JP2005338076A - 偏光操作レトロリフレクタを使用するシステム - Google Patents

偏光操作レトロリフレクタを使用するシステム Download PDF

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Publication number
JP2005338076A
JP2005338076A JP2005144359A JP2005144359A JP2005338076A JP 2005338076 A JP2005338076 A JP 2005338076A JP 2005144359 A JP2005144359 A JP 2005144359A JP 2005144359 A JP2005144359 A JP 2005144359A JP 2005338076 A JP2005338076 A JP 2005338076A
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JP
Japan
Prior art keywords
polarization
retroreflector
reflected
path
reflector
Prior art date
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Pending
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JP2005144359A
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English (en)
Japanese (ja)
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JP2005338076A5 (https=
Inventor
Miao Zhu
ミャオ・ズー
John J Bockman
ジョン・ジェイ・ボックマン
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2005338076A publication Critical patent/JP2005338076A/ja
Publication of JP2005338076A5 publication Critical patent/JP2005338076A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02019—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different points on same face of object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02045—Interferometers characterised by particular imaging or detection techniques using the Doppler effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02056—Passive reduction of errors
    • G01B9/02059—Reducing effect of parasitic reflections, e.g. cyclic errors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/15—Cat eye, i.e. reflection always parallel to incoming beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Optical Elements Other Than Lenses (AREA)
JP2005144359A 2004-05-28 2005-05-17 偏光操作レトロリフレクタを使用するシステム Pending JP2005338076A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/856,204 US7193721B2 (en) 2004-05-28 2004-05-28 Systems using polarization-manipulating retroreflectors

Publications (2)

Publication Number Publication Date
JP2005338076A true JP2005338076A (ja) 2005-12-08
JP2005338076A5 JP2005338076A5 (https=) 2008-07-03

Family

ID=35424830

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005144359A Pending JP2005338076A (ja) 2004-05-28 2005-05-17 偏光操作レトロリフレクタを使用するシステム

Country Status (4)

Country Link
US (1) US7193721B2 (https=)
JP (1) JP2005338076A (https=)
DE (1) DE102005009064B4 (https=)
NL (1) NL1029115C2 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009524064A (ja) * 2006-01-23 2009-06-25 ザイゴ コーポレーション 物体をモニタする干渉計システム

Families Citing this family (56)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9867530B2 (en) 2006-08-14 2018-01-16 Volcano Corporation Telescopic side port catheter device with imaging system and method for accessing side branch occlusions
WO2008091961A2 (en) * 2007-01-23 2008-07-31 Volcano Corporation Optical coherence tomography implementation
US9622706B2 (en) 2007-07-12 2017-04-18 Volcano Corporation Catheter for in vivo imaging
US9596993B2 (en) 2007-07-12 2017-03-21 Volcano Corporation Automatic calibration systems and methods of use
US10219780B2 (en) 2007-07-12 2019-03-05 Volcano Corporation OCT-IVUS catheter for concurrent luminal imaging
US11141063B2 (en) 2010-12-23 2021-10-12 Philips Image Guided Therapy Corporation Integrated system architectures and methods of use
CN102564613B (zh) * 2010-12-31 2014-05-21 上海微电子装备有限公司 一种波长跟踪器
US11040140B2 (en) 2010-12-31 2021-06-22 Philips Image Guided Therapy Corporation Deep vein thrombosis therapeutic methods
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US10070827B2 (en) 2012-10-05 2018-09-11 Volcano Corporation Automatic image playback
US9292918B2 (en) 2012-10-05 2016-03-22 Volcano Corporation Methods and systems for transforming luminal images
US10568586B2 (en) 2012-10-05 2020-02-25 Volcano Corporation Systems for indicating parameters in an imaging data set and methods of use
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US20140100454A1 (en) 2012-10-05 2014-04-10 Volcano Corporation Methods and systems for establishing parameters for three-dimensional imaging
US9858668B2 (en) 2012-10-05 2018-01-02 Volcano Corporation Guidewire artifact removal in images
US9367965B2 (en) 2012-10-05 2016-06-14 Volcano Corporation Systems and methods for generating images of tissue
US9307926B2 (en) 2012-10-05 2016-04-12 Volcano Corporation Automatic stent detection
US9324141B2 (en) 2012-10-05 2016-04-26 Volcano Corporation Removal of A-scan streaking artifact
US9286673B2 (en) 2012-10-05 2016-03-15 Volcano Corporation Systems for correcting distortions in a medical image and methods of use thereof
US11272845B2 (en) 2012-10-05 2022-03-15 Philips Image Guided Therapy Corporation System and method for instant and automatic border detection
US9840734B2 (en) 2012-10-22 2017-12-12 Raindance Technologies, Inc. Methods for analyzing DNA
WO2014093374A1 (en) 2012-12-13 2014-06-19 Volcano Corporation Devices, systems, and methods for targeted cannulation
US9709379B2 (en) 2012-12-20 2017-07-18 Volcano Corporation Optical coherence tomography system that is reconfigurable between different imaging modes
WO2014113188A2 (en) 2012-12-20 2014-07-24 Jeremy Stigall Locating intravascular images
US11406498B2 (en) 2012-12-20 2022-08-09 Philips Image Guided Therapy Corporation Implant delivery system and implants
US10595820B2 (en) 2012-12-20 2020-03-24 Philips Image Guided Therapy Corporation Smooth transition catheters
US10939826B2 (en) 2012-12-20 2021-03-09 Philips Image Guided Therapy Corporation Aspirating and removing biological material
US10942022B2 (en) 2012-12-20 2021-03-09 Philips Image Guided Therapy Corporation Manual calibration of imaging system
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WO2014100530A1 (en) 2012-12-21 2014-06-26 Whiseant Chester System and method for catheter steering and operation
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WO2014099760A1 (en) 2012-12-21 2014-06-26 Mai Jerome Ultrasound imaging with variable line density
US9612105B2 (en) 2012-12-21 2017-04-04 Volcano Corporation Polarization sensitive optical coherence tomography system
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US9486143B2 (en) 2012-12-21 2016-11-08 Volcano Corporation Intravascular forward imaging device
US10058284B2 (en) 2012-12-21 2018-08-28 Volcano Corporation Simultaneous imaging, monitoring, and therapy
US10226597B2 (en) 2013-03-07 2019-03-12 Volcano Corporation Guidewire with centering mechanism
WO2014138555A1 (en) 2013-03-07 2014-09-12 Bernhard Sturm Multimodal segmentation in intravascular images
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US20140276923A1 (en) 2013-03-12 2014-09-18 Volcano Corporation Vibrating catheter and methods of use
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US11026591B2 (en) 2013-03-13 2021-06-08 Philips Image Guided Therapy Corporation Intravascular pressure sensor calibration
US10219887B2 (en) 2013-03-14 2019-03-05 Volcano Corporation Filters with echogenic characteristics
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US9874435B2 (en) * 2014-05-22 2018-01-23 Samsung Electronics Co., Ltd. Measuring system and measuring method
CN119717098A (zh) 2017-02-20 2025-03-28 3M创新有限公司 感测系统
US10041781B1 (en) * 2017-06-14 2018-08-07 Southern Research Institute Multi-pass optical system to improve resolution of interferometers
US20190113329A1 (en) 2017-10-12 2019-04-18 Keysight Technologies, Inc. Systems and methods for cyclic error correction in a heterodyne interferometer
CN113740946A (zh) * 2021-08-30 2021-12-03 中国科学院上海应用物理研究所 一种偏振保持反射镜组
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CN117559219A (zh) * 2022-08-05 2024-02-13 青岛海信宽带多媒体技术有限公司 一种激光器及光模块

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60233502A (ja) * 1984-04-27 1985-11-20 Yokogawa Hewlett Packard Ltd 干渉計
JPS63228003A (ja) * 1987-03-02 1988-09-22 Yokogawa Hewlett Packard Ltd 干渉計
JPH01206283A (ja) * 1988-02-13 1989-08-18 Brother Ind Ltd 光ヘテロダイン測定装置
US4883357A (en) * 1989-03-01 1989-11-28 Zygo Corporation Dual high stability interferometer
JPH0587519A (ja) * 1991-09-25 1993-04-06 Hide Hosoe 差動型干渉プリズム
US20020001087A1 (en) * 2000-05-17 2002-01-03 Hill Henry Allen Apparatus and method for interferometric measurements of angular orientation and distance to a plane mirror object

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4930894A (en) * 1984-04-27 1990-06-05 Hewlett-Packard Company Minimum deadpath interferometer and dilatometer
US4693605A (en) * 1985-12-19 1987-09-15 Zygo Corporation Differential plane mirror interferometer
US4714339B2 (en) * 1986-02-28 2000-05-23 Us Commerce Three and five axis laser tracking systems
JP2808136B2 (ja) * 1989-06-07 1998-10-08 キヤノン株式会社 測長方法及び装置
AT397307B (de) * 1990-03-02 1994-03-25 Tabarelli Werner Interferometer insbesondere zur längenmessung
US5408318A (en) * 1993-08-02 1995-04-18 Nearfield Systems Incorporated Wide range straightness measuring stem using a polarized multiplexed interferometer and centered shift measurement of beam polarization components
US6198574B1 (en) * 1999-08-27 2001-03-06 Zygo Corporation Polarization preserving optical systems
US6201609B1 (en) * 1999-08-27 2001-03-13 Zygo Corporation Interferometers utilizing polarization preserving optical systems
US6462827B1 (en) * 2001-04-30 2002-10-08 Chromaplex, Inc. Phase-based wavelength measurement apparatus
US7224466B2 (en) * 2003-02-05 2007-05-29 Agilent Technologies, Inc. Compact multi-axis interferometer
US7075655B2 (en) * 2003-09-23 2006-07-11 Agilent Technologies, Inc. Alignment self check for a wavelength meter

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60233502A (ja) * 1984-04-27 1985-11-20 Yokogawa Hewlett Packard Ltd 干渉計
JPS63228003A (ja) * 1987-03-02 1988-09-22 Yokogawa Hewlett Packard Ltd 干渉計
JPH01206283A (ja) * 1988-02-13 1989-08-18 Brother Ind Ltd 光ヘテロダイン測定装置
US4883357A (en) * 1989-03-01 1989-11-28 Zygo Corporation Dual high stability interferometer
JPH0587519A (ja) * 1991-09-25 1993-04-06 Hide Hosoe 差動型干渉プリズム
US20020001087A1 (en) * 2000-05-17 2002-01-03 Hill Henry Allen Apparatus and method for interferometric measurements of angular orientation and distance to a plane mirror object

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009524064A (ja) * 2006-01-23 2009-06-25 ザイゴ コーポレーション 物体をモニタする干渉計システム

Also Published As

Publication number Publication date
NL1029115C2 (nl) 2007-06-01
US20050264823A1 (en) 2005-12-01
US7193721B2 (en) 2007-03-20
DE102005009064B4 (de) 2008-06-26
DE102005009064A1 (de) 2005-12-22
NL1029115A1 (nl) 2005-11-30

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