JP2005210164A - 欠陥画素補正装置 - Google Patents

欠陥画素補正装置 Download PDF

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Publication number
JP2005210164A
JP2005210164A JP2004011508A JP2004011508A JP2005210164A JP 2005210164 A JP2005210164 A JP 2005210164A JP 2004011508 A JP2004011508 A JP 2004011508A JP 2004011508 A JP2004011508 A JP 2004011508A JP 2005210164 A JP2005210164 A JP 2005210164A
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JP
Japan
Prior art keywords
frame
defective pixel
defective
image
pixel
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JP2004011508A
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English (en)
Japanese (ja)
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JP2005210164A5 (enExample
Inventor
Takako Ichien
孝子 一圓
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Olympus Corp
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Olympus Corp
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Priority to JP2004011508A priority Critical patent/JP2005210164A/ja
Publication of JP2005210164A publication Critical patent/JP2005210164A/ja
Publication of JP2005210164A5 publication Critical patent/JP2005210164A5/ja
Pending legal-status Critical Current

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JP2004011508A 2004-01-20 2004-01-20 欠陥画素補正装置 Pending JP2005210164A (ja)

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JP2004011508A JP2005210164A (ja) 2004-01-20 2004-01-20 欠陥画素補正装置

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JP2004011508A JP2005210164A (ja) 2004-01-20 2004-01-20 欠陥画素補正装置

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JP2005210164A true JP2005210164A (ja) 2005-08-04
JP2005210164A5 JP2005210164A5 (enExample) 2007-03-01

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JP2004011508A Pending JP2005210164A (ja) 2004-01-20 2004-01-20 欠陥画素補正装置

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JP (1) JP2005210164A (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009031585A1 (ja) * 2007-09-05 2009-03-12 Hamamatsu Photonics K. K. 固体撮像装置
US8149305B2 (en) 2007-03-27 2012-04-03 Samsung Electronics Co., Ltd. Method and apparatus to detect a dead pixel of an image sensor and method and apparatus to capture an image from an image sensor
US8547464B2 (en) 2008-01-24 2013-10-01 Hamamatsu Photonics K.K. Solid-state imaging device and frame data correcting method which determine a voltage value corresponding to a pixel portion in frame data
US8625741B2 (en) 2008-07-17 2014-01-07 Hamamatsu Photonics K.K. Solid-state image pickup device
JP2014518469A (ja) * 2011-06-15 2014-07-28 マイクロソフト コーポレーション 高解像度マルチスペクトル画像キャプチャ
CN108426640A (zh) * 2018-02-28 2018-08-21 北京理工大学 一种针对红外探测器缺损像元的校正方法
KR20230064934A (ko) * 2021-11-04 2023-05-11 주식회사 파인브이티 디스플레이 장치에 포함되는 기판들 간의 접착면에 도포된 접착제의 도포 상태가 정상인지 여부를 판단하기 위한 접착제 도포 상태 검사 장치 및 그 동작 방법

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8149305B2 (en) 2007-03-27 2012-04-03 Samsung Electronics Co., Ltd. Method and apparatus to detect a dead pixel of an image sensor and method and apparatus to capture an image from an image sensor
WO2009031585A1 (ja) * 2007-09-05 2009-03-12 Hamamatsu Photonics K. K. 固体撮像装置
JP2009065375A (ja) * 2007-09-05 2009-03-26 Hamamatsu Photonics Kk 固体撮像装置
US8189084B2 (en) 2007-09-05 2012-05-29 Hamamatsu Photonics K.K. Solid state imaging device
US8547464B2 (en) 2008-01-24 2013-10-01 Hamamatsu Photonics K.K. Solid-state imaging device and frame data correcting method which determine a voltage value corresponding to a pixel portion in frame data
US8625741B2 (en) 2008-07-17 2014-01-07 Hamamatsu Photonics K.K. Solid-state image pickup device
JP2014518469A (ja) * 2011-06-15 2014-07-28 マイクロソフト コーポレーション 高解像度マルチスペクトル画像キャプチャ
US9635274B2 (en) 2011-06-15 2017-04-25 Microsoft Technology Licensing, Llc High resolution multispectral image capture
KR101824290B1 (ko) * 2011-06-15 2018-01-31 마이크로소프트 테크놀로지 라이센싱, 엘엘씨 고해상도 멀티스펙트럼 이미지 캡처 기법
US9992457B2 (en) 2011-06-15 2018-06-05 Microsoft Technology Licensing, Llc High resolution multispectral image capture
CN108426640A (zh) * 2018-02-28 2018-08-21 北京理工大学 一种针对红外探测器缺损像元的校正方法
KR20230064934A (ko) * 2021-11-04 2023-05-11 주식회사 파인브이티 디스플레이 장치에 포함되는 기판들 간의 접착면에 도포된 접착제의 도포 상태가 정상인지 여부를 판단하기 위한 접착제 도포 상태 검사 장치 및 그 동작 방법
KR102745816B1 (ko) 2021-11-04 2024-12-23 주식회사 파인브이티 디스플레이 장치에 포함되는 기판들 간의 접착면에 도포된 접착제의 도포 상태가 정상인지 여부를 판단하기 위한 접착제 도포 상태 검사 장치 및 그 동작 방법

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