JP2005248192A - Method for manufacturing thin film for separating hydrogen, and palladium plating bath - Google Patents

Method for manufacturing thin film for separating hydrogen, and palladium plating bath Download PDF

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JP2005248192A
JP2005248192A JP2004055910A JP2004055910A JP2005248192A JP 2005248192 A JP2005248192 A JP 2005248192A JP 2004055910 A JP2004055910 A JP 2004055910A JP 2004055910 A JP2004055910 A JP 2004055910A JP 2005248192 A JP2005248192 A JP 2005248192A
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palladium
plating
bath
thin film
plating solution
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JP4557570B2 (en
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Nariyuki Uemiya
成之 上宮
Hideo Yoshida
英夫 吉田
Masato Sone
正人 曽根
Nobuyoshi Sato
信義 佐藤
Seizo Miyata
清蔵 宮田
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Asahi Kasei Engineering Corp
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/30Hydrogen technology
    • Y02E60/50Fuel cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

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Abstract

<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a thin film for separating hydrogen, and a palladium plating bath in which a hydrogen separating film to be used for, for example, a modified fuel cell is suitably manufactured, the hydrogen separating film is reduced in film thickness, hydrogen can be separated at high purity, a fuel reformer is reduced in size and weight, the modification reaction is performed with high efficiency and high economical efficiency a palladium thin film can be suitably manufactured by the plating method in the plating bath, the use of plating liquid is reduced, a uniform palladium film can be deposited, and the plating productivity can be improved. <P>SOLUTION: In the method for manufacturing the thin film for separating hydrogen, metal ions in plating liquid 10 stored in a reaction bath 1 are deposited on a work 18 to be plated. Plating liquid 10, supercritical state or substance formed therein, and surfactant 11 are stored in the reaction bath 1. After the super-critical state and the emulsion state are formed in the reaction bath 1, the metal ions are diffused to be deposited on the work 18 to be plated. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

本発明は、例えば改質型燃料電池に使用する水素分離膜の製造に好適で、水素分離膜を薄膜化し、水素を高純度に分離でき、燃料改質器の小形軽量化と改質反応の高効率化と経済性を図れ、しかもピンホ−ルがなく緻密かつ均一な薄膜を安価に得られるとともに、水素分離膜としてパラジウム薄膜をめっき法により製造する際のめっき浴に好適で、めっき液の使用量を低減し均一なパラジウム皮膜を析出できるとともに、めっきの生産性を向上できる、水素分離用薄膜の製造方法およびパラジウムめっき浴に関する。   The present invention is suitable, for example, for the production of a hydrogen separation membrane used in a reforming fuel cell. The hydrogen separation membrane can be thinned to separate hydrogen with high purity. High efficiency and economic efficiency are achieved, and a dense and uniform thin film without pinholes can be obtained at a low cost. It is also suitable for a plating bath for producing a palladium thin film by a plating method as a hydrogen separation film. The present invention relates to a method for producing a thin film for hydrogen separation and a palladium plating bath, which can reduce the amount used and deposit a uniform palladium film and improve the productivity of plating.

近時、環境問題やエネルギ−・セキュリティ等の観点から、燃料電池の開発と実用化並びにその普及が強く期待されている。
前記燃料電池のなかに、種々の炭化水素やアルコ−ル燃料を改質する固体高分子形燃料電池があり、該電池は作動温度が低く、電極として白金または白金合金を用いているため、一酸化炭素等の電極被毒物質を含まない高純度水素を必要としている。
Recently, from the viewpoint of environmental problems, energy security, and the like, the development, practical application and popularization of fuel cells are strongly expected.
Among the fuel cells, there are solid polymer fuel cells for reforming various hydrocarbons and alcohol fuels, and these cells have a low operating temperature and use platinum or a platinum alloy as an electrode. High-purity hydrogen that does not contain electrode poisoning substances such as carbon oxide is required.

このような高純度水素を得る際の水素分離・精製手段として、相転移を伴なわず省エネルギ−技術で、連続操作および小型化が可能な膜分離法が注目され、該分離法の高純度水素製造への適用が検討されている。
特に、パラジウム等の水素分離用金属膜は、金属内での水素の拡散が最も速く、しかも優れた耐熱性を備え、高温反応場で使用可能であるため、分離膜を燃料改質器に組み込んだ、いわゆるメンブレンリホ−マ−への適用が試みられている。
As a means for hydrogen separation / purification in obtaining such high-purity hydrogen, a membrane separation method capable of continuous operation and miniaturization with energy-saving technology without phase transition is attracting attention. Application to hydrogen production is under consideration.
In particular, metal membranes for hydrogen separation, such as palladium, have the fastest hydrogen diffusion in the metal, excellent heat resistance, and can be used in high-temperature reaction fields, so the separation membrane is built into the fuel reformer. However, application to so-called membrane reformers has been attempted.

とりわけ、非多孔質金属膜であるパラジウム合金膜は、ガスの分離能力が極めて高く水素純度を高められるため、分離した水素をそのまま固体高分子形燃料電池に使用できる利点がある(例えば、特許文献1)。
しかしながら、パラジウムは高価な金属で、燃料電池の実用化や普及に障害になるため、パラジウム合金膜を燃料電池に使用する場合は、これを薄膜化して金属使用量を削減する必要がある。
したがって、パラジウムの薄膜化にはパラジウムの機械的な強度を考慮し、多孔膜質セラミックスや多孔質ステンレス等を支持体とし、該支持体にパラジウム薄膜を被覆していた。
In particular, a palladium alloy membrane, which is a non-porous metal membrane, has an advantage that the separated hydrogen can be used as it is in a polymer electrolyte fuel cell because the gas separation ability is extremely high and the hydrogen purity can be increased (for example, patent documents). 1).
However, since palladium is an expensive metal and hinders the practical use and spread of fuel cells, when a palladium alloy film is used in a fuel cell, it is necessary to reduce the amount of metal used by reducing the film thickness.
Therefore, in consideration of the mechanical strength of palladium, the thin film of palladium is made of porous film ceramics or porous stainless steel as a support, and the support is covered with the palladium thin film.

前記パラジウムの薄膜化法として、圧延法や真空蒸着法、スパッタリング法、化学的気相蒸着法、電解めっき法や無電解めっき(化学めっき)法等が知られている。
このうち、圧延法は金属片を機械的に薄膜化するため、薄膜化に一定の限界があり、また前記蒸着法やめっき法ではピンホ−ルの発生を避けられず、該ピンホ−ルによって水素分離選択性が低下するとともに、作動時の熱サイクルによって徐々にピンホ−ルが拡大し、水素分離選択性の低下を助長するという問題がある。
As the palladium thinning method, a rolling method, a vacuum deposition method, a sputtering method, a chemical vapor deposition method, an electrolytic plating method, an electroless plating (chemical plating) method, and the like are known.
Among these, the rolling method mechanically thins the metal pieces, so there is a certain limit to thinning the film, and the above-mentioned vapor deposition method and plating method cannot avoid the occurrence of pinholes. There is a problem that the separation selectivity is lowered, and the pinhole is gradually expanded by the thermal cycle during operation, which promotes the reduction of the hydrogen separation selectivity.

このうち、前記めっき法の問題を解決するものとして、浴中にめっき液と被処理物と界面活性剤を収容し、これに超臨界二酸化炭素を導入して浴中を乳濁し、このエマルジョン状態の下で電気めっきし、つきまわりが良く、均一で薄膜の金属皮膜を析出でき、しかもめっき液の使用量と廃液量を減量し得るようにした超臨界めっき法がある(例えば、特許文献2)。   Among them, as a solution to the problem of the plating method, a plating solution, an object to be processed, and a surfactant are contained in a bath, and supercritical carbon dioxide is introduced into the bath to emulsify the bath. There is a supercritical plating method in which an electroplating is performed under good conditions, a uniform and thin metal film can be deposited, and the amount of plating solution used and the amount of waste solution can be reduced (for example, Patent Document 2). ).

しかし、前記電気めっき法は、一般的に被処理物の形状が複雑な場合、めっき皮膜の厚さに一様性を期し難く、薄膜化や均質性を得難い。
ところで、前記超臨界めっき法には無電解めっきへの適用を示唆しているが、被めっき物の浸漬を条件にしており、その場合はめっき液の使用量が増大するとともに、置換めっきの惧れがあり、更に超臨界二酸化炭素がめっき液に溶解して酸性を呈し、めっき液のpHが変動するため、アルカリ性のめっき液では均質なめっき皮膜を得られない、等の問題があって直ちに採用し難い。
However, in the electroplating method, when the shape of an object to be processed is generally complicated, it is difficult to achieve uniformity in the thickness of the plating film, and it is difficult to obtain a thin film and uniformity.
By the way, although the supercritical plating method is suggested to be applied to electroless plating, it is based on the condition that the object to be plated is immersed. In addition, since supercritical carbon dioxide dissolves in the plating solution and becomes acidic, and the pH of the plating solution fluctuates, there is a problem that a homogeneous plating film cannot be obtained with an alkaline plating solution, and there is a problem immediately. It is difficult to adopt.

一方、無電解パラジウムのめっき液として、パラジウムイオン源に塩化パラジウム、パラジウムイオンの錯化剤にアンモニウムイオンやエチレンジアミン、還元剤に次亜燐酸ナトリウム、水素化ホウ素ナトリウム、ジメチルアミンボラン、または蟻酸ナトリウムを用い、pH調整剤に燐酸塩、四ホウ酸塩、フタル酸塩、酢酸塩、クエン酸塩等を用いたものがある。
上記めっき液のうち、還元剤に蟻酸ナトリウムを用いるとめっき析出速度が遅くなるため、めっき析出速度に優れた還元剤に蟻酸塩を用い、パラジウムイオン源にテトラアンミンパラジウム化合物を用いたものがある(例えば、特許文献3)。
On the other hand, as an electroless palladium plating solution, palladium chloride is used as a palladium ion source, ammonium ion or ethylenediamine as a complexing agent for palladium ions, and sodium hypophosphite, sodium borohydride, dimethylamine borane, or sodium formate as reducing agents. There are those using phosphate, tetraborate, phthalate, acetate, citrate and the like as pH adjusters.
Among the above plating solutions, when sodium formate is used as the reducing agent, the plating deposition rate is slowed down. For this reason, formate is used as the reducing agent with excellent plating deposition rate, and a tetraammine palladium compound is used as the palladium ion source ( For example, Patent Document 3).

しかし、前記めっき液は、めっき析出速度の遅れを解消できる一方、無電解めっき時に必然的に発生する水素ガスの発生を抑えるため、めっきの生産性低下を招き、しかも発生した水素ガスがめっき液中に浮遊し、これが被めっき物表面に付着して、めっきムラやピンホ−ルの原因になり、緻密かつ均一なめっき皮膜を得られない等の問題があった。   However, while the plating solution can eliminate the delay of the plating deposition rate, it suppresses the generation of hydrogen gas that is inevitably generated during electroless plating. There is a problem that it floats inside and adheres to the surface of the object to be plated, which causes uneven plating and pinholes, and a dense and uniform plating film cannot be obtained.

特開2003−308869号公報JP 2003-308869 A 特開2003−321791号公報Japanese Patent Laid-Open No. 2003-321791 特開2000−129454号公報JP 2000-129454 A

本発明はこのような問題を解決し、例えば改質型燃料電池に使用する水素分離膜の製造に好適で、水素分離膜を薄膜化し、水素を高純度に分離でき、燃料改質器の小形軽量化と改質反応の高効率化と経済性を図れ、しかもピンホ−ルがなく緻密かつ均一な薄膜を得られるとともに、水素分離膜としてパラジウム薄膜をめっき法により製造する際のめっき浴に好適で、めっき液の使用量を低減し均一なパラジウム皮膜を析出できるとともに、めっきの生産性を向上できる、水素分離用薄膜の製造方法およびパラジウムめっき浴を提供することを目的とする。   The present invention solves such a problem, and is suitable for manufacturing a hydrogen separation membrane used for, for example, a reforming fuel cell. The hydrogen separation membrane can be thinned to separate hydrogen with high purity. Light weight, high efficiency of reforming reaction and economic efficiency, and a precise and uniform thin film without pinholes can be obtained. Also suitable as a plating bath when a palladium thin film is produced by a plating method as a hydrogen separation membrane. Thus, an object of the present invention is to provide a method for producing a thin film for hydrogen separation and a palladium plating bath, which can reduce the amount of plating solution used and deposit a uniform palladium film and improve the productivity of plating.

請求項1の発明は、反応浴に収容しためっき液中の金属イオンを被めっき物に析出させる水素分離用薄膜の製造方法において、前記反応浴にめっき液と、超臨界状態またはその形成物質と、界面活性剤とを収容し、該反応浴に超臨界状態とエマルジョン状態とを形成後、前記金属イオンを拡散させ被めっき物に析出させて、超臨界状態を駆使しためっき法により、めっき時に発生するガスを超臨界物質に溶解させ、そのめっき液中の滞留を防止するとともに、前記発生したガスの気泡を圧潰かつ押し縮めて微細化し、これに界面活性剤を効率良く働かせて、前記気泡の被めっき物からの剥離を促し、更に前記溶解を促して、ピンホ−ルがなく緻密かつ均一な薄膜を得られ、改質型燃料電池に使用する水素分離膜の製造法に好適である。   According to a first aspect of the present invention, there is provided a method for producing a hydrogen separation thin film in which metal ions in a plating solution stored in a reaction bath are deposited on an object to be plated. Then, after containing a surfactant and forming a supercritical state and an emulsion state in the reaction bath, the metal ions are diffused and deposited on the object to be plated. Dissolve the generated gas in a supercritical material, prevent retention in the plating solution, and crush and compress the generated gas bubbles to make them finer, making the surfactant work efficiently on the bubbles. It is suitable for a method for producing a hydrogen separation membrane for use in a reformed fuel cell, which promotes peeling from the object to be plated and further promotes the dissolution to obtain a dense and uniform thin film without pinholes.

請求項2の発明は、めっき液と還元剤とを別々に時間を置いて反応浴に導入し、無電解めっき法で薄膜を製造する際、それらの酸化還元反応を金属イオンの析出時まで阻止し、その間に反応浴の超臨界状態とエマルジョン状態を形成させて、合理的な薄膜の製造を図るようにしている。
請求項3の発明は、前記被めっき物と、還元剤を除くめっき液とを常時は非接触状態とし、前記めっき液の少量化を図るとともに、金属イオンの析出前における置換めっきの発生を防止し、めっき皮膜の密着力を強固にするようにしている。
In the invention of claim 2, the plating solution and the reducing agent are separately introduced into the reaction bath at a time, and when producing a thin film by the electroless plating method, the oxidation-reduction reaction is prevented until the time of deposition of metal ions. In the meantime, a supercritical state and an emulsion state of the reaction bath are formed, so that a reasonable thin film can be manufactured.
According to a third aspect of the invention, the object to be plated and the plating solution excluding the reducing agent are always kept in a non-contact state to reduce the amount of the plating solution and prevent the occurrence of displacement plating before the deposition of metal ions. In addition, the adhesion of the plating film is strengthened.

請求項4の発明は、前記被めっき物と、界面活性剤を含むめっき液とを常時は非接触状態とし、前記反応浴の超臨界状態とエマルジョン状態の形成時に、金属イオンを被めっき物に接触させ析出させて、界面活性剤を含むめっき液の少量化を図るとともに、金属イオンの析出前における置換めっきの発生を防止し、めっき皮膜の密着力を強固にするようにしている。
請求項5の発明は、前記反応浴の超臨界状態とエマルジョン状態の形成後、前記反応浴に還元剤を導入し、無電解めっき法による薄膜の製造を合理的に行なうようにしている。
According to a fourth aspect of the present invention, the object to be plated and a plating solution containing a surfactant are always kept in a non-contact state, and metal ions are applied to the object to be plated when a supercritical state and an emulsion state of the reaction bath are formed. The amount of the plating solution containing the surfactant is reduced by bringing them into contact with each other, and the occurrence of displacement plating before the deposition of metal ions is prevented, thereby strengthening the adhesion of the plating film.
In a fifth aspect of the present invention, after the supercritical state and emulsion state of the reaction bath are formed, a reducing agent is introduced into the reaction bath so as to rationally manufacture a thin film by an electroless plating method.

請求項6の発明は、前記被めっき物にパラジウムイオンを析出させ、パラジウム薄膜の合理的な製法を実現し、改質型燃料電池に好適な水素分離用パラジウム薄膜を提供できるようにしている。
請求項7の発明は、前記反応浴にアルカリ性のめっき液を収容後に超臨界二酸化炭素を導入し、該超臨界二酸化炭素を前記めっき液に溶解して、該めっき液を所定酸性の酸性濃度に調製し、安価な素材でめっき液をめっき可能な酸性濃度に調製するようにしている。
According to a sixth aspect of the present invention, palladium ions are deposited on the object to be plated to realize a rational production method of a palladium thin film, and a palladium thin film for hydrogen separation suitable for a reformed fuel cell can be provided.
In the invention of claim 7, supercritical carbon dioxide is introduced after the alkaline plating solution is contained in the reaction bath, the supercritical carbon dioxide is dissolved in the plating solution, and the plating solution is adjusted to a predetermined acidic acid concentration. The plating solution is prepared to an acid concentration capable of plating with an inexpensive material.

請求項8の発明は、少なくともめっき液にパラジウムイオン供給源を含むパラジウムめっき浴において、前記めっき浴に超臨界状態またはその形成物質と、エマルジョン状態を形成させる界面活性剤とを含ませ、超臨界状態を駆使しためっき法において、確実かつ安定したパラジウム薄膜を得られるとともに、前記めっき液と界面活性剤の少量化を図れるようにしている。
請求項9の発明は、前記パラジウムめっき浴に、パラジウムイオン供給源として塩化パラジウムと、錯化剤としてエチレンジアミンと、還元剤としてホスフィン酸またはホスホン酸またはトリメチルアミンボランとを含み、無電解めっき法による作業に際して、作業条件に応じて最適な還元剤を選択できるようにしている。
The invention of claim 8 is a palladium plating bath containing at least a palladium ion supply source in a plating solution, wherein the plating bath contains a supercritical state or a substance forming the supercritical state, and a surfactant that forms an emulsion state. In the plating method that makes full use of the state, a reliable and stable palladium thin film can be obtained, and the plating solution and the surfactant can be reduced in quantity.
The invention according to claim 9 is characterized in that the palladium plating bath contains palladium chloride as a source of palladium ions, ethylenediamine as a complexing agent, and phosphinic acid, phosphonic acid or trimethylamine borane as a reducing agent. At this time, an optimum reducing agent can be selected according to the working conditions.

請求項10の発明は、前記パラジウムめっき浴に、パラジウムイオン供給源として塩化パラジウムと、錯化剤としてエチレンジアミンと、還元剤としてホスフィン酸と、改良剤としてチオグリコ−ル酸とを含み、均一かつ緻密なパラジウム薄膜の製造に好適な具体的なめっき浴を提供するようにしている。
請求項11の発明は、前記パラジウムめっき浴に、パラジウムイオン供給源として塩化パラジウムと、錯化剤としてエチレンジアミンと、還元剤としてホスホン酸と、改良剤としてチオグリコ−ル酸とを含み、均一かつ緻密なパラジウム薄膜の製造に好適な具体的なめっき浴を提供するようにしている。
The invention of claim 10 is characterized in that the palladium plating bath contains palladium chloride as a source of palladium ions, ethylenediamine as a complexing agent, phosphinic acid as a reducing agent, and thioglycolic acid as an improving agent. A specific plating bath suitable for manufacturing a thin palladium film is provided.
The invention according to claim 11 is characterized in that the palladium plating bath contains palladium chloride as a source of palladium ions, ethylenediamine as a complexing agent, phosphonic acid as a reducing agent, and thioglycolic acid as an improving agent. A specific plating bath suitable for manufacturing a thin palladium film is provided.

請求項12の発明は、前記パラジウムめっき浴に、パラジウムイオン供給源として塩化パラジウムと、錯化剤としてエチレンジアミンと、還元剤としてトリメチルアミンボランと、改良剤としてチオグリコ−ル酸とを含み、均一かつ緻密なパラジウム薄膜の製造に好適な具体的なめっき浴を提供するようにしている。
請求項13の発明は、前記めっき液はめっき浴収容時はアルカリ性で、該めっき液に超臨界二酸化炭素を溶解して所定の酸性濃度とし、安価な素材でめっき液をめっき可能な酸性濃度に調製するようにしている。
The invention of claim 12 is characterized in that the palladium plating bath contains palladium chloride as a source of palladium ions, ethylenediamine as a complexing agent, trimethylamine borane as a reducing agent, and thioglycolic acid as an improving agent. A specific plating bath suitable for manufacturing a thin palladium film is provided.
In the invention of claim 13, the plating solution is alkaline when accommodated in the plating bath, and supercritical carbon dioxide is dissolved in the plating solution to a predetermined acidic concentration, so that the plating solution can be plated with an inexpensive material. Try to prepare.

請求項1の発明は、反応浴にめっき液と、超臨界状態またはその形成物質と、界面活性剤とを収容し、該反応浴に超臨界状態とエマルジョン状態とを形成後、前記金属イオンを拡散させ被めっき物に析出させるから、超臨界状態を駆使しためっき法により、めっき時に発生するガスを超臨界物質に溶解させ、そのめっき液中の滞留を防止するとともに、前記発生したガスの気泡を圧潰かつ押し縮めて微細化し、これに界面活性剤を効率良く働かせて、前記気泡の被めっき物からの剥離を促し、更に前記溶解を促してピンホ−ルがなく緻密かつ均一な薄膜を得られ、改質型燃料電池に使用する水素分離膜の製造法に好適な効果がある。   According to the first aspect of the present invention, a plating bath, a supercritical state or a substance forming the same, and a surfactant are contained in a reaction bath, and after forming a supercritical state and an emulsion state in the reaction bath, the metal ions are added. Because it diffuses and deposits on the object to be plated, the gas generated during plating is dissolved in the supercritical material by the plating method that makes full use of the supercritical state, and the retention of the gas in the plating solution is prevented. Crushing and compressing the material to make it finer, and using a surfactant efficiently, promotes the exfoliation of the bubbles from the object to be plated, and further promotes the dissolution to obtain a dense and uniform thin film without pinholes. Therefore, there is an effect suitable for a method for producing a hydrogen separation membrane used in a reforming fuel cell.

請求項2の発明は、めっき液と還元剤とを別々に時間を置いて反応浴に導入するから、無電解めっき法で薄膜を製造する際、それらの酸化還元反応を金属イオンの析出時まで阻止し、その間に反応浴の超臨界状態とエマルジョン状態を形成させて、合理的な薄膜の製造を図ることができる。
請求項3の発明は、前記被めっき物と、還元剤を除くめっき液とを常時は非接触状態とするから、前記めっき液の少量化を図れるとともに、金属イオンの析出前における置換めっきの発生を防止し、めっき皮膜の密着力を強固にすることができる。
In the invention of claim 2, since the plating solution and the reducing agent are separately introduced into the reaction bath, when the thin film is produced by the electroless plating method, the oxidation-reduction reaction is performed until the deposition of metal ions. In the meantime, a supercritical state and an emulsion state of the reaction bath are formed, and a reasonable thin film can be manufactured.
In the invention of claim 3, since the object to be plated and the plating solution excluding the reducing agent are always in a non-contact state, the amount of the plating solution can be reduced and the occurrence of displacement plating before the deposition of metal ions. Can be prevented, and the adhesion of the plating film can be strengthened.

請求項4の発明は、前記被めっき物と、界面活性剤を含むめっき液とを常時は非接触状態とし、前記反応浴の超臨界状態とエマルジョン状態の形成時に、金属イオンを被めっき物に接触させ析出させるから、界面活性剤を含むめっき液の少量化を図れるとともに、金属イオンの析出前における置換めっきの発生を防止し、めっき皮膜の密着力を強固にすることができる。
請求項5の発明は、前記反応浴の超臨界状態とエマルジョン状態の形成後、前記反応浴に還元剤を導入するから、無電解めっき法による薄膜の製造を合理的に行なうことができる。
According to a fourth aspect of the present invention, the object to be plated and a plating solution containing a surfactant are always kept in a non-contact state, and metal ions are applied to the object to be plated when a supercritical state and an emulsion state of the reaction bath are formed. Since they are brought into contact with each other and deposited, the amount of the plating solution containing the surfactant can be reduced, and the occurrence of displacement plating before the deposition of metal ions can be prevented, and the adhesion of the plating film can be strengthened.
In the invention of claim 5, since a reducing agent is introduced into the reaction bath after the supercritical state and emulsion state of the reaction bath are formed, it is possible to rationally manufacture a thin film by an electroless plating method.

請求項6の発明は、前記被めっき物にパラジウムイオンを析出させるから、パラジウム薄膜の合理的な製法を実現し、改質型燃料電池に好適な水素分離用パラジウム薄膜を提供することができる。
請求項7の発明は、前記反応浴にアルカリ性のめっき液を収容後に超臨界二酸化炭素を導入し、該超臨界二酸化炭素を前記めっき液に溶解して、該めっき液を所定酸性の酸性濃度に調製するから、安価な素材でめっき液をめっき可能な酸性濃度に調製することができる。
According to the invention of claim 6, since palladium ions are deposited on the object to be plated, it is possible to realize a rational method for producing a palladium thin film and to provide a palladium thin film for hydrogen separation suitable for a reformed fuel cell.
In the invention of claim 7, supercritical carbon dioxide is introduced after the alkaline plating solution is contained in the reaction bath, the supercritical carbon dioxide is dissolved in the plating solution, and the plating solution is adjusted to a predetermined acidic acid concentration. Since it is prepared, the plating solution can be adjusted to an acidic concentration capable of plating with an inexpensive material.

請求項8の発明は、めっき浴に超臨界状態またはその形成物質と、エマルジョン状態を形成させる界面活性剤とを含ませたから、超臨界状態を駆使しためっき法において、確実かつ安定したパラジウム薄膜を得られるとともに、前記めっき液と界面活性剤の少量化を図ることができる。
請求項9の発明は、前記パラジウムめっき浴に、パラジウムイオン供給源として塩化パラジウムと、錯化剤としてエチレンジアミンと、還元剤としてホスフィン酸またはホスホン酸またはトリメチルアミンボランとを含むから、無電解めっき法による作業に際して、作業条件に応じて最適な還元剤を選択することができる。
In the invention of claim 8, since the plating bath contains a supercritical state or a substance forming the same and a surfactant that forms an emulsion state, a reliable and stable palladium thin film can be obtained in a plating method using the supercritical state. As a result, the plating solution and the surfactant can be reduced in quantity.
In the invention of claim 9, since the palladium plating bath contains palladium chloride as a palladium ion supply source, ethylenediamine as a complexing agent, and phosphinic acid, phosphonic acid or trimethylamine borane as a reducing agent, the electroless plating method is used. At the time of work, an optimum reducing agent can be selected according to work conditions.

請求項10の発明は、前記パラジウムめっき浴に、パラジウムイオン供給源として塩化パラジウムと、錯化剤としてエチレンジアミンと、還元剤としてホスフィン酸と、改良剤としてチオグリコ−ル酸とを含むから、均一かつ緻密なパラジウム薄膜の製造に好適な具体的なめっき浴を提供することができる。
請求項11の発明は、前記パラジウムめっき浴に、パラジウムイオン供給源として塩化パラジウムと、錯化剤としてエチレンジアミンと、還元剤としてホスホン酸と、改良剤としてチオグリコ−ル酸とを含むから、均一かつ緻密なパラジウム薄膜の製造に好適な具体的なめっき浴を提供することができる。
Since the palladium plating bath contains palladium chloride as a palladium ion source, ethylenediamine as a complexing agent, phosphinic acid as a reducing agent, and thioglycolic acid as an improving agent, the palladium plating bath is uniform and A specific plating bath suitable for production of a dense palladium thin film can be provided.
Since the palladium plating bath contains palladium chloride as a source of palladium ions, ethylenediamine as a complexing agent, phosphonic acid as a reducing agent, and thioglycolic acid as an improving agent, the palladium plating bath is uniform and A specific plating bath suitable for production of a dense palladium thin film can be provided.

請求項12の発明は、前記パラジウムめっき浴に、パラジウムイオン供給源として塩化パラジウムと、錯化剤としてエチレンジアミンと、還元剤としてトリメチルアミンボランと、改良剤としてチオグリコ−ル酸とを含むから、均一かつ緻密なパラジウム薄膜の製造に好適な具体的なめっき浴を提供することができる。
請求項13の発明は、前記めっき液はめっき浴収容時はアルカリ性で、該めっき液に超臨界二酸化炭素を溶解して所定の酸性濃度としたから、安価な素材でめっき液をめっき可能な酸性濃度に調製することができる。
Since the palladium plating bath contains palladium chloride as a palladium ion source, ethylenediamine as a complexing agent, trimethylamine borane as a reducing agent, and thioglycolic acid as an improving agent, the palladium plating bath is uniform and A specific plating bath suitable for production of a dense palladium thin film can be provided.
In the invention of claim 13, the plating solution is alkaline when accommodated in the plating bath, and supercritical carbon dioxide is dissolved in the plating solution to obtain a predetermined acidic concentration. Therefore, the plating solution can be plated with an inexpensive material. The concentration can be adjusted.

以下、本発明を改質型燃料電池に好適な水素分離用薄膜として、パラジウム薄膜を無電解めっき(化学めっき)法によって製造する場合に適用した図示の実施形態について説明すると、図1乃至図8において1は圧力容器からなる密閉可能な反応浴で、適所に開閉蓋(図示略)が設けられ、後述の被処理物である基板を出し入れ可能にしている。   DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A description will now be given of illustrated embodiments in which the present invention is applied to a case where a palladium thin film is manufactured by an electroless plating (chemical plating) method as a hydrogen separation thin film suitable for a reformed fuel cell. 1 is a sealable reaction bath composed of a pressure vessel, and an open / close lid (not shown) is provided at an appropriate position so that a substrate, which will be described later, can be taken in and out.

前記反応浴1に第1乃至第3導管2〜4が配管され、このうち第1導管2の他端は超臨界形成物質、実施形態では二酸化炭素を充填した圧力容器5に連通可能にされている。
前記第1導管2に前記二酸化炭素を液化するコンデンサ6と、加圧ポンプ7および加熱器8と、開閉弁9が介挿され、これらで前記二酸化炭素を超臨界状態(7.3MPa、31.1℃)に形成し、これを前記反応浴1へ導入可能にしている。実施形態では反応浴1内を10MPa、50℃に形成している。
First to third conduits 2 to 4 are piped to the reaction bath 1, and the other end of the first conduit 2 is communicated with a pressure vessel 5 filled with a supercritical material, in the embodiment, carbon dioxide. Yes.
A condenser 6 for liquefying the carbon dioxide, a pressure pump 7 and a heater 8, and an on-off valve 9 are inserted in the first conduit 2, and the carbon dioxide is supercritical (7.3 MPa, 31. 1 ° C.), which can be introduced into the reaction bath 1. In the embodiment, the inside of the reaction bath 1 is formed at 10 MPa and 50 ° C.

前記第2導管3の他端は、めっき液(還元剤を除く)10と所定の界面活性剤11とを収容する収納タンク12に連通可能にされ、前記めっき液10と界面活性剤11とを第2導管3に介挿した送液ポンプ13を介して、前記反応浴1へ導入可能にしている。
実施形態のめっき液10は、図2のようにパラジウムイオン供給源として塩化パラジウム(PdCL)を0.01mol/L、錯化剤としてエチレンジアミン0.08mol/L、改良剤としてチオグリコ−ル酸を30mg/Lを調製して、pH11.7のアルカリ性に作製する。
この場合、前記めっき液10と界面活性剤11との容積比は、約4対1乃至3対2で、それらの総量は反応浴1の導入時に、図6(a)のように後述する基板の直下に非接触状態で収容可能に調量している。
The other end of the second conduit 3 can be communicated with a storage tank 12 containing a plating solution (excluding a reducing agent) 10 and a predetermined surfactant 11, and the plating solution 10 and the surfactant 11 are connected to each other. It can be introduced into the reaction bath 1 via a liquid feed pump 13 inserted in the second conduit 3.
As shown in FIG. 2, the plating solution 10 of the embodiment includes 0.01 mol / L of palladium chloride (PdCL 2 ) as a palladium ion supply source, 0.08 mol / L of ethylenediamine as a complexing agent, and thioglycolic acid as an improving agent. Prepare 30 mg / L and make it alkaline with pH 11.7.
In this case, the volume ratio of the plating solution 10 and the surfactant 11 is about 4 to 1 to 3 to 2, and the total amount thereof is a substrate described later as shown in FIG. 6A when the reaction bath 1 is introduced. It is metered so that it can be accommodated in a non-contact state directly underneath.

前記第3導管4の他端は、還元剤14を収容する収納タンク15に連通可能にされ、該還元剤14を第3導管4に介挿した送液ポンプ16を介して、前記反応浴1へ導入可能にしている。図中、17は第3導管4に介挿した開閉弁である。
実施形態の還元剤14は、次亜リン酸ナトリウムNaHPO(ホスフィン酸)0.06mol/Lを用いており、前記めっき液10の容量の約1/5に調量している。
The other end of the third conduit 4 is allowed to communicate with a storage tank 15 that stores the reducing agent 14, and the reaction bath 1 is connected via a liquid feed pump 16 having the reducing agent 14 inserted into the third conduit 4. It is possible to introduce to. In the figure, reference numeral 17 denotes an on-off valve inserted in the third conduit 4.
The reducing agent 14 of the embodiment uses sodium hypophosphite NaH 2 PO 2 (phosphinic acid) 0.06 mol / L, and is adjusted to about 1/5 of the capacity of the plating solution 10.

図中、18は前述の支持体を構成する被処理物である基板で、多孔質アルミナ平板に通孔24を形成しており、その表面に細孔を塞がない程度に導電性皮膜である超薄膜のパラジウムを被覆し、これをめっき時に反応浴1内に吊り下げ、その皮膜表面にパラジウム薄膜、実施形態ではパラジウム−リン合金を被覆可能にしている。   In the figure, reference numeral 18 denotes a substrate which is an object to be processed constituting the above-mentioned support. A through-hole 24 is formed in a porous alumina flat plate, which is a conductive film to the extent that the pores are not blocked. An ultra-thin palladium is coated and suspended in the reaction bath 1 during plating so that the surface of the film can be coated with a palladium thin film, in the embodiment, a palladium-phosphorus alloy.

19は撹拌子で、実施形態では撹拌性の高い十字型撹拌子を用いており、20は大気に連通可能にした排気管で、該管20に背圧弁21と開閉弁22が介挿されている。23は反応浴1の外面に設けたヒ−タである。
この場合、ヒ−タ23を省略し、反応浴1を恒温槽(図示略)に設置することでも、所期の目的を達成できる。
Reference numeral 19 denotes a stirrer. In the embodiment, a cross stirrer having high stirrability is used. Reference numeral 20 denotes an exhaust pipe capable of communicating with the atmosphere. A back pressure valve 21 and an on-off valve 22 are inserted into the pipe 20. Yes. Reference numeral 23 denotes a heater provided on the outer surface of the reaction bath 1.
In this case, the intended purpose can also be achieved by omitting the heater 23 and installing the reaction bath 1 in a thermostat (not shown).

このように構成した本発明は、その実施に当って密閉可能な圧力容器である反応浴1と、該浴1に導入する超臨界二酸化炭素の形成手段を要する。
これらの設備は従来の無電解めっき法にない固有の設備であるが、このうち反応浴1は、収容するめっき液量の低減分、従来の無電解めっき装置の浴槽に比べ小形軽量化を図れ、まためっき液のpH調整手段にしても、使用するめっき液量の低減分、簡素化を図れ、従来のような再生槽を省略し得る。
The present invention configured as described above requires a reaction bath 1 that is a pressure vessel that can be hermetically sealed and a means for forming supercritical carbon dioxide introduced into the bath 1.
These facilities are unique to the conventional electroless plating method. Of these, the reaction bath 1 can be reduced in size and weight compared to the bath of a conventional electroless plating apparatus by reducing the amount of plating solution to be accommodated. Further, the pH adjustment means for the plating solution can be simplified by reducing the amount of the plating solution to be used, and a conventional regeneration tank can be omitted.

次に、前記設備を用いてパラジウム薄膜を得る場合は、基板18の表面に超薄膜のパラジウムを被覆し、かつその表面を活性処理して、反応浴1に吊り下げる。
前記基板18の性状、およびパラジウム超薄膜の被覆前後の表面と断面は、図3乃至図5のようである。なお、基板18を例えばヒ−タ23を介して約50℃に温め、この後のパラジウム皮膜の析出を促すようにする。
Next, when a palladium thin film is obtained using the above equipment, the surface of the substrate 18 is coated with ultra-thin palladium, and the surface is activated and suspended in the reaction bath 1.
The properties of the substrate 18 and the surface and cross section before and after the coating of the ultra-thin palladium film are as shown in FIGS. The substrate 18 is heated to about 50 ° C. through, for example, the heater 23 to promote the subsequent deposition of the palladium film.

この後、還元剤14を除くめっき液10と、所定の界面活性剤11の所定量を、送液ポンプ13を介して収納タンク12から反応浴1へ送り込み、また撹拌子19を設置する。 この状況は図6(a)のようである。
前記めっき液10は実施形態の場合、図2のようにパラジウムイオン供給源として塩化パラジウムを0.01mol/L、錯化剤としてエチレンジアミンを0.08mol/L、改良剤としてチオグリコ−ル酸を30mg/Lを調量して、pH11.7のアルカリ性に調製する。
その総量は約25mLで、それらは図6(a)のように反応浴1内において、基板18の直下に非接触状態で収容される。なお、還元剤を除く前記めっき液10と界面活性剤11との容積比は、約4対1乃至3対2にする。
Thereafter, a plating solution 10 excluding the reducing agent 14 and a predetermined amount of a predetermined surfactant 11 are sent from the storage tank 12 to the reaction bath 1 via a liquid feed pump 13, and a stirrer 19 is installed. This situation is as shown in FIG.
In the embodiment, the plating solution 10 is 0.01 mol / L of palladium chloride as a palladium ion supply source, 0.08 mol / L of ethylenediamine as a complexing agent, and 30 mg of thioglycolic acid as an improving agent as shown in FIG. / L is adjusted to an alkaline pH of 11.7.
The total amount is about 25 mL, and they are accommodated in the reaction bath 1 in a non-contact state immediately under the substrate 18 as shown in FIG. The volume ratio of the plating solution 10 and the surfactant 11 excluding the reducing agent is about 4 to 1 to 3 to 2.

この後、圧力容器5に充填した二酸化炭素を第1導管2に導き、これをコンデンサ6で液化し、加圧ポンプ7とヒ−タ8とで10MPa、50℃に加圧かつ加熱し、超臨界二酸化炭素を形成して、これを反応浴1へ導入する。
前記導入後、超臨界二酸化炭素は前記めっき液10に溶解して、該めっき液10をpH2〜4の酸性に調製するとともに、界面活性剤11と混合して乳濁し、図6(b)のようなエマルジョン状態を形成する。そして、前記エマルジョン状態をしばらく放置し、当該状態が安定したところで、撹拌子19を約650rpmで駆動し、エマルジョン状態を一様化する。
Thereafter, the carbon dioxide filled in the pressure vessel 5 is led to the first conduit 2 and liquefied by the condenser 6 and pressurized and heated to 10 MPa and 50 ° C. by the pressure pump 7 and the heater 8. Critical carbon dioxide is formed and introduced into reaction bath 1.
After the introduction, the supercritical carbon dioxide is dissolved in the plating solution 10 to adjust the plating solution 10 to an acidic pH of 2 to 4, and mixed with the surfactant 11 to become an emulsion, as shown in FIG. Such an emulsion state is formed. Then, the emulsion state is left for a while, and when the state is stabilized, the stirrer 19 is driven at about 650 rpm to make the emulsion state uniform.

このような状況の下でホスフィン酸からなる還元剤14を所定量、実施形態では5mL、つまり0.06mol/Lを、送液ポンプ16を介して収納タンク15から反応浴1へ送り込む。
このようにすると、還元剤14がエマルジョン状態内に速やかに拡散し、前記基板18が還元剤14を含むめっき液10のエマルジョンに恰も浸漬された状況を呈して、無電解めっき反応が始まる。この状況は図6(b)のようである。
Under such circumstances, a predetermined amount of reducing agent 14 made of phosphinic acid, in the embodiment, 5 mL, that is, 0.06 mol / L is sent from the storage tank 15 to the reaction bath 1 via the liquid feed pump 16.
If it does in this way, the reducing agent 14 will spread | diffuse rapidly in an emulsion state, the said board | substrate 18 will exhibit the condition where it was immersed in the emulsion of the plating solution 10 containing the reducing agent 14, and an electroless-plating reaction will start. This situation is as shown in FIG.

すなわち、前記無電解めっき反応は、基板18とめっき液10の主成分である金属塩の塩化パラジウムと、ホスフィンからなる還元剤14によって行なわれ、ホスフィンイオンが酸化し、パラジウムイオンが還元され、該イオンが基板18の表面に析出する。上記析出反応は塩化パラジウムの触媒作用によって継続され、実施形態では2時間めっき反応させた。   That is, the electroless plating reaction is performed by the reducing agent 14 made of the metal salt palladium chloride, which is the main component of the substrate 18 and the plating solution 10, and phosphine, phosphine ions are oxidized, palladium ions are reduced, Ions are deposited on the surface of the substrate 18. The precipitation reaction was continued by the catalytic action of palladium chloride. In the embodiment, the plating reaction was performed for 2 hours.

前記ホスフィン酸の還元剤による無電解めっき時は、反応浴1内で次の反応が行なわれる。
PO +3OH→HPO 2−+2HO+2e
Pden2++2e→Pd+en
At the time of electroless plating with the phosphinic acid reducing agent, the following reaction is performed in the reaction bath 1.
H 2 PO 2 + 3OH → HPO 3 2− + 2H 2 O + 2e
Pden 2+ + 2e → Pd + en

このような無電解めっき時は、パラジウムイオンとホスフィンイオンが超臨界二酸化炭素によって、反応浴1内に高速かつ精密に拡散し、それらのイオンないし電子の授受が一様かつ旺盛に行なわれ、パラジウムイオンが基板18の表面に析出する。
したがって、従来の無電解めっき法に比べ、めっきのつき廻りが良く、複雑な形状の被めっき物に対し均一なめっき厚を得られ、かつその薄膜化を図れて、貴金属であるパラジウムめっきに好適になる。しかも、前記超臨界二酸化炭素の優れた拡散性によって、前記析出が断続的に行なわれ、析出皮膜の結晶が微細化し、めっき皮膜の緻密化を増進する。
During such electroless plating, palladium ions and phosphine ions are rapidly and accurately diffused into the reaction bath 1 by supercritical carbon dioxide, and exchange of these ions or electrons is performed uniformly and vigorously. Ions are deposited on the surface of the substrate 18.
Therefore, compared to the conventional electroless plating method, the plating is better, it is possible to obtain a uniform plating thickness for the object to be plated in a complicated shape, and the thickness can be reduced, which is suitable for palladium plating which is a noble metal. become. Moreover, due to the excellent diffusivity of the supercritical carbon dioxide, the precipitation is intermittently performed, the crystal of the deposited film is refined, and the densification of the plated film is promoted.

一方、前記無電解めっき反応時は、主に水素ガスが発生し、その気泡が基板18の表面に滞留し若しくは表面を移動して、めっきムラや欠けピンホ−ル等が発生する惧れがある
しかし、反応浴1内は超臨界状態の高圧下に置かれ、この高圧下では前記発生ガスの超臨界二酸化炭素ないしめっき液10に対する溶解が促され、また前記気泡が押し縮められて微細化し、更に微細化した気泡に界面活性剤が効率良く働いて、基板18表面に付着する気泡を速やかに剥離し、超臨界二酸化炭素およびめっき液10への溶解を促す。
したがって、前記めっきムラや欠けピンホ−ル等の発生を防止し、均一かつ緻密なめっき皮膜を得られる。
On the other hand, during the electroless plating reaction, hydrogen gas is mainly generated, and the bubbles may stay on the surface of the substrate 18 or move on the surface, which may cause uneven plating or chipped pinholes. However, the reaction bath 1 is placed under a supercritical high pressure, and under this high pressure, dissolution of the generated gas into the supercritical carbon dioxide or the plating solution 10 is promoted, and the bubbles are compressed and refined. Further, the surfactant works efficiently on the finer bubbles, and the bubbles adhering to the surface of the substrate 18 are quickly peeled off to promote dissolution in the supercritical carbon dioxide and the plating solution 10.
Therefore, the occurrence of the plating unevenness, chipped pinholes and the like can be prevented, and a uniform and dense plating film can be obtained.

こうして得られた基板18上のパラジウム皮膜は図7のようで、これを図8に示す従来の無電解めっき法と比べると、次のようである。
すなわち、本発明による析出結晶は図7(a)ように、図8(a)の従来のめっき法で発生したクラックが消失し、微細で緻密な析出結晶を得られた。また、本発明による析出皮膜は図8(b)のように、従来の無電解めっき法に比べ皮膜厚が均一で、その平均膜厚は4.10μmで従来の3.50μmより若干厚くなるが、その標準偏差は0.38で従来の0.46よりも小さく、皮膜厚の均一性の向上が確認された。
これらの結果は何れも前述した理由によるもので、めっき時に発生したガスが超臨界二酸化炭素に溶解して、その発生が抑制ないし阻止され、また超臨界二酸化炭素の優れた拡散性に基づくことが確認された。
The palladium film on the substrate 18 thus obtained is as shown in FIG. 7, and it is as follows when compared with the conventional electroless plating method shown in FIG.
That is, in the precipitated crystal according to the present invention, as shown in FIG. 7A, the cracks generated by the conventional plating method of FIG. 8A disappeared, and a fine and dense precipitated crystal was obtained. Further, as shown in FIG. 8B, the deposited film according to the present invention has a uniform film thickness as compared with the conventional electroless plating method, and the average film thickness is 4.10 μm, which is slightly thicker than the conventional 3.50 μm. The standard deviation was 0.38, which was smaller than the conventional 0.46, and it was confirmed that the film thickness was improved.
These results are all due to the reasons described above. The gas generated during plating dissolves in supercritical carbon dioxide, and its generation is suppressed or prevented, and it is based on the excellent diffusivity of supercritical carbon dioxide. confirmed.

前記めっき時間終了後、加圧ポンプ7および撹拌子19の駆動を停止し、開閉弁22の開弁して反応浴1内の圧力を低下し、反応浴1から基板18を取り出す。
このようにすると、前記超臨界二酸化炭素が減圧されて臨界点以下の状態に移行し、急激に気化若しくは液化して系内に流れが発生し、外部へ速やかに排出される。
その際、基板18に付着しためっき液が吹き飛ばされて、基板18の乾燥が促され、反応浴1内にはめっき液10と界面活性剤11とが二層をなして残留する。この状況は図6(c)のようである。
After completion of the plating time, the driving of the pressurizing pump 7 and the stirring bar 19 is stopped, the on-off valve 22 is opened to reduce the pressure in the reaction bath 1, and the substrate 18 is taken out from the reaction bath 1.
In this way, the supercritical carbon dioxide is depressurized and shifts to a state below the critical point, and is rapidly vaporized or liquefied to generate a flow in the system, which is quickly discharged to the outside.
At that time, the plating solution adhering to the substrate 18 is blown off, and drying of the substrate 18 is promoted, and the plating solution 10 and the surfactant 11 remain in the reaction bath 1 in two layers. This situation is as shown in FIG.

この後、反応浴1内に残留しためっき液10と界面活性剤11を利用する場合は、それらの不足分を補給し、かつpH調整する必要があるが、前述のように本発明は少量のめっき液10と界面活性剤11を使用しているため、その補給量ないしpH調整量は少量で足り、それぞれ適宜な滴下手段で対応できるから、従来のような大掛かりな設備や煩雑な作業を要しない。
また、めっき液10に超臨界二酸化炭素を溶解して、めっきに必要な所定の酸性濃度を得ているから、従来のような高価かつ有毒な酸性薬液を使用する場合に比べ、安価で安全に作業を行なえる。
Thereafter, when the plating solution 10 and the surfactant 11 remaining in the reaction bath 1 are used, it is necessary to replenish those shortages and adjust the pH. However, as described above, the present invention has a small amount. Since the plating solution 10 and the surfactant 11 are used, the replenishment amount or pH adjustment amount is small, and each can be handled with appropriate dropping means, so that it requires large-scale facilities and complicated work as in the past. do not do.
Further, since supercritical carbon dioxide is dissolved in the plating solution 10 to obtain a predetermined acidic concentration necessary for plating, it is cheaper and safer than when using an expensive and toxic acidic chemical solution as in the past. Can work.

図9乃至図14は本発明の他の実施形態を示し、前述の構成と対応する部分に同一の符号を用いている。なお、これらの実施形態における無電解めっき法は、前述の実施形態と実質的に同一であるから、その説明は省略し、相違するめっき液の構成と、得られためっき皮膜について説明する。
このうち、図9乃至図11は本発明の第2の実施形態を示し、この実施形態では還元剤14としてホスフィン酸の代わりに、ホスホン酸を0.02mol/L用い、そのめっき液は図9のようにパラジウムイオン供給源として塩化パラジウムを0.01mol/L、錯化剤としてエチレンジアミンを0.08mol/L、改良剤としてチオグリコ−ル酸を30mg/L用いて、pH10.6に調製している。
9 to 14 show other embodiments of the present invention, and the same reference numerals are used for portions corresponding to the above-described configuration. In addition, since the electroless plating method in these embodiments is substantially the same as the above-mentioned embodiment, the description is abbreviate | omitted and the structure of the different plating solution and the obtained plating film are demonstrated.
9 to 11 show a second embodiment of the present invention. In this embodiment, 0.02 mol / L of phosphonic acid is used as the reducing agent 14 instead of phosphinic acid, and the plating solution is shown in FIG. As described above, palladium chloride was used as a source of palladium ion at 0.01 mol / L, ethylenediamine as a complexing agent was used as 0.08 mol / L, and thioglycolic acid was used as an improving agent at a pH of 10.6. Yes.

前記ホスホン酸の還元剤による無電解めっき時は、反応浴1内で次の反応が行なわれる
HPO 2−+2OH→HPO 2−+HO+2e
HPO 2−+HO→HPO +H+2e
Pden2++2e→Pd+en
Wherein when electroless plating using a reducing agent phosphonic acid, HPO 3 2- + 2OH following reaction takes place in the reaction bath within 1 - → HPO 4 2- + H 2 O + 2e -
HPO 3 2− + H 2 O → H 2 PO 4 + H + + 2e
Pden 2+ + 2e → Pd + en

こうして得られた基板18上のパラジウム皮膜は図10のようで、これを図11に示す従来の無電解めっき法と比べると、次のようである。
すなわち、本発明による析出結晶は図10(a)ように、図8(a)の従来のめっき法よる析出結晶に比べて微細かつ緻密で、その膜厚は図10(b)のように、従来の無電解めっき法による図11(b)に比べ皮膜厚が均一で、その平均膜厚は7.03μmで従来の5.70μmより若干厚くなるが、その標準偏差は0.39で従来の0.46より小さく、皮膜厚の均一性の向上が確認された。
これらの結果は何れも前述した理由によるもので、めっき時に発生したガスが超臨界二酸化炭素に溶解して、その発生が抑制ないし阻止され、また超臨界二酸化炭素の優れた拡散性に基づくことが確認された。
The palladium film on the substrate 18 thus obtained is as shown in FIG. 10, and is compared with the conventional electroless plating method shown in FIG. 11 as follows.
That is, the precipitated crystal according to the present invention is finer and denser than the precipitated crystal formed by the conventional plating method of FIG. 8A, as shown in FIG. 10A, and the film thickness is as shown in FIG. Compared with the conventional electroless plating method shown in FIG. 11B, the film thickness is uniform and the average film thickness is 7.03 μm, which is slightly thicker than the conventional 5.70 μm, but its standard deviation is 0.39, which is It was smaller than 0.46, and the improvement in film thickness uniformity was confirmed.
These results are all due to the reasons described above. The gas generated during plating dissolves in supercritical carbon dioxide, and its generation is suppressed or prevented, and it is based on the excellent diffusivity of supercritical carbon dioxide. confirmed.

図12乃至図14は本発明の第3の実施形態を示し、この実施形態では還元剤14としてホスフィン酸およびホスホン酸の代わりに、トリメチルアミンボランを0.06mol/L用い、そのめっき液は図12のように、パラジウムイオン供給源として塩化パラジウムを0.01mol/L、錯化剤としてエチレンジアミンを0.08mol/L、改良剤としてチオグリコ−ル酸を50mg/L用いて、pH10.6に調製している。   FIGS. 12 to 14 show a third embodiment of the present invention. In this embodiment, 0.06 mol / L of trimethylamine borane is used as the reducing agent 14 instead of phosphinic acid and phosphonic acid, and the plating solution is as shown in FIG. As described above, the pH was adjusted to 10.6 using 0.01 mol / L of palladium chloride as the source of palladium ions, 0.08 mol / L of ethylenediamine as the complexing agent, and 50 mg / L of thioglycolic acid as the improving agent. ing.

前記トリメチルアミンボランの還元剤による無電解めっき時は、反応浴1内で次の反応が行なわれる。
(CHBH+7OH→(CH+BO+5HO+6e
Pden2++2e→Pd+en
At the time of electroless plating with the reducing agent of trimethylamine borane, the following reaction is performed in the reaction bath 1.
(CH 3 ) 3 BH 3 + 7OH → (CH 3 ) 2 + BO 2 + 5H 2 O + 6e
Pden 2+ + 2e → Pd + en

こうして得られた基板18上のパラジウム皮膜は図13のようで、これを図14に示す従来の無電解めっき法と比べると、次のようである。
すなわち、本発明による析出結晶は図13(a)ように、図14(a)の従来のめっき法よる析出結晶に比べて微細かつ緻密で、その膜厚は図13(b)のように、従来の無電解めっき法による図14(b)に比べ皮膜厚が均一で、その平均膜厚は5.03μmで従来の3.85μmより若干厚くなるが、その標準偏差は0.39で従来の0.30より若干大きいが、皮膜厚の均一性が確認された。
これらの結果は何れも前述した理由によるもので、めっき時に発生したガスが超臨界二酸化炭素に溶解して、その発生が抑制ないし阻止され、また超臨界二酸化炭素の優れた拡散性に基づくことが確認された。
The palladium film on the substrate 18 thus obtained is as shown in FIG. 13 and is compared with the conventional electroless plating method shown in FIG. 14 as follows.
That is, the precipitated crystal according to the present invention is finer and denser than the precipitated crystal by the conventional plating method of FIG. 14A as shown in FIG. 13A, and the film thickness is as shown in FIG. Compared to the conventional electroless plating method shown in FIG. 14B, the film thickness is uniform and the average film thickness is 5.03 μm, which is slightly thicker than the conventional 3.85 μm, but its standard deviation is 0.39, which is Although slightly larger than 0.30, the uniformity of the film thickness was confirmed.
These results are all due to the reasons described above. The gas generated during plating dissolves in supercritical carbon dioxide, and its generation is suppressed or prevented, and it is based on the excellent diffusivity of supercritical carbon dioxide. confirmed.

このように本発明の水素分離用薄膜の製造方法およびパラジウムめっき浴は、水素分離膜を薄膜化し、水素を高純度に分離でき、燃料改質器の小形軽量化と改質反応の高効率化と経済性を図れ、しかもピンホ−ルがなく緻密かつ均一な薄膜を得られるとともに、水素分離膜としてパラジウム薄膜をめっき法により製造する際のめっき浴に好適で、めっき液の使用量を低減し均一なパラジウム皮膜を析出できるとともに、めっきの生産性を向上でき、例えば改質型燃料電池に使用する水素分離膜の製造に好適である。   As described above, the method for producing a thin film for hydrogen separation and the palladium plating bath of the present invention can reduce the hydrogen separation membrane to a high purity, reduce the size and weight of the fuel reformer, and improve the efficiency of the reforming reaction. In addition, it is possible to obtain a dense and uniform thin film without pinholes, and it is suitable for a plating bath when a palladium thin film is produced by a plating method as a hydrogen separation film, reducing the amount of plating solution used. A uniform palladium film can be deposited, and the productivity of plating can be improved. For example, it is suitable for producing a hydrogen separation membrane used in a reformed fuel cell.

本発明の薄膜製造に適用した無電解めっき(化学めっき)法による薄膜製造の状況を示す概要図である。It is a schematic diagram which shows the condition of the thin film manufacture by the electroless plating (chemical plating) method applied to the thin film manufacture of this invention. 本発明の薄膜製造に適用したホスフィン酸を還元剤とするめっき液の組成を示す表である。It is a table | surface which shows the composition of the plating solution which uses the phosphinic acid applied to the thin film manufacture of this invention as a reducing agent. 本発明の薄膜製造に適用した基板の形状を示す表である。It is a table | surface which shows the shape of the board | substrate applied to the thin film manufacture of this invention. 本発明の薄膜製造に適用した基板の作製過程における被覆前の表面状況(a)と断面状況(b)を示す写真図である。It is a photograph figure which shows the surface condition (a) and cross-sectional condition (b) before the coating | cover in the preparation process of the board | substrate applied to the thin film manufacture of this invention. 本発明の薄膜製造に適用した基板の作製過程における被覆後の表面状況(a)と断面状況(b)を示す写真図である。It is a photograph figure which shows the surface condition (a) and cross-sectional condition (b) after the coating | coated in the preparation process of the board | substrate applied to the thin film manufacture of this invention.

本発明の薄膜製造に適用した無電解めっき法による薄膜製造過程を順に示す説明図で、(a)はめっき前、(b)はめっき時、(c)はめっき後の状況を示している。It is explanatory drawing which shows in order the thin film manufacturing process by the electroless-plating method applied to the thin film manufacture of this invention, (a) is before plating, (b) is at the time of plating, (c) has shown the condition after plating. 本発明の薄膜製造に適用した超臨界無電解めっき法において、ホスフィン酸を還元剤とするめっき液を使用して、基板表面に析出した薄膜の表面状況(a)と断面状況(b)を示す写真図である。In the supercritical electroless plating method applied to the production of the thin film of the present invention, the surface state (a) and the cross-sectional state (b) of the thin film deposited on the substrate surface using a plating solution containing phosphinic acid as a reducing agent are shown. FIG. 薄膜製造に適用した従来の無電解めっき法において、ホスフィン酸を還元剤とするめっき液を使用して、基板表面に析出した薄膜の表面状況(a)と断面状況(b)を示す写真図である。In the conventional electroless-plating method applied to thin film manufacture, it is the photograph figure which shows the surface condition (a) and the cross-sectional condition (b) of the thin film which deposited on the substrate surface using the plating solution which uses phosphinic acid as a reducing agent. is there. 本発明の第2の実施形態の薄膜製造に適用したホスホン酸を還元剤とするめっき液の組成を示す表である。It is a table | surface which shows the composition of the plating solution which uses the phosphonic acid applied to the thin film manufacture of the 2nd Embodiment of this invention as a reducing agent.

前記第2の実施形態の薄膜製造に適用した超臨界無電解めっき法において、ホスホン酸を還元剤とするめっき液を使用して、基板表面に析出した薄膜の表面状況(a)と断面状況(b)を示す写真図である。In the supercritical electroless plating method applied to the thin film production of the second embodiment, the surface condition (a) and the cross-sectional condition (a) of the thin film deposited on the substrate surface using a plating solution containing phosphonic acid as a reducing agent ( It is a photograph figure which shows b). 薄膜製造に適用した従来の無電解めっき法において、ホスホン酸を還元剤とするめっき液を使用して、基板表面に析出した薄膜の表面状況(a)と断面状況(b)を示す写真図である。In the conventional electroless-plating method applied to thin film manufacture, it is the photograph figure which shows the surface condition (a) and cross-sectional condition (b) of the thin film which deposited on the substrate surface using the plating solution which uses phosphonic acid as a reducing agent. is there. 本発明の第3の実施形態の薄膜製造に適用したトリメチルアミンボランを還元剤とするめっき液の組成を示す表である。It is a table | surface which shows the composition of the plating solution which uses the trimethylamine borane applied to the thin film manufacture of the 3rd Embodiment of this invention as a reducing agent.

前記第2の実施形態の薄膜製造に適用した超臨界無電解めっき法において、ホスホン酸を還元剤とするめっき液を使用して、基板表面に析出した薄膜の表面状況(a)と断面状況(b)を示す写真図である。In the supercritical electroless plating method applied to the thin film production of the second embodiment, the surface condition (a) and the cross-sectional condition (a) of the thin film deposited on the substrate surface using a plating solution containing phosphonic acid as a reducing agent ( It is a photograph figure which shows b). 薄膜製造に適用した従来の無電解めっき法において、ホスホン酸を還元剤とするめっき液を使用して、基板表面に析出した薄膜の表面状況(a)と断面状況(b)を示す写真図である。In the conventional electroless-plating method applied to thin film manufacture, it is the photograph figure which shows the surface condition (a) and cross-sectional condition (b) of the thin film which deposited on the substrate surface using the plating solution which uses phosphonic acid as a reducing agent. is there.

符号の説明Explanation of symbols

1 反応浴
10 めっき液
11 界面活性剤
14 還元剤
18 被めっき物(基板)
DESCRIPTION OF SYMBOLS 1 Reaction bath 10 Plating solution 11 Surfactant 14 Reducing agent 18 To-be-plated object (board | substrate)

Claims (13)

反応浴に収容しためっき液中の金属イオンを被めっき物に析出させる水素分離用薄膜の製造方法において、前記反応浴にめっき液と、超臨界状態またはその形成物質と、界面活性剤とを収容し、該反応浴に超臨界状態とエマルジョン状態とを形成後、前記金属イオンを拡散させ被めっき物に析出させることを特徴とする水素分離用薄膜の製造方法。   In the method for producing a hydrogen separation thin film in which metal ions in a plating solution stored in a reaction bath are deposited on an object to be plated, the plating solution, a supercritical state or a forming material thereof, and a surfactant are stored in the reaction bath. And forming a supercritical state and an emulsion state in the reaction bath, and then diffusing the metal ions to deposit on the object to be plated. めっき液と還元剤とを別々に時間を置いて反応浴に導入する請求項1記載の水素分離用薄膜の製造方法。   The method for producing a thin film for hydrogen separation according to claim 1, wherein the plating solution and the reducing agent are separately introduced into the reaction bath at intervals. 前記被めっき物と、還元剤を除くめっき液とを常時は非接触状態とする請求項1記載の水素分離用薄膜の製造方法。   The method for producing a thin film for hydrogen separation according to claim 1, wherein the object to be plated and the plating solution excluding the reducing agent are always in a non-contact state. 前記被めっき物と、界面活性剤を含むめっき液とを常時は非接触状態とし、前記反応浴の超臨界状態とエマルジョン状態の形成時に、金属イオンを被めっき物に接触させ析出させる請求項1記載の水素分離用薄膜の製造方法。   2. The plating object and a plating solution containing a surfactant are always kept in a non-contact state, and metal ions are brought into contact with the object to be plated when forming a supercritical state and an emulsion state of the reaction bath. The manufacturing method of the thin film for hydrogen separation of description. 前記反応浴の超臨界状態とエマルジョン状態の形成後、前記反応浴に還元剤を導入する請求項1または請求項2記載の水素分離用薄膜の製造方法。   The method for producing a thin film for hydrogen separation according to claim 1 or 2, wherein a reducing agent is introduced into the reaction bath after the supercritical state and emulsion state of the reaction bath are formed. 前記被めっき物にパラジウムイオンを析出させる請求項1記載の水素分離用薄膜の製造方法。   The method for producing a thin film for hydrogen separation according to claim 1, wherein palladium ions are deposited on the object to be plated. 前記反応浴にアルカリ性のめっき液を収容後に超臨界二酸化炭素を導入し、該超臨界二酸化炭素を前記めっき液に溶解し、該めっき液を所定の酸性濃度に調製する請求項1記載の水素分離用薄膜の製造方法。   2. The hydrogen separation according to claim 1, wherein supercritical carbon dioxide is introduced after the alkaline plating solution is contained in the reaction bath, the supercritical carbon dioxide is dissolved in the plating solution, and the plating solution is adjusted to a predetermined acidic concentration. Thin film manufacturing method. 少なくともめっき液にパラジウムイオン供給源を含むパラジウムめっき浴において、前記めっき浴に超臨界状態またはその形成物質と、エマルジョン状態を形成させる界面活性剤とを含ませたことを特徴とするパラジウムめっき浴。   A palladium plating bath characterized in that, in a palladium plating bath containing at least a palladium ion supply source in a plating solution, the plating bath contains a supercritical state or a substance forming the same and a surfactant that forms an emulsion state. 前記パラジウムめっき浴に、パラジウムイオン供給源として塩化パラジウムと、錯化剤としてエチレンジアミンと、還元剤としてホスフィン酸またはホスホン酸またはトリメチルアミンボランとを含む請求項8記載のパラジウムめっき浴。   The palladium plating bath according to claim 8, wherein the palladium plating bath contains palladium chloride as a palladium ion supply source, ethylenediamine as a complexing agent, and phosphinic acid, phosphonic acid, or trimethylamine borane as a reducing agent. 前記パラジウムめっき浴に、パラジウムイオン供給源として塩化パラジウムと、錯化剤としてエチレンジアミンと、還元剤としてホスフィン酸と、改良剤としてチオグリコ−ル酸とを含む請求項8記載のパラジウムめっき浴。   The palladium plating bath according to claim 8, wherein the palladium plating bath contains palladium chloride as a source of palladium ions, ethylenediamine as a complexing agent, phosphinic acid as a reducing agent, and thioglycolic acid as an improving agent. 前記パラジウムめっき浴に、パラジウムイオン供給源として塩化パラジウムと、錯化剤としてエチレンジアミンと、還元剤としてホスホン酸と、改良剤としてチオグリコ−ル酸とを含む請求項8記載のパラジウムめっき浴。   The palladium plating bath according to claim 8, wherein the palladium plating bath contains palladium chloride as a source of palladium ions, ethylenediamine as a complexing agent, phosphonic acid as a reducing agent, and thioglycolic acid as an improving agent. 前記パラジウムめっき浴に、パラジウムイオン供給源として塩化パラジウムと、錯化剤としてエチレンジアミンと、還元剤としてトリメチルアミンボランと、改良剤としてチオグリコ−ル酸とを含む請求項8記載のパラジウムめっき浴。   The palladium plating bath according to claim 8, wherein the palladium plating bath contains palladium chloride as a source of palladium ions, ethylenediamine as a complexing agent, trimethylamine borane as a reducing agent, and thioglycolic acid as an improving agent. 前記めっき液はめっき浴収容時はアルカリ性で、該めっき液に超臨界二酸化炭素を溶解して所定の酸性濃度とする請求項8記載のパラジウムめっき浴。   The palladium plating bath according to claim 8, wherein the plating solution is alkaline when accommodated in the plating bath, and supercritical carbon dioxide is dissolved in the plating solution to have a predetermined acidic concentration.
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