WO2011021276A1

WO2011021276A1 - Temperature detection device, information processing equipment and method for controlling temperature detection device

Info

Publication number: WO2011021276A1
Application number: PCT/JP2009/064464
Authority: WO
Inventors: 隆広米澤
Original assignee: 富士通株式会社
Priority date: 2009-08-18
Filing date: 2009-08-18
Publication date: 2011-02-24

Abstract

A clock signal (VOSCTEMP) is generated by controlling a first oscillation unit (13_1) at a temperature-dependent voltage (VREF1), and a clock signal (VOSCREF) is generated by controlling a second oscillation unit (13_2) at a temperature-independent voltage (VREF2). A frequency division unit (14) frequency-divides the clock signal (VOSCTEMP) to obtain a clock signal (VCOUNT). A counting unit (15) compares the clock signal (VCOUNT) and the clock signal (VOSCREF) to obtain temperature information. The temperature detection resolution can be changed by changing the radio of frequency division by the frequency division unit (14).

Description

Temperature detection apparatus, information processing apparatus, and control method for temperature detection apparatus

The present invention relates to a temperature detection device, an information processing device, and a temperature detection device control method.

In an integrated circuit such as a CPU (Central Processing Unit), the operation of the integrated circuit changes due to a temperature change caused by heat generation of the integrated circuit itself. Therefore, techniques for measuring the temperature of integrated circuits have been devised. As a temperature detection device for measuring the temperature of an integrated circuit, a device that compares a reference clock independent of temperature with the number of pulses of a VCO (Voltage Controlled Oscillator) controlled by a temperature-dependent control voltage has been known. Yes. As another temperature detection device, there is known a device that operates a VCO with a reference voltage that does not depend on temperature and a reference voltage that depends on temperature, and obtains a difference in the number of pulses as temperature information.

JP-A 63-304499 Japanese Unexamined Patent Publication No. 1-058124

However, in a device that compares a reference clock that does not depend on temperature and the number of pulses of a VCO that is controlled by a control voltage that depends on temperature, the characteristics of the VCO do not depend on temperature due to variations in the semiconductor manufacturing process or fluctuations in power supply voltage. There was a problem of fluctuation.

In contrast, an apparatus using a pair of VCOs can relatively cancel process variations and fluctuations in power supply voltage and reduce measurement errors. However, in order to increase the measurement accuracy, it is necessary to increase the oscillation frequency of at least one VCO or decrease the oscillation frequency of one VCO. However, since the input range of the VCO control voltage is limited, it is difficult to adjust the resolution.

The present invention has been made in view of the above, and provides a temperature detection device, an information processing device, and a temperature detection device control method capable of suppressing the influence of process variations and power supply voltage fluctuations and changing the resolution. The purpose is to do.

In order to solve the above-described problems and achieve the object, the disclosed temperature detection apparatus, information processing apparatus, and temperature detection apparatus control method are configured such that the first oscillation unit uses the first voltage corresponding to the temperature to change the temperature. A first clock having a frequency corresponding to the output frequency is output, the second oscillation unit outputs a second clock using a second voltage as a reference voltage, and the frequency dividing unit divides the first clock. The third clock is output, and the counting unit counts the number of pulses of the third clock in the period of the pulse width of the second clock.

The disclosed temperature detection apparatus, information processing apparatus, and control method for the temperature detection apparatus are capable of suppressing the influence of process variations and power supply voltage fluctuations and changing the resolution, and controlling the temperature detection apparatus, information processing apparatus, and temperature detection apparatus There is an effect that a method can be obtained.

FIG. 1 is a schematic configuration diagram of a temperature detection apparatus according to a first embodiment. FIG. 2 is a schematic configuration diagram of a first comparative example of the temperature detection device. FIG. 3 is a schematic configuration diagram of a second comparative example of the temperature detection device. FIG. 4 is an explanatory diagram illustrating an example of the configuration of the temperature detection unit 11. FIG. 5 is a schematic configuration diagram of the temperature detection apparatus according to the second embodiment. FIG. 6 is a circuit diagram of the VCO 23_1 shown in FIG. FIG. 7 is a circuit diagram of the SELECTOR 24 shown in FIG. FIG. 8 is a circuit diagram of the DECODER 24a. FIG. 9 is a truth table of the DECODER 24a. FIG. 10 is a circuit diagram of the DATPROC 25 shown in FIG. FIG. 11 is a time chart regarding the trigger pulse and the output VJUD of the temperature detection device 2. FIG. 12 is a circuit diagram of the COUNTER_TEMP 24b and the COUNTER_PROC 25b. FIG. 13 is a circuit diagram of the REGISTER 25c shown in FIG. FIG. 14 is a circuit diagram of the SUBTRACTOR 26 shown in FIG. FIG. 15 is an explanatory diagram of the input / output relationship between the DATPROC 25 and the SUBTRACTOR 26. FIG. 16 is an explanatory diagram of a scan chain included in the temperature detection device 2. FIG. 17 is an explanatory diagram of the boundary scan for the scan chain shown in FIG. FIG. 18 is a schematic configuration diagram of the information processing apparatus according to the third embodiment.

Hereinafter, embodiments of a temperature detection device, an information processing device, and a control method for the temperature detection device will be described in detail with reference to the drawings. Note that this embodiment does not limit the disclosed technology.

FIG. 1 is a schematic configuration diagram of a temperature detection apparatus according to the first embodiment. The temperature detection device 1 illustrated in FIG. 1 includes a temperature detection unit 11, a power supply unit 12, a first oscillation unit 13_1, a second oscillation unit 13_2, a frequency division unit 14, and a counting unit 15.

The temperature detector 11 detects the temperature and outputs a first voltage VREF1 corresponding to the detected temperature. The power supply unit 12 outputs a second voltage VREF2 serving as a reference voltage for the first voltage. The first oscillation unit 13_1 receives the voltage VREF1 and outputs a first clock VOSCTEMP having a frequency corresponding to the voltage VREF1. The frequency divider 14 divides the first clock and outputs a third clock VCOUNT.

The second oscillator 13_2 receives the voltage VREF2, and outputs a second clock VOSCREF having a frequency corresponding to the voltage VREF2. The counting unit 15 receives the second clock VOSCREF and the third clock VCOUNT, counts the number of pulses of the clock VCOUNT during the pulse width period of the clock VOSCREF, and outputs the counting result.

The first oscillator 13_1 and the second oscillator 13_2 are, for example, VCO (Voltage Controlled Oscillator). The first oscillator 13_1 and the second oscillator 13_2 are connected to the same power source and the same ground so as to have the same circuit characteristics, and have the same circuit configuration. In consideration of variations in the chip, the first oscillation unit 13_1 and the second oscillation unit 13_2 are disposed close to each other.

For this reason, variations and power supply noise between the first oscillating unit 13_1 and the second oscillating unit 13_2 are canceled out, and the difference between the outputs of the clock VOSCREF and the clock VOSCTEMP depends only on the temperature.

Since the clock VCOUNT is obtained by dividing the clock VOSCTEMP, the clock VCOUNT has a temperature-dependent difference and a division ratio difference with respect to the clock VOSCTEMP.

If the frequency division ratio of the frequency divider 14 is changed, the resolution can be adjusted without changing the voltage VREF1 or the voltage VREF2.

Specifically, VOSCREF and VOSCTEMP also change due to process variations or voltage fluctuations due to noise or the like, but since the relative difference does not change, the difference between VOSCREF and VOSCTEMP depends only on temperature.

Assuming that the frequency of VOSCTEMP is multiplied by A inside the frequency divider 14, VCOUNT and VOSCTEMP are
VCOUNT = A × VOSCTEMP
Represented as:

Therefore, the temperature difference when VCOUNT at temperature Temp1 is VCOUNT1 and VCOUNT at temperature Temp2 is VCOUNT2 is:
VCOUNT1-VCOUNT2 = A × (VOSCTEMP1-VOSCTEMP2)
It becomes. From this equation, it can be seen that the temperature difference can be increased by increasing A even when the difference between VOSCTEM1 and VOSCTEMP2 is small, that is, when the temperature change is small. Therefore, the resolution can be varied by selecting A.

FIG. 2 is a schematic configuration diagram of a first comparative example of the temperature detection device. In the first comparative example shown in FIG. 2, the reference clock Vck independent of temperature is input to the CK terminal of the counting unit 15_1, and the pulse of the oscillation unit 13_3 controlled by the control voltage Vt depending on temperature is counted in the counting unit 15_1. Input to the EN terminal. The counter 15_1 counts the number of pulses input to the EN terminal during the High or Low of the reference clock Vck.

In the first comparative example, in order to change the resolution of temperature detection, either the reference clock Vck or the control voltage Vt is changed, and it is difficult to change the resolution. In addition, there is a problem that the characteristics of the oscillation unit 13_3 fluctuate regardless of temperature due to process variations of the oscillation unit 13_3 and fluctuations in the power supply voltage.

FIG. 3 is a schematic configuration diagram of a second comparative example of the temperature detection device. In the second comparative example shown in FIG. 3, the first oscillation unit 13_1 is operated using the temperature-dependent reference voltage output from the temperature detection unit 11 as a control voltage, and the number of pulses is counted by the counting unit 15_2. Further, the second oscillating unit 13_2 is operated with a reference voltage that does not depend on the temperature output from the power supply unit 12 as a control voltage, and the counting unit 15_3 counts the number of pulses. The control unit 16 performs temperature measurement using the fact that the difference between the count numbers of the counting unit 15_2 and the counting unit 15_3 depends only on the temperature.

In the second comparative example, by using two oscillating units, process variations and power supply voltage fluctuations can be offset and measurement errors can be reduced. However, in order to change the measurement resolution, the oscillation frequency is changed by changing the voltage supplied to the oscillation unit. Since there is a limit to the range of voltage that can be supplied to the oscillation unit, it is difficult to adjust the resolution in the second comparative example. Further, when the oscillation frequency is increased in order to increase the resolution, there is a problem that the power consumption increases.

In contrast to the first and second comparative examples, the temperature detection device disclosed in FIG. 1 can cancel out process variations in the oscillation unit and fluctuations in the power supply voltage, reduce measurement errors, and set the division ratio. The resolution can be changed easily. In addition, since it is not necessary to increase the voltage supplied to the oscillation unit in order to increase the resolution, the resolution can be improved without increasing the power consumption.

FIG. 4 is an explanatory diagram illustrating an example of the configuration of the temperature detection unit 11. In the example shown in FIG. 4, the temperature detector 11 is configured by connecting a power source 11a, a resistor 11b, and a diode 11c in series, and obtains a voltage VREF1 from between the power source 11a and the resistor 11b. Since the diode 11c has temperature dependency, the voltage VREF1 becomes a DC voltage having temperature dependency due to the output voltage of the diode.

As described above, in the temperature detection device and the control method disclosed in the first embodiment, a voltage having temperature dependency and a voltage not having temperature dependency are supplied to the oscillation unit. In the temperature detection device and its control method, the clock signal oscillated based on the voltage having temperature dependency is divided, and the temperature information is obtained by comparing with the clock signal oscillated based on the voltage not having temperature dependency. .

Therefore, in the temperature detection method and the temperature detection method disclosed in the first embodiment, the temperature detection device, the information processing device, and the temperature detection device that can suppress the influence of process variations and power supply voltage fluctuations and can change the resolution. A control method can be obtained.

FIG. 5 is a schematic configuration diagram of the temperature detection apparatus according to the second embodiment. 5 includes a VGEN 21 that functions as a temperature detection unit 11, a VGEN 22 that functions as a constant pressure power supply having no temperature dependency, VCOs 23_1 and 23_2 that function as oscillation units, and a SELECTOR 24 that functions as a frequency division unit. Have.

Therefore, the VGEN 21 generates the DC voltage VREF1 depending on the temperature. The VGEN 22 generates a DC voltage VREF2 that does not depend on temperature. These VREF1 and VREF2 are supplied as control voltages for the VCOs 23_1 and 23_2.

Furthermore, the temperature detection device 2 includes a DATPROC 25 that functions as a counting unit, a SUBTRACTOR 26 that functions as a comparison unit that compares the counting result with a predetermined value, and a D-FF 27 that is a flip-flop circuit.

The VCO 23_1 is controlled by a temperature-dependent voltage VREF1. The VCO 23_2 is controlled by a voltage VREF2 that does not depend on temperature. Further, the output VOSCTEMP of the VCO 23_1 is input to the SELECTOR 24, and the output of the SELECTOR 24 is obtained as VCOUNT. VCO1 and VCO2 are connected to the same power source and the same ground so as to have the same circuit characteristics, and have the same circuit configuration. In consideration of variations in the chip, VCO1 and VCO2 are arranged close to each other on the layout. As a result, variations in VCO 23_1 and VCO 23_2 and power supply noise are offset, and the difference between VOSCREF and VOSCTEMP depends only on temperature.

Since VCOUNT is obtained by dividing VOSCTEMP, as a result, the difference between VOSCREF and VCOUNT depends only on temperature. Therefore, when adjusting the resolution of the temperature detecting device 2, it can be adjusted by the SELECTOR 24 without raising or lowering the control voltage of the VCOs 23_1 and V_2.

FIG. 6 is a circuit diagram of the VCO 23_1 shown in FIG. The VCO 23_1 is a ring oscillator in which three differential amplifiers 23a to 23c are connected, and is strong against power supply noise. A DC bias is applied to VIN_RING, which is an input to the VCO 23_1, and an output VOUT_RING having a frequency controlled by VIN_RING can be obtained. Note that the VCO 23_2 has the same configuration as the VCO 23_1.

FIG. 7 is a circuit diagram of the SELECTOR 24 shown in FIG. The SELECTOR 24 includes a COUNTER_TEMP 24b that receives the VOSCTEMP output from the VCO 23_1 as an input. The COUNTER_TEMP 24b creates and outputs eight clock signals VT0 to VT7 in which the VOSCTEMP cycle is 1 time, 2 times, 4 times, 8 times, 16 times, 32 times, 64 times, and 128 times. VT0 to VT7 are input to PASSSTR_p0 to PASSSTR_p7, respectively.

Further, the SELECTOR 24 has a DECODER 24a inside thereof. The DECODER 24a receives VSEL 0 to 2 indicating the frequency division ratio setting value for setting the frequency division ratio from the outside. Since each of VSEL0 to VSEL2 is a 1-bit signal, one of PASSSTR_p0 to PASSSTR_p7 can be specified by 3 bits of VSEL0 to VSEL2. FIG. 8 is a circuit diagram of the DECODER 24a. FIG. 9 is a truth table of DECODER 24a.

Thus, the SELECTOR 24 can selectively output one of VT0 to VT7 by selecting PASSSTR based on the designation of VSEL0 to 2.

FIG. 10 is a circuit diagram of the DATPROC 25 shown in FIG. The inputs to DATPROC 25 are the output VOSCREF of VCO 23_2 and the output VCOUNT of SELECTOR 24. The outputs of DATPROC 25 are VJTRG and VB.

VDTRG is used as a trigger pulse used when the data of the output VD of the COUNTER is taken into the REGISTER 25c, and is generated by using three D-FFs 25a_1 to 3, an AND circuit and a NOR circuit. This VDTRG is generated after detecting the down edge of VCOUNT and counting is completed. Further, the count data taken into the REGISTER 25c is output as VQ.

VJTRG is generated using VDTRG, and is used as a trigger pulse when using final determination as to whether or not the temperature determination value is exceeded, and as a reset pulse for COUNTER_PROC 25b. VJTRG is generated by the AND circuit and D-FF 25a_4 using the output of VDTRG.

FIG. 11 is a time chart regarding the trigger pulse and the output VJUD of the temperature detection device 2. VDTRG generates a one-shot trigger pulse at the second up-edge of VOSCREF when VCOUNT is at a low level. VJTRG generates a one-shot trigger pulse at the third up-edge of VOSCREF when VCOUNT is at low level. Then, in consideration of the delay until the SUBTRACTOR 26 performs arithmetic processing and outputs the result, the delay from the VDTRG generation timing to the generation of VJTRG is intentionally given.

FIG. 12 is a circuit diagram of COUNTER_TEMP 24b and COUNTER_PROC 25b. COUNTER_TEMP 24b uses VOSCTEMP as VCK. COUNTER_PROC 25b uses VCOUNTIN shown in FIG. 10 as VCK. As shown in FIG. 12, COUNTER_TEMP 24b and COUNTER_PROC 25b have 8 JK-FFs, and obtain 8 bits of outputs VCQ0 to VCQ7 of each JK-FF.

FIG. 13 is a circuit diagram of the REGISTER 25c shown in FIG. The REGISTER 25c has 8 D-FFs, and the 8-bit output of the COUNTER_PROC 25b becomes the 8-bit input of the REGISTER 25c. The D-FF CK is input as a trigger pulse used when VDTRG captures data into the D-FF. The 8-bit data taken in by VDTRG becomes an 8-bit output of VQ0 to VQ7. The 8-bit outputs VQ0 to VQ7 become the 8-bit inputs VB0 to VB7 to the SUBTRACTOR 26.

FIG. 14 is a circuit diagram of the SUBTRACTOR 26 shown in FIG. The SUBTRACTOR 26 receives VSUBREF from an external input terminal, and compares the output VSUBTEMP and VSUBREF of the DATPROC 25 to obtain an output VSUB.

VSUBREF is a temperature judgment value indicated by 8 bits of VA0 to VA7. The value of VSUBREF can be obtained in advance, for example, by simulation. The SUBTRACTOR 26 has eight full adders FA0 to FA7, and subtracts 8 bits of VA0 to VA7 and 8 bits of VB0 to VB7.

When the output VSUB of the SUBTRACTOR 26 is 0, VSUBREF is larger than the output VSUBTEMP of the DATPROC 25, indicating that the object to be measured is below the temperature determination value. When VSUB is 1, VSUBREF is a smaller value than VSUBTEMP, indicating that the temperature measurement object exceeds the temperature determination value.

The data of the signal VSUB indicating whether or not the judgment value is exceeded is taken into the D-FF 27 shown in FIG. 5 by the VJTRG and output as VJUD.

FIG. 15 is an explanatory diagram of the input / output relationship between the DATPROC 25 and the SUBTRACTOR 26. DATPROC 25 has an 8-bit output from VB0 to VB7 and becomes an 8-bit input of SUBTRACTOR26. In addition to VB0 to VB7, SUBTRACTOR26 has an 8-bit input terminal from VA0 to VA7, and VA0 to VA7 correspond to each bit of VSUBREF.

FIG. 16 is an explanatory diagram of a scan chain that the temperature detection device 2 has. The temperature detection device 2 has 11 LATCH_L1 to L10. Of LATCH_L1 to L10, LATCH_L1 to L7 correspond to VA0 to VA7. Of LATCH_L1 to L10, LATCH_L8 to L10 correspond to VSEL0 to VSEL2.

FIG. 17 is an explanatory diagram of the boundary scan for the scan chain shown in FIG. As shown in FIG. 17, the 11 flip-flops BSC0 to BSC10 of the boundary scan are connected in correspondence with LATCH_L1 to L10. Then, the value is shifted from TDI to TDO, that is, from flip-flops BSC0 to BSC10, and taken into LATCH_L0 to LATCH_L10.

As described above, the temperature detection method and the temperature detection method disclosed in the second embodiment can suppress the influence of process variations and power supply voltage variations and change the resolution in the same manner as the first embodiment.

In addition, in the second embodiment, the resolution is changed by receiving the inputs of VSEL 0 to 2 from the external system, storing them in LATCH_L 8 to L 10, and changing the division ratio based on the values of VSEL 0 to 2.

In the second embodiment, the temperature determination value VSUBREF is received from an external system, stored in LATCH_L0 to L7, and a comparison result VJUD between the detected temperature and the temperature determination value is output to the outside. By using this external result, for example, by the arithmetic processing unit, it is possible to stop or start the calculation based on whether or not the circuit temperature has reached or exceeded the determination value.

In the second embodiment, the case where there is one type of temperature determination value is illustrated. However, for example, a storage unit that stores a plurality of temperature determination values in the temperature detection device 2 and any one of the stored plurality of temperature determination values. You may comprise so that the selection part to select may be given.

FIG. 18 is a schematic configuration diagram of the information processing apparatus according to the third embodiment. The LSI 3 that is the information processing apparatus shown in FIG. 18 is a large-scale integrated circuit in which the temperature detection apparatus 2 disclosed in the second embodiment and four CPU cores 31 to 34 that operate as arithmetic processing apparatuses are connected. is there.

Since there is a temperature range in which the CPU cores 31 to 34 operate properly, by obtaining the temperature of the LSI 3 from the temperature detection device 2, it is possible to prevent malfunction due to temperature abnormality.

Further, when the CPU cores 31 to 34 perform arithmetic processing, the temperature inside the LSI 3 changes according to the operation status. Since the heat generated by the operation of the CPU cores 31 to 34 is dominant to the temperature of the LSI 3, it is effective to control the temperature by controlling the operation of the CPU cores 31 to 34.

By using the VJUD up-edge or high-level information that is the output of the temperature detection device 2 as a signal for clock control and power supply voltage control of each of the CPU cores 31 to 34, the internal temperature of the LSI 3 can be kept optimal. .

As described above, the information processing device disclosed in the third embodiment controls the temperature of the LSI 3 by controlling the arithmetic processing device using the highly accurate temperature information obtained from the temperature detection device 2 capable of changing the resolution. Therefore, the reliability of the information processing apparatus can be improved.

1, 2 Temperature detector 3 LSI
DESCRIPTION OF SYMBOLS 11 Temperature detection part 11a Power supply 11b Resistance 11c Diode 12 Power supply part 13_1 1st oscillation part 13_2 2nd oscillation part 13_3 Oscillation part 14 Dividing part 15,15_1-15_3 Counting part 16

Control part

21,22 VGEN
23_1, 23_2 VCO
23a, 23b, 23c Differential amplifier 24 SELECTOR
24a DECODER
24b COUNTER_TEMP
25 DATPROC
25a_1 ~ 4,27 D-FF
25b COUNTER_PROC
25c REGISTER
26 SUBTRACTOR
31-34 CPU core

Claims

A temperature detector that detects a temperature and outputs a first voltage corresponding to the detected temperature;
A power supply unit that outputs a second voltage serving as a reference voltage of the first voltage;
A first oscillation unit that outputs a first clock having a frequency corresponding to the first voltage to be input;
A second oscillation unit that outputs a second clock having a frequency corresponding to the second voltage to be input;
A frequency divider that divides the input first clock and outputs a third clock;
A counting unit that inputs the second clock and the third clock, counts the number of pulses of the third clock in a period of the pulse width of the second clock, and outputs a counting result; A featured temperature detection device.
The temperature detection device is connected to an electronic device, and the temperature detection device further includes:
A storage unit for storing a predetermined value;
The temperature detection device according to claim 1, further comprising: a comparison unit that outputs a notification signal to the electronic device based on a comparison result between the counting result and the predetermined value.
The temperature detection device is connected to an arithmetic processing device that performs an operation,
The temperature detecting device further includes
A storage unit for storing a predetermined value;
A comparison unit that compares the count result with the predetermined value and outputs a notification signal to the arithmetic processing unit based on a comparison result between the predetermined value output by the selection unit and the count result; The temperature detection device according to claim 1, wherein
The temperature detection device according to claim 2 or 3, wherein the arithmetic processing device stops or starts the arithmetic operation when a notification signal from the comparison unit is input.
The temperature detection device according to claim 1, wherein the power supply unit includes a constant voltage circuit that outputs the second voltage as a constant voltage.
A temperature detector that detects a temperature and outputs a first voltage corresponding to the detected temperature;
A power supply for outputting a second voltage;
A first oscillating unit that inputs the first voltage and outputs a first clock having a frequency corresponding to the first voltage;
A second oscillator that inputs the second voltage and outputs a second clock having a frequency corresponding to the second voltage;
A frequency divider that inputs the first clock, divides the first clock, and outputs a third clock;
A counting unit that inputs the second clock and the third clock, counts the number of pulses of the third clock in a period of the pulse width of the second clock, and outputs a counting result;
A storage unit for storing a predetermined value;
A comparison unit that compares the count result with the predetermined value and outputs a notification signal based on a comparison result between the predetermined value and the count result;
An information processing apparatus comprising: an arithmetic processing device that performs an arithmetic operation and stops or starts the arithmetic operation when the notification signal is input.
The information processing apparatus further includes:
A frequency division ratio storage unit for storing a frequency division ratio setting value for setting a frequency division ratio of the frequency division unit;
The information processing apparatus according to claim 6, further comprising: a system control device that controls setting of the division ratio setting value for the division ratio storage unit.
In the control method of the temperature detection device,
A first oscillator that outputs a first clock having a frequency corresponding to a first voltage having a value corresponding to a temperature;
A step of outputting a second clock having a frequency according to a second voltage input from the power supply unit by the second oscillation unit;
A frequency divider that divides the first clock and outputs a third clock;
The temperature detecting device includes a step of counting a number of pulses of the third clock in a period of a pulse width of the second clock, and outputting a counting result, the counting unit included in the temperature control device. Control method.
The temperature detection device is connected to an arithmetic processing device that performs an operation,
The method for controlling the temperature detection device further includes:
The comparison unit included in the temperature control device compares the count result with a predetermined value stored in the storage unit,
The temperature detection device control method according to claim 8, wherein a notification signal is output based on a comparison result between the predetermined value and the counting result.
10. The temperature detection device control method according to claim 9, wherein the arithmetic processing device stops the arithmetic operation when a notification signal from the comparison unit is input.