JP2005315615A - Test card - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a test card equipped with a probe mounting tool capable of adjusting the relative position distance between a probe and a measurement waiting element. <P>SOLUTION: This test card has a circuit board, a fixed platform fixed on the circuit board, a fine-adjustment platform mounted on the platform, the probe mounting tool mounted on the fine-adjustment platform, and at least one probe mounted on the probe mounting tool. The fine-adjustment platform is equipped with a fixed part, a movable part, and a driving mechanism for connecting the fixed part to the movable part, and the fixed part is fixed on the fixed platform, and the probe mounting tool is mounted on the movable part. The relative position between the probe and the measurement waiting element can be adjusted by the driving mechanism. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a test card, and more particularly to a test card capable of adjusting a relative position between a probe and a measurement waiting element.

  The test card is manufactured based on the specifications of the element to be measured, for example, the number of pins (Pin count), the pitch (Pitch), the size (Pad size), and the set height of the measuring instrument base (probe depth). When measuring the electrical characteristics of the element to be measured, the test card probe transmits a test signal from the measuring instrument base to the element to be measured, and returns the measured electric characteristic parameter to the measuring instrument base. Use for analysis.

  FIG. 1 is a cross-sectional view of a conventional test card 10. As shown in FIG. 1, this test card 10 electrically connects a circuit board 12, a support 14 attached on the circuit board 12, a plurality of probes 16 fixed on the support 14, the probes 16 and the conductors 26. It has the conductive hole 20 to connect. In order to prevent the horizontal position of the probe 16 from shifting due to an increase in use time, the probe 16 is fixed to the support 14 with an epoxy resin 24. When measuring, the test card 10 is placed on the measuring instrument base (not shown in FIG. 1), and its probe 16 is in electrical contact with the signal contact 38 of the element 30 to be measured to measure the electrical characteristic parameters. A signal can be transmitted.

  Such conventional test cards have the following disadvantages.

  1. Test cards can only be applied to specific measurement-waiting elements. A conventional test card is manufactured in conformity with the specifications of a measurement waiting element and a measuring instrument base, and its probe is fixed on a circuit board by an epoxy resin. For this reason, once a test card is completed, it can be applied only to a measurement waiting element of the specific standard. If the arrangement of probes for the elements waiting for measurement, the pitch, etc. change, a test card that conforms to the new standard must be recreated, resulting in a significant increase in measurement costs.

  2. It is difficult to adjust the position of the probe. The position of the probe of the conventional test card is the position fixed on the circuit board with epoxy resin after adjustment by an engineer of the test card manufacturer. If the horizontal position of the probe is misaligned during transportation or use, the user must return the test card to the manufacturer and correct the position. There is a problem of lack of flexibility to adjust.

  3. If one probe is missing, the entire card becomes unusable. In the conventional test card, the probe is fixed at the designed position on the test card substrate by epoxy resin. If one or several of the probes are missing, the entire card can no longer be used and a new test card can only be created. Since the replacement of the probe greatly affects the accuracy of the probe position in the entire test card, there is a problem that the accuracy of the measurement result is greatly affected.

  4). Only a single function can be measured, and future application needs cannot be met. A conventional test card can measure only a single function of the element to be measured, such as for measuring DC electrical characteristics or for measuring AC electrical characteristics. In order to accommodate future radio frequency elements, test card manufacturers have attempted to install a radio frequency probe and a DC probe on the same test card. It was fixed on a test card with an epoxy resin. However, due to the different characteristics of the materials of the radio frequency probe, DC probe and epoxy resin, this test card still cannot be adapted to the frequency required for the measurement of the radio frequency probe element. Therefore, the measurement of the electrical characteristics of the radio frequency element is still performed separately for the measurement of the DC parameter and the measurement of the radio frequency parameter, and there is a problem that the measurement time is increased 2 to 3 times.

  The present invention has been made in view of the above circumstances, and it is a first object of the present invention to provide a test card capable of adjusting the relative distance between a probe and a measurement waiting element. The second object of the present invention is to provide a multifunctional test card capable of simultaneously measuring the DC electrical characteristics.

  The first test card of the present invention includes a circuit board, a fixed platform fixed on the circuit board, a fine adjustment platform mounted on the fixed platform, and a probe mounting device mounted on the fine adjustment platform. And at least one probe mounted on the probe mounting tool. The fine adjustment platform includes a fixed portion, a movable portion, and a drive mechanism that connects the fixed portion and the movable portion. The fixed part is fixed on the fixed platform, and the probe mounting tool is attached to the movable part. The relative position between the probe and the measurement waiting element can be adjusted by the drive mechanism. Further, a shielding cover may be provided on the circuit board of the test card of the present invention, and the measuring device is configured to cover the electronic components attached on the circuit board by the shielding cover and to perform a shielding action. The noise generated from the table itself can be cut reliably, and the measurement accuracy can be ensured.

  The second test card of the present invention comprises a circuit board, a fixed platform fixed on one surface of the circuit board, a fine adjustment platform mounted on the platform, and a probe mounted on the fine adjustment platform. A mounting tool, at least one first probe mounted on the probe mounting tool, a support fixed on the other surface of the circuit board, and at least one DC probe fixed to the support. Have. In the DC probe, the other end different from one end used to measure the element to be measured passes through the circuit board and extends to the one surface of the circuit board, and further, an oscillation phenomenon occurs during measurement. In order to prevent this, it is wrapped with ferrite beads (Ferrite-Bead). By using a radio frequency probe as the first probe, the first probe and the DC probe, and the second test card of the present invention, the radio frequency electrical characteristic and the DC electrical characteristic of the element waiting for measurement are simultaneously measured. Can be measured.

  The test card according to the present invention has the following advantages over the conventional test card.

  1. The position of the pin of the radio frequency probe is adjustable. The test card according to the present invention allows the user to finely adjust the position level of the radio frequency probe pin by using the fine adjustment platform, and to match the arrangement of the elements to be measured, the pitch, and the standard of the measuring instrument. Because adjustments can be made, it is possible to cope with changes in the specifications of the element waiting for measurement.

  2. Because it can measure multiple functions, it matches industrial needs. In the test card of the present invention, the radio frequency probe is mounted by a precise fine adjustment platform, and the DC probe is mounted by a traditional fixing method. Electrical characteristics can be measured simultaneously.

  3. The test card radio frequency probe is replaceable. Since this radio frequency probe is attached to the probe mounting device in a replaceable manner, it can be directly removed and replaced with a new radio frequency probe when it becomes defective and cannot be used. In addition, in order to meet the measurement needs of different types of measurement-waiting elements such as optical communication elements, different types of measurement-waiting elements can be measured by replacing them with different types of probes (for example, optical fiber probes).

  4). The probe mounting method is stable. The test card of the present invention employs the multi-point alignment and multi-point fixing method, so that the fine adjustment platform, the probe mounting tool, and the high-frequency probe can be accurately and stably mounted on the circuit board.

  5). External noise can be blocked. By providing a shielding cover on the test circuit board of the present invention, the electronic components on the circuit board are enclosed in the cover, and by making a shielding effect, noise generated from the measuring instrument base and the external environment is reduced. It can be reliably shut off.

  6). Generation of vibration phenomenon can be prevented. Since the DC probe of the test card is covered with ferrite beads, it can be used for measuring DC electrical characteristics and can prevent the occurrence of vibration phenomenon during measurement.

  FIG. 2 is a three-dimensional front view of the test card 50 of the present invention. As shown in FIG. 2, the test card 50 is attached to the circuit board 60, the fixed platform 70 fixed to the first surface 61 </ b> A of the circuit board 60, the fine adjustment platform 80 attached to the platform 70, and the fine adjustment platform 80. Probe mounting tool 90 and at least one radio frequency probe 92 attached to the probe mounting tool 90. An opening 62 is provided in the circuit board 60, and the radio frequency probe 90 can be in electrical contact with a measurement awaiting element (not shown in FIG. 2) via the opening 62.

  The fixed platform 70 is provided with a plurality of alignment holes 72 and a plurality of fixed holes 74. The alignment hole 72 is used to align the relative positions of the fixed platform 70 and the circuit board 60. A fixing device (for example, a screw or a rivet) can fix the fixing platform 70 on the circuit board 60 by the fixing hole 74. This test card uses a multi-point alignment and fixed design of the fixed platform 70, so that the fine adjustment platform 80, the probe, the mounting tool 90, and the radio frequency probe 92 are stably and accurately mounted on the circuit board 60. It is possible to prevent the relative positions of 92 and the measurement waiting element from easily shifting even when an external force is applied.

  The fine adjustment platform 80 includes a fixed portion 82, a movable portion 84, and a drive mechanism 86 that connects the fixed portion 82 and the movable portion 84. The fixed portion 82 is fixed to the fixed platform 70, the probe mounting tool 90 is attached to the movable portion 84, and the relative position between the radio frequency probe 92 and the measurement waiting element is adjusted by the drive mechanism 86. be able to. The drive mechanism 86 includes a first drive unit 85A and a second drive unit 85B. The first drive unit 85A is used to adjust the vertical position of the radio frequency probe 92, and the second drive unit 85B is a diameter of the radio frequency probe 92. Used to adjust the directional position. The driving mechanism 86 shown in FIG. 2 can adjust the vertical position and the radial position of the radio frequency probe. However, if it is an engineer in this field, the driving mechanism 86 can be driven one-dimensionally, two-dimensionally or three-dimensionally depending on needs. It can be easily understood that the drive can be designed and further provided with an angle adjustment function. .

  In precise electrical characteristic measurement (especially high-frequency electrical characteristics), it is necessary to eliminate noise caused by the external environment outside the measurement system. In the test card 50 of the present invention, a first shielding cover 64 for preventing noise is further provided on the first surface 61A of the circuit board 60. The first shielding cover 64 includes a component (for example, a high-frequency probe) attached to the first surface 61A of the test card 50 in its interior, and by making a shielding effect, noise generated from the measuring instrument itself or from the environment. Shut off reliably to ensure measurement accuracy.

  FIG. 3 is a three-dimensional rear view of the test card 50 of the present invention. As shown in FIG. 3, the test card 50 further includes a support 110 attached to a second surface 61 </ b> B attached to the circuit board 60 and at least one DC probe 112 fixed to the support 110. The DC probe 112 is fixed on the support 110 with an epoxy resin 114. The DC probe 112 of the test card 50 is encased in the ferrite bead 120, so that the DC probe 112 can be used for measuring DC electrical characteristics, and the occurrence of a vibration phenomenon can be prevented during measurement. An end of the DC probe 112 different from the one used for measuring the element to be measured passes through the circuit board 50 and extends to the first surface of the circuit board 50. For this reason, the ferrite bead 120 can be attached so as to be close to the tip of the pin of the DC probe 112, and the occurrence of a vibration phenomenon can be prevented more effectively. The radio frequency probe 92 and the DC probe 112 allow the test card 50 to simultaneously measure the radio frequency electrical characteristics and the DC electrical characteristics of the element waiting for measurement.

  In order to prevent noise, a second shielding cover 124 may be attached to the second surface 61B of the circuit board 60 of the test card 50. The second shielding cover 124 encloses all the components (for example, DC probes) attached to the second surface 61B of the test card 50, thereby generating a shielding effect, thereby resulting from the measuring instrument itself or the environment. Noise can be cut off reliably and measurement accuracy can be ensured.

  The present invention has the following advantages over the prior art.

  1. The position of the pin of the radio frequency probe is adjustable. In the present invention, the radio frequency probe 92 is mounted on the probe mounting device 90, and the relative position between the radio frequency probe 92 and the element to be measured is adjusted by the fine adjustment platform 80. In addition to fine adjustment of the position level, it can also be adjusted according to the specifications of the measurement waiting element arrangement, pitch, and measuring instrument base, so that the test card 50 of the present invention can be applied to measurement waiting elements of other standards. It is.

  2. Multifunctional measurement is possible, and it matches the industrial needs. In the present invention, the radio frequency probe 92 and the DC probe 112 are individually fixed to ensure that the radio frequency probe 92 does not affect the electrical characteristics due to the difference in material between the epoxy resin 114 and the DC probe 112. Since the radio frequency probe 92 is attached by a precision fine-tuning platform 80, and the DC probe 112 is attached by a traditional fixing method to prevent the influence of the difference in material, the test card 50 of the present invention is waiting for measurement. The DC electrical characteristics and radio frequency electrical characteristics of the element can be measured simultaneously, and the measurement time can be shortened.

  3. The test card radio frequency probe is replaceable. Since the radio frequency probe 92 is attached to the probe mounting device 90 in a replaceable manner, even if one probe is broken, it is only necessary to replace the broken probe, which is different from the fact that the entire test card cannot be used. Further, the test card 50 of the present invention can be applied to the measurement of different measurement waiting elements by exchanging with a probe having a different function (for example, an optical fiber probe).

  4). Stable probe mounting method. In order to stably attach the radio frequency probe 92 to a specific position of the test card 50, the present invention employs a multi-point alignment and multi-point fixing method, thereby enabling fine adjustment platform 80, probe mounting tool 90, radio frequency probe. 92 is correctly and stably mounted on the circuit board 50, thereby ensuring that the probe pin position does not change under the influence of external forces.

  5). Block external noise. In the present invention, the shielding covers 64 and 124 attached on the circuit board 50 enclose the electronic elements on the circuit board in the interior thereof to form a shielding effect, thereby preventing noise generated by the measuring instrument itself. Shut off reliably to ensure measurement accuracy.

  6). Prevent the occurrence of vibration phenomenon. The DC probe 112 of the test card is encased in ferrite beads 120, so that the DC probe 112 can be used for measuring DC electrical characteristics and further prevents the occurrence of vibration phenomena during measurement. The other end of the measurement-waiting element that faces the DC probe 120 passes through the circuit board 50 and further extends to the first surface 51A of the circuit board 50, so that the ferrite bead 120 is attached to the tip portion of the DC probe 112. It is possible to attach the filter to the main body so that the vibration phenomenon occurs more effectively.

  Although the technical contents and technical features of the present invention are as disclosed above, those skilled in the art will be able to make various alternatives and modifications based on the teachings and disclosure of the present invention without departing from the spirit of the present invention. Is possible. Accordingly, the scope of protection of the present invention should not be limited to that disclosed in the examples, but should include various alternatives and modifications that do not depart from the spirit of the invention.

It is sectional drawing of the conventional test card. It is a three-dimensional front view of the test card of the present invention. It is a three-dimensional rear view of the test card of the present invention.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 Test card 12 Circuit board 14 Support body 16 Probe 20 Conductive hole 22 Opening 24 Epoxy resin 26 Conductor 30 Measurement waiting element 38 Signal contact 50 Test card 60 Circuit board 61A 1st surface 61B 2nd surface 62 Opening 64 1st shielding cover 70 Fixed platform 72 Alignment hole 74 Fixed hole 80 Fine adjustment platform 82 Fixed part 84 Movable part 85A First drive unit 85B Second drive unit 86 Drive mechanism 90 Probe 92 Radio frequency probe 110 Support body 112 DC probe 114 Epoxy resin 120 Ferrite bead 124 Second shielding cover

Claims (14)

A circuit board;
A fixed platform fixed on the circuit board;
A fine adjustment platform mounted on the fixed platform;
A probe mount mounted on the fine adjustment platform;
A test card comprising: at least one probe mounted on the probe mounting tool. The fine tuning platform is
A fixed portion fixed on the fixed platform;
A movable part for placing the probe placement tool;
The drive mechanism for connecting the said fixed part and the said movable part, and adjusting the relative position of the said probe and a measurement waiting element is characterized by the above-mentioned. Test card.   2. The test card according to claim 1, wherein the fixed platform has a plurality of alignment holes for aligning the fixed platform on the circuit board.   2. The test card according to claim 1, wherein the fixed platform has a plurality of fixing holes for tightly fixing the fixed platform on the circuit board.   The test card according to claim 1, wherein a shielding cover for preventing noise is attached to the circuit board.   The test card according to claim 1, wherein the probe is attached to the probe mounting tool in a replaceable manner.   The test card according to claim 1, wherein the circuit board is provided with an opening for electrically contacting the probe and the measurement waiting element.   2. The test card according to claim 1, wherein the probe is a high-frequency probe, an optical fiber probe, or another type of probe. A circuit board;
At least one first probe;
A fine adjustment platform mounted on the circuit board for adjusting the relative position of the first probe and the measurement awaiting element;
A support attached to a surface of the circuit board different from the surface on which the fine adjustment platform is provided;
A test card comprising at least one DC probe fixed on the support.   10. The test card according to claim 9, wherein one end of the DC probe is used for measurement of a measurement waiting element, and the other end passes through the circuit board and reaches the other surface of the circuit board. .   The test card according to claim 9, wherein the DC probe is covered with a ferrite bead to prevent the occurrence of a vibration phenomenon.   The test card according to claim 9, wherein a shielding cover for preventing noise is attached on the circuit board.   10. The test card of claim 9, wherein the first probe is a fiber optic probe, a radio frequency probe, or other type of probe.   The test card according to claim 9, wherein the circuit board is provided with an opening for electrically contacting the first probe and the measurement waiting element.

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