JP2005189671A - Display device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a display device applied to, e.g. a display device having organic EL elements in which capacities of scanning lines and signal lines of a display device having pixels for spontaneous light emission are accurately measured. <P>SOLUTION: A wiring pattern connected to an electrode at one end of a light emitting element is led out through a wiring pattern of an intermediate wiring layer, and contact parts 32 which enable a probe for measurement to be brought into contact with wires of signal lines SIG and scanning lines SCAN1 and SCAN 2 of a lower layer while insulated from a circumference are formed at positions corresponding to wires of signal lines and scanning lines of the intermediate wiring layer. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to a display device, and can be applied to, for example, a display device using an organic EL (Electro Luminescence) element. In the present invention, the wiring pattern connected to the electrode at one end of the light emitting element is drawn through the wiring pattern of the intermediate wiring layer, and the signal line of the intermediate wiring layer, the part corresponding to the wiring of the scanning line, By forming contact parts that can be insulated from the surroundings and contact the measurement probes on the underlying signal lines and scanning lines, the capacitance of the scanning lines and signal lines can be accurately determined for display devices with self-luminous pixels. Can be measured.

  Conventionally, for organic EL elements, various applications to display devices have been proposed in, for example, USP 5,684,365 and JP-A-8-234683.

  In such a display device 1, as shown in FIG. 6, for example, a pixel unit 3 in which pixels are arranged in a matrix is formed on a glass substrate 2, and an integrated circuit of a vertical scanner (SCAN). An integrated circuit 5 of 4A, 4B, selector (SEL) is mounted on the substrate 2 and formed. Here, the pixel unit 3 is provided such that the scanning lines SCN1 and SCN2 extend in the horizontal direction in units of lines, and the signal line SIG extends in the vertical direction for each column so as to be orthogonal to the scanning lines SCN1 and SCN2. To be provided. For the pixel unit 3 formed in this way, the display device 1 drives the scanning lines SCN1 and SCN2 by a vertical scanner to sequentially drive the pixels of the pixel unit 3 in units of lines, and the driving of the pixels. The signal line SIG is driven by a selector so as to correspond to the above, and the gradation of each pixel is set.

  In such a display device, since the organic EL element constituting each pixel is a self-luminous element driven by current, a large current flows through a wiring pattern of a power source that supplies power to the pixel portion. Thus, in this type of display device 1, it is required to reduce the resistance of the wiring pattern related to such a drive current as much as possible.

  FIG. 7 is an exploded perspective view showing the configuration of the display device 11 which is considered to be able to reduce the resistance of the wiring pattern related to the drive current. In the display device 11, after the pixel circuit of each pixel, the scanning lines SCAN 1, SCAN 2, the signal line SIG, and the like related to this pixel circuit are formed by amorphous silicon TFTs in the region AR serving as the pixel portion on the glass substrate 12. The integrated circuits 4A and 4B of the vertical scanner and the integrated circuit 5 of the selector are mounted. In the display device 11, a planarizing film 14 made of an insulating layer and an anode layer wiring layer 15 are subsequently formed. In the display device 11, an electrode 16 that connects the transistor of the pixel circuit that drives the organic EL element to the anode of the organic EL element is formed by the wiring layer 15 of the anode layer. In the display device 11, the material layer of the organic EL element is subsequently formed by vapor deposition, and then the wiring pattern 17 of the cathode electrode of the organic EL element and the glass substrate 18 are laminated.

  In the display device 11 thus formed, the wiring pattern 17 of the cathode electrode is formed of a transparent electrode because it is necessary to transmit and emit the light of the organic EL element. Therefore, there is a drawback that it is difficult to reduce the resistance. On the other hand, on the lower layer side of the planarizing film 14, there is a limit that the resistance can be reduced as compared with the wiring pattern 17 of the cathode electrode by applying the wiring material made of aluminum. On the other hand, the wiring layer 15 of the anode layer is provided on the planarizing film 14 so as to be insulated from the lower wiring pattern, so that the resistance can be reduced relatively easily.

  As a result, in the display device 11, the wiring pattern of the cathode electrode 17 and the wiring pattern of the power source are drawn to the outside using the wiring layer 15 of the anode layer. That is, in the wiring layer 15 of the anode layer, a wide wiring pattern 19 is formed so as to surround a rectangular region serving as the pixel portion, and as shown by a broken line, the wiring pattern 17 of the cathode electrode is formed around the pixel portion. The wiring pattern 19 is connected. Further, the wiring pattern 19 is connected to cathode pads 20A to 20D formed so as to protrude from the short side and the opposing two sides of the display device 11, respectively, thereby the wiring layer 15 of the anode layer having a low resistance. The wiring pattern 17 of the cathode electrode is drawn out via the.

  Also, the wiring layer 15 of the anode layer is formed with a set of wide wiring patterns 21A and 21B along the upper and lower sides of the wiring pattern 19 related to the wiring pattern 17 of the cathode electrode and along the long side of the display device 11. Wide wiring patterns 21A and 21B are connected to power supply pads 22A and 22B, 22C and 22D which are external connection electrodes formed so as to protrude from the upper and lower long sides of the display device 11. In the display device 11, a power supply wiring pattern formed below the planarizing film 14 is connected to the wide wiring patterns 21A and 21B, whereby the power supply wiring pattern is also connected to the wiring of the anode layer which is an intermediate layer. The layer 15 is effectively used and drawn out to the outside. The glass substrate 12 is provided with signal input pads 24A to 24D for driving the integrated circuits 4A and 4B of the vertical scanner and the integrated circuit 5 of the selector.

  As a result, in this display device 11, as shown in FIG. 8, each pixel has a wiring pattern 16 on the glass substrate 12 where the pixel circuit is formed 32, the planarization film 14, and the anode layer wiring layer 15. The organic EL element material layer 31, the cathode electrode wiring pattern 17, and the glass substrate 18 are formed in a laminated structure. On the other hand, in the portions of the signal lines SIG and the scanning lines SCN1 and SCN2 other than the pixel portion, as shown in FIG. 9, the wiring pattern by the signal lines SIG and the scanning lines SCN1 and SCN2 is planarized on the glass substrate 12. The wiring patterns 19, 21 A, and 21 B of the film 14 and the wiring layer 15 of the anode layer are laminated. In the case where the organic EL element material layer 31 and the cathode electrode wiring pattern 17 are formed on the entire surface of the glass substrate 12, the organic EL element material layer 31 and the cathode electrode wiring pattern 17 are subsequently laminated, and then the glass substrate. 18 are laminated.

  By the way, in a liquid crystal display device which is a similar display device, it is made of amorphous silicon TFTs similarly to the display device 11, and when a pixel portion is formed on a glass substrate, so-called probe setting measurement is performed by a so-called prober. Here, the probe holder measurement by the prober is a method in which the prober is pressed against the measurement point provided in the measurement object, and the voltage at the measurement point is measured through the prober. The operation characteristics, the capacitance of each wiring pattern, and the like are measured.

  Also in the display device of an organic EL element, it is considered convenient if the needle holder measurement by the same prober can be executed. That is, in the manufacturing process, by executing the needle holder measurement by the prober, it is possible to find a defective product at an early stage, thereby preventing unnecessary product processing. In the design process, measurement of the capacitance of the scanning lines and signal lines can be effectively used for designing and improving the pixel circuit, the vertical scanner, and the selector.

  However, in the display device 11 configured as described above with reference to FIG. 7, the wiring patterns 19, 21 </ b> A, and 21 </ b> B related to the wiring layer 15 of the anode layer are provided above the wirings of the scanning lines SCAN <b> 1, SCAN <b> 2, and the signal line SIG. Therefore, the probe holder measurement by the prober can be executed for the scanning lines SCAN1, SCAN2, and the signal line SIG only before the wiring layer 15 of the anode layer is provided.

  On the other hand, in the wiring layer 15 of the anode layer, the capacitance of the scanning lines SCAN1, SCAN2, and the signal line SIG is greatly increased by covering most of the portions. Accordingly, in the display device 11 shown in FIG. 7, the capacitance cannot be measured accurately if the probe holder measurement is performed on the scanning lines SCAN1, SCAN2, and the signal line SIG before the wiring layer 15 of the anode layer is provided. There's a problem.

As one method for solving this problem, for example, in the design process, after cutting a part of the layout by irradiating a laser beam, a method of performing a needle stand measurement by a prober can be considered. 11, when a part of the layout is cut out by irradiating the laser beam in this way, the wiring pattern on the glass substrate 12 is short-circuited with the wiring layer 15 of the anode layer. The capacity cannot be measured.
USP 5,684,365 JP-A-8-234683

  The present invention has been made in consideration of the above points, and an object of the present invention is to propose a display device that can accurately measure the capacity of scanning lines and signal lines for a display device using pixels that emit light by itself. .

  In order to solve this problem, in the invention of claim 1, the present invention is applied to a display device in which pixels formed by current-driven light-emitting elements and pixel circuits that drive the light-emitting elements are arranged in a matrix, and is substantially rectangular on a substrate. A pixel circuit is arranged in a matrix shape in an area depending on the shape, and a driving circuit that outputs a driving signal for the pixel circuit is arranged on a driving wiring connected to the signal line and / or the scanning line of the pixel circuit, One end of the light emitting element formed in the upper layer of the intermediate wiring layer is connected to the corresponding pixel circuit via the electrode of the intermediate wiring layer formed in the upper layer of the pixel circuit, and the other end of the light emitting element is connected to the upper layer of the light emitting element. The electrode pattern is connected to the external connection electrode via the lead wiring pattern formed on the intermediate wiring layer, and the intermediate wiring layer is connected to the electrode pattern formed on the intermediate wiring layer. A lead-out wiring pattern is formed so as to cover the drive wiring by the shape surrounding the rectangular region, and is insulated from the lead-out wiring pattern at a portion corresponding to each of the drive wiring, A contact portion capable of connecting a measurement probe to the driving wiring is formed.

  According to the configuration of claim 1, the present invention is applied to a display device in which pixels formed by current-driven light-emitting elements and pixel circuits that drive the light-emitting elements are arranged in a matrix, so that the regions in a substantially rectangular shape on the substrate are arranged in a matrix A pixel circuit is disposed, and a driving circuit that outputs a driving signal for the pixel circuit is disposed on a driving wiring connected to the signal line and / or the scanning line of the pixel circuit, and is formed in an upper layer of the pixel circuit. One end of the light emitting element formed in the upper layer of the intermediate wiring layer is connected to the corresponding pixel circuit through the electrode by the intermediate wiring layer, and the other end of the light emitting element is connected to the electrode pattern formed in the upper layer of the light emitting element. If the electrode pattern is connected to the electrode for external connection via the lead wiring pattern formed on the intermediate wiring layer, the light emitting element is connected via the intermediate wiring layer. By capable of eliciting the other end, it is possible to reduce the resistance of the wiring pattern required for this type of display device. At this time, the intermediate wiring layer has a shape surrounding a region of a substantially rectangular shape, and a lead wiring pattern is formed so as to cover the drive wiring, and the lead wiring is provided in a portion corresponding to each of the drive wirings. If a contact portion is formed that is insulated from the pattern and can connect the probe for measurement to the driving wiring in the lower layer, the resistance of the light emitting element can be reduced through the intermediate wiring layer by reducing the resistance. Even if the other end is pulled out, it is possible to measure the capacitance related to the driving wiring in the lower layer through the portion where the probe can be connected in a state where the intermediate wiring layer is provided, and thereby the pixel related to self-light emission. For the display device according to the above, it is possible to accurately measure the capacitance of the scanning line and the signal line.

  ADVANTAGE OF THE INVENTION According to this invention, the capacity | capacitance of a scanning line and a signal line can be accurately measured about the display apparatus by the pixel which concerns on self-light emission.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings as appropriate.

(1) Configuration of Embodiment FIG. 2 is an exploded perspective view showing a display device according to Embodiment 1 of the present invention in comparison with FIG. This display device 31 has a pixel circuit formed in a rectangular area AR on the glass substrate 12, and an integrated circuit of a vertical scanner that outputs driving signals to the scanning lines SCAN1, SCAN2, and the signal line SIG by the pixel circuit. 4A, 4B, selector integrated circuit 5 is provided on this glass substrate 12, and drive circuits for these integrated circuits 4A, 4B, 5 are connected to scanning lines SCAN1, SCAN2, and signal line SIG, respectively. Connected to. Further, an anode layer wiring layer 15 as an intermediate wiring layer is formed on the upper layer, and then an organic EL element material layer, a cathode electrode wiring pattern 17 and a glass substrate 18 are sequentially laminated to form a cathode electrode wiring pattern 17. Are connected to pads 20A to 20D, which are electrodes for external connection, through lead wiring patterns 19 provided in the intermediate wiring layer.

  In the display wiring pattern 19 with the intermediate wiring layer formed in this way, the display device 31 has a portion corresponding to the driving signal wiring connected to the scanning lines SCAN1, SCAN2, and the signal line SIG. The portions 32 (hereinafter referred to as contact portions), which are insulated from the surroundings and can connect the probe to the lower wiring for driving signals, are formed. This display device 31 is formed in the same manner as the display device 11 described above with reference to FIG.

  FIG. 1A is a plan view showing the contact portion 32, and FIG. 1B is a cross-sectional view taken along line BB of FIG. 1A. The contact portion 32 is provided in each of driving signal wirings (indicated by reference numerals SCAN1, SCAN2, and SIG in FIG. 1) connected to the scanning lines SCAN1, SCAN2, and the signal line SIG, respectively, and wiring of the anode layer In the layer 15, a land 33 having a rectangular shape is provided above each wiring, and the land 33 is connected to a corresponding wiring in the lower layer.

  As a result, in the display device 31, after the wiring layer 15 of the anode layer is formed, the tip of the prober is brought into contact with the land 33, thereby performing the probe holder measurement by the prober, and the scanning lines SCAN1, SCAN2, The capacitance of the line SIG can be accurately measured.

  When the land 33 is formed in this way, the land 33 is held at the same potential as the corresponding scanning lines SCAN1, SCAN2, and the signal line SIG. As a result, when the material layer of the organic EL element is provided over the entire surface of the wiring layer 15 of the anode layer, and further, the wiring pattern 17 of the cathode electrode is provided, the material layer of the organic EL element emits light above the land 33. If you want to. For this reason, in this display device 31, the organic EL element material is not provided at least on the upper layer side of the land 33, thereby preventing the display device 31 from emitting light in a region other than the pixel portion.

(2) Operation of Example In the above-described configuration, in this display device 31, the pads 20A to 20D, 22A to 22D, and 24A to 24D formed in the periphery are connected to a power source, a drive circuit, etc. Displayed on the screen. That is, in the display device 31, among these pads 20A to 20D, 22A to 22D, and 24A to 24D, the pads 22A to 22D provided at both ends on the long side are allocated for the power supply Vcc, and are also connected to both ends on the short side. The provided pads 20A to 20D are assigned to the cathode, and the gradation of each pixel is set via the remaining signal line pads 22A to 22D, and a desired image is displayed.

  In the display device 31, when each pixel is driven in this manner, power supplied from the pads 22A to 22D provided at both ends on the long side is formed on the wiring layer 15 of the anode layer from the pads 22A to 22D. The wiring patterns 21A and 21B are supplied to the lower wiring pattern layer via the wiring patterns 21A and 21B. The lower wiring pattern is supplied to each pixel in the pixel portion.

  In addition, in this way, power is supplied to each pixel, and in the display device 31, the pixel circuit provided in each pixel is connected to the upper organic EL element by the electrode 16 formed in the wiring layer 15 of the anode layer. The drive current of the organic EL element by this pixel circuit is further collected in the pixel portion by the wiring pattern 17 of the upper layer cathode electrode. In the display device 31, the driving current of the organic EL elements collected in the wiring pattern 17 of the cathode electrode is guided to the wiring pattern 19 formed in the wiring layer 15 of the anode layer so as to surround the pixel portion, and this wiring pattern Outflow from the cathode pads 20A to 20D on the short side connected to 19.

  Thereby, in the display device 31, the resistance of the path of the drive current of the organic EL element is reduced by effectively using the wiring layer 15 of the anode layer which is the intermediate wiring layer having the lowest resistance value among the many wiring pattern layers. Thus, power consumption is reduced and image quality deterioration due to wiring pattern resistance is effectively avoided.

  In addition, the wiring pattern of the cathode electrode and the wiring pattern of the power source are drawn out through the wiring layer 15 of the anode layer as the intermediate wiring layer in this way, and the resistance value related to these wiring patterns is reduced, thereby the display device 31. Then, the wiring layer 15 of the anode layer is formed so as to cover the signal lines SIG, the scanning lines SCN1, SCN2, and the drive circuits 4A, 4B, and 5. In the signal lines SIG and the scanning lines SCN1, SCN2, the wiring of the anode layer is formed. Layer 15 increases the capacity significantly.

  In the display device 31, the wiring layer 15 of the anode layer is thereby insulated from the surroundings in the portion corresponding to the wiring that connects the scanning lines SCN 1, SCN 2, and the signal line SIG to the corresponding driving circuits 4 A, 4 B, 5, A contact portion 32 is formed to which a measurement prober can be connected to the wiring related to these driving signals in the lower layer. Thereby, in the display device 31, the capacitance of the scanning lines SCN1, SCN2, and the signal line SIG can be measured by the contact portion 32 after the anode layer wiring layer 15 is formed. The capacitance of the scanning line and the signal line can be accurately measured.

  In this display device 31, a contact portion 32 to which such a prober for measurement can be connected is formed by a land 33 formed by the wiring layer 15 of the anode layer that is connected to the lower layer wiring. By simply contacting each land 33, the capacitance of the scanning line and the signal line can be accurately measured.

  Further, the contact portion 32 to which the measurement prober can be connected is formed by the land 33 in this way, so that the organic EL material is not deposited on at least the land 33 portion. Luminescence is effectively avoided.

(3) Advantages of the embodiment According to the above configuration, the intermediate wiring layer is formed such that the wiring pattern connected to the cathode electrode which is the electrode at one end of the light emitting element is drawn out through the wiring pattern of the intermediate wiring layer. By forming contact portions 32 that are insulated from the surroundings so that the measurement probes can contact the lower signal lines and scanning line wirings at portions corresponding to the signal line and scanning line wirings, With respect to a display device using pixels, it is possible to accurately measure the capacitances of scanning lines and signal lines.

  In addition, by forming a contact portion that can contact such a measurement probe with a land connected to the lower layer wiring, the probe line capacitance can be obtained simply by bringing the tip of the prober into contact with each land. Can be measured accurately.

  In addition, by forming a contact portion to which the measurement probe can be connected by the land in this way and forming the organic EL material so as not to be deposited at least on the land portion, light emission in a region other than the pixel portion can be achieved. It can be effectively avoided.

  FIG. 3 is a plan view and a cross-sectional view partially showing a display device according to a second embodiment of the present invention in comparison with FIG. In this embodiment, similarly to the display device 31 according to the first embodiment, the signal lines and the scanning lines in the lower layer are insulated from the surroundings in the portions corresponding to the signal lines and the scanning lines in the intermediate wiring layer. A contact portion 42 capable of contacting the measurement probe is formed. In this display device, the contact portion 42 is formed by the lands 43 connected to the lower layer wiring as in the first embodiment, and thereby, as in the display device 31 described above with respect to the first embodiment, simply and accurately. The capacitance of the scanning line and the signal line can be measured. This display device is formed in the same manner as the display device 31 described above with respect to the first embodiment except that the configuration regarding the contact portions 42 is different.

  In this display device, in the flattening film forming process after the wiring layer 15 of the anode layer related to such an intermediate wiring layer is formed, a flattening film 44 made of an insulating layer is also formed on the land 43 portion. The contact portion 42 is also insulated by the planarization film 44 between the upper organic EL element material film.

  Correspondingly, in the display device, the material layer of the organic EL element is formed on the entire upper layer side of the wiring layer 15 of the anode layer, thereby simplifying the production process of this material film.

  In this embodiment, the contact portion 42 is also insulated from the material layer of the upper organic EL element by the planarizing film after the wiring layer of the anode layer is formed, so that the portions other than the pixel portion can be obtained by a simple process. By effectively avoiding light emission in the region, the same effect as in the first embodiment can be obtained.

  4 is a plan view and a cross-sectional view partially showing a display device according to a third embodiment of the present invention in comparison with FIG. In this embodiment, in the same manner as in the display device according to the second embodiment, measurement is performed on the signal lines and scanning line wirings that are insulated from the surroundings in portions corresponding to the signal lines and scanning line wirings of the intermediate wiring layer. A contact portion 52 that can contact the probe is formed. This display device is created in the same manner as the display device described above for the second embodiment except that the configuration relating to the contact portion 52 is different.

  In this display device, the contact portion 52 is formed by a land 53 that is insulated from the underlying wiring by the planarizing film 14. As a result, in this display device, after the planarization film 14 is partially removed by laser beam irradiation targeting the land 53, the measurement probe is brought into contact with the land 53 or the underlying wiring to scan the line etc. It is designed to measure the capacity of

  As in this embodiment, the same effect as that of the first embodiment can be obtained by forming a contact portion that can be insulated from the lower wiring and provided with a land so that the probe for measurement can be contacted. In addition, by providing a land that is insulated from the underlying wiring in this way, even when the material layer of the organic EL element is formed on the entire surface, light emission at this land portion can be effectively avoided, thereby simplifying The same effects as those of the first embodiment can be obtained through this process.

  FIG. 5 is a plan view and a sectional view partially showing a display device according to a fourth embodiment of the present invention in comparison with FIG. In this embodiment, in the same manner as in the display device according to the first embodiment, measurement is performed on the signal lines and scanning lines in the lower layer by insulating them from the surroundings in the portions corresponding to the signal lines and scanning lines in the intermediate wiring layer A contact portion 62 that can contact the probe is formed. This display device is created in the same manner as the display device described above for the third embodiment except that the configuration relating to the contact portion 62 is different.

  In this display device, the contact portion 62 is formed by an opening formed in an island shape in the wiring layer 15 of the anode layer, so that the lower planarizing film 14 is exposed at the portion of the opening. . In this display device, the flattening film 14 is partially removed by laser beam irradiation targeting the opening, and then the measurement probe is brought into contact with the underlying wiring to measure the capacitance of the scanning line or the like. It is made to do.

  As in this embodiment, the same effect as that of the first embodiment can be obtained by forming the contact portion that can contact the measurement probe by the opening that exposes the underlying flattening film. In addition, in the case where the portion that can be contacted with the probe is formed in this way, even when the organic EL element material is formed on the entire surface, the light emission at this portion can be effectively avoided. The effect similar to Example 1 can be acquired according to a process.

  In the above-described embodiments, the case where the present invention is applied to a display device in which the anode of the light emitting element is on the intermediate wiring layer side has been described. However, the present invention is not limited to this, and the cathode of the light emitting element is used as the intermediate wiring layer. The present invention can be widely applied to a display device on the side.

  In the above-described embodiments, the case where the present invention is applied to the display device in which the power supply wiring pattern is the lower layer side of the intermediate wiring layer has been described. However, the present invention is not limited to this, and the power supply side is the uppermost layer side. The present invention can also be widely applied to display devices.

  In the above-described embodiments, the case where the capacitance is measured for both the signal line and the scanning line has been described. However, the present invention is not limited to this, and the present invention can be widely applied to the case where the capacitance is measured for only one of them. be able to.

  In the above-described embodiments, the case where the present invention is applied to a display device using an organic EL element has been described. However, the present invention is not limited thereto, and can be widely applied to a display device using a self-light emitting element related to current driving. it can.

  The present invention can be applied to a display device using an organic EL element, for example.

It is the top view and sectional drawing which show partially the display apparatus which concerns on Example 1 of this invention. It is a disassembled perspective view which shows the display apparatus which concerns on Example 1 of this invention. It is the top view and sectional drawing which show partially the display apparatus which concerns on Example 2 of this invention. It is the top view and sectional drawing which show partially the display apparatus which concerns on Example 3 of this invention. It is the top view and sectional drawing which show partially the display apparatus which concerns on Example 4 of this invention. It is a top view which shows the conventional display apparatus. It is a disassembled perspective view which shows the display apparatus considered that the resistance value of a wiring pattern can be made small. It is sectional drawing of the part of the pixel in the display apparatus of FIG. It is sectional drawing in parts other than the pixel of the display apparatus of FIG.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1, 11, 31 ... Display apparatus, 2, 12 ... Glass substrate, 3 ... Pixel part, 4A, 4B, 5 ... Integrated circuit, 14, 44 ... Planarization film, 15 ... Wiring layer, 17 , 19, 21A, 21B ... wiring pattern, 33, 43, 53 ... land

Claims (6)

In a display device in which pixels by current-driven light-emitting elements and pixel circuits that drive the light-emitting elements are arranged in a matrix,
The pixel circuits are arranged in a matrix shape in an area of a substantially rectangular shape on the substrate, and driving signals for the pixel circuits are supplied to driving wirings connected to the signal lines and / or scanning lines of the pixel circuits. The drive circuit to output is arranged,
One end of the light emitting element formed in the upper layer of the intermediate wiring layer is connected to the corresponding pixel circuit through an electrode by the intermediate wiring layer formed in the upper layer of the pixel circuit,
The other end of the light emitting element is connected to an electrode pattern formed on an upper layer of the light emitting element,
The electrode pattern is connected to an electrode for external connection through a lead wiring pattern formed in the intermediate wiring layer,
The intermediate wiring layer is
The lead-out wiring pattern is formed so as to cover the driving wiring by a shape surrounding the region by the substantially rectangular shape,
A contact portion that is insulated from the lead-out wiring pattern and can connect a measurement probe to the lower drive wiring is formed in a portion corresponding to each of the driving wiring. Display device. The contact portion is
The display device according to claim 1, wherein the display device is a land formed in an island shape in the intermediate wiring layer and connected to the driving wiring. The light emitting element is
Formed by laminating a material layer of the light emitting element on the intermediate wiring layer,
The material layer of the light emitting element is
The display device according to claim 2, wherein the display device is deposited except at least a portion of the land. The display device according to claim 2, wherein after the insulating layer is formed in the land portion, the material layer of the light emitting element is deposited on the upper layer of the intermediate wiring layer. The contact portion is
The display device according to claim 1, wherein the display device is a land formed in an island shape in the intermediate wiring layer and insulated from the driving wiring. The contact portion is
The display device according to claim 1, wherein the display device is an opening formed in the intermediate wiring layer.

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