JP2005537648A - 改善された光学機器を備える多重光源整列センサ - Google Patents

改善された光学機器を備える多重光源整列センサ Download PDF

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Publication number
JP2005537648A
JP2005537648A JP2004531989A JP2004531989A JP2005537648A JP 2005537648 A JP2005537648 A JP 2005537648A JP 2004531989 A JP2004531989 A JP 2004531989A JP 2004531989 A JP2004531989 A JP 2004531989A JP 2005537648 A JP2005537648 A JP 2005537648A
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JP
Japan
Prior art keywords
detector
sensor system
component
light source
light sources
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004531989A
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English (en)
Japanese (ja)
Inventor
マドセン，デーヴィッド・ディー
クランツ，デーヴィッド・エム
キャッシュ，フレデリック・エム，ザ・セカンド
Original Assignee
サイバーオプティックス・コーポレーション
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Publication date
Application filed by サイバーオプティックス・コーポレーション filed Critical サイバーオプティックス・コーポレーション
Publication of JP2005537648A publication Critical patent/JP2005537648A/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04—Mounting of components, e.g. of leadless components
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0812—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines the monitoring devices being integrated in the mounting machine, e.g. for monitoring components, leads, component placement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04—Mounting of components, e.g. of leadless components
    • H05K13/0404—Pick-and-place heads or apparatus, e.g. with jaws
    • H05K13/0413—Pick-and-place heads or apparatus, e.g. with jaws with orientation of the component while holding it; Drive mechanisms for gripping tools, e.g. lifting, lowering or turning of gripping tools
JP2004531989A 2002-08-29 2003-08-29 改善された光学機器を備える多重光源整列センサ Pending JP2005537648A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US40682202P 2002-08-29 2002-08-29
PCT/US2003/027236 WO2004021759A1 (en) 2002-08-29 2003-08-29 Multiple source alignment sensor with improved optics

Publications (1)

Publication Number Publication Date
JP2005537648A true JP2005537648A (ja) 2005-12-08

Family

ID=31978363

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004531989A Pending JP2005537648A (ja) 2002-08-29 2003-08-29 改善された光学機器を備える多重光源整列センサ

Country Status (5)

Country Link
JP (1) JP2005537648A (de)
KR (1) KR101022302B1 (de)
DE (1) DE10393193T5 (de)
GB (1) GB2410328B (de)
WO (1) WO2004021759A1 (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008267956A (ja) * 2007-04-19 2008-11-06 Sokkia Topcon Co Ltd 傾斜角検出器
JP2009283572A (ja) * 2008-05-20 2009-12-03 Fuji Mach Mfg Co Ltd 撮像装置付保持装置

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IES20040818A2 (en) 2004-12-06 2006-06-14 Brian Francis Mooney Method and apparatus for measuring a golf stroke
US7623250B2 (en) * 2005-02-04 2009-11-24 Stryker Leibinger Gmbh & Co. Kg. Enhanced shape characterization device and method
GB2465024B (en) * 2008-11-08 2011-01-12 Adaptive Automation Ltd Shadow sensing apparatus
KR101270007B1 (ko) * 2011-10-13 2013-06-03 경북대학교 산학협력단 물체의 위치정보 검출 장치

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100367272B1 (ko) * 1994-08-11 2003-03-15 사이버옵틱스 코포레이션 부품정렬센서및부품검출시스템
US6292261B1 (en) 1998-05-22 2001-09-18 Cyberoptics Corporation Rotary sensor system with at least two detectors
US6639239B2 (en) * 1998-10-30 2003-10-28 Cyberoptics Corporation Angle rejection filter
US6762847B2 (en) * 2001-01-22 2004-07-13 Cyberoptics Corporation Laser align sensor with sequencing light sources

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008267956A (ja) * 2007-04-19 2008-11-06 Sokkia Topcon Co Ltd 傾斜角検出器
JP2009283572A (ja) * 2008-05-20 2009-12-03 Fuji Mach Mfg Co Ltd 撮像装置付保持装置

Also Published As

Publication number Publication date
GB2410328A (en) 2005-07-27
KR20050059149A (ko) 2005-06-17
GB0505532D0 (en) 2005-04-27
GB2410328B (en) 2006-06-07
KR101022302B1 (ko) 2011-03-21
DE10393193T5 (de) 2005-09-29
WO2004021759A1 (en) 2004-03-11

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