JP2005308512A - スペクトラム処理方法および該方法を用いる測定装置 - Google Patents

スペクトラム処理方法および該方法を用いる測定装置 Download PDF

Info

Publication number
JP2005308512A
JP2005308512A JP2004124969A JP2004124969A JP2005308512A JP 2005308512 A JP2005308512 A JP 2005308512A JP 2004124969 A JP2004124969 A JP 2004124969A JP 2004124969 A JP2004124969 A JP 2004124969A JP 2005308512 A JP2005308512 A JP 2005308512A
Authority
JP
Japan
Prior art keywords
frequency
signal
spectrum
phase
phase noise
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004124969A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005308512A5 (enExample
Inventor
Kazuhiko Ninomiya
和彦 二宮
Yoshiyuki Yanagimoto
吉之 柳本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Priority to JP2004124969A priority Critical patent/JP2005308512A/ja
Priority to US11/102,409 priority patent/US7317999B2/en
Priority to DE102005017545A priority patent/DE102005017545A1/de
Publication of JP2005308512A publication Critical patent/JP2005308512A/ja
Publication of JP2005308512A5 publication Critical patent/JP2005308512A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/165—Spectrum analysis; Fourier analysis using filters
    • G01R23/167—Spectrum analysis; Fourier analysis using filters with digital filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/18—Spectrum analysis; Fourier analysis with provision for recording frequency spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/20—Measurement of non-linear distortion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio

Landscapes

  • Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Measuring Phase Differences (AREA)
JP2004124969A 2004-04-21 2004-04-21 スペクトラム処理方法および該方法を用いる測定装置 Pending JP2005308512A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2004124969A JP2005308512A (ja) 2004-04-21 2004-04-21 スペクトラム処理方法および該方法を用いる測定装置
US11/102,409 US7317999B2 (en) 2004-04-21 2005-04-08 Method of mapping linearly spaced spectrum points to logarithmically spaced frequency and a measuring apparatus using the method
DE102005017545A DE102005017545A1 (de) 2004-04-21 2005-04-16 Verfahren zur Kartierung von Spektrumspunkten mit linearem Abstand auf eine Frequenz mit logarithmischem Abstand und Messapparatur, die das Verfahren einsetzt

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004124969A JP2005308512A (ja) 2004-04-21 2004-04-21 スペクトラム処理方法および該方法を用いる測定装置

Publications (2)

Publication Number Publication Date
JP2005308512A true JP2005308512A (ja) 2005-11-04
JP2005308512A5 JP2005308512A5 (enExample) 2007-06-14

Family

ID=35137566

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004124969A Pending JP2005308512A (ja) 2004-04-21 2004-04-21 スペクトラム処理方法および該方法を用いる測定装置

Country Status (3)

Country Link
US (1) US7317999B2 (enExample)
JP (1) JP2005308512A (enExample)
DE (1) DE102005017545A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024053724A1 (ja) * 2022-09-09 2024-03-14 国立大学法人東京大学 信号処理装置、信号処理方法及びプログラム

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007010649B8 (de) * 2007-03-02 2009-01-22 Thermosensorik Gmbh Verfahren und Vorrichtung zur adaptiven Änderung der Integrationszeit eines Infrarotsensors
JP2008262021A (ja) * 2007-04-12 2008-10-30 Hiromi Murakami 電気楽器における位相切替装置
US8639506B2 (en) * 2010-03-11 2014-01-28 Telefonica, S.A. Fast partial pattern matching system and method
US9651646B2 (en) * 2014-06-24 2017-05-16 Tektronix, Inc. Phase noise correction system for discrete time signal processing
US11255893B2 (en) 2018-08-22 2022-02-22 Keysight Technologies, Inc. Measuring error in signal under test (SUT) using multiple channel measurement device
DE102023130800A1 (de) * 2023-11-07 2025-05-08 Technische Universität Darmstadt, Körperschaft des öffentlichen Rechts Photonische messvorrichtung für phasenrauschen

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3148735A1 (de) 1981-12-09 1986-10-09 Fried. Krupp Gmbh, 4300 Essen Verfahren und vorrichtung zur frequenzanalyse
US5051916A (en) * 1990-01-12 1991-09-24 Tektronix, Inc. Stimulus signal generation method to maximize dynamic range in frequency response function calculations
US5224170A (en) * 1991-04-15 1993-06-29 Hewlett-Packard Company Time domain compensation for transducer mismatch
US5583961A (en) * 1993-03-25 1996-12-10 British Telecommunications Public Limited Company Speaker recognition using spectral coefficients normalized with respect to unequal frequency bands
DE4316297C1 (de) * 1993-05-14 1994-04-07 Fraunhofer Ges Forschung Frequenzanalyseverfahren
US6760674B2 (en) * 2001-10-08 2004-07-06 Microchip Technology Incorporated Audio spectrum analyzer implemented with a minimum number of multiply operations
JP2003287555A (ja) 2002-03-28 2003-10-10 Advantest Corp 位相雑音測定方法及びその方法を用いた位相雑音測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024053724A1 (ja) * 2022-09-09 2024-03-14 国立大学法人東京大学 信号処理装置、信号処理方法及びプログラム

Also Published As

Publication number Publication date
DE102005017545A1 (de) 2005-11-24
US20050240367A1 (en) 2005-10-27
US7317999B2 (en) 2008-01-08

Similar Documents

Publication Publication Date Title
JP2005308511A (ja) 位相雑音を測定する方法および位相雑音測定装置
JP7235386B2 (ja) Ｆｍｃｗレーダーのチャープ信号線形性及び位相ノイズを判定するための回路及び方法
US12055585B2 (en) Sub-sampled based instrument noise correction for jitter measurements
US8805313B2 (en) Magnitude and phase response calibration of receivers
EP3451000B1 (en) Vector network analyzer and measuring method for frequency-converting measurements
US20140306719A1 (en) Calibration of test instrument over extended operating range
WO2013117752A1 (en) Method and system for performing a calibration
US8072206B2 (en) Spectrum analyzer system and spectrum analyze method
US10735036B1 (en) Method for measuring frequency offset between an RF transmitter and a test receiver
JP4761724B2 (ja) 位相雑音を測定する方法および位相雑音測定装置
JP2005308512A (ja) スペクトラム処理方法および該方法を用いる測定装置
US20230057105A1 (en) Frequency response calibration for radio frequency integrated circuit with multiple receiving channels
WO2008106534A1 (en) Systems and methods for performing external correction
CN105282086B (zh) 变频系统群时延的双音正交测量方法
JPWO2007108492A1 (ja) 確率密度関数分離装置、確率密度関数分離方法、ノイズ分離装置、ノイズ分離方法、試験装置、試験方法、算出装置、算出方法、プログラム、及び記録媒体
US7161511B2 (en) Linearization system and method
TWI423626B (zh) 使用大小測量資料之濾波器等化
US20080270440A1 (en) Data Compression for Producing Spectrum Traces
JP2005308510A (ja) 位相雑音測定装置および位相雑音測定システム
US7313492B2 (en) Method and device for increasing the dynamic range and measuring accuracy of a measuring device for spectrum and/or network analysis
JP6756491B2 (ja) 正規化された位相スペクトルを生成する方法及び装置
JP3974880B2 (ja) ジッタ伝達特性測定装置
Sudani et al. A comparative study of state-of-The-Art high-performance spectral test methods
US20020121892A1 (en) Modulating device characterization method and apparatus
JP2006329981A (ja) 二重スペクトル・アナライザ測定システム

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070409

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070409

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20090206

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090212

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20090701