JP2005215794A - Temperature abnormality processing method, and data processor with temperature abnormality processing function - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a temperature abnormality processing system capable of precisely discriminating the cause of a temperature abnormality and rapidly executing a proper treatment. <P>SOLUTION: This system comprises a CPU (central processing unit) 1 controlling each part of an apparatus by multi-tasking; a ROM 2 storing various processing programs of the CPU 1 including a system program; a RAM 3 temporarily storing data of the apparatus; a system peripheral circuit part 4 supporting the processing of the CPU 1; a plurality of temperature sensors composed of thermistors or the like measuring the ambient temperature within the apparatus and the temperature of an electronic device or the like by direct contact therewith; a temperature monitoring circuit 6 regularly monitoring the temperature within the apparatus based on output signal from the temperature sensors 5 and outputting detection signal when it exceeds a preset regulated temperature; a power supply unit 7 supplying power to each part of the apparatus; and a cooling mechanism 8 for cooling the inner part of the apparatus. The temperature monitoring circuit 6 successively switches measures for reducing the temperature rise within the apparatus. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to a temperature abnormality processing method and a data processing apparatus having a temperature abnormality processing function, and in particular, a temperature abnormality processing method and a temperature abnormality processing capable of accurately determining the cause of occurrence of a temperature abnormality and quickly executing an appropriate treatment. The present invention relates to a data processing apparatus having a function.

  2. Description of the Related Art Conventionally, various measures have been taken for temperature abnormality processing in devices such as data processing devices that particularly require reliability. In general, the temperature abnormality detection circuit of the apparatus detects an ambient temperature in the vicinity of a temperature sensor provided in the apparatus, and takes appropriate measures when an abnormal temperature is detected.

  For example, as a conventional treatment method in a device that operates in synchronization with the system clock, a method is proposed in which when the temperature abnormality of the device is detected, the frequency of the system clock is lowered to suppress the heat generation amount of the electronic device. . This method is shown in FIG. In FIG. 5, temperature measurement data is sent to a temperature monitoring circuit (not shown) from a temperature sensor 11 provided in the apparatus. Then, the system clock generator 13 lowers the frequency of the system clock by one step from the current setting by the frequency control program 12. When the system clock frequency cannot be lowered any more and the temperature in the apparatus still does not fall below the reference temperature, the temperature monitoring circuit issues a system disconnection request to the shutdown program 14.

  As a result, the shutdown program 14 performs power-off for the power supply unit 15 after performing end processing (system disconnection processing) for safely interrupting all running programs (for example, Japanese Patent Laid-Open No. Hei. (See 08-328688).

  As another conventional example, a plurality of local temperature sensor groups for measuring a temperature distribution of a predetermined part are installed in a predetermined part of a switchboard configured by housing a heat source element that causes heat generation inside the housing. ing. Further, an ambient temperature sensor for measuring the ambient temperature of the switchboard near the switchboard is installed.

  And the data regarding the temperature rise of the predetermined part of a switchboard are calculated based on the temperature each measured by these local temperature sensor groups and ambient temperature sensors. Further, difference data between the data relating to the temperature rise and the data relating to the temperature rise of the predetermined part of the switchboard during normal operation is calculated, and Walsh transform is performed on the difference data to obtain the correlation coefficient.

  Then, there is a method in which the correctness of the change value of the correlation coefficient is confirmed, abnormality detection is performed, and the energization function of the switchboard is monitored (for example, see JP-A-11-262117).

Japanese Patent Laid-Open No. 08-328688 JP-A-11-262117

  However, when a temperature abnormality occurs in an apparatus or the like, the way to deal with it differs depending on whether the cause is outside the apparatus or where it is inside. As in the prior art example described above, the temperature rise caused by the electronic device cannot be suppressed even if the system clock is lowered. There is a disadvantage that it continues to take life-prolonging measures and eventually leads to file destruction.

  The object of the present invention has been made in view of such problems, and without being limited to the temperature sensing method, it is possible to accurately determine the cause of the occurrence of a temperature abnormality in the apparatus and to take appropriate measures commensurate with the cause. Is to provide a temperature abnormality processing method and a data processing device having a temperature abnormality processing function.

  The temperature abnormality processing method of the present invention is a temperature abnormality processing method for processing a temperature abnormality in an apparatus that includes a cooling means and operates in synchronization with a system clock, and is provided in the vicinity of the cooling air inlet of the apparatus. An atmospheric temperature and an internal temperature of the apparatus are detected, and the operation of the cooling unit and the frequency of the system clock are controlled based on the temperature measurement result.

  A temperature abnormality processing method for processing a temperature abnormality in a device having a cooling means and operating in synchronization with a system clock, wherein the temperature inside the device and the temperature of an electronic device mounted on the device are detected. The operation of the cooling unit and the frequency of the system clock are controlled based on the temperature measurement result, and the cooling unit is a cooling fan.

  A temperature abnormality processing method for processing a temperature abnormality in a device having a cooling fan and operating in synchronization with a system clock, the ambient temperature in the vicinity of the cooling air intake of the device, and the temperature in the device The temperature of the electronic device mounted on the apparatus is detected, and the rotation speed of the cooling fan and the frequency of the system clock are controlled based on the temperature measurement result.

  A step of rotating the air-cooling fan at a high speed when an increase in the ambient temperature is detected; and a step of returning the rotation of the air-cooling fan to a normal rotation when the ambient temperature decreases and returns to a predetermined value. It is characterized by.

  When the temperature continues to rise despite rotating the air cooling fan at a high speed, the step of lowering the frequency of the system clock, and the temperature of the system clock decreases and the system clock frequency and Returning the rotation speed of the air cooling fan to normal.

  The method includes a step of stopping the device when the temperature inside the device rises despite the fact that the frequency of the system clock is lowered.

  A step of rotating the air cooling fan at a high speed when the internal temperature rises before the ambient temperature; and a normal rotation of the air cooling fan when the internal temperature decreases after returning to a predetermined value after the high speed rotation. And a step of returning to step (1).

  When the temperature continues to increase despite the high-speed rotation of the air cooling fan, the system clock frequency is decreased, and the system clock frequency is decreased if the temperature in the apparatus is not a specified value. Continuing the operation in a state, and returning the system clock frequency and the number of rotations of the air-cooling fan to normal when the temperature in the apparatus decreases after the frequency decreases and returns to a specified value. Features.

  The method includes a step of stopping the data processing device when the temperature inside the device is further increased despite the fact that the frequency of the system clock is lowered.

  When the temperature of the electronic device rises before the ambient temperature, the method includes a step of rotating the air cooling fan at a high speed and a step of stopping the data processing device.

  A temperature abnormality processing method for processing a temperature abnormality in a device having a cooling fan and operating in synchronization with a system clock, the ambient temperature in the vicinity of a cooling air intake port in the device, and a device in the device An internal temperature and a temperature of a liquid cooling system for cooling an electronic device mounted on the apparatus are detected, respectively, and the number of rotations of the cooling fan and the frequency of the system clock are controlled based on the temperature measurement result. To do.

  When the temperature of the electronic device liquid cooling system rises before the ambient temperature, the electronic device liquid cooling system includes a step of rotating the air cooling fan at a high speed and a step of stopping the apparatus.

  In these temperature abnormality processing methods, the apparatus is a data processing apparatus.

  A device that operates in synchronization with a system clock, a cooling unit that cools the inside of the device, a plurality of temperature sensors that detect the temperature in the device, a power supply unit that supplies power to each part in the device, A temperature monitoring circuit that controls the frequency of the system clock, the operation of the cooling unit, and the operation of the power supply unit based on changes in measurement data from the plurality of temperature sensors, and the cooling The means is a cooling fan.

  The temperature monitoring circuit includes: first means for monitoring temperature changes based on measurement data from the plurality of temperature sensors; and second means for stopping the operation of the power supply unit based on the measurement data. It is characterized by providing.

  The temperature abnormality processing method and apparatus according to the present invention can perform appropriate temperature abnormality processing by detecting temperature changes at a plurality of locations and determining temperature rise inside the apparatus, and can cause file destruction, data loss, and recovery. There is an effect that it is possible to prevent falling into an impossible state.

  Next, the best mode for carrying out the present invention will be described in detail with reference to the drawings. FIG. 1 is a block diagram for realizing an embodiment of the present invention, and shows a configuration of a data processing apparatus having a temperature abnormality processing function. FIG. 2 is a block diagram showing an electrical configuration including software of the present invention.

  Referring to FIGS. 1 and 2, an apparatus such as a data processing apparatus that operates in synchronization with a system clock according to the present embodiment includes a CPU (central processing unit) 1 that controls each part of the apparatus and a system program. First, a ROM 2 for storing various processing programs of the CPU 1 (such as a temperature rise comparison program 6a and a shutdown program 6b shown in FIG. 2), a RAM 3 for temporarily storing data in the apparatus, a flip-flop circuit for operating the apparatus, A system peripheral circuit unit 4 configured by a number of logic circuits such as an AND circuit and a counting circuit and supporting the processing of the CPU 1, and a thermistor that directly contacts the ambient temperature of the apparatus and an electronic device (circuit) to measure the temperature. A plurality of temperature sensors 5 and the like, and an apparatus based on an output signal from the temperature sensors 5 The temperature monitoring circuit 6 that constantly monitors the temperature of the device and outputs a detection signal when a preset specified temperature is exceeded, a power supply unit 7 that supplies power to each part of the apparatus, and a cooling mechanism for cooling the interior of the apparatus 8.

  The temperature monitoring circuit 6 determines a process for achieving a stable operation of the apparatus based on the event of which part of the temperature started to rise first. By determining the cause of the temperature abnormality based on the location where the temperature starts to rise, it is possible to prevent file destruction and data loss during processing before the apparatus enters an unstable operation.

  Usually, as a cooling medium for a data processing apparatus, air is forcibly circulated to cool the inside of the apparatus, and a temperature sensor is used to monitor whether the main part of the apparatus is maintained at an optimum temperature. This temperature sensor is mounted directly on the base of the device, etc. to measure the ambient temperature, and as seen in recent CPUs, electronic devices that require fine temperature management have a built-in temperature sensor to measure temperature. Some send data externally.

  In the configuration according to the present embodiment, as the temperature sensor 5 of the apparatus, an atmospheric temperature detection temperature sensor 5a installed at the intake of cooling air, an in-apparatus temperature detection temperature sensor 5b attached inside the apparatus, An electronic device temperature detecting temperature sensor 5c attached on the electronic device sensitive to the operating temperature is provided.

  In the temperature monitoring circuit 6, the temperature increase comparison program 6a is based on the measurement data sent from the ambient temperature detection temperature sensor 5a, the in-device temperature detection temperature sensor 5b, and the electronic device temperature detection temperature sensor 5c. Thus, the temperature change in the apparatus is constantly monitored, and when there is an abnormality such as a temperature rise, appropriate processing is immediately executed.

  After the start of temperature monitoring, for example, when the temperature of air for air cooling rises due to a failure of an air conditioner or the like, first, a temperature change appears first. Then, it is detected by the temperature rise comparison program 6a that the temperature sensor 5a for detecting the atmosphere temperature that is measuring the atmosphere starts to rise first. In this case, since the cause of the temperature rise is not inside the apparatus, an attempt is made to rotate the air cooling fan (not shown) of the cooling mechanism 8 at a high speed. Thereby, the operation | movement which increases an air volume and suppresses a temperature rise is implemented.

  Next, when the temperature rise does not stop even when the air cooling fan of the cooling mechanism 8 is rotated at high speed, an attempt is made to suppress the heat generation amount by reducing the clock frequency of the electronic device. If the temperature rise still does not stop, the shutdown program 6b for safely stopping the apparatus is started and the power supply unit 7 is instructed to turn off the power.

  Also, if the value of the temperature sensor 5b for detecting the temperature inside the apparatus is raised before the temperature sensor 5a for detecting the ambient temperature, the abnormality inside the apparatus is considered. Therefore, the shutdown program 6b is started immediately. In addition, there may be a case where dust or the like is clogged in the intake port for taking in air for air cooling, and sufficient air cannot be secured. Even in such a case, stable operation of the apparatus is achieved by sequentially performing high-speed rotation of the air cooling fan and clock-down depending on the situation.

  Furthermore, the value of the temperature sensor 5c for detecting the temperature of the electronic device mounted on the electronic device is the temperature sensor 5a for detecting the ambient temperature that detects the ambient temperature, or the temperature inside the device that detects the temperature inside the device. If it has risen before the sensor 5b, a failure of the electronic device is considered. In such a case, if the apparatus is not stopped immediately, there is a risk of causing file destruction, data loss, or an unrecoverable situation. Therefore, the shutdown program 6b is started in order to immediately stop the apparatus while performing high-speed rotation of the air cooling fan.

  As described above, even when the inside of the apparatus or the ambient temperature rises, there are a plurality of countermeasures for ensuring stable operation depending on the cause. Note that the cooling mechanism 8 in FIG. 1 is a technique well known to those skilled in the art, and is not directly related to the present invention, so that the description thereof is omitted.

  Next, the operation of the embodiment of the present invention will be described in detail with reference to the drawings. FIG. 3 is a flowchart showing an operation flow of the present embodiment.

  Referring to FIGS. 2 and 3, first, the data processing apparatus operating in synchronization with the system clock starts monitoring the temperature of the inside of the apparatus and the electronic device (step 1).

  Next, assuming that the temperature has risen due to a failure of the air conditioning system at the installation location, a temperature rise is observed (step 2). A comparison is made of which sensor being observed the temperature rise first started (step 3).

Here, when the ambient temperature detection temperature sensor 5a first detects a temperature rise;
First, when an increase in the ambient temperature detection temperature sensor 5a is detected, the air cooling fan of the cooling mechanism is rotated at a high speed to increase the air volume and suppress the temperature increase (step 5).

When the temperature rise is stopped by this measure (step 6), it is checked whether or not the temperature has returned to the initial specified value (step 11). If it has returned, the rotation of the air cooling fan is returned to the normal rotation (step 12). Return to the comparison of temperature changes again. If not, the high-speed rotation of the air cooling fan is maintained (step 5), and the temperature change is monitored.

  Next, if the temperature continues to rise even though the air cooling fan is rotated at a high speed, the system clock is lowered (step 7) to suppress heat generation of the CPU and the like. When the temperature rise is stopped by this measure, it is checked whether or not the temperature inside the apparatus has returned to the initial specified value (step 9). If not, the operation is continued in the clock down state.

  When the detected temperature falls to the specified value, the clock is returned to normal (step 10). When the temperature reaches the specified value, the rotational speed of the air cooling fan is also returned to the normal value (step 12), and the comparison is again made for the temperature change. Further, if the temperature inside the apparatus rises despite the continued clock down, since the heat generation cannot be suppressed, the shutdown program is started (step 14) and the apparatus is stopped.

Subsequently, when the value of the temperature sensor 5b for detecting the temperature inside the device attached inside the device rises before the ambient temperature;
Also in this case, the air cooling fan is rotated at a high speed to increase the air volume (step 5), thereby cooling the temperature inside the apparatus. Then, it is confirmed whether or not the internal temperature has further increased (step 6). If the temperature increase has stopped, it is determined whether or not the temperature has returned to the initial specified value (step 11). The rotation of the air cooling fan is returned to the normal rotation (step 12), and the comparison is again made for the temperature change (step 2).

  If the temperature continues to rise despite the high speed rotation of the air cooling fan, the system clock is turned down to suppress heat generation of the CPU (step 7). When the temperature rise is stopped by this measure, it is confirmed whether or not the internal temperature has returned to the initial specified value (step 9), and if not, the operation is continued in the clock down state. When the detected temperature falls and the internal temperature returns to the specified value, the clock is returned to normal (step 10).

  When the temperature reaches the specified value, the rotational speed of the air cooling fan is also returned to the normal value (step 12), and the comparison is again made for the temperature change. Further, if the temperature inside the apparatus rises even though the clock is kept down, since the heat generation cannot be suppressed, the shutdown program is started (step 14) and the apparatus is stopped.

Next, when the value of the electronic device detection temperature sensor 5c incorporated in the electronic device of the apparatus rises before the ambient temperature;
Since this indicates that the cause of the temperature abnormality is in the electronic device, the air cooling fan is rotated at a high speed (step 13), and a shutdown program or the like is immediately started (step 14), so that the file being processed is not destroyed. As soon as possible take stop measures. Even if the clock speed is lowered, there is a high possibility that there is a problem with the electronic device, so that the apparatus will eventually fall into an unrecoverable state, so no clock down action is taken.

  Next, another embodiment of the present invention will be described. FIG. 4 is a block diagram showing an electrical configuration including software according to another embodiment of the present invention.

  Referring to FIG. 4, the basic configuration of another embodiment of the present invention is the same as that of the embodiment shown in FIG. 2 described above. The use of a liquid cooling system is different from the previous example.

  When the electronic device of the apparatus employs a liquid cooling system, the temperature sensor built in the electronic device is hardly cooled by the liquid cooling system even if the electronic device starts to rise in temperature. That is, the value of the temperature sensor built in the electronic device is difficult to reflect the situation.

  For this reason, the temperature of the liquid cooling system of the electronic device is detected without using the temperature sensor built in the electronic device. Specifically, instead of the electronic device temperature detection temperature sensor 5c shown in FIG. 2, as shown in FIG. 4, an electronic device liquid cooling system temperature detection temperature sensor 5d for detecting the temperature of the liquid cooling system is provided.

  In this manner, the object to be monitored is changed to an optimum one, and a state in which a temperature sensor is built in is created. If the temperature sensor 5d for detecting the temperature of the electronic device liquid cooling system starts to rise before the other temperature sensors in the apparatus, a failure of the electronic device is assumed, and a measure is taken to immediately stop the apparatus. Apply.

  Although the present invention has been described by taking a data processing apparatus as an example of a specific embodiment, the temperature abnormality processing method of the present invention is widely used for other devices having high temperature dependence, precision instruments, and the like. be able to.

It is a block diagram which implement | achieves one embodiment of this invention. It is a block diagram which shows the electric constitution containing the software of this invention. It is a flowchart which shows the flow of operation | movement of this Embodiment. It is a block diagram which shows the electric constitution containing the software which is another embodiment of this invention. It is a block diagram which shows an example of the conventional temperature abnormality processing system.

Explanation of symbols

1 CPU
2 ROM
3 RAM
4 System Peripheral Circuit Section 5, 11 Temperature Sensor 5a Temperature Sensor for Atmospheric Temperature Detection 5b Temperature Sensor for In-Device Temperature Detection 5c Temperature Sensor for Electronic Device Temperature Detection 5d Temperature Sensor for Electronic Device Liquid Cooling System Temperature Detection 6 Temperature Monitoring Circuit 6a Temperature Rise comparison program 6b, 14 Shutdown program 7, 15 Power supply unit 8 Cooling mechanism 12 Frequency control program 13 System clock generator

Claims (17)

A temperature abnormality processing method for processing a temperature abnormality in a device having a cooling means and operating in synchronization with a system clock,
An ambient temperature in the vicinity of the cooling air intake of the apparatus and an internal temperature of the apparatus are detected, and the operation of the cooling means and the frequency of the system clock are controlled based on the temperature measurement result. Abnormal temperature processing method. A temperature abnormality processing method for processing a temperature abnormality in a device having a cooling means and operating in synchronization with a system clock,
A temperature abnormality characterized by detecting an internal temperature of the device and a temperature of an electronic device mounted on the device, and controlling the operation of the cooling means and the frequency of the system clock based on the temperature measurement result Processing method. The temperature abnormality processing method according to claim 1, wherein the cooling unit is a cooling fan. A temperature abnormality processing method for processing a temperature abnormality in a device having a cooling fan and operating in synchronization with a system clock,
Detecting the ambient temperature in the vicinity of the cooling air intake of the apparatus, the internal temperature of the apparatus, and the temperature of the electronic device mounted on the apparatus, respectively, and based on the temperature measurement results, A temperature abnormality processing method comprising controlling the frequency of the system clock. In the temperature abnormality processing method according to claim 4, when an increase in the ambient temperature is detected,
Rotating the air cooling fan at a high speed;
And a step of returning the rotation of the air-cooling fan to normal rotation when the ambient temperature decreases and returns to a predetermined value. In the temperature abnormality processing method according to claim 5, when the temperature continues to rise despite the high-speed rotation of the air cooling fan,
Reducing the frequency of the system clock;
And a step of returning the frequency of the system clock and the number of rotations of the air-cooling fan to normal when the temperature in the apparatus decreases and returns to a predetermined value. 7. The temperature abnormality processing method according to claim 6, further comprising a step of stopping the device when the temperature inside the device rises despite the state where the frequency of the system clock is lowered. Abnormal temperature processing method. In the temperature abnormality processing method according to claim 4, when the temperature in the device rises before the ambient temperature,
Rotating the air cooling fan at a high speed;
And a step of returning the air-cooling fan to normal rotation when the temperature inside the apparatus decreases and returns to a predetermined value after high-speed rotation. In the temperature abnormality processing method according to claim 8, when the temperature continues to rise even when the air cooling fan is rotated at a high speed,
Reducing the frequency of the system clock;
If the temperature inside the device is not a specified value, continuing the operation in a state where the frequency of the system clock is reduced,
And a step of returning the frequency of the system clock and the rotational speed of the air-cooling fan to normal when the temperature inside the apparatus drops and returns to a predetermined value after the frequency is lowered. 10. The temperature abnormality processing method according to claim 9, further comprising the step of stopping the data processing device when the temperature inside the device is further increased despite the state where the frequency of the system clock is lowered. An abnormal temperature treatment method. In the temperature abnormality processing method according to claim 4, when the temperature of the electronic device rises before the ambient temperature,
Rotating the air cooling fan at a high speed;
And a step of stopping the data processing apparatus. A temperature abnormality processing method for processing a temperature abnormality in a device having a cooling fan and operating in synchronization with a system clock,
Detect the ambient temperature near the intake of cooling air inside the device, the temperature inside the device and the temperature of the liquid cooling system that cools the electronic device mounted on the device, and based on the temperature measurement results And controlling the number of revolutions of the cooling fan and the frequency of the system clock. In the temperature abnormality processing method according to claim 12, when the temperature of the electronic device liquid cooling system rises before the ambient temperature,
Rotating the air cooling fan at a high speed;
And a step of stopping the apparatus. The temperature abnormality processing method according to any one of claims 1 to 13, wherein the device is a data processing device. A device that operates in synchronization with a system clock, a cooling unit that cools the inside of the device, a plurality of temperature sensors that detect the temperature in the device, a power supply unit that supplies power to each part in the device, A temperature abnormality processing function comprising: a temperature monitoring circuit that controls the frequency of the system clock, the operation of the cooling means, and the operation of the power supply unit based on changes in measurement data from the plurality of temperature sensors. A data processing apparatus. The data processing apparatus having a temperature abnormality processing function according to claim 15, wherein the cooling means is a cooling fan. The temperature monitoring circuit includes: first means for monitoring temperature changes based on measurement data from the plurality of temperature sensors; and second means for stopping the operation of the power supply unit based on the measurement data. The data processing apparatus having a temperature abnormality processing function according to claim 15 or 16, characterized by comprising:

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