜上にニッケル電鋳法により、Ni層を形成した後、前記マスターからNi層を剥離してマザースタンパを作製する。このマザーをスタンパとして射出成形することにより光ディスクを作製する。
特開平11−296915号公報
That is, after forming a photoresist pattern on the glass substrate, the glass substrate is plasma-etched using the photoresist pattern as a mask to form a rectangular groove having a width substantially the same as the bottom width. The photoresist pattern is removed to prepare a glass master. Further, a Ni film is formed on the groove of the glass master, and Ni electroforming is performed to peel off the Ni layer from the glass master to produce a master. An oxide film is formed by performing an oxide film treatment on the surface of the Ni film of the master. After forming an Ni layer on the oxide film by a nickel electroforming method, the Ni layer is peeled off from the master and the mother stamper is formed. Is made. An optical disk is manufactured by injection molding using this mother as a stamper.
Japanese Patent Laid-Open No. 11-296915

しかしながら、前記レーザ光は、その光強度が中心で高く、外側で低いガウス分布を有しているため、前記グルーブ部は、底部が平らであるが、側壁が荒れるといた問題を生じていた。特に、ブルーレイのカッティングマシンで光源として、波長266nmのレーザ光を用い、前記フォトレジストがi線用(吸収波長365nm)の場合には、特にグルーブの側壁の荒れがひどくなる。
図3にその様子を示す。図3は、従来例で作製されたガラス原盤におけるi線用フォトレジストに波長が266nmのレーザ光を照射した際のグルーブの側壁の荒れ状態を示す図である。
この結果、上記したガラス原盤を用いて作製された光ディスクは、トラッキングが取れなかったり、グルーブノイズが発生したりしていた。
However, since the laser light has a high Gaussian distribution at the center and a low Gaussian distribution on the outside, the groove portion has a problem that the bottom portion is flat but the side wall is rough. In particular, when a laser beam having a wavelength of 266 nm is used as a light source in a Blu-ray cutting machine and the photoresist is for i-line (absorption wavelength 365 nm), the roughness of the groove side wall is particularly severe.
This is shown in FIG. FIG. 3 is a diagram showing a rough state of the side wall of the groove when the i-line photoresist is irradiated with laser light having a wavelength of 266 nm in the glass master produced in the conventional example.
As a result, the optical disk produced using the glass master described above could not be tracked or generated groove noise.

そこで、本発明は、前述の課題に鑑みて提案されるものであって、グルーブの側壁に荒れを生じないガラス原盤の製造方法を提供することを目的とする。   Then, this invention is proposed in view of the above-mentioned subject, Comprising: It aims at providing the manufacturing method of the glass original disc which does not produce a rough side wall of a groove.

本願発明は、ガラス基板上にフォトレジストを塗布し、前記フォトレジストの吸収波長よりも短い波長のレーザ光を用いて、前記フォトレジストの露光を行った後、現像を行ってフォトレジストパターンを形成し、前記フォトレジスパターンをマスクとして前記ガラス基板のエッチングを行い、グルーブを形成するガラス原盤の製造方法において、前記グルーブを形成後、フロロカーボン系ガスを用いて、0.5Pa〜5Paの雰囲気ガス下で印加電圧が50〜500Vでドライエッチングすることを特徴とするガラス原盤の製造方法を提供する。   In the present invention, a photoresist is coated on a glass substrate, the photoresist is exposed using laser light having a wavelength shorter than the absorption wavelength of the photoresist, and then developed to form a photoresist pattern. The glass substrate is etched using the photoresist pattern as a mask to form a groove. After forming the groove, a fluorocarbon-based gas is used to form a groove under an atmosphere gas of 0.5 Pa to 5 Pa. The method for producing a glass master is characterized in that dry etching is performed at an applied voltage of 50 to 500V.

本発明によれば、グルーブを形成後、フロロカーボン系ガスを用いて、0.5Pa〜5Paの雰囲気ガス下で印加電圧が50〜500Vでドライエッチングするので、グルーブの側壁の荒れを低減したガラス原盤が得られる。この結果、このガラス原盤を用いて作製された光ディスクは、良好なトラッキングエラーが得られ、グルーブノイズを低減できる。   According to the present invention, after forming the groove, dry etching is performed using an fluorocarbon-based gas at an applied voltage of 50 to 500 V under an atmosphere gas of 0.5 Pa to 5 Pa. Is obtained. As a result, an optical disk manufactured using this glass master can obtain a good tracking error and reduce groove noise.

以下、本発明に係るガラス原盤の製造方法の実施の形態について、図1乃至図2を参照して詳細に説明する。
図1は、本発明の実施の形態に係るガラス原盤の製造方法を示す断面図である。図2は、本発明の実施の形態を用いて作製されたガラス原盤におけるi線用フォトレジストに波長が266nmのレーザ光を照射した際のグルーブの側壁の荒れ状態を示す図である。
Hereinafter, an embodiment of a method for producing a glass master according to the present invention will be described in detail with reference to FIGS.
FIG. 1 is a cross-sectional view showing a method for manufacturing a glass master according to an embodiment of the present invention. FIG. 2 is a diagram showing a rough state of the side wall of the groove when a laser beam having a wavelength of 266 nm is irradiated onto the i-line photoresist in the glass master manufactured using the embodiment of the present invention.

(潜像形成工程)
図1(A)に示すように、光学研磨を施した直径200nmの石英ガラス基板1を洗浄及び乾燥した後、i線用のフォトレジスト2を塗布し、次に、波長266nmのレーザ光をレンズで集光させて潜像3を形成する。
(Latent image forming process)
As shown in FIG. 1A, after cleaning and drying the optically polished quartz glass substrate 1 having a diameter of 200 nm, an i-line photoresist 2 is applied, and then laser light having a wavelength of 266 nm is applied to the lens. To form a latent image 3.

(グルーブ形成工程)
この後、同図(B)に示すように、潜像3の露光及び現像を行ってフォトレジストパターン4を形成する。
(Groove formation process)
Thereafter, as shown in FIG. 3B, the latent image 3 is exposed and developed to form a photoresist pattern 4.

(エッチング工程)
次に、同図(C)に示すように、フォトレジストパターン4をマスクとして、フロロカーボン系ガスを用いて、0.3Pa〜3Paの雰囲気ガス下で100V〜700Vの電圧を印加して異方性の高いドライエッチングを行って、グルーブ5を形成する。
(Etching process)
Next, as shown in FIG. 3C, the photoresist pattern 4 is used as a mask, and an anisotropy is applied by applying a voltage of 100 V to 700 V under an atmosphere gas of 0.3 Pa to 3 Pa using a fluorocarbon-based gas. The groove 5 is formed by performing high dry etching.

(グルーブ側壁処理工程)
次に、同図(D)に示すように、酸素アッシングを行って、フォトレジストパターン4を除去した後、再びフロロカーボン系ガスを用いて、0.5Pa〜5Paの雰囲気ガス下で50〜500Vの電圧を印加して、グルーブ5の側壁の荒れを低減してガラス原盤6を作製する。
ここでは、フロロカーボン系ガスとしては、CF4、CHF3、C38、C48等が用いられる。
しかし、5Pa以上の場合には、C38、C48では、エッチングレートが上がらず、エッチングがほとんどできない。また、0.5Pa以下では、グルーブの側壁が荒れる。このため、0.5Pa〜5Paである場合には、フロロカーボン系ガスを用いると、グルーブ5の側壁の荒れを低減できる。
その様子を図2に示す。
(Groove sidewall treatment process)
Next, as shown in FIG. 4D, after oxygen ashing is performed and the photoresist pattern 4 is removed, a fluorocarbon-based gas is used again under an atmosphere gas of 0.5 Pa to 5 Pa at 50 to 500 V. A glass master 6 is manufactured by applying a voltage to reduce the roughness of the side wall of the groove 5.
Here, CF 4 , CHF 3 , C 3 F 8 , C 4 F 8 or the like is used as the fluorocarbon-based gas.
However, in the case of 5 Pa or more, the etching rate does not increase and etching cannot be performed with C 3 F 8 or C 4 F 8 . On the other hand, at 0.5 Pa or less, the groove side wall becomes rough. For this reason, when it is 0.5 Pa-5 Pa, when the fluorocarbon type gas is used, the roughness of the side wall of the groove 5 can be reduced.
This is shown in FIG.

このガラス原盤6を用いたスタンパ及び光ディスクは、公知の製造方法により作製することができる。   A stamper and an optical disk using the glass master 6 can be manufactured by a known manufacturing method.

以上のように、本発明の実施の形態によれば、ガラス基板1上にエッチングガスを用いて、グルーブ5を形成した後、フロロカーボン系ガスを用いて、0.5Pa〜5Paの雰囲気ガス下で印加電圧が50〜500Vでドライエッチングするので、グルーブ5の側壁の荒れを低減したガラス原盤6が得られる。この結果、このガラス原盤6を用いて作製された光ディスクは、良好なトラッキングエラーが得られ、グルーブノイズを低減できる。   As described above, according to the embodiment of the present invention, after the groove 5 is formed on the glass substrate 1 using the etching gas, the fluorocarbon-based gas is used under the atmosphere gas of 0.5 Pa to 5 Pa. Since the applied voltage is dry-etched at 50 to 500 V, the glass master 6 with reduced roughness of the side wall of the groove 5 is obtained. As a result, an optical disk manufactured using this glass master 6 can obtain a good tracking error and reduce groove noise.

本発明の実施の形態に係るガラス原盤の製造方法を示す断面図である。It is sectional drawing which shows the manufacturing method of the glass original disk which concerns on embodiment of this invention. 本発明の実施の形態を用いて作製されたガラス原盤におけるi線用フォトレジストに波長が266nmのレーザ光を照射した際のグルーブの側壁の荒れ状態を示す図である。It is a figure which shows the rough state of the side wall of a groove at the time of irradiating the laser beam with a wavelength of 266 nm to the photoresist for i rays in the glass master disc produced using embodiment of this invention. 従来例で作製されたガラス原盤におけるi線用フォトレジストに波長が266nmのレーザ光を照射した際のグルーブの側壁の荒れ状態を示す図である。It is a figure which shows the rough state of the side wall of a groove at the time of irradiating the laser beam with a wavelength of 266 nm to the photoresist for i rays in the glass master disc produced by the prior art example.

符号の説明Explanation of symbols

1…ガラス基板、2…フォトレジスト、3…潜像、4…フォトレジストパターン、5…グルーブ、6…ガラス原盤

DESCRIPTION OF SYMBOLS 1 ... Glass substrate, 2 ... Photoresist, 3 ... Latent image, 4 ... Photoresist pattern, 5 ... Groove, 6 ... Glass master

Claims (1)

ガラス基板上にフォトレジストを塗布し、前記フォトレジストの吸収波長よりも短い波長のレーザ光を用いて、前記フォトレジストの露光を行った後、現像を行ってフォトレジストパターンを形成し、前記フォトレジスパターンをマスクとして前記ガラス基板のエッチングを行い、グルーブを形成するガラス原盤の製造方法において、
前記グルーブを形成後、フロロカーボン系ガスを用いて、0.5Pa〜5Paの雰囲気ガス下で印加電圧が50〜500Vでドライエッチングすることを特徴とするガラス原盤の製造方法。

A photoresist is applied on a glass substrate, and after exposing the photoresist using a laser beam having a wavelength shorter than the absorption wavelength of the photoresist, development is performed to form a photoresist pattern. Etching the glass substrate using a resist pattern as a mask, in the method of manufacturing a glass master to form a groove,
A method for producing a glass master, wherein after forming the groove, dry etching is performed using a fluorocarbon-based gas at an applied voltage of 50 to 500 V under an atmosphere gas of 0.5 Pa to 5 Pa.

JP2004260673A 2004-09-08 2004-09-08 Method of manufacturing glass master Pending JP2006079686A (en)

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