JP2006013462A - 半導体装置及びその作製方法 - Google Patents
半導体装置及びその作製方法 Download PDFInfo
- Publication number
- JP2006013462A JP2006013462A JP2005147106A JP2005147106A JP2006013462A JP 2006013462 A JP2006013462 A JP 2006013462A JP 2005147106 A JP2005147106 A JP 2005147106A JP 2005147106 A JP2005147106 A JP 2005147106A JP 2006013462 A JP2006013462 A JP 2006013462A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- photoelectric conversion
- thin film
- film transistor
- conversion element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Images
Landscapes
- Light Receiving Elements (AREA)
- Electroluminescent Light Sources (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005147106A JP2006013462A (ja) | 2004-05-21 | 2005-05-19 | 半導体装置及びその作製方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004152160 | 2004-05-21 | ||
JP2005147106A JP2006013462A (ja) | 2004-05-21 | 2005-05-19 | 半導体装置及びその作製方法 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013234905A Division JP5784096B2 (ja) | 2004-05-21 | 2013-11-13 | 半導体装置の作製方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006013462A true JP2006013462A (ja) | 2006-01-12 |
JP2006013462A5 JP2006013462A5 (enrdf_load_stackoverflow) | 2008-06-19 |
Family
ID=35780267
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005147106A Withdrawn JP2006013462A (ja) | 2004-05-21 | 2005-05-19 | 半導体装置及びその作製方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2006013462A (enrdf_load_stackoverflow) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008294414A (ja) * | 2007-04-27 | 2008-12-04 | Semiconductor Energy Lab Co Ltd | 半導体装置及びその作製方法 |
JP2009200104A (ja) * | 2008-02-19 | 2009-09-03 | Seiko Epson Corp | 光電変換装置及び電気光学装置 |
WO2009119426A1 (ja) * | 2008-03-26 | 2009-10-01 | 住友電気工業株式会社 | 光電変換モジュールおよびその組み立て方法ならびにそれを用いた光電対応情報処理機器 |
US8410473B2 (en) | 2008-08-06 | 2013-04-02 | Kabushiki Kaisha Toshiba | Light emitting device |
JP2014064024A (ja) * | 2004-05-21 | 2014-04-10 | Semiconductor Energy Lab Co Ltd | 半導体装置の作製方法 |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11251517A (ja) * | 1998-02-27 | 1999-09-17 | Seiko Epson Corp | 3次元デバイスの製造方法 |
JP2000022120A (ja) * | 1998-04-27 | 2000-01-21 | Sharp Corp | 二次元画像検出器 |
JP2002064194A (ja) * | 2000-06-08 | 2002-02-28 | Shimadzu Corp | 電磁波撮像装置およびその製造方法 |
JP2002162474A (ja) * | 2000-11-27 | 2002-06-07 | Sharp Corp | 電磁波検出器およびその製造方法 |
JP2002217391A (ja) * | 2001-01-23 | 2002-08-02 | Seiko Epson Corp | 積層体の製造方法及び半導体装置 |
JP2003023573A (ja) * | 2001-07-11 | 2003-01-24 | Asahi Kasei Corp | ビジョンチップ |
WO2003008999A2 (en) * | 2001-07-18 | 2003-01-30 | Koninklijke Philips Electronics Nv | Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same |
JP2003046096A (ja) * | 2001-04-18 | 2003-02-14 | Matsushita Electric Ind Co Ltd | 半導体モジュールとその製造方法および回路基板ならびに半導体装置 |
JP2004047975A (ja) * | 2002-05-17 | 2004-02-12 | Semiconductor Energy Lab Co Ltd | 積層体の転写方法及び半導体装置の作製方法 |
WO2004019411A1 (ja) * | 2002-08-09 | 2004-03-04 | Hamamatsu Photonics K.K. | フォトダイオードアレイ、その製造方法、及び放射線検出器 |
-
2005
- 2005-05-19 JP JP2005147106A patent/JP2006013462A/ja not_active Withdrawn
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11251517A (ja) * | 1998-02-27 | 1999-09-17 | Seiko Epson Corp | 3次元デバイスの製造方法 |
JP2000022120A (ja) * | 1998-04-27 | 2000-01-21 | Sharp Corp | 二次元画像検出器 |
JP2002064194A (ja) * | 2000-06-08 | 2002-02-28 | Shimadzu Corp | 電磁波撮像装置およびその製造方法 |
JP2002162474A (ja) * | 2000-11-27 | 2002-06-07 | Sharp Corp | 電磁波検出器およびその製造方法 |
JP2002217391A (ja) * | 2001-01-23 | 2002-08-02 | Seiko Epson Corp | 積層体の製造方法及び半導体装置 |
JP2003046096A (ja) * | 2001-04-18 | 2003-02-14 | Matsushita Electric Ind Co Ltd | 半導体モジュールとその製造方法および回路基板ならびに半導体装置 |
JP2003023573A (ja) * | 2001-07-11 | 2003-01-24 | Asahi Kasei Corp | ビジョンチップ |
WO2003008999A2 (en) * | 2001-07-18 | 2003-01-30 | Koninklijke Philips Electronics Nv | Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same |
JP2004047975A (ja) * | 2002-05-17 | 2004-02-12 | Semiconductor Energy Lab Co Ltd | 積層体の転写方法及び半導体装置の作製方法 |
WO2004019411A1 (ja) * | 2002-08-09 | 2004-03-04 | Hamamatsu Photonics K.K. | フォトダイオードアレイ、その製造方法、及び放射線検出器 |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014064024A (ja) * | 2004-05-21 | 2014-04-10 | Semiconductor Energy Lab Co Ltd | 半導体装置の作製方法 |
JP2008294414A (ja) * | 2007-04-27 | 2008-12-04 | Semiconductor Energy Lab Co Ltd | 半導体装置及びその作製方法 |
JP2009200104A (ja) * | 2008-02-19 | 2009-09-03 | Seiko Epson Corp | 光電変換装置及び電気光学装置 |
WO2009119426A1 (ja) * | 2008-03-26 | 2009-10-01 | 住友電気工業株式会社 | 光電変換モジュールおよびその組み立て方法ならびにそれを用いた光電対応情報処理機器 |
US8235603B2 (en) | 2008-03-26 | 2012-08-07 | Sumitomo Electric Industries, Ltd. | Optoelectric conversion module, method for assembling same, and optoelectric information processor using same |
JP5327052B2 (ja) * | 2008-03-26 | 2013-10-30 | 住友電気工業株式会社 | 光電変換モジュールおよびそれを用いた光電対応情報処理機器 |
US8410473B2 (en) | 2008-08-06 | 2013-04-02 | Kabushiki Kaisha Toshiba | Light emitting device |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5784096B2 (ja) | 半導体装置の作製方法 | |
US7495272B2 (en) | Semiconductor device having photo sensor element and amplifier circuit | |
JP6242831B2 (ja) | 半導体装置の作製方法 | |
JP4693411B2 (ja) | 半導体装置の作製方法 | |
US9608004B2 (en) | Semiconductor device and peeling off method and method of manufacturing semiconductor device | |
US8106474B2 (en) | Semiconductor device | |
CN100585867C (zh) | 半导体装置及其制造方法 | |
US7923800B2 (en) | Semiconductor device and electronic device | |
JP4827396B2 (ja) | 半導体装置の作製方法 | |
JP2006013462A (ja) | 半導体装置及びその作製方法 | |
JP4267394B2 (ja) | 剥離方法、及び半導体装置の作製方法 | |
JP4602035B2 (ja) | 半導体装置の作製方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20080424 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20080424 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20101102 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20101124 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20101227 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20111004 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20111101 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120904 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20121101 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20130903 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20131113 |
|
A761 | Written withdrawal of application |
Free format text: JAPANESE INTERMEDIATE CODE: A761 Effective date: 20131206 |