KR101361413B1 - Apparatus and method for controlling clock of center process unit - Google Patents

Abstract

The present invention relates to an apparatus and method for controlling a clock of a central processing unit for controlling a clock of a central processing unit by sensing a temperature of a peripheral element of a central processing unit. The present invention is provided with a basic measuring unit for measuring the temperature of the central processing unit, and an additional measuring unit for measuring the temperature of each of the peripheral elements of the central processing unit. And a comparison processor configured to output a clock control signal for controlling the temperature of the central processing unit when the temperature of the central processing unit is greater than or equal to the reference temperature or when at least one of the peripheral elements is greater than or equal to the reference temperature. According to the present invention as described above there is an advantage that can protect the central processing unit and its peripheral elements.

Central processing unit, CPU, clock control, heat generation control, peripheral device, temperature

Description

Apparatus and method for controlling clock of center process unit}

The present invention is to control the clock of the central processing unit (Center Process Unit) of the computer, in particular, it is possible to protect the central processing unit and its peripheral elements by controlling the clock of the central processing unit through the temperature sensing of the peripheral element of the central processing unit. The present invention relates to a clock control apparatus and a method of a central processing unit.

Recent developments in technology have resulted in improvements in performance due to the miniaturization, high speed, and high capacity of computers, thereby increasing the amount of heat generated by electronic components constituting the computer. In particular, since the central processing unit has a very high integration rate and operates at a high speed, it is the most heat-producing part among the components of the computer.

Therefore, various methods for controlling the heat generation of the central processing unit have been developed.

Among them, thermistor which can sense the temperature of the central processing unit is used to increase the temperature of the central processing unit by reducing the number of clocks of the central processing unit. There is a way to control it.

However, as described above, the temperature control of the central processing unit has a problem in that it does not cope with the defect phenomenon of the peripheral elements of the central processing unit. That is, when the heat generation of the central processing unit affects the peripheral devices located in the periphery of the central processing unit, the performance of the peripheral devices may be degraded, leading to malfunctions and failures as well as the entire system may become unstable. . That is, for example, an inductor and an FET constituting a power supply circuit for applying power to the central processing unit, and a CPU IC connected to the central processing unit. If the temperature of the inductor increases, saturation may occur to cause a short to the power supply circuit. If the temperature of the FET also increases, power consumption may increase and burnt may occur. Likewise, the CPU IC may cause a malfunction if its temperature is increased. As such, the peripheral elements need to be protected from heat to ensure their operational stability.

Therefore, according to a feature of the present invention for solving the above problems, the present invention includes a basic measuring unit for measuring the temperature of the central processing unit; An additional measuring unit measuring a temperature of each of the peripheral elements of the central processing unit; And a comparison processor configured to output a clock control signal for temperature control of the central processing unit when the temperature of the central processing unit is greater than or equal to the reference temperature or when at least one of the peripheral elements is greater than or equal to the reference temperature. .

An additional measuring unit measuring a temperature of each of the peripheral elements of the central processing unit; And a comparison processor configured to output a clock control signal to control the temperature of the CPU when the temperature of at least one of the peripheral elements is greater than or equal to the reference temperature.

The basic measuring unit is a thermistor whose resistance value changes according to the temperature of the central processing unit.

The additional measuring unit includes a temperature sensor and a resistor connected in series to each of the peripheral devices.

The temperature sensor is a switch that is turned on when the sensed temperature of the peripheral element is greater than or equal to the reference temperature, and the resistance has a different resistance value according to the peripheral element.

The additional measuring unit is connected in parallel with the basic measuring unit.

The peripheral element includes any one of an inductor, a FET, and a CPU IC constituting a power supply circuit of the central processing unit.

The comparison processing unit may include: a comparing unit comparing the voltage applied to the additional measuring unit with a reference voltage; And a switch unit that is turned on / off according to the output of the comparator.

The comparison processing unit transmits a clock control signal for reducing the clock of the central processing unit when the voltage applied to the additional measuring unit is less than the reference voltage.

Sensing temperature of peripheral elements of the central processing unit; Comparing the sensed temperature with a preset device reference temperature; Transmitting a clock control signal to the central processing unit for temperature control of the central processing unit when the temperature of at least one of the peripheral devices is greater than or equal to a preset device reference temperature as a result of the comparison; And controlling the clock of the central processing unit.

Sensing a temperature of the central processing unit; If the detected temperature of the central processing unit is equal to or less than the CPU reference temperature, while driving the central processing unit normally, sensing the temperatures of the peripheral elements of the central processing unit; Transmitting a clock control signal to the central processing unit for temperature control of the central processing unit when at least one of the sensed temperatures of the peripheral devices is equal to or higher than an element reference temperature; And controlling the clock of the central processing unit.

If the temperature of the peripheral device is above the device reference temperature, the step of switching to the current to conduct the resistance connected to the peripheral device is configured.

The method may further include comparing a voltage applied to a resistor connected to the peripheral device with a reference voltage.

When the voltage applied to the resistor connected to the peripheral element is less than or equal to the reference voltage, a clock control signal for reducing the number of clocks of the central processing unit is transmitted to the central processing unit.

The temperature of any one of the inductor, the FET, and the CPU IC constituting the power supply circuit of the central processing unit is measured.

When the detected temperature of the central processing unit exceeds the CPU reference temperature, the clock of the central processing unit is controlled to reduce the number of clocks of the central processing unit.

In the apparatus and method for controlling a clock of a central processing unit according to the present invention as described in detail above, the following effects can be obtained.

First, in the present invention, even when one peripheral element rises above a set value, the controller senses this and controls the number of clocks of the central processing unit, thereby protecting the peripheral element weak against heat.

In addition, in the present invention, since defects of the peripheral elements that may occur due to the high temperature are prevented, the operation of the entire system as well as the operation of the central processing unit is stabilized.

Hereinafter, the apparatus and method for controlling a clock of the above-described central processing unit will be described with reference to FIGS. 1 to 4.

1 is a circuit diagram showing a first embodiment according to the present invention.

As shown, the clock control device of the central processing unit includes peripheral elements D ₁ , D ₂ , and D _{3 which} are positioned around the central processing unit 100 and are heat sensitive. That is, the peripheral devices D ₁ , D ₂ , and D ₃ are preferably electronic devices that may cause a defect phenomenon when placed in a high temperature state by heat generation of the central processing unit. For example, the peripheral devices D ₁ , D ₂ , and D ₃ include any one of an inductor, an F FET, and a CPU IC constituting a power supply circuit of the central processing unit 100.

In addition, an additional measuring unit 200 for measuring the temperature of the peripheral elements (D ₁ , D ₂ , D ₃ ). The additional measuring unit 200 is a temperature sensor switch (SW ₁ , SW ₂ , SW ₃ ) and the temperature sensor switch (SW ₁ , SW ₂ , SW ₃ ) connected to the peripheral elements (D ₁ , D ₂ , D ₃ ). ) And resistors R ₁ , R ₂ and R ₃ connected in series.

The temperature sensor switches SW ₁ , SW ₂ , and SW ₃ measure temperatures of the peripheral elements D ₁ , D ₂ , and D ₃ , respectively, and switch them according to the temperature. For example, when the temperature of the peripheral elements (D ₁ , D ₂ , D ₃ ) is higher than the reference temperature, the temperature sensor switches SW ₁ , SW ₂ , SW ₃ are turned on and vice versa. When the temperature of the first peripheral element D ₁ and the second peripheral element D ₂ is equal to or greater than each reference temperature, the first temperature sensor switch SW ₁ and the second temperature sensor switch SW ₂ are The first resistor R ₁ and the second resistor R ₂ are connected in parallel with each other while being turned on. In this case, the resistors R ₁ , R ₂ , and R ₃ preferably have different resistance values according to the peripheral elements D ₁ , D ₂ , and D ₃ .

In addition, it includes a sensing node (N _S ) that outputs according to the operation of the additional measuring unit 200. The sensing node N _S is a point on the connection line L connected in parallel with the additional measuring unit 200. The connection line L may be connected in series with a short preventing resistor R _S for preventing a short circuit of the circuit, and the short preventing resistor R _S is connected to a ground voltage line GND. In this case, a temperature sensing signal V _TS having a voltage that changes according to the temperature of the peripheral elements D ₁ , D ₂ , and D ₃ is output from the sensing node N _S. The voltage of the temperature sensing signal V _TS is determined by the combined resistance value of the resistors R ₁ , R ₂ , and R ₃ connected in parallel to the connection line L.

The temperature sensing signal V _TS appearing in the sensing node N _S is converted into a form of a logic signal required by the central processing unit 100 by the comparison processing unit 300. In order to perform such signal conversion, the comparison processing unit 300 includes a current supply unit 310, a reference voltage unit 320, a comparison unit 330, and a switch unit 340.

The current supply unit 310 supplies a current to the additional measuring unit 200 to generate a voltage of the temperature detection signal (V _TS ), and the reference voltage unit 320 is the temperature detection signal (V _TS ). It provides a reference voltage (V _ref ) to be compared with the voltage of.

The comparator 330 includes an operational amplifier OP, and outputs a high or low signal by comparing the reference voltage V _ref with the temperature sensing signal V _TS . . That is, when the voltage of the temperature sensing signal V _TS is lower than the reference voltage V _ref , the operational amplifier OP outputs a high signal, whereas the voltage of the temperature sensing signal V _TS is the reference voltage. If it is higher than (V _ref ), a low signal is output.

The switch unit 340 is turned on or off according to the output of the comparison unit 330, and comprises a switching transistor (Q). That is, when the high signal is output from the operational amplifier OP, the switching transistor Q is turned on, and a clock control signal for reducing the number of clocks of the central processing unit 100 is sent to the central processing unit 100. Delivered.

Hereinafter, the operation of the first embodiment according to the present invention having the configuration as described above will be described with reference to FIG.

First, when the operation of the computer system is started, the temperature sensor switches SW ₁ , SW ₂ , and SW ₃ measure the temperature of each peripheral device D ₁ , D ₂ , and D ₃ (S100) to determine the peripheral device D. ₁ , D ₂ , D ₃ ) and compare with the reference temperature (S110). For convenience of description, it is assumed that the reference temperature (hereinafter referred to as element reference temperature) and the measurement temperature for each of the peripheral elements D ₁ , D ₂ , and D ₃ are as shown in Table 1.

First peripheral element D ₁ Second peripheral element (D ₂ ) Third peripheral element (D ₃ ) Reference temperature 95 ℃ 70 ℃ 80 ℃ Measurement temperature (example 1) 85 ℃ 64 ° C 85 ℃ Measurement temperature (example 2) 90 ° C 60 ° C 70 ℃ Measurement temperature (example 3) 96 ℃ 68 ° C 82 ° C

In Example 1, since the measured temperature of the first peripheral element (D ₁ ) and the measured temperature of the second peripheral element (D ₂ ) are respectively less than the corresponding element reference temperature, the first to second temperature sensor switch (SW) ₁ , SW ₂ is turned off (S112).

On the other hand, since the measurement temperature of the third peripheral element D ₃ exceeds the corresponding element reference temperature, the third temperature sensor switch SW ₃ is turned on (S114), and the current is transmitted to the third resistor R ₃ . Is flowed (S120).

Thereafter, the voltage at the sensing node N _S to which the third resistor R ₃ is connected, that is, the voltage of the temperature sensing signal V _TS is compared with the reference voltage V _ref (S130). In this case, the voltage of the temperature detection signal V _TS is a product of the third resistor R ₃ and the current supplied from the current supply unit 310. For example, when the resistance value of the third resistor R ₃ is 20 mA and the current value supplied by the current supply unit 310 is 54 mA, the voltage of the temperature detection signal V _TS is 1.08 V (20 mA). X 54 kV). At this time, when the reference voltage V _ref provided by the reference voltage unit 320 is 1.20 V, the voltage of the temperature detection signal V _TS is less than the reference voltage V _ref . Therefore, a high signal is outputted from the operational amplifier OP, and the switching transistor Q is turned on so that the clock control signal for reducing the number of clocks of the central processing unit 100 is the central processing unit 100. It is delivered to (S140).

As a result, the number of clocks of the central processing unit 100 is reduced (S150). Then, the process is repeated from the 100th step of measuring the temperature of each device.

In the case of Example 2, since the measured temperatures of the peripheral elements (D ₁ , D ₂ , D ₃ ) are all less than the element reference temperature, all of the temperature sensor switches SW ₁ , SW ₂ , SW ₃ are turned off (S112). ). That is, since the resistors R ₁ , R ₂ , and R ₃ are not all connected, the voltage of the temperature sensing signal V _TS is a default voltage determined at design time, that is, the output of the operational amplifier OP is a low signal. Since it is a value to be output, of course, it has a value larger than the reference voltage (V _ref ) (S130). Therefore, the clock number of the central processing unit 100 is maintained as it is, and is repeated from the step 100.

In example 3, since the measured temperature of the second peripheral element (D ₂ ) is less than the corresponding element reference temperature, the second temperature sensor switch (SW ₂ ) is turned off (S112). On the other hand, since the measured temperatures of the first and third peripheral elements D ₁ and D ₃ are respectively lower than the corresponding element reference temperature, the first and third temperature sensor switches SW ₁ and SW ₃ are turned on (S114). ), Current flows to the first and third resistors R ₁ and R ₃ and connected in parallel to each other (S120).

Thereafter, the voltage of the temperature detection signal V _TS is compared with the reference voltage V _ref (S130). In this case, the voltage of the temperature sensing signal V _TS is a product of the combined resistance of the first and third resistors R ₁ and R ₃ and the current supplied from the current supply unit 310. For example, if the resistance values of the first and third resistors R ₁ and R ₃ are 30 kΩ and 20 kΩ, respectively, the combined resistance of the two resistors is 12 kΩ. Applying this, the voltage of the temperature detection signal (V _TS ) is 0.648V (12㏀ × 54㎂), which is less than the reference voltage of 1.20V. That is, a high signal is output from the operational amplifier OP. Accordingly, the switch control transistor Q is turned on to reduce the number of clocks of the central processing unit 100. 100) (S140).

As a result, the number of clocks of the central processing unit 100 is reduced (S150), and then repeated from the 100th step.

3 is a circuit diagram showing a second embodiment according to the present invention.

As shown, the clock control device of the central processing unit includes the peripheral elements D ₁ , D ₂ , D ₃ described in the first embodiment and the additional measuring unit 200.

And, it includes a basic measuring unit 400 for sensing the temperature of the central processing unit (100). The basic measuring unit 400 is composed of a thermistor (R _NTC ), the thermistor (R _NTC ) is installed in the main board, the resistance value changes according to the temperature of the central processing unit (100). For example, the thermistor R _NTC has a low resistance value when the temperature of the central processing unit 100 increases, and conversely, a high resistance value when the temperature of the central processing unit 100 decreases. Here, the thermistor R _NTC is connected in parallel with the resistors R ₁ , R ₂ , and R ₃ .

In addition, the sensing unit (N _S ) in which the output according to the operation of the additional measuring unit 200 and the basic measuring unit 400 is included. Unlike the first embodiment, the sensing node N _S is a contact point between the additional measuring unit 200 and the basic measuring unit 400. Of course, as in the first embodiment, the short-circuit resistance R _S may be connected in series with the basic measuring unit 400. At this time, the voltage of the temperature detection signal (V _TS ) output from the sensing node (N _S ) is a combined resistance of the thermistor (R _NTC ) and the resistor (R ₁ , R ₂ , R ₃ ) connected in parallel thereto. Determined by the value.

The temperature sensing signal V _TS appearing in the sensing node N _S is converted into a form of a logic signal required by the central processing unit 100 by the comparison processing unit 300. In order to perform such signal conversion, the comparison processing unit 300 includes a variable current supply unit 312, a variable reference voltage unit 322, the comparison unit 330, and the switch unit 340.

The variable current supply unit 312 is a first and second current supply unit (CS ₁ , CS ₂ ) for supplying a different current so as to supply a different current according to the temperature of the central processing unit 100 and for selecting it It is configured to include a switch for controlling the current (I_SW). For example, when the current of 54 mA is supplied from the first current supply unit CS ₁ and the current of 6 mA is supplied from the second current supply unit CS ₂ , it is supplied when the current control switch I_SW is turned off. The current value is 54 mA and the current value supplied at turn-on is 60 mA. In particular, the current control switch I_SW is designed to operate according to the temperature of the central processing unit 100, and is turned on when the temperature of the central processing unit 100 is low.

The variable reference voltage unit 322 includes first and second reference voltage units VS ₁ and VS ₂ having different voltages and a reference voltage selection switch V_SW for selecting them. The reference voltage selection switch V_SW is designed to operate according to the state of the current adjustment switch I_SW. For example, the first reference voltage unit VS ₁ turns on the voltage of 1.23V and the second reference voltage unit VS ₂ turns on the current control switch I_SW under an environment of providing a voltage of 1.20V. when, the switch for selecting the reference voltage (V_SW) is operated to select the second reference voltage unit (VS ₂₎ having a low voltage of the first and second reference voltage part (VS _1, VS _2).

Since the comparison unit 330 and the switch unit 340 are the same as in the first embodiment, description thereof will be omitted.

Hereinafter, the operation of the second embodiment of the present invention having the configuration as described above will be described with reference to FIG.

First, when the operation of the computer system is started, the temperature of the central processing unit 100 is measured (S200) and compared with the reference temperature (hereinafter referred to as CPU reference temperature) of the central processing unit 100 (S210). . For convenience of description, it is assumed that the CPU reference temperature, the element reference temperature, and the measurement temperature for each of the central processing unit 100 and the peripheral elements D ₁ , D ₂ , and D ₃ are shown in Table 2.

Central Processing Unit First peripheral element D ₁ Second peripheral element (D ₂ ) Third peripheral element (D ₃ ) Reference temperature 120 DEG C 95 ℃ 70 ℃ 80 ℃ Measurement temperature (example 4) 100 ℃ 85 ℃ 65 ℃ 90 ° C Measurement temperature (example 5) 140 ° C 100 ℃ 68 ° C 93 ℃

In the case of Example 4, since the temperature of the central processing unit 100 is less than the CPU reference temperature, the central processing unit 100 is normally driven to measure the temperature of the peripheral elements (D ₁ , D ₂ , D ₃ ). It becomes (S220). Then, the measured temperatures of the peripheral devices (D ₁ , D ₂ , D ₃ ) are compared with the respective device reference temperatures (S230). In this case, since only the third peripheral element D ₃ is greater than or equal to the element reference temperature, only the third temperature sensor switch SW ₃ is turned on (S232), and the first and second temperature sensor switches SW ₁ and SW are turned on. ₂ ) is turned off (S234). Therefore, while the third resistor R ₃ is connected in parallel with the thermistor R _NTC , current is conducted (S240).

Thereafter, the voltage at the sensing node N _S to which the third resistor R ₃ is connected, that is, the voltage of the temperature sensing signal V _TS , is compared with the reference voltage V _ref (S250). At this time, since the temperature of the central processing unit 100 is less than the CPU reference temperature, the current control switch I_SW is turned on, and the current value supplied from the variable current supply unit 312 is 60 mA. In addition, the reference voltage selection switch V_SW operates to select the second reference voltage unit VS ₂ as the current control switch I_SW is turned on, so that the reference voltage V _ref is 1.20V. do.

In the above state, if the resistance value of the thermistor R _NTC is 40 kV and the resistance value of the third resistor R ₃ is 10 kV, the voltage of the temperature sensing signal V _TS is 0.48V ( 8 s x 60 s). That is, since the voltage of the temperature sensing signal V _TS is less than the reference voltage V _ref , a high signal is output from the operational amplifier OP, and the switching transistor Q is turned on to form the central processing unit ( The clock control signal for reducing the number of clocks of 100 is transmitted to the central processing unit 100 (S260).

As a result, the number of clocks of the central processing unit 100 is reduced (S270). Thereafter, the process is repeated from step 200.

In the case of Example 5, since the temperature of the central processing unit 100 exceeds the CPU reference temperature, the resistance value of the thermistor (R _NTC ) is lowered, thereby causing the peripheral elements (D ₁ , D ₂ , D ₃ ). The voltage of the temperature detection signal V _TS is less than the reference voltage V _ref without measuring a separate temperature.

Therefore, the clock control signal for reducing the number of clocks of the central processing unit 100 is transmitted to the central processing unit 100 (S260), thereby reducing the number of clocks of the central processing unit 100. (S270). Thereafter, the process is repeated from the 200 step.

1 is a circuit diagram according to a first embodiment according to the present invention.

2 is a flowchart of a first embodiment according to the present invention;

3 is a circuit diagram according to a second embodiment according to the present invention;

4 is a flowchart of a second embodiment according to the present invention;

Explanation of symbols on the main parts of the drawings

100: central processing unit 200: additional measuring unit

300: comparison processing unit 310: current supply unit

312: variable current supply unit 320: reference voltage unit

322 variable reference voltage unit 330 comparison unit

340: switch unit 400: basic measurement unit

Claims (17)

A basic measuring unit measuring a temperature of the central processing unit; In order to measure the temperature of each of the peripheral elements of the central processing unit, an additional measuring unit consisting of a temperature sensor and a resistor connected in series to each of the peripheral elements; And And a comparison processor configured to output a clock control signal for controlling the temperature of the central processing unit when the temperature of the central processing unit is greater than or equal to the reference temperature or when the temperature of at least one of the peripheral elements is greater than or equal to the reference temperature. Clock control device of the central processing unit. In order to measure the temperature of each of the peripheral elements of the central processing unit, an additional measuring unit consisting of a temperature sensor and a resistance connected in series to each of the peripheral elements; And And a comparison processor for outputting a clock control signal for controlling the temperature of the central processing unit when the temperature of at least one of the peripheral elements is greater than or equal to a reference temperature. The method of claim 1, The basic measuring unit, Clock control device of the central processing unit, characterized in that the thermistor whose resistance value changes in accordance with the temperature of the central processing unit. delete 3. The method according to claim 1 or 2, The temperature sensor, And a switch for turning on when the sensed temperature of the peripheral element is greater than or equal to the reference temperature. 3. The method according to claim 1 or 2, The resistance is, Clock control device of the central processing unit, characterized in that each having a different resistance value according to the peripheral element. The method according to claim 1, The additional measuring unit, Clock control device of the central processing unit, characterized in that connected in parallel with the basic measuring unit. The method according to claim 1 or 2, The peripheral device, Clock control device of the central processing unit, characterized in that any one of the inductor, FT (FET) and the CPU IC constituting the power supply circuit of the central processing unit. The method according to claim 1 or 2, The comparison processing unit, A comparison unit comparing the voltage applied to the additional measurement unit with a reference voltage; And Clock control device of the central processing unit, characterized in that it comprises a switch unit for operating on / off (On / Off) in accordance with the output of the comparison unit. The method of claim 9, The comparison processing unit, And a clock control signal for reducing a clock of the central processing unit when the voltage applied to the additional measuring unit is less than the reference voltage. delete Sensing a temperature of the central processing unit; If the detected temperature of the central processing unit is equal to or less than the CPU reference temperature, sensing the temperatures of peripheral elements of the central processing unit while driving the central processing unit normally; And Transmitting a clock control signal to the central processing unit for temperature control of the central processing unit when at least one of the sensed temperatures of the peripheral devices is equal to or higher than an element reference temperature; And And controlling the clock of the central processing unit. 13. The method of claim 12, And when the temperature of the peripheral element is greater than or equal to the element reference temperature, switching to conduct current to a resistor connected to the peripheral element. 14. The method of claim 13, And comparing the voltage applied to the resistor connected to the peripheral element with a reference voltage. 15. The method of claim 14, And transmitting a clock control signal for reducing the number of clocks of the central processing unit to the central processing unit when the voltage applied to the resistor connected to the peripheral element is less than or equal to the reference voltage. 13. The method of claim 12, And measuring a temperature of any one of an inductor, an FET, and a CPU IC constituting a power supply circuit of the central processing unit. 13. The method of claim 12, And if the detected temperature of the central processing unit exceeds the CPU reference temperature, controlling the clock of the central processing unit to reduce the number of clocks of the central processing unit.

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