JP2005532538A - 組み込みテスト付きセル・バッファ - Google Patents

組み込みテスト付きセル・バッファ Download PDF

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Publication number
JP2005532538A
JP2005532538A JP2004518200A JP2004518200A JP2005532538A JP 2005532538 A JP2005532538 A JP 2005532538A JP 2004518200 A JP2004518200 A JP 2004518200A JP 2004518200 A JP2004518200 A JP 2004518200A JP 2005532538 A JP2005532538 A JP 2005532538A
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JP
Japan
Prior art keywords
resistor
input terminal
cell buffer
test signal
coupled
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004518200A
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English (en)
Japanese (ja)
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JP2005532538A5 (enExample
Inventor
オット，ウィリアム・イー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell International Inc
Original Assignee
Honeywell International Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell International Inc filed Critical Honeywell International Inc
Publication of JP2005532538A publication Critical patent/JP2005532538A/ja
Publication of JP2005532538A5 publication Critical patent/JP2005532538A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16542—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies for batteries

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Fuel Cell (AREA)
JP2004518200A 2002-07-01 2003-06-30 組み込みテスト付きセル・バッファ Pending JP2005532538A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/186,517 US6777946B2 (en) 2002-07-01 2002-07-01 Cell buffer with built-in test
PCT/US2003/020801 WO2004003576A2 (en) 2002-07-01 2003-06-30 Cell buffer with built-in test

Publications (2)

Publication Number Publication Date
JP2005532538A true JP2005532538A (ja) 2005-10-27
JP2005532538A5 JP2005532538A5 (enExample) 2006-07-27

Family

ID=29999296

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004518200A Pending JP2005532538A (ja) 2002-07-01 2003-06-30 組み込みテスト付きセル・バッファ

Country Status (5)

Country Link
US (1) US6777946B2 (enExample)
EP (1) EP1518128A2 (enExample)
JP (1) JP2005532538A (enExample)
AU (1) AU2003265258A1 (enExample)
WO (1) WO2004003576A2 (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7075285B2 (en) * 2004-05-12 2006-07-11 Richard Chin Delay locked loop circuit and method for testing the operability of the circuit
US9158106B2 (en) 2005-02-23 2015-10-13 Pixtronix, Inc. Display methods and apparatus
US20070205969A1 (en) 2005-02-23 2007-09-06 Pixtronix, Incorporated Direct-view MEMS display devices and methods for generating images thereon
US9229222B2 (en) 2005-02-23 2016-01-05 Pixtronix, Inc. Alignment methods in fluid-filled MEMS displays
US8482496B2 (en) 2006-01-06 2013-07-09 Pixtronix, Inc. Circuits for controlling MEMS display apparatus on a transparent substrate
US9261694B2 (en) 2005-02-23 2016-02-16 Pixtronix, Inc. Display apparatus and methods for manufacture thereof
US8519945B2 (en) 2006-01-06 2013-08-27 Pixtronix, Inc. Circuits for controlling display apparatus
US8159428B2 (en) 2005-02-23 2012-04-17 Pixtronix, Inc. Display methods and apparatus
US7999994B2 (en) 2005-02-23 2011-08-16 Pixtronix, Inc. Display apparatus and methods for manufacture thereof
US8310442B2 (en) 2005-02-23 2012-11-13 Pixtronix, Inc. Circuits for controlling display apparatus
US9082353B2 (en) 2010-01-05 2015-07-14 Pixtronix, Inc. Circuits for controlling display apparatus
US8526096B2 (en) 2006-02-23 2013-09-03 Pixtronix, Inc. Mechanical light modulators with stressed beams
US9176318B2 (en) 2007-05-18 2015-11-03 Pixtronix, Inc. Methods for manufacturing fluid-filled MEMS displays
US7728604B1 (en) * 2008-02-11 2010-06-01 Xilinx, Inc. Testing differential signal standards using device under test's built in resistors
US8169679B2 (en) 2008-10-27 2012-05-01 Pixtronix, Inc. MEMS anchors
WO2011097258A1 (en) 2010-02-02 2011-08-11 Pixtronix, Inc. Circuits for controlling display apparatus
US9134552B2 (en) 2013-03-13 2015-09-15 Pixtronix, Inc. Display apparatus with narrow gap electrostatic actuators
CN104034941B (zh) * 2014-06-11 2017-08-08 台达电子企业管理（上海）有限公司 电压采样系统

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3812303A (en) * 1972-10-11 1974-05-21 Itt Differential loop current detector
US4525663A (en) * 1982-08-03 1985-06-25 Burr-Brown Corporation Precision band-gap voltage reference circuit
JP2593253B2 (ja) * 1991-05-29 1997-03-26 富士通株式会社 電流測定回路
US6411098B1 (en) * 1996-03-27 2002-06-25 William H. Laletin Energy device analysis and evaluation
US5914606A (en) * 1996-10-10 1999-06-22 Becker-Irvin; Craig H. Battery cell voltage monitor and method
US5940052A (en) * 1997-01-15 1999-08-17 Micron Technology, Inc. Current monitor for field emission displays
JP3863262B2 (ja) * 1997-09-30 2006-12-27 松下電器産業株式会社 電池電圧測定装置
US6163862A (en) * 1997-12-01 2000-12-19 International Business Machines Corporation On-chip test circuit for evaluating an on-chip signal using an external test signal
US6111529A (en) * 1998-09-30 2000-08-29 Cirrus Logic, Inc. Accurate gain calibration of analog to digital converters
US6353334B1 (en) * 2000-01-27 2002-03-05 Xilinx, Inc. Circuit for converting a logic signal on an output node to a pair of low-voltage differential signals
JP4210030B2 (ja) * 2000-11-02 2009-01-14 パナソニック株式会社 積層電圧計測装置

Also Published As

Publication number Publication date
US6777946B2 (en) 2004-08-17
WO2004003576A3 (en) 2004-02-26
AU2003265258A8 (en) 2004-01-19
WO2004003576A2 (en) 2004-01-08
US20040088629A1 (en) 2004-05-06
AU2003265258A1 (en) 2004-01-19
EP1518128A2 (en) 2005-03-30

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