JP2005349250A - Partial formation method for thin film - Google Patents

Partial formation method for thin film Download PDF

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JP2005349250A
JP2005349250A JP2004169919A JP2004169919A JP2005349250A JP 2005349250 A JP2005349250 A JP 2005349250A JP 2004169919 A JP2004169919 A JP 2004169919A JP 2004169919 A JP2004169919 A JP 2004169919A JP 2005349250 A JP2005349250 A JP 2005349250A
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ink
thin film
recessed part
overflow
correction
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JP4245517B2 (en
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Takeshi Matsuda
健 松田
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Sharp Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a partial formation method for a thin film solving a problem that a correction ink overflows from a recessed part, i.e., a correction portion and correction cannot be performed in correction of a thin film by an ink jet and previously perform liquid-repellent treatment of the whole surface of a substrate in order to suppress overflowing from the recessed part. <P>SOLUTION: In the method, the thin film is selectively formed by delivering and filling an ink containing a material for forming the thin film from an ink jet head 1 to the recessed part 7 after a foreign matter 6 on an insulation layer 5 such as TFT liquid crystal panel is removed. In the method, a self-liquid repellent ink having a contact angle of 15° or higher relative to the ink to be coated of the thin film formed by the ink to be coated is used and the the recessed part is coated with the ink by ink jet to form a coating part 8 of a first drop so as to over flow in the recessed part 7. Thereafter, the recessed part is coated once or several times with the ink corresponding to required film thickness by the ink jet to form a coat coating part 9. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、薄膜の部分的形成方法に関し、特に、TFT液晶パネル等の薄膜プロセスにおいて、薄膜に部分的に生じた微小な欠陥の修正等に応用可能な、部分的な薄膜の形成技術に関するものである。   The present invention relates to a method for partially forming a thin film, and more particularly to a technique for forming a partial thin film that can be applied to correction of a minute defect partially generated in a thin film in a thin film process such as a TFT liquid crystal panel. It is.

TFT液晶パネル等の薄膜プロセスにおいて、形成した薄膜に部分的に欠陥等が生じると、パネルの不良へと繋がってしまう。これらの欠陥を検出し、修正を行うことで良品とすることは可能であり、従来においても、特許文献1のように、レーザ光照射により欠陥領域を取り除き、インクジェットヘッドにより材料を吐出し、塗布することで欠陥を修正する等の方法は提案されている。   In a thin film process such as a TFT liquid crystal panel, if a defect or the like partially occurs in the formed thin film, it leads to a panel failure. It is possible to detect these defects and correct them to make them non-defective. Conventionally, as in Patent Document 1, the defect area is removed by laser light irradiation, the material is ejected by an inkjet head, and coating is performed. Thus, a method of correcting a defect has been proposed.

しかし、インクジェットに用いるインクは、固形成分を溶媒中に溶解させているため、通常、所望量の固形分を含んだインクの量はその固形分量よりも多くなることと、修正には欠陥を有する薄膜材料と同一もしくは同系の材料を含むインクが用いられることが多く、インクと薄膜との親和性が高いことから、特許文献1による方法では、修正インクが凹部に留まらず溢れてしまい、所望の形状に凹部を修正することができなかった。   However, since inks used for ink jet have solid components dissolved in a solvent, the amount of ink containing a desired amount of solids is usually larger than the amount of solids, and correction is defective. Ink containing a material that is the same as or similar to the thin film material is often used, and the affinity between the ink and the thin film is high. Therefore, in the method according to Patent Document 1, the correction ink does not stay in the recesses and overflows, and the desired ink is used. The concave part could not be corrected in the shape.

この溢れを抑制するために、特許文献2には、液滴の塗布部分の周囲に撥液部をフォトリソグラフィ技術を用いて予め形成し、液滴の広がりを制御する方法が提案されている。
また、特許文献3には、予め全面を撥液化処理しておき、塗布部のみを酸あるいはアルカリ溶液にて親液化処理する方法が提案されている。
更に、特許文献4には、予め加熱した基板に対して、液滴を塗布することで液滴の広がりを制御する方法が提案されている。
特開平11−271752号公報 特開2000−193816号公報 特開2000−33698号公報 特開2003−133692号公報
In order to suppress this overflow, Patent Document 2 proposes a method in which a liquid repellent portion is formed in advance around a droplet application portion using a photolithography technique to control the spread of the droplet.
Patent Document 3 proposes a method in which the entire surface is subjected to a lyophobic treatment in advance, and only the coated portion is subjected to a lyophilic treatment with an acid or alkali solution.
Furthermore, Patent Document 4 proposes a method of controlling the spread of droplets by applying droplets to a preheated substrate.
Japanese Patent Laid-Open No. 11-271752 JP 2000-193816 A JP 2000-33698 A Japanese Patent Laid-Open No. 2003-133682

しかし、特許文献2,3に記載の方法では、部分的な塗布を行う場合でも、予め、撥液化処理を基板全面に施しておく必要があり、特に、不良部の修正を行う目的で用いる場合には、発生するかどうか不確定な事象に備えて余計な工程を行う必要があり、コスト上昇要因となってしまう問題を有していた。更に、この撥液部は、デバイス動作には不要な部分であり、後工程で撥液部が悪影響を及ぼすような場合には、再度基板全体を処理し、撥液部を取り除く必要がある等、更に工程が煩雑になってしまう問題があった。また、特許文献4に記載の方法を用いれば、基板全体への事前の処理は必要なくなるものの、高い精度が必要な工程で、基板あるいはステージを加熱する必要があり、特に、液晶パネルのように大型の基板に対して加熱を行うことは、現実的ではなかった。   However, in the methods described in Patent Documents 2 and 3, even when partial application is performed, it is necessary to perform a liquid repellency treatment on the entire surface of the substrate in advance, especially when used for the purpose of correcting defective portions. However, it is necessary to perform an extra step in preparation for an event that is uncertain whether or not it will occur, and this causes a problem of increasing costs. Furthermore, this liquid repellent part is an unnecessary part for device operation. When the liquid repellent part adversely affects the subsequent process, it is necessary to process the entire substrate again and remove the liquid repellent part. Furthermore, there is a problem that the process becomes complicated. In addition, if the method described in Patent Document 4 is used, prior processing on the entire substrate is not necessary, but it is necessary to heat the substrate or stage in a process that requires high accuracy. It is not realistic to heat a large substrate.

上記課題を解決するために、本発明者等が鋭意研究を重ねた結果、インクジェットを用いて、薄膜を形成する材料を含むインクを塗布し、凹部に選択的に薄膜を形成する工程において、塗布するインクにより形成した薄膜の塗布するインクに対する接触角が15°以上有するインク(以下、自己撥液性インクと称す)を用いて、まず、凹部に溢れるようにインクジェットにより塗布し、その後、必要な膜厚に相当するインクをインクジェットにより1回あるいは数回に分けて塗布することで、安定して部分的に薄膜を形成できることを見出した。   In order to solve the above-mentioned problems, the present inventors have conducted extensive research, and as a result, using an ink jet, an ink containing a material for forming a thin film is applied, and in the step of selectively forming a thin film in a recess, the application is performed. Using an ink having a contact angle of 15 ° or more with respect to the applied ink of the thin film formed by the ink (hereinafter referred to as self-repellent ink), first, the ink is applied by ink jet so as to overflow into the concave portion, and then required. It has been found that a thin film can be stably and partially formed by applying ink corresponding to the film thickness in one or several times by inkjet.

請求項1の発明は、インクジェットを用いて、薄膜を形成する材料を含むインクを塗布し、凹部に選択的に薄膜を形成する薄膜の部分的形成方法において、前記インクを塗布して形成した薄膜の塗布する前記インクに対する接触角が15°以上である前記インクを用いて、前記凹部に溢れるようにインクジェットにより塗布する工程と、その後必要な膜厚に相当する前記インクをインクジェットにより1回あるいは数回に分けて塗布する工程を含むことを特徴とする。   The invention according to claim 1 is a thin film formed by applying the ink in the method for partially forming a thin film by applying an ink containing a material for forming the thin film by using an ink jet and selectively forming the thin film in the recess. Using the ink having a contact angle of 15 ° or more with respect to the ink to be applied, and applying the ink corresponding to the required film thickness once or several times by the ink jet so as to overflow the recess. It is characterized by including the process of apply | coating in steps.

請求項2の発明は、請求項1記載の薄膜の部分的形成方法において、前記凹部に溢れるように前記インクを塗布した後、少なくとも溢れた部分の前記インクを乾燥させる工程を含むことを特徴とする。   A second aspect of the invention is the method of partially forming a thin film according to the first aspect, comprising the step of drying the ink at least in the overflowed portion after applying the ink so as to overflow the recess. To do.

請求項3の発明は、請求項1または2記載の薄膜の部分的形成方法において、前記凹部に溢れるように前記インクを塗布する前に、少なくとも前記凹部の周囲に塗布する前記インクに対する親液性を向上させる処理工程を含むことを特徴とする。   According to a third aspect of the present invention, in the method for partially forming a thin film according to the first or second aspect, before applying the ink so as to overflow the concave portion, at least the lyophilic property to the ink applied around the concave portion. And a processing step for improving the process.

請求項4の発明は、請求項3記載の薄膜の部分的形成方法において、前記親液性を向上させる処理工程は、UV照射、溶媒塗布、表面粗化、界面活性剤塗布、洗浄の何れかの処理を行うことを特徴とする。   According to a fourth aspect of the present invention, in the method for partially forming a thin film according to the third aspect, the treatment step for improving the lyophilic property is any one of UV irradiation, solvent coating, surface roughening, surfactant coating, and cleaning. The process is performed.

請求項5の発明は、請求項1乃至4いずれか記載の薄膜の部分的形成方法において、前記インクは、フッ素系あるいはシラン系の界面活性剤を添加することにより、前記インクにより形成した薄膜の前記インクに対する接触角は15°以上とすることを特徴とする。   According to a fifth aspect of the present invention, in the method for partially forming a thin film according to any one of the first to fourth aspects, the ink is a thin film formed of the ink by adding a fluorine-based or silane-based surfactant. The contact angle with respect to the ink is 15 ° or more.

本発明の第1の効果は、インクジェットを用いて、薄膜を形成する材料を含むインクを塗布し、凹部に選択的に薄膜を形成する工程において、塗布するインクにより形成した薄膜の塗布するインクに対する接触角が15°以上有するインクを用いて、まず、凹部に溢れるようにインクジェットにより塗布し、その後、必要な膜厚に相当するインクをインクジェットにより1回あるいは数回に分けて塗布するため、溢れるように塗布したインクにより、薄膜を形成したい部分の撥液性をコントロールすることができ、液滴の広がりを制御して所望の部位に薄膜を形成することができる。   The first effect of the present invention is to apply an ink containing a material for forming a thin film by using an ink jet and selectively apply the thin film formed by the applied ink in the step of selectively forming the thin film in the recess. Using ink having a contact angle of 15 ° or more, first, the ink is applied by ink jet so as to overflow the concave portion, and then the ink corresponding to the required film thickness is applied once or several times by ink jet, so that the ink overflows. The ink applied in this manner can control the liquid repellency of the portion where the thin film is to be formed, and can control the spread of the droplets to form the thin film at a desired site.

本発明の第2の効果は、凹部に溢れるようにインクを塗布した後、少なくとも溢れた部分のインクを乾燥させるため、溢れた部分の撥液性がより安定し、液滴の広がりを制御して所望の部位に薄膜を形成することができる。   The second effect of the present invention is that after the ink is applied so as to overflow into the recess, at least the ink in the overflowing portion is dried, so that the liquid repellency of the overflowing portion is more stable and the spread of the droplets is controlled. Thus, a thin film can be formed at a desired site.

本発明の第3の効果は、凹部に溢れるようにインクを塗布する前に、少なくとも凹部の周囲の塗布するインクに対する親液性を向上させる処理を行うため、容易に液滴を溢れさせることが可能になり、液滴の広がりを制御して所望の部位に薄膜を形成することができるとともに、溢れた部分に形成される膜厚をより薄く制御できる。   The third effect of the present invention is that before the ink is applied so as to overflow into the recess, a process for improving the lyophilicity to the applied ink at least around the recess is performed, so that the droplet can easily overflow. As a result, the spread of the droplets can be controlled to form a thin film at a desired site, and the film thickness formed at the overflowed portion can be controlled to be thinner.

本発明の第4の効果は、凹部に溢れるようにインクを塗布する前の親液性を向上させる処理は、UV照射、溶媒塗布、表面粗化、界面活性剤塗布、洗浄の何れかにより行うことで、容易に親液性を向上させることができる。   The fourth effect of the present invention is that the treatment for improving the lyophilic property before applying ink so as to overflow into the recesses is performed by any one of UV irradiation, solvent coating, surface roughening, surfactant coating, and washing. Thus, lyophilicity can be easily improved.

本発明の第5の効果は、フッ素系あるいはシラン系の界面活性剤を添加することで、塗布するインクにより形成した薄膜の塗布するインクに対する接触角が15°以上有するインクを容易に得ることができる。   The fifth effect of the present invention is that by adding a fluorine-based or silane-based surfactant, an ink having a contact angle of 15 ° or more with respect to the applied ink of the thin film formed by the applied ink can be easily obtained. it can.

本発明に係る薄膜の部分的形成方法は、まず、部分的に薄膜を形成したい部分が凹形状になっていない場合は、レーザ等によるトリミングを行うことから始める。膜の剥がれ等により凹形状になっている場合は、そのまま用いても良いし、レーザ等により凹部の成形トリミングを行っても良い。次に、インクジェットヘッドを用いて、自己撥液性インクを吐出させてこの凹部に溢れるように塗布する(以下、初滴の塗布と称す)。この際、自己撥液性インクを凹部の縁全周より溢れるように塗布することが肝要となる。なぜならば、この初滴の塗布は、その後所望の膜厚とするためのインク塗布(以下、コート塗布と称す)を行う際、そのインクが凹部より溢れていかないようにすることが目的であり、そのためには、凹部外周全周が初滴により処理されていることが必要になるためである。   The method for partially forming a thin film according to the present invention starts with trimming with a laser or the like when a portion where a thin film is to be partially formed is not concave. When the concave shape is caused by peeling of the film or the like, the concave shape may be used as it is, or the concave portion may be formed and trimmed by a laser or the like. Next, using an ink jet head, self-repellent ink is ejected and applied so as to overflow the recess (hereinafter referred to as application of the first droplet). At this time, it is important to apply the self-liquid-repellent ink so as to overflow from the entire periphery of the recess. This is because the purpose of the application of the first droplet is to prevent the ink from overflowing from the concave portion when the ink is applied to obtain a desired film thickness (hereinafter referred to as coat application). This is because the entire outer periphery of the concave portion needs to be treated with the first droplet.

また、コート塗布では、所望の膜厚となるように液滴量を調整するが、インク中の固形分含有量が小さく、成膜体積に比べて塗布量が多くなる場合には、数回に分けて既塗布液滴の体積を乾燥により制御しながら塗布することもできる。更には、膜を形成する凹部外周とインクの濡れ性が悪く、初滴を安定して溢れさせるのが困難な場合には、凹部外周に対して、濡れ性を向上させる処理を行うことで、安定して初滴を溢れさせることができるようになり、その結果、安定してコート塗布を行うことができる。   In the coating application, the amount of droplets is adjusted so that the desired film thickness is obtained, but when the solid content in the ink is small and the coating amount is larger than the film formation volume, it is several times. It is also possible to apply the liquid droplets while controlling the volume of the applied liquid droplets by drying. Furthermore, if the wettability of the ink and the outer periphery of the concave part forming the film is poor and it is difficult to stably overflow the first droplet, by performing a treatment to improve the wettability on the outer periphery of the concave part, As a result, the first droplet can be stably overflowed, and as a result, the coating can be stably applied.

以下、実施例に基づき、本発明を詳細に説明する。
図7はTFT液晶パネルの画素の構造を模式的に示す図で、図7(A)は平面図、図7(B)は図7(A)のX−X断面図である。
上下ガラス基板4,4上に格子状に配置されたゲート配線10、ソース配線11からなる配線パターンの中に、透明電極13,13が形成され、対向するガラス基板上の透明電極13,13間に液晶14が封入され、透明電極13,13間に電圧を印加することで、液晶分子の配向を変化させ、光の透過量を制御し表示を行う。ここで、表示品位を保つためには、上下透明電極13,13間のギャップを高精度に制御する必要がある。即ち、透明電極13下部の絶縁層5等に不良が発生した場合には、その部分の絶縁膜の除去等を行なった後、再度絶縁膜を塗布し、絶縁膜を平坦にすることが重要になる。
以下に、その修正プロセスを例に本発明を説明する。
Hereinafter, based on an Example, this invention is demonstrated in detail.
7A and 7B are diagrams schematically illustrating a structure of a pixel of the TFT liquid crystal panel, in which FIG. 7A is a plan view and FIG. 7B is a cross-sectional view taken along line XX in FIG.
Transparent electrodes 13 and 13 are formed in a wiring pattern composed of gate wiring 10 and source wiring 11 arranged in a lattice pattern on upper and lower glass substrates 4 and 4, and between transparent electrodes 13 and 13 on the opposing glass substrate. The liquid crystal 14 is sealed, and a voltage is applied between the transparent electrodes 13 and 13 to change the orientation of the liquid crystal molecules, thereby controlling the amount of transmitted light and performing display. Here, in order to maintain display quality, it is necessary to control the gap between the upper and lower transparent electrodes 13 and 13 with high accuracy. That is, when a defect occurs in the insulating layer 5 below the transparent electrode 13, it is important to remove the insulating film in that portion and then apply the insulating film again to flatten the insulating film. Become.
Hereinafter, the present invention will be described by taking the correction process as an example.

図8は異物欠陥を有する基板を模式的に示す断面図であり、図9は図8に示す異物欠陥を除去する方法を工程順に示す図である。
図8は、透明電極13下部の絶縁層5まで形成したガラス基板4において、絶縁層5中への異物6の巻き込みにより、絶縁層5上面が凸状の欠陥となった基板を示している。この欠陥の修正は、図9(A)に示すように、異物6を含む領域の絶縁層5を、紫外線レーザ装置3を用いた紫外線レーザ照射により除去し(図9(B))、凹部7を形成することから行う(図9(C))。なお、本実施例では、異物6の除去は、紫外線レーザ照射により行ったが、これは、本発明を何ら限定するものではなく、その他の除去方法を利用しても良いことは、言うまでもない。更には、本実施例では、異物6の巻き込みの欠陥に関する場合を用いて説明したが、絶縁層5の剥がれ欠陥等に関しても有効なことはいうまでもなく、その場合は、レーザ照射等による欠陥部除去は省略することができる。
FIG. 8 is a cross-sectional view schematically showing a substrate having a foreign substance defect, and FIG. 9 is a diagram showing a method of removing the foreign substance defect shown in FIG.
FIG. 8 shows a substrate in which the upper surface of the insulating layer 5 becomes a convex defect due to the inclusion of foreign matter 6 in the insulating layer 5 in the glass substrate 4 formed up to the insulating layer 5 below the transparent electrode 13. As shown in FIG. 9A, the defect is corrected by removing the insulating layer 5 in the region including the foreign matter 6 by ultraviolet laser irradiation using the ultraviolet laser device 3 (FIG. 9B), and then forming the recess 7. (FIG. 9C). In this embodiment, the foreign matter 6 is removed by ultraviolet laser irradiation. However, this does not limit the present invention, and other removal methods may be used. Furthermore, although the present embodiment has been described using the case relating to the defect of the foreign material 6 involved, it is needless to say that it is also effective for the peeling defect of the insulating layer 5. Part removal can be omitted.

図10は本発明の薄膜の部分的形成方法における修正プロセスを工程順に示す図である。
図9に基づいて説明したように、異物6を含む領域の絶縁層5(図10(A))を紫外線レーザ装置3を用いた紫外線(UV)レーザ照射により除去した深さ100μmの凹部7に対して(図10(B))、インクジェットヘッド1を用いて自己撥液性インクを、先ず、凹部7より溢れるように4滴吐出し、初滴の塗布部8を形成した(図10(C))。その後、赤外線ランプ2を用いた赤外線の照射により、溢れ部分を完全に乾かした(図10(D))。次に、初滴の塗布部8が終了した凹部7に対して、1回当り5滴のコート塗布部9を、1回塗布する毎に赤外線ランプ2による赤外線の照射による中間乾燥を行いながら4回繰り返し、凹部7の埋設を行った(図10(E))。
FIG. 10 is a diagram showing a correction process in the order of steps in the method for partially forming a thin film of the present invention.
As described with reference to FIG. 9, the insulating layer 5 (FIG. 10A) in the region including the foreign matter 6 is removed by the ultraviolet (UV) laser irradiation using the ultraviolet laser device 3 to the recess 7 having a depth of 100 μm. On the other hand (FIG. 10B), first, four droplets of self-repellent ink were discharged using the inkjet head 1 so as to overflow the concave portion 7, thereby forming the first droplet application portion 8 (FIG. 10C). )). Thereafter, the overflow portion was completely dried by infrared irradiation using the infrared lamp 2 (FIG. 10D). Next, with respect to the concave portion 7 in which the first-drop application unit 8 has been completed, while applying 5 drops of coat application unit 9 at one time, 4 times while performing intermediate drying by infrared irradiation by the infrared lamp 2 4 The concave portion 7 was embedded repeatedly (FIG. 10E).

図1は本発明の実施例1の薄膜の部分的形成方法を用いて、欠陥修正を行った後の凹部断面形状測定結果を示す図、図2は比較例として自己撥液性を有しないインクを用いて、同様のプロセスにより欠陥修正を行った後の凹部断面形状測定結果を示す図である。
図1、図2の比較から明らかなように、自己撥液性を有するインクを用いた場合には、初滴の塗布により形成された撥液部が、コート塗布時のインクの溢れを抑制し、凹部を有効に埋設できていることがわかる。
しかし、自己撥液性を有しないインクの場合には、コート塗布時のインクが凹部より溢れてしまい、有効に埋設することはできなかった。
なお、本実施例では、乾燥促進のために赤外線ランプ2を用いたが、これは、本発明を何ら限定するものではなく、他の乾燥手段を用いても、あるいは自然乾燥を行っても有効なことはいうまでもない。また、初滴の塗布量、コート塗布の塗布量、塗布回数に関しても、本発明を限定するものではなく、適宜決定すればよい。
FIG. 1 is a diagram showing a measurement result of a sectional shape of a recess after defect correction using the method for partially forming a thin film according to Example 1 of the present invention. FIG. 2 is an ink having no self-liquid repellency as a comparative example. It is a figure which shows the recessed part cross-sectional shape measurement result after performing defect correction by the same process using FIG.
As is clear from the comparison between FIG. 1 and FIG. 2, when ink having self-repellent properties is used, the liquid repellent portion formed by applying the first droplet suppresses the overflow of the ink during coating application. It can be seen that the recesses are effectively embedded.
However, in the case of an ink that does not have self-liquid repellency, the ink at the time of coating application overflows from the recess and cannot be embedded effectively.
In this embodiment, the infrared lamp 2 is used for promoting drying, but this does not limit the present invention at all, and it is effective even if other drying means or natural drying is performed. Needless to say. Further, the present invention is not limited with respect to the initial drop application amount, the coat application amount, and the number of applications, and may be determined as appropriate.

次に、実施例2の薄膜の部分的形成方法は、実施例1の場合とは処理方法が異なる基板を用い、実施例1の場合よりも、絶縁膜のインクに対する親液性が弱い基板に対して、修正を行った。インクに対する親液性が弱い基板の場合、初滴を均一に溢れさせることが困難になるため、予め、凹部額縁の初滴の溢れる部位に相当する部分にUVレーザを表面を粗らす程度のパワーで照射し、額縁部のインクに対する親液性を向上させる処理を行った。その基板に対して、実施例1と同様の方法により、初滴の塗布、コート塗布を行った。比較例として、親液性向上の処理を行っていない場合についても、初滴の塗布、コート塗布を行った。   Next, the method for partially forming the thin film of Example 2 uses a substrate having a different processing method from that of Example 1, and makes the insulating film less lyophilic with respect to the ink than in Example 1. On the other hand, a correction was made. In the case of a substrate that is weakly lyophilic with respect to ink, it becomes difficult to uniformly overflow the initial droplets. Therefore, the surface of the concave frame is preliminarily roughened with a UV laser at a portion corresponding to the portion where the initial droplets overflow. Irradiation with power was performed to improve the lyophilicity of the frame portion with respect to the ink. By applying the same method as in Example 1 to the substrate, initial droplet application and coat application were performed. As a comparative example, even when the treatment for improving lyophilicity was not performed, the first drop was applied and the coat was applied.

その結果、親液性を向上させる処理を行ったものについては、凹部額縁部全周から均一に、初滴を溢れさせることができ、その後のコート塗布で凹部を埋設することができた。また、初滴の溢れにより形成された膜の膜厚を薄く形成することができた。
しかし、親液性を向上させる処理を行っていない場合には、先ず、初滴の塗布の際に、凹部額縁部全周から均一に、初滴を溢れさせることができず、また、コート塗布時には、初滴が溢れていない部分から液滴が溢れてしまった。更にその際、溢れにより形成された膜厚が、厚くなっていることが確認できた。
更に、親液性を向上させる処理を行っていない場合について、初滴の塗布量を8滴に増やした場合についても検討を行った。この場合、凹部額縁部全周より初滴を溢れさせることは可能になったが、溢れ部の膜厚が厚くなってしまった。
As a result, in the case where the treatment for improving the lyophilic property was performed, the initial droplets were allowed to overflow uniformly from the entire periphery of the concave frame portion, and the concave portions could be embedded by subsequent coating application. In addition, the film formed by the overflow of the first droplet could be formed thin.
However, when the treatment for improving the lyophilic property is not performed, first, when applying the first drop, the first drop cannot be uniformly overflowed from the entire periphery of the recessed frame portion, and the coating is applied. Sometimes the droplets overflowed from the part where the first droplets did not overflow. Further, at that time, it was confirmed that the film thickness formed by overflow was thick.
Further, in the case where the treatment for improving lyophilicity was not performed, the case where the coating amount of the first droplet was increased to 8 droplets was also examined. In this case, it was possible to overflow the first droplet from the entire periphery of the concave frame portion, but the film thickness of the overflow portion was increased.

それぞれの場合の凹部断面形状測定結果を図3、4、5に示す。
図3は実施例2の薄膜の部分的形成方法を用いて、欠陥修正を行った後の凹部断面形状測定結果を示す図、図4は比較例として親液性向上処理なしで、欠陥修正を行った後の凹部断面形状測定結果を示す図、図5は比較例として初滴量を増加して、欠陥修正を行った後の凹部断面形状測定結果を示す図である。
なお、実施例2では、紫外線(UV)照射による親液性向上処理について説明したが、溶媒塗布、表面粗化、界面活性剤塗布による方法においても、同様の効果が確認できた。
また、親液性の低下が、基板表面の汚れによるものについては、洗浄によっても親液性を向上できることを確認した。
また、実施例2では、親液性の弱い基板を用いた為、親液性の向上のための処理を行なうことが必須となったが、実施例1に用いた基板においても、表面の汚れ等により、親液性にバラツキがある場合には、親液性向上処理が有効なことはいうまでもない。
The results of measuring the recess cross-sectional shape in each case are shown in FIGS.
FIG. 3 is a diagram showing the measurement results of the cross-sectional shape of the recess after the defect correction using the method for partially forming the thin film of Example 2, and FIG. FIG. 5 is a diagram showing the measurement results of the recess cross-sectional shape after the defect was corrected by increasing the initial droplet amount as a comparative example.
In addition, in Example 2, although the lyophilic improvement process by ultraviolet-ray (UV) irradiation was demonstrated, the same effect was confirmed also in the method by solvent coating, surface roughening, and surfactant coating.
In addition, it was confirmed that the lyophilicity can be improved even by washing in the case where the lyophilicity is deteriorated due to contamination of the substrate surface.
In Example 2, since a weakly lyophilic substrate was used, it was indispensable to perform a treatment for improving lyophilicity. However, even in the substrate used in Example 1, surface contamination was observed. Needless to say, the lyophilic improvement treatment is effective when the lyophilicity varies.

実施例1、2で用いた自己撥液性を有するインクは、本発明者等が別の検討を行っていた際、インクに添加していたシラン系界面活性剤を通常量(1%未満)の10倍程度添加することにより偶然発見したものである。そこで、本発明者等は、インク本来の機能を損なうことなく、自己撥液性を発現することのできる添加剤の検討を行った。その結果、フッ素系界面活性剤においても通常添加量の5倍程度の添加により、同様の撥液性が得られることを発見した。しかし、その他検討を行ったフッ素系コート剤、シリコーン系コート剤、ペンタノール等の高級アルコールの添加では、インクの相分離、自己撥液性の不出現等、所望のインクを得ることはできなかった。   The ink having self-liquid repellency used in Examples 1 and 2 was a normal amount (less than 1%) of the silane-based surfactant added to the ink when the present inventors were conducting another study. It was discovered accidentally by adding about 10 times as much. Accordingly, the present inventors have studied an additive that can exhibit self-liquid repellency without impairing the original function of the ink. As a result, it has been found that the same liquid repellency can be obtained by adding about 5 times the normal addition amount of the fluorosurfactant. However, the addition of higher alcohols such as fluorine-based coating agents, silicone-based coating agents, and pentanol, which have been studied, cannot provide desired inks such as ink phase separation and the absence of self-liquid repellency. It was.

次に、自己撥液性の違いによる影響を調べた。先ず、上記フッ素系添加剤の添加量を調整して、自己撥液度が概ね接触角で10°、15°、20°、25°のインクを調合した。自己撥液度の確認は、そのインクをスピンコートにより塗布・乾燥した基板上に、再度1滴垂らし、その接触角を接触角計で測定した。測定精度、読み取り誤差の影響で、上記接触角は±5°程度の誤差を含んでいると考えられるが、大小関係は入れ替わっていないことは別の方法で確認した。これら撥液度の異なるインクを用いて、実施例1と同様の方法で修正を行なった。   Next, the influence of the difference in self-liquid repellency was investigated. First, the amount of the fluorine-based additive added was adjusted to prepare inks having self-repellency of approximately 10 °, 15 °, 20 °, and 25 ° in terms of contact angles. To check the self-repellency, one drop of the ink was again dropped on the substrate coated and dried by spin coating, and the contact angle was measured with a contact angle meter. The contact angle is considered to include an error of about ± 5 ° due to the influence of measurement accuracy and reading error, but it was confirmed by another method that the magnitude relationship was not changed. Correction was performed in the same manner as in Example 1 using these inks having different liquid repellency.

図6は自己撥液性の異なるインクを用いて修正を行った後の凹部修正形状の相違を示す図で、図6(A)は接触角が10°のインク、図6(B)は接触角が15°のインク、図6(C)は接触角が20°のインク、図6(D)は接触角が25°のインクを用いた場合の例である。
図6(A)〜(D)から明らかなように、接触角が10°のインクでは、初滴の撥液性が不十分で、コート塗布時の液滴の溢れを抑制できていないが、15°以上のインクでは、初滴の撥液性により、コート塗布時の液滴の溢れを抑制できていることがわかる。
6A and 6B are diagrams showing the difference in the shape of the recessed portion after correction using inks having different self-liquid repellency. FIG. 6A shows ink having a contact angle of 10 °, and FIG. 6B shows contact. FIG. 6C shows an example in which an ink having an angle of 15 °, FIG. 6C shows an example in which an ink having a contact angle of 20 °, and FIG. 6D shows an example in which an ink having a contact angle of 25 ° is used.
As apparent from FIGS. 6A to 6D, the ink having a contact angle of 10 ° has insufficient liquid repellency of the initial droplets, and the overflow of the droplets during coating application cannot be suppressed. It can be seen that with an ink of 15 ° or more, the liquid repellency of the first droplet can suppress the overflow of the droplet during coating application.

実施例1の薄膜の部分的形成方法を用いて、欠陥修正を行った後の凹部断面形状測定結果を示す図である。It is a figure which shows the recessed part cross-sectional shape measurement result after performing defect correction using the partial formation method of the thin film of Example 1. FIG. 比較例として自己撥液性を有しないインクを用いて、同様のプロセスにより修正を行った後の凹部断面形状測定結果を示す図である。It is a figure which shows the recessed part cross-sectional shape measurement result after correcting by the same process using the ink which does not have self-liquid repellency as a comparative example. 実施例2の薄膜の部分的形成方法を用いて、欠陥修正を行った後の凹部断面形状測定結果を示す図である。It is a figure which shows the recessed part cross-sectional shape measurement result after performing defect correction using the partial formation method of the thin film of Example 2. FIG. 比較例として親液性向上処理なしで、欠陥修正を行った後の凹部断面形状測定結果を示す図である。It is a figure which shows a recessed part cross-sectional shape measurement result after performing a defect correction, without a lyophilic improvement process as a comparative example. 比較例として初滴量を増加して、欠陥修正を行った後の凹部断面形状測定結果を示す図である。It is a figure which shows the recessed part cross-sectional shape measurement result after increasing initial drop amount as a comparative example, and performing defect correction. 自己撥液性の異なるインクを用いて修正を行った後の凹部断面形状の相違を示す図で、図6(A)は接触角が10°のインク、図6(B)は接触角が15°のインク、図6(C)は接触角が20°のインク、図6(D)は接触角が25°のインクを用いた場合の例である。FIGS. 6A and 6B are diagrams showing the difference in the cross-sectional shape of the recesses after correction using inks having different self-liquid repellency. FIG. 6A shows ink having a contact angle of 10 °, and FIG. FIG. 6C shows an example in which an ink having a contact angle of 20 ° is used, and FIG. 6D is an example in which an ink having a contact angle of 25 ° is used. TFT液晶パネルの画素の構造を模式的に示す図で、図7(A)は平面図、図7(B)は図7(A)のX−X断面図である。7A and 7B are diagrams schematically illustrating the structure of a pixel of a TFT liquid crystal panel, in which FIG. 7A is a plan view and FIG. 7B is a cross-sectional view taken along line XX in FIG. 異物欠陥を有する基板を模式的に示す断面図である。It is sectional drawing which shows the board | substrate which has a foreign material defect typically. 図8に示す異物欠陥を除去する方法を工程順に示す図である。It is a figure which shows the method of removing the foreign material defect shown in FIG. 本発明の薄膜の部分的形成方法における修正プロセスを工程順に示す図である。It is a figure which shows the correction process in the partial formation method of the thin film of this invention in order of a process.

符号の説明Explanation of symbols

1…インクジェットヘッド、2…赤外線ランプ、3…紫外線レーザ装置、4…ガラス基板、5…絶縁層、6…異物、7…凹部、8…初滴の塗布部、9…コート塗布部、10…ゲート配線、11…ソース配線、12…半導体層、13…透明電極、14…液晶。 DESCRIPTION OF SYMBOLS 1 ... Inkjet head, 2 ... Infrared lamp, 3 ... Ultraviolet laser apparatus, 4 ... Glass substrate, 5 ... Insulating layer, 6 ... Foreign material, 7 ... Recessed part, 8 ... First drop application part, 9 ... Coat application part, 10 ... Gate wiring, 11 ... source wiring, 12 ... semiconductor layer, 13 ... transparent electrode, 14 ... liquid crystal.

Claims (5)

インクジェットを用いて、薄膜を形成する材料を含むインクを塗布し、凹部に選択的に薄膜を形成する薄膜の部分的形成方法において、前記インクを塗布して形成した薄膜の塗布する前記インクに対する接触角が15°以上である前記インクを用いて、前記凹部に溢れるようにインクジェットにより塗布する工程と、その後必要な膜厚に相当する前記インクをインクジェットにより1回あるいは数回に分けて塗布する工程を含むことを特徴とする薄膜の部分的形成方法。   In the method for partially forming a thin film, in which an ink containing a material for forming a thin film is applied using an ink jet, and the thin film is selectively formed in the concave portion, the thin film formed by applying the ink is contacted with the ink applied A step of applying by ink jet using the ink having an angle of 15 ° or more so as to overflow the concave portion, and a step of applying the ink corresponding to a required film thickness once or several times by ink jet A method for partially forming a thin film, comprising: 前記凹部に溢れるように前記インクを塗布した後、少なくとも溢れた部分の前記インクを乾燥させる工程を含むことを特徴とする請求項1記載の薄膜の部分的形成方法。   2. The method for partially forming a thin film according to claim 1, further comprising a step of drying at least the overflowed portion of the ink after applying the ink so as to overflow the recess. 前記凹部に溢れるように前記インクを塗布する前に、少なくとも前記凹部の周囲に塗布する前記インクに対する親液性を向上させる処理工程を含むことを特徴とする請求項1または2記載の薄膜の部分的形成方法。   The thin film portion according to claim 1, further comprising a treatment step of improving lyophilicity with respect to the ink applied to at least the periphery of the recess before applying the ink so as to overflow the recess. Forming method. 前記親液性を向上させる処理工程は、紫外線照射、溶媒塗布、表面粗化、界面活性剤塗布、洗浄の何れかの処理を行うことを特徴とする請求項3記載の薄膜の部分的形成方法。   4. The method for partially forming a thin film according to claim 3, wherein the treatment step for improving the lyophilic property includes any one of ultraviolet irradiation, solvent coating, surface roughening, surfactant coating, and washing. . 前記インクは、フッ素系あるいはシラン系の界面活性剤を添加することにより、前記インクにより形成した薄膜の前記インクに対する接触角は15°以上とすることを特徴とする請求項1乃至4いずれか記載の薄膜の部分的形成方法。   5. The ink according to claim 1, wherein a contact angle of the thin film formed of the ink with respect to the ink is set to 15 ° or more by adding a fluorine-based or silane-based surfactant. Method for partially forming a thin film.
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WO2015199166A1 (en) * 2014-06-25 2015-12-30 株式会社ミマキエンジニアリング Inkjet printer, printing method, and printing system
JP2016007811A (en) * 2014-06-25 2016-01-18 株式会社ミマキエンジニアリング Ink jet printer, print method and print system
CN106470842A (en) * 2014-06-25 2017-03-01 株式会社御牧工程 Ink-jet printer, Method of printing and print system
US9884489B2 (en) 2014-06-25 2018-02-06 Mimaki Engineering Co., Ltd. Inkjet printer, printing method, and printing system

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